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Hayoung Lee
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2020 – today
- 2024
- [j22]Hyojoon Yun
, Hyeonchan Lim, Hayoung Lee
An Efficient Scan Diagnosis for Intermittent Faults Using CNN With Multi-Channel Data. IEEE Access 12: 146463-146475 (2024) - [j21]Chaelim Park, Hayoung Lee, OkRan Jeong:
Leveraging Medical Knowledge Graphs and Large Language Models for Enhanced Mental Disorder Information Extraction. Future Internet 16(8): 260 (2024) - [j20]Hayoung Lee
A New Fail Address Memory Architecture for Cost-Effective ATE. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(4): 1260-1273 (2024) - [j19]Seung Ho Shin
GRAP: Efficient GPU-Based Redundancy Analysis Using Parallel Evaluation for Cross Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(8): 2518-2531 (2024) - [j18]Juyong Lee
A New ISA for High-Speed and Area-Efficient ALPG. IEEE Trans. Circuits Syst. II Express Briefs 71(7): 3358-3362 (2024) - [j17]Hayoung Lee
RA-Aware Fail Data Collection Architecture for Cost Reduction. IEEE Trans. Very Large Scale Integr. Syst. 32(6): 1136-1149 (2024) - [j16]Hayoung Lee
An Area-Efficient Systolic Array Redundancy Architecture for Reliable AI Accelerator. IEEE Trans. Very Large Scale Integr. Syst. 32(10): 1950-1954 (2024) - [i2]Kang Min Yoo, Jaegeun Han, Sookyo In, Heewon Jeon, Jisu Jeong, Jaewook Kang, Hyunwook Kim, Kyung-Min Kim, Munhyong Kim, Sungju Kim, Donghyun Kwak, Hanock Kwak, Se Jung Kwon, Bado Lee, Dongsoo Lee, Gichang Lee, Jooho Lee, Baeseong Park, Seongjin Shin, Joonsang Yu, Seolki Baek, Sumin Byeon, Eungsup Cho, Dooseok Choe, Jeeseung Han, Youngkyun Jin, Hyein Jun, Jaeseung Jung, Chanwoong Kim, Jinhong Kim, Jinuk Kim, Dokyeong Lee, Dong Wook Park, Jeong Min Sohn, Sujung Han, Jiae Heo, Sungju Hong, Mina Jeon, Hyunhoon Jung, Jungeun Jung, Wangkyo Jung, Chungjoon Kim, Hyeri Kim, Jonghyun Kim, Min Young Kim, Soeun Lee, Joonhee Park, Jieun Shin, Sojin Yang, Jungsoon Yoon, Hwaran Lee, Sanghwan Bae, Jeehwan Cha, Karl Gylleus, Donghoon Ham, Mihak Hong, Youngki Hong, Yunki Hong, Dahyun Jang, Hyojun Jeon, Yujin Jeon, Yeji Jeong, Myunggeun Ji, Yeguk Jin, Chansong Jo, Shinyoung Joo, Seunghwan Jung, Adrian Jungmyung Kim, Byoung Hoon Kim, Hyomin Kim, Jungwhan Kim, Minkyoung Kim, Minseung Kim, Sungdong Kim, Yonghee Kim, Youngjun Kim, Youngkwan Kim, Donghyeon Ko, Dughyun Lee, Hayoung Lee, Jaehong Lee, Jieun Lee, Jonghyun Lee, Jongjin Lee, Min Young Lee, Yehbin Lee, Taehong Min, Yuri Min, Kiyoon Moon, Hyangnam Oh, Jaesun Park, Kyuyon Park, Younghun Park, Hanbae Seo, Seunghyun Seo, Mihyun Sim, Gyubin Son, Matt Yeo, Kyung Hoon Yeom, Wonjoon Yoo:
HyperCLOVA X Technical Report. CoRR abs/2404.01954 (2024) - 2023
- [j15]Hayoung Lee, Ok-Ran Jeong:
Sentiment analysis and counselling for COVID-19 pandemic based on social media. Int. J. Web Grid Serv. 19(1): 34-57 (2023) - [j14]Hayoung Lee, Okran Jeong:
A Knowledge-Grounded Task-Oriented Dialogue System with Hierarchical Structure for Enhancing Knowledge Selection. Sensors 23(2): 685 (2023) - [j13]Hayoung Lee
TRUST: Through-Silicon via Repair Using Switch Matrix Topology. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(7): 2377-2390 (2023) - [j12]Hayoung Lee
STRAIT: Self-Test and Self-Recovery for AI Accelerator. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(9): 3092-3104 (2023) - [c17]Younwoo Yoo, Hayoung Lee, Seung Ho Shin
GPU-Based Redundancy Analysis using Partitioning Method for Memory Repair. ISOCC 2023: 1-2 - [c16]Hayoung Lee, Younwoo Yoo, Seung Ho Shin
Redundancy Analysis Simplification Scheme for High-Speed Memory Repair. ISOCC 2023: 339-340 - [i1]Heungseok Park, Aeree Cho, Hyojun Jeon, Hayoung Lee, Youngil Yang, Sungjae Lee, Heungsub Lee, Jaegul Choo:
HPCClusterScape: Increasing Transparency and Efficiency of Shared High-Performance Computing Clusters for Large-scale AI Models. CoRR abs/2310.02120 (2023) - 2022
- [j11]Hogyeong Kim
Multibank Optimized Redundancy Analysis Using Efficient Fault Collection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(8): 2739-2752 (2022) - [j10]Hayoung Lee
ECMO: ECC Architecture Reusing Content-Addressable Memories for Obtaining High Reliability in DRAM. IEEE Trans. Very Large Scale Integr. Syst. 30(6): 781-793 (2022) - [c15]Seung Ho Shin
An Improved Early Termination Methodology Using Convolutional Neural Network. ISOCC 2022: 21-22 - [c14]Sooryeong Lee, Hayoung Lee
PROG: Per-Row Output Generator for BOST. ISOCC 2022: 23-24 - [c13]Hayoung Lee
FAME: Fault Address Memory Structure for Repair Time Reduction. ISOCC 2022: 31-32 - [c12]Jihye Kim, Hayoung Lee
ZOS: Zero Overhead Scan for Systolic Array-based AI accelerator. ISOCC 2022: 360-361 - 2021
- [j9]Hayoung Lee
On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug. IEEE Access 9: 56443-56456 (2021) - [j8]Donghyun Han
Effective Spare Line Allocation Built-in Redundancy Analysis With Base Common Spare for Yield Improvement of 3D Memory. IEEE Access 9: 76716-76729 (2021) - [j7]Donghyun Han
ECC-Aware Fast and Reliable Pattern Matching Redundancy Analysis for Highly Reliable Memory. IEEE Access 9: 133274-133288 (2021) - [c11]Younwoo Yoo, Hayoung Lee
Post-bond Repair of Line Faults with Double-bit ECC for 3D Memory. ISOCC 2021: 427-428 - [c10]Seung Ho Shin
An Effective Spare Allocation Methodology for 3D Memory Repair with BIRA. ISOCC 2021: 429-430 - 2020
- [j6]Jihye Kim
Fine-Grained Defect Diagnosis for CMOL FPGA Circuits. IEEE Access 8: 163140-163151 (2020) - [j5]Tae Hyun Kim
GPU-Based Redundancy Analysis Using Concurrent Evaluation. IEEE Trans. Very Large Scale Integr. Syst. 28(3): 805-817 (2020) - [c9]Hayoung Lee
Redundancy Analysis Optimization with Clustered Known Solutions for High Speed Repair. ISOCC 2020: 51-52 - [c8]Jihye Kim, Hayoung Lee
Memory-like Defect Diagnosis for CMOL FPGAs. ISOCC 2020: 139-140 - [c7]Hayoung Lee
Fail Memory Configuration Set for RA Estimation. ITC 2020: 1-9 - [c6]Hayoung Lee
W-ERA: One-Time Memory Repair with Wafer-Level Early Repair Analysis for Cost Reduction. ITC-Asia 2020: 94-99
2010 – 2019
- 2019
- [j4]Hayoung Lee
Dynamic Built-In Redundancy Analysis for Memory Repair. IEEE Trans. Very Large Scale Integr. Syst. 27(10): 2365-2374 (2019) - [c5]Hayoung Lee
Redundancy Analysis based on Fault Distribution for Memory with Complex Spares. ISOCC 2019: 235-236 - 2018
- [j3]Hayoung Lee
Fault Group Pattern Matching With Efficient Early Termination for High-Speed Redundancy Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(7): 1473-1482 (2018) - [j2]Hayoung Lee
Fast Built-In Redundancy Analysis Based on Sequential Spare Line Allocation. IEEE Trans. Reliab. 67(1): 264-273 (2018) - [j1]Donghyun Kim, Hayoung Lee
An Area-Efficient BIRA With 1-D Spare Segments. IEEE Trans. Very Large Scale Integr. Syst. 26(1): 206-210 (2018) - [c4]Donghyun Han
3D Memory Formed of Unrepairable Memory Dice and Spare Layer. TENCON 2018: 1362-1366 - 2017
- [c3]Donghyun Han
A new repair scheme for TSV-based 3D memory using base die repair cells. ISOCC 2017: 11-12 - 2016
- [c2]Keewon Cho, Jooyoung Kim, Hayoung Lee
Discussion of cost-effective redundancy architectures. ISOCC 2016: 97-98 - 2013
- [c1]Hayoung Lee, Taeho Kang, Sangho Lee, Jong Kim, Yoonho Kim:
Punobot: Mobile Botnet Using Push Notification Service in Android. WISA 2013: 124-137
Coauthor Index
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last updated on 2024-11-07 20:33 CET by the dblp team
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