Article

Memory fault diagnosis by syndrome compression

Authors:

J. Li,

C. WuAuthors Info & Claims

DATE '01: Proceedings of the conference on Design, automation and test in Europe

Pages 97 - 101

Published: 13 March 2001 Publication History

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Cited By

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Tseng TLi JChang DGielen G(2006)A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmapProceedings of the conference on Design, automation and test in Europe: Proceedings10.5555/1131481.1131498(53-58)Online publication date: 6-Mar-2006
Wang LWu CWen X(2006)VLSI Test Principles and ArchitecturesundefinedOnline publication date: 14-Aug-2006
Appello DFudoli ATancorre VBernardi PCorno FRebaudengo MReorda M(2004)A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing TechniquesJournal of Electronic Testing: Theory and Applications10.1023/B:JETT.0000009315.57771.9420:1(79-87)Online publication date: 1-Feb-2004
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Index Terms

Memory fault diagnosis by syndrome compression
1. Computer systems organization
  1. Dependable and fault-tolerant systems and networks
2. Hardware

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Information & Contributors

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Published In

DATE '01: Proceedings of the conference on Design, automation and test in Europe

March 2001

756 pages

ISBN:0769509932

Editors:
Wolfgang Nebel
Oldenburg Univ. and OFFIS, Germany
,
Ahmed Jerraya
TIMA, Grenoble, France

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IEEE Press

Publication History

Published: 13 March 2001

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Cited By

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Tseng TLi JChang DGielen G(2006)A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmapProceedings of the conference on Design, automation and test in Europe: Proceedings10.5555/1131481.1131498(53-58)Online publication date: 6-Mar-2006
Wang LWu CWen X(2006)VLSI Test Principles and ArchitecturesundefinedOnline publication date: 14-Aug-2006
Appello DFudoli ATancorre VBernardi PCorno FRebaudengo MReorda M(2004)A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing TechniquesJournal of Electronic Testing: Theory and Applications10.1023/B:JETT.0000009315.57771.9420:1(79-87)Online publication date: 1-Feb-2004
Li JHuang HChen JSu CWu CCheng CChen SHwang CLin H(2002)A Hierarchical Test Scheme for System-On-Chip DesignsProceedings of the conference on Design, automation and test in Europe10.5555/882452.874547Online publication date: 4-Mar-2002
Wang CWu CLi JWu CTeng TChiu KLin H(2002)A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAMJournal of Electronic Testing: Theory and Applications10.1023/A:102080522421918:6(637-647)Online publication date: 1-Dec-2002
Li JTzeng RWu C(2002)Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-TestJournal of Electronic Testing: Theory and Applications10.1023/A:101655792747918:4-5(515-527)Online publication date: 1-Aug-2002
Li JCheng KHuang CWu C(2001)March-Based RAM Diagnosis Algorithms for Stuck-At and Coupling FaultsProceedings of the 2001 IEEE International Test Conference10.5555/839296.843728Online publication date: 30-Oct-2001

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Fault-Pattern Oriented Defect Diagnosis for Flash Memory

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A memory built-in self-diagnosis design with syndrome compression