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High-level synthesis for testability: a survey and perspective

Published: 01 June 1996 Publication History
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    cover image ACM Conferences
    DAC '96: Proceedings of the 33rd annual Design Automation Conference
    June 1996
    839 pages
    ISBN:0897917790
    DOI:10.1145/240518
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Published: 01 June 1996

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    • (2014)High-Level Test SynthesisACM Transactions on Design Automation of Electronic Systems10.1145/262775419:4(1-27)Online publication date: 29-Aug-2014
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