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Random pattern testable logic synthesis

Authors:

Chen-Huan Chiang,

Sandeep K. GuptaAuthors Info & Claims

ICCAD '94: Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design

Pages 125 - 128

Published: 06 November 1994 Publication History

Abstract

Previous procedures for synthesis of testable logic guarantee that all faults in the synthesized circuits are detectable. However, the detectability of many faults in these circuits can be very low leading to poor random pattern testability. A new procedure to perform logic synthesis that synthesizes random pattern testable multilevel circuits is proposed. Experimental results show that the circuits synthesized by the proposed procedure tstfx are significantly more random pattern testable and smaller than those synthesized using its counterpart fast_extract (fx) in SIS. The proposed synthesis procedure design circuits that require only simple random pattern generators in built-in self-test, thereby obviating the need for complex BIST circuitry.

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Cited By

Chatterjee MPradhan D(2003)A BIST Pattern Generator Design for Near-Perfect Fault CoverageIEEE Transactions on Computers10.1109/TC.2003.125285152:12(1543-1558)Online publication date: 1-Dec-2003
https://dl.acm.org/doi/10.1109/TC.2003.1252851
Zhang JHuynh SSoma M(1999)A Test Point Insertion Algorithm for Mixed-Signal CircuitsProceedings of the 1999 17TH IEEE VLSI Test Symposium10.5555/832299.836532Online publication date: 26-Apr-1999
https://dl.acm.org/doi/10.5555/832299.836532
Zhao ZPouya BTouba N(1998)BETSYProceedings of the 1998 IEEE International Test Conference10.5555/648020.745637(144-153)Online publication date: 18-Oct-1998
https://dl.acm.org/doi/10.5555/648020.745637
Show More Cited By

Index Terms

Random pattern testable logic synthesis
1. Hardware
  1. Electronic design automation
    1. High-level and register-transfer level synthesis
  2. Hardware test
    1. Design for testability

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The advantage of random testing is that test application can be performed at a low cost in the BIST scheme. However, not all circuits are random pattern testable. In this paper, we present a method for improving random pattern testability of logic ...

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Information & Contributors

Information

Published In

cover image ACM Conferences

ICCAD '94: Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design

November 1994

771 pages

ISBN:0897916905

Chairmen:
Jochen A. G. Jess
Eindhoven Univ. of Technology, Eindhoven, The Netherlands
,
Richard Rudell
Synopsys, Inc., Mountain View, CA

Sponsors

SIGDA: ACM Special Interest Group on Design Automation
IEEE-CS: Computer Society

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IEEE Computer Society Press

Washington, DC, United States

Publication History

Published: 06 November 1994

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ICCAD '94

Sponsor:

SIGDA
IEEE-CS

ICCAD '94: International Conference on Computer Aided Design

November 6 - 10, 1994

California, San Jose, USA

Acceptance Rates

Overall Acceptance Rate 457 of 1,762 submissions, 26%

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Citations

Cited By

Chatterjee MPradhan D(2003)A BIST Pattern Generator Design for Near-Perfect Fault CoverageIEEE Transactions on Computers10.1109/TC.2003.125285152:12(1543-1558)Online publication date: 1-Dec-2003
https://dl.acm.org/doi/10.1109/TC.2003.1252851
Zhang JHuynh SSoma M(1999)A Test Point Insertion Algorithm for Mixed-Signal CircuitsProceedings of the 1999 17TH IEEE VLSI Test Symposium10.5555/832299.836532Online publication date: 26-Apr-1999
https://dl.acm.org/doi/10.5555/832299.836532
Zhao ZPouya BTouba N(1998)BETSYProceedings of the 1998 IEEE International Test Conference10.5555/648020.745637(144-153)Online publication date: 18-Oct-1998
https://dl.acm.org/doi/10.5555/648020.745637
Chatterjee MPradhan DKunz WRudell R(1995)LOTProceedings of the 1995 IEEE/ACM international conference on Computer-aided design10.5555/224841.225057(318-325)Online publication date: 1-Dec-1995
https://dl.acm.org/doi/10.5555/224841.225057
Pomeranz IReddy SPreas B(1995)On synthesis-for-testability of combinational logic circuitsProceedings of the 32nd annual ACM/IEEE Design Automation Conference10.1145/217474.217518(126-132)Online publication date: 1-Jan-1995
https://dl.acm.org/doi/10.1145/217474.217518

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