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"Pseudo Functional Path Delay Test through Embedded Memories."

Yukun Gao et al. (2015)

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DOI: 10.1007/S10836-014-5497-X

access: closed

type: Journal Article

metadata version: 2020-09-11

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  dblp key:
  - journals/et/GaoZPCW15
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  - https://dblp.org/rec/journals/et/GaoZPCW15
Yukun Gao, Tengteng Zhang, Punj Pokharel, Swati Chakraborty, D. M. H. Walker:
Pseudo Functional Path Delay Test through Embedded Memories. J. Electron. Test. 31(1): 35-42 (2015)

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