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Weibull Based Analytical Waveform Model

Published: 09 November 2003 Publication History

Abstract

Current CMOS technologies are characterized by interconnectlines with increased relative resistance w.r.t. driver outputresistance. Designs generate signal waveshapes that are verydifficult to model using a single parameter model such as thetransition time. In this paper, we present a simple and robustparameter analytical expression for waveform modeling based onthe Weibull cumulative distribution function. The Weibull modelaccurately captures the variety of waveshapes without introducingsignificant runtime overhead and produces results with less than5% error. We also present a fast and simple algorithm to convertwaveforms obtained by circuit simulation to the Weibull model. Amethodology for characterizing gates for the new model is alsopresented. Simulation results for many single and multiple inputgates show errors well below 5%. Our model can be used in amixed environment where some signals may still be characterizedby a single parameter.

References

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{4} Dartu, F. and Pillage, L. T., "Modeling signal waveshapes for empirical CMOS gate delay models," 6th Intl. Workshop PATMOS '96, pp. 57-66, 1996.
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{5} Hashimoto, M., Yamada Y., and Onodera H., "Capturing crosstalk-induced waveform for accurate static timing analysis," Proceedings of ACM/SIGDA ISPD, pp. 18-23, 2003.
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{6} Hayter, A. J., Probability and Statistics for Engineers and Scientists, Second Edition. Duxbury Press, 2002.
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{7} Liu, F., Kashyap, C., and Alpert, C., "A delay metric for RC circuits based on the Weibull distribution," Proceedings of the IEEE/ACM International Conference on Computer Aided Design, pp. 620-624, 2002.
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{8} Lin, T., Acar, E., and Pileggi, L., "h-gamma: An RC delay metric based on a Gamma distribution approximation of the homogenous response," Proceedings of the IEEE/ACM International Conference on Computer Aided Design, pp. 19- 25, 1998.
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{9} Weste, N. H. E. and Eshragian, K., Principles of CMOS VLSI Design, 2nd edition, Addison-Wesley Publishing Company, 1992.
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Cited By

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  • (2008)A "true" electrical cell model for timing, noise, and power grid verificationProceedings of the 45th annual Design Automation Conference10.1145/1391469.1391589(462-467)Online publication date: 8-Jun-2008
  • (2008)Statistical waveform and current source based standard cell models for accurate timing analysisProceedings of the 45th annual Design Automation Conference10.1145/1391469.1391526(227-230)Online publication date: 8-Jun-2008
  • (2008)A noniterative equivalent waveform model for timing analysis in presence of crosstalkACM Transactions on Design Automation of Electronic Systems10.1145/1344418.134442113:2(1-21)Online publication date: 23-Apr-2008
  • Show More Cited By

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cover image ACM Conferences
ICCAD '03: Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
November 2003
899 pages
ISBN:1581137621

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IEEE Computer Society

United States

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Published: 09 November 2003

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ICCAD '03 Paper Acceptance Rate 129 of 490 submissions, 26%;
Overall Acceptance Rate 457 of 1,762 submissions, 26%

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Cited By

View all
  • (2008)A "true" electrical cell model for timing, noise, and power grid verificationProceedings of the 45th annual Design Automation Conference10.1145/1391469.1391589(462-467)Online publication date: 8-Jun-2008
  • (2008)Statistical waveform and current source based standard cell models for accurate timing analysisProceedings of the 45th annual Design Automation Conference10.1145/1391469.1391526(227-230)Online publication date: 8-Jun-2008
  • (2008)A noniterative equivalent waveform model for timing analysis in presence of crosstalkACM Transactions on Design Automation of Electronic Systems10.1145/1344418.134442113:2(1-21)Online publication date: 23-Apr-2008
  • (2007)Crosstalk waveform modeling using wave fittingProceedings of the 17th international conference on Integrated Circuit and System Design: power and timing modeling, optimization and simulation10.5555/2391795.2391822(211-221)Online publication date: 3-Sep-2007
  • (2007)A nonlinear cell macromodel for digital applicationsProceedings of the 2007 IEEE/ACM international conference on Computer-aided design10.5555/1326073.1326217(678-685)Online publication date: 5-Nov-2007
  • (2007)Characterizing multistage nonlinear drivers and variability for accurate timing and noise analysisIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2007.90410015:11(1205-1214)Online publication date: 1-Nov-2007
  • (2006)A multi-port current source model for multiple-input switching effects in CMOS library cellsProceedings of the 43rd annual Design Automation Conference10.1145/1146909.1146974(247-252)Online publication date: 24-Jul-2006
  • (2005)A robust method for estimating Weibull parametersProceedings of the 4th WSEAS International Conference on Applied Mathematics and Computer Science10.5555/1374038.1374067(1-5)Online publication date: 25-Apr-2005
  • (2005)Accurate delay computation for noisy waveform shapesProceedings of the 2005 IEEE/ACM International conference on Computer-aided design10.5555/1129601.1129735(947-953)Online publication date: 31-May-2005
  • (2005)Statistical modeling of cross-coupling effects in VLSI interconnectsProceedings of the 2005 Asia and South Pacific Design Automation Conference10.1145/1120725.1120922(503-506)Online publication date: 18-Jan-2005
  • Show More Cited By

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