Article

An Efficient Method for Compressing Test Data

Authors:

Takahiro Yamaguchi,

Masahiro Ishida,

Marco Tilgner,

Dong Sam HaAuthors Info & Claims

Proceedings of the IEEE International Test Conference

Pages 79 - 88

Published: 03 November 1997 Publication History

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Hashempour HLombardi FLach JQu GIsmail Y(2005)Two dimensional reordering of functional test data for compression by ATEProceedings of the 15th ACM Great Lakes symposium on VLSI10.1145/1057661.1057707(188-192)Online publication date: 17-Apr-2005
https://dl.acm.org/doi/10.1145/1057661.1057707
Hashempour HLombardi F(2005)Application of Arithmetic Coding to Compression of VLSI Test DataIEEE Transactions on Computers10.1109/TC.2005.13654:9(1166-1177)Online publication date: 1-Sep-2005
https://dl.acm.org/doi/10.1109/TC.2005.136
Balakrishnan KTouba N(2004)Matrix-based software test data decompression for systems-on-a-chipJournal of Systems Architecture: the EUROMICRO Journal10.1016/j.sysarc.2003.08.00750:5(247-256)Online publication date: 1-Apr-2004
https://dl.acm.org/doi/10.1016/j.sysarc.2003.08.007
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The overall throughput of automatic test equipment (ATE) is affected by the download time of test data. An effective approach to the reduction of the download time is to compress test data before the download. A compression algorithm for test data ...
An Efficient Method for Compressing Test Data
ITC '97: Proceedings of the 1997 IEEE International Test Conference

The overall throughput of automatic test equipment(ATE) is sensitive to the download time of test data. An effec-tiveapproach to the reduction of the download time is tocompress test data before the download. A compression al-gorithmfor test data should ...
Compressing terrain elevation datasets

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Published In

Proceedings of the IEEE International Test Conference

November 1997

1011 pages

ISBN:0780342097

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IEEE Computer Society

United States

Publication History

Published: 03 November 1997

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Hashempour HLombardi FLach JQu GIsmail Y(2005)Two dimensional reordering of functional test data for compression by ATEProceedings of the 15th ACM Great Lakes symposium on VLSI10.1145/1057661.1057707(188-192)Online publication date: 17-Apr-2005
https://dl.acm.org/doi/10.1145/1057661.1057707
Hashempour HLombardi F(2005)Application of Arithmetic Coding to Compression of VLSI Test DataIEEE Transactions on Computers10.1109/TC.2005.13654:9(1166-1177)Online publication date: 1-Sep-2005
https://dl.acm.org/doi/10.1109/TC.2005.136
Balakrishnan KTouba N(2004)Matrix-based software test data decompression for systems-on-a-chipJournal of Systems Architecture: the EUROMICRO Journal10.1016/j.sysarc.2003.08.00750:5(247-256)Online publication date: 1-Apr-2004
https://dl.acm.org/doi/10.1016/j.sysarc.2003.08.007
Hwang SAbraham J(2003)Test data compression and test time reduction using an embedded microprocessorIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2003.81714011:5(853-862)Online publication date: 1-Oct-2003
https://dl.acm.org/doi/10.1109/TVLSI.2003.817140
Kay DChung SMourad SAckland B(2002)Embedded test control schemes for compression in SOCsProceedings of the 39th annual Design Automation Conference10.1145/513918.514091(679-684)Online publication date: 10-Jun-2002
https://dl.acm.org/doi/10.1145/513918.514091
Hwang SAbraham JGhose KMadden PDe VKogge P(2002)Selective-run built-in self-test using an embedded processorProceedings of the 12th ACM Great Lakes symposium on VLSI10.1145/505306.505333(124-129)Online publication date: 18-Apr-2002
https://dl.acm.org/doi/10.1145/505306.505333
Yamaguchi THa DIshida MOhmi T(2002)A Method for Compressing Test Data Based on Burrows-Wheeler TransformationIEEE Transactions on Computers10.1109/TC.2002.100458851:5(486-497)Online publication date: 1-May-2002
https://dl.acm.org/doi/10.1109/TC.2002.1004588
Jas ATouba N(2002)Deterministic Test Vector Compression/Decompression for Systems-on-a-Chip Using an Embedded ProcessorJournal of Electronic Testing: Theory and Applications10.1023/A:101650592657018:4-5(503-514)Online publication date: 1-Aug-2002
https://dl.acm.org/doi/10.1023/A%3A1016505926570
Cullen J(2001)Scan Test Sequencing Hardware for Structural TestProceedings of the 2001 IEEE International Test Conference10.5555/839296.843877Online publication date: 30-Oct-2001
https://dl.acm.org/doi/10.5555/839296.843877
Li JWu C(2001)Memory fault diagnosis by syndrome compressionProceedings of the conference on Design, automation and test in Europe10.5555/367072.367102(97-101)Online publication date: 13-Mar-2001
https://dl.acm.org/doi/10.5555/367072.367102
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A Method for Compressing Test Data Based on Burrows-Wheeler Transformation

An Efficient Method for Compressing Test Data

Compressing terrain elevation datasets

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