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"A novel test and analysis scheme to elucidate tail bit characteristics in ..."

W. Kim et al. (2024)

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DOI: 10.1109/IMW59701.2024.10536950

access: closed

type: Conference or Workshop Paper

metadata version: 2024-11-12

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  - conf/imw2/KimPJYWCR24
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W. Kim, Valerio Pica, N. Jossart, Farrukh Yasin, Kurt Wostyn, S. Couet, Sidharth Rao:
A novel test and analysis scheme to elucidate tail bit characteristics in STT-MRAM arrays. IMW 2024: 1-4

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