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Understanding Reduced-Voltage Operation in Modern DRAM Devices: Experimental Characterization, Analysis, and Mechanisms

Published: 05 June 2017 Publication History

Abstract

The energy consumption of DRAM is a critical concern in modern computing systems. Improvements in manufacturing process technology have allowed DRAM vendors to lower the DRAM supply voltage conservatively, which reduces some of the DRAM energy consumption. We would like to reduce the DRAM supply voltage more aggressively, to further reduce energy. Aggressive supply voltage reduction requires a thorough understanding of the effect voltage scaling has on DRAM access latency and DRAM reliability. In this paper, we take a comprehensive approach to understanding and exploiting the latency and reliability characteristics of modern DRAM when the supply voltage is lowered below the nominal voltage level specified by manufacturers.

Cited By

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  • (2024)Spatial Variation-Aware Read Disturbance Defenses: Experimental Analysis of Real DRAM Chips and Implications on Future Solutions2024 IEEE International Symposium on High-Performance Computer Architecture (HPCA)10.1109/HPCA57654.2024.00048(560-577)Online publication date: 2-Mar-2024
  • (2024)Functionally-Complete Boolean Logic in Real DRAM Chips: Experimental Characterization and Analysis2024 IEEE International Symposium on High-Performance Computer Architecture (HPCA)10.1109/HPCA57654.2024.00030(280-296)Online publication date: 2-Mar-2024
  • (2024)Simultaneous Many-Row Activation in Off-the-Shelf DRAM Chips: Experimental Characterization and Analysis2024 54th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)10.1109/DSN58291.2024.00024(99-114)Online publication date: 24-Jun-2024
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Published In

cover image ACM SIGMETRICS Performance Evaluation Review
ACM SIGMETRICS Performance Evaluation Review  Volume 45, Issue 1
Performance evaluation review
June 2017
70 pages
ISSN:0163-5999
DOI:10.1145/3143314
Issue’s Table of Contents
  • cover image ACM Conferences
    SIGMETRICS '17 Abstracts: Proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems
    June 2017
    84 pages
    ISBN:9781450350327
    DOI:10.1145/3078505
Permission to make digital or hard copies of part or all of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for third-party components of this work must be honored. For all other uses, contact the Owner/Author.

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 05 June 2017
Published in SIGMETRICS Volume 45, Issue 1

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Author Tags

  1. DRAM
  2. DRAM characterization
  3. energy
  4. memory latency
  5. memory systems
  6. performance
  7. reliability
  8. voltage reduction

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Cited By

View all
  • (2024)Spatial Variation-Aware Read Disturbance Defenses: Experimental Analysis of Real DRAM Chips and Implications on Future Solutions2024 IEEE International Symposium on High-Performance Computer Architecture (HPCA)10.1109/HPCA57654.2024.00048(560-577)Online publication date: 2-Mar-2024
  • (2024)Functionally-Complete Boolean Logic in Real DRAM Chips: Experimental Characterization and Analysis2024 IEEE International Symposium on High-Performance Computer Architecture (HPCA)10.1109/HPCA57654.2024.00030(280-296)Online publication date: 2-Mar-2024
  • (2024)Simultaneous Many-Row Activation in Off-the-Shelf DRAM Chips: Experimental Characterization and Analysis2024 54th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)10.1109/DSN58291.2024.00024(99-114)Online publication date: 24-Jun-2024
  • (2024)SpyHammer: Understanding and Exploiting RowHammer Under Fine-Grained Temperature VariationsIEEE Access10.1109/ACCESS.2024.340938912(80986-81003)Online publication date: 2024
  • (2023)Power-Aware Neuromorphic Architecture With Partial Voltage Scaling 3-D Stacking Synaptic MemoryIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2023.331823131:12(2016-2029)Online publication date: 1-Dec-2023
  • (2023)DRAM Bender: An Extensible and Versatile FPGA-Based Infrastructure to Easily Test State-of-the-Art DRAM ChipsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2023.328217242:12(5098-5112)Online publication date: Dec-2023
  • (2022)AgileWatts: An Energy-Efficient CPU Core Idle-State Architecture for Latency-Sensitive Server Applications2022 55th IEEE/ACM International Symposium on Microarchitecture (MICRO)10.1109/MICRO56248.2022.00063(835-850)Online publication date: Oct-2022
  • (2022)HiRA: Hidden Row Activation for Reducing Refresh Latency of Off-the-Shelf DRAM Chips2022 55th IEEE/ACM International Symposium on Microarchitecture (MICRO)10.1109/MICRO56248.2022.00062(815-834)Online publication date: Oct-2022
  • (2022)DR-STRaNGe: End-to-End System Design for DRAM-based True Random Number Generators2022 IEEE International Symposium on High-Performance Computer Architecture (HPCA)10.1109/HPCA53966.2022.00087(1141-1155)Online publication date: Apr-2022
  • (2022)Understanding RowHammer Under Reduced Wordline Voltage: An Experimental Study Using Real DRAM Devices2022 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)10.1109/DSN53405.2022.00054(475-487)Online publication date: Jun-2022
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