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2μs row time 12-bit column-parallel single slope ADC for high-speed CMOS image sensor

Published: 01 May 2023 Publication History

Abstract

To improve the conversion speed of single-slope (SS) analog-to-digital converter (ADC) for high frame rate CMOS image sensor, a cycle time-to-digital converter (TDC)-based readout technique is proposed, which optimizes the quantization method. And the proposed SS ADC prioritizes the quantization of the most significant bit (MSB), aiming to shorten the search range of the slope and greatly improve the quantization speed while ensuring accuracy. Furthermore, the proposed scheme is reversible to operate the conventional SS ADC algorithm, thus it preserves the structural advantages of the SS ADC. The proposed SS ADC is designed and simulated with 0.11-μm process. The simulation results show that the row time of SS ADC is 2 μs and the resolution is 500 ps, which greatly improves the quantization speed while ensuring power consumption and accuracy. The FoM is 182.6 fJ/step, which is a 7.1% improvement compared to other TDC-based SS ADCs. The proposed SS ADC becomes more effective as the bit-depth of the ADC increases.

References

[1]
S.K. Mendis, et al., CMOS active pixel image sensors for highly integrated imaging systems, IEEE J. Solid State Circ. 32 (2) (Feb. 1997) 187–197.
[2]
E.R. Fossum, CMOS image sensors: electronic camera-on-a-chip, IEEE Trans. Electron. Dev. 44 (10) (Oct. 1997) 1689–1698.
[3]
Z. Huang, et al., A 16-bit single-slope based pixel-level ADC for 15μm-pitch 640×512 MWIR FPAs, IEEE International Symposium on Circuits and Systems (ISCAS) (2018) 1–5.
[4]
M. Furuta, et al., A high-speed, high-sensitivity digital CMOS image sensor with a global shutter and 12-bit column-parallel cyclic A/D converters, IEEE J. Solid State Circ. 42 (4) (April 2007) 766–774.
[5]
T. Kato, et al., A Binocular CMOS Range Image Sensor with Bit-Serial Block-Parallel Interface Using Cyclic Pipelined ADCs,” Symposium on VLSI Circuits, Digest of Technical Papers, 2002, pp. 270–271.
[6]
K. Nie, et al., A single slope ADC with row-wise noise reduction technique for CMOS image sensor, IEEE Transactions on Circuits and Systems I: Regular Papers 67 (9) (Sept. 2020) 2873–2882.
[7]
M.F. Snoeij, et al., A CMOS imager with column-level ADC using dynamic column fixed-pattern noise reduction, IEEE J. Solid State Circ. 41 (12) (Dec. 2006) 3007–3015.
[8]
Z. Zhou, et al., CMOS active pixel sensor with on-chip successive approximation analog-to-digital converter, IEEE Trans. Electron. Dev. 44 (10) (Oct. 1997) 1759–1763.
[9]
M.F. Snoeij, et al., Multiple-ramp column-parallel ADC architectures for CMOS image sensors, IEEE J. Solid State Circ. 42 (12) (Dec. 2007) 2968–2977.
[10]
I. Park, et al., 5.4 A 76mW 500fps VGA CMOS Image Sensor with Time-Stretched Single-Slope ADCs Achieving 1.95e- Random Noise, IEEE International Solid-State Circuits Conference (ISSCC), 2019, pp. 100–102.
[11]
H. Kim, 11-bit column-parallel single-slope ADC with first-step half-reference ramping scheme for high-speed CMOS image sensors, IEEE J. Solid State Circ. 56 (7) (July 2021) 2132–2141.
[12]
D. Uchida, et al., A 12-bit, 5.5-μW single-slope ADC using intermittent working TDC with multi-phase clock signals, IEEE International Conference on Electronics, Circuits and Systems (ICECS) (2014) 770–773.
[13]
J. Gao, et al., A 2.44μs row conversion time 12-bit high-speed differential single-slope ADC with TDC applied to CMOS image sensor, Microelectron. J. 120 (February 2022).
[14]
Y. Seo, et al., A 1.25 ps resolution 8b cyclic TDC in 0.13 μm CMOS, IEEE J. Solid State Circ. 47 (3) (March 2012) 736–743.
[15]
B. Ginetti, et al., A CMOS 13-b cyclic RSD A/D converter, IEEE J. Solid State Circ. 27 (7) (July 1992) 957–964.
[16]
T. Toyama, et al., A 17.7Mpixel 120fps CMOS Image Sensor with 34.8Gb/s Readout, IEEE International Solid-State Circuits Conference, 2011, pp. 420–422.
[17]
G. Meynants, et al., A 47 M pixel 36.4 × 27.6 mm 230 fps global shutter image sensor, Image Sens (2017) 399–403.
[18]
T.-H. Tsai, et al., A 12-bit, 0.9-μs single-slope ADC for embedded TDI-CCD and CMOS line-scan image sensor, Image Sens (2017) 332–335.
[19]
T L, et al., A 12-bit high-speed column-parallel two-step single-slope analog-to-digital converter (ADC) for CMOS image sensors, Sensors 14 (11) (2014) 957–964. 21603-21625.

Cited By

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  • (2024)A 180 fps WVGA CIS with 3.2e− TRN and dual-readout modesMicroelectronics Journal10.1016/j.mejo.2024.106196148:COnline publication date: 1-Jun-2024
  • (2023)A high area-and-energy efficiency 12-bit column-parallel SAR/SS ADC for high-speed infrared focal plane readout circuits with error correctionMicroelectronics Journal10.1016/j.mejo.2023.105918140:COnline publication date: 1-Oct-2023

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Information

Published In

cover image Microelectronics Journal
Microelectronics Journal  Volume 135, Issue C
May 2023
201 pages

Publisher

Elsevier Science Publishers B. V.

Netherlands

Publication History

Published: 01 May 2023

Author Tags

  1. CMOS image Sensor
  2. Column-parallel readout
  3. High-speed SS ADC
  4. MSB
  5. Cyclic TDC
  6. 2×Time amplifier (TA)

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View all
  • (2024)A 180 fps WVGA CIS with 3.2e− TRN and dual-readout modesMicroelectronics Journal10.1016/j.mejo.2024.106196148:COnline publication date: 1-Jun-2024
  • (2023)A high area-and-energy efficiency 12-bit column-parallel SAR/SS ADC for high-speed infrared focal plane readout circuits with error correctionMicroelectronics Journal10.1016/j.mejo.2023.105918140:COnline publication date: 1-Oct-2023

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