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"Hot spot analysis during thermal shutdown of SOI BCDMOS half bridge driver ..."

Michael Heer et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.07.009

access: closed

type: Journal Article

metadata version: 2020-02-22

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Michael Heer, P. Grombach, A. Heid, Dionyz Pogany:
Hot spot analysis during thermal shutdown of SOI BCDMOS half bridge driver for automotive applications. Microelectron. Reliab. 48(8-9): 1525-1528 (2008)

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