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CERN Document Server Sök i 5 journaler efter:  Sökningen tog 0.90 sekunder. 
1.
Very-High-Energy Heavy Ion Beam Dosimetry Using Solid State Detectors for Electronics Testing / Waets, Andreas (CERN ; Zurich U.) ; Bilko, Kacper (CERN) ; Coronetti, Andrea (CERN) ; Emriskova, Natalia (CERN) ; Sacristan Barbero, Mario (CERN) ; García Alía, Rubén (CERN) ; Durante, Marco (Darmstadt, GSI) ; Schuy, Christoph (Darmstadt, GSI) ; Wagner, Tim (Darmstadt, GSI) ; Esposito, Luigi Salvatore (CERN) et al.
Very-high-energy (VHE), heavy ions are of particular interest for single event effects (SEEs) testing due to their combination of high linear energy transfer (LET) and high penetration within electronics components. The dosimetry of such beams poses an important challenge for facilities aiming to provide VHE ions for radiation effects testing. [...]
2024 - 9 p. - Published in : IEEE Trans. Nucl. Sci. 71 (2024) 1837-1845
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1837-1845
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2.
Mixed-Field Radiation Monitoring and Beam Characterization Through Silicon Diode Detectors / Biłko, Kacper (CERN ; Lab. Hubert Curien, St. Etienne) ; García Alía, Rubén (CERN) ; Sacristan Barbero, Mario (CERN) ; Girard, Sylvain (Lab. Hubert Curien, St. Etienne ; IUF, Paris) ; Aguiar, Ygor Q (CERN) ; Cecchetto, Matteo (CERN) ; Belanger-Champagne, Camille (TRIUMF) ; Danzeca, Salvatore (CERN) ; Hajdas, Wojtek (PSI, Villigen) ; Hands, Alex (TRIUMF) et al.
We present a calibration of a commercial silicon diode with proton and alpha beams and gamma rays. The diode together with a fast acquisition chain can be exploited for both direct and indirect (through the secondary radiation field) beam characterization. [...]
2024 - 8 p. - Published in : IEEE Trans. Nucl. Sci. 71 (2024) 777-784 Fulltext: PDF;
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3.
Analysis of the Radiation Field Generated by 200-MeV Electrons on a Target at the CLEAR Accelerator at CERN / Lerner, Giuseppe (CERN) ; Pelissou, Pierre (CERN ; INSA, Toulouse) ; Aguiar, Ygor Q (CERN) ; Sacristan Barbero, Mario (CERN) ; Cecchetto, Matteo (CERN) ; Biłko, Kacper (CERN) ; Coussen, Louise (CERN ; INSA, Toulouse) ; Emriskova, Natalia (CERN) ; García Alía, Rubén (CERN) ; Dyks, Luke (CERN ; Oxford U.) et al.
The radiation showers generated by the interaction of high-energy electrons with matter include neutrons with an energy distribution peaked at the MeV scale, produced via photonuclear reactions, allowing measurements of neutron-induced single-event effects (SEEs) in electronic devices. In this work, we study a setup where the 200-MeV electron beam of the CLEAR accelerator at European Organization for Nuclear Research [Centre Européen pour la Recherche Nucléaire (CERN)] is directed on an aluminum target to produce a radiation field with a large neutron component. [...]
2023 - 8 p. - Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.1572-1579
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4.
Electronics Irradiation With Neutrons at the NEAR Station of the n_TOF Spallation Source at CERN / Cecchetto, Matteo (CERN) ; Sacristan Barbero, Mario (CERN) ; Lerner, Giuseppe (CERN) ; García Alía, Rubén (CERN) ; Aguiar, Ygor (CERN) ; Senajova, Dominika (CERN) ; Garcia Infantes, Francisco (CERN) ; Pavon Rodriguez, Jose Antonio (CERN) ; Sabate Gilarte, Marta (CERN) ; Vlachoudis, Vasilis (CERN) et al.
We study the neutron field at the NEAR station of the neutron time-of-flight (n_TOF) facility at CERN, through Monte Carlo simulations, well-characterized static random access memories (SRAMs), and radio-photoluminescence (RPL) dosimeters, with the aim of providing neutrons for electronics irradiation. Particle fluxes and typical quantities relevant for electronics testing were simulated for several test positions at NEAR and compared to those at the CERN high-energy accelerator mixed-field facility (CHARM), highlighting similitudes and differences. [...]
2023 - 9 p. - Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.1587-1595
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5.
SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below / Coronetti, Andrea (CERN ; Jyvaskyla U.) ; Cecchetto, Matteo (CERN) ; Wang, Jialei (Leuven U.) ; Tali, Maris (CERN) ; Martinez, Pablo Fernandez (CERN) ; Kastriotou, Maria (CERN) ; Papadopoulou, Athina (CERN) ; Bilko, Kacper (CERN) ; Castellani, Florent (ENSAE, Toulouse) ; Sacristan, Mario (CERN) et al.
The R2E project at CERN has tested a few commercial SRAMs and a custom-designed SRAM, whose data are complementary to various scientific publications. The experimental data include low- and high-energy protons, heavy ions, thermal, intermediate- and high-energy neutrons, high-energy electrons and high-energy pions..
2020 - 8 p. - Published in : 10.1109/redw51883.2020.9325822
In : 2020 IEEE Radiation Effects Data Workshop, Online, US, 7 Dec 2020, pp.1-8
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