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WO2024060865A1 - 探头天线及其探头 - Google Patents

探头天线及其探头 Download PDF

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Publication number
WO2024060865A1
WO2024060865A1 PCT/CN2023/111969 CN2023111969W WO2024060865A1 WO 2024060865 A1 WO2024060865 A1 WO 2024060865A1 CN 2023111969 W CN2023111969 W CN 2023111969W WO 2024060865 A1 WO2024060865 A1 WO 2024060865A1
Authority
WO
WIPO (PCT)
Prior art keywords
radiating
probe antenna
feed line
feeder
probe
Prior art date
Application number
PCT/CN2023/111969
Other languages
English (en)
French (fr)
Inventor
蒋克勇
段程刚
Original Assignee
广东曼克维通信科技有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 广东曼克维通信科技有限公司 filed Critical 广东曼克维通信科技有限公司
Publication of WO2024060865A1 publication Critical patent/WO2024060865A1/zh

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01Q—ANTENNAS, i.e. RADIO AERIALS
    • H01Q1/00—Details of, or arrangements associated with, antennas
    • H01Q1/52—Means for reducing coupling between antennas; Means for reducing coupling between an antenna and another structure
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01Q—ANTENNAS, i.e. RADIO AERIALS
    • H01Q1/00—Details of, or arrangements associated with, antennas
    • H01Q1/50—Structural association of antennas with earthing switches, lead-in devices or lightning protectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01Q—ANTENNAS, i.e. RADIO AERIALS
    • H01Q21/00—Antenna arrays or systems

Definitions

  • the present application relates to the field of antenna communication technology, and in particular to a probe antenna and its probe.
  • the antenna is one of the key components of radar, communication and other radio systems, and its performance is directly related to the performance of the entire radio system.
  • the probe is an important component of the antenna test system. Its performance directly determines the test accuracy and efficiency of the antenna test system.
  • existing probes have the problem of poor antenna performance.
  • the application provides a probe antenna.
  • the probe antenna includes two radiating units arranged orthogonally to each other.
  • the radiating unit includes a base plate, two radiating surfaces located on both sides of the base plate, and a
  • the feed line inside the substrate, the radiation surface includes a first conductive region, a second conductive region and a non-conductive region between the first conductive region and the second conductive region, the width of the non-conductive region extends along the first conductive region
  • the feed line includes a coupling feed line segment located below the non-conductive area.
  • the two radiating units each include a machined slit
  • the two radiating units include a first radiating unit and a second radiating unit
  • the machined slit of the first radiating unit is close to the third radiating unit.
  • a first end of a radiating element, the machined slot of the second radiating element is close to the second end of the second radiating element, the first end and the second end are opposite each other, the first radiating element and the second radiating unit are locked with each other through respective machined gaps.
  • the radiation unit includes a first via hole, and two radiation surfaces of the radiation unit are electrically connected through the first via hole.
  • the probe antenna further includes two connectors, the two connectors are respectively connected to the feed lines in the two radiating units, and are used to input signals to the connected feed lines or Receives the signal output from the connected feeder.
  • the radiating unit further includes a target circuit, and the feed line further includes a first feed line segment and a second feed line segment;
  • One end of the first feeder segment is connected to the connector, and the other end of the first feeder segment is electrically connected to one end of the target circuit;
  • the other end of the target circuit is electrically connected to one end of the second feeder segment, and the other end of the second feeder segment is connected to one end of the coupling feeder segment.
  • the feeder line further comprises a feeder line terminal structure, and the feeder line terminal structure is connected to the other end of the coupled feeder line segment;
  • the feeder end structure is in a double arc shape.
  • the radiation unit further includes a second via hole and a third via hole
  • the other end of the first feed line segment is electrically connected to one end of the target circuit through the second via hole;
  • the other end of the target circuit is electrically connected to one end of the second feed line segment through the third via hole.
  • the target circuit includes a resistor, an inductor and a capacitor
  • the first end of the resistor is electrically connected to the first end of the inductor, and the second end of the resistor is electrically connected to the second end of the inductor and the first end of the capacitor respectively.
  • the coupling feed line segments are curved, and the bending directions of the coupling feed line segments in the two radiating units are opposite.
  • this application also provides a probe, which includes the probe antenna provided in any of the above embodiments.
  • the probe antenna includes two radiating units arranged orthogonally to each other, the radiating unit includes a substrate, two radiating surfaces located on both sides of the substrate, and a feeder provided inside the substrate, the radiating surface includes a first conductive area , a second conductive region and a non-conductive region between the first conductive region and the second conductive region, the width of the non-conductive region gradually increases along the first direction, and the feed line includes a coupling The coupling feeder segment is located below the non-conductive area.
  • the two radiating units are consistent, the problem of the asymmetry of the same polarization pattern of the probe antenna is solved, and the two radiating units are arranged orthogonally, which solves the problem of poor consistency of the main polarization patterns of the two radiating units. and weakening the influence of cross-polarization on main polarization.
  • the feeder line is arranged inside the substrate, and the two radiating surfaces on both sides of the substrate include a first conductive area and a second conductive area, so that the electrical signal is transmitted in a closed space without causing leakage of the electrical signal, and improves the efficiency of the probe.
  • the isolation of the antenna improves the performance of the entire probe antenna.
  • Figure 1 is a first structural schematic diagram of a probe antenna in an embodiment
  • Figure 2 is a first plan view of a radiating unit in an embodiment
  • Figure 3 is a second plan view of a radiating unit in an embodiment
  • Figure 4 is a third plan view of a radiating unit in an embodiment
  • Figure 5 is a second structural schematic diagram of the probe antenna in one embodiment
  • Figure 6 is a fourth plan view of a radiating unit in an embodiment
  • Figure 7 is a structural block diagram of a target circuit in an embodiment
  • Figure 8 is a fifth plan view of a radiating unit in an embodiment
  • Figure 9 is a sixth plan view of a radiating unit in an embodiment
  • Figure 10 is a schematic diagram of the isolation of the probe antenna in one embodiment
  • Figure 11 is a schematic diagram of the standing wave ratio of the probe antenna in one embodiment
  • Figure 12 is a schematic diagram of the radiation direction of the probe antenna in one embodiment.
  • 100 probe antenna; 10. radiation unit; 102, radiating surface; 103, feeder line; 1021, first conductive region; 1022. second conductive region; 1023. non-conductive region; 1031. coupling feeder line segment; 104. Machining gap; 105. First radiation unit; 106. Second radiation unit; 107. first via hole; 20. connector; 108. target circuit; 1032. a first feeder line segment; 1033. a second feeder line segment; 1034. a feeder line terminal structure; 109, second via hole; 110, third via hole; 1081, resistor; 1082. Inductor; 1083. Capacitor.
  • first and second are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features. Therefore, features defined as “first” and “second” may explicitly or implicitly include at least one of these features.
  • “plurality” means at least two, for example, two, three, etc., unless otherwise expressly and specifically limited.
  • connection In this application, unless otherwise clearly stated and limited, the terms “installation”, “connection”, “connection”, “fixing” and other terms should be understood in a broad sense. For example, it can be a fixed connection or a detachable connection. , or integrated into one; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be an internal connection between two elements or an interactive relationship between two elements, unless otherwise specified restrictions. For those of ordinary skill in the art, the specific meanings of the above terms in this application can be understood according to specific circumstances.
  • a first feature being “on” or “below” a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediary. touch.
  • the terms “above”, “above” and “above” the first feature is above the second feature may mean that the first feature is directly above or diagonally above the second feature, or simply means that the first feature is higher in level than the second feature.
  • "Below”, “below” and “beneath” the first feature to the second feature may mean that the first feature is directly below or diagonally below the second feature, or simply means that the first feature has a smaller horizontal height than the second feature.
  • FIG 1 is a first structural schematic diagram of a probe antenna in an embodiment.
  • the probe antenna 100 includes two radiating units 10 arranged orthogonally to each other.
  • the radiating unit 10 includes a substrate and two radiators located on both sides of the substrate.
  • the radiation surface includes a first conductive area 1021, a second conductive area 1022, and a non-conductive area 1023 between the first conductive area 1021 and the second conductive area 1022.
  • the non-conductive area 1023 The width of the feeder line 103 gradually increases along the first direction, and the feeder line 103 includes a coupling feeder line segment located below the non-conductive region 1023 .
  • the probe antenna 100 includes two radiating units 10 arranged orthogonally to each other.
  • Each radiating unit 10 is made by pressing two substrates into a whole using a common processing method.
  • the two outer sides of the combined substrate are respectively two radiation surfaces, and the feed line 103 is provided inside the substrate.
  • the first conductive region 1021 and the second conductive region 1022 are formed on the radiating surface by printing metal circuits.
  • the first conductive region 1021 and the second conductive region 1022 are in the shape of "rabbit ears" and are filled between the two radiating surfaces.
  • the non-conductive medium serves as a support, and the conductive areas on the two radiating surfaces of each radiating unit 10 (that is, the first conductive area 1021 on one radiating surface and the first conductive area 1021 on the other radiating surface of each radiating unit 10 , or, the second conductive area 1022 on one radiating surface and the second conductive area 1022 on the other radiating surface) and the feed line 103 provided inside the substrate form a strip line transmission network, and the electrical signal is transmitted through the feed line inside the substrate
  • 103 When 103 is transmitting, it can ensure that the electrical signal is transmitted in a closed space without causing leakage of the electrical signal, thereby improving the isolation between the two ports of the dual polarization probe antenna 100.
  • antenna isolation refers to the ratio of the signal power transmitted by one antenna to the signal power received by another antenna. When the antenna isolation is larger, interference between antennas can be avoided.
  • a non-conductive area 1023 is included between the first conductive area 1021 and the second conductive area 1022 on the radiation surface.
  • the width of the non-conductive area 1023 gradually increases along the first direction.
  • the non-conductive area 1023 is non-conductive.
  • the width of the conductive region 1023 gradually increases from bottom to top.
  • the feed line 103 includes a coupling feed line segment located below the non-conductive area 1023.
  • the wavelength of the electrical signal is between When the width of the region 1023 is equivalent, resonance will occur at the corresponding gap width, and the electromagnetic field will be excited to form electromagnetic waves that will be radiated. Since the wavelength of the electrical signal is equivalent to the width of the non-conductive region 1023, resonance will occur at the corresponding gap width.
  • the width of the non-conductive region 1023 is narrower, the corresponding wavelength of the electrical signal is also shorter, and the electromagnetic field formed by the exciting The higher the frequency of the electromagnetic wave, the frequency of the electromagnetic wave formed by exciting the electromagnetic field is the lowest at the point with the largest width in the first direction.
  • the two radiating units 10 are arranged orthogonally, which can improve the consistency of the main polarization patterns of the two radiating units 10, reduce the level of cross-polarization, and weaken the effect of cross-polarization on the main polarization. Impact.
  • the two radiation units 10 are the same, that is, the shape of the radiation unit 10, the width of the first conductive area 1021, the second conductive area 1022, the width of the non-conductive area 1023 between the first conductive area 1021 and the second conductive area 1022, and the feeding line 103 arranged inside the substrate are all the same, which can change the problem of asymmetry of the same polarization pattern of the probe antenna 100.
  • the substrate can be a high-frequency dielectric printed circuit PCB board.
  • the radiation unit 10 is made by processing and pressing two PCB boards together, and a feeder line 103 is provided between the two PCB boards.
  • the probe antenna includes two radiating units arranged orthogonally to each other, the radiating unit includes a substrate, two radiating surfaces located on both sides of the substrate, and a feeder arranged inside the substrate, the radiating surface includes a first conductive area, a second conductive area, and a non-conductive area located between the first conductive area and the second conductive area, the width of the non-conductive area gradually increases along the first direction, and the feeder includes a coupling feeder segment, and the coupling feeder segment is located below the non-conductive area.
  • the feeder is arranged inside the substrate, and the two radiating surfaces on both sides of the substrate include a first conductive area and a second conductive area, so that the electrical signal is transmitted in a closed space, and the leakage of the electrical signal will not be caused, thereby improving the isolation of the probe antenna and thus improving the performance of the entire probe antenna.
  • FIG. 2 is a first plan view of a radiation unit in one embodiment
  • FIG. 3 is a second plan view of a radiation unit in one embodiment.
  • the first plan view is a schematic view of the radiation surface of the first radiation unit.
  • the second plan schematic diagram takes the schematic diagram of the radiation surface of the second radiation unit as an example.
  • both radiation units include a mechanically processed gap 104
  • the two radiation units include a first radiation unit 105 and a second radiation unit 106.
  • the mechanically processed gap 104 of the first radiation unit 105 is close to the first end of the first radiation unit 105
  • the mechanically processed gap 104 of the second radiation unit 106 is close to the second end of the second radiation unit 106.
  • the first end and the second end are opposite to each other, and the first radiation unit 105 and the second radiation unit 106 are mutually clamped through their respective mechanically processed gaps 104.
  • the two radiating units are orthogonally engaged with each other, and a slit needs to be opened where the two radiating units are combined, so both radiating units include a machined slit 104 .
  • the two radiating units include a first radiating unit 105 and a second radiating unit 106.
  • the machined gap 104 of the first radiating unit 105 is close to the first end of the first radiating unit 105. It is opened from the uppermost end of the first radiation unit 105 to the top of the annular shape, and the machining gap 104 is located in the middle of the second direction.
  • the machining slit 104 of the second radiating unit 106 is close to the second end of the second radiating unit 106 and is opened from the lowermost end of the second radiating unit to the top of the ring shape.
  • the mechanical processing gap 104 of the first radiating unit 105 is The lowermost end of the machining slit 104 (the point where the machining slit 104 is cut off) just coincides with the uppermost end of the machining slit 104 of the second radiating unit 106 (the point where the machining slit 104 is cut off).
  • the second radiating unit The machined gap 104 of 106 is also located in the middle of the second direction, ensuring that the two radiating units can be completely orthogonally arranged.
  • FIG. 4 is a third schematic plan view of a radiating unit in an embodiment.
  • the third schematic plan view takes the schematic view of the radiation surface 102 of the radiating unit as an example.
  • the radiation unit includes a first via hole 107 , and the two radiation surfaces 102 of the radiation unit are electrically connected through the first via hole 107 .
  • the first via hole 107 is a metal via hole, which connects the two radiating surfaces 102 of the radiating unit, mainly to electrically connect the conductive areas on the two radiating surfaces 102 through the first via hole 107.
  • the conductive area on surface 102 acts as "ground”.
  • FIG. 5 is a second structural schematic diagram of the probe antenna in one embodiment.
  • the probe antenna 100 also includes two connectors 20.
  • the two connectors 20 are respectively connected to the feed lines 103 in the two radiating units. It is used to input signals to the connected feeder line 103 or receive signals output from the connected feeder line 103 .
  • the two connectors 20 of the probe antenna 100 are respectively connected to the two radiators.
  • the connector 20 serves as the input interface of the feeder 103
  • the electrical signal from the device body flows through the feeder 103 to reach the radiation
  • the first conductive region and the second conductive region on the surface transmit the electrical signal to the non-conductive region between the first conductive region and the second conductive region in a coupling manner, and excite the electromagnetic field to form electromagnetic waves that are radiated along the first direction.
  • the connector 20 serves as the output interface of the feed line 103, it receives electromagnetic wave energy through the first conductive area and the second conductive area of the radiation surface, and then converts the electromagnetic wave energy into electrical signals and transmits them to the device body.
  • FIG. 6 is a fourth three-dimensional schematic diagram of a radiating unit in an embodiment.
  • the fourth schematic diagram takes the radiating surface 102 of the first radiating unit as an example.
  • the radiating unit also includes a target circuit 108, a feed
  • the wire also includes a first feeder segment 1032 and a second feeder segment 1033; one end of the first feeder segment 1032 is connected to the connector 20, and the other end of the first feeder segment 1032 is electrically connected to one end of the target circuit 108; target The other end of the circuit 108 is electrically connected to one end of the second feeder section 1033 , and the other end of the second feeder section is connected to one end of the coupling feeder section 1031 .
  • the radiation unit also includes a target circuit 108.
  • the target circuit 108 is disposed in the first conductive area of the radiation surface.
  • the feeder line is disposed inside the substrate and includes a first feeder line segment 1032 and a second feeder line segment 1033.
  • the connector 20 is electrically connected to the first feeder section 1032, and the electrical signal of the external device body is transmitted to the first feeder section 1032 through the connector 20.
  • the other end of the first feeder section 1032 is electrically connected to one end of the target circuit 108, The first feed line 1032 segment is then transmitted to the target circuit 108 .
  • the other end of the target circuit 108 is electrically connected to one end of the second feeder section 1033, and the other end of the second feeder section 1033 is connected to one end of the coupling feeder section 1031.
  • the electrical signal of the target circuit 108 finally passes through the second feeder section. 1033 is transmitted to coupling feeder segment 1031.
  • the other end of the first feed line section 1032 is electrically connected to one end of the target circuit 108, and the other end of the target circuit 108 is electrically connected to one end of the second feed line section 1033.
  • They can be connected through metal vias, or they can be connected through metal vias.
  • two conductive components are set on the substrate. One end of the conductive component extends into the inside of the substrate. The first ends of the two conductive components are connected to the first feed line segment 1032 and the second feed line segment 1033 respectively. The two conductive components The other ends of are connected to both ends of the target circuit 108 respectively.
  • the function of the target circuit 108 is to reduce the standing wave ratio of the probe antenna.
  • the radiation unit also includes a second via hole 109 and a third via hole 110; the other end of the first feed line segment 1032 is electrically connected to one end of the target circuit 108 through the second via hole 109; the other end of the target circuit 108 is connected to One end of the second power supply line segment 1033 is electrically connected through the third via hole 110 .
  • the second via hole 109 and the third via hole 110 are also metal via holes.
  • the target circuit 108 since the target circuit 108 is disposed in the conductive area of the radiation surface 102, when the other end of the first feed line segment 1032 is electrically connected to one end of the target circuit 108, the electrical connection is mainly through the second via hole 109, using the third via hole 109.
  • the two via holes 109 connect the first feed line segment 1032 to the target circuit 108.
  • the other end of the target circuit 108 is electrically connected to the second feed line segment 1033, it is electrically connected through the third via hole 110.
  • the third via hole 110 is used. Connect the second feeder segment 1033 to the target circuit 108 .
  • the target circuit 108 includes a resistor 1081, an inductor 1082 and a capacitor 1083; the first end of the resistor 1081 is electrically connected to the first end of the inductor 1082, and the second end of the resistor 1081 is respectively connected to the first end of the inductor 1082.
  • the two terminals and the first terminal of the capacitor 1083 are electrically connected.
  • the target circuit 108 includes a resistor 1081 , an inductor 1082 and a capacitor 1083 .
  • the resistor 1081 and the inductor 1082 are connected in parallel, and then connected in series with the capacitor 1083 .
  • FIG 8 is a fifth schematic plan view of the radiating unit in an embodiment.
  • the fifth schematic plan view takes the schematic view of the radiation surface 102 of the first radiating unit as an example.
  • the feed line also includes a feed line end structure 1034.
  • the feeder end structure 1034 is connected to the other end of the coupled feeder segment 1031; the feeder end structure 1034 is in the shape of a double arc.
  • the feeder end structure 1034 is connected to the other end of the coupling feeder segment 1031.
  • the electrical signal flowing through the coupling feeder segment 1031 is transmitted to the non-conductive area of the radiation surface 102 in a coupling manner.
  • the signal wavelength is within
  • the width of the non-conductive area of the radiation surface 102 is equal to that of the radiation surface 102, resonance will occur, and the electromagnetic field will be excited to form electromagnetic waves that will be radiated out.
  • some electrical signals are not fully coupled, they will continue to be transmitted to the feeder end structure 1034 through the coupling feeder section 1031, and then pass through the feeder.
  • the wire end structure 1034 returns to the coupling feeder segment 1031, and then transmits part of the electrical signal to the non-conductive area of the radiation surface 102 in a coupled manner, thereby stimulating the electromagnetic field to form electromagnetic waves for radiation.
  • the feeder end structure 1034 is changed from the traditional sector shape to a double arc shape, which can improve the isolation of the probe antenna.
  • the isolation can reach more than 50dB.
  • Figure 9 is a sixth schematic plan view of the radiating unit in an embodiment.
  • the sixth schematic plan view takes the schematic view of the radiation surface 102 of the second radiating unit as an example.
  • the coupling feeder segment 1031 is curved. And the bending directions of the coupling feed line segments 1031 in the two radiating units are opposite.
  • the coupling feed line segment 1031 is set to be curved.
  • the bending directions of the coupling feed line segments 1031 in the two radiation units are opposite, as shown in Figures 8 and 9, the coupling feed line segment 1031 of the first radiation unit is bent downward, and the coupling feed line segment 1031 of the second radiation unit is bent upward.
  • An embodiment of the present application also provides a probe, including the probe antenna provided in any of the above embodiments.
  • Figure 10 is a schematic diagram of the isolation of the probe antenna in one embodiment. As shown in Figure 10, the isolation of the probe antenna port at different frequencies is shown.
  • Figure 11 is a schematic diagram of the standing wave ratio of the probe antenna in one embodiment. As shown in Figure 11, it shows the magnitude of the standing wave ratio at different frequencies.
  • Figure 12 is a schematic diagram of the radiation direction of the probe antenna in one embodiment. As shown in Figure 12, the upper curve in Figure 12 is a schematic diagram of the main polarization direction of the probe antenna, and the lower curve in Figure 12 is the cross-polarization of the probe antenna. Schematic diagram of direction.
  • the radiation pattern of the probe antenna changes smoothly without sudden changes; when the radiation pattern meets the requirements, the frequency band of the antenna can cover 0.6GHz-6GHz.
  • the frequency band of the antenna can cover 0.6GHz-6GHz.
  • the standing wave ratio of the probe antenna in the 6GHz range is ⁇ 2.6; the isolation of the two input ports of dual polarization is >50dB, and the cross-polarization ratio is >15dB.

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Abstract

本申请涉及一种探头天线及其探头，探头天线包括相互正交设置的两个辐射单元，辐射单元包括基板、位于基板两侧的两个辐射面以及设置于基板内部的馈电线，辐射面包括第一导电区域、第二导电区域以及位于第一导电区域和第二导电区域之间的非导电区域，非导电区域的宽度沿第一方向逐渐增加，馈电线包括耦合馈电线段，耦合馈电线段位于非导电区域的下方。本申请中由于两个辐射单元一致且正交设置，解决了探头天线同一极化方向图不对称的问题，以及主极化的方向图一致性差、交叉极化对主极化的影响。进一步地，馈电线设置在基板内部，使得电信号在一个封闭的空间传输，不会造成电信号的泄露，提高了探头天线的隔离度，从而提高了整个探头天线的性能。

Description

探头天线及其探头
相关申请
本申请要求2022年09月23日申请的，申请号为2022111630381，名称为“探头天线及其探头”的中国专利申请的优先权，在此将其全文引入作为参考。
技术领域
本申请涉及天线通讯技术领域，特别是涉及一种探头天线及其探头。
背景技术
随着航空航天和5G通信技术的迅猛发展，对雷达及通信系统的性能要求也越来越高。天线是雷达、通信等无线电系统的关键部件之一，它的性能直接关系到整个无线电系统的性能。探头是天线测试系统的重要部件，它的性能的直接决定了天线测试系统的测试精度和测试效率，但是现有的探头存在天线性能较差的问题。
发明内容
基于此，有必要针对上述技术问题，提供一种高性能的探头天线及其探头。
第一方面，本申请提供了一种探头天线，所述探头天线包括相互正交设置的两个辐射单元，所述辐射单元包括基板、位于所述基板两侧的两个辐射面以及设置于所述基板内部的馈电线，所述辐射面包括第一导电区域、第二导电区域以及位于所述第一导电区域和第二导电区域之间的非导电区域，所述非导电区域的宽度沿第一方向逐渐增加，所述馈电线包括耦合馈电线段，所述耦合馈电线段位于所述非导电区域的下方。
在其中一个实施例中，所述两个辐射单元均包括机械加工缝隙，所述两个辐射单元包括第一辐射单元和第二辐射单元，所述第一辐射单元的机械加工缝隙靠近所述第一辐射单元的第一端，所述第二辐射单元的机械加工缝隙靠近所述第二辐射单元的第二端，所述第一端和所述第二端彼此相对，所述第一辐射单元和所述第二辐射单元通过各自的机械加工缝隙相互卡接。
在其中一个实施例中，所述辐射单元包括第一过孔，所述辐射单元的两个辐射面通过所述第一过孔电连接。
在其中一个实施例中，所述探头天线还包括两个连接器，所述两个连接器分别与所述两个辐射单元中的所述馈电线连接，用于向连接的馈电线输入信号或者接收连接的馈电线输出的信号。
在其中一个实施例中，所述辐射单元还包括目标电路，所述馈电线还包括第一馈电线段和第二馈电线段；
所述第一馈电线段的一端与所述连接器连接，所述第一馈电线段的另一端与所述目标电路的一端电连接；
所述目标电路的另一端与所述第二馈电线段的一端电连接，所述第二馈电线段的另一端与所述耦合馈电线段的一端连接。
在其中一个实施例中，所述馈电线还包括馈电线末端结构，所述馈电线末端结构与所述耦合馈电线段的另一端连接；
所述馈电线末端结构为双弧线形状。
在其中一个实施例中，所述辐射单元还包括第二过孔和第三过孔；
所述第一馈电线段的另一端通过所述第二过孔与所述目标电路的一端电连接；
所述目标电路的另一端与所述第二馈电线段的一端通过所述第三过孔电连接。
在其中一个实施例中，所述目标电路包括电阻、电感和电容；
所述电阻的第一端与所述电感的第一端电连接，所述电阻的第二端分别与所述电感的第二端、所述电容的第一端电连接。
在其中一个实施例中，所述耦合馈电线段呈曲线状，且所述两个辐射单元中的耦合馈电线段的弯曲方向相反。
第二方面，本申请还提供了一种探头，所述探头包括如上述任一实施例提供的探头天线。
上述探头天线及其探头，探头天线包括相互正交设置的两个辐射单元，辐射单元包括基板、位于基板两侧的两个辐射面以及设置于基板内部的馈电线，辐射面包括第一导电区域、第二导电区域以及位于第一导电区域和第二导电区域之间的非导电区域，非导电区域的宽度沿第一方向逐渐增加，馈电线包括耦 合馈电线段，耦合馈电线段位于非导电区域的下方。本申请中由于两个辐射单元一致，解决了探头天线同一极化方向图不对称的问题，且两个辐射单元正交设置，解决了两个辐射单元主极化的方向图一致性差的问题，以及减弱了交叉极化对主极化的影响。进一步地，馈电线设置在基板内部，基板两侧的两个辐射面包括第一导电区域和第二导电区域，使得电信号在一个封闭的空间传输，不会造成电信号的泄露，提高了探头天线的隔离度，从而提高了整个探头天线的性能。
附图说明
图1为一个实施例中探头天线的第一结构示意图；
图2为一个实施例中辐射单元的第一平面示意图；
图3为一个实施例中辐射单元的第二平面示意图；
图4为一个实施例中辐射单元的第三平面示意图；
图5为一个实施例中探头天线的第二结构示意图；
图6为一个实施例中辐射单元的第四平面示意图；
图7为一个实施例中目标电路的结构框图；
图8为一个实施例中辐射单元的第五平面示意图；
图9为一个实施例中辐射单元的第六平面示意图；
图10为一个实施例中探头天线的隔离度示意图；
图11为一个实施例中探头天线的驻波比示意图；
图12为一个实施例中探头天线得辐射方向示意图。
附图标记说明：
100、探头天线；         10、辐射单元；
102、辐射面；           103、馈电线；            1021、第一导电区域；
1022、第二导电区域；    1023、非导电区域；       1031、耦合馈电线段；
104、机械加工缝隙；     105、第一辐射单元；      106、第二辐射单元；
107、第一过孔；         20、连接器；             108、目标电路；
1032、第一馈电线段；    1033、第二馈电线段；     1034、馈电线末端结构；
109、第二过孔；        110、第三过孔；         1081、电阻；
1082、电感；           1083、电容。
具体实施方式
为了使本申请的目的、技术方案及优点更加清楚明白，以下结合附图及实施例，对本申请进行进一步详细说明。应当理解，此处描述的具体实施例仅仅用以解释本申请，并不用于限定本申请。
在本申请的描述中，需要理解的是，术语“中心”、“纵向”、“横向”、“长度”、“宽度”、“厚度”、“上”、“下”、“前”、“后”、“左”、“右”、“竖直”、“水平”、“顶”、“底”、“内”、“外”、“顺时针”、“逆时针”、“轴向”、“径向”、“周向”等指示的方位或位置关系为基于附图所示的方位或位置关系，仅是为了便于描述本申请和简化描述，而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作，因此不能理解为对本申请的限制。
在本申请中，术语“第一”、“第二”仅用于描述目的，而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此，限定有“第一”、“第二”的特征可以明示或者隐含地包括至少一个该特征。在本申请的描述中，“多个”的含义是至少两个，例如，两个，三个等，除非另有明确具体的限定。
在本申请中，除非另有明确的规定和限定，术语“安装”、“相连”、“连接”、“固定”等术语应做广义理解，例如，可以是固定连接，也可以是可拆卸连接，或成一体；可以是机械连接，也可以是电连接；可以是直接相连，也可以通过中间媒介间接相连，可以是两个元件内部的连通或两个元件的相互作用关系，除非另有明确的限定。对于本领域的普通技术人员而言，可以根据具体情况理解上述术语在本申请中的具体含义。
在本申请中，除非另有明确的规定和限定，第一特征在第二特征“上”或“下”可以是第一和第二特征直接接触，或第一和第二特征通过中间媒介间接接触。而且，第一特征在第二特征“之上”、“上方”和“上面”可是第一特征在第二特征正上方或斜上方，或仅仅表示第一特征水平高度高于第二特征。第一特征在第二特征“之下”、“下方”和“下面”可以是第一特征在第二特征正下方或斜下方，或仅仅表示第一特征水平高度小于第二特征。
需要说明的是，当元件被称为“固定于”或“设置于”另一个元件，它可以直接在另一个元件上或者也可以存在居中的元件。当一个元件被认为是“连接”另一个元件，它可以是直接连接到另一个元件或者可能同时存在居中元件。本文所使用的术语“垂直的”、“水平的”、“上”、“下”、“左”、“右”以及类似的表述只是为了说明的目的，并不表示是唯一的实施方式。
图1为一个实施例中探头天线的第一结构示意图，如图1所示，探头天线100包括相互正交设置的两个辐射单元10，辐射单元10包括基板、位于基板两侧的两个辐射面以及设置于基板内部的馈电线103，辐射面包括第一导电区域1021、第二导电区域1022以及位于第一导电区域1021和第二导电区域1022之间的非导电区域1023，非导电区域1023的宽度沿第一方向逐渐增加，馈电线103包括耦合馈电线段，耦合馈电线段位于非导电区域1023的下方。
在本实施例中，如图1所示，探头天线100包括相互正交设置的两个辐射单元10，每个辐射单元10都是将两个基板采用通用的加工方式压合为一个整体，压合后的基板的两个外侧分别为两个辐射面，基板的内部设置馈电线103。在辐射面上通过印制金属线路的方式形成第一导电区域1021和第二导电区域1022，第一导电区域1021和第二导电区域1022呈“兔耳”状，在两个辐射面之间填充非导电的介质作为支撑，每个辐射单元10的两个辐射面上的导电区域(即各辐射单元10的一个辐射面上的第一导电区域1021和另一个辐射面上的第一导电区域1021，或者，一个辐射面上的第二导电区域1022和另一个辐射面上的第二导电区域1022)以及设置于基板内部的馈电线103构成带状线传输网络，电信号在基板内部的馈电线103进行传输时，可以保证得电信号在一个封闭的空间传输，不会造成电信号的泄露，提高双极化探头天线100两个端口之间的隔离度。
其中，天线隔离度是指一个天线发射的信号与另一个天线所接收的信号功率的比值，当天线隔离度越大时，可以避免天线之间的干扰。
在本实施例中，辐射面上的第一导电区域1021和第二导电区域1022之间包括非导电区域1023，非导电区域1023的宽度沿第一方向逐渐增加，从图1中示例可知，非导电区域1023的宽度从下至上逐渐增加。馈电线103包括耦合馈电线段，耦合馈电线段位于非导电区域1023的下方，电信号的波长在与非导电 区域1023的宽度相当时就会在与对应缝隙宽度处会产生谐振，激发电磁场形成电磁波辐射出去。由于电信号的波长在与非导电区域1023的宽度相当时就会在与对应缝隙宽度处会产生谐振，非导电区域1023的宽度越窄时，对应的电信号波长也越短，激发电磁场形成的电磁波的频率越高，在第一方向上宽度最大处，激发电磁场形成的电磁波的频率最低。非导电区域1023的宽度的变化范围越大，激发电磁场形成的电磁波的频率范围越大，覆盖频段更宽，达到探头天线100超宽频的目的。
在本实施例中，两个辐射单元10正交设置，可以提高两个辐射单元10各自的主极化方向图的一致性，降低交叉极化的电平，减弱了交叉极化对主极化的影响。
在本实施例中，两个辐射单元10是一样的，即辐射单元10的形状、第一导电区域1021、第二导电区域1022、第一导电区域1021和第二导电区域1022之间非导电区域1023的宽度一致、以及设置在基板内部的馈电线103全部相同，可以改变探头天线100同一极化方向图不对称的问题。
可选的，基板可以为高频介质印制电路PCB板，辐射单元10就是将两个PCB板加工压合在一起，在两个PCB板之间设置馈电线103。
本申请实施例中，探头天线包括相互正交设置的两个辐射单元，辐射单元包括基板、位于基板两侧的两个辐射面以及设置于基板内部的馈电线，辐射面包括第一导电区域、第二导电区域以及位于第一导电区域和第二导电区域之间的非导电区域，非导电区域的宽度沿第一方向逐渐增加，馈电线包括耦合馈电线段，耦合馈电线段位于非导电区域的下方。本申请中由于两个辐射单元一致，解决了探头天线同一极化方向图不对称的问题，且两个辐射单元正交设置，解决了两个辐射单元主极化的方向图一致性差的问题，以及减弱了交叉极化对主极化的影响。进一步地，馈电线设置在基板内部，基板两侧的两个辐射面包括第一导电区域和第二导电区域，使得电信号在一个封闭的空间传输，不会造成电信号的泄露，提高了探头天线的隔离度，从而提高了整个探头天线的性能。
图2为一个实施例中辐射单元的第一平面示意图，图3为一个实施例中辐射单元的第二平面示意图，第一平面示意图是以第一辐射单元的辐射面的示意 图为例的，第二平面示意图是以第二辐射单元的辐射面的示意图为例的。如图2和图3所示，两个辐射单元均包括机械加工缝隙104，两个辐射单元包括第一辐射单元105和第二辐射单元106，第一辐射单元105的机械加工缝隙104靠近第一辐射单元105的第一端，第二辐射单元106的机械加工缝隙104靠近第二辐射单元106的第二端，第一端和第二端彼此相对，第一辐射单元105和第二辐射单元106通过各自的机械加工缝隙104相互卡接。
在本实施例中，两个辐射单元是相互正交卡合在一起，需要在两个辐射单元结合的地方开缝，所以两个辐射单元均包括机械加工缝隙104。
在本实施例中，两个辐射单元包括第一辐射单元105和第二辐射单元106，如图2所示，第一辐射单元105的机械加工缝隙104靠近第一辐射单元105的第一端，从第一辐射单元105的最上端开设至圆环形状的上方，且机械加工缝隙104位于第二方向的正中间。如图3所示，第二辐射单元106的机械加工缝隙104靠近第二辐射单元106的第二端，从第二辐射单元的最下端开设至圆环形状的上方，第一辐射单元105的机械加工缝隙104的最下端(机械加工缝隙104加工截止的点)刚好与第二辐射单元106的机械加工缝隙104的最上端(机械加工缝隙104加工截止的点)重合，同样的，第二辐射单元106的机械加工缝隙104也位于第二方向的正中间，保证了两个辐射单元可以完全正交设置。
图4为一个实施例中辐射单元的第三平面示意图，第三平面示意图是以辐射单元的辐射面102的示意图为例的。如图4所示，辐射单元包括第一过孔107，辐射单元的两个辐射面102通过第一过孔107电连接。
在本实施例中，第一过孔107为金属过孔，将辐射单元的两个辐射面102导通，主要是将两个辐射面102上的导电区域通过第一过孔107电连接，辐射面102上的导电区域起“地”的作用。
图5为一个实施例中探头天线的第二结构示意图，如图5所示，探头天线100还包括两个连接器20，两个连接器20分别与两个辐射单元中的馈电线103连接，用于向连接的馈电线103输入信号或者接收连接的馈电线103输出的信号。
在本实施例中，如图5所示，探头天线100的两个连接器20分别与两个辐 射单元中的馈电线103连接，当连接器20作为馈电线103输入接口时，探头天线100通过连接器20与外部的设备本体连接后，来自于设备本体的电信号流经馈电线103到达辐射面的第一导电区域和第二导电区域，将电信号以耦合的方式传输到第一导电区域和第二导电区域之间的非导电区域，激发电磁场形成电磁波沿着第一方向辐射出去。当连接器20作为馈电线103输出接口时，通过辐射面第一导电区域和第二导电区域接收电磁波能量，再将电磁波能量转换为电信号，传递给设备本体。
图6为一个实施例中辐射单元的第四三平面示意图，第四平面示意图是以第一辐射单元的辐射面102示意图为例的，如图6所示，辐射单元还包括目标电路108，馈电线还包括第一馈电线段1032和第二馈电线段1033；第一馈电线段1032的一端与连接器20连接，第一馈电线段1032的另一端与目标电路108的一端电连接；目标电路108的另一端与第二馈电线段1033的一端电连接，第二馈电线段的另一端与耦合馈电线段1031的一端连接。
在本实施例中，辐射单元还包括目标电路108，目标电路108设置在辐射面的第一导电区域，馈电线设置于基板内部，包括第一馈电线段1032和第二馈电线段1033，连接器20与第一馈电线段1032电连接，通过连接器20将外部设备本体的电信号传输至第一馈电线段1032，第一馈电线段1032的另一端与目标电路108的一端电连接，在通过第一馈电线1032段传输至目标电路108。目标电路108的另一端与第二馈电线段1033的一端电连接，第二馈电线段1033的另一端与耦合馈电线段1031的一端连接，目标电路108的电信号最后通过第二馈电线段1033传输至耦合馈电线段1031。可选的，第一馈电线段1032的另一端与目标电路108的一端电连接，以及目标电路108的另一端与第二馈电线段1033的一端电连接可以通过金属过孔连接，也可以在加工基板的时候，在基板上设置两个导电部件，导电部件一端伸入基板内侧，两个导电部件的第一端分别第一馈电线段1032和第二馈电线段1033连接，两个导电部件的另一端分别连接目标电路108的两端。
在本实施例中，目标电路108的作用是为了降低探头天线的驻波比，探头天线的驻波比越大，会将更多的功率反射回去，辐射到空中的功率就更少，因 此，利用目标电路108来改变探头天线的驻波比。
具体地，辐射单元还包括第二过孔109和第三过孔110；第一馈电线段1032的另一端通过第二过孔109与目标电路108的一端电连接；目标电路108的另一端与第二馈电线段1033的一端通过第三过孔110电连接。
其中，第二过孔109、第三过孔110同样也是金属过孔。
在本实施例中，由于目标电路108设置在辐射面102的导电区域，第一馈电线段1032的另一端与目标电路108的一端电连接时，主要通过第二过孔109电连接，利用第二过孔109将第一馈电线段1032与目标电路108导通，目标电路108的另一端与第二馈电线段1033电连接时，通过第三过孔110电连接，利用第三过孔110将第二馈电线段1033与目标电路108导通。
具体地，如图7所示，目标电路108包括电阻1081、电感1082和电容1083；电阻1081的第一端与电感1082的第一端电连接，电阻1081的第二端分别与电感1082的第二端、电容1083的第一端电连接。
在本实施例中，如图7所示，目标电路108包括电阻1081、电感1082和电容1083，电阻1081和电感1082之间并联，并联之后与电容1083串联。
图8为一个实施例中辐射单元的第五平面示意图，第五平面示意图是以第一辐射单元的辐射面102的示意图为例的，如图8所示，馈电线还包括馈电线末端结构1034，馈电线末端结构1034与耦合馈电线段1031的另一端连接；馈电线末端结构1034为双弧线形状。
在本实施例中，馈电线末端结构1034与耦合馈电线段1031的另一端连接，流经耦合馈电线段1031的电信号以耦合的方式传输到辐射面102的非导电区域，当信号波长在与辐射面102的非导电区域宽度相当时会产生谐振，激发电磁场形成电磁波辐射出去，但是由于部分电信号没有完全耦合，会通过耦合馈电线段1031继续传输至馈电线末端结构1034，再经过馈电线末端结构1034重新回到耦合馈电线段1031，再将部分电信号以耦合的方式传输到辐射面102的非导电区域，从而激发电磁场形成电磁波辐射出去。
在本实施例中，馈电线末端结构1034由传统的扇形改为双弧线形状，可以提高探头天线的隔离度，本申请中，隔离度可以达到50dB以上。
图9为一个实施例中辐射单元的第六平面示意图，第六平面示意图是以第二辐射单元的辐射面102示意图为例的，结合上述图8所示，耦合馈电线段1031呈曲线状，且两个辐射单元中的耦合馈电线段1031的弯曲方向相反。
在本实施例中，为了避免第一辐射单元和第二辐射单元的耦合馈电线段1031的交叉，将耦合馈电线段1031设置为曲线状。两个辐射单元中的耦合馈电线段1031的弯曲方向相反，如图8、图9所示，第一辐射单元的耦合馈电线段1031向下弯曲，第二辐射单元的耦合馈电线段1031向上弯曲。
本申请实施例还提供了一种探头，包括上述任一实施例提供的探头天线。
在本实施例中，将本申请提供的天线应用在探头中，对探头天线的性能进行测试。图10为一个实施例中探头天线的隔离度示意图，如图10所示，分别为不同频率下，探头天线端口的隔离度。图11为一个实施例中探头天线的驻波比示意图，如图11所示，表示了在不同频率下，驻波比的大小。图12为一个实施例中探头天线得辐射方向示意图，如图12所示，图12中上方的曲线为探头天线的主极化方向的示意图，图12中下方的曲线为探头天线的交叉极化方向的示意图。由上述图10、图11和图12可知，探头天线的辐射方向图变化平滑，没有突变；在辐射方向图满足要求的情况下天线的频段可覆盖范围为0.6GHz-6GHz，在频段0.6GHz-6GHz范围内的探头天线的驻波比＜2.6；双极化的两个输入端口隔离度＞50dB，交叉极化比＞15dB。
以上实施例的各技术特征可以进行任意的组合，为使描述简洁，未对上述实施例中的各个技术特征所有可能的组合都进行描述，然而，只要这些技术特征的组合不存在矛盾，都应当认为是本说明书记载的范围。
以上所述实施例仅表达了本申请的几种实施方式，其描述较为具体和详细，但并不能因此而理解为对本申请专利范围的限制。应当指出的是，对于本领域的普通技术人员来说，在不脱离本申请构思的前提下，还可以做出若干变形和改进，这些都属于本申请的保护范围。因此，本申请的保护范围应以所附权利要求为准。

Claims (10)

  1. 一种探头天线，其特征在于，所述探头天线包括相互正交设置的两个辐射单元，所述辐射单元包括基板、位于所述基板两侧的两个辐射面以及设置于所述基板内部的馈电线，所述辐射面包括第一导电区域、第二导电区域以及位于所述第一导电区域和第二导电区域之间的非导电区域，所述非导电区域的宽度沿第一方向逐渐增加，所述馈电线包括耦合馈电线段，所述耦合馈电线段位于所述非导电区域的下方。
  2. 根据权利要求1所述的探头天线，其特征在于，所述两个辐射单元均包括机械加工缝隙，所述两个辐射单元包括第一辐射单元和第二辐射单元，所述第一辐射单元的机械加工缝隙靠近所述第一辐射单元的第一端，所述第二辐射单元的机械加工缝隙靠近所述第二辐射单元的第二端，所述第一端和所述第二端彼此相对，所述第一辐射单元和所述第二辐射单元通过各自的机械加工缝隙相互卡接。
  3. 根据权利要求1所述的探头天线，其特征在于，所述辐射单元包括第一过孔，所述辐射单元的两个辐射面通过所述第一过孔电连接。
  4. 根据权利要求1所述的探头天线，其特征在于，所述探头天线还包括两个连接器，所述两个连接器分别与所述两个辐射单元中的所述馈电线连接，用于向连接的馈电线输入信号或者接收连接的馈电线输出的信号。
  5. 根据权利要求4所述的探头天线，其特征在于，所述辐射单元还包括目标电路，所述馈电线还包括第一馈电线段和第二馈电线段；
    所述第一馈电线段的一端与所述连接器连接，所述第一馈电线段的另一端与所述目标电路的一端电连接；
    所述目标电路的另一端与所述第二馈电线段的一端电连接，所述第二馈电线段的另一端与所述耦合馈电线段的一端连接。
  6. 根据权利要求5任一所述的探头天线，其特征在于，所述馈电线还包括馈电线末端结构，所述馈电线末端结构与所述耦合馈电线段的另一端连接；
    所述馈电线末端结构为双弧线形状。
  7. 根据权利要求5所述的探头天线，其特征在于，所述辐射单元还包括第二过孔和第三过孔；
    所述第一馈电线段的另一端通过所述第二过孔与所述目标电路的一端电连接；
    所述目标电路的另一端与所述第二馈电线段的一端通过所述第三过孔电连接。
  8. 根据权利要求5所述的探头天线，其特征在于，所述目标电路包括电阻、电感和电容；
    所述电阻的第一端与所述电感的第一端电连接，所述电阻的第二端分别与所述电感的第二端、所述电容的第一端电连接。
  9. 根据权利要求1至8任一所述的探头天线，其特征在于，所述耦合馈电线段呈曲线状，且所述两个辐射单元中的耦合馈电线段的弯曲方向相反。
  10. 一种探头，其特征在于，所述探头包括权利要求1至9任一所述的探头天线。
PCT/CN2023/111969 2022-09-23 2023-08-09 探头天线及其探头 WO2024060865A1 (zh)

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WO2022088714A1 (zh) * 2020-10-30 2022-05-05 京东方科技集团股份有限公司 天线及通信系统
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