Abstract
In the context of analog BIST for ADC, this paper presents two structures for the internal generation of a linear signal used with the histogram-based test technique. All of these structures use wide-swing current mirrors and an original adaptive system to make the generators less sensitive to process variations. The first structure allows us to generate high quality ramp signal. In a second step, a very high accuracy triangle-wave signal generator is presented in order to improve the equivalent linearity of the generated analog test signal.
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Bernard, S., Azaïs, F., Bertrand, Y. et al. On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST. Journal of Electronic Testing 19, 469–479 (2003). https://doi.org/10.1023/A:1024652328578
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DOI: https://doi.org/10.1023/A:1024652328578