MODEST: a model for energy estimation under spatio-temporal variability
Abstract
References
Index Terms
- MODEST: a model for energy estimation under spatio-temporal variability
Recommendations
Cache Design for Low Power and High Yield
ISQED '08: Proceedings of the 9th international symposium on Quality Electronic DesignA novel circuit approach to increase SRAM Static Noise Margin (SNM) and enable lower operating voltage is described. Increasing process variability for new technologies coupled with increased reliability effects like Negative Bias Temperature ...
A reduced voltage swing circuit using a single supply to enable lower voltage operation for SRAM-based memory
This paper presents a new read and write assist technique to enable lower voltage operation for Static Random Access Memory (SRAM). The ability to scale the operating voltage with frequency of the chip has big impact on power consumption (P@av^2). The ...
Energy/power breakdown of pipelined nanometer caches (90nm/65nm/45nm/32nm)
ISLPED '06: Proceedings of the 2006 international symposium on Low power electronics and designAs transistors continue to scale down into the nanometer regime, device leakage currents are becoming the dominant cause of power dissipation in nanometer caches, making it essential to model these leakage effects properly. Moreover, typical ...
Comments
Please enable JavaScript to view thecomments powered by Disqus.Information & Contributors
Information
Published In
- General Chairs:
- Vojin Oklobdzija,
- Barry Pangle,
- Naehyuck Chang,
- Program Chairs:
- Naresh Shanbhag,
- Chris H. Kim
Sponsors
In-Cooperation
- IEEE CAS
Publisher
Association for Computing Machinery
New York, NY, United States
Publication History
Check for updates
Author Tags
Qualifiers
- Poster
Conference
Acceptance Rates
Contributors
Other Metrics
Bibliometrics & Citations
Bibliometrics
Article Metrics
- 0Total Citations
- 157Total Downloads
- Downloads (Last 12 months)0
- Downloads (Last 6 weeks)0
Other Metrics
Citations
View Options
Login options
Check if you have access through your login credentials or your institution to get full access on this article.
Sign in