default search action

combined dblp search
author search
venue search
publication search

ask others

"Algorithmic Read Resistance Trim for Improving Yield and Reducing Test ..."

Daehyun Chang et al. (2023)

> Home

Details and statistics

DOI: 10.1109/ITC51656.2023.00022

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/itc/ChangKPHLHCK23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/ChangKPHLHCK23
Daehyun Chang, Youngdae Kim, Suksoo Pyo, Shin Hun, Daesop Lee, Sohee Hwang, Jaesik Choi, Siwoong Kim:
Algorithmic Read Resistance Trim for Improving Yield and Reducing Test Time in MRAM. ITC 2023: 87-92

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.