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View all- Cong JGupta PLee J(2010)Evaluating statistical power optimizationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2010.206139029:11(1750-1762)Online publication date: 1-Nov-2010
In response to the increasing variations in integrated-circuit manufacturing, the current trend is to create designs that take these variations into account statistically. In this paper, we quantify the difference between the statistical and ...
Process Variation has become a crucial challenge on both interconnect delay and reliability of nanometer integrated circuit designs. Furthermore, the dramatic increase of power consumption and integration density has led to high operating temperature. ...
Aging effect degrades circuit performance in the runtime, interacts with fabrication-induced device parameter variation, and thus posing significant impact on circuit lifetime reliability. In this work, a statistical circuit optimization flow is ...
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