default search action

combined dblp search
author search
venue search
publication search

ask others

"Buried Silicon-Germanium pMOSFETs: Experimental Analysis in VLSI Logic ..."

Felice Crupi et al. (2012)

> Home

Details and statistics

DOI: 10.1109/TVLSI.2011.2159870

access: closed

type: Journal Article

metadata version: 2020-03-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tvlsi/CrupiAFMKGMWH12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tvlsi/CrupiAFMKGMWH12
Felice Crupi, Massimo Alioto, Jacopo Franco, Paolo Magnone, Ben Kaczer, Guido Groeseneken, Jérôme Mitard, Liesbeth Witters, Thomas Y. Hoffmann:
Buried Silicon-Germanium pMOSFETs: Experimental Analysis in VLSI Logic Circuits Under Aggressive Voltage Scaling. IEEE Trans. Very Large Scale Integr. Syst. 20(8): 1487-1495 (2012)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.