WO1990014582A1 - Detecteur de longueur d'onde - Google Patents
Detecteur de longueur d'onde Download PDFInfo
- Publication number
- WO1990014582A1 WO1990014582A1 PCT/JP1990/000640 JP9000640W WO9014582A1 WO 1990014582 A1 WO1990014582 A1 WO 1990014582A1 JP 9000640 W JP9000640 W JP 9000640W WO 9014582 A1 WO9014582 A1 WO 9014582A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- light
- detected
- wavelength
- reference light
- beam splitter
- Prior art date
Links
- BJQHLKABXJIVAM-UHFFFAOYSA-N bis(2-ethylhexyl) phthalate Chemical compound CCCCC(CC)COC(=O)C1=CC=CC=C1C(=O)OCC(CC)CCCC BJQHLKABXJIVAM-UHFFFAOYSA-N 0.000 claims abstract description 29
- 238000001514 detection method Methods 0.000 claims description 30
- 239000013307 optical fiber Substances 0.000 claims description 20
- 238000003384 imaging method Methods 0.000 claims description 13
- 230000003287 optical effect Effects 0.000 claims description 8
- 230000010354 integration Effects 0.000 claims description 6
- 239000000835 fiber Substances 0.000 claims description 2
- 230000001678 irradiating effect Effects 0.000 claims description 2
- 238000000034 method Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 8
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 6
- 229910052753 mercury Inorganic materials 0.000 description 6
- 230000010355 oscillation Effects 0.000 description 4
- 238000005070 sampling Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000009467 reduction Effects 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 description 1
- 229910001634 calcium fluoride Inorganic materials 0.000 description 1
- 210000005069 ears Anatomy 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 101150093988 maf-2 gene Proteins 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 210000002784 stomach Anatomy 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
- G01J9/0246—Measuring optical wavelength
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/26—Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
Definitions
- the present invention relates to a wavelength detecting device for detecting a wavelength of a laser or the like, and particularly to a case where an excimer laser is used as a light source of a reduction projection exposure apparatus for manufacturing semiconductor devices.
- the present invention relates to a wavelength detecting device suitable for wavelength detection. Background technology
- Reduction projection exposure apparatus for manufacturing a semiconductor device (hereinafter referred to as the scan Te Tsu Bruno,. Trying to stomach) Re 0 the use of e key Shi Ma-les-over The that have been attention as a light source of the E key Shi Ma Due to the short wavelength of the laser (KrF laser is about 248.4 nm), there is a possibility that the limit of light exposure may be extended to 0.5 / «m or less. If the resolution is the same, the depth of focus is deeper and the aperture (NA) of the lens is smaller than the conventional mercury lamp g-line and i-line, and the exposure The ability to expect many excellent advantages, such as the ability to increase the area, and the ability to obtain large power, etc.
- the wavelength of the excimer laser is as short as 248.4 nm, and the material that transmits this wavelength is quartz, CaF2, and MaF2.
- quartz as the lens material in terms of uniformity and processing accuracy. I can't get it. Therefore, it is very difficult to design a reduced projection lens with chromatic aberration correction. Therefore, when an excimer laser is used as the light source of the stepper, the excimer laser output laser is used until the color difference is negligible. It is necessary to narrow the band of the laser light, and it is necessary to stabilize and control the wavelength of the narrowed output laser light with high precision.
- a monitor etalon has been used to measure the wavelength line width of output light from a narrow-band oscillation excimer laser or to detect the wavelength.
- the monitor etalon is constructed by using an air-gap-equipped port in which partial reflection mirrors are arranged opposite to each other with a predetermined gap.
- the transmission wavelength of the Pueta port is expressed as follows.
- n the refractive index between the partial reflection mirrors
- 0 the optical axis of the normal to the aperture and the incident light. Is the angle between and.
- n, d, and m are constant, 0 changes when the wavelength changes.
- the monitor etalon utilizes this property to detect the wavelength of the light to be detected.
- the air gap is used. If the internal pressure and ambient temperature change, the above-mentioned angle 0 will change even if the wavelength is constant. Therefore, when using a monitor etalon, wavelength detection is performed by controlling the pressure and ambient temperature in the air gap to a constant value.
- a reference light whose wavelength is known in advance together with the light to be detected is input to the monitor etalon, and the relative wavelength of the light to be detected with respect to this reference light is detected. Accordingly, a device for detecting the absolute wavelength of the light to be detected has been proposed.
- the reference light source and the light source of the light to be detected have different properties, for example, the reference light is a mercury lamp that can be regarded as a surface light source, and the light source of the light to be detected is In the case of a simulated laser, it is difficult to guide the reference light and the light to be detected to the monitor etalon with sufficient intensity, respectively. SZN power ⁇ Poor, could not detect absolute wavelength with high accuracy 0
- the relative wavelength of the detected light with respect to the reference light is detected, and the absolute wavelength of the detected light is detected based on the detected light.
- the light source of the reference light and the light source of the light to be detected are different, it is difficult to guide the reference destination and the light to be detected to the monitor port with sufficient intensity. Therefore, it was not possible to detect the absolute wavelength of the light to be detected with high accuracy.
- the present invention can introduce the reference light and the light to be detected with sufficient intensity even if the light sources of the reference light and the light to be detected have different properties. With high accuracy
- An object of the present invention is to provide a wavelength detecting device capable of detecting the wave length of the light to be detected. Disclosure of the invention
- the reference light generated from the reference light source and the light to be detected are radiated to the aperture, and the light transmitted through the ethanol is transmitted.
- a wavelength detector that detects the wavelength of the light to be detected with respect to the reference light by detecting the light with the light detecting means, the light is radiated to the aperture provided before the etalon.
- a collimator lens means for converting light into parallel light; an illuminating means for irradiating the front focal plane of the collimator lens with reference light and light to be detected;
- An imaging lens means is provided at the subsequent stage of the lon and forms an image of light transmitted through the etalon on a detection surface of the light detection means.
- the front focal plane of the collector lens is illuminated by the reference light and the light to be detected. This light is converted into a parallel light at the collimator lens and radiated to the etalon.
- the reference light and the light to be detected transmitted through this etalon are imaged by the imaging lens means on the detection surface of the light detection means, and the reference light and the detection light are formed on the detection surface.
- the interference fringes corresponding to the detected light are formed. By detecting this interference fringe, the light detecting means detects the relative wavelength of the light to be detected with respect to the reference light, that is, the absolute wavelength of the light to be detected.
- FIG. 1 is a diagram showing an embodiment in which the wavelength detecting device of the present invention is applied to wavelength detection of output laser light of a narrow-band excimer laser.
- FIG. 2 is a diagram showing another embodiment of the present invention using a converging lens
- FIG. 3 is a diagram in which a reference light source is imaged in front of the front focal plane of the collimator lens.
- FIG. 3 is a diagram showing another embodiment of the present invention
- FIG. 4 is a diagram showing another embodiment of the present invention in which light to be detected is introduced using a fiber.
- FIG. 5 is a diagram showing another embodiment of the present invention in which a diffuser plate is used for the front focal plane of the collimator lens.
- FIG. 6 is a diagram showing another embodiment of the present invention in which an optical fiber sleeve is used at the tip of the optical fiber.
- FIG. 7 is a diagram showing another embodiment of the present invention in which the light to be detected is introduced by an optical fiber, and further the integration is used.
- FIG. FIG. 9 is a view showing another embodiment of the present invention in which an aperture is arranged on the front focal plane of a collimator lens using a lens.
- FIG. 1 shows an embodiment of the wavelength detecting apparatus according to the present invention.
- the detected light is The output light 11 of the narrow-band oscillation excimer laser 10 is used, and a mercury lamp is used as the reference light source 30. That is, in the case of this embodiment, the detected light is a KrF excimer laser light having a wavelength of 248.4 noi, and the reference light is a light of a mercury lamp. 7 nm
- a part of the laser light 11 output from the narrow-band oscillation excimer laser 10 is sampled by the beam splitter 20.
- the sampling light is applied to the beam splitter 42 via the integration switch 41.
- the reference light source 30 and the output reference light 31 are radiated to the other surface of the beam platter 42.
- the beam splitter 42 transmits a part of the sampling light output from the integral light source 41 and the reference light source 30. By reflecting a part of the output reference light 31, the sampling light and the reference light are combined. The combined light of the sampling light and the reference light combined by the beam splitter 42 is passed through the condenser lens 43 to be collimated.
- the front focal plane 50 of the lens 61 is illuminated.
- the collimator lens 61 converts the light illuminating the front focal plane 51 into parallel rays, and irradiates the parallel rays to the etalon 62 o
- the etalon 62 is composed of two transparent plates 62a and 62b, the inner surface of which is a partial reflection mirror, and is configured to transmit incident light to the etalon 62.
- the transmitted wave lengths differ depending on the angle.o Transmitted through this port 62
- the light irradiates the light position detector 64 via the imaging lens 63, and the first interference fringe and the first interference fringe corresponding to the wavelength of the reference light are detected on the detection surface of the light detector 64.
- a second interference fringe corresponding to the wavelength of the light to be detected is formed.
- the photodetector 64 detects the first and second interference fringes and, based on this detection, detects a relative wavelength of the wavelength of the light to be detected with respect to the wavelength of the reference light. Then, the absolute wavelength of the light to be detected is detected based on the wavelength of the known reference light and the detected relative wavelength.
- a one-dimensional or two-dimensional image sensor, diode array, PSD (P0 SITION SENSITIVE DETECTOR), etc. is used as the photodetector 64. It can be configured by
- interference fringes having a high light intensity can be obtained, and the absolute wavelength of the light to be detected can be detected with high accuracy.
- the reference light and the light to be detected only need to illuminate the front focal plane of the collimator lens, it is not necessary to adjust the optical axis with high precision, and the adjustment is very difficult. It will be easier.
- FIG. 2 shows another embodiment of the present invention.
- the same reference numerals are given to the parts performing the functions common to each other for convenience of explanation.
- the light to be detected sampled by the beam splitter 20 is condensed by the condenser lens 44, and the condensed light is beamed. Allow the splitter 42 to pass through, and
- the front focal plane 50 of the collimator lens 61 is illuminated by the excessive light, and the reference light 31 generated from the reference light source 30 is beam-splitter 4.
- the light is reflected at 2 and the reflected light illuminates the front focal plane of the collimator lens 50.
- the front focal plane of the collimator lens 50 is illuminated by both the detected light and the reference light.
- This illumination light is collimated by a collimator lens 61, and is transmitted through an etalon 61 and an imaging lens 63 to a detection surface of a photodetector 64.
- Two interference fringes corresponding to the wavelengths of the reference light and the light to be detected are formed above. The absolute wavelength of the light to be detected can be detected based on these two interference fringes.
- FIG. 3 shows still another embodiment of the present invention.
- the detected light sampled at the beam spring 20 is transmitted through the integration lens 41 and the condenser lens 45. Then, the light is incident on the beam splitter 42, and the transmitted light of the beam splitter 42 illuminates the front focal plane 50 of the collimator lens 61.
- the reference light 31 generated from the reference light source 30 passes through the imaging lens 46, is reflected by the beam splitter 42, and passes through the collimator lens 6.
- An image 30 a of the reference light source is formed before the front focal plane 50 of 1.
- the reference light source 30 is equivalent to arranging the reference light source 30 on the image 30a of the reference light source, and the front focal plane of the collimator overnight lens 61 is condensed.
- the light collected by the lens 4 5 Irradiation is performed by the detection light and the reference light from the image 30a of the reference light source 30.
- the following operations are the same as those shown in Fig. 1 and Fig. 2. is there .
- the detected light sampled by the beam splitter 20 is introduced using an optical fiber. It is an example.
- the detection light sampled at the beam splitter 20 is supplied to the optical fiber via the lens 21 and the sleeve 22.
- the detected light input into the optical fiber 23 and transmitted through the optical fiber 23 is output through the sleeve 24, and the output light of the sleep 24
- the beam splitter 42 is irradiated, and the transmitted light of the beam splitter 42 causes the front focal plane 50 of the collimation lens 61 to be illuminated. Light up.
- Other configurations are the same as those shown in FIG.
- the position of the detected excimer laser light 11 is determined.
- the advantage is that the positional relationship between the wavelength detector and the wavelength detector can be set arbitrarily, and there is no limitation on the location of the wavelength detector.
- FIG. 5 shows the configuration shown in FIG. 4 with the addition of a diffuser 47 to the front focal plane 50 of the collimator lens 61.
- FIG. 6 shows a configuration in which the sleeve 24 on the output side of the optical fiber 23 in the configuration shown in FIG. 4 is replaced by an optical fiber comprising a multi-core optical fiber. This shows another embodiment replaced with a sleep.
- FIG. 7 shows another embodiment in which the light to be detected is introduced by using an optical fiber.
- O ⁇ 7 In FIG.
- the sampled light to be detected is input into the optical fiber 23 via the lens 21 and the sleep 22, and this optical fiber 2
- the detected light having transmitted 3 is output via the sleeve 24 and is irradiated on the integral evening 41 via the collar lens 26. .
- the light output from this integral part 41 is irradiated on the beam split part 42 o
- the reference light 31 output from the reference light source 3 ⁇ is irradiated on the other surface of the beam splitter 42.
- the beam splitter 42 combines the detected light output from the integrator 41 and the reference light 31 output from the reference light source 30, This combined light is applied to the front focal plane of the lens 50 through the condenser lens 43.
- the following operations are the same as those shown in Fig. 1, for example.
- FIG. 8 shows the reference in the configuration shown in FIG.
- New 3 ⁇ 4 3 ⁇ 4 A finoletor 32 is inserted between the light source 30 and the imaging lens 46, and furthermore, a vane and a — are connected to the front focal plane 50 of the collimator lens 61.
- the fin 32 transmits only light of a specific wavelength out of the light generated from the reference light source 30.
- the reference light source 30 The outlet of the mercury lamp, the filter 32, is the wavelength of the oscillating light of the rF excimer laser, which is the detected light out of the output light of the mercury lamp, that is, the wavelength 24 It selectively transmits the light of the oscillation line with a wavelength of 253.7 nm close to 8.4 nm. That is, in the case of this embodiment, only the light having a wavelength of 253.7 nm is used to illuminate the aperture 48 as the reference light. The disturbance is reduced, and the absolute wavelength of the light to be detected can be detected with higher accuracy.
- the final lens may be configured to be inserted at a position other than between the reference light source 30 and the imaging lens 46.
- an image 30a of the reference light source 30 is used and an imaging lens 46 is used. It is also possible to use a concave mirror in place of the imaging lens 46 to form the reference light source 30a. Further, in the above-described embodiment, the force configured to form the image 30a of the reference light source 30 before the front focal plane of the collimator lens 61 is formed. This will be imaged on the front focal plane of the collimator lens 61. It may be configured as follows.
- a diffusing plate is provided on the front focal plane of the collimator lens 61. May be configured by inserting an aperture O
- the air gear etalon is used, but the solid etalon is used instead of the air etalon.
- interference fringes having sufficiently high intensity are obtained for both the reference light and the detected light, whereby the absolute wavelength of the detected light can be detected with high accuracy. You can do it. Further, since the reference light and the light to be detected merely illuminate the front focal plane of the collimator lens, high-precision optical axis alignment is not required.
- the wavelength detecting apparatus of the present invention is particularly suitable for wavelength detection when an excimer laser is used as a light source of a reduction projection exposure apparatus for manufacturing semiconductor devices.
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Lasers (AREA)
- Spectrometry And Color Measurement (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Description
Claims
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1129393A JP2781987B2 (ja) | 1989-05-23 | 1989-05-23 | 波長検出装置 |
JP1/129393 | 1989-05-23 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1990014582A1 true WO1990014582A1 (fr) | 1990-11-29 |
Family
ID=15008465
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP1990/000640 WO1990014582A1 (fr) | 1989-05-23 | 1990-05-18 | Detecteur de longueur d'onde |
Country Status (5)
Country | Link |
---|---|
US (1) | US5198872A (ja) |
EP (1) | EP0428744A4 (ja) |
JP (1) | JP2781987B2 (ja) |
CA (1) | CA2033194A1 (ja) |
WO (1) | WO1990014582A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102445279A (zh) * | 2010-10-14 | 2012-05-09 | 上海微电子装备有限公司 | 一种测量干涉仪波长的装置及方法 |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1989000779A1 (en) * | 1987-07-17 | 1989-01-26 | Kabushiki Kaisha Komatsu Seisakusho | Apparatus for controlling laser wavelength |
JP3082857B2 (ja) * | 1989-06-12 | 2000-08-28 | 株式会社ニコン | レーザ発振装置及びレーザ発振装置を用いた露光装置、露光方法 |
WO1991012499A1 (fr) * | 1990-02-15 | 1991-08-22 | Kabushiki Kaisha Komatsu Seisakusho | Detecteur de longueur d'onde |
JPH05312646A (ja) * | 1992-05-15 | 1993-11-22 | Mitsubishi Electric Corp | 波長測定装置およびこれを搭載したレーザ装置 |
US5543916A (en) * | 1993-10-04 | 1996-08-06 | Science Solutions, Inc. | Interferometer with alignment assembly and with processor for linearizing fringes for determining the wavelength of laser light |
US5420687A (en) * | 1993-10-04 | 1995-05-30 | Science Solutions Inc. | Interferometer with processor for linearizing fringers for determining the wavelength of laser light |
JPH07120326A (ja) * | 1993-10-22 | 1995-05-12 | Komatsu Ltd | 波長検出装置 |
US5801831A (en) * | 1996-09-20 | 1998-09-01 | Institute For Space And Terrestrial Science | Fabry-Perot spectrometer for detecting a spatially varying spectral signature of an extended source |
JP3690632B2 (ja) * | 1998-03-17 | 2005-08-31 | 株式会社小松製作所 | 狭帯域モジュールの検査装置 |
US6160832A (en) | 1998-06-01 | 2000-12-12 | Lambda Physik Gmbh | Method and apparatus for wavelength calibration |
US7006541B2 (en) * | 1998-06-01 | 2006-02-28 | Lambda Physik Ag | Absolute wavelength calibration of lithography laser using multiple element or tandem see through hollow cathode lamp |
US6580517B2 (en) | 2000-03-01 | 2003-06-17 | Lambda Physik Ag | Absolute wavelength calibration of lithography laser using multiple element or tandem see through hollow cathode lamp |
US6426966B1 (en) | 1999-02-10 | 2002-07-30 | Lambda Physik Ag | Molecular fluorine (F2) laser with narrow spectral linewidth |
US6269110B1 (en) | 1998-10-05 | 2001-07-31 | Lambda Physik Ag | Internal wavelength calibration for tunable ArF-excimer laser using atomic carbon and molecular oxygen absorption lines |
US6160831A (en) * | 1998-10-26 | 2000-12-12 | Lambda Physik Gmbh | Wavelength calibration tool for narrow band excimer lasers |
US6717973B2 (en) | 1999-02-10 | 2004-04-06 | Lambda Physik Ag | Wavelength and bandwidth monitor for excimer or molecular fluorine laser |
US6667804B1 (en) | 1999-10-12 | 2003-12-23 | Lambda Physik Ag | Temperature compensation method for wavemeters |
US7075963B2 (en) | 2000-01-27 | 2006-07-11 | Lambda Physik Ag | Tunable laser with stabilized grating |
US6597462B2 (en) | 2000-03-01 | 2003-07-22 | Lambda Physik Ag | Laser wavelength and bandwidth monitor |
US6807205B1 (en) | 2000-07-14 | 2004-10-19 | Lambda Physik Ag | Precise monitor etalon calibration technique |
US6747741B1 (en) | 2000-10-12 | 2004-06-08 | Lambda Physik Ag | Multiple-pass interferometric device |
US20040114354A1 (en) * | 2002-09-10 | 2004-06-17 | Rajendra Jagad | Light emitting source, printed circuit board and power source combination and its method of use |
US7268869B2 (en) * | 2004-08-13 | 2007-09-11 | Micron Technology, Inc. | In-situ spectrograph and method of measuring light wavelength characteristics for photolithography |
EP2995979B1 (en) * | 2013-05-27 | 2018-11-14 | Huawei Technologies Co., Ltd. | Filter and manufacturing method thereof, and laser wavelength monitoring device |
KR101864261B1 (ko) * | 2016-10-31 | 2018-06-05 | (주)켐옵틱스 | 파장 가변 레이저의 파장 잠금 구조 및 파장 가변 레이저의 파장 잠금 방법 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57199922A (en) * | 1981-05-27 | 1982-12-08 | Centre Nat Etd Spatiales | Astronomical observing device |
JPS63107177A (ja) * | 1986-10-24 | 1988-05-12 | Komatsu Ltd | レ−ザ光の波長検出装置 |
JPH01183873A (ja) * | 1988-01-18 | 1989-07-21 | Mitsubishi Electric Corp | レーザ波長の安定化方法及び波長安定化レーザ装置 |
JPH0621783Y2 (ja) * | 1990-01-30 | 1994-06-08 | 池田物産株式会社 | シート構造 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS5719992A (en) * | 1980-07-08 | 1982-02-02 | Mitsubishi Electric Corp | Crucible induction furnace |
JPS6021783A (ja) * | 1983-07-19 | 1985-02-04 | 高砂電器産業株式会社 | カードゲーム機 |
KR910006307B1 (ko) * | 1987-09-26 | 1991-08-19 | 미쓰비시덴기 가부시기가이샤 | 레이저 파장의 안정화 방법 및 파장 안정화 장치 |
JPS6484767A (en) * | 1987-09-28 | 1989-03-30 | Matsushita Electric Ind Co Ltd | Tunable laser device |
JP2611264B2 (ja) * | 1987-10-14 | 1997-05-21 | 三菱電機株式会社 | 波長安定化レーザ |
JPH01123491A (ja) * | 1987-11-06 | 1989-05-16 | Nikon Corp | レーザ発振装置 |
-
1989
- 1989-05-23 JP JP1129393A patent/JP2781987B2/ja not_active Expired - Lifetime
-
1990
- 1990-05-18 EP EP19900907442 patent/EP0428744A4/en not_active Withdrawn
- 1990-05-18 WO PCT/JP1990/000640 patent/WO1990014582A1/ja not_active Application Discontinuation
- 1990-05-18 US US07/640,431 patent/US5198872A/en not_active Expired - Lifetime
- 1990-05-18 CA CA002033194A patent/CA2033194A1/en not_active Abandoned
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57199922A (en) * | 1981-05-27 | 1982-12-08 | Centre Nat Etd Spatiales | Astronomical observing device |
JPS63107177A (ja) * | 1986-10-24 | 1988-05-12 | Komatsu Ltd | レ−ザ光の波長検出装置 |
JPH01183873A (ja) * | 1988-01-18 | 1989-07-21 | Mitsubishi Electric Corp | レーザ波長の安定化方法及び波長安定化レーザ装置 |
JPH0621783Y2 (ja) * | 1990-01-30 | 1994-06-08 | 池田物産株式会社 | シート構造 |
Non-Patent Citations (1)
Title |
---|
See also references of EP0428744A4 * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102445279A (zh) * | 2010-10-14 | 2012-05-09 | 上海微电子装备有限公司 | 一种测量干涉仪波长的装置及方法 |
Also Published As
Publication number | Publication date |
---|---|
EP0428744A4 (en) | 1992-07-08 |
CA2033194A1 (en) | 1990-11-24 |
US5198872A (en) | 1993-03-30 |
JPH02307281A (ja) | 1990-12-20 |
EP0428744A1 (en) | 1991-05-29 |
JP2781987B2 (ja) | 1998-07-30 |
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