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Hsu et al., 2006 - Google Patents

A new robust paradigm for diagnosing hold-time faults in scan chains

Hsu et al., 2006

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Document ID
5258351412057198941
Author
Hsu E
Huang S
Tzeng C
Publication year
Publication venue
2006 International Symposium on VLSI Design, Automation and Test

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Snippet

Hold-time violation is a common cause of failure at scan chains. A robust new paradigm for diagnosing such failure is presented in this paper. As compared to previous methods, the major advantage of ours is the ability to tolerate non-ideal conditions, eg, under the …
Continue reading at www.researchgate.net (PDF) (other versions)

Classifications

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    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
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    • G01R27/20—Measuring earth resistance; Measuring contact resistance, e.g. of earth connections, e.g. plates
    • G01R27/205—Measuring contact resistance of connections, e.g. of earth connections

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