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Kexin Yang 0001
Person information
- affiliation: Synopsys Inc., Mountain View, CA, USA
- affiliation (PhD 2018): Georgia Institute of Technology, Atlanta, GA, USA
Other persons with the same name
- Kexin Yang — disambiguation page
- Kexin Yang 0002
— Sichuan University, China
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2020 – today
- 2022
- [j7]Rui Zhang, Taizhi Liu, Kexin Yang, Linda Milor
CacheEM: For Reliability Analysis on Cache Memory Aging Due to Electromigration. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(9): 3078-3091 (2022) - 2021
- [j6]Rui Zhang
A Comprehensive Framework for Analysis of Time-Dependent Performance-Reliability Degradation of SRAM Cache Memory. IEEE Trans. Very Large Scale Integr. Syst. 29(5): 857-870 (2021) - 2020
- [j5]Rui Zhang
SRAM Stability Analysis and Performance-Reliability Tradeoff for Different Cache Configurations. IEEE Trans. Very Large Scale Integr. Syst. 28(3): 620-633 (2020) - [j4]Yi-Da Wu
Optimal Accelerated Test Framework for Time-Dependent Dielectric Breakdown Lifetime Parameter Estimation. IEEE Trans. Very Large Scale Integr. Syst. 28(12): 2658-2671 (2020) - [c8]Rui Zhang, Zhaocheng Liu, Kexin Yang, Taizhi Liu, Wenshan Cai, Linda Milor
Inverse Design of FinFET SRAM Cells. IRPS 2020: 1-6
2010 – 2019
- 2019
- [c7]Shu-Han Hsu, Kexin Yang, Linda Milor
Reliability and Accelerated Testing of 14nm FinFET Ring Oscillators. DCIS 2019: 1-7 - [c6]Shu-Han Hsu, Ying-Yuan Huang, Kexin Yang, Linda Milor
Identification of Failure Modes for Circuit Samples with Confounded Causes of Failure. IOLTS 2019: 257-262 - [c5]Shu-Han Hsu, Kexin Yang, Linda Milor
Machine Learning for Detection of Competing Wearout Mechanisms. IRPS 2019: 1-9 - [c4]Rui Zhang, Kexin Yang, Taizhi Liu, Linda Milor
Impact of Front-End Wearout Mechanisms on the Performance of a Ring Oscillator-Based Thermal Sensor. IWASI 2019: 258-263 - 2018
- [j3]Kexin Yang
A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both Traditional CMOS and FinFET Technology. IEEE Trans. Very Large Scale Integr. Syst. 26(11): 2470-2482 (2018) - [c3]Kexin Yang, Rui Zhang, Taizhi Liu, Dae Hyun Kim
Optimal Accelerated Test Regions for Time- Dependent Dielectric Breakdown Lifetime Parameters Estimation in FinFET Technology. DCIS 2018: 1-6 - [c2]Rui Zhang, Kexin Yang, Taizhi Liu, Linda Milor
Estimation of the Optimal Accelerated Test Region for FinFET SRAMs Degraded by Front-End and Back-End Wearout Mechanisms. DCIS 2018: 1-6 - [c1]Kexin Yang, Taizhi Liu, Rui Zhang, Linda Milor
Circuit-level reliability simulator for front-end-of-line and middle-of-line time-dependent dielectric breakdown in FinFET technology. VTS 2018: 1-6 - 2017
- [j2]Kexin Yang, Taizhi Liu, Rui Zhang, Dae Hyun Kim
Front-end of line and middle-of-line time-dependent dielectric breakdown reliability simulator for logic circuits. Microelectron. Reliab. 76-77: 81-86 (2017) - [j1]Rui Zhang, Taizhi Liu, Kexin Yang, Linda Milor
Analysis of time-dependent dielectric breakdown induced aging of SRAM cache with different configurations. Microelectron. Reliab. 76-77: 87-91 (2017)
Coauthor Index
aka: Linda Milor
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