Integrated Optoelectronic Turnkey Testing Solution, which includes semiautomatic PS4L 200 mm Double-Sided Probing System for Testing VCSEL Die, Partial Wafer, and Whole Wafer Form Over Temperature in a Dark Environment & Test Instrumentation

Integrated Optoelectronic Turnkey Testing Solution, which Includes a Semiautomatic PS4L 200 mm Double-Sided Probing System for Testing VCSEL Die, Partial Wafers, and Whole Wafers Over Temperature in a Dark Environment & Test Instrumentation

Fully Automated Optoelectronic Probing System for Testing 150 mm and 200 mm Silicon Photonic Wafers using DC, High-Frequency and Hexapod Manipulators

PS4L Fully Automatic 300 mm Double-Sided Probing System for Testing Silicon Photonic Wafers at Hot and Cold Temperatures in a Shielded Environment using a Probe Card

Semiautomatic PS4L Probing System Configured to Test VCSEL and EELD Products from Ambient to 200 C using Manual & Hexapod Manipulators

Optoelectronics and Photonics Probing Systems

SemiProbe has developed probe stations for a wide variety of optoelectronic and photonic device applications, including light-emitting diodes (LEDs), vertical cavity surface emitting lasers (VCSEL), and photodiodes. Testing and handling small, fragile, thin wafers with thousands of die poses unique challenges requiring innovative solutions. Our unique integrating sphere holder enables users to utilize the same Probe System for Life ® (PS4L) system for horizontal (EELD) and vertical (VCSEL, LED) testing in either a manual or semiautomatic configuration.

Some of our solutions are wafer maps capable of mapping >100 k die, custom chuck systems to handle fragile or broken wafers, and high-speed stages and software to increase throughput.

Optoelectronics and Photonics Probing Systems

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