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Hyeonchan Lim
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2020 – today
- 2024
- [j7]Hyojoon Yun, Hyeonchan Lim, Hayoung Lee, Doohyun Yoon, Sungho Kang:
An Efficient Scan Diagnosis for Intermittent Faults Using CNN With Multi-Channel Data. IEEE Access 12: 146463-146475 (2024) - [j6]Hyeonchan Lim, Tae-Hyun Kim, Sungho Kang:
Reconfigurable Multi-Bit Scan Flip-Flop for Cell-Aware Diagnosis. IEEE Trans. Circuits Syst. II Express Briefs 71(4): 2024-2028 (2024) - 2022
- [j5]Hyeonchan Lim, Hyojoon Yun, Sungho Kang:
A Hybrid Test Scheme for Automotive IC in Multisite Testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(12): 5671-5680 (2022) - [j4]Hyeonchan Lim, Hyojoon Yun, Sungho Kang:
Scan Cell Modification for Intra Cell-Aware Scan Chain Diagnosis. IEEE Trans. Circuits Syst. II Express Briefs 69(11): 4498-4502 (2022) - [c9]Hyeonchan Lim, Hyojoon Yun, Juyong Lee, Sungho Kang:
Cell-Aware Scan Diagnosis Using Partially Synchronous Set and Reset. ISOCC 2022: 121-122 - [c8]Tae Hyun Kim, Hyeonchan Lim, Minho Cheong, Hyojoon Yun, Sungho Kang:
Logic Diagnosis Based on Deep Learning for Multiple Faults. ISOCC 2022: 366-367 - 2021
- [j3]Jungil Mok, Hyeonchan Lim, Sungho Kang:
Enhanced Postbond Test Architecture for Bridge Defects Between the TSVs. IEEE Trans. Very Large Scale Integr. Syst. 29(6): 1164-1177 (2021) - 2020
- [j2]Young-Woo Lee, Hyeonchan Lim, Youngkwang Lee, Sungho Kang:
Robust Secure Shield Architecture for Detection and Protection Against Invasive Attacks. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 3023-3034 (2020) - [c7]Hyeonchan Lim, Tae Hyun Kim, Seunghwan Kim, Sungho Kang:
Diagnosis of Scan Chain Faults Based-on Machine-Learning. ISOCC 2020: 57-58
2010 – 2019
- 2018
- [c6]Hyeonchan Lim, Seokjun Jang, Sungho Kang:
A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain. ISOCC 2018: 265-266 - 2017
- [j1]Young-Woo Lee, Hyeonchan Lim, Sungho Kang:
Grouping-Based TSV Test Architecture for Resistive Open and Bridge Defects in 3-D-ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(10): 1759-1763 (2017) - [c5]Hyeonchan Lim, Junghwan Kim, Soyeon Kang, Sungho Kang:
Test data reduction method based on berlekamp-massey algorithm. ISOCC 2017: 123-124 - [c4]Sungyoul Seo, Hyeonchan Lim, Soyeon Kang, Sungho Kang:
Off-chip test architecture for improving multi-site testing efficiency using tri-state decoder and 3V-level encoder. ISQED 2017: 191-195 - [c3]Hyeonchan Lim, Sungyoul Seo, Soyeon Kang, Sungho Kang:
Broadcast scan compression based on deterministic pattern generation algorithm. ISQED 2017: 449-453 - 2016
- [c2]Soyeon Kang, Inhyuk Choi, Hyeonchan Lim, Sungyoul Seo, Sungho Kang:
Software-based embedded core test using multi-polynomial for test data reduction. ISOCC 2016: 39-40 - 2015
- [c1]Sungyoul Seo, Yong Lee, Hyeonchan Lim, Joohwan Lee, Hongbom Yoo, Yojoung Kim, Sungho Kang:
Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction. ATS 2015: 1-6
Coauthor Index
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last updated on 2024-11-07 20:28 CET by the dblp team
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