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Full chip leakage estimation considering power supply and temperature variations

Published: 25 August 2003 Publication History

Abstract

Leakage power is emerging as a key design challenge in current and future CMOS designs. Since leakage is critically dependent on operating temperature and power supply, we present a full chip leakage estimation technique which accurately accounts for power supply and temperature variations. State of the art techniques are used to compute the thermal and power supply profile of the entire chip. Closed-form models are presented which relate leakage to temperature and VDD variations. These models coupled with the thermal and VDD profile are used to generate an accurate full chip leakage estimation technique considering environmental variations. The results of this approach are demonstrated on large-scale industrial designs.

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    cover image ACM Conferences
    ISLPED '03: Proceedings of the 2003 international symposium on Low power electronics and design
    August 2003
    502 pages
    ISBN:158113682X
    DOI:10.1145/871506
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    New York, NY, United States

    Publication History

    Published: 25 August 2003

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    Author Tags

    1. leakage power
    2. supply voltage variation
    3. thermal analysis

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    ISLPED '03 Paper Acceptance Rate 90 of 221 submissions, 41%;
    Overall Acceptance Rate 398 of 1,159 submissions, 34%

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    Cited By

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    • (2021)A Novel Thermal Modeling of Through Silicon Vias in 3-D IC structuresInternational Journal of Materials10.46300/91018.2020.7.197(104-110)Online publication date: 15-Jan-2021
    • (2021)Brain-Inspired Golden Chip Free Hardware Trojan DetectionIEEE Transactions on Information Forensics and Security10.1109/TIFS.2021.306298916(2697-2708)Online publication date: 2021
    • (2021)PROWAVES: Proactive Runtime Wavelength Selection for Energy-Efficient Photonic NoCsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2020.303732740:10(2156-2169)Online publication date: Oct-2021
    • (2021)Cost-efficient overclocking in immersion-cooled datacentersProceedings of the 48th Annual International Symposium on Computer Architecture10.1109/ISCA52012.2021.00055(623-636)Online publication date: 14-Jun-2021
    • (2020)An Improved Q-Learning for System Power Optimization with Temperature, Performance and Energy Constraint Modeling2020 IEEE Conference on Telecommunications, Optics and Computer Science (TOCS)10.1109/TOCS50858.2020.9339699(348-354)Online publication date: 11-Dec-2020
    • (2020) Experimental Analysis of Server Fan Control Strategies for Improved Data Center Air-based Thermal Management * 2020 19th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm)10.1109/ITherm45881.2020.9190337(341-349)Online publication date: Jul-2020
    • (2019)Adaptive Transient Leakage-Aware Linearised Model for Thermal Analysis of 3-D ICs2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)10.23919/DATE.2019.8714867(268-271)Online publication date: Mar-2019
    • (2019)A Survey of Chip-level Thermal SimulatorsACM Computing Surveys10.1145/330954452:2(1-35)Online publication date: 30-Apr-2019
    • (2018)A novel power model for future heterogeneous 3D chip-multiprocessors in the dark silicon ageEURASIP Journal on Embedded Systems10.1186/s13639-018-0086-12018:1Online publication date: 27-Jul-2018
    • (2018)Leakage Models for High-Level Power EstimationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2017.276051937:8(1627-1639)Online publication date: Aug-2018
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