research-article

Estimating MLC NAND flash endurance: a genetic programming based symbolic regression application

Authors:

Conor RyanAuthors Info & Claims

GECCO '13: Proceedings of the 15th annual conference on Genetic and evolutionary computation

Pages 1285 - 1292

https://doi.org/10.1145/2463372.2463537

Published: 06 July 2013 Publication History

Abstract

NAND Flash memory is a multi-billion dollar industry which is projected to continue to show significant growth until at least 2017. Devices such as smart-phones, tablets and Solid State Drives use NAND Flash since it has numerous advantages over Hard Disk Drives including better performance, lower power consumption, and lower weight. However, storage locations within Flash devices have a limited working lifetime, as they slowly degrade through use, eventually becoming unreliable and failing. The number of times a location can be programmed is termed its endurance, and can vary significantly, even between locations within the same device. There is currently no technique available to predict endurance, resulting in manufacturers placing extremely conservative specifications on their Flash devices. We perform symbolic regression using Genetic Programming to estimate the endurance of storage locations, based only on the duration of program and erase operations recorded from them. We show that the quality of estimations for a device can be refined and improved as the device continues to be used, and investigate a number of different approaches to deal with the significant variations in the endurance of storage locations. Results show this technique's huge potential for real-world application.

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Cited By

Wang JFan YDu YHuang SWan Y(2024)Balancing Page Endurance Variation Between Layers to Extend 3D NAND Flash Memory LifetimeMicromachines10.3390/mi1512144715:12(1447)Online publication date: 29-Nov-2024
https://doi.org/10.3390/mi15121447
Pan YLu ZZhang HZhang HArafin MLiu ZQu G(2023)ADLPT: Improving 3D NAND Flash Memory Reliability by Adaptive Lifetime Prediction TechniquesIEEE Transactions on Computers10.1109/TC.2022.321411572:6(1525-1538)Online publication date: 1-Jun-2023
https://doi.org/10.1109/TC.2022.3214115
Pan YZhang HYu RLu ZZhang HLiu Z(2022)LightWarner: Predicting Failure of 3D NAND Flash Memory Using Reinforcement LearningIEEE Transactions on Computers10.1109/TC.2022.3184270(1-14)Online publication date: 2022
https://doi.org/10.1109/TC.2022.3184270
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Index Terms

Estimating MLC NAND flash endurance: a genetic programming based symbolic regression application

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Published In

cover image ACM Conferences

GECCO '13: Proceedings of the 15th annual conference on Genetic and evolutionary computation

July 2013

1672 pages

ISBN:9781450319638

DOI:10.1145/2463372

Editor:
Christian Blum
IKERBASQUE and University of the Basque Country UPV/EHU, Spain
,
General Chair:
Enrique Alba
University of Malaga, Spain

Copyright © 2013 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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SIGEVO: ACM Special Interest Group on Genetic and Evolutionary Computation

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 06 July 2013

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GECCO '13

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SIGEVO

GECCO '13: Genetic and Evolutionary Computation Conference

July 6 - 10, 2013

Amsterdam, The Netherlands

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GECCO '13 Paper Acceptance Rate 204 of 570 submissions, 36%;

Overall Acceptance Rate 1,669 of 4,410 submissions, 38%

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Cited By

Wang JFan YDu YHuang SWan Y(2024)Balancing Page Endurance Variation Between Layers to Extend 3D NAND Flash Memory LifetimeMicromachines10.3390/mi1512144715:12(1447)Online publication date: 29-Nov-2024
https://doi.org/10.3390/mi15121447
Pan YLu ZZhang HZhang HArafin MLiu ZQu G(2023)ADLPT: Improving 3D NAND Flash Memory Reliability by Adaptive Lifetime Prediction TechniquesIEEE Transactions on Computers10.1109/TC.2022.321411572:6(1525-1538)Online publication date: 1-Jun-2023
https://doi.org/10.1109/TC.2022.3214115
Pan YZhang HYu RLu ZZhang HLiu Z(2022)LightWarner: Predicting Failure of 3D NAND Flash Memory Using Reinforcement LearningIEEE Transactions on Computers10.1109/TC.2022.3184270(1-14)Online publication date: 2022
https://doi.org/10.1109/TC.2022.3184270
Zambelli CMicheloni ROlivo P(2022)Machine Learning for 3D NAND Flash and Solid State Drives Reliability/Performance OptimizationMachine Learning and Non-volatile Memories10.1007/978-3-031-03841-9_7(133-156)Online publication date: 26-May-2022
https://doi.org/10.1007/978-3-031-03841-9_7
Ma RWu FXie C(2021)Intelligent Prediction of Flash Lifetime via Online Domain Adaptation2021 IEEE 39th International Conference on Computer Design (ICCD)10.1109/ICCD53106.2021.00081(488-491)Online publication date: Oct-2021
https://doi.org/10.1109/ICCD53106.2021.00081
Ma RWu FLu ZZhong WWu QWan JXie C(2020)BlockHammer: Improving Flash Reliability by Exploiting Process Variation Aware Proactive Failure PredictionIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2020.2981025(1-1)Online publication date: 2020
https://doi.org/10.1109/TCAD.2020.2981025
Zhang TZuck APorter DTsafrir DSong JKim MLane NBalan R(2019)Apps Can Quickly Destroy Your Mobile's FlashProceedings of the 17th Annual International Conference on Mobile Systems, Applications, and Services10.1145/3307334.3326108(207-221)Online publication date: 12-Jun-2019
https://dl.acm.org/doi/10.1145/3307334.3326108
Ma RWu FZhang MLu ZWan JXie C(2019)RBER-Aware Lifetime Prediction Scheme for 3D-TLC NAND Flash MemoryIEEE Access10.1109/ACCESS.2019.29095677(44696-44708)Online publication date: 2019
https://doi.org/10.1109/ACCESS.2019.2909567
Zhu YWu FXiong QXie C(2017)Alert-and-transferProceedings of the Twelfth IEEE/ACM/IFIP International Conference on Hardware/Software Codesign and System Synthesis Companion10.1145/3125502.3125536(1-2)Online publication date: 15-Oct-2017
https://dl.acm.org/doi/10.1145/3125502.3125536
Zhang TZuck APorter DTsafrir D(2017)Flash Drive Lifespan *is* a ProblemProceedings of the 16th Workshop on Hot Topics in Operating Systems10.1145/3102980.3102988(42-49)Online publication date: 7-May-2017
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