Nothing Special   »   [go: up one dir, main page]

Inoue et al., 2002 - Google Patents

Critical current properties in YBCO coated IBAD tapes

Inoue et al., 2002

Document ID
7208029051832545028
Author
Inoue M
Nishimura S
Kuga T
Kiuchi M
Kiss T
Takeo M
Matsushita T
Iijima Y
Kakimoto K
Saitoh T
Awaji S
Watanabe K
Shiohara Y
Publication year
Publication venue
Physica C: Superconductivity

External Links

Snippet

Current transport properties in YBCO coated ion beam assisted deposition tapes have been studied as a function of temperature, magnetic field and field angle under high magnetic fields up to 18 T. The value of critical current, Ic, for 1 cm wide tape was 85 A at 77.3 K in self …
Continue reading at www.sciencedirect.com (other versions)

Classifications

    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L39/00—Devices using superconductivity; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof
    • H01L39/24—Processes or apparatus peculiar to the manufacture or treatment of devices provided for in H01L39/00 or of parts thereof
    • H01L39/2419—Processes or apparatus peculiar to the manufacture or treatment of devices provided for in H01L39/00 or of parts thereof the superconducting material comprising copper oxide
    • H01L39/2422—Processes for depositing or forming superconductor layers
    • H01L39/2454—Processes for depositing or forming superconductor layers characterised by the substrate
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L39/00—Devices using superconductivity; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof
    • H01L39/22—Devices comprising a junction of dissimilar materials, e.g. Josephson-effect devices
    • H01L39/223—Josephson-effect devices
    • H01L39/225—Josephson-effect devices comprising high Tc ceramic materials
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L39/00—Devices using superconductivity; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof
    • H01L39/24—Processes or apparatus peculiar to the manufacture or treatment of devices provided for in H01L39/00 or of parts thereof
    • H01L39/2419—Processes or apparatus peculiar to the manufacture or treatment of devices provided for in H01L39/00 or of parts thereof the superconducting material comprising copper oxide
    • H01L39/2464—After-treatment, e.g. patterning
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L39/00—Devices using superconductivity; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof
    • H01L39/02—Details
    • H01L39/12—Details characterised by the material
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00—Superconductor technology: apparatus, material, process
    • Y10S505/70—High TC, above 30 k, superconducting device, article, or structured stock
    • Y10S505/701—Coated or thin film device, i.e. active or passive
    • Y10S505/703—Microelectronic device with superconducting conduction line
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L39/00—Devices using superconductivity; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof
    • H01L39/14—Permanent superconductor devices
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00—Superconductor technology: apparatus, material, process
    • Y10S505/825—Apparatus per se, device per se, or process of making or operating same
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S428/00—Stock material or miscellaneous articles
    • Y10S428/922—Static electricity metal bleed-off metallic stock
    • Y10S428/9265—Special properties
    • Y10S428/93—Electric superconducting

Similar Documents

Publication Publication Date Title
Lee et al. Epitaxially grown sputtered LaAlO3 films
Komori et al. Approach for the fabrication of MgB 2 superconducting tape with large in-field transport critical current density
Kiss et al. Angular dependence of critical current properties in YBCO coated tape under high magnetic field up to 18 T
Li et al. Inductance investigation of YBa 2 Cu 3 O 7− δ nano-slit SQUIDs fabricated with a focused helium ion beam
Strickland et al. Onset temperature of intrinsic pinning in a REBCO coated conductor from critical current anisotropy
Inoue et al. Critical current properties in YBCO coated IBAD tapes
Lee et al. Magnetic-field angle dependent critical current densities and flux pinning in commercial YBCO tapes below liquid nitrogen temperatures
Kitaguchi et al. Critical current density distribution in superconducting oxide layer of Bi2Sr2CaCu2Ox/Ag composite tapes
Hosseini et al. Characterization of a transition-edge bolometer made of YBCO thin films prepared by nonfluorine metal–organic deposition
Yamada et al. Critical current density and related microstructures of TFA-MOD YBCO coated conductors
Fuger et al. Superior properties of SmBCO coated conductors at high magnetic fields and elevated temperatures
Kobayashi et al. Investigation of magnetic properties of YBCO film with artificial pinning centers on PLD/IBAD metal substrate
Adachi et al. Fabrication of integrated HTS-SQUID magnetometers having multiturn input coils with different sizes
Ota et al. Particle-free superconducting Bi2Sr2CaCu2Ox ultrathin films prepared by atomic-layer-controlled molecular beam epitaxy technique
Kiss et al. Distribution of pinning strength and scaling behavior in YBCO coated IBAD tape
Matsushita et al. Critical current properties in superconducting Y-123 tapes
Chana et al. Josephson effects in misaligned Tl-2212 films
Wen et al. Josephson tunneling and gap structure in Y1Ba2Cu3O7− y/oxide barrier/Pb planar junctions on tetragonal LaSrGaO4 (100) substrates
Huang et al. Fabrication and properties of high-Tc ramp junctions with manganite barriers
Zhitlukhina et al. Critical current enhancement in a superconducting nanolayer proximitized to a weak-ferromagnetic film
Takahashi et al. Magnetic field dependence of critical currents in PLD RE–Ba–Cu–O (RE= Er, Dy, Gd) film prepared on CeO2 capped IBAD-GZO layers
Porokhov et al. Superconducting properties of YBCO thin films grown on [001] quartz substrates by pulsed laser deposition
Takahashi et al. E–J properties of Bi2Sr2CaCu2O8 thick films
Wakana et al. Influence of deposition conditions of La-doped YbBa2Cu3Oy upper layers on electrical properties of interface-modified ramp-edge junction
Terai et al. Electrical interface structure in YBa/sub 2/Cu/sub 3/O/sub 7-x//metal contact