An LPDDR4 Safety Model for Automotive Applications
Authors: 
Lukas Steiner, Kira Kraft, Denis Uecker, 
Matthias Jung, Michael Huonker, Norbert WehnAuthors Info & Claims
Article No.: 12, Pages 1 - 9
Abstract
The increasing demand for DRAM in modern vehicles creates new challenges for automobile manufacturers. To allow DRAM subsystems to be used in safety-critical tasks like autonomous driving, a special Automotive Safety Integrity Level (ASIL) grading according to the ISO 26262 is required. While the classification process is already well-established for processors and on-chip memories with dedicated automotive hardware introduced to the market, no similar research has been conducted for DRAM yet. As a consequence, the process proves to be difficult for car manufacturers at this point. Therefore, a methodology that captures all the DRAM subsystem complexity in a comprehensive but yet understandable way is required. In this paper we use Component Fault Trees to create a clearly-structured safety model of an exemplary LPDDR4 memory subsystem. Based on the proposed model, we also evaluate the ASIL that it can reach. For the automotive industry, our work can serve as a foundation for future classification processes, therefore taking one more step towards full autonomy.
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Published In
September 2021
158 pages
ISBN:9781450385701
DOI:10.1145/3488423
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Published: 09 May 2022
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MEMSYS 2021
MEMSYS 2021: The International Symposium on Memory Systems
September 27 - 30, 2021
DC, Washington DC, USA
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