WO2011114926A1 - Template processing method, computer storage medium and template processing apparatus - Google Patents
Template processing method, computer storage medium and template processing apparatus Download PDFInfo
- Publication number
- WO2011114926A1 WO2011114926A1 PCT/JP2011/055230 JP2011055230W WO2011114926A1 WO 2011114926 A1 WO2011114926 A1 WO 2011114926A1 JP 2011055230 W JP2011055230 W JP 2011055230W WO 2011114926 A1 WO2011114926 A1 WO 2011114926A1
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- WIPO (PCT)
- Prior art keywords
- release agent
- template
- convex portion
- unit
- template processing
- Prior art date
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C33/00—Moulds or cores; Details thereof or accessories therefor
- B29C33/56—Coatings, e.g. enameled or galvanised; Releasing, lubricating or separating agents
- B29C33/58—Applying the releasing agents
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C37/00—Component parts, details, accessories or auxiliary operations, not covered by group B29C33/00 or B29C35/00
- B29C37/0067—Using separating agents during or after moulding; Applying separating agents on preforms or articles, e.g. to prevent sticking to each other
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C59/00—Surface shaping of articles, e.g. embossing; Apparatus therefor
- B29C59/02—Surface shaping of articles, e.g. embossing; Apparatus therefor by mechanical means, e.g. pressing
- B29C59/022—Surface shaping of articles, e.g. embossing; Apparatus therefor by mechanical means, e.g. pressing characterised by the disposition or the configuration, e.g. dimensions, of the embossments or the shaping tools therefor
Definitions
- the present invention relates to a template processing method, a computer storage medium, and a template processing apparatus for forming a release agent on a template having a concavo-convex transfer pattern formed on the surface.
- a semiconductor wafer (hereinafter referred to as “wafer”) is subjected to a photolithography process to form a predetermined resist pattern on the wafer.
- the resist pattern When forming the above-described resist pattern, the resist pattern is required to be miniaturized in order to further increase the integration of the semiconductor device.
- the limit of miniaturization in the photolithography process is about the wavelength of light used for the exposure process. For this reason, it has been advancing to shorten the wavelength of exposure light.
- the wavelength of the exposure light source there are technical and cost limitations to shortening the wavelength of the exposure light source, and it is difficult to form a fine resist pattern on the order of several nanometers, for example, only by the method of advancing the light wavelength. is there.
- a mold release agent having a liquid repellency to the resist is usually formed on the entire surface of the template used in the above-described imprinting method so that the template can be easily peeled off from the resist.
- the pattern on the template is very fine, and the mold release agent has liquid repellency to the resist.
- the liquid is difficult to enter.
- the resist solution stays on the droplets inside the recess, and bubbles are generated in the recess. That is, the resist solution is not filled in the recesses of the transfer pattern without any gaps. Then, since the shape of the droplet is transferred as it is to the resist pattern on the wafer, there is a case where a predetermined resist pattern cannot be formed on the wafer.
- the present invention has been made in view of such a point, and an object thereof is to appropriately form a release agent on the surface of a template so that a predetermined pattern is formed on the substrate using the template. To do.
- the present invention is used to transfer a transfer pattern to a coating film formed on a substrate to form a predetermined pattern on the coating film, and a transfer pattern having an uneven shape on the surface.
- the release agent is formed only on the upper surface of the convex portion of the transfer pattern.
- the release agent is formed only on the upper surface of the convex portion of the transfer pattern, the upper surface of the convex portion is less than the inner surface of the concave portion of the transfer pattern with respect to the coating liquid applied on the template thereafter.
- the contact angle increases.
- the coating liquid applied on the template tends to flow into the recesses of the transfer pattern. That is, the coating liquid is filled in the recesses of the transfer pattern without any gaps. Therefore, a predetermined pattern can be formed on the coating film on the substrate using such a template.
- Another aspect of the present invention is a readable computer storage medium storing a program that operates on a computer of a control unit that controls the template processing apparatus in order to cause the template processing apparatus to execute the template processing method.
- the transfer pattern is transferred to a coating film formed on a substrate to form a predetermined pattern on the coating film, and a concavo-convex transfer pattern is formed on the surface.
- a template processing apparatus for depositing a release agent on a template further includes a deposition unit for depositing the release agent only on the upper surface of the convex portion of the transfer pattern.
- a release agent can be appropriately formed on the surface of the template, and a predetermined pattern can be formed on the substrate using the template.
- FIG. 1 is a plan view schematically showing the configuration of the template processing apparatus 1 according to the present embodiment.
- 2 and 3 are side views showing an outline of the configuration of the template processing apparatus 1.
- a template T having a rectangular parallelepiped shape and having a concavo-convex transfer pattern C formed on the surface is used as shown in FIG.
- Transfer pattern C is constituted by a convex portion C 1 and the recess C 2.
- the transfer pattern C means the side of the template T which is formed with the surface T 1, the surface T 1 opposite to the surface of the backside T 2.
- a transparent material that can transmit visible light, near ultraviolet light, ultraviolet light, or the like, such as glass is used.
- the convex height of the C 1 of the transfer pattern C is, for example, 40 nm ⁇ 100 nm.
- the template processing apparatus 1 carries a plurality of, for example, five templates T in the cassette unit between the outside and the template processing apparatus 1 and carries the template T into and out of the cassette C.
- the carry-in / out station 2 and the processing station 3 including a plurality of processing units for performing predetermined processing on the template T are integrally connected.
- the cassette loading table 10 is provided at the loading / unloading station 2.
- the cassette mounting table 10 can mount a plurality of cassettes C in a row in the X direction (vertical direction in FIG. 1). That is, the carry-in / out station 2 is configured to be capable of holding a plurality of templates T.
- the carry-in / out station 2 is provided with a template carrier 12 that can move on a conveyance path 11 extending in the X direction.
- the template transport body 12 is also movable in the vertical direction and around the vertical direction ( ⁇ direction), and can transport the template T between the cassette C and the processing station 3.
- the processing station 3 is provided with a transport unit 20 at the center thereof.
- a transport unit 20 for example, four processing blocks G1 to G4 in which various processing units are arranged in multiple stages are arranged.
- a first processing block G1 and a second processing block G2 are arranged in this order from the loading / unloading station 2 side on the front side of the processing station 3 (X direction negative direction side in FIG. 1).
- a third processing block G3 and a fourth processing block G4 are arranged in this order from the loading / unloading station 2 side on the back side of the processing station 3 (positive side in the X direction in FIG. 1).
- a transition unit 21 for delivering the template T is arranged on the loading / unloading station 2 side of the processing station 3.
- the transport unit 20 can transport the template T to various processing units (to be described later) disposed in these processing blocks G1 to G4 and the transition unit 21.
- the first processing block G1 is formed by a plurality of liquid processing units, for example only on the upper surface of the convex portion C 1 of the transfer pattern C in the template T of the liquid release agent is applied as shown in FIG. 2
- a film forming unit 30 and a rinse unit 31 for rinsing the release agent on the template T are stacked in two stages in order from the bottom.
- the film forming unit 32 and the rinsing unit 33 are stacked in two stages from the bottom.
- chemical chambers 34 and 35 for supplying various processing liquids to the liquid processing unit are provided at the lowermost stages of the first processing block G1 and the second processing block G2, respectively.
- the cleaning unit 50, the temperature control units 51 and 52, and the heating units 53 and 54 are stacked in five stages in order from the bottom.
- the film forming unit 30 has a casing 100 in which a loading / unloading port (not shown) for the template T is formed on the side surface.
- a mounting table 101 on which the template T is mounted is provided on the bottom surface in the casing 100.
- Template T has a surface T 1 is placed on the top surface of the mounting table 101 to face upward.
- raising / lowering pins 102 for supporting the template T from below and raising / lowering it are provided in the mounting table 101.
- the elevating pin 102 can be moved up and down by the elevating drive unit 103.
- a through hole 104 penetrating the upper surface in the thickness direction is formed on the upper surface of the mounting table 101, and the elevating pin 102 is inserted through the through hole 104.
- a rail 110 extending along the Y direction is provided on the mounting table 101 on the negative side in the X direction (downward in FIG. 6).
- the rail 110 is formed from the outside of the mounting table 101 on the Y direction negative direction (left direction in FIG. 6) side to the outside on the Y direction positive direction (right direction in FIG. 6) side.
- An arm 111 is attached to the rail 110.
- a release agent supply unit 112 that supplies a release agent onto the template T is supported on the arm 111.
- the release agent supply unit 112 is, for example, equal to or longer than one side dimension of the template T and extends along the X direction. Note that a material having a liquid repellency with respect to a resist film on the wafer, which will be described later, such as a fluororesin, is used as the material of the release agent.
- the arm 111 is movable on the rail 110 by the drive unit 113.
- the release agent supply unit 112 can move from the standby unit 114 installed outside the mounting table 101 on the positive side in the Y direction to above the template T on the mounting table 101, and further the surface of the template T T 1 on the movable in the side direction of the template T.
- the arm 111 can be raised and lowered by the drive unit 113, and the height of the release agent supply unit 112 can be adjusted.
- the rail 110, the arm 111, and the drive unit 113 constitute a moving mechanism.
- the release agent supply unit 112 has a support member 120 supported by the arm 111 as shown in FIG.
- the support member 120 is in contact with the upper surface of the convex portion C 1, a first roller 121 for applying a liquid release agent S on the upper surface of the convex portion C 1, the first roller 121 and coaxially And a second roller 122 that contacts the first roller 121 is supported.
- the first roller 121 and the second roller 122 are each equal to or longer than one side dimension of the template T and extend along the X direction. Then, as the support member 120 moves in the horizontal direction, the first roller 121 and the second roller 122 rotate in opposite directions.
- a release agent nozzle 123 that supplies the release agent S to the second roller 122 is provided above the second roller 122.
- the release agent nozzle 123 is supported by the support member 120. Further, the release agent nozzle 123 is equal to or longer than one side dimension of the template T and extends along the X direction. Similarly, the release agent S supply port of the release agent nozzle 123 extends in the X direction.
- the release agent S supplied from the release agent nozzle 123 to the second roller 122 is supplied from the second roller 122 to the first roller 121. At this time, since the first roller 121 and the second roller 122 are in contact with each other, the release agent S is stretched thinly.
- the convex portion C 1 upper surface of the transfer pattern C from the first roller 121, the release agent S is coated by a predetermined thickness, for example, 5 nm.
- the drying nozzle 124 is provided for drying the release agent S ing.
- the drying nozzle 124 is supported by the support member 120. Further, the drying nozzle 124 is equal to or longer than one side dimension of the template T, and extends along the X direction. Similarly, the gas supply port of the drying nozzle 124 extends along the X direction.
- the gas supplied from the drying nozzle 124 is air at room temperature, for example, 23 ° C., for example.
- the configuration of the film forming unit 32 is the same as the configuration of the film forming unit 30 described above, and a description thereof will be omitted.
- the rinse unit 31 has a casing 130 in which a loading / unloading port (not shown) for the template T is formed on the side surface.
- a rotation holding member 131 that holds and rotates the template T is provided at the center of the casing 130.
- a central portion of the rotation holding member 131 is depressed downward, whereby an accommodating portion 132 for accommodating the template T is formed.
- a groove 132 a smaller than the outer shape of the template T is formed in the lower portion of the housing portion 132. Therefore, in the accommodating portion 132, the inner peripheral portion of the lower surface of the template T is not in contact with the rotation holding member 131 due to the presence of the groove portion 132 a, and only the outer peripheral portion of the lower surface of the template T is supported by the rotation holding member 131.
- the accommodating portion 132 has a substantially rectangular planar shape that matches the outer shape of the template T.
- a plurality of projecting portions 133 projecting inward from the side surface are formed in the housing portion 132, and the template T accommodated in the housing portion 132 is positioned by the projecting portion 133. Further, when the template T is transferred from the transfer arm 20 a of the transfer unit 20 to the storage unit 132, a cutout portion 134 is formed on the outer periphery of the storage unit 132 in order to prevent the transfer arm 20 a from interfering with the storage unit 132. It is formed in four places.
- the rotation holding member 131 is attached to the cover body 135 as shown in FIG. 8, and a rotation driving unit 137 is provided below the rotation holding member 131 via a shaft 136.
- this rotation drive unit 137 the rotation holding member 131 can rotate around the vertical at a predetermined speed and can move up and down.
- a cup 140 that receives and collects a release agent scattered or dropped from the template T.
- a lower surface of the cup 140 is connected to a discharge pipe 141 that discharges the collected release agent and an exhaust pipe 142 that exhausts the atmosphere in the cup 140.
- a rail 150 extending along the Y direction is formed on the negative side of the cup 140 in the X direction (downward direction in FIG. 10).
- the rail 150 is formed, for example, from the outside of the cup 140 in the Y direction negative direction (left direction in FIG. 10) to the outside in the Y direction positive direction (right direction in FIG. 10).
- An arm 151 is attached to the rail 150.
- the arm 151 supports a rinsing liquid nozzle 152 for supplying a rinsing liquid, for example, an organic solvent for the release agent S, onto the template T.
- the arm 151 is movable on the rail 150 by a nozzle driving unit 153.
- the rinse liquid nozzle 152 can move from the standby portion 154 installed outside the cup 140 on the Y direction positive direction side to above the center portion of the template T in the cup 140.
- the arm 151 can be moved up and down by a nozzle driving unit 153, and the height of the rinsing liquid nozzle 152 can be adjusted.
- a cleaning liquid nozzle that injects a cleaning liquid, for example, an organic solvent, may be provided in the groove 132 a of the rotation holding member 131.
- a cleaning liquid nozzle that injects a cleaning liquid, for example, an organic solvent, may be provided in the groove 132 a of the rotation holding member 131.
- the configuration of the rinse unit 33 is the same as the configuration of the rinse unit 31 described above, and a description thereof will be omitted.
- the cleaning unit 40 has a casing 160 in which a loading / unloading port (not shown) for the template T is formed on the side surface.
- a chuck 161 for adsorbing and holding the template T is provided in the casing 160.
- Chuck 161 the surface T 1 of the template T to face upward, suction-holds the rear surface T 2.
- a chuck drive unit 162 is provided below the chuck 161.
- the chuck driving unit 162 is provided on the bottom surface in the casing 150 and is mounted on a rail 163 extending along the Y direction. The chuck 161 can be moved along the rail 163 by the chuck driving unit 162.
- An ultraviolet irradiation unit 164 that irradiates the template T held by the chuck 161 with ultraviolet rays is provided on the ceiling surface in the casing 150 and above the rails 163.
- the ultraviolet irradiation part 164 extends in the X direction as shown in FIG. Then, while moving the template T along the rail 163, by irradiating ultraviolet from the ultraviolet irradiation unit 164 to the surface T 1 of the said template T, ultraviolet rays are irradiated onto the surface T 1 the entire surface of the template T.
- the configuration of the cleaning unit 50 is the same as the configuration of the cleaning unit 40 described above, and thus the description thereof is omitted.
- the heating unit 43 has a casing 170 in which a loading / unloading port (not shown) for the template T is formed on the side surface.
- a mounting table 171 on which the template T is mounted is provided on the bottom surface in the casing 170.
- Template T has a surface T 1 is placed on the top surface of the mounting table 171 to face upward.
- elevating pins 172 for supporting the template T from below and elevating it are provided in the mounting table 171.
- the elevating pin 172 can be moved up and down by the elevating drive unit 173.
- a through hole 174 that penetrates the upper surface in the thickness direction is formed on the upper surface of the mounting table 171, and the elevating pin 172 is inserted through the through hole 174.
- a hot plate 175 for heating the template T is provided on the upper surface of the mounting table 171.
- a heater that generates heat by power feeding is provided inside the hot plate 175, for example, a heater that generates heat by power feeding is provided, and the hot plate 175 can be adjusted to a predetermined set temperature.
- a lid body 180 that can move up and down is provided above the mounting table 171.
- the lid 180 has an open bottom surface and forms a processing chamber K together with the mounting table 171.
- An exhaust part 181 is provided at the center of the upper surface of the lid 180. The atmosphere in the processing chamber K is uniformly exhausted from the exhaust unit 181.
- the temperature control units 41, 42, 51, 52 have the same configuration as that of the heating unit 43 described above, and a temperature control plate is used instead of the hot plate 175.
- a cooling member such as a Peltier element is provided inside the temperature adjustment plate, and the temperature adjustment plate can be adjusted to a set temperature.
- the lid 180 in the heating unit 43 may be omitted.
- the control unit 200 is a computer, for example, and has a program storage unit (not shown).
- the program storage unit controls the transfer of the template T between the loading / unloading station 2 and the processing station 3, the operation of the drive system in the processing station 3, and the like, and executes template processing to be described later in the template processing apparatus 1.
- the program is stored.
- This program is recorded in a computer-readable storage medium such as a computer-readable hard disk (HD), flexible disk (FD), compact disk (CD), magnetic optical desk (MO), memory card, or the like. Or installed in the control unit 200 from the storage medium.
- the template processing apparatus 1 is configured as described above. Next, the process which forms the mold release agent performed in the template processing apparatus 1 will be described.
- FIG. 14 shows the main processing flow of this template processing.
- the template transport body 12 takes out the template T from the cassette C on the cassette mounting table 10 and transports it to the transition unit 21 of the processing station 3 (step A1 in FIG. 14).
- the cassette C, the template T, the surface T 1 of the transfer pattern C is formed is accommodated so as to face upward, the template T in this state is conveyed to the transition unit 21.
- the template T is transported to the cleaning unit 40 by the transport unit 20 and is sucked and held by the chuck 161. Subsequently, the template T is irradiated with ultraviolet rays from the ultraviolet irradiation unit 164 while moving the template T along the rails 163 by the chuck driving unit 162. Thus, ultraviolet light is irradiated on the surface T 1 the entire surface of the template T, the surface T 1 of the template T is cleaned (step A2 in FIG. 14).
- the template T is transported to the film forming unit 30 by the transport unit 20.
- the template T transported to the film forming unit 30 is transferred to the lifting pins 102 and placed on the placing table 101.
- the release agent S is supplied from the release agent nozzle 123 to the second roller 122 while moving the release agent supply unit 112 in the side direction of the template T.
- the release agent S supplied from the release agent nozzle 123 to the second roller 122 is supplied from the second roller 122 to the first roller 121.
- the release agent S is stretched thinly. Then, it adheres to the surface of the first roller 121 with a predetermined film thickness, for example, 5 nm.
- the first roller 121 comes into contact with the upper surface of the convex portion C 1 of the transfer pattern C of the template T while rotating.
- the convex portion C 1 upper surface of the transfer pattern C from the first roller 121 the release agent S is coated by a predetermined thickness, for example, 5 nm.
- the first roller 121 abuts only on the convex portion C 1 top, since the release agent S on the surface of the first roller 121 is adjusted to small thickness, the release agent S is It will not be applied to portions other than the convex portion C 1 top.
- the drying nozzle 124 by supplying gas to the upper surface of the convex portion C 1, drying the release agent S of the convex portion C 1 top.
- the release agent S is formed on the convex portion C 1 top (step A3 in FIG. 14).
- the template T is transported to the heating unit 43 by the transport unit 20.
- the template T carried into the heating unit 43 is transferred to the lift pins 172 and placed on the placement table 171.
- the lid 180 is closed, and the template T is heated to, for example, 200 ° C. by the hot plate 175.
- the release agent S on the template T is baked (step A4 in FIG. 14).
- the transport unit 20 transports the template T to the temperature adjustment unit 41, and the template T is adjusted to a predetermined temperature.
- the template T is transported to the rinse unit 31 by the transport unit 20 and transferred to the rotation holding member 131.
- the rinse liquid nozzle 152 is moved to above the center of the template T and the template T is rotated.
- the rinse liquid is supplied onto the rotating template T, and the rinse liquid is diffused on the template T by centrifugal force. When it does so, only the unreacted part of the mold release agent S will peel (process A5 of FIG. 14).
- it continues to further rotate the template T, drying finishing off the surface T 1.
- the template T is transported to the transition unit 21 by the transport unit 20 and returned to the cassette C by the template transport body 12 (step A6 in FIG. 14).
- the release agent S is deposited only on the convex portion C 1 upper surface in the transfer pattern C of the template T.
- the template T on which the release agent S is formed as described above is conveyed to, for example, the imprint unit 210 shown in FIGS. 15 and 16, and a resist pattern is formed on the wafer W using the template T in the imprint unit 210. It is formed.
- the imprint unit 210 has a casing 211 in which a loading / unloading port (not shown) for the template T and a loading / unloading port (not shown) for the wafer W are formed on the side surfaces.
- a template holding unit 220 that holds the template T is provided on the bottom surface in the casing 211.
- Template holding portion 220, the outer peripheral portion of the rear surface T 2 of the template T has a chuck 221 for holding suction.
- the chuck 221 is movable in the vertical direction and rotatable around the vertical by a moving mechanism 222 provided below the chuck 221.
- the template T can be rotated up and down in a predetermined direction with respect to a wafer W on a wafer holding unit 240 described later.
- the template holding unit 220 has a light source 223 provided above the template T held by the chuck 221.
- the light source 223 emits light such as visible light, near ultraviolet light, and ultraviolet light, and the light from the light source 223 is transmitted upward through the template T.
- a rail 230 extending along the Y direction (left and right direction in FIG. 16) is provided on the negative side in the X direction (downward direction in FIG. 16) of the template holding unit 220.
- the rail 230 is formed, for example, from the outside of the template holding unit 220 on the Y direction negative direction (left direction in FIG. 16) to the outside on the Y direction positive direction (right direction in FIG. 16).
- An arm 231 is attached to the rail 230.
- the arm 231 supports a resist solution nozzle 232 that supplies a resist solution onto the template T.
- the resist solution nozzle 232 has, for example, an elongated shape along the X direction that is the same as or longer than the diameter dimension of the wafer W.
- an ink jet type nozzle is used as the resist solution nozzle 232, and a plurality of supply ports (not shown) formed in a line along the longitudinal direction are formed below the resist solution nozzle 232.
- the resist solution nozzle 232 can strictly control the resist solution supply timing, the resist solution supply amount, and the like.
- the arm 231 is movable on the rail 230 by the nozzle driving unit 233. Accordingly, the resist solution nozzle 232 can move from the standby unit 234 installed on the outer side of the template holding unit 220 on the Y direction positive direction side to above the template T on the template holding unit 220, and the surface of the template T The top can be moved in the side direction of the template T.
- the arm 231 can be moved up and down by a nozzle driving unit 233, and the height of the resist solution nozzle 232 can be adjusted.
- a wafer holding unit 240 that holds the wafer W as shown in FIG. 15 is provided on the ceiling surface in the casing 30 and above the template holding unit 220. That is, the template holding unit 220 and the wafer holding unit 240 are arranged so that the template T held by the template holding unit 220 and the wafer W placed on the wafer holding unit 240 face each other.
- the wafer holding unit 240 holds the back surface of the wafer W by suction so that the processing surface of the wafer W faces downward.
- the wafer holding unit 240 can be moved in the horizontal direction by a moving mechanism 241 provided above the wafer holding unit 240.
- FIG. 17 shows the state of the template T and the wafer W in the main process.
- the template T and the wafer W are carried into the imprint unit 210 and are sucked and held by the template holding unit 220 and the wafer holding unit 240, respectively.
- release agent S is deposited only on the convex portion C 1 upper surface of the transfer pattern C.
- the resist solution nozzle 232 is moved in the side direction of the template T, and the resist solution is applied onto the template T as shown in FIG. 17A to form a resist film R as a coating film.
- the amount of the resist solution applied onto the recess C 2 portion corresponding to the transfer pattern C of the template T is often convex portion C
- the resist solution is applied onto the template T so that the amount of the resist solution applied to the portion corresponding to 1 (the portion corresponding to the recess in the resist pattern P) is reduced. In this way, a resist solution is applied on the template T in accordance with the aperture ratio of the transfer pattern C.
- the release agent S is formed only on the upper surface of the convex portion C 1 in the transfer pattern C of the template T, the upper surface of the convex portion C 1 is more resist resist than the inner surface of the concave portion C 2.
- the wafer W held on the wafer holding unit 240 is moved to a predetermined position in the horizontal direction to be aligned and held on the template holding unit 220.
- the template T is rotated in a predetermined direction.
- the template T is raised to the wafer W side as indicated by the arrow in FIG.
- the template T rises to a predetermined position, and the surface T 1 of the template T is pressed against the resist film R on the wafer W.
- light is emitted from the light source 223.
- the light from the light source 223 passes through the template T as shown in FIG. 17B and is applied to the resist film R on the wafer W, whereby the resist film R is photopolymerized. In this way, the transfer pattern C of the template T is transferred to the resist film R on the wafer W, and a resist pattern P is formed.
- the template T is lowered as shown in FIG. 17C to form a resist pattern P on the wafer W.
- the convex portion C 1 is the top surface release agent S in the transfer pattern C of the template T is deposited, never resist on the wafer W adheres to the surface T 1 of the template T. That is, according to the inventors, if the release agent S on the convex portion C 1 upper surface long as it is deposited, the template T is able to exert a sufficient releasing effect has been confirmed. Note that after the wafer W is unloaded from the imprint unit 210, the remaining film L on the wafer W may be removed as shown in FIG. Thus, the imprint process in the imprint unit 210 is completed, and a predetermined resist pattern P is formed on the wafer W.
- the resist solution applied on the template T is likely to flow into the concave portion C 2 of the transfer pattern C.
- the resist solution is filled without gaps in the recess C 2. Therefore, a predetermined resist pattern P can be formed on the wafer W using the template T.
- the supply is performed from the release agent nozzle 123 to the second roller 122.
- the released release agent S is stretched thinly between the second roller 122 and the first roller 121. Then, the release agent S adheres to the surface of the first roller 121 with a predetermined film thickness. Accordingly, the convex portion C 1 upper surface of the transfer pattern C from the first roller 121 may be coated with a release agent S in a predetermined thickness.
- drying nozzle 124 and the first roller 121 can be dried the same because it is supported by the support member 120, immediately efficiently release agent S coated on the convex portion C 1 upper surface of the transfer pattern C .
- the release agent supply unit 112 configured by these is provided. It can be moved efficiently. In addition, only one moving mechanism for moving the release agent supply unit 112 is required, and the manufacturing cost of the template processing apparatus 1 can be reduced.
- step A2 since cleaning the surface T 1 of the template T in step A2, it is possible to film the release agent S in a predetermined thickness on the surface T 1 of the template T in the subsequent step S3. Note that this step A2 may be omitted if the surface T 1 of the template T is prewashed thoroughly.
- the template T is mounted on the mounting table 101.
- the present invention is not limited to this as long as the template T can be held.
- a rotation holding member having the same configuration as the rotation holding member 131 of the rinse units 31 and 33 may be provided. In such a case, the lifting pins 102 and the lifting drive unit 103 can be omitted.
- the release agent supply unit 112 is arranged above the mounting table 101.
- the arrangement of the mounting table 101 and the release agent supply unit 112 is arranged in the vertical direction. It may be reversed. In such a case, the mounting table 101 suction-holds the rear surface T 2 of the template T. Then, the first roller 121 from below the template T releasing agent supply unit 112 is in contact with the convex portion C 1 upper surface of the transfer pattern C, and depositing the release agent S on the convex portion C 1 top.
- the rinsing units 31 and 33 supply the rinsing liquid onto the rotating template T to rinse the release agent S.
- the template T is applied to the immersion layer in which the rinsing liquid is stored. May be dipped to rinse the release agent S.
- an ultraviolet irradiation unit for covering the surface T 1 the entire surface of the template T
- the template T may be irradiated with ultraviolet rays.
- the ultraviolet irradiation unit is disposed above the template T so as to face the template T. In this case, it is possible to irradiate ultraviolet rays to the surface T 1 the entire surface of the template T by one irradiation, it is possible to clean the surface T 1 of the template T quickly.
- the template T is rotated, may be irradiated with ultraviolet rays to the surface T 1 entire template T in the rotation.
- the film formation of the release agent S on the template T and the heating of the template T are performed in separate processing units (film formation units 30 and 32 and heating units 43, 44, 53, and 54). Although it was performed, it may be performed by one processing unit. For example, a hot plate is provided in the mounting table 101 of the film forming units 30 and 32. In such a case, since the application of the release agent S and the heating of the template T can be continuously performed in one processing unit, the throughput of the template processing can be improved. In addition, the configuration of the template processing apparatus 1 can be simplified.
- the template holding unit 220 is provided below the wafer holding unit 240.
- the arrangement of the template holding unit 220 and the wafer holding unit 240 may be reversed in the vertical direction. . That is, the template holding unit 220 may be arranged on the ceiling surface in the casing 211, and the wafer holding unit 240 may be arranged on the bottom surface in the casing 211.
- the resist solution is supplied onto the wafer W placed on the wafer holder 240 and the resist film R is formed
- the template holder 220 holding the template T is lowered. Then, the transfer pattern C of the template T is transferred to the resist film R on the wafer W, and a resist pattern P is formed.
- the resist solution is applied on the template T in the imprint unit 210.
- the resist solution may be applied in the film forming units 30 and 32 described above.
- a resist solution nozzle that supplies the resist solution to the release agent supply unit 112 is provided. Then, the template T on which the release agent S and the resist film R are formed is conveyed to the imprint 210, and the transfer pattern C of the template T is transferred to the resist film R on the wafer W in the imprint unit 210. Is formed.
- the imprint unit 210 and the template processing apparatus 1 are provided separately, but they may be arranged in one system. In such a case, since the template processing in the template processing apparatus 1 and the imprint processing in the imprint unit 210 can be performed continuously, the throughput of these processes can be improved.
- the configuration of the release agent supply unit 112 is not limited to the above embodiment, and various configurations can be adopted.
- the drying nozzle 124 of the release agent supply unit 112 the surrounding atmosphere of the convex portion C 1 top release agent is applied to the S of the transfer pattern C may be aspirated.
- the release agent S since the upward force on the release agent S of the convex portion C 1 top acts, the release agent S can be reliably prevented from flowing into the recess C 2. Therefore, it is possible to form a release agent S only more reliable protrusions C 1 top.
- the second roller 122 may be omitted, and only the first roller 121 may be provided as shown in FIG.
- the release agent S is supplied from the release agent nozzle 123 to the first roller 121. Then, by controlling the supply amount of the release agent S from the release agent nozzle 123, the release agent S adheres to the surface of the first roller 121 with a predetermined film thickness. Therefore, the apparatus configuration of the film forming units 30 and 32 can be simplified and the manufacturing cost can be reduced.
- the liquid release agent S is attached to the surface (circumferential surface) of the first roller 121, but as shown in FIG. A mold release agent S that has been dried and solidified may be adhered to the peripheral surface.
- the roller 300 is supported by the support member 120.
- the liquid release agent S is attached to the roller 300 in the standby unit 114 shown in FIG. 6, and then the release agent S is dried.
- the roller 300 as shown in FIG. 20 in contact with the convex portion C 1 upper surface of the transfer pattern C, to move the roller 300 in the side direction of the template T.
- the roller 300 is rotated on the convex portion C 1, the release agent S on the surface of the roller 300 is transferred to the convex portion C 1 top.
- the release agent S is so dry, are transferred to the convex portion C 1 upper surface at a predetermined thickness.
- it since no release agent S on the convex portion C 1 upper surface must be dried, it can be omitted drying nozzle 124 in the release agent supply unit 112 of the embodiment described above. Therefore, the apparatus configuration of the film forming units 30 and 32 can be simplified and the manufacturing cost can be reduced.
- the release agent S on the convex portion C 1 upper surface of the transfer pattern C using rollers 121,122,300 was applied, release agent on the surface as shown in FIG. 21
- An application plate 310 to which S is attached may be used.
- the application plate 310 has a shape that covers at least the transfer pattern C of the template T. Then, by the elevating mechanism (not shown) to lower the applied plate 310 to the template T side, it is brought into contact with the surface of the coating plate 310 to the convex portion C 1 top. Then, the release agent S is coated on the convex portion C 1 top.
- the release agent S attached to the surface of the coating plate 310 may be in a liquid form or may be dried and solidified. If the release agent S is a liquid, after application of the release agent S on the upper surface of the convex portion C 1 using a coating plate 310, the release agent S, is dried by, for example, gas.
- post-processing units 400 and 401 are arranged in the first processing block G1 and the second processing block G2 of the template processing apparatus 1 in place of the rinse units 31 and 33, for example. .
- the post-processing unit 400 and 401 and supplies the alcohol to the convex portion C 1 release agent is deposited on the upper surface S in the film forming unit 30 and 32, the adhesion between the convex portion C 1 top and a release agent S Thereafter, the release agent S supplied with alcohol is rinsed to remove unreacted portions of the release agent S.
- the heating units 43, 44, 53, 54 and the temperature control units 41, 42, 51, 52 are omitted, and the cleaning unit 40 is used.
- , 50 are arranged in two stages.
- the post-processing unit 400 includes a casing 410 having a loading / unloading port (not shown) for the template T formed on the side surface.
- a rotation holding member 411 that holds and rotates the template T is provided at the center of the casing 410.
- the configuration of the rotation holding member 411 is the same as the configuration of the rotation holding member 131 shown in FIGS.
- the rotation holding member 411 is attached to the cover body 412 as shown in FIG. 24, and a rotation driving unit 414 is provided below the rotation holding member 411 via a shaft 413.
- the rotation holding member 411 can rotate at a predetermined speed around the vertical and can move up and down.
- a cup 420 that receives and collects alcohol or rinsing liquid scattered or dropped from the template T.
- a lower surface of the cup 420 is connected to a discharge pipe 421 for discharging the collected alcohol or rinsing liquid and an exhaust pipe 422 for exhausting the atmosphere in the cup 420.
- a rail 430 extending along the Y direction (left-right direction in FIG. 25) is formed on the X direction negative direction (downward direction in FIG. 25) side of the cup 420.
- the rail 430 is formed, for example, from the outside of the cup 420 in the Y direction negative direction (left direction in FIG. 25) to the outside in the Y direction positive direction (right direction in FIG. 25).
- two arms 431 and 432 are attached to the rail 430.
- the first arm 431 supports an alcohol nozzle 433 that supplies normal temperature alcohol, for example ethanol, to the release agent S on the template T.
- the first arm 431 is movable on the rail 430 by the nozzle driving unit 434.
- the alcohol nozzle 433 can move from the standby portion 435 installed outside the cup 420 on the Y direction positive direction side to above the center portion of the template T in the cup 420.
- the first arm 431 can be moved up and down by a nozzle driving unit 434, and the height of the alcohol nozzle 433 can be adjusted.
- alcohol should just be alcohols and you may use alcohol other than ethanol.
- methanol, propanol, butanol, pentanol, hexanol, heptanol may be used, or a mixture of these alcohols may be used.
- concentration of alcohol is not particularly limited, but is preferably 100%.
- normal temperature alcohol in this Embodiment, in order to suppress condensation of alcohol, you may use alcohol heated, for example to 70 degrees C or less.
- liquid alcohol is used in the present embodiment, gaseous alcohol may be used.
- the second arm 432 supports a rinsing liquid nozzle 440 that supplies a rinsing liquid, for example, an organic solvent of the release agent S, onto the template T.
- the second arm 432 is movable on the rail 430 by the nozzle driving unit 441.
- the rinsing liquid nozzle 440 can move from the standby portion 442 provided on the outer side of the cup 420 on the Y direction negative direction side to above the center portion of the template T in the cup 420.
- the second arm 432 can be moved up and down by the nozzle driving unit 441, and the height of the rinsing liquid nozzle 440 can be adjusted.
- the alcohol nozzle 433 and the rinsing liquid nozzle 440 are supported by separate arms 431 and 432. However, the alcohol nozzle 433 and the rinsing liquid nozzle are supported by the same arm and controlled by movement of the arms. The movement and supply timing of 440 may be controlled.
- the configuration of the post-processing unit 401 is the same as the configuration of the post-processing unit 400 described above, and a description thereof will be omitted.
- the template processing apparatus 1 is configured as described above. Next, the process which forms the mold release agent performed in the template processing apparatus 1 will be described.
- FIG. 26 shows the main processing flow of this template processing.
- the template T is transferred from the loading / unloading station 2 to the processing station 3 by the template transfer body 12 (step B1 in FIG. 26). Thereafter, in the cleaning unit 40, after the cleaning of the surface T 1 of the template T (step B2 in FIG. 26) is performed, in the film deposition unit 30.
- the template T is formed (step B3 in FIG. 26). Since these steps B1 to B3 are the same as the steps A1 to A3 in the above embodiment, a detailed description thereof is omitted.
- the template T is transported to the post-processing unit 400 by the transport unit 20 and transferred to the rotation holding member 411.
- the alcohol nozzle 433 is moved above the center of the template T by the first arm 431 and the template T is rotated.
- alcohol is supplied onto the rotating template T, and the alcohol is diffused on the template T by centrifugal force (step B4 in FIG. 26).
- the alcohol on the template T, the release agent S is firmly and closely chemically react with the surface T 1 of the template T, release agent S is brought into close contact with the surface T 1 of the said template T.
- the supply of alcohol from the alcohol nozzle 433 is stopped, and the template T is further rotated.
- the alcohol on the template T is dried and removed (step B5 in FIG. 26). While the alcohol is being dried in this way, the alcohol nozzle 433 moves from above the center of the template T, and the second arm 432 moves the rinse liquid nozzle 440 of the standby unit 442 to above the center of the template T. To do.
- the template T When the alcohol on the template T is dried, the template T is continuously rotated, and the rinse liquid is supplied from the rinse liquid nozzle 440 onto the rotating template T.
- the rinse liquid diffuses on the template T by centrifugal force. Only the unreacted portion of the release agent S is peeled off by this rinsing liquid (step B6 in FIG. 26). Then, after stopping the supply of the rinsing liquid, it continues to further rotate the template T, drying finishing off the surface T 1.
- the template T is transported to the transition unit 21 by the transport unit 20 and returned to the cassette C by the template transport body 12 (step B7 in FIG. 26).
- the release agent S is deposited only on the convex portion C 1 upper surface in the transfer pattern C of the template T.
- the template since the alcohol was applied to the release agent S on the template T in step B4, the chemical reaction between the surface T 1 and the release agent S of the template T is promoted, the template The adhesion between the surface T 1 of T and the release agent S is improved. In other words, it can be brought into close contact with the surface T 1 of the template T of the release agent S in a short time. Thereby, the throughput of template processing can be further improved.
- the predetermined angle and the contact angle of the release agent S on the template T can be for example, about 110 degrees.
- the release agent S has sufficient liquid repellency with respect to the resist film, and can exhibit its release function.
- the process B4 and the process B5 that is, the application and drying of the alcohol and the application and drying of the rinse liquid are performed in one post-processing unit 400, the alcohol processing and the rinsing process can be performed efficiently, and the template processing apparatus 1 The size can be reduced, and the manufacturing cost can be reduced.
- the film formation of the release agent S on the template T and the alcohol treatment and the rinsing treatment of the release agent S are performed in separate processing units (the film formation units 30 and 32 and the post-processing unit 400, respectively). 401), it may be performed by one processing unit.
- the film forming unit 500 which is the above-described processing unit, supplies the release agent shown in FIGS. 4 and 6 into the casing 410 of the post-processing unit 400 shown in FIGS.
- the portion 112 is arranged.
- the release agent supply unit 112 is supported by the third arm 501 as shown in FIG.
- the third arm 501 is movable on the rail 430 by the drive unit 502.
- the release agent supply unit 112 extends from the standby unit 503 installed on the outer side of the standby unit 442 in the negative Y direction (left direction in FIG. 27) to above the center of the template T in the cup 420. I can move.
- the third arm 501 can be raised and lowered by the drive unit 502, and the height of the release agent supply unit 112 can be adjusted.
- a standby unit 504 is installed between the standby unit 435 and the cup 420, and the rinse liquid nozzle 440 can move from the standby unit 442 to the standby unit 504 through the center of the template T in the cup 420.
- the other configuration of the film forming unit 500 is the same as the configuration of the post-processing unit 400, and thus the description thereof is omitted.
- the release agent supply unit 112 is supported by the third arm 501, but may be supported by the same arm together with the alcohol nozzle 433 and the rinse liquid nozzle 440.
- the film formation of the release agent S on the template T performed in the film formation unit 500 and the alcohol treatment and the rinsing treatment of the release agent S on the template T are the same as the steps B3 to B6 of the above embodiment. Therefore, explanation is omitted.
- the process B3 to the process B6 are performed by the single film forming unit 500, the film forming process, the alcohol process, and the rinsing process of the release agent S can be performed efficiently. Moreover, the template processing apparatus 1 can be reduced in size, and the manufacturing cost can be reduced.
- the release agent S which is formed in the convex portion C 1 upper surface in the transfer pattern C of the template T, it may be irradiated with light.
- the wavelength of the light applied to the release agent S is preferably, for example, 350 nm to 2500 nm.
- release agent S it is possible to accelerate the chemical bonding of the surface T 1 and the release agent S of the template T, the surface T 1 and the release of the template T It was found that the adhesion with the agent S was improved. That is, the chemical bonding between the surface T 1 of the template T and the release agent S by the alcohol described above can be further promoted, and the release agent S can be brought into close contact with the surface T 1 of the template T in a shorter time.
- the present invention is not limited to such examples. It is obvious for those skilled in the art that various modifications or modifications can be conceived within the scope of the idea described in the claims, and these naturally belong to the technical scope of the present invention. It is understood.
- the present invention is not limited to this example and can take various forms.
- the present invention can also be applied to a case where the substrate is another substrate such as an FPD (flat panel display) other than a wafer or a mask reticle for a photomask.
- FPD flat panel display
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Abstract
Disclosed is a template processing apparatus used for forming a predetermined pattern on a coated film by transferring a transfer pattern onto the coated film formed on a substrate, and that forms a film of a mold-release agent on the template formed with an uneven-shaped transfer pattern on a surface. The mold-release agent film is formed only on a top surface of a convex portion of the transfer pattern. A contact angle of the convex portion upper surface to a coating liquid applied to the template thereafter increases compared to an inner surface of the transfer pattern concave portion, so the coating liquid applied to the template easily flows into the concave portion of the transferred pattern and fills the concave portions of the transfer pattern without gaps.
Description
本発明は、表面に凹凸形状の転写パターンが形成されたテンプレート上に離型剤を成膜するテンプレート処理方法、コンピュータ記憶媒体及びテンプレート処理装置に関する。
The present invention relates to a template processing method, a computer storage medium, and a template processing apparatus for forming a release agent on a template having a concavo-convex transfer pattern formed on the surface.
例えば半導体デバイスの製造工程では、例えば半導体ウェハ(以下、「ウェハ」という。)にフォトリソグラフィー処理を行い、ウェハ上に所定のレジストパターンを形成することが行われている。
For example, in a semiconductor device manufacturing process, for example, a semiconductor wafer (hereinafter referred to as “wafer”) is subjected to a photolithography process to form a predetermined resist pattern on the wafer.
上述したレジストパターンを形成する際には、半導体デバイスのさらなる高集積化を図るため、当該レジストパターンの微細化が求められている。一般にフォトリソグラフィー処理における微細化の限界は、露光処理に用いる光の波長程度である。このため、従来より露光処理の光を短波長化することが進められている。しかしながら、露光光源の短波長化には技術的、コスト的な限界があり、光の短波長化を進める方法のみでは、例えば数ナノメートルオーダーの微細なレジストパターンを形成するのが困難な状況にある。
When forming the above-described resist pattern, the resist pattern is required to be miniaturized in order to further increase the integration of the semiconductor device. In general, the limit of miniaturization in the photolithography process is about the wavelength of light used for the exposure process. For this reason, it has been advancing to shorten the wavelength of exposure light. However, there are technical and cost limitations to shortening the wavelength of the exposure light source, and it is difficult to form a fine resist pattern on the order of several nanometers, for example, only by the method of advancing the light wavelength. is there.
そこで、近年、ウェハにフォトリソグラフィー処理を行う代わりに、いわゆるインプリントと呼ばれる方法を用いてウェハ上に微細なレジストパターンを形成することが提案されている。この方法は、表面に凹凸形状の微細なパターンを有するテンプレート(モールドや型と呼ばれることもある。)をウェハ上に形成したレジスト表面に圧着させ、その後剥離し、当該レジスト表面に直接パターンの転写を行うものである(特許文献1)。
Therefore, in recent years, it has been proposed to form a fine resist pattern on a wafer by using a so-called imprint method instead of performing a photolithography process on the wafer. In this method, a template (sometimes referred to as a mold or a mold) having an uneven pattern on the surface is pressure-bonded to the resist surface formed on the wafer, then peeled off, and the pattern is directly transferred to the resist surface. (Patent Document 1).
上述のインプリント方法で用いられるテンプレートの表面全面には、テンプレートをレジストから剥離し易くするため、通常、レジストに対して撥液性を有する離型剤が成膜されている。
A mold release agent having a liquid repellency to the resist is usually formed on the entire surface of the template used in the above-described imprinting method so that the template can be easily peeled off from the resist.
しかしながら、上述したようにテンプレート上のパターンは非常に微細であり、しかも離型剤がレジストに対して撥液性を有するため、テンプレート上にレジスト液を塗布しても、転写パターンの凹部にレジスト液が入り込み難い。この場合、レジスト液が凹部の内部において液滴上の状態で留まってしまい、凹部に気泡が発生する。すなわち、転写パターンの凹部にレジスト液が隙間無く充填されない。そうすると、液滴の形状がウェハ上のレジストパターンにそのまま転写されてしまうため、ウェハ上に所定のレジストパターンを形成できない場合があった。
However, as described above, the pattern on the template is very fine, and the mold release agent has liquid repellency to the resist. The liquid is difficult to enter. In this case, the resist solution stays on the droplets inside the recess, and bubbles are generated in the recess. That is, the resist solution is not filled in the recesses of the transfer pattern without any gaps. Then, since the shape of the droplet is transferred as it is to the resist pattern on the wafer, there is a case where a predetermined resist pattern cannot be formed on the wafer.
本発明は、かかる点に鑑みてなされたものであり、テンプレートを用いて基板上に所定のパターンが形成されるように、当該テンプレートの表面に離型剤を適切に成膜することを目的とする。
The present invention has been made in view of such a point, and an object thereof is to appropriately form a release agent on the surface of a template so that a predetermined pattern is formed on the substrate using the template. To do.
前記の目的を達成するため、本発明は、基板上に形成される塗布膜に転写パターンを転写して当該塗布膜に所定のパターンを形成するために用いられ、かつ表面に凹凸形状の転写パターンが形成されたテンプレート上に、離型剤を成膜するテンプレート処理方法において、前記転写パターンの凸部の上面のみに離型剤を成膜する。
In order to achieve the above object, the present invention is used to transfer a transfer pattern to a coating film formed on a substrate to form a predetermined pattern on the coating film, and a transfer pattern having an uneven shape on the surface. In the template processing method of forming a release agent on the template on which the film is formed, the release agent is formed only on the upper surface of the convex portion of the transfer pattern.
本発明によれば、転写パターンの凸部上面のみに離型剤を成膜するので、この凸部上面は、転写パターンの凹部の内面に比して、その後テンプレート上に塗布される塗布液に対する接触角が大きくなる。このため、テンプレート上に塗布された塗布液は、転写パターンの凹部に流入し易くなる。すなわち、転写パターンの凹部に塗布液が隙間なく充填される。したがって、かかるテンプレートを用いて基板上の塗布膜に所定のパターンを形成することができる。
According to the present invention, since the release agent is formed only on the upper surface of the convex portion of the transfer pattern, the upper surface of the convex portion is less than the inner surface of the concave portion of the transfer pattern with respect to the coating liquid applied on the template thereafter. The contact angle increases. For this reason, the coating liquid applied on the template tends to flow into the recesses of the transfer pattern. That is, the coating liquid is filled in the recesses of the transfer pattern without any gaps. Therefore, a predetermined pattern can be formed on the coating film on the substrate using such a template.
別な観点による本発明は、前記テンプレート処理方法をテンプレート処理装置によって実行させるために、当該テンプレート処理装置を制御する制御部のコンピュータ上で動作するプログラムを格納した読み取り可能なコンピュータ記憶媒体である。
Another aspect of the present invention is a readable computer storage medium storing a program that operates on a computer of a control unit that controls the template processing apparatus in order to cause the template processing apparatus to execute the template processing method.
さらに別な観点による本発明は、基板上に形成される塗布膜に転写パターンを転写して当該塗布膜に所定のパターンを形成するために用いられ、かつ表面に凹凸形状の転写パターンが形成されたテンプレート上に、離型剤を成膜するテンプレート処理装置において、前記転写パターンの凸部の上面のみに離型剤を成膜する成膜ユニットを有する。
According to another aspect of the present invention, the transfer pattern is transferred to a coating film formed on a substrate to form a predetermined pattern on the coating film, and a concavo-convex transfer pattern is formed on the surface. A template processing apparatus for depositing a release agent on a template further includes a deposition unit for depositing the release agent only on the upper surface of the convex portion of the transfer pattern.
本発明によれば、テンプレートの表面に離型剤を適切に成膜し、当該テンプレートを用いて基板上に所定のパターンを形成することができる。
According to the present invention, a release agent can be appropriately formed on the surface of the template, and a predetermined pattern can be formed on the substrate using the template.
以下、本発明の実施の形態について説明する。図1は、本実施の形態にかかるテンプレート処理装置1の構成の概略を示す平面図である。図2及び図3は、テンプレート処理装置1の構成の概略を示す側面図である。
Hereinafter, embodiments of the present invention will be described. FIG. 1 is a plan view schematically showing the configuration of the template processing apparatus 1 according to the present embodiment. 2 and 3 are side views showing an outline of the configuration of the template processing apparatus 1.
本実施の形態のテンプレート処理装置1では、図4に示すように直方体形状を有し、表面に凹凸形状の転写パターンCが形成されたテンプレートTが用いられる。転写パターンCは、凸部C1と凹部C2とで構成されている。以下、転写パターンCが形成されているテンプレートTの面を表面T1といい、当該表面T1と反対側の面を裏面T2という。なお、テンプレートTには、可視光、近紫外光、紫外線などの光を透過可能な透明材料、例えばガラスが用いられる。また、転写パターンCの凸部C1の高さは、例えば40nm~100nmである。
In the template processing apparatus 1 of the present embodiment, a template T having a rectangular parallelepiped shape and having a concavo-convex transfer pattern C formed on the surface is used as shown in FIG. Transfer pattern C is constituted by a convex portion C 1 and the recess C 2. Hereinafter, the transfer pattern C means the side of the template T which is formed with the surface T 1, the surface T 1 opposite to the surface of the backside T 2. For the template T, a transparent material that can transmit visible light, near ultraviolet light, ultraviolet light, or the like, such as glass, is used. Further, the convex height of the C 1 of the transfer pattern C is, for example, 40 nm ~ 100 nm.
テンプレート処理装置1は、図1に示すように複数、例えば5枚のテンプレートTをカセット単位で外部とテンプレート処理装置1との間で搬入出したり、カセットCに対してテンプレートTを搬入出したりする搬入出ステーション2と、テンプレートTに所定の処理を施す複数の処理ユニットを備えた処理ステーション3とを一体に接続した構成を有している。
As shown in FIG. 1, the template processing apparatus 1 carries a plurality of, for example, five templates T in the cassette unit between the outside and the template processing apparatus 1 and carries the template T into and out of the cassette C. The carry-in / out station 2 and the processing station 3 including a plurality of processing units for performing predetermined processing on the template T are integrally connected.
搬入出ステーション2には、カセット載置台10が設けられている。カセット載置台10は、複数のカセットCをX方向(図1中の上下方向)に一列に載置自在になっている。すなわち、搬入出ステーション2は、複数のテンプレートTを保有可能に構成されている。
The cassette loading table 10 is provided at the loading / unloading station 2. The cassette mounting table 10 can mount a plurality of cassettes C in a row in the X direction (vertical direction in FIG. 1). That is, the carry-in / out station 2 is configured to be capable of holding a plurality of templates T.
搬入出ステーション2には、X方向に延伸する搬送路11上を移動可能なテンプレート搬送体12が設けられている。テンプレート搬送体12は、鉛直方向及び鉛直周り(θ方向)にも移動自在であり、カセットCと処理ステーション3との間でテンプレートTを搬送できる。
The carry-in / out station 2 is provided with a template carrier 12 that can move on a conveyance path 11 extending in the X direction. The template transport body 12 is also movable in the vertical direction and around the vertical direction (θ direction), and can transport the template T between the cassette C and the processing station 3.
処理ステーション3には、その中心部に搬送ユニット20が設けられている。この搬送ユニット20の周辺には、各種処理ユニットが多段に配置された、例えば4つの処理ブロックG1~G4が配置されている。処理ステーション3の正面側(図1のX方向負方向側)には、搬入出ステーション2側から第1の処理ブロックG1、第2の処理ブロックG2が順に配置されている。処理ステーション3の背面側(図1のX方向正方向側)には、搬入出ステーション2側から第3の処理ブロックG3、第4の処理ブロックG4が順に配置されている。処理ステーション3の搬入出ステーション2側には、テンプレートTの受け渡しを行うためのトランジションユニット21が配置されている。搬送ユニット20は、これらの処理ブロックG1~G4内に配置された後述する各種処理ユニット、及びトランジションユニット21に対してテンプレートTを搬送できる。
The processing station 3 is provided with a transport unit 20 at the center thereof. Around the transport unit 20, for example, four processing blocks G1 to G4 in which various processing units are arranged in multiple stages are arranged. A first processing block G1 and a second processing block G2 are arranged in this order from the loading / unloading station 2 side on the front side of the processing station 3 (X direction negative direction side in FIG. 1). A third processing block G3 and a fourth processing block G4 are arranged in this order from the loading / unloading station 2 side on the back side of the processing station 3 (positive side in the X direction in FIG. 1). A transition unit 21 for delivering the template T is arranged on the loading / unloading station 2 side of the processing station 3. The transport unit 20 can transport the template T to various processing units (to be described later) disposed in these processing blocks G1 to G4 and the transition unit 21.
第1の処理ブロックG1には、図2に示すように複数の液処理ユニット、例えばテンプレートTに転写パターンCの凸部C1の上面のみに液体状の離型剤を塗布して成膜する成膜ユニット30、テンプレートT上の離型剤をリンスするリンスユニット31が下から順に2段に重ねられている。第2の処理ブロックG2も同様に、成膜ユニット32、リンスユニット33が下から順に2段に重ねられている。また、第1の処理ブロックG1及び第2の処理ブロックG2の最下段には、前記液処理ユニットに各種処理液を供給するためのケミカル室34、35がそれぞれ設けられている。
The first processing block G1, is formed by a plurality of liquid processing units, for example only on the upper surface of the convex portion C 1 of the transfer pattern C in the template T of the liquid release agent is applied as shown in FIG. 2 A film forming unit 30 and a rinse unit 31 for rinsing the release agent on the template T are stacked in two stages in order from the bottom. Similarly, in the second processing block G2, the film forming unit 32 and the rinsing unit 33 are stacked in two stages from the bottom. In addition, chemical chambers 34 and 35 for supplying various processing liquids to the liquid processing unit are provided at the lowermost stages of the first processing block G1 and the second processing block G2, respectively.
第3の処理ブロックG3には、図3に示すようにテンプレートTに対して紫外線を照射し、テンプレートT上に離型剤が成膜される前の表面T1を洗浄する洗浄ユニット40、テンプレートTの温度を調節する温度調節ユニット41、42、テンプレートTを加熱処理する加熱ユニット43、44が下から順に5段に重ねられている。
The third processing block G3, the cleaning unit 40 that ultraviolet rays are irradiated to the template T as shown in FIG. 3, the release agent on the template T is to clean the surface T 1 of the before the deposition, the template Temperature adjusting units 41 and 42 for adjusting the temperature of T, and heating units 43 and 44 for heating the template T are stacked in five stages in order from the bottom.
第4の処理ブロックG4にも、第3の処理ブロックG3と同様に、洗浄ユニット50、温度調節ユニット51、52、加熱ユニット53、54が下から順に5段に重ねられている。
In the fourth processing block G4, similarly to the third processing block G3, the cleaning unit 50, the temperature control units 51 and 52, and the heating units 53 and 54 are stacked in five stages in order from the bottom.
次に、上述した成膜ユニット30、32の構成について説明する。成膜ユニット30は、図5に示すように側面にテンプレートTの搬入出口(図示せず)が形成されたケーシング100を有している。
Next, the configuration of the film forming units 30 and 32 described above will be described. As shown in FIG. 5, the film forming unit 30 has a casing 100 in which a loading / unloading port (not shown) for the template T is formed on the side surface.
ケーシング100内の底面には、テンプレートTが載置される載置台101が設けられている。テンプレートTは、その表面T1が上方を向くように載置台101の上面に載置される。載置台101内には、テンプレートTを下方から支持し昇降させるための昇降ピン102が設けられている。昇降ピン102は、昇降駆動部103により上下動できる。載置台101の上面には、当該上面を厚み方向に貫通する貫通孔104が形成されおり、昇降ピン102は、貫通孔104を挿通するようになっている。
A mounting table 101 on which the template T is mounted is provided on the bottom surface in the casing 100. Template T has a surface T 1 is placed on the top surface of the mounting table 101 to face upward. In the mounting table 101, raising / lowering pins 102 for supporting the template T from below and raising / lowering it are provided. The elevating pin 102 can be moved up and down by the elevating drive unit 103. A through hole 104 penetrating the upper surface in the thickness direction is formed on the upper surface of the mounting table 101, and the elevating pin 102 is inserted through the through hole 104.
図6に示すように載置台101のX方向負方向(図6の下方向)側には、Y方向(図6の左右方向)に沿って延伸するレール110が設けられている。レール110は、例えば載置台101のY方向負方向(図6の左方向)側の外方からY方向正方向(図6の右方向)側の外方まで形成されている。レール110には、アーム111が取り付けられている。
As shown in FIG. 6, a rail 110 extending along the Y direction (left-right direction in FIG. 6) is provided on the mounting table 101 on the negative side in the X direction (downward in FIG. 6). For example, the rail 110 is formed from the outside of the mounting table 101 on the Y direction negative direction (left direction in FIG. 6) side to the outside on the Y direction positive direction (right direction in FIG. 6) side. An arm 111 is attached to the rail 110.
アーム111には、テンプレートT上に離型剤を供給する離型剤供給部112が支持されている。離型剤供給部112は、例えばテンプレートTの一辺寸法と同じかそれよりも長く、X方向に沿って延伸している。なお、離型剤の材料には、後述するウェハ上のレジスト膜に対して撥液性を有する材料、例えばフッ素樹脂等が用いられる。
A release agent supply unit 112 that supplies a release agent onto the template T is supported on the arm 111. The release agent supply unit 112 is, for example, equal to or longer than one side dimension of the template T and extends along the X direction. Note that a material having a liquid repellency with respect to a resist film on the wafer, which will be described later, such as a fluororesin, is used as the material of the release agent.
アーム111は、駆動部113により、レール110上を移動自在である。これにより、離型剤供給部112は、載置台101のY方向正方向側の外方に設置された待機部114から載置台101上のテンプレートTの上方まで移動でき、さらに当該テンプレートTの表面T1上をテンプレートTの辺方向に移動できる。また、アーム111は、駆動部113によって昇降自在であり、離型剤供給部112の高さを調整できる。なお、本実施の形態においては、レール110、アーム111、駆動部113で移動機構を構成している。
The arm 111 is movable on the rail 110 by the drive unit 113. As a result, the release agent supply unit 112 can move from the standby unit 114 installed outside the mounting table 101 on the positive side in the Y direction to above the template T on the mounting table 101, and further the surface of the template T T 1 on the movable in the side direction of the template T. Further, the arm 111 can be raised and lowered by the drive unit 113, and the height of the release agent supply unit 112 can be adjusted. In the present embodiment, the rail 110, the arm 111, and the drive unit 113 constitute a moving mechanism.
離型剤供給部112は、図7に示すようにアーム111に支持される支持部材120を有している。支持部材120には、凸部C1の上面に当接して、当該凸部C1の上面に液体状の離型剤Sを塗布する第1のローラ121と、第1のローラ121と同軸方向に延伸し、当該第1のローラ121と当接する第2のローラ122とが支持されている。第1のローラ121と第2のローラ122は、それぞれテンプレートTの一辺寸法と同じかそれよりも長く、X方向に沿って延伸している。そして、支持部材120が水平方向に移動することで、第1のローラ121と第2のローラ122はそれぞれ逆方向に回転する。
The release agent supply unit 112 has a support member 120 supported by the arm 111 as shown in FIG. The support member 120 is in contact with the upper surface of the convex portion C 1, a first roller 121 for applying a liquid release agent S on the upper surface of the convex portion C 1, the first roller 121 and coaxially And a second roller 122 that contacts the first roller 121 is supported. The first roller 121 and the second roller 122 are each equal to or longer than one side dimension of the template T and extend along the X direction. Then, as the support member 120 moves in the horizontal direction, the first roller 121 and the second roller 122 rotate in opposite directions.
第2のローラ122の上方には、当該第2のローラ122に離型剤Sを供給する離型剤ノズル123が設けられている。離型剤ノズル123は、支持部材120に支持されている。また、離型剤ノズル123は、テンプレートTの一辺寸法と同じかそれよりも長く、X方向に沿って延伸している。離型剤ノズル123の離型剤Sの供給口も同様にX方向に沿って延伸している。離型剤ノズル123から第2のローラ122に供給された離型剤Sは、当該第2のローラ122から第1のローラ121に供給される。このとき、第1のローラ121と第2のローラ122が当接しているため、離型剤Sは薄く引き伸ばされる。そうすると、当該第1のローラ121の表面に所定の膜厚、例えば5nmで付着する。そして、第1のローラ121から転写パターンCの凸部C1上面に、離型剤Sが所定の膜厚、例えば5nmで塗布される。
A release agent nozzle 123 that supplies the release agent S to the second roller 122 is provided above the second roller 122. The release agent nozzle 123 is supported by the support member 120. Further, the release agent nozzle 123 is equal to or longer than one side dimension of the template T and extends along the X direction. Similarly, the release agent S supply port of the release agent nozzle 123 extends in the X direction. The release agent S supplied from the release agent nozzle 123 to the second roller 122 is supplied from the second roller 122 to the first roller 121. At this time, since the first roller 121 and the second roller 122 are in contact with each other, the release agent S is stretched thinly. Then, it adheres to the surface of the first roller 121 with a predetermined film thickness, for example, 5 nm. Then, the convex portion C 1 upper surface of the transfer pattern C from the first roller 121, the release agent S is coated by a predetermined thickness, for example, 5 nm.
第1のローラ120の後方(Y方向負方向側)には、凸部C1上面に塗布された離型剤Sに気体を供給し、当該離型剤Sを乾燥させる乾燥ノズル124が設けられている。乾燥ノズル124は、支持部材120に支持されている。また、乾燥ノズル124は、テンプレートTの一辺寸法と同じかそれよりも長く、X方向に沿って延伸している。乾燥ノズル124の気体の供給口も同様にX方向に沿って延伸している。乾燥ノズル124から供給される気体は、例えば常温、たとえば23℃の空気である。
Behind the first roller 120 (Y-direction negative direction side), the gas is supplied to the convex portion C 1 release agent is applied to the upper surface S, the drying nozzle 124 is provided for drying the release agent S ing. The drying nozzle 124 is supported by the support member 120. Further, the drying nozzle 124 is equal to or longer than one side dimension of the template T, and extends along the X direction. Similarly, the gas supply port of the drying nozzle 124 extends along the X direction. The gas supplied from the drying nozzle 124 is air at room temperature, for example, 23 ° C., for example.
なお、成膜ユニット32の構成は、上述した成膜ユニット30の構成と同様であるので説明を省略する。
Note that the configuration of the film forming unit 32 is the same as the configuration of the film forming unit 30 described above, and a description thereof will be omitted.
次に、上述したリンスユニット31、33の構成について説明する。リンスユニット31は、図8に示すように、側面にテンプレートTの搬入出口(図示せず)が形成されたケーシング130を有している。
Next, the configuration of the rinse units 31 and 33 described above will be described. As shown in FIG. 8, the rinse unit 31 has a casing 130 in which a loading / unloading port (not shown) for the template T is formed on the side surface.
ケーシング130内の中央部には、テンプレートTを保持して回転させる、回転保持部材131が設けられている。回転保持部材131の中央部分は下方に窪み、それによって、テンプレートTを収容する収容部132が形成されている。収容部132の下部には、テンプレートTの外形より小さい溝部132aが形成されている。したがって、収容部132内では、溝部132aの存在によってテンプレートTの下面内周部は、回転保持部材131と接しておらず、テンプレートTの下面外周部のみが回転保持部材131に支持されている。収容部132は、図9に示すようにテンプレートTの外形に適合したほぼ四角形の平面形状を有している。収容部132には、側面から内側に突出した突出部133が複数形成され、この突出部133により、収容部132に収容されるテンプレートTの位置決めがされる。また、搬送ユニット20の搬送アーム20aから収容部132にテンプレートTを受け渡す際に、搬送アーム20aが収容部132と干渉するのを避けるため、収容部132の外周には、切欠き部134が4箇所に形成されている。
A rotation holding member 131 that holds and rotates the template T is provided at the center of the casing 130. A central portion of the rotation holding member 131 is depressed downward, whereby an accommodating portion 132 for accommodating the template T is formed. A groove 132 a smaller than the outer shape of the template T is formed in the lower portion of the housing portion 132. Therefore, in the accommodating portion 132, the inner peripheral portion of the lower surface of the template T is not in contact with the rotation holding member 131 due to the presence of the groove portion 132 a, and only the outer peripheral portion of the lower surface of the template T is supported by the rotation holding member 131. As shown in FIG. 9, the accommodating portion 132 has a substantially rectangular planar shape that matches the outer shape of the template T. A plurality of projecting portions 133 projecting inward from the side surface are formed in the housing portion 132, and the template T accommodated in the housing portion 132 is positioned by the projecting portion 133. Further, when the template T is transferred from the transfer arm 20 a of the transfer unit 20 to the storage unit 132, a cutout portion 134 is formed on the outer periphery of the storage unit 132 in order to prevent the transfer arm 20 a from interfering with the storage unit 132. It is formed in four places.
回転保持部材131は、図8に示すようにカバー体135に取り付けられ、回転保持部材131の下方には、シャフト136を介して回転駆動部137が設けられている。この回転駆動部137により、回転保持部材131は鉛直周りに所定の速度で回転でき、且つ昇降できる。
The rotation holding member 131 is attached to the cover body 135 as shown in FIG. 8, and a rotation driving unit 137 is provided below the rotation holding member 131 via a shaft 136. By this rotation drive unit 137, the rotation holding member 131 can rotate around the vertical at a predetermined speed and can move up and down.
回転保持部材131の周囲には、テンプレートTから飛散又は落下する離型剤を受け止めて、回収するカップ140が設けられている。カップ140の下面には、回収した離型剤を排出する排出管141と、カップ140内の雰囲気を排気する排気管142が接続されている。
Around the rotation holding member 131, there is provided a cup 140 that receives and collects a release agent scattered or dropped from the template T. A lower surface of the cup 140 is connected to a discharge pipe 141 that discharges the collected release agent and an exhaust pipe 142 that exhausts the atmosphere in the cup 140.
図10に示すようにカップ140のX方向負方向(図10の下方向)側には、Y方向(図10の左右方向)に沿って延伸するレール150が形成されている。レール150は、例えばカップ140のY方向負方向(図10の左方向)側の外方からY方向正方向(図10の右方向)側の外方まで形成されている。レール150には、アーム151が取り付けられている。
As shown in FIG. 10, a rail 150 extending along the Y direction (left-right direction in FIG. 10) is formed on the negative side of the cup 140 in the X direction (downward direction in FIG. 10). The rail 150 is formed, for example, from the outside of the cup 140 in the Y direction negative direction (left direction in FIG. 10) to the outside in the Y direction positive direction (right direction in FIG. 10). An arm 151 is attached to the rail 150.
アーム151には、テンプレートT上にリンス液、例えば離型剤Sの有機溶剤を供給するリンス液ノズル152が支持されている。アーム151は、ノズル駆動部153により、レール150上を移動自在である。これにより、リンス液ノズル152は、カップ140のY方向正方向側の外方に設置された待機部154からカップ140内のテンプレートTの中心部上方まで移動できる。また、アーム151は、ノズル駆動部153によって昇降自在であり、リンス液ノズル152の高さを調整できる。
The arm 151 supports a rinsing liquid nozzle 152 for supplying a rinsing liquid, for example, an organic solvent for the release agent S, onto the template T. The arm 151 is movable on the rail 150 by a nozzle driving unit 153. As a result, the rinse liquid nozzle 152 can move from the standby portion 154 installed outside the cup 140 on the Y direction positive direction side to above the center portion of the template T in the cup 140. The arm 151 can be moved up and down by a nozzle driving unit 153, and the height of the rinsing liquid nozzle 152 can be adjusted.
例えば回転保持部材131の溝部132a内に、洗浄液、例えば有機溶剤を噴射する洗浄液ノズルを設けてもよい。この洗浄液ノズルからテンプレートTの裏面T2に洗浄液を噴射することによって、当該裏面T2を洗浄することができる。
For example, a cleaning liquid nozzle that injects a cleaning liquid, for example, an organic solvent, may be provided in the groove 132 a of the rotation holding member 131. By spraying the cleaning liquid onto the back surface T 2 of the template T from the cleaning liquid nozzle, the back surface T 2 can be cleaned.
リンスユニット33の構成は、上述したリンスユニット31の構成と同様であるので説明を省略する。
The configuration of the rinse unit 33 is the same as the configuration of the rinse unit 31 described above, and a description thereof will be omitted.
次に、上述した洗浄ユニット40、50の構成について説明する。洗浄ユニット40は、図11に示すように側面にテンプレートTの搬入出口(図示せず)が形成されたケーシング160を有している。
Next, the configuration of the above-described cleaning units 40 and 50 will be described. As shown in FIG. 11, the cleaning unit 40 has a casing 160 in which a loading / unloading port (not shown) for the template T is formed on the side surface.
ケーシング160内には、テンプレートTを吸着保持するチャック161が設けられている。チャック161は、テンプレートTの表面T1が上方を向くように、その裏面T2を吸着保持する。チャック161の下方には、チャック駆動部162が設けられている。このチャック駆動部162は、ケーシング150内の底面に設けられ、Y方向に沿って延伸するレール163上に取付けられている。このチャック駆動部162により、チャック161はレール163に沿って移動できる。
A chuck 161 for adsorbing and holding the template T is provided in the casing 160. Chuck 161, the surface T 1 of the template T to face upward, suction-holds the rear surface T 2. A chuck drive unit 162 is provided below the chuck 161. The chuck driving unit 162 is provided on the bottom surface in the casing 150 and is mounted on a rail 163 extending along the Y direction. The chuck 161 can be moved along the rail 163 by the chuck driving unit 162.
ケーシング150内の天井面であって、レール163の上方には、チャック161に保持されたテンプレートTに紫外線を照射する紫外線照射部164が設けられている。紫外線照射部164は、図12に示すようにX方向に延伸している。そして、テンプレートTがレール163に沿って移動中に、紫外線照射部164から当該テンプレートTの表面T1に紫外線を照射することで、テンプレートTの表面T1全面に紫外線が照射される。
An ultraviolet irradiation unit 164 that irradiates the template T held by the chuck 161 with ultraviolet rays is provided on the ceiling surface in the casing 150 and above the rails 163. The ultraviolet irradiation part 164 extends in the X direction as shown in FIG. Then, while moving the template T along the rail 163, by irradiating ultraviolet from the ultraviolet irradiation unit 164 to the surface T 1 of the said template T, ultraviolet rays are irradiated onto the surface T 1 the entire surface of the template T.
なお、洗浄ユニット50の構成は、上述した洗浄ユニット40の構成と同様であるので説明を省略する。
Note that the configuration of the cleaning unit 50 is the same as the configuration of the cleaning unit 40 described above, and thus the description thereof is omitted.
次に、上述した加熱ユニット43、44、53、54の構成について説明する。加熱ユニット43は、図13に示すように側面にテンプレートTの搬入出口(図示せず)が形成されたケーシング170を有している。
Next, the configuration of the heating units 43, 44, 53, and 54 will be described. As shown in FIG. 13, the heating unit 43 has a casing 170 in which a loading / unloading port (not shown) for the template T is formed on the side surface.
ケーシング170内の底面には、テンプレートTが載置される載置台171が設けられている。テンプレートTは、その表面T1が上方を向くように載置台171の上面に載置される。載置台171内には、テンプレートTを下方から支持し昇降させるための昇降ピン172が設けられている。昇降ピン172は、昇降駆動部173により上下動できる。載置台171の上面には、当該上面を厚み方向に貫通する貫通孔174が形成されおり、昇降ピン172は、貫通孔174を挿通するようになっている。載置台171の上面には、テンプレートTを加熱する熱板175が設けられている。熱板175の内部には、例えば給電により発熱するヒータが設けられており、熱板175を所定の設定温度に調節できる。なお、この熱板175は、テンプレートTの上方、例えば後述する蓋体180の天井面に設けてもよい。また、テンプレートTの上方と下方に熱板175を設けてもよい。
A mounting table 171 on which the template T is mounted is provided on the bottom surface in the casing 170. Template T has a surface T 1 is placed on the top surface of the mounting table 171 to face upward. In the mounting table 171, elevating pins 172 for supporting the template T from below and elevating it are provided. The elevating pin 172 can be moved up and down by the elevating drive unit 173. A through hole 174 that penetrates the upper surface in the thickness direction is formed on the upper surface of the mounting table 171, and the elevating pin 172 is inserted through the through hole 174. A hot plate 175 for heating the template T is provided on the upper surface of the mounting table 171. Inside the hot plate 175, for example, a heater that generates heat by power feeding is provided, and the hot plate 175 can be adjusted to a predetermined set temperature. In addition, you may provide this hot platen 175 above the template T, for example, the ceiling surface of the cover body 180 mentioned later. Further, a hot plate 175 may be provided above and below the template T.
載置台171の上方には、上下動自在の蓋体180が設けられている。蓋体180は下面が開口しており、載置台171と一体となって処理室Kを形成する。蓋体180の上面中央部には、排気部181が設けられている。処理室K内の雰囲気は、排気部181から均一に排気される。
A lid body 180 that can move up and down is provided above the mounting table 171. The lid 180 has an open bottom surface and forms a processing chamber K together with the mounting table 171. An exhaust part 181 is provided at the center of the upper surface of the lid 180. The atmosphere in the processing chamber K is uniformly exhausted from the exhaust unit 181.
なお、加熱ユニット44、53、54の構成は、上述した加熱ユニット43の構成と同様であるので説明を省略する。
In addition, since the structure of the heating units 44, 53, and 54 is the same as the structure of the heating unit 43 mentioned above, description is abbreviate | omitted.
また、温度調節ユニット41、42、51、52の構成についても、上述した加熱ユニット43と同様の構成を有し、熱板175に代えて、温度調節板が用いられる。温度調節板の内部には、例えばペルチェ素子などの冷却部材が設けられており、温度調節板を設定温度に調節できる。また、この場合、加熱ユニット43における蓋体180を省略してもよい。
Also, the temperature control units 41, 42, 51, 52 have the same configuration as that of the heating unit 43 described above, and a temperature control plate is used instead of the hot plate 175. A cooling member such as a Peltier element is provided inside the temperature adjustment plate, and the temperature adjustment plate can be adjusted to a set temperature. In this case, the lid 180 in the heating unit 43 may be omitted.
以上のテンプレート処理装置1には、図1に示すように制御部200が設けられている。制御部200は、例えばコンピュータであり、プログラム格納部(図示せず)を有している。プログラム格納部には、搬入出ステーション2と処理ステーション3との間のテンプレートTの搬送や、処理ステーション3における駆動系の動作などを制御して、テンプレート処理装置1における後述するテンプレート処理を実行するプログラムが格納されている。なお、このプログラムは、例えばコンピュータ読み取り可能なハードディスク(HD)、フレキシブルディスク(FD)、コンパクトディスク(CD)、マグネットオプティカルデスク(MO)、メモリーカードなどのコンピュータに読み取り可能な記憶媒体に記録されていたものであって、その記憶媒体から制御部200にインストールされたものであってもよい。
In the template processing apparatus 1 described above, a control unit 200 is provided as shown in FIG. The control unit 200 is a computer, for example, and has a program storage unit (not shown). The program storage unit controls the transfer of the template T between the loading / unloading station 2 and the processing station 3, the operation of the drive system in the processing station 3, and the like, and executes template processing to be described later in the template processing apparatus 1. The program is stored. This program is recorded in a computer-readable storage medium such as a computer-readable hard disk (HD), flexible disk (FD), compact disk (CD), magnetic optical desk (MO), memory card, or the like. Or installed in the control unit 200 from the storage medium.
本実施の形態にかかるテンプレート処理装置1は以上のように構成されている。次に、そのテンプレート処理装置1で行われる離型剤を成膜する処理について説明する。図14は、このテンプレート処理の主な処理フローを示している。
The template processing apparatus 1 according to the present embodiment is configured as described above. Next, the process which forms the mold release agent performed in the template processing apparatus 1 will be described. FIG. 14 shows the main processing flow of this template processing.
先ず、テンプレート搬送体12によって、カセット載置台10上のカセットCからテンプレートTが取り出され、処理ステーション3のトランジションユニット21に搬送される(図14の工程A1)。このとき、カセットC内には、テンプレートTは、転写パターンCが形成された表面T1が上方を向くように収容されており、この状態でテンプレートTはトランジションユニット21に搬送される。
First, the template transport body 12 takes out the template T from the cassette C on the cassette mounting table 10 and transports it to the transition unit 21 of the processing station 3 (step A1 in FIG. 14). At this time, the cassette C, the template T, the surface T 1 of the transfer pattern C is formed is accommodated so as to face upward, the template T in this state is conveyed to the transition unit 21.
その後、搬送ユニット20によって、テンプレートTは、洗浄ユニット40に搬送され、チャック161に吸着保持される。続いて、チャック駆動部162によってテンプレートTをレール163に沿って移動させながら、紫外線照射部164から当該テンプレートTに紫外線が照射される。こうして、テンプレートTの表面T1全面に紫外線が照射され、テンプレートTの表面T1が洗浄される(図14の工程A2)。
Thereafter, the template T is transported to the cleaning unit 40 by the transport unit 20 and is sucked and held by the chuck 161. Subsequently, the template T is irradiated with ultraviolet rays from the ultraviolet irradiation unit 164 while moving the template T along the rails 163 by the chuck driving unit 162. Thus, ultraviolet light is irradiated on the surface T 1 the entire surface of the template T, the surface T 1 of the template T is cleaned (step A2 in FIG. 14).
その後、搬送ユニット20によって、テンプレートTは成膜ユニット30に搬送される。成膜ユニット30に搬送されたテンプレートTは、昇降ピン102に受け渡され、載置台101に載置される。続いて、離型剤供給部112をテンプレートTの辺方向に移動させながら、離型剤ノズル123から第2のローラ122に離型剤Sを供給する。離型剤ノズル123から第2のローラ122に供給された離型剤Sは、当該第2のローラ122から第1のローラ121に供給される。このとき、第1のローラ121と第2のローラ122が当接しているため、離型剤Sは薄く引き伸ばされる。そうすると、当該第1のローラ121の表面に所定の膜厚、例えば5nmで付着する。そして、離型剤供給部112の移動に伴い、第1のローラ121が回転しながらテンプレートTの転写パターンCにおける凸部C1の上面に当接する。こうして、第1のローラ121から転写パターンCの凸部C1上面に、離型剤Sが所定の膜厚、例えば5nmで塗布される。このとき、第1のローラ121は凸部C1上面のみに当接し、当該第1のローラ121の表面上の離型剤Sが微小な膜厚に調整されているため、離型剤Sが凸部C1上面以外の部分に塗布されることはない。
Thereafter, the template T is transported to the film forming unit 30 by the transport unit 20. The template T transported to the film forming unit 30 is transferred to the lifting pins 102 and placed on the placing table 101. Subsequently, the release agent S is supplied from the release agent nozzle 123 to the second roller 122 while moving the release agent supply unit 112 in the side direction of the template T. The release agent S supplied from the release agent nozzle 123 to the second roller 122 is supplied from the second roller 122 to the first roller 121. At this time, since the first roller 121 and the second roller 122 are in contact with each other, the release agent S is stretched thinly. Then, it adheres to the surface of the first roller 121 with a predetermined film thickness, for example, 5 nm. Then, with the movement of the release agent supply unit 112, the first roller 121 comes into contact with the upper surface of the convex portion C 1 of the transfer pattern C of the template T while rotating. Thus, the convex portion C 1 upper surface of the transfer pattern C from the first roller 121, the release agent S is coated by a predetermined thickness, for example, 5 nm. At this time, the first roller 121 abuts only on the convex portion C 1 top, since the release agent S on the surface of the first roller 121 is adjusted to small thickness, the release agent S is It will not be applied to portions other than the convex portion C 1 top.
また、離型剤供給部112を移動させながら、乾燥ノズル124から凸部C1の上面に気体を供給して、当該凸部C1上面の離型剤Sを乾燥させる。こうして、凸部C1上面に離型剤Sが成膜される(図14の工程A3)。
Further, while moving the release agent supply unit 112, the drying nozzle 124 by supplying gas to the upper surface of the convex portion C 1, drying the release agent S of the convex portion C 1 top. Thus, the release agent S is formed on the convex portion C 1 top (step A3 in FIG. 14).
その後、搬送ユニット20によって、テンプレートTは加熱ユニット43に搬送される。加熱ユニット43に搬入されたテンプレートTは、昇降ピン172に受け渡され、載置台171に載置される。続いて、蓋体180が閉じられ、テンプレートTは熱板175によって例えば200℃に加熱される。所定時間経過後、テンプレートT上の離型剤Sが焼成される(図14の工程A4)。
Thereafter, the template T is transported to the heating unit 43 by the transport unit 20. The template T carried into the heating unit 43 is transferred to the lift pins 172 and placed on the placement table 171. Subsequently, the lid 180 is closed, and the template T is heated to, for example, 200 ° C. by the hot plate 175. After a predetermined time has elapsed, the release agent S on the template T is baked (step A4 in FIG. 14).
その後、搬送ユニット20によって、テンプレートTは温度調節ユニット41に搬送され、テンプレートTが所定の温度に調節される。
Thereafter, the transport unit 20 transports the template T to the temperature adjustment unit 41, and the template T is adjusted to a predetermined temperature.
その後、搬送ユニット20によって、テンプレートTはリンスユニット31に搬送され、回転保持部材131に受け渡される。続いて、リンス液ノズル152をテンプレートTの中心部上方まで移動させると共に、テンプレートTを回転させる。そして、回転中のテンプレートT上にリンス液を供給し、遠心力によりリンス液をテンプレートT上で拡散させる。そうすると、離型剤Sの未反応部分のみが剥離する(図14の工程A5)。その後、リンス液の供給を停止した後、さらにテンプレートTを回転させ続け、その表面T1を振り切り乾燥させる。
Thereafter, the template T is transported to the rinse unit 31 by the transport unit 20 and transferred to the rotation holding member 131. Subsequently, the rinse liquid nozzle 152 is moved to above the center of the template T and the template T is rotated. Then, the rinse liquid is supplied onto the rotating template T, and the rinse liquid is diffused on the template T by centrifugal force. When it does so, only the unreacted part of the mold release agent S will peel (process A5 of FIG. 14). Then, after stopping the supply of the rinsing liquid, it continues to further rotate the template T, drying finishing off the surface T 1.
その後、搬送ユニット20によって、テンプレートTはトランジションユニット21に搬送され、テンプレート搬送体12によってカセットCに戻される(図14の工程A6)。こうしてテンプレート処理装置1における一連のテンプレート処理が終了し、テンプレートTの転写パターンCにおける凸部C1上面のみに離型剤Sが成膜される。
Thereafter, the template T is transported to the transition unit 21 by the transport unit 20 and returned to the cassette C by the template transport body 12 (step A6 in FIG. 14). Thus a series of template processing in template processing apparatus 1 is completed, the release agent S is deposited only on the convex portion C 1 upper surface in the transfer pattern C of the template T.
以上のように離型剤Sが成膜されたテンプレートTは、例えば図15及び図16に示すインプリントユニット210に搬送され、当該インプリントユニット210において、テンプレートTを用いてウェハW上にレジストパターンが形成される。
The template T on which the release agent S is formed as described above is conveyed to, for example, the imprint unit 210 shown in FIGS. 15 and 16, and a resist pattern is formed on the wafer W using the template T in the imprint unit 210. It is formed.
次に、かかるインプリントユニット210の構成について説明する。インプリントユニット210は、図15に示すように側面にテンプレートTの搬入出口(図示せず)とウェハWの搬入出口(図示せず)が形成されたケーシング211を有している。
Next, the configuration of the imprint unit 210 will be described. As shown in FIG. 15, the imprint unit 210 has a casing 211 in which a loading / unloading port (not shown) for the template T and a loading / unloading port (not shown) for the wafer W are formed on the side surfaces.
ケーシング211内の底面には、テンプレートTを保持するテンプレート保持部220が設けられている。テンプレート保持部220は、テンプレートTの裏面T2の外周部を吸着保持するチャック221を有している。チャック221は、当該チャック221の下方に設けられた移動機構222により、鉛直方向に移動自在で、且つ鉛直周りに回転自在になっている。これにより、テンプレートTは、後述するウェハ保持部240上のウェハWに対して所定の向きに回転し昇降できる。
A template holding unit 220 that holds the template T is provided on the bottom surface in the casing 211. Template holding portion 220, the outer peripheral portion of the rear surface T 2 of the template T has a chuck 221 for holding suction. The chuck 221 is movable in the vertical direction and rotatable around the vertical by a moving mechanism 222 provided below the chuck 221. Thus, the template T can be rotated up and down in a predetermined direction with respect to a wafer W on a wafer holding unit 240 described later.
テンプレート保持部220は、チャック221に保持されたテンプレートTの上方に設けられた光源223を有している。光源223からは、例えば可視光、近紫外光、紫外線などの光が発せられ、この光源223からの光は、テンプレートTを透過して上方に照射される。
The template holding unit 220 has a light source 223 provided above the template T held by the chuck 221. The light source 223 emits light such as visible light, near ultraviolet light, and ultraviolet light, and the light from the light source 223 is transmitted upward through the template T.
図16に示すようにテンプレート保持部220のX方向負方向(図16の下方向)側には、Y方向(図16の左右方向)に沿って延伸するレール230が設けられている。レール230は、例えばテンプレート保持部220のY方向負方向(図16の左方向)側の外方からY方向正方向(図16の右方向)側の外方まで形成されている。レール230には、アーム231が取り付けられている。
16, a rail 230 extending along the Y direction (left and right direction in FIG. 16) is provided on the negative side in the X direction (downward direction in FIG. 16) of the template holding unit 220. The rail 230 is formed, for example, from the outside of the template holding unit 220 on the Y direction negative direction (left direction in FIG. 16) to the outside on the Y direction positive direction (right direction in FIG. 16). An arm 231 is attached to the rail 230.
アーム231には、テンプレートT上にレジスト液を供給するレジスト液ノズル232が支持されている。レジスト液ノズル232は、例えばウェハWの直径寸法と同じかそれよりも長い、X方向に沿った細長形状を有している。レジスト液ノズル232には、例えばインクジェット方式のノズルが用いられ、レジスト液ノズル232の下部には、長手方向に沿って一列に形成された複数の供給口(図示せず)が形成されている。そして、レジスト液ノズル232は、レジスト液の供給タイミング、レジスト液の供給量等を厳密に制御できる。
The arm 231 supports a resist solution nozzle 232 that supplies a resist solution onto the template T. The resist solution nozzle 232 has, for example, an elongated shape along the X direction that is the same as or longer than the diameter dimension of the wafer W. For example, an ink jet type nozzle is used as the resist solution nozzle 232, and a plurality of supply ports (not shown) formed in a line along the longitudinal direction are formed below the resist solution nozzle 232. The resist solution nozzle 232 can strictly control the resist solution supply timing, the resist solution supply amount, and the like.
アーム231は、ノズル駆動部233により、レール230上を移動自在である。これにより、レジスト液ノズル232は、テンプレート保持部220のY方向正方向側の外方に設置された待機部234からテンプレート保持部220上のテンプレートTの上方まで移動でき、さらに当該テンプレートTの表面上をテンプレートTの辺方向に移動できる。また、アーム231は、ノズル駆動部233によって昇降自在であり、レジスト液ノズル232の高さを調整できる。
The arm 231 is movable on the rail 230 by the nozzle driving unit 233. Accordingly, the resist solution nozzle 232 can move from the standby unit 234 installed on the outer side of the template holding unit 220 on the Y direction positive direction side to above the template T on the template holding unit 220, and the surface of the template T The top can be moved in the side direction of the template T. The arm 231 can be moved up and down by a nozzle driving unit 233, and the height of the resist solution nozzle 232 can be adjusted.
ケーシング30内の天井面であって、テンプレート保持部220の上方には、図15に示すようにウェハWを保持するウェハ保持部240が設けられている。すなわち、テンプレート保持部220とウェハ保持部240は、テンプレート保持部220に保持されたテンプレートTと、ウェハ保持部240に載置されたウェハWとが対向するように配置されている。ウェハ保持部240は、ウェハWの被処理面が下方を向くように、当該ウェハWの裏面を吸着保持する。ウェハ保持部240は、当該ウェハ保持部240の上方に設けられた移動機構241によって水平方向に移動できるようになっている。
A wafer holding unit 240 that holds the wafer W as shown in FIG. 15 is provided on the ceiling surface in the casing 30 and above the template holding unit 220. That is, the template holding unit 220 and the wafer holding unit 240 are arranged so that the template T held by the template holding unit 220 and the wafer W placed on the wafer holding unit 240 face each other. The wafer holding unit 240 holds the back surface of the wafer W by suction so that the processing surface of the wafer W faces downward. The wafer holding unit 240 can be moved in the horizontal direction by a moving mechanism 241 provided above the wafer holding unit 240.
次に、以上のように構成されたインプリントユニット210で行われるインプリント処理について説明する。図17は、主な工程におけるテンプレートTとウェハWの状態を示している。
Next, an imprint process performed by the imprint unit 210 configured as described above will be described. FIG. 17 shows the state of the template T and the wafer W in the main process.
先ず、テンプレートTとウェハWがインプリントユニット210に搬入され、テンプレート保持部220とウェハ保持部240にそれぞれ吸着保持される。このとき、テンプレートT上には、その転写パターンCの凸部C1上面のみに離型剤Sが成膜されている。
First, the template T and the wafer W are carried into the imprint unit 210 and are sucked and held by the template holding unit 220 and the wafer holding unit 240, respectively. At this time, on the template T, release agent S is deposited only on the convex portion C 1 upper surface of the transfer pattern C.
その後、レジスト液ノズル232をテンプレートTの辺方向に移動させ、図17(a)に示すようにテンプレートT上にレジスト液を塗布し、塗布膜としてのレジスト膜Rを形成する。このとき、テンプレートTの転写パターンCの凹部C2に対応する部分(ウェハW上に形成されるレジストパターンPにおける凸部に対応する部分)に塗布されるレジスト液の量は多く、凸部C1に対応する部分(レジストパターンPにおける凹部に対応する部分)に塗布されるレジスト液の量は少なくなるように、テンプレートT上にレジスト液が塗布される。このように転写パターンCの開口率に応じてテンプレートT上にレジスト液が塗布される。
Thereafter, the resist solution nozzle 232 is moved in the side direction of the template T, and the resist solution is applied onto the template T as shown in FIG. 17A to form a resist film R as a coating film. At this time, the amount of the resist solution applied onto the recess C 2 portion corresponding to the transfer pattern C of the template T (portion corresponding to the convex portion of the resist pattern P formed on the wafer W) is often convex portion C The resist solution is applied onto the template T so that the amount of the resist solution applied to the portion corresponding to 1 (the portion corresponding to the recess in the resist pattern P) is reduced. In this way, a resist solution is applied on the template T in accordance with the aperture ratio of the transfer pattern C.
また、テンプレートTの転写パターンCには、その凸部C1上面のみに離型剤Sが成膜されているため、凸部C1上面は、凹部C2の内面に比して、レジスト液に対する接触角が大きくなる。このため、テンプレートT上に塗布されたレジスト液は、凹部C2に流入し易くなる。すなわち、凹部C2にレジスト液が隙間なく充填される。
Further, since the release agent S is formed only on the upper surface of the convex portion C 1 in the transfer pattern C of the template T, the upper surface of the convex portion C 1 is more resist resist than the inner surface of the concave portion C 2. The contact angle with respect to increases. Therefore, the resist solution applied on the template T is likely to flow into the concave portion C 2. Namely, the resist solution is filled without gaps in the recess C 2.
このようにテンプレートT上にレジスト膜Rが塗布されると、ウェハ保持部240に保持されたウェハWを水平方向の所定の位置に移動させて位置合わせを行うと共に、テンプレート保持部220に保持されたテンプレートTを所定の向きに回転させる。そして、図17(a)の矢印に示すようにテンプレートTをウェハW側に上昇させる。テンプレートTは所定の位置まで上昇し、テンプレートTの表面T1がウェハW上のレジスト膜Rに押し付けられる。続いて、光源223から光が照射される。光源223からの光は、図17(b)に示すようにテンプレートTを透過してウェハW上のレジスト膜Rに照射され、これによりレジスト膜Rは光重合する。このようにしてウェハW上のレジスト膜RにテンプレートTの転写パターンCが転写され、レジストパターンPが形成される。
When the resist film R is applied on the template T in this manner, the wafer W held on the wafer holding unit 240 is moved to a predetermined position in the horizontal direction to be aligned and held on the template holding unit 220. The template T is rotated in a predetermined direction. Then, the template T is raised to the wafer W side as indicated by the arrow in FIG. The template T rises to a predetermined position, and the surface T 1 of the template T is pressed against the resist film R on the wafer W. Subsequently, light is emitted from the light source 223. The light from the light source 223 passes through the template T as shown in FIG. 17B and is applied to the resist film R on the wafer W, whereby the resist film R is photopolymerized. In this way, the transfer pattern C of the template T is transferred to the resist film R on the wafer W, and a resist pattern P is formed.
その後、図17(c)に示すようにテンプレートTを下降させて、ウェハW上にレジストパターンPを形成する。このとき、テンプレートTの転写パターンCにおける凸部C1上面には離型剤Sが成膜されているので、ウェハW上のレジストがテンプレートTの表面T1に付着することはない。すなわち、発明者らによれば、凸部C1上面に離型剤Sが成膜されていれば、テンプレートTは十分に離型効果を発揮することが確認されている。なお、ウェハWをインプリントユニット210から搬出した後、図17(d)に示すようにウェハW上の残存膜Lを除去してもよい。こうしてインプリントユニット210におけるインプリント処理が終了し、ウェハW上に所定のレジストパターンPが形成される。
Thereafter, the template T is lowered as shown in FIG. 17C to form a resist pattern P on the wafer W. At this time, the convex portion C 1 is the top surface release agent S in the transfer pattern C of the template T is deposited, never resist on the wafer W adheres to the surface T 1 of the template T. That is, according to the inventors, if the release agent S on the convex portion C 1 upper surface long as it is deposited, the template T is able to exert a sufficient releasing effect has been confirmed. Note that after the wafer W is unloaded from the imprint unit 210, the remaining film L on the wafer W may be removed as shown in FIG. Thus, the imprint process in the imprint unit 210 is completed, and a predetermined resist pattern P is formed on the wafer W.
以上の実施の形態によれば、工程A3において転写パターンCの凸部C1上面のみに離型剤Sを成膜するので、この凸部C1上面は、転写パターンCの凹部C2の内面に比して、レジスト液に対する接触角が大きくなる。このため、テンプレートT上に塗布されたレジスト液は、転写パターンCの凹部C2に流入し易くなる。すなわち、凹部C2にレジスト液が隙間なく充填される。したがって、かかるテンプレートTを用いてウェハW上に所定のレジストパターンPを形成することができる。
According to the above embodiment, since the formation of the release agent S only the convex portion C 1 upper surface of the transfer pattern C in step A3, the convex portion C 1 upper surface, the inner surface of the concave portion C 2 of the transfer pattern C The contact angle with respect to the resist solution is larger than Therefore, the resist solution applied on the template T is likely to flow into the concave portion C 2 of the transfer pattern C. Namely, the resist solution is filled without gaps in the recess C 2. Therefore, a predetermined resist pattern P can be formed on the wafer W using the template T.
また、成膜ユニット30の離型剤供給部112には、第1のローラ121と第2のローラ122が当接して設けられているので、離型剤ノズル123から第2のローラ122に供給された離型剤Sは、当該第2のローラ122と第1のローラ121との間で薄く引き伸ばされる。そうすると、離型剤Sは、第1のローラ121の表面に所定の膜厚で付着する。これにより、第1のローラ121から転写パターンCの凸部C1上面に、離型剤Sを所定の膜厚で塗布することができる。
Further, since the first roller 121 and the second roller 122 are provided in contact with the release agent supply unit 112 of the film forming unit 30, the supply is performed from the release agent nozzle 123 to the second roller 122. The released release agent S is stretched thinly between the second roller 122 and the first roller 121. Then, the release agent S adheres to the surface of the first roller 121 with a predetermined film thickness. Accordingly, the convex portion C 1 upper surface of the transfer pattern C from the first roller 121 may be coated with a release agent S in a predetermined thickness.
また、第1のローラ121と乾燥ノズル124は同一の支持部材120に支持されているので、転写パターンCの凸部C1上面に塗布された離型剤Sを直ちに効率よく乾燥させることができる。
Further, the drying nozzle 124 and the first roller 121 can be dried the same because it is supported by the support member 120, immediately efficiently release agent S coated on the convex portion C 1 upper surface of the transfer pattern C .
さらに、一の支持部材120に、第1のローラ121、第2のローラ122、離型剤ノズル123、乾燥ノズル124が全て支持されているので、これらで構成される離型剤供給部112を効率よく移動させることができる。しかも、離型剤供給部112を移動させる移動機構は1つでよく、テンプレート処理装置1の製造コストを低廉化することができる。
Furthermore, since the first roller 121, the second roller 122, the release agent nozzle 123, and the drying nozzle 124 are all supported by one support member 120, the release agent supply unit 112 configured by these is provided. It can be moved efficiently. In addition, only one moving mechanism for moving the release agent supply unit 112 is required, and the manufacturing cost of the template processing apparatus 1 can be reduced.
また、工程A2においてテンプレートTの表面T1を洗浄しているので、その後工程S3においてテンプレートTの表面T1に離型剤Sを所定の膜厚で成膜することができる。なお、この工程A2は、テンプレートTの表面T1が予め十分に洗浄されている場合には省略してもよい。
Moreover, since cleaning the surface T 1 of the template T in step A2, it is possible to film the release agent S in a predetermined thickness on the surface T 1 of the template T in the subsequent step S3. Note that this step A2 may be omitted if the surface T 1 of the template T is prewashed thoroughly.
以上の実施の形態では、成膜ユニット30、32において、テンプレートTは載置台101上に載置されていたが、テンプレートTを保持できる構成であればこれに限定されない。例えば載置台101に代えて、リンスユニット31、33の回転保持部材131と同様の構成の回転保持部材を設けてもよい。かかる場合、昇降ピン102及び昇降駆動部103を省略できる。
In the above embodiment, in the film forming units 30 and 32, the template T is mounted on the mounting table 101. However, the present invention is not limited to this as long as the template T can be held. For example, instead of the mounting table 101, a rotation holding member having the same configuration as the rotation holding member 131 of the rinse units 31 and 33 may be provided. In such a case, the lifting pins 102 and the lifting drive unit 103 can be omitted.
以上の実施の形態では、成膜ユニット30、32において、載置台101の上方に離型剤供給部112が配置されていたが、載置台101と離型剤供給部112の配置を上下方向に反転させてもよい。かかる場合、載置台101は、テンプレートTの裏面T2を吸着保持する。そして、テンプレートTの下方から離型剤供給部112の第1のローラ121を転写パターンCの凸部C1上面に当接させ、当該凸部C1上面に離型剤Sを成膜する。
In the above embodiment, in the film forming units 30 and 32, the release agent supply unit 112 is arranged above the mounting table 101. However, the arrangement of the mounting table 101 and the release agent supply unit 112 is arranged in the vertical direction. It may be reversed. In such a case, the mounting table 101 suction-holds the rear surface T 2 of the template T. Then, the first roller 121 from below the template T releasing agent supply unit 112 is in contact with the convex portion C 1 upper surface of the transfer pattern C, and depositing the release agent S on the convex portion C 1 top.
以上の実施の形態では、リンスユニット31、33において、回転中のテンプレートT上にリンス液を供給して離型剤Sをリンスしていたが、例えばリンス液が貯留された浸漬層にテンプレートTを浸漬させて離型剤Sをリンスしてもよい。
In the above embodiment, the rinsing units 31 and 33 supply the rinsing liquid onto the rotating template T to rinse the release agent S. For example, the template T is applied to the immersion layer in which the rinsing liquid is stored. May be dipped to rinse the release agent S.
以上の実施の形態では、洗浄ユニット40、50において、テンプレートTを移動させながら、当該移動中のテンプレートTに紫外線を照射していたが、例えばテンプレートTの表面T1全面を覆う紫外線照射部を用いて、テンプレートTに紫外線を照射してもよい。この紫外線照射部は、テンプレートTに対向するように、当該テンプレートTの上方に配置される。かかる場合、一度の照射でテンプレートTの表面T1全面に紫外線を照射することができるので、テンプレートTの表面T1の洗浄を迅速に行うことができる。また、この場合、リンスユニット31、33と同様に、テンプレートTを回転させ、当該回転中のテンプレートTの表面T1全面に紫外線を照射してもよい。
In the above embodiment, in the cleaning unit 40 and 50, while moving the template T, had been irradiated with ultraviolet rays to the template T in the mobile, for example, an ultraviolet irradiation unit for covering the surface T 1 the entire surface of the template T The template T may be irradiated with ultraviolet rays. The ultraviolet irradiation unit is disposed above the template T so as to face the template T. In this case, it is possible to irradiate ultraviolet rays to the surface T 1 the entire surface of the template T by one irradiation, it is possible to clean the surface T 1 of the template T quickly. In this case, similarly to the rinsing unit 31 and 33, the template T is rotated, may be irradiated with ultraviolet rays to the surface T 1 entire template T in the rotation.
以上の実施の形態では、テンプレートT上への離型剤Sの成膜とテンプレートTの加熱は、それぞれ別の処理ユニット(成膜ユニット30、32と加熱ユニット43、44、53、54)で行われていたが、一の処理ユニットで行われてもよい。例えば成膜ユニット30、32の載置台101内に、熱板を設けられる。かかる場合、一の処理ユニットで離型剤Sの塗布とテンプレートTの加熱を連続して行うことができるので、テンプレート処理のスループットを向上させることができる。また、テンプレート処理装置1の構成を簡略化することもできる。
In the above embodiment, the film formation of the release agent S on the template T and the heating of the template T are performed in separate processing units ( film formation units 30 and 32 and heating units 43, 44, 53, and 54). Although it was performed, it may be performed by one processing unit. For example, a hot plate is provided in the mounting table 101 of the film forming units 30 and 32. In such a case, since the application of the release agent S and the heating of the template T can be continuously performed in one processing unit, the throughput of the template processing can be improved. In addition, the configuration of the template processing apparatus 1 can be simplified.
以上の実施の形態では、インプリントユニット210において、テンプレート保持部220はウェハ保持部240の下方に設けられていたが、テンプレート保持部220とウェハ保持部240の配置を上下方向に反転させてもよい。すなわち、テンプレート保持部220をケーシング211内の天井面に配置し、ウェハ保持部240をケーシング211内の底面に配置してもよい。かかる場合、ウェハ保持部240に載置されたウェハW上にレジスト液が供給されレジスト膜Rが形成された後、テンプレートTを保持したテンプレート保持部220を下降させる。そして、ウェハW上のレジスト膜RにテンプレートTの転写パターンCが転写され、レジストパターンPが形成される。
In the above embodiment, in the imprint unit 210, the template holding unit 220 is provided below the wafer holding unit 240. However, the arrangement of the template holding unit 220 and the wafer holding unit 240 may be reversed in the vertical direction. . That is, the template holding unit 220 may be arranged on the ceiling surface in the casing 211, and the wafer holding unit 240 may be arranged on the bottom surface in the casing 211. In such a case, after the resist solution is supplied onto the wafer W placed on the wafer holder 240 and the resist film R is formed, the template holder 220 holding the template T is lowered. Then, the transfer pattern C of the template T is transferred to the resist film R on the wafer W, and a resist pattern P is formed.
以上の実施の形態では、インプリントユニット210においてテンプレートT上にレジスト液を塗布していたが、上述した成膜ユニット30、32においてレジスト液を塗布してもよい。かかる場合、離型剤供給部112にレジスト液を供給するレジスト液ノズルが設けられる。そして、離型剤Sとレジスト膜Rが形成されたテンプレートTをインプリント210に搬送し、当該インプリントユニット210においてウェハW上のレジスト膜RにテンプレートTの転写パターンCが転写され、レジストパターンPが形成される。
In the above embodiment, the resist solution is applied on the template T in the imprint unit 210. However, the resist solution may be applied in the film forming units 30 and 32 described above. In such a case, a resist solution nozzle that supplies the resist solution to the release agent supply unit 112 is provided. Then, the template T on which the release agent S and the resist film R are formed is conveyed to the imprint 210, and the transfer pattern C of the template T is transferred to the resist film R on the wafer W in the imprint unit 210. Is formed.
以上の実施の形態では、インプリントユニット210とテンプレート処理装置1は別々に設けられていたが、これらを一のシステム内に配置してもよい。かかる場合、テンプレート処理装置1におけるテンプレート処理とインプリントユニット210におけるインプリント処理を連続して行うことができるので、これら処理のスループットを向上させることができる。
In the above embodiment, the imprint unit 210 and the template processing apparatus 1 are provided separately, but they may be arranged in one system. In such a case, since the template processing in the template processing apparatus 1 and the imprint processing in the imprint unit 210 can be performed continuously, the throughput of these processes can be improved.
以上の実施の形態の成膜ユニット30、32において、離型剤供給部112の構成は上記実施の形態に限定されず、種々の構成を採ることができる。
In the film forming units 30 and 32 of the above embodiment, the configuration of the release agent supply unit 112 is not limited to the above embodiment, and various configurations can be adopted.
例えば図18に示すように、離型剤供給部112の乾燥ノズル124は、転写パターンCの凸部C1上面に塗布された離型剤Sの周囲の雰囲気を吸引してもよい。かかる場合、凸部C1上面の離型剤Sに上向きの力が作用するため、当該離型剤Sが凹部C2に流入するのを確実に抑制できる。したがって、より確実に凸部C1上面のみに離型剤Sを成膜することができる。
For example, as shown in FIG. 18, the drying nozzle 124 of the release agent supply unit 112, the surrounding atmosphere of the convex portion C 1 top release agent is applied to the S of the transfer pattern C may be aspirated. In this case, since the upward force on the release agent S of the convex portion C 1 top acts, the release agent S can be reliably prevented from flowing into the recess C 2. Therefore, it is possible to form a release agent S only more reliable protrusions C 1 top.
また、例えば離型剤供給部112において、第2のローラ122を省略し、図19に示すように第1のローラ121のみを設けてもよい。かかる場合、離型剤ノズル123から第1のローラ121に離型剤Sが供給される。そして、離型剤ノズル123からの離型剤Sの供給量を制御することによって、第1のローラ121の表面に離型剤Sが所定の膜厚で付着する。したがって、成膜ユニット30、32の装置構成を簡略化できると共に、その製造コストを低廉化することができる。
Further, for example, in the release agent supply unit 112, the second roller 122 may be omitted, and only the first roller 121 may be provided as shown in FIG. In such a case, the release agent S is supplied from the release agent nozzle 123 to the first roller 121. Then, by controlling the supply amount of the release agent S from the release agent nozzle 123, the release agent S adheres to the surface of the first roller 121 with a predetermined film thickness. Therefore, the apparatus configuration of the film forming units 30 and 32 can be simplified and the manufacturing cost can be reduced.
また、上記実施の形態の離型剤供給部112では第1のローラ121表面(周面)に液体状の離型剤Sを付着させていたが、図20に示すようにローラ300の表面(周面)に、乾燥して固化した離型剤Sを付着させてもよい。ローラ300は、支持部材120に支持されている。かかる場合、例えば図6に示した待機部114においてローラ300に液体状の離型剤Sを付着させ、その後離型剤Sを乾燥させる。そして、図20に示すようにローラ300が転写パターンCの凸部C1上面に当接した状態で、ローラ300をテンプレートTの辺方向に移動させる。そうすると、ローラ300が凸部C1上で回転し、ローラ300の表面の離型剤Sが凸部C1上面に転写される。このとき、離型剤Sは乾燥しているので、所定の膜厚で凸部C1上面に転写される。この例によれば、凸部C1上面上の離型剤Sを乾燥させる必要がないので、既述の実施の形態の離型剤供給部112において乾燥ノズル124を省略できる。したがって、成膜ユニット30、32の装置構成を簡略化できると共に、その製造コストを低廉化することができる。
Further, in the release agent supply unit 112 of the above embodiment, the liquid release agent S is attached to the surface (circumferential surface) of the first roller 121, but as shown in FIG. A mold release agent S that has been dried and solidified may be adhered to the peripheral surface. The roller 300 is supported by the support member 120. In such a case, for example, the liquid release agent S is attached to the roller 300 in the standby unit 114 shown in FIG. 6, and then the release agent S is dried. In a state where the roller 300 as shown in FIG. 20 in contact with the convex portion C 1 upper surface of the transfer pattern C, to move the roller 300 in the side direction of the template T. Then, the roller 300 is rotated on the convex portion C 1, the release agent S on the surface of the roller 300 is transferred to the convex portion C 1 top. In this case, the release agent S is so dry, are transferred to the convex portion C 1 upper surface at a predetermined thickness. According to this example, since no release agent S on the convex portion C 1 upper surface must be dried, it can be omitted drying nozzle 124 in the release agent supply unit 112 of the embodiment described above. Therefore, the apparatus configuration of the film forming units 30 and 32 can be simplified and the manufacturing cost can be reduced.
また、以上の実施の形態では、ローラ121、122、300を用いて転写パターンCの凸部C1上面に離型剤Sを塗布していたが、図21に示すように表面に離型剤Sが付着した塗布プレート310を用いてもよい。塗布プレート310は、テンプレートTの少なくとも転写パターンCを覆う形状を有している。そして、昇降機構(図示せず)によって塗布プレート310をテンプレートT側に下降させ、当該塗布プレート310の表面を凸部C1上面に当接させる。そうすると、凸部C1上面に離型剤Sが塗布される。なお、塗布プレート310の表面に付着される離型剤Sは、液体状であってもよいし、あるいは乾燥して固化していてもよい。離型剤Sが液体状である場合、塗布プレート310を用いて凸部C1の上面に離型剤Sを塗布した後、当該離型剤Sを、例えば気体によって乾燥させる。
Further, in the above embodiment, although the release agent S on the convex portion C 1 upper surface of the transfer pattern C using rollers 121,122,300 was applied, release agent on the surface as shown in FIG. 21 An application plate 310 to which S is attached may be used. The application plate 310 has a shape that covers at least the transfer pattern C of the template T. Then, by the elevating mechanism (not shown) to lower the applied plate 310 to the template T side, it is brought into contact with the surface of the coating plate 310 to the convex portion C 1 top. Then, the release agent S is coated on the convex portion C 1 top. The release agent S attached to the surface of the coating plate 310 may be in a liquid form or may be dried and solidified. If the release agent S is a liquid, after application of the release agent S on the upper surface of the convex portion C 1 using a coating plate 310, the release agent S, is dried by, for example, gas.
以上の実施の形態では、工程A3において凸部C1上面に離型剤Sを成膜した後、工程A4において離型剤Sを加熱して焼成していたが、当該離型剤Sを焼成する代わりにアルコール処理してもよい。
In the above embodiment, after forming a release agent S on the convex portion C 1 upper surface in step A3, it had been calcined by heating the release agent S in step A4, firing the release agent S Alternatively, alcohol treatment may be performed.
かかる場合、図22に示すようにテンプレート処理装置1の第1の処理ブロックG1及び第2の処理ブロックG2には、例えばリンスユニット31、33に代えて、後処理ユニット400、401が配置される。この後処理ユニット400、401では、成膜ユニット30、32で凸部C1上面に成膜された離型剤Sにアルコールを供給して、凸部C1上面と離型剤Sとの密着性を向上させ、その後、アルコールが供給された離型剤Sをリンスして、当該離型剤Sの未反応部を除去する。また、図23に示すように第3の処理ブロックG3及び第4の処理ブロックG4では、加熱ユニット43、44、53、54と温度調節ユニット41、42、51、52を省略し、洗浄ユニット40、50をそれぞれ2段に重ねて配置する。
In this case, as shown in FIG. 22, post-processing units 400 and 401 are arranged in the first processing block G1 and the second processing block G2 of the template processing apparatus 1 in place of the rinse units 31 and 33, for example. . In the post-processing unit 400 and 401, and supplies the alcohol to the convex portion C 1 release agent is deposited on the upper surface S in the film forming unit 30 and 32, the adhesion between the convex portion C 1 top and a release agent S Thereafter, the release agent S supplied with alcohol is rinsed to remove unreacted portions of the release agent S. Further, as shown in FIG. 23, in the third processing block G3 and the fourth processing block G4, the heating units 43, 44, 53, 54 and the temperature control units 41, 42, 51, 52 are omitted, and the cleaning unit 40 is used. , 50 are arranged in two stages.
次に、後処理ユニット400、401の構成について説明する。後処理ユニット400は、図24に示すように側面にテンプレートTの搬入出口(図示せず)が形成されたケーシング410を有している。
Next, the configuration of the post-processing units 400 and 401 will be described. As shown in FIG. 24, the post-processing unit 400 includes a casing 410 having a loading / unloading port (not shown) for the template T formed on the side surface.
ケーシング410内の中央部には、テンプレートTを保持して回転させる回転保持部材411が設けられている。回転保持部材411の構成は、上記実施の形態の図8及び図9に示した回転保持部材131の構成と同様であるので説明を省略する。
A rotation holding member 411 that holds and rotates the template T is provided at the center of the casing 410. The configuration of the rotation holding member 411 is the same as the configuration of the rotation holding member 131 shown in FIGS.
回転保持部材411は、図24に示すようにカバー体412に取り付けられ、回転保持部材411の下方には、シャフト413を介して回転駆動部414が設けられている。この回転駆動部414により、回転保持部材411は鉛直周りに所定の速度で回転でき、且つ昇降できる。
The rotation holding member 411 is attached to the cover body 412 as shown in FIG. 24, and a rotation driving unit 414 is provided below the rotation holding member 411 via a shaft 413. By this rotation drive unit 414, the rotation holding member 411 can rotate at a predetermined speed around the vertical and can move up and down.
回転保持部材411の周囲には、テンプレートTから飛散又は落下するアルコール又はリンス液を受け止め、回収するカップ420が設けられている。カップ420の下面には、回収したアルコール又はリンス液を排出する排出管421と、カップ420内の雰囲気を排気する排気管422が接続されている。
Around the rotation holding member 411, there is provided a cup 420 that receives and collects alcohol or rinsing liquid scattered or dropped from the template T. A lower surface of the cup 420 is connected to a discharge pipe 421 for discharging the collected alcohol or rinsing liquid and an exhaust pipe 422 for exhausting the atmosphere in the cup 420.
図25に示すようにカップ420のX方向負方向(図25の下方向)側には、Y方向(図25の左右方向)に沿って延伸するレール430が形成されている。レール430は、例えばカップ420のY方向負方向(図25の左方向)側の外方からY方向正方向(図25の右方向)側の外方まで形成されている。レール430には、例えば2本のアーム431、432が取り付けられている。
25, a rail 430 extending along the Y direction (left-right direction in FIG. 25) is formed on the X direction negative direction (downward direction in FIG. 25) side of the cup 420. As shown in FIG. The rail 430 is formed, for example, from the outside of the cup 420 in the Y direction negative direction (left direction in FIG. 25) to the outside in the Y direction positive direction (right direction in FIG. 25). For example, two arms 431 and 432 are attached to the rail 430.
第1のアーム431には、テンプレートT上の離型剤Sに常温のアルコール、例えばエタノールを供給するアルコールノズル433が支持されている。第1のアーム431は、ノズル駆動部434により、レール430上を移動自在である。これにより、アルコールノズル433は、カップ420のY方向正方向側の外方に設置された待機部435からカップ420内のテンプレートTの中心部上方まで移動できる。また、第1のアーム431は、ノズル駆動部434によって昇降自在であり、アルコールノズル433の高さを調整できる。なお、アルコールはアルコール類であればよく、エタノール以外の他のアルコールを用いてもよい。例えばメタノール、プローパノール、ブタノール、ペンタノール、ヘキサノール、ヘプタノールを用いてもよく、あるいはこれらのアルコールの混合物を用いてもよい。また、アルコールの濃度は特に限定されないが、100%であることが好ましい。また、本実施の形態では常温のアルコールを用いているが、アルコールが結露するのを抑制するため、例えば70℃以下に加熱したアルコールを用いてもよい。さらに、本実施の形態では液体状のアルコールを用いているが、気体状のアルコールを用いてもよい。
The first arm 431 supports an alcohol nozzle 433 that supplies normal temperature alcohol, for example ethanol, to the release agent S on the template T. The first arm 431 is movable on the rail 430 by the nozzle driving unit 434. As a result, the alcohol nozzle 433 can move from the standby portion 435 installed outside the cup 420 on the Y direction positive direction side to above the center portion of the template T in the cup 420. The first arm 431 can be moved up and down by a nozzle driving unit 434, and the height of the alcohol nozzle 433 can be adjusted. In addition, alcohol should just be alcohols and you may use alcohol other than ethanol. For example, methanol, propanol, butanol, pentanol, hexanol, heptanol may be used, or a mixture of these alcohols may be used. The concentration of alcohol is not particularly limited, but is preferably 100%. Moreover, although normal temperature alcohol is used in this Embodiment, in order to suppress condensation of alcohol, you may use alcohol heated, for example to 70 degrees C or less. Furthermore, although liquid alcohol is used in the present embodiment, gaseous alcohol may be used.
第2のアーム432には、テンプレートT上にリンス液、例えば離型剤Sの有機溶剤を供給するリンス液ノズル440が支持されている。第2のアーム432は、ノズル駆動部441によってレール430上を移動自在である。これにより、リンス液ノズル440は、カップ420のY方向負方向側の外方に設けられた待機部442からカップ420内のテンプレートTの中心部上方まで移動できる。また、第2のアーム432は、ノズル駆動部441によって昇降自在であり、リンス液ノズル440の高さを調節できる。
The second arm 432 supports a rinsing liquid nozzle 440 that supplies a rinsing liquid, for example, an organic solvent of the release agent S, onto the template T. The second arm 432 is movable on the rail 430 by the nozzle driving unit 441. Thereby, the rinsing liquid nozzle 440 can move from the standby portion 442 provided on the outer side of the cup 420 on the Y direction negative direction side to above the center portion of the template T in the cup 420. The second arm 432 can be moved up and down by the nozzle driving unit 441, and the height of the rinsing liquid nozzle 440 can be adjusted.
なお、以上の構成では、アルコールノズル433とリンス液ノズル440が別々のアーム431、432に支持されていたが、同じアームに支持され、そのアームの移動の制御により、アルコールノズル433とリンス液ノズル440の移動と供給タイミングを制御してもよい。
In the above configuration, the alcohol nozzle 433 and the rinsing liquid nozzle 440 are supported by separate arms 431 and 432. However, the alcohol nozzle 433 and the rinsing liquid nozzle are supported by the same arm and controlled by movement of the arms. The movement and supply timing of 440 may be controlled.
なお、後処理ユニット401の構成は、上述した後処理ユニット400の構成と同様であるので説明を省略する。
Note that the configuration of the post-processing unit 401 is the same as the configuration of the post-processing unit 400 described above, and a description thereof will be omitted.
本実施の形態にかかるテンプレート処理装置1は以上のように構成されている。次に、そのテンプレート処理装置1で行われる離型剤を成膜する処理について説明する。図26は、このテンプレート処理の主な処理フローを示している。
The template processing apparatus 1 according to the present embodiment is configured as described above. Next, the process which forms the mold release agent performed in the template processing apparatus 1 will be described. FIG. 26 shows the main processing flow of this template processing.
先ず、テンプレート搬送体12によって、搬入出ステーション2から処理ステーション3にテンプレートTが搬送される(図26の工程B1)。その後、洗浄ユニット40において、テンプレートTの表面T1の洗浄(図26の工程B2)が行われた後、成膜ユニット30において。テンプレートTの成膜(図26の工程B3)行われる。なお、これら工程B1~B3は、上記実施の形態における工程A1~A3と同様であるので詳細な説明を省略する。
First, the template T is transferred from the loading / unloading station 2 to the processing station 3 by the template transfer body 12 (step B1 in FIG. 26). Thereafter, in the cleaning unit 40, after the cleaning of the surface T 1 of the template T (step B2 in FIG. 26) is performed, in the film deposition unit 30. The template T is formed (step B3 in FIG. 26). Since these steps B1 to B3 are the same as the steps A1 to A3 in the above embodiment, a detailed description thereof is omitted.
その後、搬送ユニット20によって、テンプレートTは後処理ユニット400に搬送され、回転保持部材411に受け渡される。続いて、第1のアーム431によりアルコールノズル433をテンプレートTの中心部上方まで移動させると共に、テンプレートTを回転させる。そして、回転中のテンプレートT上にアルコールを供給し、遠心力によりアルコールをテンプレートT上で拡散させる(図26の工程B4)。そうすると、テンプレートT上のアルコールによって、離型剤SがテンプレートTの表面T1と強固且つ密に化学反応し、当該テンプレートTの表面T1に離型剤Sが密着する。
Thereafter, the template T is transported to the post-processing unit 400 by the transport unit 20 and transferred to the rotation holding member 411. Subsequently, the alcohol nozzle 433 is moved above the center of the template T by the first arm 431 and the template T is rotated. Then, alcohol is supplied onto the rotating template T, and the alcohol is diffused on the template T by centrifugal force (step B4 in FIG. 26). Then, the alcohol on the template T, the release agent S is firmly and closely chemically react with the surface T 1 of the template T, release agent S is brought into close contact with the surface T 1 of the said template T.
その後、アルコールノズル433からのアルコールの供給を停止すると共に、テンプレートTをさらに回転させる。このテンプレートTの回転により、当該テンプレートT上のアルコールを乾燥させて除去する(図26の工程B5)。このようにアルコールを乾燥させている間に、アルコールノズル433がテンプレートTの中心部上方から移動すると共に、第2のアーム432により待機部442のリンス液ノズル440がテンプレートTの中心部上方まで移動する。
Thereafter, the supply of alcohol from the alcohol nozzle 433 is stopped, and the template T is further rotated. By the rotation of the template T, the alcohol on the template T is dried and removed (step B5 in FIG. 26). While the alcohol is being dried in this way, the alcohol nozzle 433 moves from above the center of the template T, and the second arm 432 moves the rinse liquid nozzle 440 of the standby unit 442 to above the center of the template T. To do.
テンプレートT上のアルコールが乾燥すると、引き続きテンプレートTを回転させると共に、回転中のテンプレートT上にリンス液ノズル440からリンス液を供給する。リンス液は、遠心力によりテンプレートT上を拡散する。このリンス液によって、離型剤Sの未反応部分のみが剥離する(図26の工程B6)。その後、リンス液の供給を停止した後、さらにテンプレートTを回転させ続け、その表面T1を振り切り乾燥させる。
When the alcohol on the template T is dried, the template T is continuously rotated, and the rinse liquid is supplied from the rinse liquid nozzle 440 onto the rotating template T. The rinse liquid diffuses on the template T by centrifugal force. Only the unreacted portion of the release agent S is peeled off by this rinsing liquid (step B6 in FIG. 26). Then, after stopping the supply of the rinsing liquid, it continues to further rotate the template T, drying finishing off the surface T 1.
その後、搬送ユニット20によって、テンプレートTはトランジションユニット21に搬送され、テンプレート搬送体12によってカセットCに戻される(図26の工程B7)。こうしてテンプレート処理装置1における一連のテンプレート処理が終了し、テンプレートTの転写パターンCにおける凸部C1上面のみに離型剤Sが成膜される。
Thereafter, the template T is transported to the transition unit 21 by the transport unit 20 and returned to the cassette C by the template transport body 12 (step B7 in FIG. 26). Thus a series of template processing in template processing apparatus 1 is completed, the release agent S is deposited only on the convex portion C 1 upper surface in the transfer pattern C of the template T.
以上の実施の形態によれば、工程B4においてテンプレートT上の離型剤Sにアルコールを塗布しているので、テンプレートTの表面T1と離型剤Sとの化学反応が促進され、当該テンプレートTの表面T1と離型剤Sの密着性が向上する。すなわち、テンプレートTの表面T1に離型剤Sを短時間で密着させることができる。これによって、テンプレート処理のスループットをさらに向上させることができる。
According to the above embodiment, since the alcohol was applied to the release agent S on the template T in step B4, the chemical reaction between the surface T 1 and the release agent S of the template T is promoted, the template The adhesion between the surface T 1 of T and the release agent S is improved. In other words, it can be brought into close contact with the surface T 1 of the template T of the release agent S in a short time. Thereby, the throughput of template processing can be further improved.
また、工程B4においてテンプレートTの表面T1に離型剤Sが密着するので、当該テンプレートT上の離型剤Sの接触角を所定の角度、例えば110度程度にすることができる。これによって、離型剤Sはレジスト膜に対して十分な撥液性を有し、その離型機能を発揮することができる。
Further, since the release agent S on the surface T 1 of the template T in the step B4 to adhesion, the predetermined angle and the contact angle of the release agent S on the template T, can be for example, about 110 degrees. Thereby, the release agent S has sufficient liquid repellency with respect to the resist film, and can exhibit its release function.
また、工程B4と工程B5、すなわちアルコールの塗布及び乾燥とリンス液の塗布及び乾燥を一の後処理ユニット400で行っているので、効率よくアルコール処理とリンス処理を行えると共に、テンプレート処理装置1を小型化でき、その製造コストを低廉化することができる。
In addition, since the process B4 and the process B5, that is, the application and drying of the alcohol and the application and drying of the rinse liquid are performed in one post-processing unit 400, the alcohol processing and the rinsing process can be performed efficiently, and the template processing apparatus 1 The size can be reduced, and the manufacturing cost can be reduced.
以上の実施の形態では、テンプレートT上への離型剤Sの成膜と、離型剤Sのアルコール処理及びリンス処理は、それぞれ別の処理ユニット(成膜ユニット30、32と後処理ユニット400、401)で行われていたが、一の処理ユニットで行われてもよい。
In the above embodiment, the film formation of the release agent S on the template T and the alcohol treatment and the rinsing treatment of the release agent S are performed in separate processing units (the film formation units 30 and 32 and the post-processing unit 400, respectively). 401), it may be performed by one processing unit.
例えば図27に示すように、上述の処理ユニットである成膜ユニット500は、図24及び図25で示した後処理ユニット400のケーシング410内に、図4及び図6に示した離型剤供給部112を配置した構成を有している。離型剤供給部112は、図27に示すように、第3のアーム501に支持されている。第3のアーム501は、駆動部502により、レール430上を移動自在である。これにより、離型剤供給部112は、待機部442のY方向負方向(図27の左方向)側の外方に設置された待機部503から、カップ420内のテンプレートTの中心部上方まで移動できる。また、第3のアーム501は、駆動部502によって昇降自在であり、離型剤供給部112の高さを調整できる。さらに、待機部435とカップ420との間に待機部504が設置され、リンス液ノズル440は待機部442から、カップ420内のテンプレートTの中心部上方を通り、待機部504まで移動できる。なお、成膜ユニット500のその他の構成については、後処理ユニット400の構成と同様であるので説明を省略する。また、以上の構成では、離型剤供給部112は第3のアーム501に支持されていたが、アルコールノズル433とリンス液ノズル440と共に同じアームに支持されてもよい。
For example, as shown in FIG. 27, the film forming unit 500, which is the above-described processing unit, supplies the release agent shown in FIGS. 4 and 6 into the casing 410 of the post-processing unit 400 shown in FIGS. The portion 112 is arranged. The release agent supply unit 112 is supported by the third arm 501 as shown in FIG. The third arm 501 is movable on the rail 430 by the drive unit 502. Thereby, the release agent supply unit 112 extends from the standby unit 503 installed on the outer side of the standby unit 442 in the negative Y direction (left direction in FIG. 27) to above the center of the template T in the cup 420. I can move. Further, the third arm 501 can be raised and lowered by the drive unit 502, and the height of the release agent supply unit 112 can be adjusted. Further, a standby unit 504 is installed between the standby unit 435 and the cup 420, and the rinse liquid nozzle 440 can move from the standby unit 442 to the standby unit 504 through the center of the template T in the cup 420. The other configuration of the film forming unit 500 is the same as the configuration of the post-processing unit 400, and thus the description thereof is omitted. In the above configuration, the release agent supply unit 112 is supported by the third arm 501, but may be supported by the same arm together with the alcohol nozzle 433 and the rinse liquid nozzle 440.
なお、成膜ユニット500で行われるテンプレートT上への離型剤Sの成膜と、テンプレートT上の離型剤Sのアルコール処理及びリンス処理は、上記実施の形態の工程B3~B6と同様であるので説明を省略する。
The film formation of the release agent S on the template T performed in the film formation unit 500 and the alcohol treatment and the rinsing treatment of the release agent S on the template T are the same as the steps B3 to B6 of the above embodiment. Therefore, explanation is omitted.
かかる場合、工程B3~工程B6を一の成膜ユニット500で行っているので、効率よく離型剤Sの成膜処理、アルコール処理及びリンス処理を行うことができる。しかも、テンプレート処理装置1を小型化でき、その製造コストを低廉化することができる。
In such a case, since the process B3 to the process B6 are performed by the single film forming unit 500, the film forming process, the alcohol process, and the rinsing process of the release agent S can be performed efficiently. Moreover, the template processing apparatus 1 can be reduced in size, and the manufacturing cost can be reduced.
なお、以上の実施の形態において、テンプレートTの転写パターンCにおける凸部C1上面に成膜された離型剤Sに対して、光を照射してもよい。離型剤Sに照射する光の波長は、例えば350nm~2500nmが好ましい。発明者が調べたところ、かかる波長の光を離型剤Sに照射すると、テンプレートTの表面T1と離型剤Sの化学結合を促進させることができ、テンプレートTの表面T1と離型剤Sとの密着性が向上することが分かった。すなわち、上述したアルコールによるテンプレートTの表面T1と離型剤Sの化学結合をさらに促進させることができ、より短時間でテンプレートTの表面T1に離型剤Sを密着させることができる。
Incidentally, in the above embodiment, with respect to the release agent S which is formed in the convex portion C 1 upper surface in the transfer pattern C of the template T, it may be irradiated with light. The wavelength of the light applied to the release agent S is preferably, for example, 350 nm to 2500 nm. When the inventors have examined, is irradiated with light of such wavelengths release agent S, it is possible to accelerate the chemical bonding of the surface T 1 and the release agent S of the template T, the surface T 1 and the release of the template T It was found that the adhesion with the agent S was improved. That is, the chemical bonding between the surface T 1 of the template T and the release agent S by the alcohol described above can be further promoted, and the release agent S can be brought into close contact with the surface T 1 of the template T in a shorter time.
以上、添付図面を参照しながら本発明の好適な実施の形態について説明したが、本発明はかかる例に限定されない。当業者であれば、特許請求の範囲に記載された思想の範疇内において、各種の変更例または修正例に想到し得ることは明らかであり、それらについても当然に本発明の技術的範囲に属するものと了解される。本発明はこの例に限らず種々の態様を採りうるものである。本発明は、基板がウェハ以外のFPD(フラットパネルディスプレイ)、フォトマスク用のマスクレチクルなどの他の基板である場合にも適用できる。
The preferred embodiments of the present invention have been described above with reference to the accompanying drawings, but the present invention is not limited to such examples. It is obvious for those skilled in the art that various modifications or modifications can be conceived within the scope of the idea described in the claims, and these naturally belong to the technical scope of the present invention. It is understood. The present invention is not limited to this example and can take various forms. The present invention can also be applied to a case where the substrate is another substrate such as an FPD (flat panel display) other than a wafer or a mask reticle for a photomask.
1 テンプレート処理装置
30、32 成膜ユニット
31、33 リンスユニット
40、50 洗浄ユニット
43、44、53、54 加熱ユニット
110 レール
111 アーム
112 離型剤供給部
113 駆動部
120 支持部材
121 第1のローラ
122 第2のローラ
123 離型剤ノズル
124 乾燥ノズル
200 制御部
210 インプリントユニット
300 ローラ
310 塗布プレート
400、401 後処理ユニット
411 回転保持部材
433 アルコールノズル
440 リンス液ノズル
500 成膜ユニット
C 転写パターン
C1 凸部
C2 凹部
P レジストパターン
R レジスト膜
S 離型剤
T テンプレート
W ウェハ DESCRIPTION OFSYMBOLS 1 Template processing apparatus 30, 32 Film-forming unit 31, 33 Rinse unit 40, 50 Cleaning unit 43, 44, 53, 54 Heating unit 110 Rail 111 Arm 112 Release agent supply part 113 Drive part 120 Support member 121 1st roller 122 Second roller 123 Release agent nozzle 124 Drying nozzle 200 Control unit 210 Imprint unit 300 Roller 310 Application plate 400, 401 Post-processing unit 411 Rotation holding member 433 Alcohol nozzle 440 Rinse liquid nozzle 500 Film formation unit C Transfer pattern C 1 Convex part C 2 concave part P Resist pattern R Resist film S Release agent T Template W Wafer
30、32 成膜ユニット
31、33 リンスユニット
40、50 洗浄ユニット
43、44、53、54 加熱ユニット
110 レール
111 アーム
112 離型剤供給部
113 駆動部
120 支持部材
121 第1のローラ
122 第2のローラ
123 離型剤ノズル
124 乾燥ノズル
200 制御部
210 インプリントユニット
300 ローラ
310 塗布プレート
400、401 後処理ユニット
411 回転保持部材
433 アルコールノズル
440 リンス液ノズル
500 成膜ユニット
C 転写パターン
C1 凸部
C2 凹部
P レジストパターン
R レジスト膜
S 離型剤
T テンプレート
W ウェハ DESCRIPTION OF
Claims (19)
- 基板上に形成される塗布膜に転写パターンを転写して当該塗布膜に所定のパターンを形成するために用いられ、かつ表面に凹凸形状の転写パターンが形成されたテンプレート上に、離型剤を成膜するテンプレート処理方法において、
前記転写パターンの凸部の上面のみに離型剤を成膜する。 A mold release agent is applied to a template having a concavo-convex transfer pattern formed on the surface thereof, which is used to transfer a transfer pattern to a coating film formed on a substrate to form a predetermined pattern on the coating film. In the template processing method for film formation,
A release agent is formed only on the upper surface of the convex portion of the transfer pattern. - 請求項1に記載のテンプレート処理方法において、
前記凸部上面に離型剤を成膜する際、前記凸部上面に液体状の離型剤を供給し、その後前記離型剤に気体を供給し、当該離型剤を乾燥させる。 The template processing method according to claim 1,
When a release agent is formed on the upper surface of the convex portion, a liquid release agent is supplied to the upper surface of the convex portion, and then a gas is supplied to the release agent to dry the release agent. - 請求項1に記載のテンプレート処理方法において、
前記凸部上面に離型剤を成膜する際、前記凸部上面に液体状の離型剤を供給し、その後前記離型剤の周囲の雰囲気を吸引し、当該離型剤を乾燥させる。 The template processing method according to claim 1,
When a release agent is formed on the upper surface of the convex portion, a liquid release agent is supplied to the upper surface of the convex portion, and then the atmosphere around the release agent is sucked to dry the release agent. - 請求項1に記載のテンプレート処理方法において、
前記凸部上面に離型剤を成膜する際、前記凸部上面に、乾燥して固化した離型剤を付着させる。 The template processing method according to claim 1,
When a release agent is formed on the upper surface of the convex portion, the release agent solidified by drying is attached to the upper surface of the convex portion. - 請求項1に記載のテンプレート処理方法において、
前記凸部上面に離型剤を成膜した後、当該離型剤を加熱して焼成し、
その後、前記焼成された離型剤をリンスして、当該離型剤の未反応部を除去する。 The template processing method according to claim 1,
After forming a release agent on the upper surface of the convex portion, the release agent is heated and baked,
Thereafter, the fired release agent is rinsed to remove unreacted portions of the release agent. - 請求項1に記載のテンプレート処理方法において、
前記凸部上面に離型剤を成膜した後、当該離型剤にアルコールを供給して、前記凸部上面と前記離型剤との密着性を向上させ、
その後、前記アルコールが供給された離型剤をリンスして、当該離型剤の未反応部を除去する。 The template processing method according to claim 1,
After forming a release agent film on the upper surface of the convex portion, supplying alcohol to the release agent to improve the adhesion between the upper surface of the convex portion and the release agent,
Thereafter, the release agent supplied with the alcohol is rinsed to remove the unreacted portion of the release agent. - 請求項1に記載のテンプレート処理方法において、
前記凸部上面に離型剤を成膜する前に、前記テンプレートの表面を洗浄する。 The template processing method according to claim 1,
The surface of the template is cleaned before depositing a release agent on the upper surface of the convex portion. - テンプレート処理方法を、テンプレート処理装置によって実行させるために、当該テンプレート処理装置を制御する制御部のコンピュータ上で動作するプログラム格納した、読み取り可能なコンピュータ記憶媒体であって、
前記テンプレート処理方法は、
基板上に形成される塗布膜に転写パターンを転写して当該塗布膜に所定のパターンを形成するために用いられ、かつ表面に凹凸形状の転写パターンが形成されたテンプレート上に、離型剤を成膜し、前記転写パターンの凸部の上面のみに離型剤を成膜するものである。 A readable computer storage medium storing a program that operates on a computer of a control unit that controls the template processing apparatus in order to execute the template processing method by the template processing apparatus,
The template processing method is:
A mold release agent is applied to a template having a concavo-convex transfer pattern formed on the surface and used to transfer a transfer pattern to a coating film formed on a substrate to form a predetermined pattern on the coating film. A film is formed, and a release agent is formed only on the upper surface of the convex portion of the transfer pattern. - 基板上に形成される塗布膜に転写パターンを転写して当該塗布膜に所定のパターンを形成するために用いられ、かつ表面に凹凸形状の転写パターンが形成されたテンプレート上に、離型剤を成膜するテンプレート処理装置において、
前記転写パターンの凸部の上面のみに離型剤を成膜する成膜ユニットを有する。 A mold release agent is applied to a template having a concavo-convex transfer pattern formed on the surface thereof, which is used to transfer a transfer pattern to a coating film formed on a substrate to form a predetermined pattern on the coating film. In a template processing apparatus for film formation,
A film forming unit for forming a release agent on only the upper surface of the convex portion of the transfer pattern is provided. - 請求項9に記載のテンプレート処理装置において、
前記凸部上面に当接して、当該凸部上面に離型剤を塗布するローラと、前記ローラの表面に液体状の離型剤を供給する離型剤ノズルと、前記ローラと前記離型剤ノズルを支持する支持部材とを備えた離型剤供給部と、
前記離型剤供給部を支持し、水平方向に移動させる移動機構と、を有する。 The template processing apparatus according to claim 9, wherein
A roller that contacts the upper surface of the convex portion and applies a release agent to the upper surface of the convex portion, a release agent nozzle that supplies a liquid release agent to the surface of the roller, the roller, and the release agent A release agent supply unit comprising a support member for supporting the nozzle;
And a moving mechanism that supports the release agent supply section and moves it in the horizontal direction. - 請求項10に記載のテンプレート処理装置において、
前記離型剤供給部は、前記支持部材に支持され、且つ前記ローラと同軸方向に延伸して当該ローラと当接する他のローラを有し、
前記離型剤ノズルは、前記他のローラに離型剤を供給する。 The template processing apparatus according to claim 10, wherein
The release agent supply unit includes another roller that is supported by the support member and that extends in the same direction as the roller and contacts the roller.
The release agent nozzle supplies a release agent to the other roller. - 請求項10に記載のテンプレート処理装置において、
前記離型剤供給部は、前記支持部材に支持され、前記凸部上面に塗布された離型剤を乾燥させる乾燥ノズルを有し、
前記乾燥ノズルは、前記凸部上面の離型剤に気体を供給する。 The template processing apparatus according to claim 10, wherein
The release agent supply unit is supported by the support member, and has a drying nozzle that dries the release agent applied to the upper surface of the convex portion.
The drying nozzle supplies gas to the release agent on the upper surface of the convex portion. - 請求項10に記載のテンプレート処理装置において、
前記離型剤供給部は、前記支持部材に支持され、前記凸部上面に塗布された離型剤を乾燥させる乾燥ノズルを有し、
前記乾燥ノズルは、前記凸部上面の離型剤の周囲の雰囲気を吸引する。 The template processing apparatus according to claim 10, wherein
The release agent supply unit is supported by the support member, and has a drying nozzle that dries the release agent applied to the upper surface of the convex portion.
The drying nozzle sucks the atmosphere around the release agent on the upper surface of the convex portion. - 請求項9に記載のテンプレート処理装置において、
前記成膜ユニットは、
表面に乾燥して固化した離型剤が周着し、前記凸部上面に当接して当該凸部上面に離型剤を付着させるローラと、
前記ローラを支持して水平方向に移動させる移動機構と、
を有する。 The template processing apparatus according to claim 9, wherein
The film forming unit includes:
A release agent solidified by drying on the surface, and a roller that contacts the upper surface of the convex portion and attaches the release agent to the upper surface of the convex portion;
A moving mechanism that supports the roller and moves it in a horizontal direction;
Have - 請求項9に記載のテンプレート処理装置において、
前記成膜ユニットは、表面に離型剤が付着し、前記凸部上面に当接して、当該凸部上面に離型剤を塗布する塗布プレートを有する。 The template processing apparatus according to claim 9, wherein
The film forming unit has a coating plate on which a release agent adheres to the surface, abuts on the upper surface of the convex portion, and applies the release agent to the upper surface of the convex portion. - 請求項9に記載のテンプレート処理装置において、
前記成膜ユニットで成膜された離型剤を焼成する加熱ユニットと、
前記加熱ユニットで焼成された離型剤をリンスするリンスユニットと、
を有する。 The template processing apparatus according to claim 9, wherein
A heating unit for firing the release agent formed in the film forming unit;
A rinse unit for rinsing the release agent baked in the heating unit;
Have - 請求項9に記載のテンプレート処理装置において、
前記テンプレートを保持して回転させる回転保持部材と、
前記成膜ユニットで成膜された離型剤にアルコールを供給するアルコールノズルと、
前記アルコールが供給された離型剤にリンス液を供給するリンス液ノズルとを備えた後処理ユニットと、
を有する。 The template processing apparatus according to claim 9, wherein
A rotation holding member for holding and rotating the template;
An alcohol nozzle for supplying alcohol to the release agent formed by the film forming unit;
A post-processing unit comprising a rinsing liquid nozzle for supplying a rinsing liquid to the mold release agent supplied with the alcohol;
Have - 請求項9に記載のテンプレート処理装置において、
前記成膜ユニットは、
前記テンプレートを保持して回転させる回転保持部材と、
前記凸部上面に成膜された離型剤にアルコールを供給するアルコールノズルと、
前記アルコールが供給された離型剤にリンス液を供給するリンス液ノズルと、
を有する。 The template processing apparatus according to claim 9, wherein
The film forming unit includes:
A rotation holding member for holding and rotating the template;
An alcohol nozzle for supplying alcohol to a release agent formed on the upper surface of the convex portion;
A rinse liquid nozzle for supplying a rinse liquid to the release agent supplied with the alcohol;
Have - 請求項9に記載のテンプレート処理装置において、
前記成膜ユニットで前記離型剤が成膜される前のテンプレートの表面を洗浄する洗浄ユニットを有する。 The template processing apparatus according to claim 9, wherein
A cleaning unit that cleans the surface of the template before the release agent is formed by the film forming unit;
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CN103085288B (en) * | 2013-02-21 | 2015-05-27 | 铁岭市清河区清河石墨电碳制品厂 | Production method of guide bearing |
JP2015032616A (en) * | 2013-07-31 | 2015-02-16 | 株式会社東芝 | Template, processing method of template, pattern forming method and imprinting resist |
JP6029558B2 (en) * | 2013-09-30 | 2016-11-24 | 富士フイルム株式会社 | Curable composition for optical imprint, pattern formation method, fine pattern, and method for manufacturing semiconductor device |
JP2019126954A (en) * | 2018-01-24 | 2019-08-01 | パナソニックIpマネジメント株式会社 | Mold release processing method and imprint apparatus |
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002184719A (en) * | 2000-12-19 | 2002-06-28 | Matsushita Electric Ind Co Ltd | Method of forming pattern |
JP2004059822A (en) * | 2002-07-31 | 2004-02-26 | Dainippon Printing Co Ltd | Photocurable resin, photocurable resin composition, method of forming fine concave-convex pattern, transfer foil, optical article, and stamper |
JP2004288783A (en) * | 2003-03-20 | 2004-10-14 | Hitachi Ltd | Nano printing apparatus and microstructure transfer method |
JP2009208447A (en) * | 2008-03-06 | 2009-09-17 | Fujifilm Corp | Mold structure for imprint, imprint method, magnetic recording medium and method for manufacturing the same |
Family Cites Families (1)
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---|---|---|---|---|
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Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002184719A (en) * | 2000-12-19 | 2002-06-28 | Matsushita Electric Ind Co Ltd | Method of forming pattern |
JP2004059822A (en) * | 2002-07-31 | 2004-02-26 | Dainippon Printing Co Ltd | Photocurable resin, photocurable resin composition, method of forming fine concave-convex pattern, transfer foil, optical article, and stamper |
JP2004288783A (en) * | 2003-03-20 | 2004-10-14 | Hitachi Ltd | Nano printing apparatus and microstructure transfer method |
JP2009208447A (en) * | 2008-03-06 | 2009-09-17 | Fujifilm Corp | Mold structure for imprint, imprint method, magnetic recording medium and method for manufacturing the same |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2017502328A (en) * | 2013-12-09 | 2017-01-19 | レイセオン カンパニー | Method for forming a deposition pattern on a surface |
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