WO2014101281A1

WO2014101281A1 - Device and method for detecting optical-axis offset of lens in apparatus

Info

Publication number: WO2014101281A1
Application number: PCT/CN2013/001559
Authority: WO
Inventors: 曲明东; 张坤; 张�雄; 唐云学
Original assignee: 青岛歌尔声学科技有限公司
Priority date: 2012-12-26
Filing date: 2013-12-12
Publication date: 2014-07-03
Also published as: CN103018015B; KR20150032557A; KR101833599B1; CN103018015A

Abstract

A device for detecting optical-axis offset of a lens in an apparatus. The device comprises: a standard image acquiring module (110), used for focusing, at a shooting position, a standard lens assembled in the apparatus, shooting a picture sample, and acquiring a standard image of the picture sample; a reference coordinate system setup module (120), used for setting up a reference coordinate system by using the center of the standard image as a coordinate origin; a test image acquiring module (130), used for focusing, at the shooting position, a to-be-detected lens assembled in the apparatus, shooting the picture sample, and acquiring a test image of the picture sample; a test cursor position determining module (140), used for determining the position of a test cursor in the reference coordinate system by using the center of the test image as the test cursor; and an optical-axis offset detecting module (150), used for determining optical-axis offset and/or an optical-axis offset angle of the to-be-detected lens according to the position. The device can detect the optical-axis offset of the lens in the apparatus during assembly. Also provided is a method for detecting optical-axis offset of a lens in an apparatus.

Description

Apparatus and method for detecting optical axis offset of a lens in a device

Technical field

The present invention relates to the field of optical inspection, and more particularly to an apparatus and method for detecting an optical axis shift of a lens in a device.

Background of the invention

In the prior art, for a device having a lens, the lens in the device may have an optical axis deviation due to a defect of the lens itself or due to an operation problem during assembly.

The prior art optical axis offset detection is static detection and must be implemented with detailed design parameters of the lens and expensive test equipment. After the lens is assembled onto the printed circuit board PCBA, the optical axis offset cannot be determined after the focusing process. However, due to assembly tolerances, optical sensor patch tolerances, lens positioning, etc., the lens in the device will produce an optical axis offset. If the optical axis offset exceeds the allowable tolerance range, the lens shooting brightness will be uneven, and the functional problems such as vignetting will occur around.

Summary of the invention

The present invention provides an apparatus and method for detecting an optical axis shift of a lens in a device to solve the problem that the optical axis shift of the lens in the apparatus cannot be detected during assembly.

The invention discloses a device for detecting an optical axis offset of a lens in a device, the device comprising:

a standard image acquisition module for focusing a standard lens assembled into the device at a shooting position, taking a picture sample, and obtaining a standard image of the picture sample;

a reference coordinate system establishing module, configured to take a center of the standard image as a coordinate origin, and establish a reference coordinate system;

a test image acquisition module, configured to: after focusing the lens to be tested assembled into the device at the shooting position, taking the picture sample to obtain a test image of the picture sample;

a test cursor position determining module, configured to take a center of the test image as a test cursor, and determine a position of the test cursor in the reference coordinate system;

The optical axis offset detecting module is configured to determine an optical axis offset and/or an optical axis offset angle of the lens to be tested according to the position.

Wherein, the device further comprises:

a qualified determination module, configured to compare the determined optical axis offset of the lens to be tested with a preset offset threshold, and if the offset threshold is not exceeded, the device assembled with the lens to be tested is qualified; otherwise , the equipment assembled with the lens to be tested is unqualified; or,

Comparing the determined optical axis offset angle of the lens to be tested with a preset offset angle threshold. If the offset angle threshold is not exceeded, the device in which the lens to be tested is assembled is qualified; otherwise, the lens to be tested is assembled The equipment is not qualified.

Wherein the reference coordinate system is in units of pixels;

The optical axis offset detecting module is configured to obtain a distance between the test cursor and the origin in the reference coordinate system according to the coordinates of the position; multiplying the distance by the pixel size to obtain an optical axis offset of the lens to be tested .

The optical axis offset detecting module is configured to obtain an optical axis offset of the lens to be tested according to the coordinates of the position, and determine a lens to be tested according to the optical axis offset and the distance between the shooting position and the image sample. The optical axis is offset by the angle.

The reference coordinate system establishing module is configured to establish an absolute coordinate system by taking the center of the picture sample as a coordinate origin, determine a coordinate of a center of the standard image in an absolute coordinate system, and use a center of the standard image as a coordinate origin to establish a reference coordinate. system;

The test cursor position determining module is configured to determine a coordinate of the test cursor in an absolute coordinate system, and convert the coordinate of the test cursor in the absolute coordinate system to the coordinate in the reference coordinate system according to the coordinate of the center of the standard image in the absolute coordinate system.

The invention also discloses a method for detecting an optical axis offset of a lens in a device, the method comprising:

After focusing the standard lens assembled into the device at the shooting position, take a picture sample and obtain a standard image of the picture sample;

Taking the center of the standard image as the coordinate origin, and establishing a reference coordinate system;

After focusing the lens to be tested assembled in the device at the shooting position, taking the picture sample to obtain a test image of the picture sample;

Take the center of the test image as the test cursor and determine the position of the test cursor in the reference coordinate system;

An optical axis offset and/or an optical axis offset angle of the lens to be tested is determined according to the position.

The method further includes:

Comparing the determined optical axis offset of the lens to be tested with a preset offset threshold, if the offset threshold is not exceeded, the device in which the lens to be tested is assembled is qualified; otherwise, the lens to be tested is assembled Equipment is not qualified; or,

Wherein the reference coordinate system is in units of pixels;

The determining the optical axis offset of the lens to be tested according to the location specifically includes:

Deriving a distance between the test cursor and the origin in the reference coordinate system according to the coordinates of the position;

Multiplying the distance by the pixel size gives the optical axis offset of the lens to be tested.

The determining, by the position, the optical axis offset angle of the lens to be tested, according to the position, the optical axis offset of the lens to be tested is obtained according to the optical axis offset and the shooting position. The distance between the image samples determines the optical axis offset angle of the lens to be tested.

Wherein, the center of the standard image is the coordinate origin, and the establishing the reference coordinate system specifically includes:

Establish the absolute coordinate system by taking the center of the image sample as the coordinate origin.

Determining the coordinates of the center of the standard image in the absolute coordinate system, and establishing the reference coordinate system by taking the center of the standard image as the coordinate origin;

The determining the location of the test cursor in the reference coordinate system specifically includes:

Determine the coordinates of the test cursor in the absolute coordinate system, and convert the coordinates of the test cursor in the absolute coordinate system to the coordinates in the reference coordinate system according to the coordinates of the center of the standard image in the absolute coordinate system.

The beneficial effects of the present invention are: obtaining a standard image of the picture sample by taking a picture sample after focusing the standard lens assembled into the device at the shooting position; taking the center of the standard image as the coordinate origin, establishing a reference coordinate system; After the shooting position is assembled to the lens to be tested assembled in the device, the picture sample is taken to obtain a test image of the picture sample; the center of the test image is taken as a test cursor, and the position of the test cursor in the reference coordinate system is determined; according to the position The optical axis offset and/or the optical axis offset angle of the lens to be tested are determined. By adopting the invention, only the sample to be tested assembled into the device needs to take a picture sample, and the test image center is compared with the standard image center, so that the optical axis offset of the lens in the detecting device during the assembly process can be detected. Moreover, it is not necessary to know the detailed design parameters of the lens, and the detection can be realized by the common detecting device, and the detection is simpler and easier.

BRIEF DESCRIPTION OF THE DRAWINGS

1 is a structural diagram of an apparatus for detecting an optical axis shift of a lens in a device according to an embodiment of the present invention;

2 is a distribution diagram of quality parameter values of a sample lens according to an embodiment of the present invention;

3 is a schematic diagram of a sample of a picture in an embodiment of the present invention;

4 is a structural diagram of an apparatus for detecting an optical axis shift of a lens in a device according to an embodiment of the present invention;

FIG. 5 is a flowchart of a method for detecting an optical axis offset of a lens in a device according to an embodiment of the present invention; FIG.

6 is a schematic diagram of an optical axis offset angle of a lens in a computing device according to an embodiment of the invention.

Mode for carrying out the invention

The embodiments of the present invention will be further described in detail below with reference to the accompanying drawings.

1 is a structural diagram of an apparatus for detecting an optical axis shift of a lens in a device according to an embodiment of the present invention. The apparatus includes a standard image acquisition module 110, a reference coordinate system creation module 120, a test image acquisition module 130, a test cursor position determination module 140, and an optical axis offset detection module 150.

The standard image acquisition module 110 is configured to: after focusing the standard lens assembled into the device at the shooting position, take a picture sample, obtain a standard image of the picture sample, and store it.

Among them, the standard lens is a lens whose determined optical axis shift is within a limited range. The standard lens is preferably the same model or the same series as the lens to be tested. The standard lens can be a sample provided by the manufacturer or a lens selected from a plurality of lenses. For example, measuring multiple sample lenses, obtaining quality parameter values for each sample lens, and selecting a standard lens from the sample lens according to the probability distribution of the quality parameter values of the sample lens. 2 is a distribution diagram of quality parameter values of a sample lens according to an embodiment of the present invention. Select the area where the quality parameter value distribution is concentrated, as shown in the circle circled in Figure 2, determine the center of the circular area, and select the sample lens closest to the center as the standard lens. The selection of the standard lens can be in various ways, as long as the optical axis of the standard lens is within a limited range, and there is no particular limitation thereto.

The picture sample may be any picture, for example, may be an MTF (Modulation Transfer Function) picture. Referring to FIG. 3, a schematic diagram of a picture sample in an embodiment of the present invention.

In one embodiment of the present invention, in order to position the photographing position, the tooling is used as an aid, that is, the tooling is used as an auxiliary device of the detecting device in the present invention. For example, the tooling of the equipment placed in the detecting device is adjusted such that the tooling is substantially vertically aligned with the center of the MTF map. The tooling position is the shooting position, and a PCBA (printed circuit board) assembled with a standard lens, that is, a device equipped with a standard lens, is placed on the tooling. Adjust the focal length of the standard lens, take a picture sample, and get a standard image of the picture sample. For example, in the MTF diagram shown in Figure 3, After the focal length adjustment in the five shaded areas is completed, the standard lens is considered to be in focus, and at this time, "pass" is displayed in the detecting device, indicating that the focus adjustment is completed. After the standard lens is focused, the MTF image is taken to obtain a standard image.

Here, for the detection device used for the first time, it is necessary to calibrate the detection device. In the root directory of the test device, find the CameraTest.ini file and change the CalibrationDebug value to 1 to calibrate. The PCBA assembled with the standard lens is placed in the shooting position, and the standard lens is used to calibrate the detecting device. After the calibration, the tooling position is fixed so that the shooting positions are the same for each shooting.

The reference coordinate system establishing module 120 is configured to take a center of the standard image as a coordinate origin and establish a reference coordinate system.

Further, the reference coordinate system establishing module 120 establishes an absolute coordinate system by taking the center of the picture sample as a coordinate origin, determining the coordinates of the center of the standard image in the absolute coordinate system, and establishing the reference coordinate system by using the center of the standard image as the coordinate origin.

For example, both the reference coordinate system and the absolute coordinate system are in pixels. For example, if the number of pixels is 640×480, the center of the picture sample is the point at (320, 240), and the point is the origin of the absolute coordinate system. The reference coordinate system is established by taking the center of the standard image as the coordinate origin. If the placement of the tooling is completely aligned with the center of the MTF map, the origin of the absolute coordinate system coincides with the origin of the reference coordinate system. Otherwise, there is a deviation between the two. In the present embodiment, both the reference coordinate system and the absolute coordinate system are in units of pixels, which can be conveniently calculated. Of course, in other embodiments of the present invention, the reference coordinate system and the absolute coordinate system may not be in units of pixels.

The test image acquisition module 130 is configured to: after focusing the lens to be tested assembled into the device at the shooting position, take the picture sample, obtain a test image of the picture sample, and store the image.

For example, the PCBA assembled with the lens to be tested is placed on the tooling. Focusing on the measuring lens, after the focal length adjustment is completed in the five shaded areas in the MTF diagram shown in FIG. 3, "pass" is displayed in the detecting device, indicating that the focal length adjustment is completed. After the lens to be tested is focused, the MTF map is taken to obtain a test image.

The test cursor position determining module 140 is configured to take the center of the test image as a test cursor and determine the position of the test cursor in the reference coordinate system.

Further, the test cursor position determining module 140 determines the coordinates of the test cursor in the absolute coordinate system, and converts the test cursor in the absolute coordinate system to the coordinates in the reference coordinate system according to the coordinates of the center of the standard image in the absolute coordinate system.

As shown in FIG. 3, the test cursor position determining module 140 obtains the coordinates of the test cursor in the reference coordinate system according to the coordinates of the center O of the standard image in the absolute coordinate system and the coordinates of the test cursor A in the absolute coordinate system. For example, if the center O of the standard image has a coordinate of (2, 2) in the absolute coordinate system and the coordinate of the test cursor A in the absolute coordinate system is (5, 6), the coordinate of the test cursor A in the reference coordinate system is (3, 4).

The optical axis offset detecting module 150 is configured to determine an optical axis offset or an optical axis offset angle of the lens to be tested according to the position.

The reference coordinate system is in pixels. The optical axis offset detection module 150 obtains the distance between the test cursor and the origin in the reference coordinate system according to the coordinates of the test cursor in the reference coordinate system; multiplies the distance by the pixel size to obtain the optical axis offset of the lens to be tested. .

For example, if the amount of pixels is 640 × 480, the number of units of the X-axis and the Y-axis in the reference coordinates is 640 × 480. The size of one pixel is 6 μm×6 μm, and the distance between the test cursor A and the origin O in the reference coordinate system |AO| is multiplied by 6 μm, that is, |AO|×6 μm, and the optical axis offset of the lens to be tested is obtained. For example, if the coordinate of the test cursor A in the reference coordinate system in FIG. 3 is (3, 4), the distance between the test cursor A and the origin O in the reference coordinate system |AO| is 5, and the optical axis offset of the lens to be tested is It is 5 × 6 μm = 30 μm.

The optical axis offset detecting module 150 obtains the optical axis offset of the lens to be tested according to the coordinates of the test cursor in the reference coordinate system, and determines the light of the lens to be tested according to the optical axis offset and the distance between the shooting position and the image sample. Axis offset angle. For example, referring to Fig. 6, a schematic diagram of the optical axis offset angle of the lens in the computing device. When the coordinates of the test cursor A in the reference coordinate system are (-3, -4), the distance between the test cursor A and the origin O in the reference coordinate system |AO| is 5, and the size of one pixel is 6 μm × 6 μm, the test is to be tested. The optical axis shift amount of the lens is 5 × 6 μm = 30 μm. The distance between the shooting position and the image sample is |OB|, for example, |OB|=727mm, then the offset angle = arctan(|AO|/|BO|)= Arctan (30/727000).

In another embodiment of the invention, the apparatus further includes an eligibility determination module 160. 4 is a structural diagram of an apparatus for detecting an optical axis shift of a lens in a device according to an embodiment of the present invention.

The qualified determination module 160 is configured to compare the determined optical axis offset of the lens to be tested with a preset offset threshold. If the offset threshold is not exceeded, the device assembled with the lens to be tested is qualified. Otherwise, the equipment assembled with the lens to be tested is unqualified. The offset threshold may be set according to an eligibility criterion or may be set according to a probability distribution of the detected plurality of optical axis offsets.

The qualified determination module 160 is configured to compare the determined optical axis offset angle of the lens to be tested with a preset offset angle threshold. If the offset angle threshold is not exceeded, the device assembled with the lens to be tested is qualified. Otherwise, the equipment assembled with the lens to be tested is unqualified.

The offset angle threshold may be set according to an eligibility criterion or may be set according to a probability distribution of a plurality of detected optical axis deviation angles.

Referring to Figure 5, a flow chart of a method of detecting an optical axis offset of a lens in a device is disclosed. The method includes the following steps.

Step S510, after focusing the standard lens assembled in the device at the shooting position, taking a picture sample, obtaining a standard image of the picture sample and storing it.

Among them, the standard lens is a lens whose determined optical axis shift is within a limited range. The standard lens can be a sample provided by the manufacturer or a lens selected from a plurality of lenses. For example, measuring multiple sample lenses, obtaining quality parameter values for each sample lens, and selecting a standard lens from the sample lens according to the probability distribution of the quality parameter values of the sample lens. 2 is a distribution diagram of quality parameter values of a sample lens according to an embodiment of the present invention. Select the area where the quality parameter value distribution is concentrated, as shown in the circle circled in Figure 2, determine the center of the circular area, and select the sample lens closest to the center as the standard lens. The selection of the standard lens can be in various ways, as long as the optical axis of the standard lens is within a limited range, and there is no particular limitation thereto.

For example, adjust the tooling of the equipment so that the tooling is substantially vertically aligned with the center of the MTF map. The tooling position is the shooting position, and a PCBA (printed circuit board) assembled with a standard lens, that is, a device equipped with a standard lens, is placed on the tooling. Adjust the focal length of the standard lens, take a picture sample, and get a standard image of the picture sample. For example, in the MTF diagram shown in Figure 3, After the focal length adjustment in the five shaded areas is completed, the standard lens is considered to be in focus, and "pass" is displayed, indicating that the focus adjustment is completed. After the standard lens is focused, the MTF image is taken to obtain a standard image.

Here, calibration is required for the initial inspection. In the root directory of the test device, find the CameraTest.ini file and change the CalibrationDebug value to 1 to calibrate. The PCBA assembled with the standard lens is placed in the shooting position, and the standard lens is used to calibrate the detecting device. After the calibration, the tooling position is fixed so that the shooting positions are the same for each shooting.

Step S520, taking the center of the standard image as the coordinate origin, and establishing a reference coordinate system.

further, In step S520, the center of the picture sample is taken as the coordinate origin, an absolute coordinate system is established, the center of the standard image is determined in the absolute coordinate system, and the center of the standard image is taken as the coordinate origin, and the reference coordinate system is established.

For example, both the reference coordinate system and the absolute coordinate system are in pixels. For example, if the number of pixels is 640×480, the center of the picture sample is the point at (320, 240), and the point is the origin of the absolute coordinate system. The reference coordinate system is established by taking the center of the standard image as the coordinate origin. If the placement of the tooling is completely aligned with the center of the MTF map, the origin of the absolute coordinate system coincides with the origin of the reference coordinate system. Otherwise, there is a deviation between the two.

Step S530, after focusing the lens to be tested assembled in the device at the shooting position, taking the picture sample, obtaining a test image of the picture sample and storing.

In step S540, the center of the test image is taken as a test cursor, and the position of the test cursor in the reference coordinate system is determined.

Further, the coordinates of the test cursor in the absolute coordinate system are determined, and the coordinates of the test cursor in the absolute coordinate system are converted into coordinates in the reference coordinate system according to the coordinates of the center of the standard image in the absolute coordinate system.

As shown in FIG. 3, in step S540, the coordinates of the test cursor in the reference coordinate system are obtained according to the coordinates of the center O of the standard image in the absolute coordinate system and the coordinates of the test cursor A in the absolute coordinate system. For example, if the center O of the standard image has a coordinate of (2, 2) in the absolute coordinate system and the coordinate of the test cursor A in the absolute coordinate system is (5, 6), the coordinate of the test cursor A in the reference coordinate system is (3, 4).

Step S550, determining an optical axis offset and an optical axis offset angle of the lens to be tested according to the position of the test cursor in the reference coordinate system.

The reference coordinate system is in pixels. In step S550, the distance between the test cursor and the origin in the reference coordinate system is obtained according to the coordinates of the test cursor in the reference coordinate system; and the distance is multiplied by the pixel size to obtain the optical axis offset of the lens to be tested.

In step S550, the optical axis offset of the lens to be tested is obtained according to the coordinates of the test cursor in the reference coordinate system, and the optical axis deviation of the lens to be tested is determined according to the optical axis offset and the distance between the shooting position and the image sample. Move the angle.

For example, referring to Fig. 6, a schematic diagram of the optical axis offset angle of the lens in the computing device. When the coordinates of the test cursor A in the reference coordinate system are (-3, -4), the distance between the test cursor A and the origin O in the reference coordinate system |AO| is 5, and the size of one pixel is 6 μm × 6 μm, the test is to be tested. The optical axis shift amount of the lens is 5 × 6 μm = 30 μm. The distance between the shooting position and the image sample is |OB|, for example, |OB|=727mm, then the offset angle = arctan(|AO|/|BO|)= Arctan (30/727000).

In another embodiment of the invention, the method further comprises the following steps.

Comparing the determined optical axis offset of the lens to be tested with a preset offset threshold, if the offset threshold is not exceeded, the device in which the lens to be tested is assembled is qualified; otherwise, the lens to be tested is assembled The equipment is not qualified.

The offset threshold may be set according to an eligibility criterion or may be set according to a probability distribution of the detected plurality of optical axis offsets.

The above is only the preferred embodiment of the present invention and is not intended to limit the scope of the present invention. Any modifications, equivalents, improvements, etc. made within the spirit and scope of the invention are intended to be included within the scope of the invention.

Claims

A device for detecting an optical axis shift of a lens in a device, the device comprising:

a standard image acquisition module for focusing a standard lens assembled into the device at a shooting position, taking a picture sample, and obtaining a standard image of the picture sample;

a reference coordinate system establishing module, configured to take a center of the standard image as a coordinate origin, and establish a reference coordinate system;

a test image acquisition module, configured to: after focusing the lens to be tested assembled into the device at the shooting position, taking the picture sample to obtain a test image of the picture sample;

a test cursor position determining module, configured to take a center of the test image as a test cursor, and determine a position of the test cursor in the reference coordinate system;

The optical axis offset detecting module is configured to determine an optical axis offset and/or an optical axis offset angle of the lens to be tested according to the position.
The device of claim 1 wherein:

The device also includes:

a qualified determination module, configured to compare the determined optical axis offset of the lens to be tested with a preset offset threshold, and if the offset threshold is not exceeded, the device assembled with the lens to be tested is qualified; otherwise , the equipment assembled with the lens to be tested is unqualified; or,

Comparing the determined optical axis offset angle of the lens to be tested with a preset offset angle threshold. If the offset angle threshold is not exceeded, the device in which the lens to be tested is assembled is qualified; otherwise, the lens to be tested is assembled The equipment is not qualified.
Device according to claim 1 or 2, characterized in that

The reference coordinate system is in units of pixels;

The optical axis offset detecting module is configured to obtain a distance between the test cursor and the origin in the reference coordinate system according to the coordinates of the position; multiplying the distance by the pixel size to obtain an optical axis offset of the lens to be tested .
Device according to claim 1 or 2, characterized in that

The optical axis offset detecting module is configured to obtain an optical axis offset of the lens to be tested according to the coordinates of the position, and determine, according to the optical axis offset and the distance between the shooting position and the image sample The optical axis offset angle of the lens is measured.
Device according to claim 1 or 2, characterized in that

The reference coordinate system establishing module is configured to establish an absolute coordinate system by using a center of the picture sample as a coordinate origin, determine a coordinate of a center of the standard image in an absolute coordinate system, and establish a reference coordinate system by using a center of the standard image as a coordinate origin;

The test cursor position determining module is configured to determine a coordinate of the test cursor in an absolute coordinate system, and convert the coordinate of the test cursor in the absolute coordinate system to the coordinate in the reference coordinate system according to the coordinate of the center of the standard image in the absolute coordinate system.
A method for detecting an optical axis offset of a lens in a device, the method comprising:

After focusing the standard lens assembled into the device at the shooting position, take a picture sample and obtain a standard image of the picture sample;

Taking the center of the standard image as the coordinate origin, and establishing a reference coordinate system;

After focusing the lens to be tested assembled in the device at the shooting position, taking the picture sample to obtain a test image of the picture sample;

Take the center of the test image as the test cursor and determine the position of the test cursor in the reference coordinate system;

An optical axis offset and/or an optical axis offset angle of the lens to be tested is determined according to the position.
The method of claim 6 wherein:

The method further includes:

Comparing the determined optical axis offset of the lens to be tested with a preset offset threshold, if the offset threshold is not exceeded, the device in which the lens to be tested is assembled is qualified; otherwise, the lens to be tested is assembled Equipment is not qualified; or,

Comparing the determined optical axis offset angle of the lens to be tested with a preset offset angle threshold. If the offset angle threshold is not exceeded, the device in which the lens to be tested is assembled is qualified; otherwise, the lens to be tested is assembled The equipment is not qualified.
Method according to claim 6 or 7, characterized in that

The reference coordinate system is in units of pixels;

The determining the optical axis offset of the lens to be tested according to the location specifically includes:

Deriving a distance between the test cursor and the origin in the reference coordinate system according to the coordinates of the position;

Multiplying the distance by the pixel size gives the optical axis offset of the lens to be tested.
Method according to claim 6 or 7, characterized in that

The determining the optical axis offset angle of the lens to be tested according to the position specifically includes:

And determining an optical axis offset of the lens to be tested according to the coordinate of the position, and determining an optical axis offset angle of the lens to be tested according to the optical axis offset and the distance between the shooting position and the image sample.
Method according to claim 6 or 7, characterized in that

The center of the standard image is the coordinate origin, and the reference coordinate system is specifically configured to include:

Establish the absolute coordinate system by taking the center of the image sample as the coordinate origin.

Determining the coordinates of the center of the standard image in the absolute coordinate system, and establishing the reference coordinate system by taking the center of the standard image as the coordinate origin;

The determining the location of the test cursor in the reference coordinate system specifically includes:

Determine the coordinates of the test cursor in the absolute coordinate system, and convert the coordinates of the test cursor in the absolute coordinate system to the coordinates in the reference coordinate system according to the coordinates of the center of the standard image in the absolute coordinate system.