• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 50 matches

• 2023
• 
  Costas Argyrides, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian:
  Utilizing ECC Analytics to Improve Memory Lifecycle Management. ITC 2023: 383-387
• 
  Ayush Arunachalam, Sanjay Das, Monikka Rajan, Fei Su, Xiankun Jin, Suvadeep Banerjee, Arnab Raha, Suriyaprakash Natarajan, Kanad Basu:
  Enhanced ML-Based Approach for Functional Safety Improvement in Automotive AMS Circuits. ITC 2023: 266-275
• 
  Ferhat Can Ataman, Y. B. Chethan Kumar, Sandeep Rao, Sule Ozev:
  Improving Angle of Arrival Estimation Accuracy for mm-Wave Radars. ITC 2023: 30-36
• 
  Navajit Singh Baban, Ajymurat Orozaliev, Yong-Ak Song, Urbi Chatterjee, Sankalp Bose, Sukanta Bhattacharjee, Ramesh Karri, Krishnendu Chakrabarty:
  Biochip-PUF: Physically Unclonable Function for Microfluidic Biochips. ITC 2023: 166-175
• 
  Anshuman Chandra, Moiz Khan, Ankita Patidar, Fumiaki Takashima, Sandeep Kumar Goel, Bharath Shankaranarayanan, Vuong Nguyen, Vistrita Tyagi, Manish Arora:
  A Case Study on IEEE 1838 Compliant Multi-Die 3DIC DFT Implementation. ITC 2023: 11-20
• 
  Daehyun Chang, Youngdae Kim, Suksoo Pyo, Shin Hun, Daesop Lee, Sohee Hwang, Jaesik Choi, Siwoong Kim:
  Algorithmic Read Resistance Trim for Improving Yield and Reducing Test Time in MRAM. ITC 2023: 87-92
• 
  Manoj Devendhiran, Jakub Janicki, Szczepan Urban, Manish Sharma, Jayant D'Souza:
  Predicting the Resolution of Scan Diagnosis. ITC 2023: 303-309
• 
  Cyrille Dray, Khushal Gelda, Benoit Nadeau-Dostie, Wei Zou, Luc Romain, Jongsin Yun, Harshitha Kodali, Lori Schramm, Martin Keim:
  Transitioning eMRAM from Pilot Project to Volume Production. ITC 2023: 82-86
• 
  Anuj Dubey, Aydin Aysu:
  A Full-Stack Approach for Side-Channel Secure ML Hardware. ITC 2023: 186-195
• 
  Matthew Dupree, Min Jian Yang, Yueling Jenny Zeng, Li-C. Wang:
  IEA-Plot: Conducting Wafer-Based Data Analytics Through Chat. ITC 2023: 122-131
• 
  Makoto Eiki, Tomoki Nakamura, Masuo Kajiyama, Michiko Inoue, Takashi Sato, Michihiro Shintani:
  Improving Efficiency and Robustness of Gaussian Process Based Outlier Detection via Ensemble Learning. ITC 2023: 132-140
• 
  Seyedeh Maryam Ghasemi, Sergej Meschkov, Jonas Krautter, Dennis R. E. Gnad, Mehdi B. Tahoori:
  Enabling In-Field Parametric Testing for RISC-V Cores. ITC 2023: 367-376
• 
  Dimitris Gizopoulos, George Papadimitriou, Odysseas Chatzopoulos:
  Estimating the Failures and Silent Errors Rates of CPUs Across ISAs and Microarchitectures. ITC 2023: 377-382
• 
  Yunfei Gu, Xingyu Wang, Zixiao Chen, Chentao Wu, Xinfei Guo, Jie Li, Minyi Guo, Song Wu, Rong Yuan, Taile Zhang, Yawen Zhang, Haoran Cai:
  Improving Productivity and Efficiency of SSD Manufacturing Self-Test Process by Learning-Based Proactive Defect Prediction. ITC 2023: 226-235
• 
  Ryan Holzhausen, Tasnuva Farheen, Morgan Thomas, Nima Maghari, Domenic Forte:
  Laser Fault Injection Vulnerability Assessment and Mitigation with Case Study on PG-TVD Logic Cells. ITC 2023: 330-339
• 
  Sam M.-H. Hsiao, Amy H.-Y. Tsai, Lowry P.-T. Wang, Aaron C.-W. Liang, Charles H.-P. Wen, Herming Chiueh:
  Preventing Single-Event Double-Node Upsets by Engineering Change Order in Latch Designs. ITC 2023: 276-285
• 
  Bing-Han Hsieh, Yun-Sheng Liu, James Chien-Mo Li, Chris Nigh, Mason Chern, Gaurav Bhargava:
  Diagnosis of Systematic Delay Failures Through Subset Relationship Analysis. ITC 2023: 293-302
• 
  Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty:
  Scan Cell Segmentation Based on Reinforcement Learning for Power-Safe Testing of Monolithic 3D ICs. ITC 2023: 216-225
• 
  Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima, Oussama Laouamri, Naveen Khanna, Jeff Mayer, Nilanjan Mukherjee:
  A New Framework for RTL Test Points Insertion Facilitating a "Shift-Left DFT" Strategy. ITC 2023: 1-10
• 
  Hanieh Jafarzadeh, Florian Klemme, Jan Dennis Reimer, Zahra Paria Najafi-Haghi, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich:
  Robust Pattern Generation for Small Delay Faults Under Process Variations. ITC 2023: 111-116
• 
  Kranthi Kandula, Ramalingam Kolisetti, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian:
  SLM Subsystem for Automotive SoC: Case Study on Path Margin Monitor. ITC 2023: 388-392
• 
  Rasheed Kibria, Farimah Farahmandi, Mark M. Tehranipoor:
  ARC-FSM-G: Automatic Security Rule Checking for Finite State Machine at the Netlist Abstraction. ITC 2023: 320-329
• 
  Suhasini Komarraju, Akhil Tammana, Chandramouli N. Amarnath, Abhijit Chatterjee:
  OATT: Outlier Oriented Alternative Testing and Post-Manufacture Tuning of Mixed-Signal/RF Circuits and Systems. ITC 2023: 37-46
• 
  Sudhakar Kongala, Anuj Gupta, Yash Walia, Sahil Jain:
  Novel Methodology to Optimize TAT and Resource Utilization for ATPG Simulations for Large SoCs. ITC 2023: 60-64
• 
  Seongkwan Lee, Minho Kang, Cheolmin Park, Jun Yeon Won, Jaemoo Choi:
  Method for Adjusting Termination Resistance Using PMU in DC Test. ITC 2023: 77-81
• 
  Seongkwan Lee, Jun Yeon Won, Cheolmin Park, Minho Kang, Jaemoo Choi:
  Method for Diagnosing Channel Damage Using FPGA Transceiver. ITC 2023: 71-76
• 
  J. Lefevre, P. Debaud, Patrick Girard, Arnaud Virazel:
  Predictor BIST: An "All-in-One" Optical Test Solution for CMOS Image Sensors. ITC 2023: 310-319
• 
  Yu Li, Qiang Xu:
  Towards Robust Deep Neural Networks Against Design-Time and Run-Time Failures. ITC 2023: 196-205
• 
  Huaxiao Liang, Xiaoze Lin, Liyang Lai, Naixing Wang, Yu Huang, Fei Yang, Yuxin Yang:
  GPU-Based Concurrent Static Learning. ITC 2023: 159-165
• 
  Zhe-Jia Liang, Yu-Tsung Wu, Yun-Feng Yang, James Chien-Mo Li, Norman Chang, Akhilesh Kumar, Ying-Shiun Li:
  High-Speed, Low-Storage Power and Thermal Predictions for ATPG Test Patterns. ITC 2023: 206-215

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