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A class of optimal minimum odd-weight-column SEC-DED codes

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M. Y. HsiaoAuthors Info & Claims

IBM Journal of Research and Development, Volume 14, Issue 4

Pages 395 - 401

https://doi.org/10.1147/rd.144.0395

Published: 01 July 1970 Publication History

Abstract

The class of codes described in this paper is used for single-error correction and double-error detection (SEC-DED). It is equivalent to the Hamming SEC-DED code in the sense that for a specified number k of data bits, the same number of check bits r is used. The minimum odd-weight-column code is suitable for applications to computer memories or parallel systems. A computation indicates that this code is better in performance, cost and reliability than are conventional Hamming SEC-DED codes.

References

[1]

C. A. Allen, "Design of Digital Memories that Tolerate All Classes of Defects," SEL TR 4662-1, Stanford University, May 1966.

Google Scholar

[2]

R. W. Hamming, "Error Detecting and Error Correcting Codes," Bell System Tech. J., 29, 147 (1950).

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[3]

W. W. Peterson, Error Correcting Codes, M.I.T. Press, Cambridge, Mass. 1961, p. 33.

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A class of optimal minimum odd-weight-column SEC-DED codes
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cover image IBM Journal of Research and Development

IBM Journal of Research and Development Volume 14, Issue 4

July 1970

129 pages

ISSN:0018-8646

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IBM Corp.

United States

Publication History

Published: 01 July 1970

Received: 21 October 1969

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A Class of Odd-Weight-Column SEC-DED-SbED Codes for Memory System Applications

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