Nothing Special   »   [go: up one dir, main page]

Jiang et al., 2011 - Google Patents

A DSP-based ramp test for on-chip high-resolution ADC

Jiang et al., 2011

View PDF
Document ID
1039585413223944701
Author
Jiang W
Agrawal V
Publication year
Publication venue
2011 IEEE 43rd Southeastern Symposium on System Theory

External Links

Snippet

Ramp test approach is widely used in analog-to-digital converter (ADC) built-in self-test (BIST), which generates linear and slow-slope analog ramp signals intended for histogram- based non-linearity test. The test time can be high for high-resolution ADCs. In this paper, a …
Continue reading at www.eng.auburn.edu (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/40—Analogue value compared with reference values sequentially only, e.g. successive approximation type recirculation type
    • H03M1/403—Analogue value compared with reference values sequentially only, e.g. successive approximation type recirculation type using switched capacitors
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/14—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0634—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. varying supply voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/36—Analogue value compared with reference values simultaneously only, i.e. parallel type
    • H03M1/361—Analogue value compared with reference values simultaneously only, i.e. parallel type having a separate comparator and reference value for each quantisation level, i.e. full flash converter type
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/50—Analogue/digital converters with intermediate conversion to time interval
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H03M1/1245—Details of sampling arrangements or methods
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H03M1/109—Measuring or testing for dc performance, i.e. static testing
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M3/00—Conversion of analogue values to or from differential modulation
    • H03M3/30—Delta-sigma modulation
    • H03M3/39—Structural details of delta-sigma modulators, e.g. incremental delta-sigma modulators
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters

Similar Documents

Publication Publication Date Title
Jin et al. Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal
CN109756226B (en) Background calibration of reference DAC and quantization nonlinearity in ADC
Chen et al. Ultrafast stimulus error removal algorithm for ADC linearity test
Lee et al. Code-width testing-based compact ADC BIST circuit
Jin et al. Linearity testing of precision analog-to-digital converters using stationary nonlinear inputs
US20050088164A1 (en) Method for testing analog and mixed-signal circuits using functionally related excitations and functionally related measurements
Jin et al. An on-chip ADC BIST solution and the BIST enabled calibration scheme
Jin et al. SEIR linearity testing of precision A/D converters in nonstationary environments with center-symmetric interleaving
Jin et al. High-performance ADC linearity test using low-precision signals in non-stationary environments
Jiang et al. A DSP-based ramp test for on-chip high-resolution ADC
Huang et al. A self-testing and calibration method for embedded successive approximation register ADC
Jin et al. Low-cost high-quality constant offset injection for SEIR-based ADC built-in-self-test
Kerzérho et al. A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC
Lee et al. Hardness assurance and testing techniques for high resolution (12-to 16-bit) analog-to-digital converters
Jin et al. Testing of precision DAC using low-resolution ADC with wobbling
Jin et al. Testing of precision DACs using low-resolution ADCs with dithering
Jin et al. A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals
Renaud et al. On-chip implementation of an integrator-based servo-loop for ADC static linearity test
Olleta et al. A deterministic dynamic element matching approach for testing high-resolution ADCs with low-accuracy excitations
Jin et al. Linearity test of analog-to-digital converters using Kalman filtering
Shin et al. A statistical digital equalizer for loopback-based linearity test of data converters
Jin et al. An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli
Chiorboli et al. ADC modeling and testing
Aswin New Algorithm for Fast and Accurate Linearity Testing of High-Resolution SAR ADCs
Jin A SEIR-based ADC built-in-self-test and its application in ADC self-calibration