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Hiroshi Makino
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2010 – 2019
- 2016
- [j29]Yoshifumi Kawamura, Naoya Okada, Yoshio Matsuda, Tetsuya Matsumura, Hiroshi Makino, Kazutami Arimoto:
A Field Programmable Sequencer and Memory with Middle Grained Programmability Optimized for MCU Peripherals. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 99-A(5): 917-928 (2016) - [c17]Ryota Bnadou, Masahiro Hiramori, Shuhei Iwade, Hiroshi Makino, Tutomu Yoshimura, Yoshio Matsuda:
A study on motion estimation algorithm for moving pictures. GCCE 2016: 1-3 - [c16]Masahiro Hiramori, Ryota Bandou, Shuhei Iwade, Hiroshi Makino, Tsutomu Yoshimura, Yoshio Matsuda:
A study on fast motion estimation algorithm. GCCE 2016: 1-3 - 2015
- [j28]Hiroshi Makino, Shunsuke Kamijo:
The Challenge of Collaboration among Academies and Asia Pacific for ITS R&D. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 98-A(1): 259-266 (2015) - 2014
- [j27]Shunji Nakata, Hiroshi Makino, Ryota Honda, Masayuki Miyama, Yoshio Matsuda:
Analysis of voltage, Current and Energy dissipation of Stepwise Adiabatic Charging of a capacitor using a nonresonant inductor Current. J. Circuits Syst. Comput. 23(3) (2014) - [j26]Hiroshi Makino:
Development of the SCARA. J. Robotics Mechatronics 26(1): 5-8 (2014) - [j25]Shunji Nakata, Hiroshi Makino, Junpei Hosokawa, Tsutomu Yoshimura, Shuhei Iwade, Yoshio Matsuda:
Energy Efficient Stepwise Charging of a Capacitor Using a DC-DC Converter With Consecutive Changes of its Duty Ratio. IEEE Trans. Circuits Syst. I Regul. Pap. 61-I(7): 2194-2203 (2014) - [j24]Shunji Nakata, Hiroki Hanazono, Hiroshi Makino, Hiroki Morimura, Masayuki Miyama, Yoshio Matsuda:
Increase in Read Noise Margin of Single-Bit-Line SRAM Using Adiabatic Change of Word Line Voltage. IEEE Trans. Very Large Scale Integr. Syst. 22(3): 686-690 (2014) - [c15]Tetsuya Matsumura, Naoya Okada, Yoshifumi Kawamura, Koji Nii, Kazutami Arimoto, Hiroshi Makino, Yoshio Matsuda:
The LSI implementation of a memory based field programmable device for MCU peripherals. DDECS 2014: 183-188 - [c14]Shunji Nakata, Hiroshi Makino, Yoshio Matsuda:
A new stepwise adiabatic charging circuit with a smaller capacitance in a regenerator than a load capacitance. MWSCAS 2014: 439-442 - 2013
- [j23]Tsutomu Yoshimura, Shuhei Iwade, Hiroshi Makino, Yoshio Matsuda:
Analysis of Pull-in Range Limit by Charge Pump Mismatch in a Linear Phase-Locked Loop. IEEE Trans. Circuits Syst. I Regul. Pap. 60-I(4): 896-907 (2013) - 2012
- [j22]Hiroshi Makino, Shunji Nakata, Hirotsugu Suzuki, Shin'ichiro Mutoh, Masayuki Miyama, Tsutomu Yoshimura, Shuhei Iwade, Yoshio Matsuda:
Utilising the normal distribution of the write noise margin to easily predict the SRAM write yield. IET Circuits Devices Syst. 6(4): 260-270 (2012) - [j21]Shunji Nakata, Ryota Honda, Hiroshi Makino, Shin'ichiro Mutoh, Masayuki Miyama, Yoshio Matsuda:
General Stability of Stepwise Waveform of an Adiabatic Charge Recycling Circuit With Any Circuit Topology. IEEE Trans. Circuits Syst. I Regul. Pap. 59-I(10): 2301-2314 (2012) - [c13]Shunji Nakata, Ryota Honda, Hiroshi Makino, Hiroki Morimura, Yoshio Matsuda:
Energy dissipation reduction during adiabatic charging and discharging with controlled inductor current. MWSCAS 2012: 1068-1071 - 2011
- [j20]Hiroshi Makino, Shunji Nakata, Hirotsugu Suzuki, Shin'ichiro Mutoh, Masayuki Miyama, Tsutomu Yoshimura, Shuhei Iwade, Yoshio Matsuda:
Reexamination of SRAM Cell Write Margin Definitions in View of Predicting the Distribution. IEEE Trans. Circuits Syst. II Express Briefs 58-II(4): 230-234 (2011) - 2010
- [j19]Shunji Nakata, Shin'ichiro Mutoh, Hiroshi Makino, Masayuki Miyama, Yoshio Matsuda:
Stable adiabatic circuit using advanced series capacitors and time variation of energy dissipation. IEICE Electron. Express 7(9): 640-646 (2010) - [c12]Shunji Nakata, Hirotsugu Suzuki, Ryota Honda, Takahito Kusumoto, Shin'ichiro Mutoh, Hiroshi Makino, Masayuki Miyama, Yoshio Matsuda:
Adiabatic SRAM with a shared access port using a controlled ground line and step-voltage circuit. ISCAS 2010: 2474-2477
2000 – 2009
- 2009
- [j18]Koji Nii, Yasumasa Tsukamoto, Makoto Yabuuchi, Yasuhiro Masuda, Susumu Imaoka, Keiichi Usui, Shigeki Ohbayashi, Hiroshi Makino, Hirofumi Shinohara:
Synchronous Ultra-High-Density 2RW Dual-Port 8T-SRAM With Circumvention of Simultaneous Common-Row-Access. IEEE J. Solid State Circuits 44(3): 977-986 (2009) - 2008
- [j17]Masako Fujii, Koji Nii, Hiroshi Makino, Shigeki Ohbayashi, Motoshige Igarashi, Takeshi Kawamura, Miho Yokota, Nobuhiro Tsuda, Tomoaki Yoshizawa, Toshikazu Tsutsui, Naohiko Takeshita, Naofumi Murata, Tomohiro Tanaka, Takanari Fujiwara, Kyoko Asahina, Masakazu Okada, Kazuo Tomita, Masahiko Takeuchi, Shigehisa Yamamoto, Hiromitsu Sugimoto, Hirofumi Shinohara:
A Large-Scale, Flip-Flop RAM Imitating a Logic LSI for Fast Development of Process Technology. IEICE Trans. Electron. 91-C(8): 1338-1347 (2008) - [j16]Shigeki Ohbayashi, Makoto Yabuuchi, Kazushi Kono, Yuji Oda, Susumu Imaoka, Keiichi Usui, Toshiaki Yonezu, Takeshi Iwamoto, Koji Nii, Yasumasa Tsukamoto, Masashi Arakawa, Takahiro Uchida, Masakazu Okada, Atsushi Ishii, Tsutomu Yoshihara, Hiroshi Makino, Koichiro Ishibashi, Hirofumi Shinohara:
A 65 nm Embedded SRAM With Wafer Level Burn-In Mode, Leak-Bit Redundancy and Cu E-Trim Fuse for Known Good Die. IEEE J. Solid State Circuits 43(1): 96-108 (2008) - [j15]Koji Nii, Makoto Yabuuchi, Yasumasa Tsukamoto, Shigeki Ohbayashi, Susumu Imaoka, Hiroshi Makino, Yoshinobu Yamagami, Satoshi Ishikura, Toshio Terano, Toshiyuki Oashi, Keiji Hashimoto, Akio Sebe, Gen Okazaki, Katsuji Satomi, Hironori Akamatsu, Hirofumi Shinohara:
A 45-nm Bulk CMOS Embedded SRAM With Improved Immunity Against Process and Temperature Variations. IEEE J. Solid State Circuits 43(1): 180-191 (2008) - [j14]Satoshi Ishikura, Marefusa Kurumada, Toshio Terano, Yoshinobu Yamagami, Naoki Kotani, Katsuji Satomi, Koji Nii, Makoto Yabuuchi, Yasumasa Tsukamoto, Shigeki Ohbayashi, Toshiyuki Oashi, Hiroshi Makino, Hirofumi Shinohara, Hironori Akamatsu:
A 45 nm 2-port 8T-SRAM Using Hierarchical Replica Bitline Technique With Immunity From Simultaneous R/W Access Issues. IEEE J. Solid State Circuits 43(4): 938-945 (2008) - [c11]Masako Fujii, Hiroaki Suzuki, Hiromi Notani, Hiroshi Makino, Hirofumi Shinohara:
On-chip leakage monitor circuit to scan optimal reverse bias voltage for adaptive body-bias circuit under gate induced drain leakage effect. ESSCIRC 2008: 258-261 - [c10]Hiroaki Suzuki, Masanori Kurimoto, Tadao Yamanaka, Hidehiro Takata, Hiroshi Makino, Hirofumi Shinohara:
Post-silicon programmed body-biasing platform suppressing device variability in 45 nm CMOS technology. ISLPED 2008: 15-20 - 2007
- [j13]Hiroshi Makino, Akitaka Kato, Yasunori Yamazaki:
Research and Commercialization of SCARA Robot -The Case of Industry-University Joint Research and Development-. Int. J. Autom. Technol. 1(1): 61-67 (2007) - [j12]Shigeki Ohbayashi, Makoto Yabuuchi, Koji Nii, Yasumasa Tsukamoto, Susumu Imaoka, Yuji Oda, Tsutomu Yoshihara, Motoshige Igarashi, Masahiko Takeuchi, Hiroshi Kawashima, Yasuo Yamaguchi, Kazuhiro Tsukamoto, Masahide Inuishi, Hiroshi Makino, Koichiro Ishibashi, Hirofumi Shinohara:
A 65-nm SoC Embedded 6T-SRAM Designed for Manufacturability With Read and Write Operation Stabilizing Circuits. IEEE J. Solid State Circuits 42(4): 820-829 (2007) - [c9]Mitsuya Fukazawa, Tetsuro Matsuno, Toshifumi Uemura, Rei Akiyama, Tetsuya Kagemoto, Hiroshi Makino, Hidehiro Takata, Makoto Nagata:
Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variations in SoCs. ISSCC 2007: 288-603 - [c8]Makoto Yabuuchi, Koji Nii, Yasumasa Tsukamoto, Shigeki Ohbayashi, Susumu Imaoka, Hiroshi Makino, Yoshinobu Yamagami, Satoshi Ishikura, Toshio Terano, Toshiyuki Oashi, Keiji Hashimoto, Akio Sebe, Gen Okazaki, Katsuji Satomi, Hironori Akamatsu, Hirofumi Shinohara:
A 45nm Low-Standby-Power Embedded SRAM with Improved Immunity Against Process and Temperature Variations. ISSCC 2007: 326-606 - [c7]Shigeki Ohbayashi, Makoto Yabuuchi, Kazushi Kono, Yuji Oda, Susumu Imaoka, Keiichi Usui, Toshiaki Yonezu, Takeshi Iwamoto, Koji Nii, Yasumasa Tsukamoto, Masashi Arakawa, Takahiro Uchida, Masakazu Okada, Atsushi Ishii, Hiroshi Makino, Koichiro Ishibashi, Hirofumi Shinohara:
A 65nm Embedded SRAM with Wafer-Level Burn-In Mode, Leak-Bit Redundancy and E-Trim Fuse for Known Good Die. ISSCC 2007: 488-617 - 2005
- [c6]Yasumasa Tsukamoto, Koji Nii, Susumu Imaoka, Yuji Oda, Shigeki Ohbayashi, Tomoaki Yoshizawa, Hiroshi Makino, Koichiro Ishibashi, Hirofumi Shinohara:
Worst-case analysis to obtain stable read/write DC margin of high density 6T-SRAM-array with local Vth variability. ICCAD 2005: 398-405 - [c5]Niichi Itoh, Yasumasa Tsukamoto, Takeshi Shibagaki, Koji Nii, Hidehiro Takata, Hiroshi Makino:
A 32×24-bit multiplier-accumulator with advanced rectangular styled Wallace-tree structure. ISCAS (1) 2005: 73-76 - 2004
- [j11]Koji Nii, Yasumasa Tsukamoto, Tomoaki Yoshizawa, Susumu Imaoka, Yoshinobu Yamagami, Toshikazu Suzuki, Akinori Shibayama, Hiroshi Makino, Shuhei Iwade:
A 90-nm low-power 32-kB embedded SRAM with gate leakage suppression circuit for mobile applications. IEEE J. Solid State Circuits 39(4): 684-693 (2004) - 2001
- [j10]Niichi Itoh, Yuka Naemura, Hiroshi Makino, Yasunobu Nakase, Tsutomu Yoshihara, Yasutaka Horiba:
A 600-MHz 54×54-bit multiplier with rectangular-styled Wallace tree. IEEE J. Solid State Circuits 36(2): 249-257 (2001)
1990 – 1999
- 1998
- [j9]Noriaki Kiyohiro, Hiroshi Makino, Hideo Mori:
Robot contest "Robocon Yamanashi". J. Robotics Mechatronics 10(1): 34-39 (1998) - [c4]Koji Nii, Hiroshi Makino, Yoshiki Tsujihashi, Chikayoshi Morishima, Yasushi Hayakawa, Hiroyuki Nunogami, Takahiko Arakawa, Hisanori Hamano:
A low power SRAM using auto-backgate-controlled MT-CMOS. ISLPED 1998: 293-298 - 1997
- [j8]Vojin G. Oklobdzija, Hiroaki Suzuki, Hiroyuki Morinaka, Hiroshi Makino, Yasunobu Nakase, Koichiro Mashiko, Tadashi Sumi:
Comments on "Leading-zero anticipatory logic for high-speed floating point addition" [with reply]. IEEE J. Solid State Circuits 32(2): 292 (1997) - [j7]Hiroaki Suzuki, Hiroyuki Morinaka, Hiroshi Makino, Yasunobu Nakase, Koichiro Mashiko:
Authors Reply. IEEE J. Solid State Circuits 32(2): 293 (1997) - [c3]Hiroaki Suzuki, Hiroshi Makino, Koichiro Mashiko, Hisanori Hamano:
A Floating Point Divider using Redundant Binary Circuits and an Asynchronous Clock Scheme. ICCD 1997: 685-689 - 1996
- [j6]Hiroshi Makino, Hiroaki Suzuki, Hiroyuki Morinaka, Yasunobu Nakase, Koichiro Mashiko, Tadashi Sumi:
A 286 MHz 64-b floating point multiplier with enhanced CG operation. IEEE J. Solid State Circuits 31(4): 504-513 (1996) - [j5]Hiroshi Makino, Yasunobu Nakase, Hiroaki Suzuki, Hiroyuki Morinaka, Hirofumi Shinohara, Koichiro Mashiko:
An 8.8-ns 54×54-bit multiplier with high speed redundant binary architecture. IEEE J. Solid State Circuits 31(6): 773-783 (1996) - [j4]Hiroaki Suzuki, Hiroyuki Morinaka, Hiroshi Makino, Yasunobu Nakase, Koichiro Mashiko, Tadashi Sumi:
Leading-zero anticipatory logic for high-speed floating point addition. IEEE J. Solid State Circuits 31(8): 1157-1164 (1996) - 1995
- [j3]Yasunobu Nakase, Hiroaki Suzuki, Hiroshi Makino, Hirofumi Shinohara, Koichiro Mashiko:
A BiCMOS wired-OR logic. IEEE J. Solid State Circuits 30(6): 622-628 (1995) - 1993
- [c2]Hiroshi Makino, Yasunobu Nakase, Hirofumi Shinohara:
A 8.8-ns 54 54-Bit Multiplier Using New Redundant Binary Architecture. ICCD 1993: 202-205
1980 – 1989
- 1989
- [j2]Hiroshi Makino:
Development of the Spherical SCARA Robot. J. Robotics Mechatronics 1(3): 251-252 (1989) - 1985
- [j1]Hiroshi Makino:
Beta: An Automatic Kana-Kanji Translation System. Computer 18(1): 46-52 (1985) - 1980
- [c1]Hiroshi Makino, Makoto Kizawa:
An Automatic Translation System Of Non-Segmented Kana Sentences Into Kanji-Kana Sentences. COLING 1980: 295-302
Coauthor Index
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