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View all- Ibrahim AIbrahim AEl-Kharashi MSafar M(2023)Adaptive SAT Modeling for Optimal Pattern Retargeting in IEEE 1687 NetworksIEEE Transactions on Computers10.1109/TC.2023.333619873:2(536-547)Online publication date: 1-Dec-2023
Automatic test pattern generation (ATPG) based on the Boolean satisfiability (SAT) problem has recently been proven to be a beneficial complement to traditional methods. Efficient SAT techniques yield a robust fault classification. In this paper, we ...
While the advancement in semiconductor technologies enables manufacturing of highly advanced and complex integrated circuits, there is an increasing need of embedded (on-chip) instruments for test, debug, diagnosis, configuration, monitoring, etc. A key ...
Due to the rapidly growing size of integrated circuits, there is a need for new algorithms for automatic test pattern generation (ATPG). While classical algorithms reach their limit, there have been recent advances in algorithms to solve Boolean ...
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