Cited By
View all- Sato YIkeya TNakao MNagumo T(2000)A BIST Approach for Very Deep Sub-Micron (VDSM) DefectsProceedings of the 2000 IEEE International Test Conference10.5555/839295.843635Online publication date: 3-Oct-2000
- Kikuchi JSasaki THashimoto TMiyamoto KYoshida K(2000)Delay-optimal wiring plan for the microprocessor of high performance computing machinesProceedings of the 2000 Asia and South Pacific Design Automation Conference10.1145/368434.368629(265-270)Online publication date: 28-Jan-2000
- Sato YIkeya TNakao MNagumo T(2000)A BIST approach for very deep sub-micron (VDSM) defectsProceedings International Test Conference 2000 (IEEE Cat. No.00CH37159)10.1109/TEST.2000.894216(283-291)Online publication date: 2000
- Show More Cited By