WO2010082300A1 - Transfer device - Google Patents
Transfer device Download PDFInfo
- Publication number
- WO2010082300A1 WO2010082300A1 PCT/JP2009/050315 JP2009050315W WO2010082300A1 WO 2010082300 A1 WO2010082300 A1 WO 2010082300A1 JP 2009050315 W JP2009050315 W JP 2009050315W WO 2010082300 A1 WO2010082300 A1 WO 2010082300A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- transfer
- support mechanism
- unit
- mold
- moving
- Prior art date
Links
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/84—Processes or apparatus specially adapted for manufacturing record carriers
- G11B5/855—Coating only part of a support with a magnetic layer
Definitions
- the present invention relates to a transfer device for transferring a concavo-convex pattern to a transfer target.
- Patent Document 1 Currently, for example, an apparatus as shown in FIG. 1 of Patent Document 1 has been proposed as a transfer apparatus that transfers a fine concavo-convex pattern onto a disk-shaped recording medium substrate using an optical imprint method.
- an auxiliary apparatus for alignment of the mold and the substrate an auxiliary apparatus for light irradiation must be provided, and the apparatus configuration is increased in size.
- JP 2008-155522 A JP 2008-155522 A
- An advantage of some aspects of the invention is that it provides a transfer apparatus that does not increase the size of the apparatus and complicate the apparatus configuration.
- a transfer device is a transfer device that performs a series of transfer processes for transferring a pattern formed on a mold to a transfer target, a support mechanism for supporting the transfer target, and the support
- a support mechanism driving unit that drives the mechanism in a first direction; an irradiation unit that irradiates an energy beam toward the transfer target; and a moving unit that moves the irradiation unit and / or the support mechanism driving unit.
- a transfer device is a transfer device that performs a series of transfer processes for transferring a pattern formed on a mold to a transfer target, a support mechanism for supporting the transfer target, and the support Support mechanism driving means for driving the mechanism in the first direction, photographing means for alignment of the transferred object and the mold, and moving means for moving the photographing means and / or the supporting mechanism driving means.
- a transfer device is a transfer device for transferring a pattern formed on a mold to a transfer target, an irradiation means for irradiating an energy ray toward the transfer target, and the transfer target
- An imaging unit for alignment of the body and the mold, a moving unit for moving the imaging unit or the irradiation unit, and one of the imaging unit and the irradiation unit is set to a use position according to the progress of the pattern transfer process.
- Control means for controlling the moving means to be arranged.
- the transfer device transfers the pattern formed on the first mold to the first surface of the transfer object, and transfers the pattern formed on the second mold to the second surface of the transfer object.
- a transfer device that performs a series of transfer processes to be transferred to a first support mechanism, a first support mechanism that supports the transfer object, a first support mechanism driving unit that drives the first support mechanism in a first direction, and an energy beam First irradiating means for irradiating the first surface of the transferred body, second irradiating means for irradiating energy rays toward the second surface of the transferred body, the transferred body and the Imaging means for alignment of the first and second molds, a second support mechanism for supporting the transferred object, a second support mechanism driving means for moving the second support mechanism, the imaging means, and the first Transfer the support mechanism driving means or the first irradiation means.
- a transfer device is a transfer device that performs a series of transfer processes for transferring a pattern formed on a mold to a transfer target, and has a support mechanism that supports the transfer target in a first direction.
- One of the support mechanism driving means and the irradiating means is set to the use position.
- a movement control means for moving the slide table to be arranged.
- a transfer device is a transfer device that performs a series of transfer processes for transferring a pattern formed on a mold to a transfer target, and has a support mechanism that supports the transfer target in a first direction.
- a transfer device is a transfer device for performing a series of transfer processes for transferring a pattern formed on a mold to a transfer target, and an imaging unit for alignment of the transfer target and the mold , And a slide table on which irradiation means for irradiating an energy beam toward the transfer object is installed, and the slide table is moved so that one of the photographing means and the irradiation means is placed at a use position. And a device station comprising movement control means.
- FIG. 1 It is a figure which shows schematic structure of the imprint apparatus which concerns on this invention. It is a figure which shows schematic structure of the upper device station 90a seen from the upper surface. It is a figure which shows schematic structure of the upper device station 90a seen from the side surface. It is a figure which shows schematic structure of the lower device station 90b seen from the upper surface. It is a figure which shows schematic structure of the lower device station 90b seen from the side surface. It is a top view which shows the other structure of the upper device station 90a. It is a side view which shows the other structure of the upper device station 90a. It is a figure which shows an example of the manufacturing process of a double-sided magnetic disc.
- a support mechanism driving means for moving a support mechanism for supporting the transfer object and the mold at the same reference position and a light irradiation means for irradiating light for curing the surface of the substrate are placed on the stage.
- the installation position of the light irradiating means and the support mechanism driving means with respect to can be moved.
- FIG. 1 is a view showing a schematic cross-sectional structure of a UV (Ultraviolet) type imprint apparatus according to the present invention.
- This imprint apparatus uses the upper mold 503a and the lower mold 503b on which the concavo-convex pattern to be transferred is formed to perform pattern transfer on both sides of the substrate 6 as a transfer target to be transferred.
- the transfer target is referred to as a substrate.
- the substrate refers to a configuration including a layer to be transferred.
- the support mechanism refers to a center pin.
- an upper transfer layer 604a and a lower transfer layer 604b made of a transfer material that is cured when irradiated with ultraviolet rays are formed on both surfaces of the substrate 6, an upper transfer layer 604a and a lower transfer layer 604b made of a transfer material that is cured when irradiated with ultraviolet rays are formed.
- FIG. 1 the configuration of the imprint apparatus is shown in a state in which the substrate 6, the upper mold 503a, and the lower mold 503b are installed.
- the imprint apparatus shown in FIG. 1 includes an upper mechanism unit, a lower mechanism unit, a controller 200 that controls the upper mechanism unit and the lower mechanism unit, and an operation unit 201.
- the upper mechanism unit includes an upper center pin 30a, a camera unit 40, an upper device station 90a, an upper mold XY stage 500a, an upper mold holding unit 501a, an upper stage 505a, an upper center pin driving unit 507a, and an upper UV irradiation unit 508a.
- the upper center pin 30a and the upper center pin drive unit 507a are integrally formed in order to photograph a tip portion of a lower center pin 30b described later. That is, the upper center pin 30a is also moved by the movement of the upper center pin driving unit 507a.
- the board-like upper stage 505a has a screw hole portion in which a screw groove into which a ball screw 512 (to be described later) is screwed is formed, along with an opening portion 100a as shown in FIG.
- An upper mold XY stage 500a having an opening continuous with the opening 100a is installed on the lower surface of the upper stage 505a.
- an upper mold holding part 501a made of a transparent material is installed so as to cover the opening.
- Upper mold XY stage 500a is according to the supplied upper XY stage movement signal XY U from the controller 200, the upper mold holding portion 501a, it is moved in the direction of the two-dimensional with respect to the lower surface of the upper stage 505a.
- the upper mold holding part 501a includes a mold holding surface (a surface with which the upper mold 503a is in contact in FIG. 1) for holding the upper mold 503a.
- a through hole is provided in the center of the upper mold holding part 501a so that the upper center pin 30a can be moved up and down in a direction perpendicular to the mold holding surface of the upper mold holding part 501a.
- the upper mold holding unit 501a in accordance with the upper mold holding signal MH U supplied from the controller 200, for example, by vacuum suction, and holds the upper mold 503a on the mold holding surface.
- the method of holding the upper mold 503a on the mold holding surface is not limited to vacuum suction and may be held by a mechanical method.
- An upper device station 90a is installed on the upper surface of the upper stage 505a.
- the upper device station 90a, the camera unit 40, among the upper center pin drive unit 507a and the upper UV irradiation unit 508a, the center position of the opening 100a of one of the units by the supplied unit designation signal US U from the controller 200 Move to.
- the upper device station 90a moves the installation position of the unit selected above by the distance of the unit position adjustment signal UP U supplied from the controller 200.
- FIG. 2A is a diagram illustrating a schematic configuration of the upper device station 90a viewed from the top surface
- FIG. 2B is a diagram illustrating a schematic configuration of the upper device station 90a viewed from the side surface.
- the upper device station 90a moves the slide table 901a and the slide table 901a on which the camera unit 40, the upper center pin driving unit 507a, and the upper UV irradiation unit 508a are installed.
- a guide rail 902a As shown in FIG. 2A, the guide rail 902a includes two rails arranged in parallel with each other across the region of the opening 100a of the upper stage 505a.
- the slide table 901a is provided with an opening at a position where each unit is to be arranged.
- Slide table 901a in response to the supplied unit designation signal US U from the controller 200, only the specified unit (camera unit 40, the upper center pin drive unit 507a or the upper UV irradiation unit 508a) is in the center of the opening 100a It moves along the guide rail 902a so as to be arranged.
- the upper device station 90a selectively uses one of the camera unit 40, the upper center pin driving unit 507a, and the upper UV irradiation unit 508a at the use position, that is, the center position of the substrate 6 arrangement position on the upper stage 505a. It is transferred to the upper part.
- the use position refers to a position where the camera unit 40, the upper center pin drive unit 507a, and the upper UV irradiation unit 508a are used by performing their functions in the imprint process. Therefore, the use positions of the camera unit 40, the upper center pin driving unit 507a, and the upper UV irradiation unit 508a may be the same or different.
- the camera unit 40 has cameras 40 1 , 40 2 and 40 3 for photographing the alignment marks formed on the molds (503a, 503b), and a camera 40 4 for photographing the tip of the lower center pin 30b. Is provided.
- Each of the cameras 40 1 , 40 2, and 40 3 is installed with its photographing lens oriented perpendicularly to the surface of the upper mold holding unit 501a through the opening of the slide table 901a. Further, the camera 40 4, the photographing lens through the opening in the slide table 901a, are disposed in a state directed perpendicularly to the distal end portion of the lower center pin 30b.
- Each of the cameras 40 1 , 40 2 , and 40 3 controls the imaging signals PD 1 , PD 2 , and PD 3 obtained by imaging the upper mold 503a and the lower mold 503b from the respective positions. 200.
- the camera 40 4 supplies the controller 200 with a photographing signal PD 4 obtained by photographing the tip of the lower center pin 30b.
- the upper UV irradiation unit 508a applies ultraviolet rays to cure the transfer material in accordance with the ultraviolet irradiation signal UV supplied from the controller 200, the opening of the slide table 901a, the opening 100a of the upper stage 505a, and the upper mold holding unit 501a. Then, the light is irradiated toward the upper transfer layer 604a of the substrate 6.
- Upper center pin drive unit 507a in accordance with the upper center pin movement signal CG U supplied from the controller 200, the upper center pin 30a, is moved to the upper or lower side in the direction of its central axis.
- the upper center pin 30a supports the vicinity of the center hole of the substrate 6 through the center hole of the upper mold 503a by moving downward. Furthermore, the board
- the upper center pin drive unit 507a may be provided with a mechanism for rotating the upper center pin 30a.
- the lower mechanism part of the imprint apparatus includes a lower center pin 30b, a lower device station 90b, a lower mold XY stage 500b, a lower mold holding part 501b, a lower stage 505b, a lower center pin drive unit 507b, a lower part A side UV irradiation unit 508b, a stage vertical drive unit 511, and a ball screw 512 are provided.
- the board-like lower stage 505b has a through hole through which the ball screw 512 passes, together with the opening 100b as shown in FIG.
- One end of the ball screw 512 passes through the through hole of the lower stage 505b so that the lower stage 505b and the upper stage 505a are maintained in a parallel state, and the other end is threaded in the upper stage 505a. It is screwed into the part.
- a lower mold XY stage 500b having an opening larger than the opening 100b is installed on the upper surface of the lower stage 505b.
- a lower mold holding part 501b made of a transparent material is installed so as to cover the opening.
- the lower mold XY stage 500b moves the lower mold holding portion 501b in each of two-dimensional directions with respect to the lower surface of the lower stage 505b in accordance with the lower XY stage movement signal XY L supplied from the controller 200.
- the lower mold holding part 501b includes a mold holding surface (a surface with which the lower mold 503b is in contact in FIG. 1) for holding the lower mold 503b.
- a through-hole for supporting the lower center pin 30b in a vertically movable state in a direction perpendicular to the mold holding surface of the lower mold holding portion 501b is formed at the center of the lower mold holding portion 501b. Is provided.
- Lower mold holding portion 501b in accordance with the lower mold holding signal MH L supplied from the controller 200, for example, to hold the lower mold 503b to the mold holding surface by vacuum suction.
- the method of holding the lower mold 503b on the mold holding surface is not limited to vacuum suction and may be held by a mechanical method.
- the lower UV irradiation unit 508b transmits ultraviolet light to be cured on the transfer material in accordance with the ultraviolet irradiation signal UV supplied from the controller 200 via the opening 100a and the upper mold holding unit 501b. Irradiation is performed toward the transfer layer 604b.
- Lower center pin drive unit 507b in accordance with the lower center pin moving signal CG L supplied from the controller 200, a lower center pin 30b, a direction perpendicular to the mold holding surface of the lower mold holding portion 501b That is, the upper center pin 30b is moved upward or downward in the central axis direction.
- the lower center pin drive unit 507b may be provided with a mechanism for rotating the lower center pin 30b.
- a stage vertical drive unit 511 and a lower device station 90b are provided on the lower surface of the lower stage 505b.
- the stage vertical drive unit 511 maintains the upper stage 505a parallel to the lower stage 505b by rotating the ball screw 512 clockwise or counterclockwise according to the stage drive signal SG supplied from the controller 200. Move it up or down. That is, the upward movement of the upper stage 505a causes the upper mold holding part 501a to move away from the lower mold holding part 501b in a direction perpendicular to the mold holding surface of the lower mold holding part 501b. . On the other hand, the upper mold holding part 501a moves toward the lower mold holding part 501b by the downward movement of the upper stage 505a.
- Lower device station 90b is within the lower center pin drive unit 507b and the lower UV irradiation unit 508b, any one of the units by the supplied unit designation signal US L from the controller 200 to the center position of the opening 100b Move.
- the lower device station 90b moves the installation position of the unit selected above by the distance of the unit position adjustment signal UP L supplied from the controller 200.
- FIG. 3A is a diagram showing a schematic configuration of the lower device station 90b viewed from the top surface
- FIG. 3B is a diagram showing a schematic configuration of the lower device station 90b viewed from the side surface.
- the lower device station 90b moves the slide table 901b on which the lower center pin driving unit 507b and the lower UV irradiation unit 508b are installed, and the slide table 901b.
- Guide rail 902b As shown in FIG. 3A, the guide rail 902b is composed of two rails arranged in parallel with each other across the region of the opening 100b of the lower stage 505b. Further, as shown in FIG. 3B, the slide table 901b is provided with an opening at a position where each unit is to be arranged.
- Slide table 901b in response to the supplied units specified signal US L from the controller 200, located only specified unit (lower center pin drive unit 507b or the lower UV irradiation unit 508b) is in the center position of the opening 100b As shown, it moves along the guide rail 902b.
- the lower device station 90b selectively uses one of the lower center pin drive unit 507b and the lower UV irradiation unit 508b at the use position, that is, the center position of the substrate 6 arrangement position on the lower stage 505b. It is transported.
- the lower UV irradiation unit 508b generates ultraviolet rays for curing the transfer material in accordance with the ultraviolet irradiation signal UV supplied from the controller 200, the opening of the slide table 901b, the opening 100b of the lower stage 505b, and the lower mold. Irradiation is performed toward the lower transfer layer 604b of the substrate 6 through the holding portion 501b.
- Lower center pin drive unit 507b in accordance with the lower center pin moving signal CG L supplied from the controller 200, a lower center pin 30b, is moved to the upper or lower side in the direction of its central axis.
- the lower center pin 30b is formed with a first support portion TB1 that supports the upper mold 503a or the lower mold 503b and a second support portion TB2 that supports the substrate 6, respectively.
- the operation unit 201 accepts various operation commands instructed by the user to operate the imprint apparatus, and supplies an operation command signal indicating the operation command to the controller 200.
- the controller 200 generates various control signals for controlling the imprint apparatus by executing a processing program corresponding to the operation indicated by the operation command signal supplied from the operation unit 201.
- the controller 200 executes an imprint processing program.
- the controller 200 first aligns each of the substrate 6, the upper mold 503a, and the lower mold 503b. (Hereinafter referred to as alignment).
- the controller 200 first supplies a unit designation signal US U that specifies the camera unit 40 to the upper device station 90a.
- the slide table 901a of the upper device station 90a moves along the guide rail 902a so as to arrange the camera unit 40 at the center position of the opening 100a.
- the controller 200 determines the relative positions of the substrate 6, the upper mold 503a, and the lower mold 503b based on the imaging signals PD 1 to PD 4 obtained by imaging with the cameras 40 1 to 40 4 of the camera unit 40. The relationship is detected, and the upper mold XY stage 500a and / or the lower mold XY stage 500b is controlled so that this becomes a predetermined relative positional relationship.
- the controller 200 supplies a stage drive signal SG for moving the upper stage 505a downward to the stage vertical drive unit 511 so as to press the upper mold 503a and the lower mold 503b against the substrate 6.
- a stage drive signal SG for moving the upper stage 505a downward to the stage vertical drive unit 511 so as to press the upper mold 503a and the lower mold 503b against the substrate 6.
- the upper transfer layer 604a and the lower transfer layer 604b are in a liquid state (flowable state)
- the upper transfer layer 604a is deformed along the uneven pattern shape formed on the upper mold 503a
- the lower transfer layer 604b is Each deforms along the uneven pattern shape formed in the lower mold 503b.
- the controller 200 in order to cure the upper transfer layer 604a and a lower transfer layer 604b each substrate 6, firstly, to supply the unit designation signal US U that specifies the upper UV irradiation unit 508a on the upper device station 90a, supplying unit designation signal US L specifying the lower UV irradiation unit 508b to the lower device station 90b.
- the slide table 901a of the upper device station 90a moves along the guide rail 902a so as to place the upper UV irradiation unit 508a at the center position of the opening 100a instead of the camera unit 40.
- the slide table 901b of the lower device station 90b moves along the guide rail 902b in order to place the lower UV irradiation unit 508b at the center position of the opening 100b instead of the lower center pin driving unit 507b.
- the controller 200 supplies the ultraviolet irradiation signal UV to the upper UV irradiation unit 508a and the lower UV irradiation unit 508b.
- the upper UV irradiation unit 508a irradiates the upper transfer layer 604a of the substrate 6 with ultraviolet rays that should cure the transfer layer material
- the lower UV irradiation unit 508b transfers lower ultraviolet rays that should cure the transfer layer material. Irradiation is performed toward the layer 604b. Thereby, the transfer layers of the upper transfer layer 604a and the lower transfer layer 604b are cured, and the uneven pattern on the surfaces of the upper transfer layer 604a and the lower transfer layer 604b is determined.
- the controller 200 in order to release the substrate 6 from the upper mold 503a and the lower mold 503b, first, supplies the unit designation signal US U that specifies the upper center pin drive unit 507a to the upper device station 90a, supplying unit designation signal US L specifying the lower center pin drive unit 507b to the lower device station 90b.
- the slide table 901a of the upper device station 90a moves along the guide rail 902a so as to place the upper center pin driving unit 507a at the center position of the opening 100a instead of the upper UV irradiation unit 508a.
- the slide table 901b of the lower device station 90b moves along the guide rail 902b so as to place the lower center pin driving unit 507b at the center of the opening 100b instead of the lower UV irradiation unit 508b.
- the controller 200 the lower should supplies upper center pin moving signal CG U to move the upper center pin 30a in a downward direction to the upper center pin drive unit 507a, move the lower center pin 30b upward supplying side center pin movement signal CG L below the center pin drive unit 507b.
- the substrate 6 moves upward together with the lower center pin 30b, and the upper end portions of the upper center pin 30a and the lower center pin 30b are joined to each other.
- the upper mold 503a is released from the upper transfer layer 604a of the substrate 6, and the substrate 6 is released from the lower mold 503b.
- the imprint apparatus shown in FIG. 1 includes the above-described various mechanical components (501a, 501b, 505a, 505b, 511, 512) responsible for the operation for pressing the mold (503a, 503b) against the substrate 6.
- various auxiliary devices for mounting the alignment, curing the transfer layer, and releasing the substrate / mold are mounted. That is, the camera unit 40 used for performing the alignment as described above, the upper center pin driving unit 507a used for releasing the mold (503a, 503b) from the substrate 6, and the upper transfer layer 604a are cured.
- An upper UV irradiation unit 508a that emits power ultraviolet light is provided on the upper stage 505a.
- a lower center pin driving unit 507b that drives the lower center pin 30b that supports the substrate 6 and the lower mold 503b, and a lower UV irradiation unit 508b that emits ultraviolet light to cure the lower transfer layer 604b.
- the camera unit 40, the upper center pin driving unit 507a, and the upper UV irradiation unit 508a as the auxiliary devices as described above are placed on a slide table 901a that moves along the guide rail 902a as shown in FIGS. 2A and 2B. Each is arranged.
- Slide table 901a the center of one unit (camera unit 40, the upper center pin drive unit 507a or the upper UV irradiation unit 508a) only the upper stage 505a opening 100a indicated by the supplied unit designation signal US U from the controller 200 It moves along the guide rail 902a so that it may be located in. Further, as shown in FIGS. 3A and 3B, the lower center pin drive unit 507b and the lower UV irradiation unit 508b as auxiliary devices are respectively arranged on a slide table 901b that moves along the guide rail 902b.
- Slide table 901b in response to the supplied units specified signal US L from the controller 200, only one unit represented by the unit designation signal US L (lower center pin drive unit 507b or the lower UV irradiation unit 508b) is It moves along the guide rail 902b so as to be arranged at the center of the opening 100b.
- the irradiation units (508a, 508b) that emit light for curing the transfer layer and various adjustment auxiliary devices (camera unit 40, upper center pin drive unit 507a, lower center pin drive unit 507b), respectively. It is possible to install one of the two at the optimum position (the center position of the openings 100a and 100b) during use.
- the irradiation units (508a, 508b) can be moved to a position where the light for curing the transfer layer can be uniformly irradiated over the entire surface of the substrate 6. . Therefore, even if various auxiliary devices (40, 507a, 507b) are mounted on the stage (505a, 505b) together with the irradiation units (508a, 508b), the irradiation units (508a, 508b) are disposed on the entire surface of the substrate 6. It is possible to irradiate light for curing the transfer layer uniformly.
- the camera unit 40, the upper UV irradiation unit 508a, and the upper center pin drive unit 507a are all installed on one slide table 901a.
- Each unit (40, 507a, 508a) may be installed on the slide table.
- 4A and 4B are diagrams showing another configuration of the upper device station 90a made in view of such points.
- 4A is a diagram showing another configuration of the upper device station 90a viewed from the upper surface side
- FIG. 4B is a diagram viewed from the side surface side.
- the slide tables 901 1 and 901 3 have two guide rails 902 1 arranged in parallel with each other across the region of the opening 100a of the upper stage 505a (the region surrounded by the wavy line). Move individually along the line.
- the slide table 901 2 is arranged in parallel with each other across the region of the opening 100a and moves along the two guide rails 902 2 orthogonal to the guide rail 902 1 .
- the unit designation signal US U that specifies the upper center pin drive unit 507a from the controller 200 is supplied, only the slide table 901 2 of the slide table 901 1-901 3 along the guide rail 902 2 Then, the upper center pin drive unit 507a is disposed at the center of the opening 100a. Further, the unit designation signal US U that specifies the camera unit 40 from the controller 200 is supplied, only the slide table 901 one of the slide table 901 1-901 3 is moved along the guide rails 902 1, the camera unit 40 is arranged at the center of the opening 100a.
- the unit designation signal US U for designating the upper UV irradiation unit 508a is supplied from the controller 200, only the slide table 901 3 among the slide tables 901 1 to 901 3 moves along the guide rail 902 1 , The upper UV irradiation unit 508a is disposed at the center of the opening 100a.
- the imprint operation by the imprint apparatus shown in FIG. 1 can be applied to a manufacturing process of a magnetic recording medium such as a discrete track medium or a bit patterned medium.
- a method of manufacturing a magnetic disk including the above-described imprint operation will be described with reference to FIG.
- an upper mold 503a and a lower mold 503b having a desired concavo-convex pattern on the surface of a base material made of a material such as glass that transmits ultraviolet rays are prepared.
- the concavo-convex pattern is formed by forming a resist pattern on a substrate using, for example, an electron beam drawing apparatus, and then performing a dry etching process or the like using the resist pattern as a mask.
- the finished upper mold 503a and lower mold 503b are subjected to a surface treatment with a silane coupling agent or the like in order to improve releasability.
- a substrate made of a material that transmits ultraviolet rays such as glass replicated by an imprint method or the like, may be used as a transfer mold using the upper mold 503a and the lower mold 503b as masters.
- a substrate made of a material that transmits ultraviolet rays, such as glass duplicated by an imprint method or the like from the duplication disk produced by the above method may be used as a transfer mold. If a duplicate transfer mold is used, the master and / or the base material of the duplicate disk is, for example, ultraviolet rays such as nickel (including alloys) duplicated by a method such as silicon or electroforming. A material that does not transmit can be used.
- a magnetic disk media substrate (hereinafter referred to as a media substrate) 600 is manufactured.
- the media substrate 600 has, for example, an upper side on one side (upper side) and the other side (lower side) of a disc-shaped support substrate 601 made of specially processed chemically strengthened glass, silicon wafer, aluminum substrate, or the like.
- a plurality of layers including the transfer layer 604a and the lower transfer layer 604b are laminated as follows. That is, as shown in FIG. 5A, on the upper surface of the support substrate 601, there is an upper nonmagnetic layer 602a made of a nonmagnetic material, an upper metal layer 603a made of a metal material such as Ta or Ti, and an upper transfer.
- a layer 604a is stacked.
- a lower nonmagnetic layer 602b made of a nonmagnetic material, a lower metal layer 603b made of a metal material such as Ta or Ti, and a lower transfer layer 604b are laminated on the lower surface of the support substrate 601.
- the upper nonmagnetic layer 602a, the upper metal layer 603a, the lower nonmagnetic layer 602b, and the lower metal layer 603b are formed by a sputtering method or the like.
- the concavo-convex pattern formed on the upper mold 503a and the lower mold 503b is transferred to the upper transfer layer 604a and the lower transfer layer 604b formed on the media substrate 600 by the imprint method described above. That is, the upper transfer layer 604a and the lower transfer layer 604b are formed on the media substrate 600 prepared in the above process by spin coating or the like, and the reference positions of the upper mold 503a and the lower mold 503b are aligned with the central axis of the center pin 30b.
- the media substrate 600 is mounted on the center pin 30b, and the upper mold 503a is placed on the lower mold in the direction of the center axis of the center pin 30b with the reference position aligned with the center axis of the center pin 30b.
- the upper mold 503 a is pressed against one surface of the media substrate 600 and the lower mold 503 b is pressed against the other surface of the media substrate 600.
- the upper UV irradiation unit 508a irradiates the upper transfer layer 604a of the media substrate 600 with ultraviolet rays to cure the transfer layer
- the lower UV irradiation unit 508b emits ultraviolet rays to cure the transfer layer.
- the media substrate 600 is formed with a cross-sectional structure as shown in FIG.
- etching is performed on both surfaces of the media substrate 600 having a structure as shown in FIG.
- the etching process first, the remaining film of the upper transfer layer 604a remains in the portion corresponding to the convex portion of the upper mold 503a, and the residual film of the lower transfer layer 604b remains in the portion corresponding to the convex portion of the lower mold 503b.
- the remaining film is removed by oxygen reactive ion etching (RIE) or the like.
- RIE oxygen reactive ion etching
- the upper metal layer 603a and the lower metal layer 603b are etched and patterned by dry etching using the upper transfer layer 604a and the lower transfer layer 604b patterned by the imprint process as a mask.
- the recesses in the concavo-convex patterns of the upper resist layer 604a and the lower resist layer 604b and the recesses in the upper metal layer 603a and the lower metal layer 603b are formed. Corresponding portions are removed, and a pattern is formed on each of the upper metal layer 603a and the lower metal layer 603b (metal mask patterning step).
- a transfer layer removal process is performed on both surfaces of the media substrate 600 in the state shown in FIG. 5B by a method such as wet etching or dry ashing. Then, the transfer layer remaining on each of the upper metal layer 603a and the lower metal layer 603b is removed (transfer layer removing process).
- the non-magnetic material is etched and patterned by dry etching using the upper metal layer 603a and the lower metal layer 603b as a mask with respect to the media substrate 600 in a state as shown in FIG. Thereby, as shown in FIG. 5D, a pattern is formed on the nonmagnetic material by a predetermined depth with respect to the exposed regions of the upper nonmagnetic layer 602a and the lower nonmagnetic layer 602b (nonmagnetic). Layer patterning process).
- the remaining upper metal layer 603a and lower metal layer 603b are removed from both surfaces of the media substrate 600 in a state as shown in FIG. 5D by a method such as a wet etching process or a dry etching process.
- a method such as a wet etching process or a dry etching process.
- FIG. 5E the metal layer remaining in each of the upper nonmagnetic layer 602a and the lower nonmagnetic layer 602b is removed (metal mask removing process).
- the concave portions of the upper nonmagnetic layer 602a and the lower nonmagnetic layer 602b are filled with a magnetic material (shown in black), and the upper protective layer 605a and the upper lubricating layer are further filled.
- a layer 606a, a lower protective layer 605b, and a lower lubricating layer 606b are stacked as shown in FIG.
- the imprint apparatus shown in FIG. 1 performs the processes shown in FIGS.
- a double-sided magnetic disk having a cross-sectional structure as shown in F) is manufactured.
- a method of manufacturing a magnetic disk from a media substrate 600 provided with an upper nonmagnetic layer 602a and a lower nonmagnetic layer 602b as shown in FIG. 5A a method of manufacturing a magnetic disk from a media substrate 600 provided with an upper nonmagnetic layer 602a and a lower nonmagnetic layer 602b as shown in FIG. 5A.
- the magnetic disk may be manufactured from the media substrate 600 employing the upper magnetic layer and the lower magnetic layer made of a magnetic material instead of the upper nonmagnetic layer 602a and the lower nonmagnetic layer 602b.
- the magnetic material is etched by dry etching using the upper metal layer 603a and the lower metal layer 603b as a mask with respect to the media substrate 600 in the state as shown in FIG.
- a pattern is formed on the magnetic material by a predetermined depth for each exposed region of the side nonmagnetic layer (magnetic layer patterning step). Then, the magnetic disk is obtained by filling the concave portions of the upper magnetic layer and the lower magnetic layer with a nonmagnetic material.
- the UV imprint method and the imprint apparatus are described.
- the present invention is not limited to this, and thermal imprint, light energy (light other than UV) curing imprint, etc.
- the present invention can be applied to other types of imprint apparatuses.
Landscapes
- Shaping Of Tube Ends By Bending Or Straightening (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
Abstract
A transfer device is provided with a support mechanism driving means for moving a support mechanism for supporting a transferred body and an irradiation means for irradiating an energy beam toward the surface of the transferred body. In the device, one of the light irradiation means or the support mechanism driving means is made movable toward a use position according to the progress of a pattern transfer process.
Description
本発明は、被転写体に凹凸パターンを転写する転写装置に関する。
The present invention relates to a transfer device for transferring a concavo-convex pattern to a transfer target.
現在、光インプリント法を利用してディスク形状の記録媒体基板上に微細な凹凸パターンを転写する転写装置として、例えば、特許文献1の図1に示すような装置が提案されている。上記のような従来転写装置では、各工程毎に、例えば、モールドと基板のアライメントのための補助装置、光照射のための補助装置を備えなければならず、転写装置が大型化する、装置構成が複雑化するといった課題が生じる。これによって、転写装置のコストが増し、作業性やメンテナンス性の悪化も招くこととなる。
特開2008-155522号公報
Currently, for example, an apparatus as shown in FIG. 1 of Patent Document 1 has been proposed as a transfer apparatus that transfers a fine concavo-convex pattern onto a disk-shaped recording medium substrate using an optical imprint method. In the conventional transfer apparatus as described above, for each process, for example, an auxiliary apparatus for alignment of the mold and the substrate, an auxiliary apparatus for light irradiation must be provided, and the apparatus configuration is increased in size. There arises a problem of increasing complexity. As a result, the cost of the transfer device is increased, and workability and maintenance are deteriorated.
JP 2008-155522 A
本発明は、上述した点に鑑みてなされたものであって、装置の大型化および装置構成の複雑化を生じない転写装置を提供することを目的とする。
SUMMARY An advantage of some aspects of the invention is that it provides a transfer apparatus that does not increase the size of the apparatus and complicate the apparatus configuration.
本発明の第1の特徴による転写装置は、モールドに形成されたパターンを被転写体に転写する一連の転写処理を行う転写装置であって、前記被転写体を支持する支持機構と、前記支持機構を第1方向に駆動させる支持機構駆動手段と、エネルギー線を前記被転写体に向けて照射する照射手段と、前記照射手段及び/又は前記支持機構駆動手段を移動させる移動手段と、を有する。
A transfer device according to a first feature of the present invention is a transfer device that performs a series of transfer processes for transferring a pattern formed on a mold to a transfer target, a support mechanism for supporting the transfer target, and the support A support mechanism driving unit that drives the mechanism in a first direction; an irradiation unit that irradiates an energy beam toward the transfer target; and a moving unit that moves the irradiation unit and / or the support mechanism driving unit. .
本発明の第2の特徴による転写装置は、モールドに形成されたパターンを被転写体に転写する一連の転写処理を行う転写装置であって、前記被転写体を支持する支持機構と、前記支持機構を第1方向に駆動させる支持機構駆動手段と、前記被転写体と前記モールドのアライメント用の撮影手段と、前記撮影手段及び/又は前記支持機構駆動手段を移動させる移動手段と、を有する。
A transfer device according to a second aspect of the present invention is a transfer device that performs a series of transfer processes for transferring a pattern formed on a mold to a transfer target, a support mechanism for supporting the transfer target, and the support Support mechanism driving means for driving the mechanism in the first direction, photographing means for alignment of the transferred object and the mold, and moving means for moving the photographing means and / or the supporting mechanism driving means.
本発明の第3の特徴による転写装置は、モールドに形成されたパターンを被転写体に転写する転写装置であって、エネルギー線を前記被転写体に向けて照射する照射手段と、前記被転写体及び前記モールドのアライメント用の撮影手段と、前記撮影手段又は前記照射手段を移動させる移動手段と、パターン転写処理の進捗に応じて、前記撮影手段及び前記照射手段の内の一方を使用位置に配置させるべく前記移動手段を制御する制御手段と、を有する。
A transfer device according to a third aspect of the present invention is a transfer device for transferring a pattern formed on a mold to a transfer target, an irradiation means for irradiating an energy ray toward the transfer target, and the transfer target An imaging unit for alignment of the body and the mold, a moving unit for moving the imaging unit or the irradiation unit, and one of the imaging unit and the irradiation unit is set to a use position according to the progress of the pattern transfer process. Control means for controlling the moving means to be arranged.
本発明の第4の特徴による転写装置は、第1モールドに形成されたパターンを被転写体の第1面に転写し、且つ第2モールドに形成されたパターンを前記被転写体の第2面に転写する一連の転写処理を行う転写装置であって、前記被転写体を支持する第1支持機構と、前記第1支持機構を第1方向に駆動させる第1支持機構駆動手段と、エネルギー線を前記被転写体の前記第1面に向けて照射する第1照射手段と、エネルギー線を前記被転写体の前記第2面に向けて照射する第2照射手段と、前記被転写体と前記第1及び第2モールドのアライメント用の撮影手段と、前記被転写体を支持する第2支持機構と、前記第2支持機構を移動させる第2支持機構駆動手段と、前記撮影手段、前記第1支持機構駆動手段、又は前記第1照射手段を移動させる第1移動手段と、前記第2支持機構駆動手段、又は前記第2照射手段を移動させる第2移動手段と、パターン転写処理の進捗に応じて、前記撮影手段、前記第1支持機構駆動手段及び前記第1照射手段の内の一方を選択的に第1使用位置に移動させるように前記第1移動手段を制御し、前記第2支持機構駆動手段及び前記第2照射手段の内の一方を選択的に第2使用位置に移動するように前記第2移動手段を制御する制御手段と、を有する。
The transfer device according to the fourth aspect of the present invention transfers the pattern formed on the first mold to the first surface of the transfer object, and transfers the pattern formed on the second mold to the second surface of the transfer object. A transfer device that performs a series of transfer processes to be transferred to a first support mechanism, a first support mechanism that supports the transfer object, a first support mechanism driving unit that drives the first support mechanism in a first direction, and an energy beam First irradiating means for irradiating the first surface of the transferred body, second irradiating means for irradiating energy rays toward the second surface of the transferred body, the transferred body and the Imaging means for alignment of the first and second molds, a second support mechanism for supporting the transferred object, a second support mechanism driving means for moving the second support mechanism, the imaging means, and the first Transfer the support mechanism driving means or the first irradiation means. A first moving means for moving the second supporting mechanism driving means, a second moving means for moving the second irradiating means, and the photographing means and the first supporting mechanism driving means according to the progress of the pattern transfer process. And controlling one of the first irradiation means to selectively move one of the first irradiation means to the first use position, and moving one of the second support mechanism driving means and the second irradiation means to one of the first irradiation means. Control means for controlling the second moving means so as to selectively move to the second use position.
本発明の第5の特徴による転写装置は、モールドに形成されたパターンを被転写体に転写する一連の転写処理を行う転写装置であって、前記被転写体を支持する支持機構を第1方向に駆動させる支持機構駆動手段、及びエネルギー線を前記被転写体に向けて照射する照射手段が夫々設置されているスライドテーブルと、前記支持機構駆動手段及び前記照射手段の内の一方を使用位置に配置させるべく前記スライドテーブルを移動させる移動制御手段と、からなるデバイスステーションを備える。
A transfer device according to a fifth aspect of the present invention is a transfer device that performs a series of transfer processes for transferring a pattern formed on a mold to a transfer target, and has a support mechanism that supports the transfer target in a first direction. One of the support mechanism driving means and the irradiating means is set to the use position. And a movement control means for moving the slide table to be arranged.
本発明の第6の特徴による転写装置は、モールドに形成されたパターンを被転写体に転写する一連の転写処理を行う転写装置であって、前記被転写体を支持する支持機構を第1方向に駆動させる支持機構駆動手段、及び前記被転写体と前記モールドのアライメント用の撮影手段が夫々設置されているスライドテーブルと、前記支持機構駆動手段及び前記撮影手段の内の一方を使用位置に配置させるべく前記スライドテーブルを移動させる移動制御手段と、からなるデバイスステーションを備える。
A transfer device according to a sixth aspect of the present invention is a transfer device that performs a series of transfer processes for transferring a pattern formed on a mold to a transfer target, and has a support mechanism that supports the transfer target in a first direction. A support mechanism driving means to be driven, a slide table on which an imaging means for alignment of the transferred object and the mold is respectively installed, and one of the support mechanism driving means and the imaging means is arranged at a use position And a movement control means for moving the slide table to allow the device station to be provided.
本発明の第7の特徴による転写装置は、モールドに形成されたパターンを被転写体に転写する一連の転写処理を行う転写装置であって、前記被転写体と前記モールドのアライメント用の撮影手段、及びエネルギー線を前記被転写体に向けて照射する照射手段が夫々設置されているスライドテーブルと、前記撮影手段及び前記照射手段の内の一方を使用位置に配置させるべく前記スライドテーブルを移動させる移動制御手段と、からなるデバイスステーションを備える。
A transfer device according to a seventh aspect of the present invention is a transfer device for performing a series of transfer processes for transferring a pattern formed on a mold to a transfer target, and an imaging unit for alignment of the transfer target and the mold , And a slide table on which irradiation means for irradiating an energy beam toward the transfer object is installed, and the slide table is moved so that one of the photographing means and the irradiation means is placed at a use position. And a device station comprising movement control means.
被転写体及びモールドの基準位置を一致させて夫々を支持する支持機構を移動させる支持機構駆動手段と、基板の表面を硬化させる光を照射する光照射手段とが設置されるステージ上において、基板に対する光照射手段及び支持機構駆動手段の設置位置を移動可能にする。
On a stage on which a support mechanism driving means for moving a support mechanism for supporting the transfer object and the mold at the same reference position and a light irradiation means for irradiating light for curing the surface of the substrate are placed on the stage. The installation position of the light irradiating means and the support mechanism driving means with respect to can be moved.
以下、本発明に係る実施の形態について図面を参照して説明する。なお、以下の説明における例示が本発明を限定することはない。
Embodiments according to the present invention will be described below with reference to the drawings. In addition, the illustration in the following description does not limit this invention.
図1は、本発明によるUV(Ultraviolet)式のインプリント装置の概略断面構造を示す図である。
FIG. 1 is a view showing a schematic cross-sectional structure of a UV (Ultraviolet) type imprint apparatus according to the present invention.
このインプリント装置は、転写すべき凹凸パターンが形成されている上側モールド503a及び下側モールド503bを用いて、パターンの転写対象となる被転写体としての基板6に対して両面にパターン転写を行うものである。なお、本明細書において被転写体を基板と称する。ここで基板とは、被転写層を含む構成を指すものとする。また、支持機構とはセンターピンを指す。基板6の両面には、紫外線が照射されると硬化する転写材料からなる上側転写層604a及び下側転写層604bが形成されている。尚、図1では、これら基板6、上側モールド503a及び下側モールド503bが設置された状態で、インプリント装置の構成を示している。
This imprint apparatus uses the upper mold 503a and the lower mold 503b on which the concavo-convex pattern to be transferred is formed to perform pattern transfer on both sides of the substrate 6 as a transfer target to be transferred. Is. In this specification, the transfer target is referred to as a substrate. Here, the substrate refers to a configuration including a layer to be transferred. The support mechanism refers to a center pin. On both surfaces of the substrate 6, an upper transfer layer 604a and a lower transfer layer 604b made of a transfer material that is cured when irradiated with ultraviolet rays are formed. In FIG. 1, the configuration of the imprint apparatus is shown in a state in which the substrate 6, the upper mold 503a, and the lower mold 503b are installed.
図1に示すインプリント装置は、上側機構部、下側機構部、これら上側機構部及び下側機構部を制御するコントローラ200及び操作部201から構成される。
The imprint apparatus shown in FIG. 1 includes an upper mechanism unit, a lower mechanism unit, a controller 200 that controls the upper mechanism unit and the lower mechanism unit, and an operation unit 201.
上側機構部は、上側センターピン30a、カメラユニット40、上側デバイスステーション90a、上側モールドXYステージ500a、上側モールド保持部501a、上側ステージ505a、上側センターピン駆動ユニット507a、上側UV照射ユニット508a、を備える。尚、本実施例では、後述する下側センターピン30bの先端部を撮影するために、上側センターピン30aと上側センターピン駆動ユニット507aは一体構成としている。すなわち、上側センターピン駆動ユニット507aの移動によって、上側センターピン30aも同じく移動することになる。
The upper mechanism unit includes an upper center pin 30a, a camera unit 40, an upper device station 90a, an upper mold XY stage 500a, an upper mold holding unit 501a, an upper stage 505a, an upper center pin driving unit 507a, and an upper UV irradiation unit 508a. . In the present embodiment, the upper center pin 30a and the upper center pin drive unit 507a are integrally formed in order to photograph a tip portion of a lower center pin 30b described later. That is, the upper center pin 30a is also moved by the movement of the upper center pin driving unit 507a.
ボード状の上側ステージ505aには、図1に示す如き開口部100aと共に、後述するボールネジ512がねじ込まれるネジ溝が切られているネジ穴部が存在する。
The board-like upper stage 505a has a screw hole portion in which a screw groove into which a ball screw 512 (to be described later) is screwed is formed, along with an opening portion 100a as shown in FIG.
上側ステージ505aの下面には、開口部100aと連続する開口部を有する上側モールドXYステージ500aが設置されている。上側モールドXYステージ500a上には、その開口部を覆うように透明材料からなる上側モールド保持部501aが設置されている。上側モールドXYステージ500aは、コントローラ200から供給された上側XYステージ移動信号XYUに応じて、上側モールド保持部501aを、上側ステージ505aの下面に対する2次元の各方向に移動させる。上側モールド保持部501aは、上側モールド503aを保持させる為のモールド保持面(図1において上側モールド503aが接触している面)を備えている。又、上側モールド保持部501aの中心部には、上側センターピン30aを上側モールド保持部501aのモールド保持面に対して垂直な方向において上下移動可能とする貫通孔が設けられている。
An upper mold XY stage 500a having an opening continuous with the opening 100a is installed on the lower surface of the upper stage 505a. On the upper mold XY stage 500a, an upper mold holding part 501a made of a transparent material is installed so as to cover the opening. Upper mold XY stage 500a is according to the supplied upper XY stage movement signal XY U from the controller 200, the upper mold holding portion 501a, it is moved in the direction of the two-dimensional with respect to the lower surface of the upper stage 505a. The upper mold holding part 501a includes a mold holding surface (a surface with which the upper mold 503a is in contact in FIG. 1) for holding the upper mold 503a. A through hole is provided in the center of the upper mold holding part 501a so that the upper center pin 30a can be moved up and down in a direction perpendicular to the mold holding surface of the upper mold holding part 501a.
上側モールド保持部501aは、コントローラ200から供給された上側モールド保持信号MHUに応じて、例えば、真空吸着することにより、上側モールド503aをモールド保持面に保持する。尚、上側モールド503aをモールド保持面に保持する方法は、真空吸着に限られず機械式方法で保持するようにしても良い。
The upper mold holding unit 501a, in accordance with the upper mold holding signal MH U supplied from the controller 200, for example, by vacuum suction, and holds the upper mold 503a on the mold holding surface. The method of holding the upper mold 503a on the mold holding surface is not limited to vacuum suction and may be held by a mechanical method.
上側ステージ505aの上面には、上側デバイスステーション90aが設置されている。上側デバイスステーション90aは、カメラユニット40、上側センターピン駆動ユニット507a及び上側UV照射ユニット508aの内で、コントローラ200から供給されたユニット指定信号USUによっていずれか1つのユニットを開口部100aの中心位置に移動させる。又、上側デバイスステーション90aは、コントローラ200から供給されたユニット位置調整信号UPUの距離だけ上記で選択されたユニットの設置位置を移動させる。
An upper device station 90a is installed on the upper surface of the upper stage 505a. The upper device station 90a, the camera unit 40, among the upper center pin drive unit 507a and the upper UV irradiation unit 508a, the center position of the opening 100a of one of the units by the supplied unit designation signal US U from the controller 200 Move to. The upper device station 90a moves the installation position of the unit selected above by the distance of the unit position adjustment signal UP U supplied from the controller 200.
図2Aは、上面から眺めた上側デバイスステーション90aの概略構成を示す図であり、図2Bは側面から眺めた上側デバイスステーション90aの概略構成を示す図である。
FIG. 2A is a diagram illustrating a schematic configuration of the upper device station 90a viewed from the top surface, and FIG. 2B is a diagram illustrating a schematic configuration of the upper device station 90a viewed from the side surface.
図2A及び図2Bに示すように、上側デバイスステーション90aは、カメラユニット40、上側センターピン駆動ユニット507a及び上側UV照射ユニット508aの各ユニットが設置されるスライドテーブル901aと、スライドテーブル901aを移動させる為のガイドレール902aとから構成される。図2Aに示すように、ガイドレール902aは、上側ステージ505aの開口部100aの領域を挟んで互いに平行な状態で配置されている2本のレールからなる。又、図2Bに示すように、スライドテーブル901aには、各ユニットが配置されるべき位置に夫々開口部が設けられている。スライドテーブル901aは、コントローラ200から供給されたユニット指定信号USUに応じて、指定されたユニット(カメラユニット40、上側センターピン駆動ユニット507a又は上側UV照射ユニット508a)のみが開口部100aの中心に配置されるように、ガイドレール902aに沿って移動する。
As shown in FIGS. 2A and 2B, the upper device station 90a moves the slide table 901a and the slide table 901a on which the camera unit 40, the upper center pin driving unit 507a, and the upper UV irradiation unit 508a are installed. And a guide rail 902a. As shown in FIG. 2A, the guide rail 902a includes two rails arranged in parallel with each other across the region of the opening 100a of the upper stage 505a. As shown in FIG. 2B, the slide table 901a is provided with an opening at a position where each unit is to be arranged. Slide table 901a in response to the supplied unit designation signal US U from the controller 200, only the specified unit (camera unit 40, the upper center pin drive unit 507a or the upper UV irradiation unit 508a) is in the center of the opening 100a It moves along the guide rail 902a so as to be arranged.
すなわち、上側デバイスステーション90aは、カメラユニット40、上側センターピン駆動ユニット507a及び上側UV照射ユニット508aの内の1つを選択的に使用位置、すなわち上側ステージ505a上における基板6配置位置の中心位置の上部に移送するのである。ここで使用位置とは、カメラユニット40、上側センターピン駆動ユニット507a及び上側UV照射ユニット508aが、インプリント工程において、その機能を発揮させて使用される位置を指す。従って、カメラユニット40、上側センターピン駆動ユニット507a及び上側UV照射ユニット508aの使用位置は各々同じであってもよいし、異なっていても構わない。
That is, the upper device station 90a selectively uses one of the camera unit 40, the upper center pin driving unit 507a, and the upper UV irradiation unit 508a at the use position, that is, the center position of the substrate 6 arrangement position on the upper stage 505a. It is transferred to the upper part. Here, the use position refers to a position where the camera unit 40, the upper center pin drive unit 507a, and the upper UV irradiation unit 508a are used by performing their functions in the imprint process. Therefore, the use positions of the camera unit 40, the upper center pin driving unit 507a, and the upper UV irradiation unit 508a may be the same or different.
カメラユニット40は、モールド(503a、503b)に形成されているアライメントマークを撮影する為のカメラ401、402及び403と、下側センターピン30bの先端部を撮影する為のカメラ404を備える。カメラ401、402及び403の各々は、スライドテーブル901aの開口部を介してその撮影レンズを上側モールド保持部501aの表面に対して垂直に向けた状態で設置されている。又、カメラ404は、スライドテーブル901aの開口部を介してその撮影レンズを、下側センターピン30bの先端部に対して垂直に向けた状態で設置されている。カメラ401、402、及び、403の各々は、夫々の位置から上側モールド503a、下側モールド503bを撮影して得られた撮影信号PD1、PD2、及び、PD3をコントロ-ラ200に供給する。又、カメラ404は、下側センターピン30bの先端部を撮影して得られた撮影信号PD4をコントロ-ラ200に供給する。
The camera unit 40 has cameras 40 1 , 40 2 and 40 3 for photographing the alignment marks formed on the molds (503a, 503b), and a camera 40 4 for photographing the tip of the lower center pin 30b. Is provided. Each of the cameras 40 1 , 40 2, and 40 3 is installed with its photographing lens oriented perpendicularly to the surface of the upper mold holding unit 501a through the opening of the slide table 901a. Further, the camera 40 4, the photographing lens through the opening in the slide table 901a, are disposed in a state directed perpendicularly to the distal end portion of the lower center pin 30b. Each of the cameras 40 1 , 40 2 , and 40 3 controls the imaging signals PD 1 , PD 2 , and PD 3 obtained by imaging the upper mold 503a and the lower mold 503b from the respective positions. 200. The camera 40 4 supplies the controller 200 with a photographing signal PD 4 obtained by photographing the tip of the lower center pin 30b.
上側UV照射ユニット508aは、コントローラ200から供給された紫外線照射信号UVに応じて、転写材料を硬化させるべき紫外線を、スライドテーブル901aの開口部、上側ステージ505aの開口部100a及び上側モールド保持部501aを介して、基板6の上側転写層604aに向けて照射する。
The upper UV irradiation unit 508a applies ultraviolet rays to cure the transfer material in accordance with the ultraviolet irradiation signal UV supplied from the controller 200, the opening of the slide table 901a, the opening 100a of the upper stage 505a, and the upper mold holding unit 501a. Then, the light is irradiated toward the upper transfer layer 604a of the substrate 6.
上側センターピン駆動ユニット507aは、コントローラ200から供給された上側センターピン移動信号CGUに応じて、上側センターピン30aを、その中心軸の方向において上側又は下側に移動させる。尚、上側センターピン30aは、下方向の移動により、上側モールド503aの中心孔を通過して基板6の中心孔近傍を支持する。さらに、後述する下側センターピン30bと共に基板6の中心孔近傍を支持ことによって、基板6が保持される。また、上側センターピン駆動ユニット507aには、上側センターピン30aを回転させる機構を設けても良い。
Upper center pin drive unit 507a in accordance with the upper center pin movement signal CG U supplied from the controller 200, the upper center pin 30a, is moved to the upper or lower side in the direction of its central axis. The upper center pin 30a supports the vicinity of the center hole of the substrate 6 through the center hole of the upper mold 503a by moving downward. Furthermore, the board | substrate 6 is hold | maintained by supporting the center hole vicinity of the board | substrate 6 with the lower side center pin 30b mentioned later. The upper center pin drive unit 507a may be provided with a mechanism for rotating the upper center pin 30a.
インプリント装置の下側機構部は、下側センターピン30b、下側デバイスステーション90b、下側モールドXYステージ500b、下側モールド保持部501b、下側ステージ505b、下側センターピン駆動ユニット507b、下側UV照射ユニット508b、ステージ上下駆動ユニット511及びボールネジ512を備える。
The lower mechanism part of the imprint apparatus includes a lower center pin 30b, a lower device station 90b, a lower mold XY stage 500b, a lower mold holding part 501b, a lower stage 505b, a lower center pin drive unit 507b, a lower part A side UV irradiation unit 508b, a stage vertical drive unit 511, and a ball screw 512 are provided.
ボード状の下側ステージ505bには、図1に示す如き開口部100bと共に、ボールネジ512が貫通する貫通孔が存在する。ボールネジ512は、下側ステージ505bと上側ステージ505aの平行状態を維持させたまま両者を連結するように、その一端が下側ステージ505bの貫通孔を貫通し、他端が上側ステージ505aのネジ穴部にネジ込まれている。
The board-like lower stage 505b has a through hole through which the ball screw 512 passes, together with the opening 100b as shown in FIG. One end of the ball screw 512 passes through the through hole of the lower stage 505b so that the lower stage 505b and the upper stage 505a are maintained in a parallel state, and the other end is threaded in the upper stage 505a. It is screwed into the part.
下側ステージ505bの上面には、開口部100bよりも大なる開口部を有する下側モールドXYステージ500bが設置されている。下側モールドXYステージ500b上には、その開口部を覆うように透明材料からなる下側モールド保持部501bが設置されている。下側モールドXYステージ500bは、コントローラ200から供給された下側XYステージ移動信号XYLに応じて、下側モールド保持部501bを、下側ステージ505bの下面に対する2次元の各方向において移動させる。下側モールド保持部501bは、下側モールド503bを保持させる為のモールド保持面(図1において下側モールド503bが接触している面)を備えている。又、下側モールド保持部501bの中心部には、下側センターピン30bを下側モールド保持部501bのモールド保持面に対して垂直な方向において上下移動可能な状態で支持する為の貫通孔が設けられている。
A lower mold XY stage 500b having an opening larger than the opening 100b is installed on the upper surface of the lower stage 505b. On the lower mold XY stage 500b, a lower mold holding part 501b made of a transparent material is installed so as to cover the opening. The lower mold XY stage 500b moves the lower mold holding portion 501b in each of two-dimensional directions with respect to the lower surface of the lower stage 505b in accordance with the lower XY stage movement signal XY L supplied from the controller 200. The lower mold holding part 501b includes a mold holding surface (a surface with which the lower mold 503b is in contact in FIG. 1) for holding the lower mold 503b. In addition, a through-hole for supporting the lower center pin 30b in a vertically movable state in a direction perpendicular to the mold holding surface of the lower mold holding portion 501b is formed at the center of the lower mold holding portion 501b. Is provided.
下側モールド保持部501bは、コントローラ200から供給された下側モールド保持信号MHLに応じて、例えば、真空吸着によって下側モールド503bをモールド保持面に保持する。尚、下側モールド503bをモールド保持面に保持する方法は、真空吸着に限られず機械式方法で保持するようにしても良い。
Lower mold holding portion 501b in accordance with the lower mold holding signal MH L supplied from the controller 200, for example, to hold the lower mold 503b to the mold holding surface by vacuum suction. The method of holding the lower mold 503b on the mold holding surface is not limited to vacuum suction and may be held by a mechanical method.
下側UV照射ユニット508bは、コントローラ200から供給された紫外線照射信号UVに応じて、転写材料を硬化させるべき紫外線を、上記開口部100a及び上側モールド保持部501bを介して、基板6の下側転写層604bに向けて照射する。
The lower UV irradiation unit 508b transmits ultraviolet light to be cured on the transfer material in accordance with the ultraviolet irradiation signal UV supplied from the controller 200 via the opening 100a and the upper mold holding unit 501b. Irradiation is performed toward the transfer layer 604b.
下側センターピン駆動ユニット507bは、コントローラ200から供給された下側センターピン移動信号CGLに応じて、下側センターピン30bを、下側モールド保持部501bのモールド保持面に対して垂直な方向、つまり下側センターピン30bの中心軸方向において上側又は下側に移動させる。尚、下側センターピン駆動ユニット507bには、下側センターピン30bを回転させる機構を設けても良い。
Lower center pin drive unit 507b in accordance with the lower center pin moving signal CG L supplied from the controller 200, a lower center pin 30b, a direction perpendicular to the mold holding surface of the lower mold holding portion 501b That is, the upper center pin 30b is moved upward or downward in the central axis direction. The lower center pin drive unit 507b may be provided with a mechanism for rotating the lower center pin 30b.
下側ステージ505bの下面にはステージ上下駆動ユニット511及び下側デバイスステーション90bが設けられている。
A stage vertical drive unit 511 and a lower device station 90b are provided on the lower surface of the lower stage 505b.
ステージ上下駆動ユニット511は、コントローラ200から供給されたステージ駆動信号SGに応じて、ボールネジ512を時計方向又は反時計方向に回転させることにより、上側ステージ505aを、下側ステージ505bに対する平行状態を維持したまま上方向又は下方向に移動させる。すなわち、上側ステージ505aの上方向への移動により、上側モールド保持部501aが、下側モールド保持部501bのモールド保持面に対して垂直な方向において下側モールド保持部501bから離間するように移動する。一方、上側ステージ505aの下方向への移動により、上側モールド保持部501aが、下側モールド保持部501bに向けて移動する。
The stage vertical drive unit 511 maintains the upper stage 505a parallel to the lower stage 505b by rotating the ball screw 512 clockwise or counterclockwise according to the stage drive signal SG supplied from the controller 200. Move it up or down. That is, the upward movement of the upper stage 505a causes the upper mold holding part 501a to move away from the lower mold holding part 501b in a direction perpendicular to the mold holding surface of the lower mold holding part 501b. . On the other hand, the upper mold holding part 501a moves toward the lower mold holding part 501b by the downward movement of the upper stage 505a.
下側デバイスステーション90bは、下側センターピン駆動ユニット507b及び下側UV照射ユニット508bの内で、コントローラ200から供給されたユニット指定信号USLによっていずれか1つのユニットを開口部100bの中心位置に移動させる。又、下側デバイスステーション90bは、コントローラ200から供給されたユニット位置調整信号UPLの距離だけ上記で選択されたユニットの設置位置を移動させる。
Lower device station 90b is within the lower center pin drive unit 507b and the lower UV irradiation unit 508b, any one of the units by the supplied unit designation signal US L from the controller 200 to the center position of the opening 100b Move. The lower device station 90b moves the installation position of the unit selected above by the distance of the unit position adjustment signal UP L supplied from the controller 200.
図3Aは、上面から眺めた下側デバイスステーション90bの概略構成を示す図であり、図3Bは側面から眺めた下側デバイスステーション90bの概略構成を示す図である。
FIG. 3A is a diagram showing a schematic configuration of the lower device station 90b viewed from the top surface, and FIG. 3B is a diagram showing a schematic configuration of the lower device station 90b viewed from the side surface.
図3A及び図3Bに示すように、下側デバイスステーション90bは、下側センターピン駆動ユニット507b及び下側UV照射ユニット508bの各ユニットが設置されるスライドテーブル901bと、スライドテーブル901bを移動させる為のガイドレール902bとから構成される。尚、図3Aに示すように、ガイドレール902bは、下側ステージ505bの開口部100bの領域を挟んで互いに平行な状態で配置されている2本のレールからなる。又、図3Bに示すように、スライドテーブル901bには、各ユニットが配置されるべき位置に夫々開口部が設けられている。スライドテーブル901bは、コントローラ200から供給されたユニット指定信号USLに応じて、指定されたユニット(下側センターピン駆動ユニット507b又は下側UV照射ユニット508b)のみが開口部100bの中心位置に配置されるように、ガイドレール902bに沿って移動する。
As shown in FIGS. 3A and 3B, the lower device station 90b moves the slide table 901b on which the lower center pin driving unit 507b and the lower UV irradiation unit 508b are installed, and the slide table 901b. Guide rail 902b. As shown in FIG. 3A, the guide rail 902b is composed of two rails arranged in parallel with each other across the region of the opening 100b of the lower stage 505b. Further, as shown in FIG. 3B, the slide table 901b is provided with an opening at a position where each unit is to be arranged. Slide table 901b, in response to the supplied units specified signal US L from the controller 200, located only specified unit (lower center pin drive unit 507b or the lower UV irradiation unit 508b) is in the center position of the opening 100b As shown, it moves along the guide rail 902b.
すなわち、下側デバイスステーション90bは、下側センターピン駆動ユニット507b及び下側UV照射ユニット508bの内の1つを選択的に使用位置、すなわち下側ステージ505b上における基板6配置位置の中心位置に移送するのである。
That is, the lower device station 90b selectively uses one of the lower center pin drive unit 507b and the lower UV irradiation unit 508b at the use position, that is, the center position of the substrate 6 arrangement position on the lower stage 505b. It is transported.
下側UV照射ユニット508bは、コントローラ200から供給された紫外線照射信号UVに応じて、転写材料を硬化させるべき紫外線を、スライドテーブル901bの開口部、下側ステージ505bの開口部100b及び下側モールド保持部501bを介して、基板6の下側転写層604bに向けて照射する。
The lower UV irradiation unit 508b generates ultraviolet rays for curing the transfer material in accordance with the ultraviolet irradiation signal UV supplied from the controller 200, the opening of the slide table 901b, the opening 100b of the lower stage 505b, and the lower mold. Irradiation is performed toward the lower transfer layer 604b of the substrate 6 through the holding portion 501b.
下側センターピン駆動ユニット507bは、コントローラ200から供給された下側センターピン移動信号CGLに応じて、下側センターピン30bを、その中心軸の方向において上側又は下側に移動させる。尚、下側センターピン30bには、上側モールド503aまたは下側モールド503bを支持する第1支持部TB1及び基板6を支持する第2支持部TB2が夫々形成されている。
Lower center pin drive unit 507b in accordance with the lower center pin moving signal CG L supplied from the controller 200, a lower center pin 30b, is moved to the upper or lower side in the direction of its central axis. The lower center pin 30b is formed with a first support portion TB1 that supports the upper mold 503a or the lower mold 503b and a second support portion TB2 that supports the substrate 6, respectively.
操作部201は、このインプリント装置を動作させるべく、使用者によって指示された各種動作指令を受け付け、その動作指令を示す動作指令信号をコントローラ200に供給する。コントローラ200は、操作部201から供給された動作指令信号にて示される動作に対応した処理プログラムを実行することにより、インプリント装置を制御する為の各種制御信号を生成する。
The operation unit 201 accepts various operation commands instructed by the user to operate the imprint apparatus, and supplies an operation command signal indicating the operation command to the controller 200. The controller 200 generates various control signals for controlling the imprint apparatus by executing a processing program corresponding to the operation indicated by the operation command signal supplied from the operation unit 201.
ここで、操作部201が、使用者からのインプリント実行指令を受け付けると、コントローラ200は、インプリント処理プログラムを実行する。
Here, when the operation unit 201 receives an imprint execution command from the user, the controller 200 executes an imprint processing program.
以下に、かかるナノインプリント処理プログラムの実行によって為されるパターン転写動作について説明する。
The pattern transfer operation performed by executing the nanoimprint processing program will be described below.
図1に示す如く、インプリント装置に基板6、上側モールド503a及び下側モールド503b各々が装着されると、コントローラ200は、先ず、これら基板6、上側モールド503a及び下側モールド503b各々の位置合わせ行う(以下、アライメントと称する)。コントローラ200は、先ず、カメラユニット40を指定するユニット指定信号USUを上側デバイスステーション90aに供給する。これにより、上側デバイスステーション90aのスライドテーブル901aは、カメラユニット40を開口部100aの中心位置に配置すべくガイドレール902aに沿って移動する。ここで、コントローラ200は、カメラユニット40のカメラ401~404にて撮影して得られた撮影信号PD1~PD4に基づき、基板6、上側モールド503a及び下側モールド503b各々の相対位置関係を検出し、これが所定の相対位置関係となるように上側モールドXYステージ500a及び/又は下側モールドXYステージ500bを制御する。
As shown in FIG. 1, when the substrate 6, the upper mold 503a, and the lower mold 503b are mounted on the imprint apparatus, the controller 200 first aligns each of the substrate 6, the upper mold 503a, and the lower mold 503b. (Hereinafter referred to as alignment). The controller 200 first supplies a unit designation signal US U that specifies the camera unit 40 to the upper device station 90a. Thereby, the slide table 901a of the upper device station 90a moves along the guide rail 902a so as to arrange the camera unit 40 at the center position of the opening 100a. Here, the controller 200 determines the relative positions of the substrate 6, the upper mold 503a, and the lower mold 503b based on the imaging signals PD 1 to PD 4 obtained by imaging with the cameras 40 1 to 40 4 of the camera unit 40. The relationship is detected, and the upper mold XY stage 500a and / or the lower mold XY stage 500b is controlled so that this becomes a predetermined relative positional relationship.
かかるアライメント終了後、コントローラ200は、上側モールド503a及び下側モールド503bを基板6に押圧させるべく、上側ステージ505aを下方向に移動させるステージ駆動信号SGをステージ上下駆動ユニット511に供給する。これにより、基板6の両面が、上側モールド503a及び下側モールド503bによって押圧され、その状態が保持される。つまり、上側モールド503aに形成されている凹凸パターンが上側転写層604aに押圧されると共に、下側モールド503bに形成されている凹凸パターンが下側転写層604bに夫々押圧される。上側転写層604a及び下側転写層604bは液状(流動可能状態)にあるため、上側転写層604aが上側モールド503aに形成されている凹凸パターン形状に沿って変形すると共に、下側転写層604bが下側モールド503bに形成されている凹凸パターン形状に沿って夫々変形する。
After the alignment, the controller 200 supplies a stage drive signal SG for moving the upper stage 505a downward to the stage vertical drive unit 511 so as to press the upper mold 503a and the lower mold 503b against the substrate 6. Thereby, both surfaces of the substrate 6 are pressed by the upper mold 503a and the lower mold 503b, and the state is maintained. That is, the concavo-convex pattern formed on the upper mold 503a is pressed against the upper transfer layer 604a, and the concavo-convex pattern formed on the lower mold 503b is pressed against the lower transfer layer 604b. Since the upper transfer layer 604a and the lower transfer layer 604b are in a liquid state (flowable state), the upper transfer layer 604a is deformed along the uneven pattern shape formed on the upper mold 503a, and the lower transfer layer 604b is Each deforms along the uneven pattern shape formed in the lower mold 503b.
その後、コントローラ200は、基板6の上側転写層604a及び下側転写層604b各々を硬化させるべく、先ず、上側UV照射ユニット508aを指定するユニット指定信号USUを上側デバイスステーション90aに供給すると共に、下側UV照射ユニット508bを指定するユニット指定信号USLを下側デバイスステーション90bに供給する。これにより、上側デバイスステーション90aのスライドテーブル901aは、カメラユニット40に代わり上側UV照射ユニット508aを開口部100aの中心位置に配置すべく、ガイドレール902aに沿って移動する。更に、下側デバイスステーション90bのスライドテーブル901bは、下側センターピン駆動ユニット507bに代わり下側UV照射ユニット508bを開口部100bの中心位置に配置すべく、ガイドレール902bに沿って移動する。そして、コントローラ200は、紫外線照射信号UVを上側UV照射ユニット508a及び下側UV照射ユニット508bに供給する。すると、上側UV照射ユニット508aが転写層材料を硬化させるべき紫外線を基板6の上側転写層604aに向けて照射すると共に、下側UV照射ユニット508bが転写層材料を硬化させるべき紫外線を下側転写層604bに向けて照射する。これにより、上側転写層604a及び下側転写層604b各々の転写層が硬化し、上側転写層604a及び下側転写層604b表面の凹凸パターンが確定する。
Thereafter, the controller 200, in order to cure the upper transfer layer 604a and a lower transfer layer 604b each substrate 6, firstly, to supply the unit designation signal US U that specifies the upper UV irradiation unit 508a on the upper device station 90a, supplying unit designation signal US L specifying the lower UV irradiation unit 508b to the lower device station 90b. Thereby, the slide table 901a of the upper device station 90a moves along the guide rail 902a so as to place the upper UV irradiation unit 508a at the center position of the opening 100a instead of the camera unit 40. Further, the slide table 901b of the lower device station 90b moves along the guide rail 902b in order to place the lower UV irradiation unit 508b at the center position of the opening 100b instead of the lower center pin driving unit 507b. Then, the controller 200 supplies the ultraviolet irradiation signal UV to the upper UV irradiation unit 508a and the lower UV irradiation unit 508b. Then, the upper UV irradiation unit 508a irradiates the upper transfer layer 604a of the substrate 6 with ultraviolet rays that should cure the transfer layer material, and the lower UV irradiation unit 508b transfers lower ultraviolet rays that should cure the transfer layer material. Irradiation is performed toward the layer 604b. Thereby, the transfer layers of the upper transfer layer 604a and the lower transfer layer 604b are cured, and the uneven pattern on the surfaces of the upper transfer layer 604a and the lower transfer layer 604b is determined.
次に、コントローラ200は、上側モールド503a及び下側モールド503bから基板6を離型させるべく、先ず、上側センターピン駆動ユニット507aを指定するユニット指定信号USUを上側デバイスステーション90aに供給すると共に、下側センターピン駆動ユニット507bを指定するユニット指定信号USLを下側デバイスステーション90bに供給する。これにより、上側デバイスステーション90aのスライドテーブル901aは、上側UV照射ユニット508aに代わり上側センターピン駆動ユニット507aを開口部100aの中心位置に配置すべく、ガイドレール902aに沿って移動する。更に、下側デバイスステーション90bのスライドテーブル901bが、下側UV照射ユニット508bに代わり下側センターピン駆動ユニット507bを開口部100bの中心位置に配置すべく、ガイドレール902bに沿って移動する。次に、コントローラ200は、上側センターピン30aを下方向に移動させるべき上側センターピン移動信号CGUを上側センターピン駆動ユニット507aに供給すると共に、下側センターピン30bを上方向に移動させるべき下側センターピン移動信号CGLを下側センターピン駆動ユニット507bに供給する。すると、下側センターピン30bと共に基板6が上方向に移動すると共に、上側センターピン30a及び下側センターピン30bの先端部同士が接合される。これにより、上側モールド503aが基板6の上側転写層604aから離型すると共に、下側モールド503bから基板6が離型する。
Next, the controller 200, in order to release the substrate 6 from the upper mold 503a and the lower mold 503b, first, supplies the unit designation signal US U that specifies the upper center pin drive unit 507a to the upper device station 90a, supplying unit designation signal US L specifying the lower center pin drive unit 507b to the lower device station 90b. Thereby, the slide table 901a of the upper device station 90a moves along the guide rail 902a so as to place the upper center pin driving unit 507a at the center position of the opening 100a instead of the upper UV irradiation unit 508a. Further, the slide table 901b of the lower device station 90b moves along the guide rail 902b so as to place the lower center pin driving unit 507b at the center of the opening 100b instead of the lower UV irradiation unit 508b. Next, the controller 200, the lower should supplies upper center pin moving signal CG U to move the upper center pin 30a in a downward direction to the upper center pin drive unit 507a, move the lower center pin 30b upward supplying side center pin movement signal CG L below the center pin drive unit 507b. Then, the substrate 6 moves upward together with the lower center pin 30b, and the upper end portions of the upper center pin 30a and the lower center pin 30b are joined to each other. Thereby, the upper mold 503a is released from the upper transfer layer 604a of the substrate 6, and the substrate 6 is released from the lower mold 503b.
このように、図1に示すインプリント装置には、モールド(503a、503b)を基板6に押圧する為の動作を担う各種機構部品(501a、501b、505a、505b、511、512)と共に、上述した如きアライメント、転写層の硬化、基板・モールドの離型を夫々担う各種補助装置が搭載されている。すなわち、上述した如きアライメントを実施する際に使用するカメラユニット40と、基板6からモールド(503a、503b)を離型する際に使用する上側センターピン駆動ユニット507aと、上側転写層604aを硬化させるべき紫外線光を発する上側UV照射ユニット508aとが、上側ステージ505a上に設けられている。又、基板6及び下側モールド503bを支持する下側センターピン30bを駆動する下側センターピン駆動ユニット507bと、下側転写層604bを硬化させるべき紫外線光を発する下側UV照射ユニット508bとが、下側ステージ505b上に設けられている。この際、上記の如き補助装置としてのカメラユニット40、上側センターピン駆動ユニット507a及び上側UV照射ユニット508aは、図2A及び図2Bに示す如く、ガイドレール902aに沿って移動するスライドテーブル901a上に夫々配置されている。スライドテーブル901aは、コントローラ200から供給されたユニット指定信号USUによって示される1ユニット(カメラユニット40、上側センターピン駆動ユニット507a又は上側UV照射ユニット508a)のみが上側ステージ505aの開口部100aの中心に位置するように、ガイドレール902aに沿って移動する。又、補助装置としての下側センターピン駆動ユニット507b及び下側UV照射ユニット508bは、図3A及び図3Bに示す如く、ガイドレール902bに沿って移動するスライドテーブル901b上に夫々配置されている。スライドテーブル901bは、コントローラ200から供給されたユニット指定信号USLに応じて、このユニット指定信号USLにて示される1ユニット(下側センターピン駆動ユニット507b又は下側UV照射ユニット508b)のみが開口部100bの中心に配置されるように、ガイドレール902bに沿って移動する。
As described above, the imprint apparatus shown in FIG. 1 includes the above-described various mechanical components (501a, 501b, 505a, 505b, 511, 512) responsible for the operation for pressing the mold (503a, 503b) against the substrate 6. Various auxiliary devices for mounting the alignment, curing the transfer layer, and releasing the substrate / mold are mounted. That is, the camera unit 40 used for performing the alignment as described above, the upper center pin driving unit 507a used for releasing the mold (503a, 503b) from the substrate 6, and the upper transfer layer 604a are cured. An upper UV irradiation unit 508a that emits power ultraviolet light is provided on the upper stage 505a. Further, a lower center pin driving unit 507b that drives the lower center pin 30b that supports the substrate 6 and the lower mold 503b, and a lower UV irradiation unit 508b that emits ultraviolet light to cure the lower transfer layer 604b. Are provided on the lower stage 505b. At this time, the camera unit 40, the upper center pin driving unit 507a, and the upper UV irradiation unit 508a as the auxiliary devices as described above are placed on a slide table 901a that moves along the guide rail 902a as shown in FIGS. 2A and 2B. Each is arranged. Slide table 901a, the center of one unit (camera unit 40, the upper center pin drive unit 507a or the upper UV irradiation unit 508a) only the upper stage 505a opening 100a indicated by the supplied unit designation signal US U from the controller 200 It moves along the guide rail 902a so that it may be located in. Further, as shown in FIGS. 3A and 3B, the lower center pin drive unit 507b and the lower UV irradiation unit 508b as auxiliary devices are respectively arranged on a slide table 901b that moves along the guide rail 902b. Slide table 901b, in response to the supplied units specified signal US L from the controller 200, only one unit represented by the unit designation signal US L (lower center pin drive unit 507b or the lower UV irradiation unit 508b) is It moves along the guide rail 902b so as to be arranged at the center of the opening 100b.
よって、かかる構成によれば、転写層を硬化させる光を発する照射ユニット(508a、508b)及び各種調整用補助装置(カメラユニット40、上側センターピン駆動ユニット507a、下側センターピン駆動ユニット507b)各々の内の1つをその使用時において、最適な位置(開口部100a、100bの中心位置)に設置することが可能となる。
Therefore, according to such a configuration, the irradiation units (508a, 508b) that emit light for curing the transfer layer and various adjustment auxiliary devices (camera unit 40, upper center pin drive unit 507a, lower center pin drive unit 507b), respectively. It is possible to install one of the two at the optimum position (the center position of the openings 100a and 100b) during use.
これにより、転写層を硬化させる場合には、転写層を硬化させるべき光を基板6の表面全面に亘って均一に照射できるような位置に、照射ユニット(508a、508b)を移動することができる。従って、照射ユニット(508a、508b)と共に各種補助装置(40、507a、507b)がステージ(505a、505b)上に搭載されていても、照射ユニット(508a、508b)は、基板6の表面全面に亘って均一に転写層硬化用の光を照射することが可能となる。
As a result, when the transfer layer is cured, the irradiation units (508a, 508b) can be moved to a position where the light for curing the transfer layer can be uniformly irradiated over the entire surface of the substrate 6. . Therefore, even if various auxiliary devices (40, 507a, 507b) are mounted on the stage (505a, 505b) together with the irradiation units (508a, 508b), the irradiation units (508a, 508b) are disposed on the entire surface of the substrate 6. It is possible to irradiate light for curing the transfer layer uniformly.
尚、図2A及び図2Bに示す上側デバイスステーション90aでは、カメラユニット40、上側UV照射ユニット508a及び上側センターピン駆動ユニット507aを全て1つのスライドテーブル901a上に設置しているが、3つの夫々独立したスライドテーブル上に各ユニット(40、507a、508a)を設置するようにしても良い。
In the upper device station 90a shown in FIGS. 2A and 2B, the camera unit 40, the upper UV irradiation unit 508a, and the upper center pin drive unit 507a are all installed on one slide table 901a. Each unit (40, 507a, 508a) may be installed on the slide table.
図4A及び図4Bは、かかる点に鑑みて為された上側デバイスステーション90aの他の構成を示す図である。尚、図4Aは上面側、図4Bは側面側から夫々眺めた上側デバイスステーション90aの他の構成を示す図である。
4A and 4B are diagrams showing another configuration of the upper device station 90a made in view of such points. 4A is a diagram showing another configuration of the upper device station 90a viewed from the upper surface side, and FIG. 4B is a diagram viewed from the side surface side.
図4A及び図4Bに示す上側デバイスステーション90aは、カメラユニット40が設置されるスライドテーブル9011、上側センターピン駆動ユニット507aが設置されるスライドテーブル9012、及び上側UV照射ユニット508aが設置されるスライドテーブル9013を個別に備える。この際、スライドテーブル9011及び9013は、上側ステージ505aの開口部100aの領域(波線にて囲まれている領域)を挟んで互いに平行な状態で配置されている2本のガイドレール9021に沿って夫々個別に移動する。一方、スライドテーブル9012は、開口部100aの領域を挟んで互いに平行な状態で配置されており且つ上記ガイドレール9021に直交する2本のガイドレール9022に沿って移動する。ここで、コントローラ200から上側センターピン駆動ユニット507aを指定するユニット指定信号USUが供給されると、スライドテーブル9011~9013の内のスライドテーブル9012のみがガイドレール9022に沿って移動し、上側センターピン駆動ユニット507aを開口部100aの中心に配置する。又、コントローラ200からカメラユニット40を指定するユニット指定信号USUが供給されると、スライドテーブル9011~9013の内のスライドテーブル9011のみがガイドレール9021に沿って移動し、カメラユニット40を開口部100aの中心に配置する。又、コントローラ200から上側UV照射ユニット508aを指定するユニット指定信号USUが供給されると、スライドテーブル9011~9013の内のスライドテーブル9013のみがガイドレール9021に沿って移動し、上側UV照射ユニット508aを開口部100aの中心に配置する。
The upper device station 90a shown in FIGS. 4A and 4B, the slide table 901 1 camera unit 40 is mounted, the slide table 901 2 the upper center pin drive unit 507a is installed, and the upper UV irradiation unit 508a is installed comprising a slide table 901 3 individually. At this time, the slide tables 901 1 and 901 3 have two guide rails 902 1 arranged in parallel with each other across the region of the opening 100a of the upper stage 505a (the region surrounded by the wavy line). Move individually along the line. On the other hand, the slide table 901 2 is arranged in parallel with each other across the region of the opening 100a and moves along the two guide rails 902 2 orthogonal to the guide rail 902 1 . Moving Here, the unit designation signal US U that specifies the upper center pin drive unit 507a from the controller 200 is supplied, only the slide table 901 2 of the slide table 901 1-901 3 along the guide rail 902 2 Then, the upper center pin drive unit 507a is disposed at the center of the opening 100a. Further, the unit designation signal US U that specifies the camera unit 40 from the controller 200 is supplied, only the slide table 901 one of the slide table 901 1-901 3 is moved along the guide rails 902 1, the camera unit 40 is arranged at the center of the opening 100a. When the unit designation signal US U for designating the upper UV irradiation unit 508a is supplied from the controller 200, only the slide table 901 3 among the slide tables 901 1 to 901 3 moves along the guide rail 902 1 , The upper UV irradiation unit 508a is disposed at the center of the opening 100a.
ここで、図1に示されるインプリント装置によるインプリント動作は、ディスクリートトラックメディアやビットパターンドメディア等の磁気記録媒体の製造工程に適用することができる。以下に、上記したインプリント動作を含む磁気ディスクの製造手方法について図5を参照しつつ説明する。
Here, the imprint operation by the imprint apparatus shown in FIG. 1 can be applied to a manufacturing process of a magnetic recording medium such as a discrete track medium or a bit patterned medium. Hereinafter, a method of manufacturing a magnetic disk including the above-described imprint operation will be described with reference to FIG.
まず、ガラス等の紫外線を透過する材料からなる基材の表面に所望とする凹凸パターンを有する上側モールド503a及び下側モールド503bを作製する。凹凸パターンは、例えば電子ビーム描画装置などにより基材上にレジストパターンを形成し、その後、レジストパターンをマスクとしてドライエッチング処理等を行うことによって形成する。
First, an upper mold 503a and a lower mold 503b having a desired concavo-convex pattern on the surface of a base material made of a material such as glass that transmits ultraviolet rays are prepared. The concavo-convex pattern is formed by forming a resist pattern on a substrate using, for example, an electron beam drawing apparatus, and then performing a dry etching process or the like using the resist pattern as a mask.
完成した上側モールド503a及び下側モールド503bには、離型性向上のためシランカップリング剤等により表面処理を施しておく。なお、上側モールド503a及び下側モールド503bを原盤として、インプリント法等で複製したガラス等の紫外線を透過する材料からなる基板を転写用のモールドとして用いても良い。更に、上記方法で作製した複製盤からインプリント法等で複製したガラス等の紫外線を透過する材料からなる基板を転写用のモールドとして用いても良い。尚、複製した転写用のモールドを使用するのであれば、原盤、及び/又は、複製盤の基材は、例えば、シリコンや電鋳等の方法によって複製したニッケル(合金を含む)等の紫外線を透過しない材料を用いることができる。
The finished upper mold 503a and lower mold 503b are subjected to a surface treatment with a silane coupling agent or the like in order to improve releasability. Note that a substrate made of a material that transmits ultraviolet rays, such as glass replicated by an imprint method or the like, may be used as a transfer mold using the upper mold 503a and the lower mold 503b as masters. Furthermore, a substrate made of a material that transmits ultraviolet rays, such as glass duplicated by an imprint method or the like from the duplication disk produced by the above method, may be used as a transfer mold. If a duplicate transfer mold is used, the master and / or the base material of the duplicate disk is, for example, ultraviolet rays such as nickel (including alloys) duplicated by a method such as silicon or electroforming. A material that does not transmit can be used.
次に磁気ディスクメディア基板(以下メディア基板と称する)600を作製する。メディア基板600は、例えば、特殊加工化学強化ガラス、シリコンウエハ、アルミ基板等からなるディスク状の支持基板601の一方の面側(上側面)及び他方の面側(下側面)に、夫々、上側転写層604a及び下側転写層604bを含む、以下の如き複数の層が積層されて為るものである。つまり、図5(A)に示すように、支持基板601の上側面には、非磁性材料からなる上側非磁性層602a、金属材料、例えばTa又はTi等からなる上側メタル層603a、及び上側転写層604aが積層されている。支持基板601の下側面には非磁性材料からなる下側非磁性層602b、金属材料、例えばTa又はTi等からなる下側メタル層603b、及び下側転写層604bを積層することにより形成する。上側非磁性層602a、上側メタル層603a、下側非磁性層602b、及び下側メタル層603bは、スパッタリング法等により形成する。
Next, a magnetic disk media substrate (hereinafter referred to as a media substrate) 600 is manufactured. The media substrate 600 has, for example, an upper side on one side (upper side) and the other side (lower side) of a disc-shaped support substrate 601 made of specially processed chemically strengthened glass, silicon wafer, aluminum substrate, or the like. A plurality of layers including the transfer layer 604a and the lower transfer layer 604b are laminated as follows. That is, as shown in FIG. 5A, on the upper surface of the support substrate 601, there is an upper nonmagnetic layer 602a made of a nonmagnetic material, an upper metal layer 603a made of a metal material such as Ta or Ti, and an upper transfer. A layer 604a is stacked. A lower nonmagnetic layer 602b made of a nonmagnetic material, a lower metal layer 603b made of a metal material such as Ta or Ti, and a lower transfer layer 604b are laminated on the lower surface of the support substrate 601. The upper nonmagnetic layer 602a, the upper metal layer 603a, the lower nonmagnetic layer 602b, and the lower metal layer 603b are formed by a sputtering method or the like.
次に、上記したインプリント方法により、メディア基板600に形成した上側転写層604a及び下側転写層604bに上側モールド503a及び下側モールド503bに形成された凹凸パターンを転写する。すなわち、上記工程で用意したメディア基板600にスピンコート法等で上側転写層604a及び下側転写層604bを形成し、上側モールド503a及び下側モールド503bの基準位置をセンターピン30bの中心軸に合致させた状態で固定した後、メディア基板600をセンターピン30bに装着させ、基準位置をセンターピン30bの中心軸に合致させた状態で、上側モールド503aをセンターピン30bの中心軸方向において下側モールド503bに向けて移動させることにより、上側モールド503aをメディア基板600の一面に押圧すると共に下側モールド503bをメディア基板600の他面に押圧する。その後、上側UV照射ユニット508aから転写層を硬化させるべき紫外線をメディア基板600の上側転写層604aに向けて照射すると共に、下側UV照射ユニット508bから転写層を硬化させるべき紫外線を下側転写層604bに向けて照射し、上側転写層604a及び下側転写層604bが硬化したら上側モールド503a及び下側モールド503bをメディア基板600から離型し、メディア基板600を取り出す。以上の工程により、メディア基板600の両面に図5(A)に示す如き断面構造を有するものが形成される。
Next, the concavo-convex pattern formed on the upper mold 503a and the lower mold 503b is transferred to the upper transfer layer 604a and the lower transfer layer 604b formed on the media substrate 600 by the imprint method described above. That is, the upper transfer layer 604a and the lower transfer layer 604b are formed on the media substrate 600 prepared in the above process by spin coating or the like, and the reference positions of the upper mold 503a and the lower mold 503b are aligned with the central axis of the center pin 30b. Then, the media substrate 600 is mounted on the center pin 30b, and the upper mold 503a is placed on the lower mold in the direction of the center axis of the center pin 30b with the reference position aligned with the center axis of the center pin 30b. By moving it toward 503 b, the upper mold 503 a is pressed against one surface of the media substrate 600 and the lower mold 503 b is pressed against the other surface of the media substrate 600. Thereafter, the upper UV irradiation unit 508a irradiates the upper transfer layer 604a of the media substrate 600 with ultraviolet rays to cure the transfer layer, and the lower UV irradiation unit 508b emits ultraviolet rays to cure the transfer layer. When the upper transfer layer 604a and the lower transfer layer 604b are cured by irradiating toward the 604b, the upper mold 503a and the lower mold 503b are released from the media substrate 600, and the media substrate 600 is taken out. Through the above steps, the media substrate 600 is formed with a cross-sectional structure as shown in FIG.
次に、図5(A)に示す如き構造を有するメディア基板600の両面にエッチング処理を施す。エッチング処理として、先ず、上側モールド503aの凸部に相当する部分に上側転写層604aの残膜が、下側モールド503bの凸部に相当する部分に下側転写層604bの残膜が残るため、酸素リアクティブイオンエッチング(RIE)等でこの残膜を除去する。次に、上記インプリント工程によりパターニングが施された上側転写層604a及び下側転写層604bをマスクとしてドライエッチング処理により、上側メタル層603a及び下側メタル層603bをエッチングし、パターニングを施す。かかるエッチング処理により、図5(B)に示す如く、上側レジスト層604a及び下側レジスト層604b各々の凹凸パターンの内で凹部、並びに、上側メタル層603a及び下側メタル層603b各々における上記凹部に対応した部分が除去され、上側メタル層603a及び下側メタル層603b各々にパターンが形成される(メタルマスクパターニング工程)。
Next, etching is performed on both surfaces of the media substrate 600 having a structure as shown in FIG. As the etching process, first, the remaining film of the upper transfer layer 604a remains in the portion corresponding to the convex portion of the upper mold 503a, and the residual film of the lower transfer layer 604b remains in the portion corresponding to the convex portion of the lower mold 503b. The remaining film is removed by oxygen reactive ion etching (RIE) or the like. Next, the upper metal layer 603a and the lower metal layer 603b are etched and patterned by dry etching using the upper transfer layer 604a and the lower transfer layer 604b patterned by the imprint process as a mask. By this etching process, as shown in FIG. 5B, the recesses in the concavo-convex patterns of the upper resist layer 604a and the lower resist layer 604b and the recesses in the upper metal layer 603a and the lower metal layer 603b are formed. Corresponding portions are removed, and a pattern is formed on each of the upper metal layer 603a and the lower metal layer 603b (metal mask patterning step).
次に、図5(B)に示す如き状態にあるメディア基板600の両面に対して、ウェットエッチング若しくはドライアッシング処理等の方法で転写層除去処理を施すことにより、図5(C)に示すように、上側メタル層603a及び下側メタル層603b各々に残存する転写層を除去する(転写層除去行程)。
Next, as shown in FIG. 5C, a transfer layer removal process is performed on both surfaces of the media substrate 600 in the state shown in FIG. 5B by a method such as wet etching or dry ashing. Then, the transfer layer remaining on each of the upper metal layer 603a and the lower metal layer 603b is removed (transfer layer removing process).
次に、図5(C)に示す如き状態にあるメディア基板600に対して上側メタル層603a及び下側メタル層603bをマスクとしてドライエッチング処理により、非磁性体をエッチングし、パターニングを施す。これにより、上側非磁性層602a及び下側非磁性層602b各々の露出領域に対して、図5(D)に示す如く、所定の深さ分だけ非磁性材料にパターンが形成される(非磁性層パターニング行程)。
Next, the non-magnetic material is etched and patterned by dry etching using the upper metal layer 603a and the lower metal layer 603b as a mask with respect to the media substrate 600 in a state as shown in FIG. Thereby, as shown in FIG. 5D, a pattern is formed on the nonmagnetic material by a predetermined depth with respect to the exposed regions of the upper nonmagnetic layer 602a and the lower nonmagnetic layer 602b (nonmagnetic). Layer patterning process).
次に、図5(D)に示す如き状態にあるメディア基板600の両面に対して、残存する上側メタル層603a及び下側メタル層603bをウェットエッチング処理、若しくはドライエッチング処理等の方法で除去することにより、図5(E)に示すように、上側非磁性層602a及び下側非磁性層602b各々に残存するメタル層を除去する(メタルマスク除去行程)。
Next, the remaining upper metal layer 603a and lower metal layer 603b are removed from both surfaces of the media substrate 600 in a state as shown in FIG. 5D by a method such as a wet etching process or a dry etching process. As a result, as shown in FIG. 5E, the metal layer remaining in each of the upper nonmagnetic layer 602a and the lower nonmagnetic layer 602b is removed (metal mask removing process).
次に、図5(E)に示す如き上側非磁性層602a及び下側非磁性層602b各々の凹部に磁性体(黒塗りにて示す)を充填し、更に、上側保護層605a、上側潤滑層606a、下側保護層605b、及び下側潤滑層606bを図5(F)に示すように積層する。
Next, as shown in FIG. 5E, the concave portions of the upper nonmagnetic layer 602a and the lower nonmagnetic layer 602b are filled with a magnetic material (shown in black), and the upper protective layer 605a and the upper lubricating layer are further filled. A layer 606a, a lower protective layer 605b, and a lower lubricating layer 606b are stacked as shown in FIG.
このように、図1に示すインプリント装置によって両面に凹凸パターンが形成された被転写体6に対して、図5(A)~図5(F)の如き処理を施すことにより、図5(F)に示す如き断面構造を有する両面磁気ディスクが製造されるのである。
As shown in FIG. 5 (A) to FIG. 5 (F), the imprint apparatus shown in FIG. 1 performs the processes shown in FIGS. A double-sided magnetic disk having a cross-sectional structure as shown in F) is manufactured.
尚、図5(A)~図5(F)では、図5(A)に示す如き上側非磁性層602a及び下側非磁性層602bを備えたメディア基板600から、磁気ディスクを製造する方法について説明したが、上側非磁性層602a及び下側非磁性層602bに代わり、磁性材料からなる上側磁性層及び下側磁性層を採用したメディア基板600から磁気ディスクを製造するようにしても良い。この際、図5(C)に示す如き状態にあるメディア基板600に対して上側メタル層603a及び下側メタル層603bをマスクとしてドライエッチング処理により、磁性体をエッチングし、上側非磁性層及び下側非磁性層各々の露出領域に対して、所定の深さ分だけ磁性材料にパターン形成を行う(磁性層パターニング行程)。そして、上側磁性層及び下側磁性層各々の凹部に非磁性材料を充填することにより、磁気ディスクを得るのである。
5A to 5F, a method of manufacturing a magnetic disk from a media substrate 600 provided with an upper nonmagnetic layer 602a and a lower nonmagnetic layer 602b as shown in FIG. 5A. As described above, the magnetic disk may be manufactured from the media substrate 600 employing the upper magnetic layer and the lower magnetic layer made of a magnetic material instead of the upper nonmagnetic layer 602a and the lower nonmagnetic layer 602b. At this time, the magnetic material is etched by dry etching using the upper metal layer 603a and the lower metal layer 603b as a mask with respect to the media substrate 600 in the state as shown in FIG. A pattern is formed on the magnetic material by a predetermined depth for each exposed region of the side nonmagnetic layer (magnetic layer patterning step). Then, the magnetic disk is obtained by filling the concave portions of the upper magnetic layer and the lower magnetic layer with a nonmagnetic material.
尚、本実施例ではUV式のインプリント方法およびインプリント装置に関して記載しているが、これに限定されるものではなく、熱式インプリント、光エネルギー(UV以外の光)硬化式インプリント等の他の方式のインプリント装置にも適用可能である。
In this embodiment, the UV imprint method and the imprint apparatus are described. However, the present invention is not limited to this, and thermal imprint, light energy (light other than UV) curing imprint, etc. The present invention can be applied to other types of imprint apparatuses.
また、磁気ディスクの転写だけでなく、光ディスクなどの様々な記録媒体の製造に用いることができる。
Also, it can be used not only for transferring magnetic disks but also for manufacturing various recording media such as optical disks.
Claims (22)
- モールドに形成されたパターンを被転写体に転写する一連の転写処理を行う転写装置であって、
前記被転写体を支持する支持機構と、
前記支持機構を第1方向に駆動させる支持機構駆動手段と、
エネルギー線を前記被転写体に向けて照射する照射手段と、
前記照射手段及び/又は前記支持機構駆動手段を移動させる移動手段と、を有することを特徴とする転写装置。 A transfer device that performs a series of transfer processes for transferring a pattern formed on a mold to a transfer target,
A support mechanism for supporting the transfer object;
Support mechanism driving means for driving the support mechanism in the first direction;
Irradiating means for irradiating an energy beam toward the transfer object;
And a moving means for moving the irradiation means and / or the support mechanism driving means. - 前記一連の転写処理の進捗に応じて、前記光照射手段及び前記支持機構駆動手段の内の一方を選択的に使用位置に配置すべく前記移動手段を制御する制御手段を更に含むことを特徴とする請求項1に記載の転写装置。 The apparatus further includes control means for controlling the moving means to selectively place one of the light irradiation means and the support mechanism driving means at a use position in accordance with the progress of the series of transfer processes. The transfer device according to claim 1.
- 前記移動手段は、前記照射手段が設置されている第1ステージと、前記支持機構駆動手段が設置されている第2ステージと、を含み、
前記制御手段は、前記一連の転写処理の進捗に応じて、前記第1ステージ及び前記第2ステージの内の一方を前記使用位置に移動させることを特徴とする請求項2記載の転写装置。 The moving means includes a first stage on which the irradiation means is installed, and a second stage on which the support mechanism driving means is installed,
3. The transfer apparatus according to claim 2, wherein the control unit moves one of the first stage and the second stage to the use position in accordance with the progress of the series of transfer processes. - 前記照射手段及び前記支持機構駆動手段はステージ上に設置されており、
前記制御手段は、前記照射手段及び前記支持機構駆動手段の内の一方を前記使用位置に配置させるべく前記ステージを移動させる制御手段を更に有することを特徴とする請求項2に記載の転写装置。 The irradiation means and the support mechanism driving means are installed on a stage,
The transfer apparatus according to claim 2, wherein the control unit further includes a control unit that moves the stage so that one of the irradiation unit and the support mechanism driving unit is arranged at the use position. - 前記制御手段は、前記モールドと前記被転写体とのアライメント動作時には前記支持機構駆動手段を前記使用位置に配置させるべく前記移動手段を制御し、前記モールドを前記被転写体に押圧する押圧動作時には前記照射手段を前記使用位置に配置させるべく前記移動手段を制御することを特徴とする請求項2に記載の転写装置。 The control means controls the moving means to place the support mechanism driving means at the use position during an alignment operation between the mold and the transferred body, and during a pressing operation that presses the mold against the transferred body. The transfer apparatus according to claim 2, wherein the moving unit is controlled so that the irradiating unit is arranged at the use position.
- 前記使用位置は、前記支持機構に支持されている前記被転写体の真上又は真下の位置であることを特徴とする請求項2に記載の転写装置。 The transfer apparatus according to claim 2, wherein the use position is a position directly above or directly below the transfer target supported by the support mechanism.
- 前記制御手段は、前記支持機構を前記第1方向に駆動させる場合には前記支持機構駆動手段を前記使用位置に配置させるべく前記移動手段を制御し、前記エネルギー線を前記被転写体に照射する場合には前記照射手段を前記使用位置に配置させるべく前記移動手段を制御することを特徴とする請求項2又は6記載の転写装置。 When the support mechanism is driven in the first direction, the control means controls the moving means to place the support mechanism drive means at the use position, and irradiates the energy transfer body with the energy beam. 7. The transfer apparatus according to claim 2, wherein the moving unit is controlled so that the irradiation unit is arranged at the use position.
- モールドに形成されたパターンを被転写体に転写する一連の転写処理を行う転写装置であって、
前記被転写体を支持する支持機構と、
前記支持機構を第1方向に駆動させる支持機構駆動手段と、
前記被転写体と前記モールドのアライメント用の撮影手段と、
前記撮影手段及び/又は前記支持機構駆動手段を移動させる移動手段と、を有することを特徴とする転写装置。 A transfer device that performs a series of transfer processes for transferring a pattern formed on a mold to a transfer target,
A support mechanism for supporting the transfer object;
Support mechanism driving means for driving the support mechanism in the first direction;
An imaging means for alignment of the transfer object and the mold;
And a moving means for moving the photographing means and / or the support mechanism driving means. - 前記一連の転写処理の進捗に応じて、前記撮影手段及び前記支持機構駆動手段の内の一方を選択的に使用位置に配置すべく前記移動手段を制御する制御手段を更に含むことを特徴とする請求項8に記載の転写装置。 The apparatus further includes control means for controlling the moving means so as to selectively place one of the photographing means and the support mechanism driving means at a use position in accordance with the progress of the series of transfer processes. The transfer device according to claim 8.
- 前記移動手段は、前記撮影手段及び前記支持機構駆動手段が設置されているステージを含み、
前記制御手段は、前記撮影手段及び前記支持機構駆動手段各々の内の一方を前記使用位置に配置すべく前記ステージを移動させるべき制御を行うことを特徴とする請求項9に記載の転写装置。 The moving means includes a stage on which the photographing means and the support mechanism driving means are installed,
The transfer device according to claim 9, wherein the control unit performs control to move the stage so that one of the photographing unit and the support mechanism driving unit is arranged at the use position. - 前記制御手段は、前記モールドと前記被転写体とのアライメント動作時には前記撮影手段を前記使用位置に配置させるべく前記移動手段を制御し、前記モールド及び前記被転写体の離型動作時には前記支持機構駆動手段を前記使用位置に配置させるべく前記移動手段を制御することを特徴とする請求項9に記載の転写装置。 The control unit controls the moving unit to place the photographing unit at the use position during an alignment operation between the mold and the transfer target, and the support mechanism during a mold release operation of the mold and the transfer target. The transfer device according to claim 9, wherein the moving unit is controlled so that a driving unit is arranged at the use position.
- 前記使用位置は、前記支持機構に支持されている前記被転写体の真上又は真下の位置であることを特徴とする請求項9に記載の転写装置。 The transfer device according to claim 9, wherein the use position is a position directly above or directly below the transfer target supported by the support mechanism.
- 前記制御手段は、前記支持機構を前記第1方向に駆動させる場合には前記支持機構駆動手段を前記使用位置に配置させるべく前記移動手段を制御し、前記被転写体及び/又は前記モールドの表面を撮影する場合には前記撮影手段を前記使用位置に配置させるべく前記移動手段を制御することを特徴とする請求項9又は12記載の転写装置。 The control means controls the moving means to dispose the support mechanism driving means at the use position when the support mechanism is driven in the first direction, and controls the surface of the transfer object and / or the mold. 13. The transfer apparatus according to claim 9 or 12, wherein when the image is photographed, the moving means is controlled so that the photographing means is arranged at the use position.
- モールドに形成されたパターンを被転写体に転写する転写装置であって、
エネルギー線を前記被転写体に向けて照射する照射手段と、
前記被転写体及び前記モールドのアライメント用の撮影手段と、
前記撮影手段又は前記照射手段を移動させる移動手段と、
パターン転写処理の進捗に応じて、前記撮影手段及び前記照射手段の内の一方を使用位置に配置させるべく前記移動手段を制御する制御手段と、を有することを特徴とする転写装置。 A transfer device for transferring a pattern formed on a mold to a transfer target,
Irradiating means for irradiating an energy beam toward the transfer object;
An imaging means for alignment of the transfer object and the mold;
Moving means for moving the imaging means or the irradiation means;
And a control unit that controls the moving unit to place one of the photographing unit and the irradiation unit at a use position in accordance with the progress of the pattern transfer process. - 前記移動手段は、前記撮影手段及び前記照射手段が設置されているステージを含み、
前記制御手段は、前記撮影手段及び前記照射手段各々の内の一方を前記使用位置に配置すべく前記ステージを移動させるべき制御を行うことを特徴とする請求項14に記載の転写装置。 The moving means includes a stage on which the photographing means and the irradiation means are installed,
15. The transfer apparatus according to claim 14, wherein the control unit performs control to move the stage so that one of the photographing unit and the irradiation unit is arranged at the use position. - 前記制御手段は、前記モールドと前記被転写体とのアライメント動作時には前記撮影手段を前記使用位置に配置させるべく前記移動手段を制御し、前記モールドを前記被転写体に押圧する押圧動作時には前記照射手段を前記使用位置に配置させるべく前記移動手段を制御することを特徴とする請求項14に記載の転写装置。 The control means controls the moving means to place the photographing means at the use position during an alignment operation between the mold and the transferred body, and performs the irradiation during a pressing operation for pressing the mold against the transferred body. 15. The transfer apparatus according to claim 14, wherein the moving means is controlled so as to place the means at the use position.
- 前記使用位置は、前記被転写体の真上又は真下の位置であることを特徴とする請求項14に記載の転写装置。 The transfer device according to claim 14, wherein the use position is a position directly above or directly below the transfer target.
- 前記制御手段は、前記エネルギー線を前記被転写体に照射する場合には前記照射手段を前記使用位置に配置させるべく前記移動手段を制御し、前記被転写体及び/又は前記モールドの表面を撮影する場合には前記撮影手段を前記使用位置に配置させるべく前記移動手段を制御することを特徴とする請求項14又は17記載の転写装置。 The control means controls the moving means to place the irradiation means at the use position when irradiating the transferred body with the energy rays, and images the surface of the transferred body and / or the mold. 18. The transfer device according to claim 14, wherein the moving unit is controlled so that the photographing unit is arranged at the use position.
- 第1モールドに形成されたパターンを被転写体の第1面に転写し、且つ第2モールドに形成されたパターンを前記被転写体の第2面に転写する一連の転写処理を行う転写装置であって、
前記被転写体を第一の方向から支持する第1支持機構と、
前記第1支持機構を第1方向に駆動させる第1支持機構駆動手段と、
エネルギー線を前記被転写体の前記第1面に向けて照射する第1照射手段と、
エネルギー線を前記被転写体の前記第2面に向けて照射する第2照射手段と、
前記被転写体と前記第1及び第2モールドのアライメント用の撮影手段と、
前記被転写体を第二の方向から支持する第2支持機構と、
前記第2支持機構を移動させる第2支持機構駆動手段と、
前記撮影手段、前記第1支持機構駆動手段、又は前記第1照射手段を移動させる第1移動手段と、
前記第2支持機構駆動手段、又は前記第2照射手段を移動させる第2移動手段と、を有し、
パターン転写処理の進捗に応じて、前記撮影手段、前記第1支持機構駆動手段及び前記第1照射手段の内の一方を選択的に第1使用位置に移動させるように前記第1移動手段を制御し、前記第2支持機構駆動手段及び前記第2照射手段の内の一方を選択的に第2使用位置に移動するように前記第2移動手段を制御する制御手段を有することを特徴とする転写装置。 A transfer device that performs a series of transfer processes for transferring a pattern formed on a first mold to a first surface of a transfer target and transferring a pattern formed on a second mold to a second surface of the transfer target. There,
A first support mechanism for supporting the transfer object from a first direction;
First support mechanism driving means for driving the first support mechanism in a first direction;
First irradiation means for irradiating energy rays toward the first surface of the transfer object;
Second irradiation means for irradiating energy rays toward the second surface of the transfer target;
Photographing means for alignment of the transferred body and the first and second molds;
A second support mechanism for supporting the transfer object from a second direction;
Second support mechanism driving means for moving the second support mechanism;
First moving means for moving the photographing means, the first support mechanism driving means, or the first irradiation means;
The second support mechanism driving means, or the second moving means for moving the second irradiation means,
According to the progress of the pattern transfer process, the first moving unit is controlled to selectively move one of the photographing unit, the first support mechanism driving unit, and the first irradiation unit to the first use position. And a control means for controlling the second moving means so as to selectively move one of the second support mechanism driving means and the second irradiation means to the second use position. apparatus. - モールドに形成されたパターンを被転写体に転写する一連の転写処理を行う転写装置であって、
前記被転写体を支持する支持機構を第1方向に駆動させる支持機構駆動手段、及びエネルギー線を前記被転写体に向けて照射する照射手段が夫々設置されているスライドテーブルと、
前記支持機構駆動手段及び前記照射手段の内の一方を使用位置に配置させるべく前記スライドテーブルを移動させる移動制御手段と、からなるデバイスステーションを備えたことを特徴とする転写装置。 A transfer device that performs a series of transfer processes for transferring a pattern formed on a mold to a transfer target,
A slide mechanism on which a support mechanism driving means for driving a support mechanism for supporting the transfer object in a first direction and an irradiation means for irradiating an energy ray toward the transfer object;
A transfer apparatus comprising: a device station including a movement control unit that moves the slide table so that one of the support mechanism driving unit and the irradiation unit is arranged at a use position. - モールドに形成されたパターンを被転写体に転写する一連の転写処理を行う転写装置であって、
前記被転写体を支持する支持機構を第1方向に駆動させる支持機構駆動手段、及び前記被転写体と前記モールドのアライメント用の撮影手段が夫々設置されているスライドテーブルと、
前記支持機構駆動手段及び前記撮影手段の内の一方を使用位置に配置させるべく前記スライドテーブルを移動させる移動制御手段と、からなるデバイスステーションを備えたことを特徴とする転写装置。 A transfer device that performs a series of transfer processes for transferring a pattern formed on a mold to a transfer target,
A support mechanism driving means for driving a support mechanism for supporting the transfer object in a first direction, and a slide table on which the image pickup means for alignment of the transfer object and the mold are respectively installed;
A transfer apparatus comprising: a device station comprising: a movement control unit that moves the slide table so that one of the support mechanism driving unit and the photographing unit is arranged at a use position. - モールドに形成されたパターンを被転写体に転写する一連の転写処理を行う転写装置であって、
前記被転写体と前記モールドのアライメント用の撮影手段、及びエネルギー線を前記被転写体に向けて照射する照射手段が夫々設置されているスライドテーブルと、
前記撮影手段及び前記照射手段の内の一方を使用位置に配置させるべく前記スライドテーブルを移動させる移動制御手段と、からなるデバイスステーションを備えたことを特徴とする転写装置。 A transfer device that performs a series of transfer processes for transferring a pattern formed on a mold to a transfer target,
An imaging unit for alignment of the transferred object and the mold, and a slide table on which irradiation means for irradiating energy transferred toward the transferred object are respectively installed;
A transfer apparatus comprising: a device station comprising: a movement control unit that moves the slide table so that one of the photographing unit and the irradiation unit is disposed at a use position.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2009/050315 WO2010082300A1 (en) | 2009-01-13 | 2009-01-13 | Transfer device |
JP2010546485A JPWO2010082300A1 (en) | 2009-01-13 | 2009-01-13 | Transfer device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2009/050315 WO2010082300A1 (en) | 2009-01-13 | 2009-01-13 | Transfer device |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2010082300A1 true WO2010082300A1 (en) | 2010-07-22 |
Family
ID=42339569
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2009/050315 WO2010082300A1 (en) | 2009-01-13 | 2009-01-13 | Transfer device |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPWO2010082300A1 (en) |
WO (1) | WO2010082300A1 (en) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006188054A (en) * | 2002-08-29 | 2006-07-20 | Toppan Printing Co Ltd | Pattern forming apparatus |
JP2007182063A (en) * | 2005-11-04 | 2007-07-19 | Asml Netherlands Bv | Imprint lithography |
JP2007281072A (en) * | 2006-04-04 | 2007-10-25 | Canon Inc | Nanoimprint method and nanoimprint system |
JP2008244441A (en) * | 2007-02-06 | 2008-10-09 | Canon Inc | Imprint method, imprint device, and method for manufacturing member using imprint method |
JP2009060091A (en) * | 2007-08-29 | 2009-03-19 | Samsung Electronics Co Ltd | Double-sided imprint lithography equipment |
-
2009
- 2009-01-13 WO PCT/JP2009/050315 patent/WO2010082300A1/en active Application Filing
- 2009-01-13 JP JP2010546485A patent/JPWO2010082300A1/en active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006188054A (en) * | 2002-08-29 | 2006-07-20 | Toppan Printing Co Ltd | Pattern forming apparatus |
JP2007182063A (en) * | 2005-11-04 | 2007-07-19 | Asml Netherlands Bv | Imprint lithography |
JP2007281072A (en) * | 2006-04-04 | 2007-10-25 | Canon Inc | Nanoimprint method and nanoimprint system |
JP2008244441A (en) * | 2007-02-06 | 2008-10-09 | Canon Inc | Imprint method, imprint device, and method for manufacturing member using imprint method |
JP2009060091A (en) * | 2007-08-29 | 2009-03-19 | Samsung Electronics Co Ltd | Double-sided imprint lithography equipment |
Also Published As
Publication number | Publication date |
---|---|
JPWO2010082300A1 (en) | 2012-06-28 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5232077B2 (en) | Microstructure transfer device | |
JP4596981B2 (en) | Imprint apparatus and fine structure transfer method | |
JP5894439B2 (en) | Irradiation system for stereolithography equipment | |
US8025829B2 (en) | Die imprint by double side force-balanced press for step-and-repeat imprint lithography | |
JPWO2008142784A1 (en) | Imprint device | |
JP2010036514A (en) | Nanoimprint stamper, and microfine structure transfer device using the same | |
US10611063B2 (en) | Imprint apparatus, and method of manufacturing article | |
US20110155008A1 (en) | Double-sided imprint apparatus | |
JP2012234913A (en) | Imprint apparatus, imprint method and manufacturing method of device | |
JP4555896B2 (en) | Transfer method and transfer device | |
JP5155814B2 (en) | Imprint device | |
KR102059758B1 (en) | Imprint apparatus and article manufacturing method | |
WO2010082300A1 (en) | Transfer device | |
WO2010082298A1 (en) | Transfer device and transfer method | |
JP2013022807A (en) | Microstructure transfer device and stamper transport method | |
WO2012020741A1 (en) | Light imprinting method and device | |
JP4756105B2 (en) | Transfer apparatus and transfer method | |
JP5052660B2 (en) | MOLD, MOLD MANUFACTURING METHOD, AND MOLD TRANSFER METHOD | |
JP2019201180A (en) | Adhering matter removal method, molding apparatus, molding method, and manufacturing method for article | |
JP4608028B2 (en) | Mold and manufacturing method thereof | |
JP4756106B2 (en) | Transfer device | |
JP2019204895A (en) | Molding apparatus for molding composition on substrate using mold, molding method, substrate processing method, and article manufacturing method | |
JP2012099197A (en) | Optical imprint method | |
WO2010070747A1 (en) | Transfer apparatus and transfer method | |
WO2010100712A1 (en) | Transfer apparatus and transfer method |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 09838270 Country of ref document: EP Kind code of ref document: A1 |
|
WWE | Wipo information: entry into national phase |
Ref document number: 2010546485 Country of ref document: JP |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 09838270 Country of ref document: EP Kind code of ref document: A1 |