Nothing Special   »   [go: up one dir, main page]

Yang et al., 2019 - Google Patents

A noniterative and efficient technique to extract complex permittivity of low-loss dielectric materials at terahertz frequencies

Yang et al., 2019

Document ID
4510697812018064869
Author
Yang C
Ma K
Ma J
Publication year
Publication venue
IEEE Antennas and Wireless Propagation Letters

External Links

Snippet

In this letter, a noniterative technique is proposed to efficiently extract complex permittivity (ε) of low-loss dielectric materials at terahertz frequencies while mitigating the effects at Fabry- Perot frequencies. For this goal, the formula of ε with little resonance is first derived by …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/10Radiation diagrams of aerials; Antenna testing in general
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/0807Measuring electromagnetic field characteristics characterised by the application
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/0864Measuring electromagnetic field characteristics characterised by constructional or functional features
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants; Measuring impedance or related variables
    • G01R27/2688Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants; Measuring impedance or related variables
    • G01R27/2617Measuring dielectric properties, e.g. constants
    • G01R27/2635Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00Investigating or analysing materials by the use of microwaves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infra-red light
    • G01N21/3581Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infra-red light using far infra-red light; using Terahertz radiation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/02Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
    • G01S7/40Means for monitoring or calibrating
    • G01S7/4052Means for monitoring or calibrating by simulation of echoes
    • G01S2007/406Means for monitoring or calibrating by simulation of echoes using internally generated reference signals, e.g. via delay line, via RF or IF signal injection or via integrated reference reflector or transponder
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/02Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
    • G01S7/03Details of HF subsystems specially adapted therefor, e.g. common to transmitter and receiver

Similar Documents

Publication Publication Date Title
Yang et al. A noniterative and efficient technique to extract complex permittivity of low-loss dielectric materials at terahertz frequencies
Wang et al. Characterization of dielectric materials at WR-15 band (50–75 GHz) using VNA-based technique
Wang et al. Material measurements using VNA-based material characterization kits subject to thru-reflect-line calibration
Hasar Determination of complex permittivity of low-loss samples from position-invariant transmission and shorted-reflection measurements
Severo et al. Non-resonant permittivity measurement methods
Orlob et al. Compact unfocused antenna setup for X-band free-space dielectric measurements based on line-network-network calibration method
Grosvenor et al. Time-domain free-field measurements of the relative permittivity of building materials
Li et al. Compact dielectric constant characterization of low-loss thin dielectric slabs with microwave reflection measurement
Rudd et al. Determining high-frequency conductivity based on shielding effectiveness measurement using rectangular waveguides
Hasar Unique permittivity determination of low-loss dielectric materials from transmission measurements at microwave frequencies
Hasar et al. An accurate complex permittivity method for thin dielectric materials
Kato et al. New uncertainty analysis for permittivity measurements using the transmission/reflection method
Salski et al. Microwave characterization of dielectric sheets in a plano-concave Fabry-Perot open resonator
Stewart et al. Electromagnetic characterization of a magnetic material using an open-ended waveguide probe and a rigorous full-wave multimode model
Han et al. A new method for measuring the properties of dielectric materials
Yang et al. Non-iterative method for extracting complex permittivity and thickness of materials from reflection-only measurements
You et al. Non-destructive dielectric measurements and calibration for thin materials using waveguide-coaxial adaptors
Requena et al. Wireless Complex Permittivity Measurement Using Resonant Scatterers and a Radar Approach
Tiwari et al. Partially filled substrate integrated waveguide-based microwave technique for broadband dielectric characterization
Kazemipour et al. A reliable simple method to extract the intrinsic material properties in millimeter/sub-millimeter wave domain
Di Massa et al. Accurate circuit model of open resonator system for dielectric material characterization
Gong et al. An improved overmoded-waveguide method for the accurate measurement of dielectric properties in the sub-terahertz band
Silveirinha et al. A graphical aid for the complex permittivity measurement at microwave and millimeter wavelengths
Hasar Procedure for accurate and stable constitutive parameters extraction of materials at microwave frequencies
Chuma et al. Using metamaterial complementary split-ring resonators for measuring dielectric constants and loss tangents at 22 GHz