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"A discrete event systems approach to online testing of digital VLSI circuits."

Santosh Biswas, Siddhartha Mukhopadhyay, Amit Patra (2004)

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DOI: 10.1109/ICSMC.2004.1399876

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Santosh Biswas, Siddhartha Mukhopadhyay, Amit Patra:
A discrete event systems approach to online testing of digital VLSI circuits. SMC (2) 2004: 1699-1704

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