WO2014204182A1 - 태양전지 - Google Patents
태양전지 Download PDFInfo
- Publication number
- WO2014204182A1 WO2014204182A1 PCT/KR2014/005318 KR2014005318W WO2014204182A1 WO 2014204182 A1 WO2014204182 A1 WO 2014204182A1 KR 2014005318 W KR2014005318 W KR 2014005318W WO 2014204182 A1 WO2014204182 A1 WO 2014204182A1
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- WIPO (PCT)
- Prior art keywords
- electrode layer
- holes
- support substrate
- layer
- front electrode
- Prior art date
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- 239000000758 substrate Substances 0.000 claims abstract description 85
- 238000000034 method Methods 0.000 claims description 30
- 230000000149 penetrating effect Effects 0.000 claims description 14
- 238000010521 absorption reaction Methods 0.000 abstract 3
- 230000003287 optical effect Effects 0.000 abstract 3
- 238000005530 etching Methods 0.000 description 22
- 239000010949 copper Substances 0.000 description 9
- 238000004519 manufacturing process Methods 0.000 description 9
- 229910052751 metal Inorganic materials 0.000 description 9
- 239000002184 metal Substances 0.000 description 9
- 229910052733 gallium Inorganic materials 0.000 description 8
- 229910052738 indium Inorganic materials 0.000 description 8
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 6
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 6
- 229910052802 copper Inorganic materials 0.000 description 6
- 239000000463 material Substances 0.000 description 6
- 238000000926 separation method Methods 0.000 description 6
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 5
- 238000000151 deposition Methods 0.000 description 5
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 5
- 238000010297 mechanical methods and process Methods 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 5
- 238000004544 sputter deposition Methods 0.000 description 5
- 150000001875 compounds Chemical class 0.000 description 4
- 239000002243 precursor Substances 0.000 description 4
- 239000011669 selenium Substances 0.000 description 4
- KTSFMFGEAAANTF-UHFFFAOYSA-N [Cu].[Se].[Se].[In] Chemical compound [Cu].[Se].[Se].[In] KTSFMFGEAAANTF-UHFFFAOYSA-N 0.000 description 3
- 230000001154 acute effect Effects 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 230000003247 decreasing effect Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 239000011787 zinc oxide Substances 0.000 description 3
- 238000000231 atomic layer deposition Methods 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000001704 evaporation Methods 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 230000031700 light absorption Effects 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- WUPHOULIZUERAE-UHFFFAOYSA-N 3-(oxolan-2-yl)propanoic acid Chemical compound OC(=O)CCC1CCCO1 WUPHOULIZUERAE-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 229910052980 cadmium sulfide Inorganic materials 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- YNLHHZNOLUDEKQ-UHFFFAOYSA-N copper;selanylidenegallium Chemical compound [Cu].[Se]=[Ga] YNLHHZNOLUDEKQ-UHFFFAOYSA-N 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000003912 environmental pollution Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 238000001552 radio frequency sputter deposition Methods 0.000 description 1
- 238000005546 reactive sputtering Methods 0.000 description 1
- 229910052711 selenium Inorganic materials 0.000 description 1
- 150000003346 selenoethers Chemical class 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000005361 soda-lime glass Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
- YVTHLONGBIQYBO-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O--].[Zn++].[In+3] YVTHLONGBIQYBO-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
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- H01L31/04—
-
- H01L31/022425—
-
- H01L31/0463—
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Definitions
- Embodiments relate to solar cells.
- Solar cells are classified into silicon semiconductor solar cells, compound semiconductor solar cells, stacked solar cells and the like according to the constituents, and the solar cells including the CIGS light absorbing layer of the present invention belong to the class of compound semiconductor solar cells.
- CIGS a group I-III-VI compound semiconductor
- the solar cell is manufactured by sequentially depositing a substrate, a back electrode layer, a light absorbing layer, a buffer layer, and a front electrode layer. Further, a first through hole for shorting the rear electrode layer, a second through hole for shorting the light absorbing layer and the buffer layer, a third through hole for shorting the front electrode layer and a fourth through hole for shorting the edge portion are formed.
- the fourth through hole that short-circuits the edge portion may be formed by etching with a laser or by first etching with a laser and then mechanically etching using a needle or the like as a second.
- the front electrode layer may melt due to the high energy of the laser, and short may occur due to the contact between the front electrode layer and the rear electrode layer. There is a problem.
- Embodiments provide a solar cell having a new structure including a fourth through hole having an inclined surface.
- the solar cell according to the first embodiment includes a support substrate; A rear electrode layer formed on the support substrate; A light absorbing layer formed on the back electrode layer; A buffer layer formed on the light absorbing layer; A front electrode layer formed on the buffer layer; And a fourth through hole penetrating the rear electrode layer, the light absorbing layer, the buffer layer, and the front electrode layer, wherein the fourth through groove is formed to have an inclination with respect to an upper surface of the support substrate.
- the solar cell according to the second embodiment includes a support substrate; A rear electrode layer formed on the support substrate; A light absorbing layer formed on the back electrode layer; A front electrode layer formed on the light absorbing layer; And a fourth through hole penetrating the rear electrode layer, the light absorbing layer, and the front electrode layer, wherein the fourth through groove comprises: a first surface perpendicular to an upper surface of the support substrate; And a second surface extending from the first surface and inclined with respect to an upper surface of the support substrate.
- the fourth through holes are formed to be inclined at a predetermined inclination angle with respect to the upper surface of the support substrate.
- the fourth through holes are formed in a direction perpendicular to the upper surface of the support substrate like the first through third through holes.
- the laser was irradiated at one time or the laser was irradiated firstly, and the second etching was performed by a mechanical method through a needle or the like.
- the solar cell according to the first embodiment is formed so that the inner surface of the fourth through hole has a predetermined inclination angle when forming the fourth through hole.
- the front electrode layer since the separation distance between the front electrode layer and the rear electrode layer increases, even if the front electrode layer is partially melted due to the high energy of the laser during etching by the laser, the front electrode layer may be prevented from contacting the front electrode layer. Short circuit can be prevented by contacting the back electrode layer with the back electrode layer.
- the solar cell according to the second embodiment is formed with a second surface in which fourth through grooves are inclined with a first surface perpendicular to the upper surface of the support substrate.
- the solar cell according to the second embodiment is formed so that the inner surface of the fourth through groove has a partially inclined angle when forming the fourth through groove.
- the front electrode layer since the separation distance between the front electrode layer and the rear electrode layer increases, even if the front electrode layer is partially melted due to the high energy of the laser during etching by the laser, the front electrode layer may be prevented from contacting the front electrode layer. Short circuit can be prevented by contacting the back electrode layer with the back electrode layer.
- FIG. 1 is a plan view illustrating a solar cell according to an embodiment.
- FIG. 2 is a cross-sectional view showing a cross section of the solar cell according to the first embodiment.
- 3 and 4 illustrate a fourth through hole of the solar cell according to the first embodiment.
- FIG. 5 is a cross-sectional view showing a cross section of the solar cell according to the second embodiment.
- FIG. 6 is a view illustrating a fourth through hole portion of the solar cell according to the second embodiment.
- FIG. 7 to 15 are views for explaining a method of manufacturing a solar cell according to the embodiment.
- each layer, region, pattern, or structure may be “on” or “under” the substrate, each layer, region, pad, or pattern.
- Substrate formed in includes all formed directly or through another layer. Criteria for the top / bottom or bottom / bottom of each layer will be described with reference to the drawings.
- each layer (film), region, pattern, or structure may be modified for clarity and convenience of description, and thus do not necessarily reflect the actual size.
- FIG. 1 is a plan view illustrating a solar cell according to an embodiment
- FIG. 2 is a cross-sectional view showing a cross section of the solar cell according to the first embodiment
- FIGS. 3 and 4 are views of the solar cell according to the first embodiment
- FIG. 5 is a cross-sectional view illustrating a cross section of the solar cell according to the second embodiment
- FIG. 6 illustrates a fourth through groove part of the solar cell according to the second embodiment.
- the solar cell according to the first embodiment includes a support substrate 10, a back electrode layer 20, a light absorbing layer 30, a buffer layer 40, a front electrode layer 50, and a plurality of connections. (60).
- the support substrate 10 has a plate shape and supports the rear electrode layer 20, the light absorbing layer 30, the buffer layer 40, the front electrode layer 50, and the connection part 60.
- the support substrate 10 may be an insulator.
- the support substrate 10 may be a glass substrate, a plastic substrate, or a metal substrate.
- the support substrate 10 may be a soda lime glass substrate.
- the support substrate 10 may be transparent.
- the support substrate 100 may be rigid or flexible.
- the back electrode layer 20 is disposed on the support substrate 10.
- the back electrode layer 20 is a conductive layer.
- Examples of the material used for the back electrode layer 20 may include a metal such as molybdenum.
- the back electrode layer 20 may include two or more layers.
- each of the layers may be formed of the same metal or different metals.
- First through holes TH1 are formed in the rear electrode layer 20.
- the first through holes TH1 are open regions exposing the top surface of the support substrate 10.
- the first through holes TH1 may have a shape extending in a first direction when viewed in a plan view.
- the width of the first through holes TH1 may be about 80 ⁇ m to about 200 ⁇ m, but is not limited thereto.
- the rear electrode layer 20 is divided into a plurality of rear electrodes by the first through holes TH1. That is, the back electrodes are defined by the first through holes TH1.
- the rear electrodes are spaced apart from each other by the first through holes TH1.
- the back electrodes are arranged in a stripe shape.
- the back electrodes may be arranged in a matrix form.
- the first through holes TH1 may have a lattice shape when viewed in a plan view.
- the light absorbing layer 30 is disposed on the back electrode layer 20.
- the material included in the light absorbing layer 30 is filled in the first through holes TH1.
- the light absorbing layer 30 includes a group I-III-VI compound.
- the light absorbing layer 30 may be formed of a copper-indium-gallium-selenide-based (Cu (In, Ga) Se 2 ; CIGS-based) crystal structure, copper-indium-selenide-based, or copper-gallium-selenide It may have a system crystal structure.
- the energy band gap of the light absorbing layer 30 may be about 1 eV to 1.8 eV.
- the buffer layer 40 is disposed on the light absorbing layer 30.
- the buffer layer 40 is in direct contact with the light absorbing layer 30.
- Second through holes TH2 may be formed on the buffer layer 40.
- the second through holes TH2 are open regions exposing the top surface of the back electrode layer 20.
- the second through holes TH2 may have a shape extending in one direction when viewed in a plan view.
- the width of the second through holes TH2 may be about 80 ⁇ m to about 200 ⁇ m, but is not limited thereto.
- the buffer layer 40 is defined as a plurality of buffer layers by the second through holes TH2.
- the front electrode layer 50 is disposed on the buffer layer 40.
- the front electrode layer 50 is transparent and a conductive layer.
- the resistance of the front electrode layer 50 may be higher than the resistance of the rear electrode layer 20.
- the front electrode layer 50 includes an oxide.
- examples of the material used as the front electrode layer 50 include aluminum doped ZnC (AZO), indium zinc oxide (IZO), or indium tin oxide (ITO). Etc. can be mentioned.
- the front electrode layer 50 includes connection parts 60 positioned in the second through holes TH2.
- Third through holes TH3 are formed in the buffer layer 40 and the front electrode layer 50.
- the third through holes TH3 may penetrate part or all of the buffer layer 40 and the front electrode layer 50. That is, the third through holes TH3 may expose the top surface of the back electrode layer 20.
- the third through holes TH3 are formed at positions adjacent to the second through holes TH2.
- the third through holes TH3 are disposed next to the second through holes TH2. That is, when viewed in a plan view, the third through holes TH3 are arranged side by side next to the second through holes TH2.
- the third through holes TH3 may have a shape extending in the first direction.
- the front electrode layer 50 is divided into a plurality of front electrodes by the third through holes TH3.
- the front electrodes have a shape corresponding to the rear electrodes. That is, the front electrodes are arranged in a stripe shape. Alternatively, the front electrodes may be arranged in a matrix form.
- a plurality of solar cells C1, C2... are defined by the third through holes TH3.
- the solar cells C1, C2... are defined by the second through holes TH2 and the third through holes TH3. That is, the solar cell according to the embodiment is divided into the solar cells C1, C2... By the second through holes TH2 and the third through holes TH3.
- the solar cells C1, C2... are connected to each other in a second direction crossing the first direction. That is, current may flow in the second direction through the solar cells C1, C2...
- the solar cell panel 1000 includes the support substrate 10 and the solar cells C1, C2...
- the solar cells C1, C2... are disposed on the support substrate 10 and spaced apart from each other.
- the solar cells C1, C2... Are connected to each other in series by the connecting parts 60.
- connection parts 60 are disposed inside the second through holes TH2.
- the connection parts 60 extend downward from the front electrode layer 50 and are connected to the back electrode layer 20.
- the connection parts 60 extend from the front electrode of the first cell C1 and are connected to the rear electrode of the second cell C2.
- connection parts 60 connect solar cells adjacent to each other.
- the connection parts 60 connect the front electrode and the back electrode included in the solar cells adjacent to each other.
- connection part 60 is integrally formed with the front electrode layer 60. That is, the material used as the connection part 60 is the same as the material used as the front electrode layer 50.
- the fourth through holes TH4 are formed on the front electrode layer 50.
- the fourth through holes TH4 are formed through the rear electrode layer 20, the light absorbing layer 30, and the front electrode layer 50.
- the fourth through holes TH4 expose the surface of the support substrate 10 and short-circuit the edge portion of the solar cell with the outside.
- the inner side surfaces of the fourth through holes TH4 are inclined with respect to the upper surface of the support substrate 10.
- the fourth through holes TH4 may be formed in a direction different from at least one of the first through holes TH1, the second through holes TH2, and the third through holes TH3. Can be. That is, at least one of the first through holes TH1, the second through holes TH2, and the third through holes TH3 may be formed in a direction perpendicular to the top surface of the support substrate 10. The fourth through holes TH4 may be formed in a direction different from the vertical direction.
- the fourth through holes TH4 are formed to be inclined such that the widths of the fourth through holes TH4 become wider as they extend from the support substrate 10 to the front electrode layer 50. do.
- the inclination angle ⁇ 1 of the fourth through holes TH4 and the upper surface of the support substrate 10 may be an obtuse angle.
- the inclination angle ⁇ 1 may be about 130 ° to about 170 °.
- the dead zone may be widened, thereby decreasing efficiency, and etching by laser may be difficult.
- the inclination angle ⁇ 1 is 170 ° or more, the front electrode layer 50 may be melted by a laser, and the front electrode layer 50 may contact the rear electrode layer 20 to cause a short.
- the fourth through holes TH4 are formed to be inclined so that the widths of the fourth through holes TH4 become narrower as they extend from the support substrate 10 to the front electrode layer 50. do.
- the inclination angle ⁇ 2 of the fourth through holes TH4 and the upper surface of the support substrate 10 may be an acute angle.
- the inclination angle ⁇ 2 may be about 40 ° to about 80 °.
- the dead zone may be widened, thereby decreasing efficiency, and etching by laser may be difficult.
- the inclination angle ⁇ 2 is 80 ° or more, the front electrode layer 50 may be melted by a laser, and the front electrode layer 50 may contact the rear electrode layer 20 to cause a short.
- the fourth through holes are formed to be inclined at a predetermined inclination angle with respect to the upper surface of the support substrate.
- the fourth through holes are formed in a direction perpendicular to the upper surface of the support substrate like the first through third through holes.
- the laser was irradiated at one time or the laser was irradiated firstly, and the second etching was performed by a mechanical method through a needle or the like.
- the solar cell according to the first embodiment is formed so that the inner surface of the fourth through hole has a predetermined inclination angle when forming the fourth through hole.
- the front electrode layer since the separation distance between the front electrode layer and the rear electrode layer increases, even if the front electrode layer is partially melted due to the high energy of the laser during etching by the laser, the front electrode layer may be prevented from contacting the front electrode layer. Short circuit can be prevented by contacting the back electrode layer with the back electrode layer.
- a solar cell according to a second embodiment will be described with reference to FIGS. 5 and 6.
- the description of the same parts as those of the solar cell according to the first embodiment will be omitted. That is, the description of the solar cell according to the second embodiment is essentially combined with the description of the solar cell according to the first embodiment.
- the solar cell according to the second embodiment includes a support substrate 100, a rear electrode layer 200, a light absorbing layer 300, a buffer layer 400, a front electrode layer 500, and a plurality of solar cells. And a connection part 600.
- the solar cell according to the second embodiment may include first through holes TH1 penetrating the rear electrode layer, second through holes TH1 penetrating the light absorbing layer, the light absorbing layer, and the front electrode layer. And third through holes TH1 penetrating and fourth through holes TH4 penetrating the rear electrode layer, the light absorbing layer, and the front electrode layer.
- the support substrate 100, the back electrode layer 200, the light absorbing layer 300, the buffer layer 400, the front electrode layer 500, the contact portion 600, and the first through third through holes are the same as the description of the solar cell according to the first embodiment described above, and thus description thereof will be omitted.
- the fourth through holes TH4 are formed to expose the surface of the support substrate 100 and to short-circuit the edge portion of the solar cell with the outside.
- the fourth through holes TH4 may be formed in a direction different from at least one of the first through holes TH1, the second through holes TH2, and the third through holes TH3. . That is, at least one of the first through holes TH1, the second through holes TH2, and the third through holes TH3 may be formed in a direction perpendicular to the top surface of the support substrate 10. The fourth through holes TH4 may be formed in a direction different from the vertical direction.
- the fourth through holes TH4 may be partially inclined with respect to the top surface of the support substrate 100.
- the fourth through holes TH4 extend from the first surface TH4a and the first surface TH4a perpendicular to the upper surface of the support substrate 100, and the upper surface of the support substrate 100. It includes a second surface (TH4b) which is inclined at a predetermined angle with respect to. That is, the inner surface of the fourth through holes TH4 includes a second surface TH4b that is partially inclined with respect to the support substrate 100, that is, an inclined surface.
- the width of the fourth through holes TH4 may become wider as it extends from the support substrate 100 to the front electrode layer 500.
- the width of the fourth through holes TH4 may become wider as it extends from the supporting substrate 100 to the front electrode layer 500 with the second surface TH4b as a starting point.
- the second surface TH4a of the fourth through holes TH4 is inclined when the predetermined angle with respect to the top surface of the support substrate 100 is inclined.
- the second surface TH4b is inclined at an inclination angle ⁇ 3 of about 130 ° to about 170 ° with respect to the support substrate 100.
- the inclination angle ⁇ 3 may be about 130 ° to about 170 °.
- the dead zone may be widened, thereby decreasing efficiency, and etching by laser may be difficult.
- the inclination angle ⁇ 3 is 170 ° or more, the front electrode layer 50 may be melted by a laser, and the front electrode layer 50 may contact the rear electrode layer 20 to cause a short.
- the solar cell according to the second embodiment is formed with a second surface in which fourth through grooves are inclined with a first surface perpendicular to the upper surface of the support substrate.
- the solar cell according to the second embodiment is formed so that the inner surface of the fourth through groove has a partially inclined angle when forming the fourth through groove.
- the front electrode layer since the separation distance between the front electrode layer and the rear electrode layer increases, even if the front electrode layer is partially melted due to the high energy of the laser during etching by the laser, the front electrode layer may be prevented from contacting the front electrode layer. Short circuit can be prevented by contacting the back electrode layer with the back electrode layer.
- FIGS. 7 to 15 are views for explaining a method of manufacturing a solar cell according to the embodiment.
- reference numerals of the solar cell according to the second embodiment are described for convenience of description, and the method of manufacturing the solar cell according to the first embodiment also includes The manufacturing method is also produced by the same manufacturing method as in the first embodiment.
- the back electrode layer 200 is formed on the support substrate 100.
- the rear electrode layer 200 is patterned to form first through holes TH1. Accordingly, a plurality of back electrodes, first connection electrodes, and second connection electrodes are formed on the support substrate 100.
- the back electrode layer 200 is patterned by a laser.
- the first through holes TH1 may expose the top surface of the support substrate 100 and may have a width of about 80 ⁇ m to about 200 ⁇ m, but is not limited thereto.
- an additional layer such as a diffusion barrier may be interposed between the support substrate 100 and the rear electrode layer 200, wherein the first through holes TH1 expose the top surface of the additional layer.
- a light absorbing layer 300 is formed on the back electrode layer 200.
- the light absorbing layer 300 may be formed by a sputtering process or an evaporation method.
- the light absorbing layer 300 For example, copper, indium, gallium, selenide-based (Cu (In, Ga) Se 2 ; CIGS-based) while evaporating copper, indium, gallium, and selenium simultaneously or separately to form the light absorbing layer 300.
- the method of forming the light absorbing layer 300 and the method of forming the metal precursor film by the selenization process are widely used.
- a metal precursor film is formed on the back electrode 200 by a sputtering process using a copper target, an indium target, and a gallium target.
- the metal precursor film is formed of a copper-indium-gallium-selenide (Cu (In, Ga) Se 2 ; CIGS-based) light absorbing layer 300 by a selenization process.
- Cu (In, Ga) Se 2 copper-indium-gallium-selenide
- CIGS-based copper-indium-gallium-selenide
- the sputtering process and the selenization process using the copper target, the indium target, and the gallium target may be simultaneously performed.
- the CIS-based or CIG-based light absorbing layer 300 may be formed by using only a copper target and an indium target, or by a sputtering process and a selenization process using a copper target and a gallium target.
- cadmium sulfide is deposited by a sputtering process or a chemical bath depositon (CBD), and the buffer layer 400 is formed.
- the buffer layer may be formed by chemical vapor deposition (CVD), metal organic chemical vapor deposition (MOCVD), or atomic layer deposition (ALD).
- CVD chemical vapor deposition
- MOCVD metal organic chemical vapor deposition
- ALD atomic layer deposition
- the second through holes TH2 may be formed by a mechanical device such as a tip or a laser device.
- the light absorbing layer 300 and the buffer layer 400 may be patterned by a tip having a width of about 40 ⁇ m to about 180 ⁇ m.
- the second through holes TH2 may be formed by a laser having a wavelength of about 200 nm to about 600 nm.
- the width of the second through holes TH2 may be about 100 ⁇ m to about 200 ⁇ m.
- the second through holes TH2 are formed to expose a portion of the top surface of the back electrode layer 200.
- a transparent conductive material is deposited on the buffer layer 400 to form the front electrode layer 500.
- the front electrode layer 500 may be formed by depositing the transparent conductive material in an oxygen-free atmosphere.
- the front electrode layer 500 may be formed by depositing zinc oxide doped with aluminum in an inert gas atmosphere containing no oxygen.
- the forming of the front electrode layer may be formed by depositing zinc oxide doped with aluminum by a method of depositing using a ZnO target by an RF sputtering method or a reactive sputtering method using a Zn target.
- a portion of the light absorbing layer 300, the buffer layer 400 and the front electrode layer 500 is removed to form third through holes TH3.
- the front electrode layer 500 is patterned to define a plurality of front electrodes, a first cell C1, a second cell C2, and a third cell C3.
- the width of the third through holes TH3 may be about 80 ⁇ m to about 200 ⁇ m, but is not limited thereto.
- some of the rear electrode layer 200, the light absorbing layer 300, the buffer layer 400, and the front electrode layer 500 are removed to form fourth through holes TH4. . Accordingly, the surface of the support substrate 100 is exposed, and the edge portion of the solar cell is shorted to the outside.
- the fourth through holes TH4 may be formed by irradiating a laser.
- the laser is inclined at a predetermined angle with respect to the upper surface of the support substrate 100 is irradiated. Accordingly, the inner surface of the fourth through holes TH4 is formed with a predetermined inclination angle with respect to the upper surface of the support substrate.
- the inner surfaces of the fourth through holes TH4 are formed in a narrower or wider direction as they extend from the support substrate 100 to the front electrode layer. That is, the fourth through holes TH4 are formed when the inclination angle of the acute angle or the obtuse angle with respect to the upper surface of the support substrate 100 is formed.
- the inclination angle of the fourth through holes TH4 is about 40 °. To about 80 °.
- the inclination angle of the fourth through holes TH4 is about 130 ° or more. About 170 °.
- the separation distance between the front electrode layer and the rear electrode layer increases in the solar cell manufactured by the manufacturing method, even when the front electrode layer is partially melted due to the high energy of the laser during etching by the laser, Since it is possible to prevent the contact of the front electrode layer and the rear electrode layer is in contact with the short can be prevented from occurring.
- fourth through grooves partially inclined by removing portions of the back electrode layer 200, the light absorbing layer 300, the buffer layer 400, and the front electrode layer 500, unlike FIG. 14. TH4 is formed. Accordingly, the surface of the support substrate 100 is exposed, and the edge portion of the solar cell is shorted to the outside.
- the fourth through holes TH4 may be formed by irradiating a laser and using a mechanical method such as a needle.
- the laser is irradiated in a vertical direction with respect to the upper surface of the support substrate 100.
- an inner surface of the fourth through holes TH4 is perpendicular to the upper surface of the support substrate.
- the inner surface of the fourth through holes TH4 may include the second surface TH4b partially inclined with the first surface TH4a that is partially perpendicular to the upper surface of the support substrate 100. Is formed.
- the second surface TH4b of the inner surfaces of the fourth through holes TH4 is formed in a direction that is wider as it extends from the support substrate 100 to the front electrode layer. That is, the second surface TH4b is formed when the inclination angle of the acute angle or the obtuse angle with respect to the upper surface of the support substrate 100 is formed. In detail, when the second surface TH4b is formed to be narrower as it extends from the support substrate 100 to the front electrode layer, the inclination angle of the upper surface of the support substrate 100 and the second surface TH4b is about 130. ° to about 170 °.
- the separation distance between the front electrode layer and the rear electrode layer increases in the solar cell manufactured by the manufacturing method, even when the front electrode layer is partially melted due to the high energy of the laser during etching by the laser, Since contact of the front electrode layer and the rear electrode layer can be prevented from contacting, it is possible to prevent the short from occurring.
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Abstract
Description
Claims (14)
- 지지 기판;상기 지지 기판 상에 형성되는 후면 전극층;상기 후면 전극층 상에 형성되는 광 흡수층;상기 광 흡수층 상에 형성되는 버퍼층;상기 버퍼층 상에 형성되는 전면 전극층; 및상기 후면 전극층, 상기 광 흡수층, 상기 버퍼층 및 상기 전면 전극층을 관통하는 제 4 관통홈을 포함하고,상기 제 4 관통홈은, 상기 지지 기판의 상면에 대해 경사를 가지며 형성되는 태양전지.
- 제 1항에 있어서,상기 후면 전극층을 관통하는 제 1 관통홈;상기 광 흡수층 및 상기 버퍼층을 관통하는 제 2 관통홈; 및상기 광 흡수층, 상기 버퍼층 및 상기 전면 전극층을 관통하는 제 3 관통홈을 더 포함하는 태양전지.
- 제 2항에 있어서,상기 제 4 관통홈과, 상기 제 1 관통홈 내지 상기 제 3 관통홈 중 적어도 하나의 관통홈은 서로 다른 방향으로 형성되는 태양전지.
- 제 3항에 있어서,상기 제 1 관통홈 내지 상기 제 3 관통홈 중 적어도 하나의 관통홈은 상기 지지기판의 상면에 대해 수직 방향으로 형성되는 태양전지.
- 제 2항에 있어서,상기 제 4 관통홈의 폭은 상기 지지 기판에서 상기 전면 전극층으로 연장할수록 넓어지는 태양전지.
- 제 5항에 있어서,상기 제 4 관통홈의 경사 각도는 약 130° 내지 약 170°인 태양전지.
- 제 2항에 있어서,상기 제 4 관통홈의 폭은 상기 지지 기판에서 상기 전면 전극층으로 연장할수록 좁아지는 태양전지.
- 제 7항에 있어서,상기 제 4 관통홈의 경사 각도는 약 40° 내지 약 80°인 태양전지.
- 지지 기판;상기 지지 기판 상에 형성되는 후면 전극층;상기 후면 전극층 상에 형성되는 광 흡수층;상기 광 흡수층 상에 형성되는 전면 전극층; 및상기 후면 전극층, 상기 광 흡수층 및 상기 전면 전극층을 관통하는 제 4 관통홈을 포함하고,상기 제 4 관통홈은,상기 지지 기판의 상면에 대해 수직인 제 1면; 및상기 제 1 면으로부터 연장되고, 상기 지지 기판의 상면에 대해 경사지는 제 2면을 포함하는 태양전지.
- 제 9항에 있어서,상기 후면 전극층을 관통하는 제 1 관통홈;상기 광 흡수층 및 상기 버퍼층을 관통하는 제 2 관통홈; 및상기 광 흡수층, 상기 버퍼층 및 상기 전면 전극층을 관통하는 제 3 관통홈을 더 포함하는 태양전지.
- 제 10항에 있어서,상기 제 4 관통홈과, 상기 제 1 관통홈 내지 상기 제 3 관통홈 중 적어도 하나의 관통홈은 서로 다른 방향으로 형성되는 태양전지.
- 제 11항에 있어서,상기 제 1 관통홈 내지 상기 제 3 관통홈 중 적어도 하나의 관통홈은 상기 지지기판의 상면에 대해 수직 방향으로 형성되는 태양전지.
- 제 9항에 있어서,상기 제 4 관통홈은 상기 지지 기판에서 상기 전면 전극층으로 연장할수록 넓어지는 태양전지.
- 제 9항에 있어서,상기 제 2면은 상기 지지 기판의 상면에 대해 약 130° 내지 약 170°의 경사각도로 경사지는 태양전지.
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US14/892,177 US9960291B2 (en) | 2013-06-20 | 2014-06-17 | Solar cell |
CN201480035545.4A CN105340083B (zh) | 2013-06-20 | 2014-06-17 | 太阳能电池 |
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KR1020130070737A KR102042026B1 (ko) | 2013-06-20 | 2013-06-20 | 태양전지 |
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JP7102532B2 (ja) * | 2019-03-19 | 2022-07-19 | 株式会社東芝 | 光電変換素子とその製造方法 |
EP3764405A1 (en) | 2019-07-10 | 2021-01-13 | Nederlandse Organisatie voor toegepast- natuurwetenschappelijk Onderzoek TNO | Method of manufacturing a thin film photovoltaic product |
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US20160104807A1 (en) | 2016-04-14 |
KR20140147947A (ko) | 2014-12-31 |
CN105340083B (zh) | 2018-07-24 |
KR102042026B1 (ko) | 2019-11-27 |
CN105340083A (zh) | 2016-02-17 |
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