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Pant et al., 2000 - Google Patents

Path-delay fault diagnosis in non-scan sequential circuits with at-speed test application

Pant et al., 2000

Document ID
9289970985545621394
Author
Pant P
Chatterjee A
Publication year
Publication venue
Proceedings International Test Conference 2000 (IEEE Cat. No. 00CH37159)

External Links

Snippet

A new methodology is developed in this paper for identifying possible path delay faults through at-speed testing of sequential non-scan circuits. In the past, different techniques have been proposed for diagnosing delay faults in sequential circuits through variable clock …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

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