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- research-articleAugust 2020
Steady state driven power gating for lightening always-on state retention storage
ISLPED '20: Proceedings of the ACM/IEEE International Symposium on Low Power Electronics and DesignPages 79–84https://doi.org/10.1145/3370748.3406556It is generally known that a considerable portion of flip-flops in circuits is occupied by the ones with mux-feedback loop (called self-loop), which are the critical (inherently unavoidable) bottleneck in minimizing total (always-on) storage size for ...
- research-articleNovember 2017
State retention for power gated design with non-uniform multi-bit retention latches
Retention registers/latches are commonly applied to power-gated circuits for state retention during the sleep mode. Recent studies have shown that applying uniform multi-bit retention registers (MBRRs) can reduce the storage size, and hence save more ...
- ArticleDecember 2011
A Test Method for Power Management of SoC-based Microprocessors
MTV '11: Proceedings of the 2011 12th International Workshop on Microprocessor Test and VerificationPages 28–31https://doi.org/10.1109/MTV.2011.14Power management in system-on-chip (SoC) has become one of the most crucial techniques for mobile devices. Among many intellectual properties (IPs) of SoC, a microprocessor, which is one of the major power consumers in the system, is a key component in ...
- ArticleNovember 2009
Why is Conventional ATPG Not Sufficient for Advanced Low Power Designs?
Designs using advanced low power techniques like Multi- Supply Multi-Voltage and Power Shutoff bring with them a new set of challenges that manufacturing test must deal with carefully. These designs have low power components – isolation cells, retention ...
- ArticleSeptember 2009
Low-power dual-edge triggered state retention scan flip-flop
PATMOS'09: Proceedings of the 19th international conference on Integrated Circuit and System Design: power and Timing Modeling, Optimization and SimulationPages 156–164https://doi.org/10.1007/978-3-642-11802-9_20This work presents a low-power dual-edge triggered static scanable flip-flop that uses reduced swing-clock and -data to manage dynamic power. The circuit employs clock- and power-gating during idle mode to eliminate dynamic power and reduce static power,...
- ArticleNovember 2008
Test Generation for State Retention Logic
ATS '08: Proceedings of the 2008 17th Asian Test SymposiumPages 237–242https://doi.org/10.1109/ATS.2008.73As low power designs with multiple switchable power domains become more common, there is a need to ensure that the low power component structures in the design –such as isolation cells, state retention logic, and level shifters – are robustly tested ...