WO2016143077A1 - メモリ診断装置及びメモリ診断プログラム - Google Patents
メモリ診断装置及びメモリ診断プログラム Download PDFInfo
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- WO2016143077A1 WO2016143077A1 PCT/JP2015/057050 JP2015057050W WO2016143077A1 WO 2016143077 A1 WO2016143077 A1 WO 2016143077A1 JP 2015057050 W JP2015057050 W JP 2015057050W WO 2016143077 A1 WO2016143077 A1 WO 2016143077A1
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/38—Response verification devices
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F12/00—Accessing, addressing or allocating within memory systems or architectures
- G06F12/16—Protection against loss of memory contents
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/06—Acceleration testing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/14—Implementation of control logic, e.g. test mode decoders
- G11C29/16—Implementation of control logic, e.g. test mode decoders using microprogrammed units, e.g. state machines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C2029/4402—Internal storage of test result, quality data, chip identification, repair information
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/36—Data generation devices, e.g. data inverters
Definitions
- the present invention relates to a memory diagnostic device and a memory diagnostic program for detecting a memory failure.
- Patent Document 1 a memory to be diagnosed is divided into a plurality of areas, and a combination of the divided areas is executed in combination with two known memory diagnoses.
- a technique for detecting a memory failure is known.
- a coupling failure is a failure in which other cells change arbitrarily depending on the value of a certain cell in the memory.
- a regenerative failure is a failure in which the value of a certain cell in the memory is fixed to 0 or 1 and does not change.
- Non-patent document 1 discloses a procedure necessary for detecting a coupling failure and a retraction failure.
- Patent Document 1 divides the memory into a plurality of areas, and performs the same process on the divided areas to diagnose the failure.
- the procedure that can be omitted is repeatedly performed, and there is a problem that the processing time becomes long.
- the present invention has been made in view of the above, and an object of the present invention is to obtain a memory diagnostic apparatus that shortens the processing time required for memory diagnosis without lowering the diagnostic rate.
- the present invention is a memory diagnostic device for diagnosing whether or not a failure has occurred in a memory, and divides the memory into a plurality of areas, Select two or more base areas to be diagnosed from the above areas, execute memory diagnosis including read test and write test for all groups, and at the second and subsequent memory diagnosis for the same base area It has a diagnostic execution unit that performs only a writing test.
- the memory diagnostic device has an effect that the processing time required for memory diagnosis can be shortened without lowering the diagnostic rate.
- FIG. 1 is a diagram illustrating a functional configuration of a memory diagnostic device according to a first embodiment
- 1 is a diagram illustrating a hardware configuration of a programmable logic controller that realizes a memory diagnostic device according to a first embodiment
- FIG. 1 is a flowchart showing an operation flow of the memory diagnostic apparatus according to the first embodiment
- FIG. 3 is a diagram schematically illustrating an example of the operation of the memory diagnostic device according to the first embodiment
- FIG. 5 is a diagram schematically illustrating another example of the operation of the memory diagnostic device according to the first embodiment
- FIG. 1 is a diagram illustrating a functional configuration of the memory diagnostic apparatus according to the first embodiment.
- the memory diagnostic device 10 receives a notification from the diagnosis execution unit 13 (to be described later) that the memory diagnosis has been completed for one of the divided areas of the memory, and performs memory diagnosis for each of the divided areas. And a base region diagnosis management unit 11 that replies to the diagnosis execution unit 13 whether the region inquired from the diagnosis execution unit 13 has executed the memory diagnosis.
- the memory diagnostic device 10 is a part of the memory divided into a plurality of areas, and selects a base area that is a basic unit for executing the memory diagnosis and transmits the base area to the diagnosis executing unit 13 12 is provided.
- the memory diagnostic device 10 inquires of the base region diagnosis management unit 11 whether or not the base region transmitted from the base region selection unit 12 has been diagnosed, and performs a read test and a test on the base region transmitted from the base region selection unit 12.
- a diagnosis execution unit 13 that performs a memory test by executing a write test is provided.
- the diagnosis execution unit 13 performs a read test and a write test for each cell in the base region.
- FIG. 2 is a diagram illustrating a hardware configuration of a programmable logic controller that implements the memory diagnostic device according to the first embodiment.
- the programmable logic controller is referred to as PLC (Programmable Logic Controller).
- the PLC 50 is a device that controls the control target device 80.
- the PLC 50 is a processing circuit 51 that executes a memory diagnostic program to perform software processing, a memory 52 that the computing device 51 uses as a work area, a storage device 53 that stores information, and a communication target device 80.
- a communication device 54 is provided.
- arithmetic device 51 a central processing unit (CPU) or a system LSI (Large Scale Integration) can be used.
- the memory 52 a random access memory (RAM) can be used.
- the storage device 53 can be a hard disk drive or a solid state drive.
- FIG. 3 is a diagram illustrating a configuration of the memory diagnostic apparatus according to the first embodiment.
- the memory diagnostic device 10 is realized by the PLC 50 executing a memory diagnostic program and performing software processing. That is, the PLC that is executing the installed memory diagnostic program 60 by the arithmetic device 51 is the memory diagnostic device 10.
- the base area diagnosis management unit 11, the base area selection unit 12, and the diagnosis execution unit 13 are realized by an arithmetic device 51 that is a processing circuit that executes the memory diagnosis program 60 stored in the storage device 53.
- a plurality of processing circuits may cooperate to execute the above function.
- the memory diagnostic program 60 is executed in the background of the control program 70 that the PLC 50 executes to control the control target device 80. That is, the arithmetic unit 51 executes the memory diagnosis program 60 to perform the memory diagnosis of the memory 52 while executing the control program 70 to control the control target device.
- the memory diagnostic apparatus 10 divides the memory 52 to be diagnosed into a plurality of areas, selects two or more areas to be diagnosed from the divided areas, and executes a known memory diagnosis .
- an area to be diagnosed among a plurality of divided areas of the memory 52 is referred to as a “base area”.
- the memory diagnosis device 10 repeatedly performs memory diagnosis by changing the combination of areas to be base areas, and sets all combinations of the divided areas as base areas. As described above, the memory diagnostic device 10 detects a coupling failure between all the cells of the memory 52.
- the diagnosis execution unit 13 if the diagnosis execution unit 13 has executed the memory diagnosis for the base area, the read test for the base area in which the memory diagnosis has been executed is omitted.
- the diagnostic procedure that can detect the regenerative failure and the coupling failure is determined as disclosed in Non-Patent Document 1, and even if the read test for the area where the memory diagnosis has been executed is omitted, all the cells are detected. Necessary procedures that can detect regression faults and coupling faults are satisfied. By omitting the read test for the area where the memory diagnosis has been executed, the memory diagnosis that can detect the coupling failure can be completed in a shorter time than when the read test is not omitted.
- FIG. 4 is a flowchart of an operation flow of the memory diagnostic apparatus according to the first embodiment.
- the memory diagnostic device 10 selects two areas as base areas to be diagnosed from among the divided areas of the memory.
- the diagnosis execution unit 13 inquires of the base region selection unit 12 about a base region to be subjected to memory diagnosis.
- the base region selection unit 12 selects a base region to be diagnosed and notifies the diagnosis execution unit 13 of the base region. Note that the selection order of the base areas is not limited to a specific order, and any order may be used as long as all combinations of the divided areas of the memory 52 are finally selected. Absent.
- step S102 the memory diagnosis device 10 determines whether or not memory diagnosis has been performed on the selected base region. Specifically, the diagnosis execution unit 13 inquires of the base region diagnosis management unit 11 whether the base region transmitted from the base region selection unit 12 has been subjected to memory diagnosis, and the selected base region has been diagnosed. Check if it exists.
- step S102 If the memory diagnosis has not been executed on the base area selected by the base area selection unit 12 before, “No” is determined in step S102, and in step S103, the diagnosis execution unit 13 is based on the answer from the base area diagnosis management unit 11.
- the memory diagnosis is executed on the base area selected by the base area selection unit 12.
- the memory diagnosis here is a general memory diagnosis for performing a read diagnosis and a write diagnosis.
- step S104 the diagnosis execution unit 13 is based on the answer from the base area diagnosis management unit 11. Only the write test is executed on the base area where the memory diagnosis has been executed.
- step S104 ends, the process proceeds to step S105.
- step S105 the memory diagnostic device 10 sets the base area in which the memory diagnosis has been performed as diagnosed. Specifically, the diagnosis execution unit 13 notifies the base region diagnosis management unit 11 of the base region that has been diagnosed after the completion of the memory diagnosis for the base region. The base area diagnosis management unit 11 stores that the base area transmitted from the diagnosis execution unit 13 has been diagnosed.
- step S106 the memory diagnostic device 10 determines whether there is an area to be diagnosed next. Specifically, the diagnosis execution unit 13 inquires of the base region diagnosis management unit 11 about the next region to be diagnosed among the divided regions of the memory 52. If the base region to be diagnosed next is not returned from the base region diagnosis management unit 11, the diagnosis execution unit 13 executes memory diagnosis for all combinations of the divided regions of the memory 52, and then performs the diagnosis. It is determined that there should be no base area (No in step S106), and the memory diagnosis is terminated. When the region to be diagnosed next is returned from the base region diagnosis management unit 11, the diagnosis executing unit 13 determines that there is a base region to be diagnosed next (Yes in step S106), and proceeds to step S101.
- FIG. 5 is a diagram schematically illustrating an example of the operation of the memory diagnostic device according to the first embodiment.
- the memory 52 is divided into three areas, areas m 1 , m 2 and m 3 .
- a region surrounded by a broken line is a base region.
- the memory diagnostic device 10 performs a known memory diagnosis using the areas m 1 and m 2 as the base area.
- the memory diagnostic device 10 performs a known memory diagnosis using the areas m 1 and m 3 as the base area.
- the memory diagnostic device 10 performs a known memory diagnosis using the areas m 2 and m 3 as the base area.
- the known memory diagnosis here is a memory diagnosis in which a memory failure is detected by executing a read test and a write test on the cells of the memory 52 and determining whether or not the values match the expected value.
- Known memory diagnostics can include Abraham and March. These known memory diagnostics are: “Write and read values to and from memory cells, and the read values match the written values.
- a diagnostic method is shown in which the process of “confirm whether or not to perform” is performed with various algorithms in which the order of cells to be processed and the combination thereof are different in accordance with the diagnosis processing time and the diagnosis rate.
- the diagnosis execution unit 13 performs a read test and a write test on the areas m 1 and m 2 that are the base areas.
- the diagnosis execution unit 13 omits the read test for the area m 1 and performs only the write test. On the other hand, the diagnosis execution unit 13 performs the read test and write tests on the region m 3 is the base region.
- the diagnosis execution unit 13 targets the areas m 2 and m 3 .
- the read test is omitted and only the write test is performed.
- FIG. 6 is a diagram schematically illustrating another example of the operation of the memory diagnostic device according to the first embodiment.
- the memory 52 is divided into five areas m 1 to m 5 .
- the memory diagnostic device 10 selects three of the divided areas as the base area.
- a region surrounded by a broken line is a base region.
- the memory diagnostic device 10 performs a known memory diagnosis using the areas m 1 , m 2 and m 3 as base areas.
- the memory diagnostic device 10 performs a known memory diagnosis using the areas m 1 , m 2, and m 4 as base areas.
- the memory diagnostic device 10 performs a known memory diagnosis using the areas m 1 , m 2 and m 5 as the base area.
- the memory diagnostic device 10 performs a known memory diagnosis using the areas m 1 , m 3, and m 4 as the base area.
- the memory diagnostic device 10 performs a known memory diagnosis using the areas m 1 , m 3 and m 5 as the base area.
- the memory diagnostic device 10 performs a known memory diagnosis using the areas m 1 , m 4 and m 5 as the base area.
- the memory diagnostic apparatus 10 performs a known memory diagnosis using the areas m 2 , m 3, and m 4 as the base area.
- the memory diagnostic device 10 performs a known memory diagnosis using the areas m 2 , m 3 and m 5 as the base area.
- the memory diagnostic device 10 performs a known memory diagnosis using the areas m 2 , m 4 and m 5 as the base area.
- the cycle t + 9 the memory diagnostic device 10 performs a known memory diagnosis using the areas m 3 , m 4 and m 5 as the base area.
- the diagnosis execution unit 13 performs a read test and a write test on the areas m 1 , m 2, and m 3 that are the base areas.
- the diagnosis execution unit 13 omits the read test for the areas m 1 and m 2 and performs only the write test. I do.
- the diagnosis execution unit 13 reads a test intended for the region m 1 and m 2 are omitted, writing test only I do.
- the diagnosis execution unit 13 performs the areas m 1 , m 3, and m 4.
- the read test for the target is omitted, and only the write test is performed.
- the diagnosis execution unit 13 performs the areas m 1 , m 3 and m 5.
- the read test for the target is omitted, and only the write test is performed.
- the diagnosis execution unit 13 determines that the area m 1 The read test for 1 , m 4 and m 5 is omitted, and only the write test is performed.
- the diagnosis execution unit 13 performs the areas m 2 , m 3, and m 4.
- the read test for the target is omitted, and only the write test is performed.
- the diagnosis execution unit 13 performs the areas m 2 , m 3, and m 5.
- the read test for the target is omitted, and only the write test is performed.
- the memory diagnosis apparatus 10 performs redundant processing by omitting the read test for the base area for which the read test has been executed, in the memory diagnosis in which the area for which the read test has been executed is used as the base area. Omit. Thereby, the memory diagnostic apparatus 10 according to the first embodiment can shorten the processing time without lowering the diagnosis rate.
- the arithmetic unit 51 of the PLC 50 executes the memory diagnosis program 60 in the background of the control program 70 to execute the memory diagnosis of the memory 52 has been described as an example, but a computer is connected to the outside of the PLC 50. It is also possible to perform a memory diagnosis by causing a computer to execute a memory diagnosis program. By performing a memory diagnosis by causing a computer connected to the outside of the PLC 50 to execute a memory diagnosis program, the load on the computing device 51 of the PLC 50 can be reduced, and the control operation of the control target device 80 by the PLC 50 can be reliably performed. Is possible.
- the configuration described in the above embodiment shows an example of the contents of the present invention, and can be combined with another known technique, and can be combined with other configurations without departing from the gist of the present invention. It is also possible to omit or change the part.
- 10 memory diagnosis device 11 base region diagnosis management unit, 12 base region selection unit, 13 diagnosis execution unit, 50 PLC, 51 arithmetic device, 52 memory, 53 storage device, 60 memory diagnosis program, 70 control program, 80 control target device .
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Abstract
Description
図1は、実施の形態1にかかるメモリ診断装置の機能構成を示す図である。メモリ診断装置10は、メモリの複数に分割された領域のいずれかに対してメモリ診断が完了したことの通知を、後述する診断実行部13から受け取り、分割された領域の各々に対してメモリ診断を実行済か否かを管理し、かつ診断実行部13から問い合わせをされた領域がメモリ診断を実行済かを診断実行部13に回答するベース領域診断管理部11を備える。また、メモリ診断装置10は、複数の領域に分割されたメモリの一部であり、メモリ診断を実行する基本単位となる領域であるベース領域を選択して診断実行部13に伝えるベース領域選択部12を備える。また、メモリ診断装置10は、ベース領域選択部12から伝えられたベース領域が診断済か否かをベース領域診断管理部11に問い合わせ、ベース領域選択部12から伝えられたベース領域に読み出しテスト及び書き込みテストを実行してメモリ診断を行う診断実行部13を備える。診断実行部13は、ベース領域内のセルごとに読み出しテスト及び書き込みテストを行う。
Claims (4)
- メモリに故障が発生しているか否かを診断するメモリ診断装置であって、
前記メモリを複数の領域に分割し、該分割した複数の領域の中から診断対象とするベース領域を二つ以上選んで読み出しテスト及び書き込みテストを含むメモリ診断を実行し、同じベース領域に対する2回目以降のメモリ診断時には前記書き込みテストのみを行う診断実行部を有することを特徴とするメモリ診断装置。 - 前記診断実行部から前記ベース領域に対しての前記メモリ診断が完了したことの通知を受け取り、前記メモリの分割された複数の領域の各々に対してメモリ診断が実行されたか否かを管理し、かつ、前記診断実行部から問い合わせをされた領域がメモリ診断を実行済みか否かを前記診断実行部に回答するベース領域診断管理部と、
前記メモリ診断を実行する領域であるベース領域を選択して前記診断実行部に伝えるベース領域選択部と、
を有し、
前記診断実行部は、前記ベース領域選択部から伝えられたベース領域に対してメモリ診断が実行されたか否かを前記ベース領域診断管理部に問い合わせ、該問い合わせに対する回答に基づいて、前記ベース領域選択部から伝えられたベース領域にメモリ診断を行うことを特徴とする請求項1に記載のメモリ診断装置。 - メモリに故障が発生しているか否かを診断する処理をプログラマブルロジックコントローラに実行させるメモリ診断プログラムであって、
前記プログラマブルロジックコントローラに、
前記メモリを複数の領域に分割する処理と、
前記分割した複数の領域の中から診断対象とするベース領域を二つ以上選んで読み出しテスト及び書き込みテストを含むメモリ診断を実行し、同じベース領域に対する2回目以降のメモリ診断時には前記書き込みテストのみを行う処理とを行わせることを特徴とするメモリ診断プログラム。 - 前記プログラマブルロジックコントローラを、
前記ベース領域に対して前記メモリ診断を行う診断実行部と、
前記診断実行部から前記ベース領域に対しての前記メモリ診断が完了したことの通知を受け取り、前記メモリの分割された複数の領域の各々に対してメモリ診断が実行されたか否かを管理し、かつ、前記診断実行部から問い合わせをされた領域がメモリ診断を実行済みか否かを前記診断実行部に回答するベース領域診断管理部と、
前記メモリ診断を実行する領域であるベース領域を選択して前記診断実行部に伝えるベース領域選択部と、
として機能させ、
前記診断実行部は、前記ベース領域選択部から伝えられたベース領域に対してメモリ診断が実行されたか否かを前記ベース領域診断管理部に問い合わせ、該問い合わせに対する回答に基づいて、前記ベース領域選択部から伝えられたベース領域にメモリ診断を行うことを特徴とする請求項3に記載のメモリ診断プログラム。
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