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Reducing fault dictionary size for million-gate large circuits

Published: 07 April 2009 Publication History

Abstract

In general, fault dictionary is prevented from practical applications in fault diagnosis due to its extremely large size. Several previous works are proposed for the fault dictionary size reduction. However, some of them fail to bring down the size to an acceptable level, and others might not be able to handle today's million-gate circuits due to their high time and space complexity. In this article, an algorithm is presented to reduce the size of pass-fail dictionary while still preserving high diagnostic resolution. The proposed algorithm possesses low time and space complexity by avoiding constructing the huge distinguishability table, which inevitably boosts up the required computation complexity. Experimental results demonstrate that the proposed algorithm is capable of handling industrial million-gate large circuits in a reasonable amount of runtime and memory.

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  • (2019)Counter-Based Output Selection for Test Response CompactionIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2012.221447932:1(152-164)Online publication date: 4-Jan-2019

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    cover image ACM Transactions on Design Automation of Electronic Systems
    ACM Transactions on Design Automation of Electronic Systems  Volume 14, Issue 2
    March 2009
    384 pages
    ISSN:1084-4309
    EISSN:1557-7309
    DOI:10.1145/1497561
    Issue’s Table of Contents
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Publication History

    Published: 07 April 2009
    Accepted: 01 December 2008
    Revised: 01 December 2007
    Received: 01 June 2007
    Published in TODAES Volume 14, Issue 2

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    Author Tags

    1. Fault dictionary
    2. diagnostic resolution
    3. fault diagnosis

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    • (2019)Counter-Based Output Selection for Test Response CompactionIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2012.221447932:1(152-164)Online publication date: 4-Jan-2019

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