PA Probe Catalog en 201308
PA Probe Catalog en 201308
PA Probe Catalog en 201308
Matched to Rexolite Probes Matched to Water Probes Integrated Wedge Curved Array Probes Wedges
920-165D-EN
The Company
Olympus Corporation is an international company operating in industrial, medical, and consumer markets, specializing in optics, electronics, and precision engineering. Olympus instruments contribute to the quality of products and add to the safety of infrastructure and facilities. Olympus is a world-leading manufacturer of innovative nondestructive testing and measurement instruments that are used in industrial and research applications ranging from aerospace, power generation, petrochemical, civil infrastructure, and automotive to consumer products. Leading-edge testing technologies include ultrasound, ultrasound phased array, eddy current, eddy current array, microscopy, optical metrology, and X-ray uorescence. Its products include aw detectors, thickness gages, industrial NDT systems and scanners, videoscopes, borescopes, high-speed video cameras, microscopes, probes, and various accessories. Olympus NDT is based in Waltham, Massachusetts, USA, and has sales and service centers in all principal industrial locations worldwide. Visit www.olympus-ims.com for applications and sales assistance.
Basic Concepts
The distinguis hing feature of phased array elements in a ultrasonic testing multielement probe. The excitation possibility of is the computer dynamically modifying -controlled excitation of multiple piezocom a beam in phase beam paramete (amplitude and by means of rs such as angle, posite elements can generate delay) constructive Similarly, the focal a focused ultrasonicof individual interference, echo the various active distance, and focal spot by each element from the desired focal point beam with the size through transduce are time-shift hits the various software. To desired focal ed transducer elements r elements are pulsed point and attenuate before being summed at slightly differentgenerate with a computab together. The s echoes from times. resulting le time shift. other points The echoes received in the test piece. sum is an A-scan that emphasiz es the response from the
Emitting
Trigger
Pulses
Incident wave
front
Transmitting delays
Flaw
Receiving
Echo signals
Reflected wave
front
Probe Types
Flaw
Delay (ns)
140
120
FD = 15
Angle steering
PA probe
Time delay [ns]
100
80
FD = 15
FD = 30
Incident wave
60
FD = 30
Illustration of
40
a single focal of active elements; law is multiplexe scanning is performe d across a group phased array d at a constant probe angle and along ultrasonic transducelength (aperture). This the is equivalent r performing to a conventio or shear-wav a raster scan nal e inspection. If an angled wedge for corrosion mapping compensate for different time delays inside is used, the focal laws the wedge.
Scanning Patterns
beam focusing
FD = 60
20
Illustration of
beam steering
FD = 60
0 0 4 8 12 16 20 24
Element number
28
32
Delay values (left) and depth scanning principles (right ) probe focusing for a 32-element linear array at 15-mm, 30-mm, longitudinal and 60-mm waves.
With sectorial scanning (also called azimuthal beam is moved through a sweep or angular scanning) same elements; range for a specic , the other added. The angular sweep ranges with different focal depth, using the sectors may have focal different values. depths may be
Sectorial scanni ng
Angle Beam
Angle beam probes wedge to transmit are used with a removabl e or integrate a refracted shear d test piece. They or longitudinal are designed wave into a for a wide and can be used to vary the refracted range of applications of the beam, beam angle depending on the wedge orientatio or the skew face is acoustica lly matched to n. the wedge material. The probe
Active group
1 16 128
(DDF) is a programm on-reception accomplished able, real-time by modifying each element array responsethe delay, gain, as a function of time. DDF and excitation the same focal replaces multiple of range created focal by beams at the receiving stage. the emitted beam with separate laws for the focal distance In other words, focused DDF dynamica as the signal signicantly returns to the lly changes increases the phased array depth of eld probe. DDF and signal-to-n oise ratio. Emission
Reception
Delay (ns) PA probe
Pulse-echo
Scanning direction
t0 t1 t2 t3 tn
=
This variation of an the probe housing. angle beam probe integrate s the wedge into The wedge congura smaller overall tion is xed but dimensions. offers
Acquisition time
Integrated Wedg e
Electronic linear
DDF
Acquisition with
DDF
Linear arrays are the important features most commonly used phased array of linear arrays probes for industrial is the active probe The active aperture applications. aperture. Thus, one of (A) is the total the active probe A = (n1)p length. Aperture +e length is given by the following where n = Number formula: of elements in the PA probe p = Elementar y pitchdistance between the e = Element widthw centers of two idth of a single adjacent elements g = Gap between piezocomposite adjacent elements element (a practical =v value is e < f /2) where = Waveleng th v = Material sound velocity f = Frequency
70 60
Phased array probes are made applications. A few types are in a variety of shapes and sizes for different illustrated here:
e
Linear
Near Wall
The near wall probe is specical dead zone at ly designed to probe ends by minimize the reducing the the last available distance element and the external edge between This probe type is useful for composit of the housing. inspections, or e radius and corner any using a 0 wedge. application requiring close contact to a wall
Wpassive n=8
1.5-D array
2-D array
Convex
p A
Time-Corrected Gain
70 60 45 60 45 70 60 45 45 60 60
45
Skewing
In order to support the growing NDT community, Olympus has published the Understanding Phased Array Technology poster. This poster has been designed by eld experts to present phased array inspection technology in a concise and clearly illustrated manner. Get your free poster at www.olympus-ims.com.
Variable angle
Dual linear
Dual 1.5-D
60 45
70
70
70 60 45 70 45 70 60 70
Immersion
Immersion probes or in an immersio are designed to be used with a water wedge n tank when the test part is immersed. The partially or wholly water acts as a uniform couplant Immersion probes and delay line. are longitudinal-wave up for refracted probes that can shear-wave inspectio be set probes are mostly n under water. intended for automated inspectio Immersion ns.
70 60 45
Distance-amplitude curves (DAC) the time-corre used to create cted gain (TCG)
70 60 45
In order to cover 45 the whole volume each focal law has to be calibrated of the part with consisten spread. This time-corrected-gain for attenuation and beam cy, performed with (TCG) calibration a calibration can be block reectors (for example, side-drille having several identical Using a sectorial 70 d holes) at 60 scan, the probe is moved different depths. that each beam 45 back and forth hits so is recorded (DAC) each reector. The amplitude and used to construct of each signal focal law. one TCG curve per
70 60 45 45 45 60 60 70 70
70 60 45 45 60 70
Defect Positioning
Once the TCG calibration is completed, each reector will always yield the focal law has 70 one individual same signal amplitude that detected it. A defect at TCG curve. , regardless of 60 3 mm amplitude as its position inside As a consequence, a if 45 it were at 10 mm in depth detected with an the part and angle of 45 degrees and detected at 60 degrees. will provide the of the beam same signal
Two-dimensional arrays have multiple allow electronic strips of linear focusing and arrays to steering in both arrays have the probe axes. 2-D same number of elements in whereas 1.5-D both dimensio identies probes ns, uneven numbers with any combinat of ion of achieving optimal elements. The probes can be used for focusing capability without probe or to cover a movement. dened area
Top
B0 45
Bottom
RA PA DA
T1
Top
SA
For manual inspection s, real-time readings respect to the are essential part geometry to quickly position and/or probe location. the
reected signal
source with
RA, PA, DA, and SA readings allow position the the user to accurately defect in real time during an inspection.
RA Reference point to the indication PA Probe front in face to the indication gate A DA Depth of in gate A the indication in gate A SA Sound-pa th length to the indication in gate A
Two linear or two 1.5-D array probes can be a roof-angled positioned on wedge with a transmitting probe. paired with a receiving equivalen The probe is in noisy materials t for such as austenitic optimal performance is a phased-a steel. This congura rray equivalen tion t to a conventional UT and is widely dual- element probe in used in the power-ge industry. neration
Dual Arrays
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Copyright 2011 by Olympus 920-242A_EN NDT. - Poster_PA_EN_A1_2All rights reserved. 01111. Printed in the USA.
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Table of Contents
Introduction to Phased Array Technology. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Custom Probes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Ordering Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Phased Array Probes Application Matrix. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 7 7 8
Wedges
Wedges for Angle Beam Probes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Immersion Corner Wedges for Curved Array Probes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 Wedge Offset Parameters. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Options
Probe Options and Spare Parts. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 Wedge Options. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 A1 and A2 Legacy Probe Specications and Dimensions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Software Control of Beam Angle, Focal Distance, and Focal Spot Size
To generate a beam, the various probe elements are pulsed at slightly different times. By precisely controlling the delays between the probe elements, beams of various angles, focal distances, and focal spot sizes can be produced. The echo from the desired focal point hits the various probe elements with a computable time shift. The signals received at each probe element are time-shifted before being summed together. The resulting sum is an A-scan emphasizing the response from the desired focal point and attenuating various other echoes from other points in the material.
Acquisition unit Phased array unit
Probe elements
Pulses Trigger Incident wave front
Emitting
Transmitting delays
Flaw
Receiving
Flaw
The capacity to produce at will, and under computer control, various beam angles and focal lengths is used to inspect parts with complex shapes such as turbine discs, turbine blade roots, reactor nozzles, and other complex shapes.
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Defect Positioning
For manual inspections, real-time readings are essential to quickly position the reected signal source with respect to the parts geometry and/or probe location. RA, PA, DA, and SA readings allow the user to accurately position the defect in real time during an inspection. RA: Reference point to the indication in gate A PA: Probe front face to the indication in gate A DA: Depth of the indication in gate A SA: Sound path length to the indication in gate A
Top
B0
Bottom
45 T1 Top
Active group
16 1 128
Scanning direction
High-speed linear scan: Olympus phased array systems can also be used to inspect at surfaces such as steel plates. Compared to a wide, single-element transduceroften referred to as a paint brushphased array technology offers a much higher sensitivity due to the use of a small focused beam.
RA PA DA SA
Linear
1.5-D array
2-D array
Convex
Concave
Annular
Internal focus
Skewing
Variable angle
Dual linear
Dual 1.5-D
Other types of probes can be designed to suit the needs of your application. Linear arrays are the most commonly used phased array probes for industrial applications. One of the important features that denes phased array probes is the active probe aperture.
The active aperture (A) is the total active probe length. Aperture length is calculated by the following formula: A = np where n = number of elements in the PA probe p = elementary pitchdistance between the centers of two adjacent elements A more precise way of nding the active aperture is calculated by this formula: A = (n1)p + e where e = element widthwidth of a single piezocomposite element (a practical value is e < /2)
e
The near-field (N) value gives the maximum depth of usable focus for a given array. This value is given by the following formula: N= D2f 4c where D = element diameter f = frequency c = material velocity To calculate the near-eld value in the active (primary) axis of a phased array probe: D = n p, where n is number of elements per group in the focal law. To calculate the near-eld value in the passive (secondary) axis of a phased array probe: D = Wpassive, which is often called elevation.
Wpassive
n=8
p A
6
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Custom Probes
Olympus can manufacture custom phased array probes to suit specic applications and geometries. To develop your custom probe, we will need to know: Application Probe type (angle beam, immersions, integrated wedge, matrix) Comparable UT single element transducer Cable jacket required Frequency Cable length Number of elements, pitch, and elevation Connector style Array shape (at, curve) Housing restrictions and/or size constraints -- Curved in active dimension -- Curved in passive dimension (focused)
Ordering Information
Numbering System Used to Order Standard Phased Array Probes
5L16-9.6x10-A1-P-2.5-OM
Frequency Array type Number of elements Active aperture Elevation Cable length Cable type Casing type Probe type Connector type
Number of elements
Example: 16 = 16 elements
Casing type
Casing type for a given probe type
Cable type
P = PVC outer M = metal armor outer
Active Aperture
Active aperture in mm. Refer to page 6 for details.
Elevation
Elevation in mm Example: 10 = 10 mm
Cable length
Cable length in m 2.5 = 2.5 m 5= 5m 10 = 10 m
Array type
L = linear A = annular M = matrix probe (1.5D, 2D) CV (ROC) = convex in azimuth CC (ROC) = concave in azimuth CCEV (ROC) = elevation focused
Probe type
A = angle beam with external wedge NW = near-wall PWZ = weld inspection angle beam W = angle beam with integrated wedge I = immersion DGS = DGS inspection/Atlas (AVG probe) AWS = AWS inspection
Connector type
OM = OmniScan connector HY = Hypertronics connector OL = OmniScan Connector with conventional UT channel on element 1 (LEMO 00 connector)
Automated Sectorial Sectorial Developed for scribe mark applications Small access, reduced footprint A10 recommended for weld applications A12 recommended for weld applications
Developed for OmniScan 32:128 shear wave and L-wave manual S-scan crack sizing applications Primary probe for carbon steel weld inspection for thickness up to 50 mm (16:128) and 70 mm (32:128)
A12
Sectorial and Linear Sectorial and Linear Sectorial Linear Linear Linear Sectorial and Linear Sectorial Sectorial Sectorial and Linear Sectorial and Linear Sectorial and Linear
Primary probe for carbon steel weld inspection for thickness over 50 mm (16:128)
DGS applications
This table is only a general application guideline. Please consult your Olympus sales representative prior to ordering.
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10L32-A10
5L64-A12
5L60-A14
Advantages
Probes are designed to have a low-prole probe/wedge combination for easier access in restricted areas. Wave layers with acoustic adaptation to Rexolite Captive anchoring screws are provided with the probe. A wide selection of wedges is available to suit any angle beam application.
H
H
L W
Typical Applications
A10, A11, and A12 Probes
Manual or automated inspection of 6.35 mm to 38 mm (0.25in. to 1.5 in.) thick welds Detection of aws and sizing Inspections of castings, forgings, pipes, tubes, and machined and structural components for cracks and welding defects
A14 casing
H
W
These probes come standard with an OmniScan connector and a 2.5m (8.2ft) cable or can be specially tted with other connectors and cable lengths. 9
A3
A4
A5
Advantages
Wave layers with acoustic adaptation to Rexolite Captive anchoring screws are provided with the probe. A wide selection of wedges is available to suit any angle beam application.
Typical Applications
A3, A4, and A5 Probes
Deep penetration applications Thick plates and welds Forging Noisy or granular material
H H L W
A5 casing
W
A3 casing
W
A4 casing
These probes come standard with an OmniScan connector and a 2.5m (8.2ft) cable or can be specially tted with other connectors and cable lengths. 10
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7.5L60-PWZ1
7.5LCCEV100-60-A16
Typical Applications
Automated inspection of girth welds with PipeWIZARD systems Manual or automated inspection of thick welds Detection of aws and sizing Inspection of castings, forgings, pipes, tubes, and machined and structural components for cracks and welding defects
H L W
External Dimensions mm (in.) L 68 (2.68) 68 (2.68) 68 (2.68) 56 (2.20) 40 (1.57) 40 (1.57) 40 (1.57) 68 (2.68) 68 (2.68) W 26 (1.02) 26 (1.02) 26 (1.02) 26 (1.02) 26 (1.02) 26 (1.02) 26 (1.02) 29 (1.14) 29 (1.14) H 30 (1.18) 30 (1.18) 30 (1.18) 30 (1.18) 30 (1.18) 30 (1.18) 30 (1.18) 30 (1.18) 30 (1.18)
These probes come standard with an OmniScan connector and a 2.5m (8.2ft) cable or can be specially tted with other connectors and cable lengths. * Designed for PipeWIZARD system, this probe comes with a CE Hypertronics connector and a 0.6m (2ft) cable. ** Designed for PipeWIZARD system, this probe comes with a CE Hypertronics connector and a 0.75m (2.5ft) cable. 11
A00, A0, and A15 Small-footprint Probes NW1, NW2, and NW3 Near-wall Probes
7.5CCEV35-A15
10L16-A00
5L10-A0-TOP
5L64-NW1
A0 casing
H L W
NW1 casing
Small-Footprint Probes 10L16-A00 5L10-A0-SIDE 5L10-A0-TOP 10L10-A0-SIDE 10L10-A0-TOP 7.5CCEV35-A15 U8330145 U8330080 U8330075 U8330110 U8330111 U8330826 10.0 5.0 5.0 10.0 10.0 7.5 16 10 10 10 10 16 0.31 0.60 0.60 0.60 0.60 0.50 5.0 6.0 6.0 6.0 6.0 10.0 8 (0.31) 13 (0.51) 13 (0.51) 13 (0.51) 13 (0.51) 26 (1.02) 8 (0.31) 10 (0.39) 10 (0.39) 10 (0.39) 10 (0.39) 22 (0.87) 23 (0.91) 23 (0.91) 23 (0.91) 23 (0.91) 23 (0.91) 9.7 (0.38)
Near-Wall Probes 3.5L64-NW1 5L64-NW1 3.5L24-NW2 5L24-NW2 3.5L128-NW3 5L128-NW3 U8330148 U8330134 U8330965 U8330155 U8330695 U8330647 3.5 5.0 3.5 5.0 3.5 5.0 64 64 24 24 128 128 1.0 1.0 1.0 1.0 1.0 1.0 64.0 64.0 24.0 24.0 128.0 128.0 7.0 7.0 7.0 7.0 7.0 7.0 66 (2.60) 66 (2.60) 26 (1.02) 26 (1.02) 130 (5.12) 130 (5.12) 19 (0.75) 19 (0.75) 19 (0.75) 19 (0.75) 21 (0.83) 21 (0.83) 25 (0.98) 25 (0.98) 30 (1.18) 30 (1.18) 35 (1.38) 35 (1.38)
These probes come standard with an OmniScan connector and a 2.5m (8.2ft) cable or can be specially tted with other connectors and cable lengths. 12
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10L128-I2
7.5L64-I4
Immersion probes are designed to be used with a water wedge or in an immersion tank when the test part is partially or wholly immersed. They are longitudinal wave probes that can be set up for refracted shear-wave inspections using a Rexolite wedge.
Advantages
Acoustic impedance matches water Design allows tting on water wedges for easier coupling on many surfaces and an adjustable water path (when the part to be inspected cannot be immersed in a tank). Linear scanning allows coverage of 30mm to 90mm in one line, with very high accuracy. Corrosion-resistant stainless steel case Waterproof guaranteed up to 1m (3.28 ft) under water
Typical Applications
Inspection of thin plate or tubing (steel, aluminum, or other) Composite inspection for delamination, disbonding, etc. Inline thickness gaging Automated scanning
W
I3 casing
L W
I4 casing
These probes come standard with an OmniScan connector and a 2.5m (8.2ft) cable or can be specially tted with other connectors and cable lengths. 13
DGS1, SW1, and AWS1 Integrated Wedge and Code Compliant Probes
4L16-DGS1
2.25L16-AWS1
Advantages
Probe and wedge in the same housing The lowest-prole probe-and-wedge combination for contact angle beam inspection Coupling always good between probe and wedge interfaces, no need for couplant between the probe and wedge Very small assembly for easy access in restricted areas Inspections of 30 to 70 in steel, SW or LW Easy to handle Probes with an internal wedge can be specially ordered to t a specic curvature radius.
DGS1 casing
H
Typical Applications
Manual weld inspection of 6.35mm to 19mm (0.25in. to 0.75in.) thick surfaces (butt joints, corner joints, tee joints), using 40 to 70 simultaneously Manual inspection of stress-corrosion cracking AWS and DGS code compliant applications
H
L W
AWS1 casing
Part Number
Item Number
8 16 16 16 16 16 16
These probes come standard with an OmniScan connector and a 2.5m (8.2ft) cable or can be specially tted with other connectors and cable lengths 14
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3.5CC10.2-R1
3.5CC25-R4
3.5CC50-R5
Advantages
Acoustic impedance matches water. High circumferential resolution around the radius Corrosion-resistant stainless steel case Waterproof guaranteed up to 1 m (3.28 ft) underwater Compatible with adjustable immersion wedges (shown on page 19)
Typical Applications
Inspection of carbon ber reinforced polymers (CFRP) corners Composite inspection for delamination
R A
R casing
These probes come standard with an OmniScan connector and a 2.5m (8.2ft) cable or can be specially tted with other connectors and cable lengths. 15
SA2-0L
SA00-N60S
SA10-N55S
SA11-N55S
SA12-N55S
Advantages
Available in standard refracted angles of 0, 45, 55, and 60 in steel for angle-beam inspections from 30 to 70, SW or LW Stainless steel screw receptacles provide a rm anchoring of probes to wedges. Lateral electronic scanning replaces the hand-skewing movement (with lateral wedges). The IHC wedge option can be ordered to improve the quality of the inspection: irrigation, mounting holes for the wedge holder to work with any Olympus scanner, and carbide pins to increase wear resistance. Wedges are designed to perform manual or automated scans. Custom wedges with specic refracted angles can be ordered; wedge shape and contour can also be customized.
SA1-N60S-IHC-AOD8
Wedge type Probe mounting Options Wave type Refracted angle in steel Pipe diameter Curvature type
Wave type
Options
Probe mounting
IHC = Irrigation, scanner attachment points, and carbide wear pins IHC-C = Irrigation, scanner attachment points, and composite wear pins WP5 = Water pocket (0.005in.) WP40 = Water pocket (0.040 in.)
Curvature type
AOD = Axial outside diameter (circumferential scan) COD = Circumferential outside diameter (axial scan)
Pipe diameter
16
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L
W
L W
SA00-N60S
SA0-0L
SPWZ1-N55S-IHC
Wedge Type: SA1, SA2, SA3, SA4, SA5, SPWZ1, SPWZ3, SI1, SI2, SI3
2 2.25 2.5 3 3.25 3.5 4 4.5 5 6 7 8 10 12 16 22 30 Flat 2.375 2.875 45.7 (1.8) 50.8 (2) 57.1 (2.25) 63.5 (2.5) 76.2 (3) 82.5 (3.25) 88.9 (3.5) 101.6 (4) 114.3 (4.5) 127.0 (5) 152.4 (6) 177.8 (7) 203.2 (8) 254.0 (10) 304.8 (12) 406.4 (16) 558.8 (22) 762.0 (30) 50.8 (2) 60.3 (2.375) 50.8 (2) 57.1 (2.25) 63.5 (2.5) 76.2 (3) 82.5 (3.25) 88.9 (3.5) 101.6 (4) 114.3 (4.5) 127.0 (5) 152.4 (6) 177.8 (7) 203.2 (8) 254.0 (10) 304.8 (12) 406.4 (16) 555.8 (22) 762.0 (30) up to at
*: Below 4in. IHC are integrated in the Rexolite. Wedges are not compatible with IHC rings.
18
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SR1-I81-ADJ
SR4-IE90-ADJ
Advantages
Available in specic radius and angle and also with adjustable radius to t on various components to be inspected Wedges are designed to perform manual scans. Designed to be used with the Mini-Wheel encoder
SR1-I90-0.125
Wedge type Inspection type Radius Angle of inspected part
Radius
Radius in in. ADJ = adjustable radius Note: Not all angles or radii are available, as such, many angle and radii combinations are not available. Please consult your Olympus representative to discuss your specific application.
Angle
H
Z X XT Y
A Wedge Specication Sheet is provided with every wedge. This sheet presents the wedge offset parameters of a phased array probes rst element for both OmniScan and TomoView software. It is important to note that the values given are only applicable for the wedge and probe combinations listed.
Olympus NDT Canada 505, boul. du Parc-Technologique Qubec (Qubec) G1P4S9 Canada Web site: Tel.: 1-418-872-1155 Fax: 1-418-872-5431 www.olympus-ims.com
Wedge Parameters
Model Wedge Angle Serial Number SA1-N60S-IHC Orientation Normal Sec. Offset 0,00
m/s mm
mm
Normal Orientation:
2330,00 Velocity:
(m s)
5,00 Height:
(mm)
Flat
39,000 0,000 2330,00 5,000 3,000 20,000 -30,300 -20,000 30,300 40,000
Note that if the word reverse appears on the header of the Wedge Specication Sheet, it means that the probe is mounted backwards on the wedge.
20
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Spare parts kit consists of: 1. 2. 3. 4. 5. M2, 6 mm screws (6) Gasket (1) M1.6, 8 mm screws (2), M1.6, 4 mm screws (2) Spring and nylon insert (2) M3 captive thumbscrews (2)
Wedge Options
Basic
Designed for manual inspection using gel couplant or water (not fed from an irrigation system).
New removable IHC ring for SA10, SA11, SA12, and SA14 wedges offers great exibility.
21
WP
The water pocket option adds a shallow cavity at the base of the wedge to improve the quality of coupling by restricting the ow of couplant. WP option offers irrigation and scanner yoke attachment points. This option is only available for SNW wedges.
Number of Elements 16 16 32 64 64 64
External Dimensions mm (in.) L 17 (0.67) 17 (0.67) 17 (0.67) 53 (2.09) 53 (2.09) 53 (2.09) W 29 (1.14) 29 (1.14) 29 (1.14) 29 (1.14) 29 (1.14) 29 (1.14) H 25 (0.98) 25 (0.98) 25 (0.98) 35 (1.38) 35 (1.38) 35 (1.38)
These probes come standard with an OmniScan connector and a 2.5m (8.2ft) cable or can be specially tted with other connectors and cable lengths.
A1 casing
5L16-A1
5L64-A2
L W
A2 casing
22
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Median Waveform
The median waveform graph displays a median pulse-echo response (typical) from the test target. Half of the return pulses from the probe elements will have a peak-peak voltage greater than (or equal to) this median element, and the other half will have a smaller value. Return pulse duration is shown on the horizontal axis (in microseconds) and amplitude is shown on the vertical axis (in V). The number of the median element is shown above the graph (in parentheses).
Probe Conformance Summary ___________________________________________________________________________ Parameter Measurement Specification Conformance ___________________________________________________________________________ Average Center Frequency (MHz) Average -6dB Bandwidth (%) Overall Vp-p Sensitivity (dB) Probe Cable Order Checked and Verified Probe Uncoupled Response Checked and Verified Probe Programmable Parameters Checked and Verified 5.03 Mhz 81.8 % 1.4 dB +/- 10.0% (band) > 60% (typical)
Freq. (MHz)
________________________________________ Part Number: XAAB-0004 Description: ARRAY, 5-L-64-38.4X10-A2-P-2.5-OM Serial Number: D0259
4.5
50 1 Elements 64
Bandwidth (%)
Amplitude (V)
The 6dB percent bandwidth bar graph displays a calculated percent bandwidth value for each of the probes elements. This value is determined by using the length (in frequency) of an imaginary line intersecting a given elements spectrum (FFT) data at the 6db level and calculated as a percentage of the center frequency. The average value of all the probes elements is displayed at the top of the graph.
Peak-to-Peak Sensitivity
The peak-to-peak sensitivity bar graph displays a value for each of the probes elements, representing the sensitivity of the probe. This value is calculated by using the magnitude of the excitation (test) pulse sent to each element and the peak-to-peak voltage measurement of that elements pulse-echo return (from the test target). The reported value is 20 multiplied by the log of the ratio of these two magnitudes. The average value of all the probes elements is displayed at the top of the graph.
-3.0 1 Elements 64
____________________________________________
AVG MAX MIN RANGE ______________________________ Center Frequency (MHz) -6dB Bandwidth (%) Vp-p Sensitivity (dB) -20dB Pulse Width (ns) -40dB Pulse Width (ns) 5.03 81.8 -45.9 355 765 5.08 83.4 -45.1 360 880 4.96 79.9 -46.5 346 678
Page 2 of 3
1.4
Pulse Width
The various pulse-width bar graphs display values representing the axial resolution of the elements pulse-echo returns at various levels, such as 20dB, 30dB and 40dB. These values are calculated by measuring the return pulses width (in nanoseconds) at the desired level. Axial resolution is an important measure of the ability to distinguish individual pulse returns from one another during a normal transducer operation. The average value of all the probes elements is displayed at the top of the graph.
R/D Tech Ultrasonic Transducers 60 Decibel Road, Suite 300, State College, PA 16801 USA Tel.: (1) (814) 689-1390 Fax: (1) (814) 689-1395
__________________________________________________________________________ Part Number: XAAB-0004 Description: ARRAY, 5-L-64-38.4X10-A2-P-2.5-OM Serial Number: D0259
Test Conditions
_________________
600
Pulser Voltage : 70 V Pulse Width : 50 ns Primary Gain : 8 dB Secondary Gain : 37 dB Scope Delay : 18.7 us
System : FOCUS
Scope Volts per Division : 0.127 V Test Medium : Testing on 2cm Rexolite Block
Elements
64
Warranty Information
_____________________
R/D Tech Ultrasonic Transducers offers a one-year warranty on all the phased-array transducers sold by R/D Tech. These products are guaranteed against all defects in materials and manufacturing. All products covered by this warranty must be examined by R/D Tech Ultrasonic transducers and receive their approval in advance before any repairs or replacement are made. Any shipping costs are at the expense of the customer. The warranty excludes defects and deterioration due to normal wear and tear, or caused by an external accident such as: - Incorrect assembly - Poor maintenance - Incorrect usage including, but not limited to, the firing of the probe in air (WARNING : This will damage the probe) - Exposition to temperatures out of the range of -20 C to +60 C for storage or 10 C to 40 C for operation - Excessive voltage (max. 180 V for 7.5 Mhz and below, max. 100 V for 10 Mhz and above) - Use of unqualified couplant - Unforeseen modifications of the product Page 3 of 3
23
Training
Olympus has recently developed its unique Training Academy, which is a partnership with major training companies in an effort to offer comprehensive courses in phased array technology and applications. Courses range from a two-day Introduction to Phased Array program to an in-depth, two-week LevelII Phased Array course. In both cases, students experience practical training utilizing the portable OmniScan phased array unit. Courses lead either to recognized certication or to certicates of attendance. Courses are currently being offered at the training facilities of participating companies as well as at customer-determined locations worldwide. Customized courses can also be arranged. Check the latest course schedule at www.olympus-ims.com.
How to Order
For pricing or for further information, consult the ordering information outlined on page 7 and call your local sales representative. To locate the nearest Olympus ofce, please visit www.olympus-ims.com
Olympus has introduced the new Phased Array Testing eld guide as a convenient resource for customers and anyone else interested in phased array technology. It is designed to be an easy-to follow introduction to ultrasonic phased array testing, both for newcomers and for more experienced users who wish to review basic principles. This guide begins by explaining what phased array testing is and how it works, then outlines some considerations for selecting probes and instruments, and concludes with further reference information and a Phased Array Glossary. This free eld guide is available from your local sales representative. To locate the nearest Olympus ofce, please visit www.olympus-ims.com
s NDT Field Guide
Shinjuku Monilith, 3-1Nishi-Shinjuku2-chome, Shinjuku-ku, Tokyo 163-0914, Japan, Tel: 81(0)3-6901-4039 48 Woerd Avenue, Waltham, MA 02453, USA, Tel.: (1) 781-419-3900
www.olympus-ims.com
info@olympusNDT.com
Stock Road, Southend-on-Sea, Essex, SS2 5QH, UK, Tel.: (44) (0) 1702 616333 505, boul. du Parc-Technologique, Qubec (Qubec) G1P 4S9, Tel.: (1) 418-872-1155 31 Gilby Road, Mount Waverly, Victoria, 3149, Tel.: (61) 130-013-2992 Valley Point Office Tower, 248373, Tel: (65) 68-34-00-10 PA_Probe_Catalog_EN_201308 Printed in Canada Copyright 2010 by Olympus NDT. *All specications are subject to change without notice. All brands are trademarks or registered trademarks of their respective owners and third party entities.