Diagnosing scan chain faults

The amount of die area consumed by scan chains and scan control circuit can range from 15%~30%, and scan chain failures account for almost 50% of chip failures. As the conventional diagnosis process usually runs on the faulty free scan chain, scan chain ...

Diagnosis of scan chain faults is important for yield learning and improvement. Procedures that generate tests for diagnosis of scan chain faults produce scan-based tests with one or more functional capture cycles between a scan-in and a scan-out ...

A diagnosis technique is presented to locate multiple timing faults in scan chains. Jump simulation is a novel parallel simulation technique which quickly searches for the upper and the lower bounds of every individual fault. The proposed technique ...