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10.1109/ATS.2008.73guideproceedingsArticle/Chapter ViewAbstractPublication PagesConference Proceedingsacm-pubtype
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Test Generation for State Retention Logic

Published: 24 November 2008 Publication History

Abstract

As low power designs with multiple switchable power domains become more common, there is a need to ensure that the low power component structures in the design –such as isolation cells, state retention logic, and level shifters – are robustly tested during manufacturing test. This paper describes some of the challenges involved intesting low power components like state retention logic and proposes a novel method for testing them by cycling through the power modes of the chip to test the irretention capability.
  1. Test Generation for State Retention Logic

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    Published In

    cover image Guide Proceedings
    ATS '08: Proceedings of the 2008 17th Asian Test Symposium
    November 2008
    378 pages
    ISBN:9780769533964

    Publisher

    IEEE Computer Society

    United States

    Publication History

    Published: 24 November 2008

    Author Tags

    1. ATPG
    2. power gating
    3. power shutoff
    4. state retention
    5. test generation

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