Article

Degradation Analysis and Mitigation in FPGAs

Authors:

Edward Stott,

Justin S. J. Wong,

Peter Y. K. CheungAuthors Info & Claims

FPL '10: Proceedings of the 2010 International Conference on Field Programmable Logic and Applications

Pages 428 - 433

https://doi.org/10.1109/FPL.2010.88

Published: 31 August 2010 Publication History

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Abstract

FPGAs are powerful platforms for investigating impending challenges associated with process scaling, such as variation and degradation. Their versatility allows us to gather empirical data and evaluate novel solutions. We carried out accelerated-life tests on modern FPGA devices and obtained a useful characterisation of the ageing processes that afflict them. We also quantified the potential benefits of three degradation mitigation strategies based on exploiting spare logic and interconnect resources. The work helps cement the role of reconfigurable logic as a vitally-important technology in the face of the uncertainties of future process scaling.

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Lanzieri LMartino GFey GSchlarb HSchmidt TWählisch M(2024)A Review of Techniques for Ageing Detection and Monitoring on Embedded SystemsACM Computing Surveys10.1145/369524757:1(1-34)Online publication date: 7-Oct-2024
https://dl.acm.org/doi/10.1145/3695247
Davis JHung ELevine JStott ECheung PConstantinides G(2018)KAPowACM Transactions on Reconfigurable Technology and Systems10.1145/312978911:1(1-22)Online publication date: 9-Jan-2018
https://dl.acm.org/doi/10.1145/3129789
Xue YYang CHu J(2017)Age-aware Logic and Memory Co-Placement for RRAM-FPGAsProceedings of the 54th Annual Design Automation Conference 201710.1145/3061639.3062198(1-6)Online publication date: 18-Jun-2017
https://dl.acm.org/doi/10.1145/3061639.3062198
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FPL '10: Proceedings of the 2010 International Conference on Field Programmable Logic and Applications

August 2010

617 pages

ISBN:9780769541792

Publisher

IEEE Computer Society

United States

Publication History

Published: 31 August 2010

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Lanzieri LMartino GFey GSchlarb HSchmidt TWählisch M(2024)A Review of Techniques for Ageing Detection and Monitoring on Embedded SystemsACM Computing Surveys10.1145/369524757:1(1-34)Online publication date: 7-Oct-2024
https://dl.acm.org/doi/10.1145/3695247
Davis JHung ELevine JStott ECheung PConstantinides G(2018)KAPowACM Transactions on Reconfigurable Technology and Systems10.1145/312978911:1(1-22)Online publication date: 9-Jan-2018
https://dl.acm.org/doi/10.1145/3129789
Xue YYang CHu J(2017)Age-aware Logic and Memory Co-Placement for RRAM-FPGAsProceedings of the 54th Annual Design Automation Conference 201710.1145/3061639.3062198(1-6)Online publication date: 18-Jun-2017
https://dl.acm.org/doi/10.1145/3061639.3062198
Gupte AVyas SJones P(2015)A Fault-Aware Toolchain Approach for FPGA Fault ToleranceACM Transactions on Design Automation of Electronic Systems10.1145/269983820:2(1-22)Online publication date: 2-Mar-2015
https://dl.acm.org/doi/10.1145/2699838
Pfeifer PPliva Z(2014)A new method for in situ measurement of parameters and degradation processes in modern nanoscale programmable devicesMicroprocessors & Microsystems10.1016/j.micpro.2014.04.00838:6(605-619)Online publication date: 1-Aug-2014
https://dl.acm.org/doi/10.1016/j.micpro.2014.04.008

Abstract

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