US20090169770A1 - Moisture barrier coatings - Google Patents
Moisture barrier coatings Download PDFInfo
- Publication number
- US20090169770A1 US20090169770A1 US12/400,431 US40043109A US2009169770A1 US 20090169770 A1 US20090169770 A1 US 20090169770A1 US 40043109 A US40043109 A US 40043109A US 2009169770 A1 US2009169770 A1 US 2009169770A1
- Authority
- US
- United States
- Prior art keywords
- diamond
- barrier
- layers
- polymer
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 230000004888 barrier function Effects 0.000 title claims abstract description 91
- 238000000576 coating method Methods 0.000 title description 92
- 229920000642 polymer Polymers 0.000 claims abstract description 74
- 239000000758 substrate Substances 0.000 claims abstract description 49
- 239000001301 oxygen Substances 0.000 claims abstract description 43
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 43
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 42
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 32
- 239000011521 glass Substances 0.000 claims abstract description 32
- 229910052799 carbon Inorganic materials 0.000 claims abstract description 29
- 239000002131 composite material Substances 0.000 claims abstract description 6
- 238000000034 method Methods 0.000 claims description 34
- 229910052710 silicon Inorganic materials 0.000 claims description 20
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 19
- 239000010703 silicon Substances 0.000 claims description 19
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 17
- 229910052757 nitrogen Inorganic materials 0.000 claims description 8
- 230000000712 assembly Effects 0.000 abstract description 13
- 238000000429 assembly Methods 0.000 abstract description 13
- 239000010410 layer Substances 0.000 description 103
- 239000010408 film Substances 0.000 description 63
- 239000011248 coating agent Substances 0.000 description 40
- 239000000463 material Substances 0.000 description 37
- -1 polypropylenes Polymers 0.000 description 37
- 229910003460 diamond Inorganic materials 0.000 description 23
- 239000010432 diamond Substances 0.000 description 23
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 16
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 14
- 125000004429 atom Chemical group 0.000 description 14
- 238000000151 deposition Methods 0.000 description 13
- 239000000178 monomer Substances 0.000 description 13
- 239000000126 substance Substances 0.000 description 12
- 230000003287 optical effect Effects 0.000 description 10
- 150000001252 acrylic acid derivatives Chemical class 0.000 description 9
- 229910052751 metal Inorganic materials 0.000 description 9
- 239000002184 metal Substances 0.000 description 9
- 239000000203 mixture Substances 0.000 description 9
- 229910052814 silicon oxide Inorganic materials 0.000 description 9
- 239000010409 thin film Substances 0.000 description 9
- 229920001577 copolymer Polymers 0.000 description 8
- 238000004132 cross linking Methods 0.000 description 8
- 230000008021 deposition Effects 0.000 description 8
- CZDYPVPMEAXLPK-UHFFFAOYSA-N tetramethylsilane Chemical compound C[Si](C)(C)C CZDYPVPMEAXLPK-UHFFFAOYSA-N 0.000 description 8
- 230000005540 biological transmission Effects 0.000 description 7
- 239000000976 ink Substances 0.000 description 7
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 7
- 239000013047 polymeric layer Substances 0.000 description 7
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 7
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 6
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 6
- 238000005481 NMR spectroscopy Methods 0.000 description 6
- 239000000654 additive Substances 0.000 description 6
- 229910052731 fluorine Inorganic materials 0.000 description 6
- 239000011737 fluorine Substances 0.000 description 6
- 229910002804 graphite Inorganic materials 0.000 description 6
- 239000010439 graphite Substances 0.000 description 6
- 229910052739 hydrogen Inorganic materials 0.000 description 6
- 239000001257 hydrogen Substances 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 6
- 229920000139 polyethylene terephthalate Polymers 0.000 description 6
- 239000005020 polyethylene terephthalate Substances 0.000 description 6
- 230000005855 radiation Effects 0.000 description 6
- 238000005507 spraying Methods 0.000 description 6
- 238000001704 evaporation Methods 0.000 description 5
- 230000008020 evaporation Effects 0.000 description 5
- 239000011888 foil Substances 0.000 description 5
- 239000007789 gas Substances 0.000 description 5
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 5
- 239000004926 polymethyl methacrylate Substances 0.000 description 5
- 239000002243 precursor Substances 0.000 description 5
- 238000005546 reactive sputtering Methods 0.000 description 5
- 238000001228 spectrum Methods 0.000 description 5
- 238000004544 sputter deposition Methods 0.000 description 5
- HCLJOFJIQIJXHS-UHFFFAOYSA-N 2-[2-[2-(2-prop-2-enoyloxyethoxy)ethoxy]ethoxy]ethyl prop-2-enoate Chemical compound C=CC(=O)OCCOCCOCCOCCOC(=O)C=C HCLJOFJIQIJXHS-UHFFFAOYSA-N 0.000 description 4
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 4
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 4
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 4
- 239000000853 adhesive Substances 0.000 description 4
- 230000001070 adhesive effect Effects 0.000 description 4
- 230000008033 biological extinction Effects 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 239000000356 contaminant Substances 0.000 description 4
- 238000001493 electron microscopy Methods 0.000 description 4
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 4
- 238000012856 packing Methods 0.000 description 4
- 229920002493 poly(chlorotrifluoroethylene) Polymers 0.000 description 4
- 229920003207 poly(ethylene-2,6-naphthalate) Polymers 0.000 description 4
- 239000005023 polychlorotrifluoroethylene (PCTFE) polymer Substances 0.000 description 4
- 239000010936 titanium Substances 0.000 description 4
- 229910052719 titanium Inorganic materials 0.000 description 4
- LEJBBGNFPAFPKQ-UHFFFAOYSA-N 2-(2-prop-2-enoyloxyethoxy)ethyl prop-2-enoate Chemical compound C=CC(=O)OCCOCCOC(=O)C=C LEJBBGNFPAFPKQ-UHFFFAOYSA-N 0.000 description 3
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
- GTELLNMUWNJXMQ-UHFFFAOYSA-N 2-ethyl-2-(hydroxymethyl)propane-1,3-diol;prop-2-enoic acid Chemical class OC(=O)C=C.OC(=O)C=C.OC(=O)C=C.CCC(CO)(CO)CO GTELLNMUWNJXMQ-UHFFFAOYSA-N 0.000 description 3
- 239000004642 Polyimide Substances 0.000 description 3
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 3
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 3
- 238000004833 X-ray photoelectron spectroscopy Methods 0.000 description 3
- IAXXETNIOYFMLW-GYSYKLTISA-N [(1r,3r,4r)-4,7,7-trimethyl-3-bicyclo[2.2.1]heptanyl] 2-methylprop-2-enoate Chemical compound C1C[C@@]2(C)[C@H](OC(=O)C(=C)C)C[C@@H]1C2(C)C IAXXETNIOYFMLW-GYSYKLTISA-N 0.000 description 3
- HVVWZTWDBSEWIH-UHFFFAOYSA-N [2-(hydroxymethyl)-3-prop-2-enoyloxy-2-(prop-2-enoyloxymethyl)propyl] prop-2-enoate Chemical compound C=CC(=O)OCC(CO)(COC(=O)C=C)COC(=O)C=C HVVWZTWDBSEWIH-UHFFFAOYSA-N 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- 239000011203 carbon fibre reinforced carbon Substances 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 3
- 229920006037 cross link polymer Polymers 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- 238000001035 drying Methods 0.000 description 3
- 238000011065 in-situ storage Methods 0.000 description 3
- 230000001965 increasing effect Effects 0.000 description 3
- 239000011159 matrix material Substances 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 239000000049 pigment Substances 0.000 description 3
- 239000004417 polycarbonate Substances 0.000 description 3
- 229920000728 polyester Polymers 0.000 description 3
- 239000011112 polyethylene naphthalate Substances 0.000 description 3
- 229920001721 polyimide Polymers 0.000 description 3
- 238000006116 polymerization reaction Methods 0.000 description 3
- 229920002981 polyvinylidene fluoride Polymers 0.000 description 3
- 238000001004 secondary ion mass spectrometry Methods 0.000 description 3
- 239000000377 silicon dioxide Substances 0.000 description 3
- 239000000243 solution Substances 0.000 description 3
- 239000002904 solvent Substances 0.000 description 3
- 241000894007 species Species 0.000 description 3
- 229910052717 sulfur Inorganic materials 0.000 description 3
- 239000011593 sulfur Substances 0.000 description 3
- UHUUYVZLXJHWDV-UHFFFAOYSA-N trimethyl(methylsilyloxy)silane Chemical compound C[SiH2]O[Si](C)(C)C UHUUYVZLXJHWDV-UHFFFAOYSA-N 0.000 description 3
- 238000007740 vapor deposition Methods 0.000 description 3
- MXFQRSUWYYSPOC-UHFFFAOYSA-N (2,2-dimethyl-3-prop-2-enoyloxypropyl) prop-2-enoate Chemical class C=CC(=O)OCC(C)(C)COC(=O)C=C MXFQRSUWYYSPOC-UHFFFAOYSA-N 0.000 description 2
- PSGCQDPCAWOCSH-UHFFFAOYSA-N (4,7,7-trimethyl-3-bicyclo[2.2.1]heptanyl) prop-2-enoate Chemical compound C1CC2(C)C(OC(=O)C=C)CC1C2(C)C PSGCQDPCAWOCSH-UHFFFAOYSA-N 0.000 description 2
- BQCIDUSAKPWEOX-UHFFFAOYSA-N 1,1-Difluoroethene Chemical compound FC(F)=C BQCIDUSAKPWEOX-UHFFFAOYSA-N 0.000 description 2
- YIJYFLXQHDOQGW-UHFFFAOYSA-N 2-[2,4,6-trioxo-3,5-bis(2-prop-2-enoyloxyethyl)-1,3,5-triazinan-1-yl]ethyl prop-2-enoate Chemical compound C=CC(=O)OCCN1C(=O)N(CCOC(=O)C=C)C(=O)N(CCOC(=O)C=C)C1=O YIJYFLXQHDOQGW-UHFFFAOYSA-N 0.000 description 2
- INQDDHNZXOAFFD-UHFFFAOYSA-N 2-[2-(2-prop-2-enoyloxyethoxy)ethoxy]ethyl prop-2-enoate Chemical compound C=CC(=O)OCCOCCOCCOC(=O)C=C INQDDHNZXOAFFD-UHFFFAOYSA-N 0.000 description 2
- RZVINYQDSSQUKO-UHFFFAOYSA-N 2-phenoxyethyl prop-2-enoate Chemical compound C=CC(=O)OCCOC1=CC=CC=C1 RZVINYQDSSQUKO-UHFFFAOYSA-N 0.000 description 2
- NLHHRLWOUZZQLW-UHFFFAOYSA-N Acrylonitrile Chemical compound C=CC#N NLHHRLWOUZZQLW-UHFFFAOYSA-N 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N Alumina Chemical class [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 229920001780 ECTFE Polymers 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- 239000004812 Fluorinated ethylene propylene Substances 0.000 description 2
- OAKJQQAXSVQMHS-UHFFFAOYSA-N Hydrazine Chemical compound NN OAKJQQAXSVQMHS-UHFFFAOYSA-N 0.000 description 2
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 2
- 239000002033 PVDF binder Substances 0.000 description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 2
- 239000004696 Poly ether ether ketone Substances 0.000 description 2
- 239000004697 Polyetherimide Substances 0.000 description 2
- 239000004721 Polyphenylene oxide Substances 0.000 description 2
- 239000004743 Polypropylene Substances 0.000 description 2
- 229910018503 SF6 Inorganic materials 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- DAKWPKUUDNSNPN-UHFFFAOYSA-N Trimethylolpropane triacrylate Chemical compound C=CC(=O)OCC(CC)(COC(=O)C=C)COC(=O)C=C DAKWPKUUDNSNPN-UHFFFAOYSA-N 0.000 description 2
- 238000002441 X-ray diffraction Methods 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 230000002411 adverse Effects 0.000 description 2
- 229910021529 ammonia Inorganic materials 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 2
- 125000004432 carbon atom Chemical group C* 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 2
- 238000005336 cracking Methods 0.000 description 2
- 238000006731 degradation reaction Methods 0.000 description 2
- 239000002274 desiccant Substances 0.000 description 2
- 125000004386 diacrylate group Chemical group 0.000 description 2
- 239000003814 drug Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000002708 enhancing effect Effects 0.000 description 2
- 229920000840 ethylene tetrafluoroethylene copolymer Polymers 0.000 description 2
- 125000000524 functional group Chemical group 0.000 description 2
- 230000004927 fusion Effects 0.000 description 2
- 230000009477 glass transition Effects 0.000 description 2
- 229920001519 homopolymer Polymers 0.000 description 2
- 150000002431 hydrogen Chemical class 0.000 description 2
- 238000002329 infrared spectrum Methods 0.000 description 2
- 238000010849 ion bombardment Methods 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- 229940119545 isobornyl methacrylate Drugs 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 150000002734 metacrylic acid derivatives Chemical class 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- YDKNBNOOCSNPNS-UHFFFAOYSA-N methyl 1,3-benzoxazole-2-carboxylate Chemical compound C1=CC=C2OC(C(=O)OC)=NC2=C1 YDKNBNOOCSNPNS-UHFFFAOYSA-N 0.000 description 2
- 229910000069 nitrogen hydride Inorganic materials 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 238000004806 packaging method and process Methods 0.000 description 2
- 229920009441 perflouroethylene propylene Polymers 0.000 description 2
- 230000000704 physical effect Effects 0.000 description 2
- 229920003023 plastic Polymers 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 229920002492 poly(sulfone) Polymers 0.000 description 2
- 229920002312 polyamide-imide Polymers 0.000 description 2
- 229920006260 polyaryletherketone Polymers 0.000 description 2
- 229920000515 polycarbonate Polymers 0.000 description 2
- 229920002530 polyetherether ketone Polymers 0.000 description 2
- 229920001601 polyetherimide Polymers 0.000 description 2
- 229920006254 polymer film Polymers 0.000 description 2
- 229920006324 polyoxymethylene Polymers 0.000 description 2
- 229920006380 polyphenylene oxide Polymers 0.000 description 2
- 229920001155 polypropylene Polymers 0.000 description 2
- 229920002620 polyvinyl fluoride Polymers 0.000 description 2
- 238000007639 printing Methods 0.000 description 2
- KCTAWXVAICEBSD-UHFFFAOYSA-N prop-2-enoyloxy prop-2-eneperoxoate Chemical compound C=CC(=O)OOOC(=O)C=C KCTAWXVAICEBSD-UHFFFAOYSA-N 0.000 description 2
- 150000003254 radicals Chemical class 0.000 description 2
- 229910010271 silicon carbide Inorganic materials 0.000 description 2
- 235000012239 silicon dioxide Nutrition 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- 229920001897 terpolymer Polymers 0.000 description 2
- TXEYQDLBPFQVAA-UHFFFAOYSA-N tetrafluoromethane Chemical compound FC(F)(F)F TXEYQDLBPFQVAA-UHFFFAOYSA-N 0.000 description 2
- 229920001187 thermosetting polymer Polymers 0.000 description 2
- 238000011282 treatment Methods 0.000 description 2
- 229940096522 trimethylolpropane triacrylate Drugs 0.000 description 2
- 239000011800 void material Substances 0.000 description 2
- QNODIIQQMGDSEF-UHFFFAOYSA-N (1-hydroxycyclohexyl)-phenylmethanone Chemical compound C=1C=CC=CC=1C(=O)C1(O)CCCCC1 QNODIIQQMGDSEF-UHFFFAOYSA-N 0.000 description 1
- RFOWDPMCXHVGET-UHFFFAOYSA-N (2,3,4,5,6-pentafluorophenyl) prop-2-enoate Chemical compound FC1=C(F)C(F)=C(OC(=O)C=C)C(F)=C1F RFOWDPMCXHVGET-UHFFFAOYSA-N 0.000 description 1
- ASULPTPKYZUPFI-UHFFFAOYSA-N (2-nitrophenyl) prop-2-enoate Chemical compound [O-][N+](=O)C1=CC=CC=C1OC(=O)C=C ASULPTPKYZUPFI-UHFFFAOYSA-N 0.000 description 1
- ADTHJEKIUIOLBX-UHFFFAOYSA-N 1,1,3,4,4,5,5,6,6,6-decafluoro-3-(trifluoromethyl)hex-1-ene Chemical compound FC(C(F)(F)F)(C(C(C(F)(F)F)(C=C(F)F)F)(F)F)F ADTHJEKIUIOLBX-UHFFFAOYSA-N 0.000 description 1
- BCMCBBGGLRIHSE-UHFFFAOYSA-N 1,3-benzoxazole Chemical compound C1=CC=C2OC=NC2=C1 BCMCBBGGLRIHSE-UHFFFAOYSA-N 0.000 description 1
- ZDQNWDNMNKSMHI-UHFFFAOYSA-N 1-[2-(2-prop-2-enoyloxypropoxy)propoxy]propan-2-yl prop-2-enoate Chemical compound C=CC(=O)OC(C)COC(C)COCC(C)OC(=O)C=C ZDQNWDNMNKSMHI-UHFFFAOYSA-N 0.000 description 1
- 239000012956 1-hydroxycyclohexylphenyl-ketone Substances 0.000 description 1
- VOBUAPTXJKMNCT-UHFFFAOYSA-N 1-prop-2-enoyloxyhexyl prop-2-enoate Chemical compound CCCCCC(OC(=O)C=C)OC(=O)C=C VOBUAPTXJKMNCT-UHFFFAOYSA-N 0.000 description 1
- IPDYIFGHKYLTOM-UHFFFAOYSA-N 2-(2-prop-2-enoyloxypropoxy)propyl prop-2-enoate Chemical class C=CC(=O)OCC(C)OCC(C)OC(=O)C=C IPDYIFGHKYLTOM-UHFFFAOYSA-N 0.000 description 1
- HWSSEYVMGDIFMH-UHFFFAOYSA-N 2-[2-[2-(2-methylprop-2-enoyloxy)ethoxy]ethoxy]ethyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCCOCCOCCOC(=O)C(C)=C HWSSEYVMGDIFMH-UHFFFAOYSA-N 0.000 description 1
- TXBCBTDQIULDIA-UHFFFAOYSA-N 2-[[3-hydroxy-2,2-bis(hydroxymethyl)propoxy]methyl]-2-(hydroxymethyl)propane-1,3-diol Chemical compound OCC(CO)(CO)COCC(CO)(CO)CO TXBCBTDQIULDIA-UHFFFAOYSA-N 0.000 description 1
- 125000001731 2-cyanoethyl group Chemical group [H]C([H])(*)C([H])([H])C#N 0.000 description 1
- FWWXYLGCHHIKNY-UHFFFAOYSA-N 2-ethoxyethyl prop-2-enoate Chemical compound CCOCCOC(=O)C=C FWWXYLGCHHIKNY-UHFFFAOYSA-N 0.000 description 1
- YMUQRDRWZCHZGC-UHFFFAOYSA-N 2-ethyl-2-(hydroxymethyl)propane-1,3-diol;prop-2-enoic acid Chemical class OC(=O)C=C.OC(=O)C=C.OC(=O)C=C.OC(=O)C=C.CCC(CO)(CO)CO.CCC(CO)(CO)CO YMUQRDRWZCHZGC-UHFFFAOYSA-N 0.000 description 1
- CEXQWAAGPPNOQF-UHFFFAOYSA-N 2-phenoxyethyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCCOC1=CC=CC=C1 CEXQWAAGPPNOQF-UHFFFAOYSA-N 0.000 description 1
- RHOOUTWPJJQGSK-UHFFFAOYSA-N 2-phenylsulfanylethyl prop-2-enoate Chemical compound C=CC(=O)OCCSC1=CC=CC=C1 RHOOUTWPJJQGSK-UHFFFAOYSA-N 0.000 description 1
- FQMIAEWUVYWVNB-UHFFFAOYSA-N 3-prop-2-enoyloxybutyl prop-2-enoate Chemical compound C=CC(=O)OC(C)CCOC(=O)C=C FQMIAEWUVYWVNB-UHFFFAOYSA-N 0.000 description 1
- CYUZOYPRAQASLN-UHFFFAOYSA-N 3-prop-2-enoyloxypropanoic acid Chemical compound OC(=O)CCOC(=O)C=C CYUZOYPRAQASLN-UHFFFAOYSA-N 0.000 description 1
- SAPGBCWOQLHKKZ-UHFFFAOYSA-N 6-(2-methylprop-2-enoyloxy)hexyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCCCCCCOC(=O)C(C)=C SAPGBCWOQLHKKZ-UHFFFAOYSA-N 0.000 description 1
- LVGFPWDANALGOY-UHFFFAOYSA-N 8-methylnonyl prop-2-enoate Chemical compound CC(C)CCCCCCCOC(=O)C=C LVGFPWDANALGOY-UHFFFAOYSA-N 0.000 description 1
- 229910052580 B4C Inorganic materials 0.000 description 1
- 229910052582 BN Inorganic materials 0.000 description 1
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 1
- 239000004215 Carbon black (E152) Substances 0.000 description 1
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 1
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 description 1
- 239000005977 Ethylene Substances 0.000 description 1
- 239000004831 Hot glue Substances 0.000 description 1
- 229930040373 Paraformaldehyde Natural products 0.000 description 1
- 229920012266 Poly(ether sulfone) PES Polymers 0.000 description 1
- 239000004952 Polyamide Substances 0.000 description 1
- 239000004962 Polyamide-imide Substances 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- 239000002202 Polyethylene glycol Substances 0.000 description 1
- 239000004954 Polyphthalamide Substances 0.000 description 1
- 239000004820 Pressure-sensitive adhesive Substances 0.000 description 1
- GMBQZIIUCVWOCD-WWASVFFGSA-N Sarsapogenine Chemical compound O([C@@H]1[C@@H]([C@]2(CC[C@@H]3[C@@]4(C)CC[C@H](O)C[C@H]4CC[C@H]3[C@@H]2C1)C)[C@@H]1C)[C@]11CC[C@H](C)CO1 GMBQZIIUCVWOCD-WWASVFFGSA-N 0.000 description 1
- 229910018540 Si C Inorganic materials 0.000 description 1
- 229910007264 Si2H6 Inorganic materials 0.000 description 1
- 108091092920 SmY RNA Proteins 0.000 description 1
- 241001237710 Smyrna Species 0.000 description 1
- UCKMPCXJQFINFW-UHFFFAOYSA-N Sulphide Chemical compound [S-2] UCKMPCXJQFINFW-UHFFFAOYSA-N 0.000 description 1
- 229920006172 Tetrafluoroethylene propylene Polymers 0.000 description 1
- 239000012963 UV stabilizer Substances 0.000 description 1
- QYKIQEUNHZKYBP-UHFFFAOYSA-N Vinyl ether Chemical class C=COC=C QYKIQEUNHZKYBP-UHFFFAOYSA-N 0.000 description 1
- 239000005083 Zinc sulfide Substances 0.000 description 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 1
- PSGCQDPCAWOCSH-BREBYQMCSA-N [(1r,3r,4r)-4,7,7-trimethyl-3-bicyclo[2.2.1]heptanyl] prop-2-enoate Chemical compound C1C[C@@]2(C)[C@H](OC(=O)C=C)C[C@@H]1C2(C)C PSGCQDPCAWOCSH-BREBYQMCSA-N 0.000 description 1
- KNSXNCFKSZZHEA-UHFFFAOYSA-N [3-prop-2-enoyloxy-2,2-bis(prop-2-enoyloxymethyl)propyl] prop-2-enoate Chemical class C=CC(=O)OCC(COC(=O)C=C)(COC(=O)C=C)COC(=O)C=C KNSXNCFKSZZHEA-UHFFFAOYSA-N 0.000 description 1
- 238000005299 abrasion Methods 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 239000002318 adhesion promoter Substances 0.000 description 1
- XYLMUPLGERFSHI-UHFFFAOYSA-N alpha-Methylstyrene Chemical compound CC(=C)C1=CC=CC=C1 XYLMUPLGERFSHI-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910003481 amorphous carbon Inorganic materials 0.000 description 1
- 229910021417 amorphous silicon Inorganic materials 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 238000000149 argon plasma sintering Methods 0.000 description 1
- 239000012298 atmosphere Substances 0.000 description 1
- JUPQTSLXMOCDHR-UHFFFAOYSA-N benzene-1,4-diol;bis(4-fluorophenyl)methanone Chemical compound OC1=CC=C(O)C=C1.C1=CC(F)=CC=C1C(=O)C1=CC=C(F)C=C1 JUPQTSLXMOCDHR-UHFFFAOYSA-N 0.000 description 1
- MQDJYUACMFCOFT-UHFFFAOYSA-N bis[2-(1-hydroxycyclohexyl)phenyl]methanone Chemical compound C=1C=CC=C(C(=O)C=2C(=CC=CC=2)C2(O)CCCCC2)C=1C1(O)CCCCC1 MQDJYUACMFCOFT-UHFFFAOYSA-N 0.000 description 1
- 229920001400 block copolymer Polymers 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- INAHAJYZKVIDIZ-UHFFFAOYSA-N boron carbide Chemical compound B12B3B4C32B41 INAHAJYZKVIDIZ-UHFFFAOYSA-N 0.000 description 1
- CREMABGTGYGIQB-UHFFFAOYSA-N carbon carbon Chemical compound C.C CREMABGTGYGIQB-UHFFFAOYSA-N 0.000 description 1
- 239000001913 cellulose Substances 0.000 description 1
- 229920002678 cellulose Polymers 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- UUAGAQFQZIEFAH-UHFFFAOYSA-N chlorotrifluoroethylene Chemical compound FC(F)=C(F)Cl UUAGAQFQZIEFAH-UHFFFAOYSA-N 0.000 description 1
- 238000009838 combustion analysis Methods 0.000 description 1
- 238000005056 compaction Methods 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- SOLZAPJHTKXTOR-UHFFFAOYSA-N cyclohexane;methanol;prop-2-enoic acid Chemical class OC.OC.OC(=O)C=C.OC(=O)C=C.C1CCCCC1 SOLZAPJHTKXTOR-UHFFFAOYSA-N 0.000 description 1
- 238000005034 decoration Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 229910001882 dioxygen Inorganic materials 0.000 description 1
- PZPGRFITIJYNEJ-UHFFFAOYSA-N disilane Chemical compound [SiH3][SiH3] PZPGRFITIJYNEJ-UHFFFAOYSA-N 0.000 description 1
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 1
- 229940079593 drug Drugs 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000005566 electron beam evaporation Methods 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 239000000839 emulsion Substances 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- WRQGPGZATPOHHX-UHFFFAOYSA-N ethyl 2-oxohexanoate Chemical compound CCCCC(=O)C(=O)OCC WRQGPGZATPOHHX-UHFFFAOYSA-N 0.000 description 1
- UHESRSKEBRADOO-UHFFFAOYSA-N ethyl carbamate;prop-2-enoic acid Chemical class OC(=O)C=C.CCOC(N)=O UHESRSKEBRADOO-UHFFFAOYSA-N 0.000 description 1
- 239000003063 flame retardant Substances 0.000 description 1
- 239000000796 flavoring agent Substances 0.000 description 1
- 235000019634 flavors Nutrition 0.000 description 1
- 229920002457 flexible plastic Polymers 0.000 description 1
- 229920002313 fluoropolymer Polymers 0.000 description 1
- 239000004811 fluoropolymer Substances 0.000 description 1
- 235000013305 food Nutrition 0.000 description 1
- WOLATMHLPFJRGC-UHFFFAOYSA-N furan-2,5-dione;styrene Chemical compound O=C1OC(=O)C=C1.C=CC1=CC=CC=C1 WOLATMHLPFJRGC-UHFFFAOYSA-N 0.000 description 1
- 238000009998 heat setting Methods 0.000 description 1
- UQEAIHBTYFGYIE-UHFFFAOYSA-N hexamethyldisiloxane Chemical compound C[Si](C)(C)O[Si](C)(C)C UQEAIHBTYFGYIE-UHFFFAOYSA-N 0.000 description 1
- 229920001903 high density polyethylene Polymers 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 229910003437 indium oxide Inorganic materials 0.000 description 1
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical class [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 1
- 238000007641 inkjet printing Methods 0.000 description 1
- 229910052809 inorganic oxide Inorganic materials 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 238000007648 laser printing Methods 0.000 description 1
- PBOSTUDLECTMNL-UHFFFAOYSA-N lauryl acrylate Chemical compound CCCCCCCCCCCCOC(=O)C=C PBOSTUDLECTMNL-UHFFFAOYSA-N 0.000 description 1
- 239000002346 layers by function Substances 0.000 description 1
- 238000007644 letterpress printing Methods 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 230000000670 limiting effect Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 239000011344 liquid material Substances 0.000 description 1
- 229920001684 low density polyethylene Polymers 0.000 description 1
- 238000001755 magnetron sputter deposition Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 150000001247 metal acetylides Chemical class 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 239000011104 metalized film Substances 0.000 description 1
- 229910000484 niobium oxide Inorganic materials 0.000 description 1
- URLJKFSTXLNXLG-UHFFFAOYSA-N niobium(5+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Nb+5].[Nb+5] URLJKFSTXLNXLG-UHFFFAOYSA-N 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 230000006911 nucleation Effects 0.000 description 1
- 238000010899 nucleation Methods 0.000 description 1
- FSAJWMJJORKPKS-UHFFFAOYSA-N octadecyl prop-2-enoate Chemical compound CCCCCCCCCCCCCCCCCCOC(=O)C=C FSAJWMJJORKPKS-UHFFFAOYSA-N 0.000 description 1
- 238000007645 offset printing Methods 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 125000004430 oxygen atom Chemical group O* 0.000 description 1
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 description 1
- SOQBVABWOPYFQZ-UHFFFAOYSA-N oxygen(2-);titanium(4+) Chemical class [O-2].[O-2].[Ti+4] SOQBVABWOPYFQZ-UHFFFAOYSA-N 0.000 description 1
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229920002037 poly(vinyl butyral) polymer Polymers 0.000 description 1
- 229920000058 polyacrylate Polymers 0.000 description 1
- 229920002647 polyamide Polymers 0.000 description 1
- 229920001230 polyarylate Polymers 0.000 description 1
- 229920002577 polybenzoxazole Polymers 0.000 description 1
- 229920006393 polyether sulfone Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 229920001223 polyethylene glycol Polymers 0.000 description 1
- 239000002861 polymer material Substances 0.000 description 1
- 229920006375 polyphtalamide Polymers 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 239000004800 polyvinyl chloride Substances 0.000 description 1
- 229920000915 polyvinyl chloride Polymers 0.000 description 1
- 230000002028 premature Effects 0.000 description 1
- 238000002203 pretreatment Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000010791 quenching Methods 0.000 description 1
- 230000000171 quenching effect Effects 0.000 description 1
- 229920005604 random copolymer Polymers 0.000 description 1
- 230000002829 reductive effect Effects 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 150000004756 silanes Chemical class 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical class [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- SFZCNBIFKDRMGX-UHFFFAOYSA-N sulfur hexafluoride Chemical compound FS(F)(F)(F)(F)F SFZCNBIFKDRMGX-UHFFFAOYSA-N 0.000 description 1
- 229960000909 sulfur hexafluoride Drugs 0.000 description 1
- MUTNCGKQJGXKEM-UHFFFAOYSA-N tamibarotene Chemical compound C=1C=C2C(C)(C)CCC(C)(C)C2=CC=1NC(=O)C1=CC=C(C(O)=O)C=C1 MUTNCGKQJGXKEM-UHFFFAOYSA-N 0.000 description 1
- 229910001936 tantalum oxide Inorganic materials 0.000 description 1
- 238000002207 thermal evaporation Methods 0.000 description 1
- 229920001169 thermoplastic Polymers 0.000 description 1
- 239000004416 thermosoftening plastic Substances 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- QHGNHLZPVBIIPX-UHFFFAOYSA-N tin(ii) oxide Chemical class [Sn]=O QHGNHLZPVBIIPX-UHFFFAOYSA-N 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
- 238000012876 topography Methods 0.000 description 1
- 238000005809 transesterification reaction Methods 0.000 description 1
- 238000010023 transfer printing Methods 0.000 description 1
- UONOETXJSWQNOL-UHFFFAOYSA-N tungsten carbide Chemical compound [W+]#[C-] UONOETXJSWQNOL-UHFFFAOYSA-N 0.000 description 1
- 238000002211 ultraviolet spectrum Methods 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- 238000005019 vapor deposition process Methods 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
- 238000001429 visible spectrum Methods 0.000 description 1
- 229910052984 zinc sulfide Inorganic materials 0.000 description 1
- DRDVZXDWVBGGMH-UHFFFAOYSA-N zinc;sulfide Chemical compound [S-2].[Zn+2] DRDVZXDWVBGGMH-UHFFFAOYSA-N 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
- 229910001928 zirconium oxide Inorganic materials 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D7/00—Processes, other than flocking, specially adapted for applying liquids or other fluent materials to particular surfaces or for applying particular liquids or other fluent materials
- B05D7/50—Multilayers
- B05D7/52—Two layers
- B05D7/54—No clear coat specified
- B05D7/546—No clear coat specified each layer being cured, at least partially, separately
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D7/00—Processes, other than flocking, specially adapted for applying liquids or other fluent materials to particular surfaces or for applying particular liquids or other fluent materials
- B05D7/50—Multilayers
- B05D7/56—Three layers or more
- B05D7/58—No clear coat specified
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J7/00—Chemical treatment or coating of shaped articles made of macromolecular substances
- C08J7/04—Coating
- C08J7/042—Coating with two or more layers, where at least one layer of a composition contains a polymer binder
- C08J7/0423—Coating with two or more layers, where at least one layer of a composition contains a polymer binder with at least one layer of inorganic material and at least one layer of a composition containing a polymer binder
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J7/00—Chemical treatment or coating of shaped articles made of macromolecular substances
- C08J7/04—Coating
- C08J7/043—Improving the adhesiveness of the coatings per se, e.g. forming primers
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J7/00—Chemical treatment or coating of shaped articles made of macromolecular substances
- C08J7/04—Coating
- C08J7/046—Forming abrasion-resistant coatings; Forming surface-hardening coatings
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J7/00—Chemical treatment or coating of shaped articles made of macromolecular substances
- C08J7/04—Coating
- C08J7/048—Forming gas barrier coatings
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J7/00—Chemical treatment or coating of shaped articles made of macromolecular substances
- C08J7/12—Chemical modification
- C08J7/123—Treatment by wave energy or particle radiation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/26—Deposition of carbon only
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/54—Apparatus specially adapted for continuous coating
- C23C16/545—Apparatus specially adapted for continuous coating for coating elongated substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/80—Constructional details
- H10K30/88—Passivation; Containers; Encapsulations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/842—Containers
- H10K50/8423—Metallic sealing arrangements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/844—Encapsulations
- H10K50/8445—Encapsulations multilayered coatings having a repetitive structure, e.g. having multiple organic-inorganic bilayers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/80—Constructional details
- H10K59/87—Passivation; Containers; Encapsulations
- H10K59/873—Encapsulations
- H10K59/8731—Encapsulations multilayered coatings having a repetitive structure, e.g. having multiple organic-inorganic bilayers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D1/00—Processes for applying liquids or other fluent materials
- B05D1/62—Plasma-deposition of organic layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/80—Constructional details
- H10K59/87—Passivation; Containers; Encapsulations
- H10K59/871—Self-supporting sealing arrangements
- H10K59/8721—Metallic sealing arrangements
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/26—Web or sheet containing structurally defined element or component, the element or component having a specified physical dimension
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/26—Web or sheet containing structurally defined element or component, the element or component having a specified physical dimension
- Y10T428/263—Coating layer not in excess of 5 mils thick or equivalent
- Y10T428/264—Up to 3 mils
- Y10T428/265—1 mil or less
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/30—Self-sustaining carbon mass or layer with impregnant or other layer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
- Y10T428/31855—Of addition polymer from unsaturated monomers
- Y10T428/31935—Ester, halide or nitrile of addition polymer
Definitions
- the present invention relates to barrier films for protection of moisture or oxygen sensitive articles.
- OLEDs Organic light emitting devices
- Metals and glasses have been used to encapsulate and prolong the life of OLED devices, but metals typically lack transparency and glass lacks flexibility.
- Intense efforts are underway to find alternative encapsulation materials for OLEDs and other electronic devices. Examples include various types of vacuum processes are described in the patent and technical literature for the formation of barrier coatings. These methods span the range of e-beam evaporation, thermal evaporation, electron-cyclotron resonance plasma-enhanced chemical vapor deposition (PECVD), magnetically enhanced PECVD, reactive sputtering, and others.
- PECVD electron-cyclotron resonance plasma-enhanced chemical vapor deposition
- MVTR moisture vapor transmission rate
- U.S. Pat. No. 5,320,875 teaches the importance of a plasma polymerized siloxane monomer and an adhesion promoter in addition to generating the plasma in an “oxygen excessive” mode and depositing the coatings in the “plasma reaction zone” to obtain improved barrier performance.
- the best barrier coatings made by this process still have an MVTR of 0.23 g/m 2 day.
- Da Silva Sobrinho et al. (Surface and Coatings Technology, 116-119, p 1204, 1999) report a microwave and radio frequency combined process for depositing barrier coatings.
- Sheats et al. claim that a high density plasma with low bias voltage results in superior quality barrier coatings.
- references relating to flexible barrier films include U.S. Pat. No. 5,440,446 (Shaw et. al.), U.S. Pat. No. 5,530,581 (Cogan), U.S. Pat. No. 5,681,666 (Treger et al.), U.S. Pat. No. 5,686,360 (Harvey, III et al.), U.S. Pat. No. 5,736,207 (Walther et al.), U.S. Pat. No. 6,004,660 (Topolski et al.), U.S. Pat. No. 6,083,628 (Yializis), U.S. Pat. No. 6,146,225 (Sheats et al.), U.S. Pat. No.
- a first composite assembly for protection of a moisture or oxygen sensitive article includes a substrate, a first polymer layer overcoated on the substrate, and a second polymer layer overcoated on the first polymer layer.
- the first polymer layer is composed of a first polymer
- the second polymer layer is composed of a second polymer different from the first polymer
- the second polymer comprises a plasma polymer.
- a second composite assembly for protection of a moisture or oxygen sensitive article includes a substrate, a polymer layer overcoated on the substrate, and a diamond-like carbon layer overcoated on the polymer layer.
- a third composite assembly for protection of a moisture or oxygen sensitive article includes a substrate, a polymer layer overcoated on the substrate, and a diamond-like glass layer overcoated on the polymer glass layer.
- Processes include any method of fabricating these assemblies.
- orientation such as “atop”, “on”, “uppermost” and the like for the location of various layers in the barrier assemblies or devices refer to the relative position of one or more layers with respect to a horizontal support layer. We do not intend that the barrier assemblies or devices should have any particular orientation in space during or after their manufacture.
- overcoated to describe the position of a layer with respect to a substrate or other element of a barrier assembly, refers to the layer as being atop the substrate or other element, but not necessarily contiguous to either the substrate or the other element.
- polymer refers to homopolymers and copolymers, as well as homopolymers or copolymers that may be formed in a miscible blend, e.g., by coextrusion or by reaction, including, e.g., transesterification.
- polymer also includes plasma deposited polymers.
- copolymer includes both random and block copolymers.
- curable polymer includes both crosslinked and uncrosslinked polymers.
- crosslinked polymer refers to a polymer whose polymer chains are joined together by covalent chemical bonds, usually via crosslinking molecules or groups, to form a network polymer. A crosslinked polymer is generally characterized by insolubility, but may be swellable in the presence of an appropriate solvent.
- a “visible light-transmissive” support, layer, assembly or device means that the support, layer, assembly or device has an average transmission over the visible portion of the spectrum, T vis of at least about 20%, measured along the normal axis.
- diamond-like glass refers to substantially or completely amorphous glass including carbon and silicon, and optionally including one or more additional components selected from the group including hydrogen, nitrogen, oxygen, fluorine, sulfur, titanium, and copper. Other elements may be present in certain embodiments.
- the amorphous diamond-like glass films may contain clustering of atoms to give it a short-range order but are essentially void of medium and long range ordering that lead to micro or macro crystallinity which can adversely scatter radiation having wavelengths of from 180 nanometers (nm) to 800 nm.
- DLC diamond-like carbon
- FIG. 1 is a schematic view of a disclosed barrier assembly
- FIG. 2 is a schematic view of a disclosed barrier assembly having multiple layers made from alternating DLG or DLC layers and polymer layers;
- FIG. 3 is a schematic view of a disclosed laminated barrier assembly having multiple layers made from polymers
- FIG. 4 is a schematic view of an apparatus for carrying out a disclosed process for making barrier assemblies.
- FIG. 5 is a schematic cross-sectional view of an exemplary OLED device that can incorporate the barrier assembly.
- Embodiments consistent with the present invention include an enhanced PECVD process that leads to coatings having superior moisture vapor barrier performance.
- excellent barrier performance is achieved from a SiOCH film formed on a web in intimate contact with a drum electrode utilizing radio frequency (RF) plasma conditions that lead to an oxygen depleted silicon oxide coating under significant energetic ion bombardment.
- RF radio frequency
- the MVTRs of barrier coatings deposited using this process were less than 0.005 g/m 2 day measured using ASTM F-1219 at 50° C.
- barrier coatings at least 100 nm thick deposited under high self-bias and low pressures result in superior moisture vapor transmission rates.
- the coatings are deposited on a drum electrode powered using an RF source operating at least 1000 W of forward power.
- the vacuum chamber is configured such that these operating conditions result in a very high (>500 V) negative potential on the drum electrode.
- the coating formed has very low free volume.
- the drum is typically water cooled.
- a silicon source such as tetra methyl silane (TMS) and oxygen is introduced in quantities such that the resulting coatings are oxygen depleted in certain embodiments. Even though the coatings are deficient in oxygen, the coatings have high optical transmission. Nitrogen may be introduced in addition to oxygen to obtain a SiOCNH coating.
- the SiOCNH coatings also have superior barrier properties.
- barrier coatings are made by an RF PECVD process on a moving drum electrode under high self-bias; (2) the CVD process is operated at a very low pressure of less than 50 mTorr, preferably less than 25 mTorr, most preferably less than 10 mTorr to avoid gas phase nucleation and particle formation, and to prevent collisional quenching of ion energy at higher pressures; and (3) the coatings are significantly “oxygen depleted,” meaning that for every Si atom there are less than 1.5 oxygen atoms present in the coating (O/Si atomic ratio ⁇ 1.5).
- the barrier coatings may be used for various types of packaging applications.
- electronics, medical, pharmaceutical and foodstuffs packaging all have varying requirements for protection from moisture and oxygen.
- the barrier coatings may be used, for example, to protect drugs from oxygen and moisture, helping to maintain their purity and increase their shelf life by avoiding the adverse effects of contaminants.
- the barrier coatings may be used, for example, to protect food products from oxygen and moisture, helping to preserve their flavor and increase their shelf life.
- Another application involves using the coatings to encapsulate phosphor particles including electroluminescent phosphor particles such as zinc sulfide, organic electroluminescent thin films, photovoltaic devices, and other such devices.
- Substrates having the barrier coatings may be used in the fabrication of flexible electronic devices such as OLEDs, organic transistors, liquid crystal displays (LCD), and other devices.
- the coatings can also be used to encapsulate the OLED devices directly, and the barrier film could be used as a cover for encapsulating glass or plastic substrate devices. Due to the superior barrier performance of the coatings produced using the described PECVD conditions, such devices could be produced at a lower cost with better performance.
- FIG. 1 is a schematic view of a disclosed barrier assembly having a coating 100 to reduce or prevent substantial transfer of moisture and oxygen, or other contaminants, to an underlying substrate 102 .
- the assembly can represent any type of article requiring or benefiting from protection from moisture or oxygen, such as the examples provided above.
- oxygen and moisture can severely degrade their performance or lifetime, and thus the coating 100 can provide significant advantages in device performance.
- FIG. 2 is a schematic view of a disclosed laminated barrier assembly 110 having multiple layers made from alternating DLG or DLC layers 116 , 120 and polymer layers 114 , 118 protecting an underlying substrate 112 .
- FIG. 3 is a schematic view of a disclosed laminated barrier assembly 130 having multiple layers made from alternating different types of polymer layers, for example alternating polymer layers 136 , 140 and polymer layers 134 , 138 protecting an underlying substrate 132 .
- layers 136 and 140 are composed of a first type of polymer
- layers 134 and 138 are composed of a second type of polymer different from the first type of polymer.
- Any highly crosslinked polymers may be used for the layers, examples of which are provided below.
- Assembly 130 is thus an all polymer multilayer construction of a barrier assembly, although it can also include other types of layers.
- Each group of different polymers e.g., 134 and 136
- combinations of polymers including DLG or DLC e.g., 114 and 116
- the assembly can include any number of dyads. It can also include various types of optional layers between the dyads, examples of which are provided below.
- Assemblies 110 and 130 can include any number of alternating or other layers. Adding more layers may improve the lifetime of the assemblies by increasing their imperviousness to oxygen, moisture, or other contaminants. Use of more or multiple layers may also help cover or encapsulate defects within the layers. The number of layers can be optimized, or otherwise selected, based upon particular implementations or other factors.
- Substrates having moisture barrier coatings can include any type of substrate material for use in making a display or electronic device.
- the substrate can be rigid, for example by using glass or other materials.
- the substrate can also be curved or flexible, for example by using plastics or other materials.
- the substrate can be of any desired shape.
- thermoplastic films such as polyesters (e.g., PET), polyacrylates (e.g., polymethyl methacrylate), polycarbonates, polypropylenes, high or low density polyethylenes, polyethylene naphthalates, polysulfones, polyether sulfones, polyurethanes, polyamides, polyvinyl butyral, polyvinyl chloride, polyvinylidene difluoride and polyethylene sulfide, and thermoset films such as cellulose derivatives, polyimide, polyimide benzoxazole, and poly benzoxazole.
- polyesters e.g., PET
- polyacrylates e.g., polymethyl methacrylate
- polycarbonates e.g., polypropylenes, high or low density polyethylenes, polyethylene naphthalates, polysulfones, polyether sulfones, polyurethanes, polyamides, polyvinyl butyral, polyvinyl chloride, polyviny
- CTFE/VDF chlorotrifluoroethylene-vinylidene fluoride copolymer
- ECTFE ethylene-chlorotrifluoroethylene copolymer
- ETFE ethylene-tetrafluoroethylene copolymer
- FEP fluorinated ethylene-propylene copolymer
- PCTFE polychlorotrifluoroethylene
- PFA perfluoroalkyl-tetrafluoroethylene copolymer
- PTFE polytetrafluoroethyloene
- PVDF polyvinylidene fluoride
- PVDF polyvinyl fluoride
- PVDF polyvinyl fluoride
- TFE/HFP tetrafluoroethylene-hexafluoropropylene-vinylidene fluoride terpolymer
- TFE tetrafluoroethylene-hexafluoropropylene-vinylidene fluoride terpolymer
- PCTFE polych
- Alternative substrates include materials having a high glass transition temperature (Tg) barrier, preferably being heat-stabilized, using heat setting, annealing under tension, or other techniques that will discourage shrinkage up to at least the heat stabilization temperature when the support is not constrained.
- Tg glass transition temperature
- HSET heat-stabilized polyethylene terephthalate
- the substrate has a thickness of about 0.01 millimeters (mm) to about 1 mm, more preferably about 0.05 mm to about 0.25 mm.
- Diamond-like glass is an amorphous carbon system including a substantial quantity of silicon and oxygen that exhibits diamond-like properties.
- these films on a hydrogen-free basis, there is at least 30% carbon, a substantial amount of silicon (typically at least 25%) and no more than 45% oxygen.
- the unique combination of a fairly high amount of silicon with a significant amount of oxygen and a substantial amount of carbon makes these films highly transparent and flexible (unlike glass).
- Diamond-like glass thin films may have a variety of light transmissive properties. Depending upon the composition, the thin films may have increased transmissive properties at various frequencies. However, in specific implementations the thin film (when approximately one micron thick) is at least 70% transmissive to radiation at substantially all wavelengths from about 250 nm to about 800 nm and more preferably from about 400 nm to about 800 nm.
- the extinction coefficient of DLG film is as follows: 70% transmission for a one micron thick film corresponds to an extinction coefficient (k) of less than 0.02 in the visible wavelength range between 400 nm and 800 nm.
- Diamond thin films having significantly different properties from the amorphous diamond-like glass film of the present invention due to the arrangement and intermolecular bonds of carbon atoms in the specific material, have previously been deposited on substrates.
- the type and amount of intermolecular bonds are determined by infrared (IR) and nuclear magnetic resonance (NMR) spectra.
- Carbon deposits contain substantially two types of carbon-carbon bonds: trigonal graphite bonds (sp 2 ) and tetrahedral diamond bonds (sp 3 ).
- Diamond is composed of virtually all tetrahedral bonds
- diamond-like films are composed of approximately 50% to 90% tetrahedral bonds
- graphite is composed of virtually all trigonal bonds.
- Diamond is crystalline whereas the diamond-like glass is a non-crystalline amorphous material, as determined by x-ray diffraction. Diamond is essentially pure carbon, whereas diamond-like glass contains a substantial amount of non-carbon components, including silicon.
- Diamond has the highest packing density, or gram atom density (GAD) of any material at ambient pressure. Its GAD is 0.28 gram atoms/cc. Amorphous diamond-like films have a GAD ranging from about 0.20 to 0.28 gram atoms/cc. In contrast, graphite has a GAD of 0.18 gram atoms/cc.
- GAD gram atom density
- the high packing density of diamond-like glass affords excellent resistance to diffusion of liquid or gaseous materials.
- Gram atom density is calculated from measurements of the weight and thickness of a material. The term “gram atom” refers to the atomic weight of a material expressed in grams.
- Amorphous diamond-like glass is diamond-like because, in addition to the foregoing physical properties that are similar to diamond, it has many of the desirable performance properties of diamond such as extreme hardness (typically 1000 to 2000 kg/mm 2 ), high electrical resistivity (often 109 to 1013 ohm-cm), a low coefficient of friction (for example, 0.1), and optical transparency over a wide range of wavelengths (a typical extinction coefficient of about between 0.01 and 0.02 in the 400 nm to 800 nm range).
- extreme hardness typically 1000 to 2000 kg/mm 2
- high electrical resistivity often 109 to 1013 ohm-cm
- a low coefficient of friction for example, 0.1
- optical transparency over a wide range of wavelengths (a typical extinction coefficient of about between 0.01 and 0.02 in the 400 nm to 800 nm range).
- Diamond films also have some properties which, in many applications, make them less beneficial than amorphous diamond-like glass films.
- Diamond films usually have grain structures, as determined by electron microscopy. The grain boundaries are a path for chemical attack and degradation of the substrates, and also cause scattering of actinic radiation.
- Amorphous diamond-like glass does not have a grain structure, as determined by electron microscopy, and is thus well suited to applications wherein actinic radiation will pass through the film.
- the polycrystalline structure of diamond films causes light scattering from the grain boundaries.
- various additional components can be incorporated into the basic carbon or carbon and hydrogen composition. These additional components can be used to alter and enhance the properties that the diamond-like glass film imparts to the substrate. For example, it may be desirable to further enhance the barrier and surface properties.
- the additional components may include one or more of hydrogen (if not already incorporated), nitrogen, fluorine, sulfur, titanium, or copper. Other additional components may also be of benefit.
- the addition of hydrogen promotes the formation of tetrahedral bonds.
- the addition of fluorine is particularly useful in enhancing barrier and surface properties of the diamond-like glass film, including the ability to be dispersed in an incompatible matrix.
- the addition of nitrogen may be used to enhance resistance to oxidation and to increase electrical conductivity.
- the addition of sulfur can enhance adhesion.
- the addition of titanium tends to enhance adhesion as well as diffusion and barrier properties.
- These diamond-like materials may be considered as a form of plasma polymers, which can be deposited on the assembly using, for example, a vapor source.
- plasma polymer is applied to a class of materials synthesized from a plasma by using precursor monomers in the gas phase at low temperatures. Precursor molecules are broken down by energetic electrons present in the plasma to form free radical species. These free radical species react at the substrate surface and lead to polymeric thin film growth. Due to the non-specificity of the reaction processes in both the gas phase and the substrate, the resulting polymer films are highly cross-linked and amorphous in nature. This class of materials has been researched and summarized in publications such as the following: H.
- these polymers have an organic nature to them due to the presence of hydrocarbon and carbonaceous functional groups such as CH 3 , CH 2 , CH, Si—C, Si—CH 3 , Al—C, Si—O—CH 3 , etc.
- hydrocarbon and carbonaceous functional groups such as CH 3 , CH 2 , CH, Si—C, Si—CH 3 , Al—C, Si—O—CH 3 , etc.
- the presence of these functional groups may be ascertained by analytical techniques such as IR, nuclear magnetic resonance (NMR) and secondary ion mass (SIMS) spectroscopies.
- the carbon content in the film may be quantified by electron spectroscopy for chemical analysis (ESCA).
- Inorganic thin films are frequently deposited by PECVD at elevated substrate temperatures to produce thin inorganic films such as amorphous silicon, silicon oxide, silicon nitride, aluminum nitride, etc. Lower temperature processes may be used with inorganic precursors such as silane (SiH 4 ) and ammonia (NH 3 ). In some cases, the organic component present in the precursors is removed in the plasma by feeding the precursor mixture with an excess flow of oxygen. Silicon rich films are produced frequently from tetramethyldisiloxane (TMDSO)-oxygen mixtures where the oxygen flow rate is ten times that of the TMDSO flow. Films produced in these cases have an oxygen to silicon ratio of about 2, which is near that of silicon dioxide.
- TMDSO tetramethyldisiloxane
- the plasma polymer layer of this invention is differentiated from other inorganic plasma deposited thin films by the oxygen to silicon ratio in the films and by the amount of carbon present in the films.
- a surface analytic technique such as ESCA
- the elemental atomic composition of the film may be obtained on a hydrogen-free basis.
- Plasma polymer films of the present invention are substantially sub-stoichiometric in their inorganic component and substantially carbon-rich, depicting their organic nature.
- the oxygen to silicon ratio is preferably below 1.8 (silicon dioxide has a ratio of 2.0), and most preferably below 1.5 as in the case of DLG, and the carbon content is at least about 10%.
- the carbon content is at least about 20% and most preferably at least about 25%.
- the organic siloxane structure of the films may be detected by IR spectra of the film with the presence of Si—CH 3 groups at 1250 cm ⁇ 1 and 800 cm ⁇ 1 , and by secondary ion mass spectroscopy (SIMS).
- DLG coatings or films are their resistance to cracking in comparison to other films. DLG coatings are inherently resistant to cracking either under applied stress or inherent stresses arising from manufacture of the film. This property was determined by cutting 75 mm ⁇ 10 mm strips of sample #2 prepared according to the process conditions in Table 2 of Example 1 below (175 nm thick DLG coating) and sample #1 prepared according to the conditions described in Table 3 of Example 1 below (60 nm thick sputtered SiOx film). The strips were attached to the jaws of a home-made vise. The extent of travel of the jaws was determined by a digital micrometer attached to the vise. The sample strips were stretched by opening the jaws by 1.5 mm thus producing a 2% elongation in the coated samples.
- Diamond and DLC differ significantly due to the arrangement of carbon atoms in the specific material.
- Carbon coatings contain substantially two types of carbon-carbon bonds: trigonal graphite bonds (sp 2 ) and tetrahedral diamond bonds (sp 3 ).
- Diamond is composed of virtually all tetrahedral bonds
- DLC is composed of approximately 50% to 90% tetrahedral bonds
- graphite is composed of virtually all trigonal bonds. The type and amount of bonds are determined from IR and nuclear magnetic resonance (NMR) spectra.
- the crystallinity and the nature of the bonding of the carbon determine the physical and chemical properties of the coating.
- Diamond is crystalline whereas DLC is a non-crystalline amorphous material, as determined by x-ray diffraction.
- DLC contains a substantial amount of hydrogen (from 10 to 50 atomic percent), unlike diamond which is essentially pure carbon. Atomic percentages are determined by combustion analysis.
- Diamond has the highest packing, or gram atom, density (GAD) of any material at ambient pressure. Its GAD is 0.28 gram atoms/cc. Diamond-like carbon has a GAD ranging from about 0.20 to 0.28 gram atoms/cc. In contrast, graphite has a GAD of 0.18 gram atoms/cc.
- GAD gram atom density
- DLC coatings are diamond-like because, in addition to the foregoing physical properties that are similar to diamond, they have many of the desirable properties of diamond such as extreme hardness (1000 to 2000 kg/mm 2 ), high electrical resistivity (109 to 1013 ohm-cm), a low coefficient of friction (0.1), and optical transparency over a wide range of wavelengths (extinction coefficient of less than 0.1 in the 400 to 800 nanometer range).
- Diamond coatings have some properties which, in some applications, make them less beneficial as a coating than DLC.
- Diamond coatings are comprised of a grain structures, as determined by electron microscopy. The grain boundaries are a path for chemical attack and degradation of underlying sensitive materials, via transmission of water or oxygen. The amorphous DLC coatings do not have a grain structure, as determined by electron microscopy.
- Diamond and DLC also have different light absorption characteristics.
- diamond has no intrinsic fundamental absorption in the blue light range because its optical band gap is 5.56 eV and it is transmissive well into the ultraviolet region.
- DLC contains small amounts of unsaturated bonds due to carbon-carbon double bonding, which causes an optical absorption band in the blue region of the electromagnetic spectrum.
- additives to the DLC coating can be used. These additives may comprise one or more of nitrogen, oxygen, fluorine, or silicon.
- the addition of fluorine is particularly useful in enhancing barrier and surface properties, including dispersibility, of the DLC coating.
- Sources of fluorine include compounds such as carbon tetrafluoride (CF 4 ), sulfur hexafluoride (SF 6 ), C 2 F 6 , C 3 F 8 , and C 4 F 10 .
- the addition of silicon and oxygen to the DLC coating tend to improve the optical transparency and thermal stability of the coating.
- the addition of nitrogen may be used to enhance resistance to oxidation and to increase electrical conductivity.
- Sources of oxygen include oxygen gas (O 2 ), water vapor, ethanol, and hydrogen peroxide.
- Sources of silicon preferably include silanes such as SiH 4 , Si 2 H 6 , and hexamethyldisiloxane.
- Sources of nitrogen include nitrogen gas (N 2 ), ammonia (NH 3 ), and hydrazine (N 2 H 6 ).
- the additives may be incorporated into the diamond-like matrix or attached to the surface atomic layer. If the additives are incorporated into the diamond-like matrix they may cause perturbations in the density and/or structure, but the resulting material is essentially a densely packed network with diamond-like carbon characteristics (chemical inertness, hardness, barrier properties, etc.). If the additive concentration is large, greater than 50 atomic percent relative to the carbon concentration, the density will be affected and the beneficial properties of the diamond-like carbon network will be lost. If the additives are attached to the surface atomic layers they will alter only the surface structure and properties. The bulk properties of the diamond-like carbon network will be preserved.
- the polymer layers used in the multilayer stack of the barrier assemblies are preferably crosslinkable.
- the crosslinked polymeric layer lies atop the substrate or other layers, and it can be formed from a variety of materials.
- the polymeric layer is crosslinked in situ atop the underlying layer.
- the polymeric layer can be applied using conventional coating methods such as roll coating (e.g., gravure roll coating) or spray coating (e.g., electrostatic spray coating), then crosslinked using, for example, ultraviolet (UV) radiation.
- roll coating e.g., gravure roll coating
- spray coating e.g., electrostatic spray coating
- UV radiation ultraviolet
- the polymeric layer is formed by flash evaporation, vapor deposition and crosslinking of a monomer as described above.
- Volatilizable (meth)acrylate monomers are preferred for use in such a process, with volatilizable acrylate monomers being especially preferred.
- Preferred (meth)acrylates have a molecular weight in the range of about 150 to about 600, more preferably about 200 to about 400.
- Other preferred (meth)acrylates have a value of the ratio of the molecular weight to the number of acrylate functional groups per molecule in the range of about 150 to about 600 g/mole/(meth)acrylate group, more preferably about 200 to about 400 g/mole/(meth)acrylate group.
- Fluorinated (meth)acrylates can be used at higher molecular weight ranges or ratios, e.g., about 400 to about 3000 molecular weight or about 400 to about 3000 g/mole/(meth)acrylate group. Coating efficiency can be improved by cooling the support.
- Particularly preferred monomers include multifunctional (meth)acrylates, used alone or in combination with other multifunctional or mono functional (meth)acrylates, such as hexanediol diacrylate, ethoxyethyl acrylate, phenoxyethyl acrylate, cyanoethyl (mono)acrylate, isobornyl acrylate, isobornyl methacrylate, octadecyl acrylate, isodecyl acrylate, lauryl acrylate, beta-carboxyethyl acrylate, tetrahydrofurfuryl acrylate, dinitrile acrylate, pentafluorophenyl acrylate, nitrophenyl acrylate, 2-phenoxyethyl acrylate, 2-phenoxyethyl methacrylate, 2,2,2-trifluoromethyl (meth)acrylate, diethylene glycol diacrylate, triethylene glycol diacrylate, triethylene glycol dimethacrylate
- the physical thickness of the crosslinked polymeric layer will depend in part upon its refractive index and in part upon the desired optical characteristics of the film (e.g., on whether the film should contain a Fabry-Perot stack).
- the crosslinked polymeric spacing layer typically will have a refractive index of about 1.3 to about 1.7, and preferably will have an optical thickness of about 75 nm to about 200 nm, more preferably about 100 nm to about 150 nm and a corresponding physical thickness of about 50 nm to about 130 nm, more preferably about 65 nm to about 100 nm.
- Alternative materials for the polymer layers include materials having a Tg greater than or equal to that of HSPET.
- a variety of alternative polymer materials can be employed. Volatilizable monomers that form suitably high Tg polymers are especially preferred.
- the alternative polymer layer has a Tg greater than that of PMMA, more preferably a Tg of at least about 110° C., yet more preferably at least about 150° C., and most preferably at least about 200° C.
- Various functional layers or coatings can be added to the barrier assemblies to alter or improve their physical or chemical properties, particularly at the surface of the barrier film.
- Such layers or coatings can include, for example, visible light-transmissive conductive layers or electrodes (e.g., of indium tin oxide); antistatic coatings or films; flame retardants; UV stabilizers; abrasion resistant or hardcoat materials; optical coatings; anti-fogging materials; magnetic or magneto-optic coatings or films; photographic emulsions; prismatic films; holographic films or images; adhesives such as pressure sensitive adhesives or hot melt adhesives; primers to promote adhesion to adjacent layers; and low adhesion backsize materials for use when the barrier assembly is to be used in adhesive roll form.
- These functional components can be incorporated into one or more of the outermost layers of the barrier assembly or can be applied as a separate film or coating.
- Optional layers can also include “getter” or “desiccant” layers functionally incorporated within or adjacent to the barrier coating; examples of such layers are described in copending U.S. patent application Ser. Nos. 10/948,013 and 10/948,011, which are incorporated herein by reference as if fully set forth.
- Getter layers include layers with materials that absorb or deactivate oxygen
- desiccant layers include layers with materials that absorb or deactivate water.
- inorganic barrier layers include one or more inorganic barrier layers.
- the inorganic barrier layers when multiple such layers are used, do not have to be the same.
- a variety of inorganic barrier materials can be employed.
- Preferred inorganic barrier materials include metal oxides, metal nitrides, metal carbides, metal oxynitrides, metal oxyborides, and combinations thereof, e.g., silicon oxides such as silica, aluminum oxides such as alumina, titanium oxides such as titania, indium oxides, tin oxides, indium tin oxide (“ITO”), tantalum oxide, zirconium oxide, niobium oxide, boron carbide, tungsten carbide, silicon carbide, aluminum nitride, silicon nitride, boron nitride, aluminum oxynitride, silicon oxynitride, boron oxynitride, zirconium oxyboride, titanium oxyboride, and combinations thereof.
- Indium tin oxide, silicon oxide, aluminum oxide and combinations thereof are especially preferred inorganic barrier materials.
- ITO is an example of a special class of ceramic materials that can become electrically conducting with the proper selection of the relative proportions of each elemental constituent.
- the inorganic barrier layers when incorporated into the assembly, preferably are formed using techniques employed in the film metallizing art such as sputtering (e.g., cathode or planar magnetron sputtering), evaporation (e.g., resistive or electron beam evaporation), chemical vapor deposition, plating and the like. Most preferably the inorganic barrier layers are formed using sputtering, e.g., reactive sputtering.
- Enhanced barrier properties have been observed when the inorganic layer is formed by a high energy deposition technique such as sputtering compared to lower energy techniques such as conventional chemical vapor deposition processes. Without being bound by theory, it is believed that the enhanced properties are due to the condensing species arriving at the substrate with greater kinetic energy, leading to a lower void fraction as a result of compaction.
- the smoothness and continuity of each inorganic barrier layer and its adhesion to the underlying layer can be enhanced by pretreatments (e.g., plasma pretreatment) such as those described above.
- the barrier assembly may be desirable to alter the appearance or performance of the barrier assembly, such as by laminating a dyed film layer to the barrier assembly, applying a pigmented coating to the surface of the barrier assembly, or including a dye or pigment in one or more of the materials used to make the barrier assembly.
- the dye or pigment can absorb in one or more selected regions of the spectrum, including portions of the infrared, ultraviolet or visible spectrum.
- the dye or pigment can be used to complement the properties of the barrier assembly, particularly where the barrier assembly transmits some frequencies while reflecting others.
- the barrier assembly can be treated with, for example, inks or other printed indicia such as those used to display product identification, orientation information, advertisements, warnings, decoration, or other information.
- inks or other printed indicia such as those used to display product identification, orientation information, advertisements, warnings, decoration, or other information.
- Various techniques can be used to print on the barrier assembly, such as, for example, screen printing, inkjet printing, thermal transfer printing, letterpress printing, offset printing, flexographic printing, stipple printing, laser printing, and so forth, and various types of ink can be used, including one and two component inks, oxidatively drying and UV-drying inks, dissolved inks, dispersed inks, and 100% ink systems.
- the barrier assemblies can also have a protective polymer topcoat.
- the topcoat polymer layer can be applied using conventional coating methods such as roll coating (e.g., gravure roll coating) or spray coating (e.g., electrostatic spray coating), then crosslinked using, for example, UV radiation.
- a pretreatment e.g., plasma pretreatment
- the desired chemical composition and thickness of the topcoat polymer layer will depend in part on the nature and surface topography of the underlying layer(s), the hazards to which the barrier assembly might be exposed, and applicable device requirements.
- the topcoat polymer layer thickness preferably is sufficient to provide a smooth, defect-free surface that will protect the underlying layers from ordinary hazards.
- the polymer layers can be formed by applying a layer of a monomer or oligomer to the substrate and crosslinking the layer to form the polymer in situ, e.g., by flash evaporation and vapor deposition of a radiation-crosslinkable monomer, followed by crosslinking using, for example, an electron beam apparatus, UV light source, electrical discharge apparatus or other suitable device. Coating efficiency can be improved by cooling the support.
- the monomer or oligomer can also be applied to the substrate using conventional coating methods such as roll coating (e.g., gravure roll coating) or spray coating (e.g., electrostatic spray coating), then crosslinked as set out above.
- the polymer layers can also be formed by applying a layer containing an oligomer or polymer in solvent and drying the thus-applied layer to remove the solvent.
- Plasma polymerization may also be employed if it will provide a polymeric layer having a glassy state at an elevated temperature, with a glass transition temperature greater than or equal to that of HSPET.
- the polymer layers are formed by flash evaporation and vapor deposition followed by crosslinking in situ, e.g., as described in U.S. Pat. No. 4,696,719 (Bischoff), U.S. Pat. No. 4,722,515 (Ham), U.S. Pat. No. 4,842,893 (Yializis et al.), U.S. Pat. No.
- FIG. 4 illustrates a preferred apparatus 180 that can be used for roll-to-roll manufacture of barrier assemblies on the invention, such as those shown in FIGS. 1-3 and described above.
- a more detailed diagram and description of a vacuum system used to make the barrier coatings is shown in U.S. Pat. No. 5,888,594, incorporated herein by reference.
- Powered rolls 181 a and 181 b move supporting web 182 back and forth through apparatus 180 .
- Temperature-controlled rotating drums 183 a and 183 b , and idler rolls 184 a , 184 b , 184 c , 184 d and 184 e carry web 182 past metal sputtering applicator 185 , plasma pretreater 186 , monomer evaporator 187 and E-beam crosslinking device 188 .
- Liquid material 189 is supplied to evaporator 187 from reservoir 190 . Successive layers or pairs of layers can be applied to web 182 using multiple passes through apparatus 180 .
- apparatus 180 can be added to apparatus 180 , for example along the periphery of drums 183 a and 183 b , to enable sequential deposition of several pairs of layers.
- a power source 191 can provide the appropriate bias to drum 183 a .
- Apparatus 180 can be enclosed in a suitable chamber (as represented by the box enclosing it) and maintained under vacuum or supplied with a suitable inert atmosphere in order to discourage oxygen, water vapor, dust and other atmospheric contaminants from interfering with the various pretreatment, monomer coating, crosslinking and sputtering steps.
- apparatus 180 can alternatively use only one drum 183 a for coating web 182 , along the appropriate elements for applying layers to the web.
- FIG. 5 is a schematic cross-sectional view of a disclosed OLED device.
- the barrier assemblies of the invention such as those shown in FIGS. 1-3 and described above, can be used to inhibit the transmission of moisture vapor, oxygen or other gases in a variety of applications.
- the barrier assemblies are especially useful for encapsulating OLEDs, light valves such as LCDs, and other electronic devices, aside from the other examples provided above.
- a representative encapsulated OLED device 200 is shown in FIG. 5 .
- the front or light-emitting side of device 200 faces downward in FIG. 5 .
- Device 200 includes a visible light-transmissive barrier assembly 210 having an outer indium tin oxide layer (not shown in FIG. 5 , but oriented so that it would face upward) that serves as an anode.
- Light emitting structure 220 is formed on barrier assembly 210 in contact with the outer ITO layer.
- Structure 220 contains a plurality of layers (not individually shown in FIG. 5 ) that cooperate to emit light downward through barrier assembly 210 when suitably electrically energized.
- Device 200 also includes conductive cathode 230 and metallic foil surround 250 .
- Foil surround 250 is adhered to the back, sides and part of the front of device 220 by adhesive 240 .
- An opening 260 formed in adhesive 240 permits a portion 270 of foil 250 to be deformed into contact with cathode 230 .
- Another opening in foil 250 (not shown in FIG. 5 ) permits contact to be made with the anode formed by the outer ITO layer of barrier assembly 210 .
- Metal foil 250 and barrier assembly 210 largely prevent water vapor and oxygen from reaching light emitting structure 220 .
- a UV-curable polymer solution was made containing 100 grams of epoxy acrylate, commercially available from UCB Chemicals, Smyrna, Ga. under the trade designation “Ebecryl 629”; 2 grams of 1-hydroxy-cyclohexyl-phenyl ketone, commercially available from Ciba Specialty Chemicals, Tarrytown, N.Y. under the trade designation “Irgacure184” dissolved in 1000 grams of methyl ethyl ketone.
- the resulting solution was coated at a web speed of 20 ft/min on a 6.5 inch wide, 100 micron polyethylene terephthalate (“PET”) liner commercially available from Teijin Corp., Japan under the trade designation “HSPE 100” using a microgravure coater commercially available from Yasui Seiki, Japan under the trade designation “Model CAG150” fitted with a 90R knurl.
- PET polyethylene terephthalate
- the coating was dried in-line at 70° C. and cured under a nitrogen atmosphere with UV lamp commercially available from Fusion UV systems, Gaithersburg, Md. under the trade designation “F-600 Fusion D UV lamp” operating at 100% power, resulting in a dried coating thickness of approximately 1.2 microns.
- the polymer coated web described above was loaded into the vacuum chamber of the coating system used to make DLG coating shown in U.S. Pat. No. 5,888,594 and pumped down to approximately 1 mTorr.
- the reactive gases were introduced into the chamber and RF power was applied to the drum.
- the web speed was adjusted to achieve the desired coating thickness.
- a second polymer layer was coated over the first DLG coating according to same conditions as the first polymer layer except a 110R knurl was used which resulted in the polymer layer thickness of approximately 0.7 microns.
- Table 2 describes the deposition conditions for DLG coating and the MVTR of the resulting barrier coatings that were made in this chamber.
- Barrier coatings were also made using reactive sputtering process for comparison purposes.
- PET web coated with the first polymer layer was coated with SiOx coating deposited under conditions shown in Table 3.
- a second polymer layer was coated over the first SiOx layer and a second SiOx layer was then coated over the second polymer layer.
- the deposition conditions and MVTR of coatings made by the reactive sputtering process are listed in Table 3.
- the sample analyzed included a PET substrate 112 , acrylate layers 114 and 118 , and DLG film layers 116 and 120 .
- the process for coating the acrylate layers is described in Example 1.
- TMS tetramethylsilane
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Wood Science & Technology (AREA)
- Optics & Photonics (AREA)
- Electromagnetism (AREA)
- Plasma & Fusion (AREA)
- Laminated Bodies (AREA)
- Chemical Vapour Deposition (AREA)
- Electroluminescent Light Sources (AREA)
Abstract
A barrier assembly having a flexible or rigid substrate overcoated with an all polymer multilayer stack. A multilayer on the substrate includes alternating diamond-like glass or carbon layers with polymer layers. Another multilayer includes alternating polymer layers using different types of polymers. The barrier layers can be used to mount, cover, encapsulate or form composite assemblies for protection of moisture or oxygen sensitive articles
Description
- This application is a divisional of U.S. Ser. No. 11/185,078, filed Jul. 20, 2005, which is pending, the disclosure of which is incorporated by reference in its entirety herein.
- The present invention relates to barrier films for protection of moisture or oxygen sensitive articles.
- Organic light emitting devices (OLEDs) can suffer reduced output or premature failure when exposed to water vapor or oxygen. Metals and glasses have been used to encapsulate and prolong the life of OLED devices, but metals typically lack transparency and glass lacks flexibility. Intense efforts are underway to find alternative encapsulation materials for OLEDs and other electronic devices. Examples include various types of vacuum processes are described in the patent and technical literature for the formation of barrier coatings. These methods span the range of e-beam evaporation, thermal evaporation, electron-cyclotron resonance plasma-enhanced chemical vapor deposition (PECVD), magnetically enhanced PECVD, reactive sputtering, and others. Barrier performance of the coatings deposited by these methods typically results in a moisture vapor transmission rate (MVTR) in the range from 0.1-5 g/m2 day, depending on the specific processes. Graff (WO0036665) demonstrates the importance of separating multiple inorganic oxide coatings with vapor deposited highly cross-linked polymer layers to achieve barrier performance necessary for OLED device substrates.
- It is commonly accepted that multiple inorganic layers separated by polymer coatings are needed to achieve superior barrier performance. U.S. Pat. No. 5,320,875 teaches the importance of a plasma polymerized siloxane monomer and an adhesion promoter in addition to generating the plasma in an “oxygen excessive” mode and depositing the coatings in the “plasma reaction zone” to obtain improved barrier performance. The best barrier coatings made by this process still have an MVTR of 0.23 g/m2 day. Da Silva Sobrinho et al. (Surface and Coatings Technology, 116-119, p 1204, 1999) report a microwave and radio frequency combined process for depositing barrier coatings. In U.S. Pat. No. 6,146,225, Sheats et al. claim that a high density plasma with low bias voltage results in superior quality barrier coatings.
- References relating to flexible barrier films include U.S. Pat. No. 5,440,446 (Shaw et. al.), U.S. Pat. No. 5,530,581 (Cogan), U.S. Pat. No. 5,681,666 (Treger et al.), U.S. Pat. No. 5,686,360 (Harvey, III et al.), U.S. Pat. No. 5,736,207 (Walther et al.), U.S. Pat. No. 6,004,660 (Topolski et al.), U.S. Pat. No. 6,083,628 (Yializis), U.S. Pat. No. 6,146,225 (Sheats et al.), U.S. Pat. No. 6,214,422 (Yializis), U.S. Pat. No. 6,268,695 (Affinito), U.S. Pat. No. 6,358,570 (Affinito), U.S. Pat. No. 6,413,645 (Graff et al.), U.S. Pat. No. 6,492,026 (Graff et al.), U.S. Pat. No. 6,497,598 (Affinito), U.S. Pat. No. 6,497,598 (Affinito), U.S. Pat. No. 6,623,861 (Martin et al.), U.S. Pat. No. 6,570,325 (Graff et al.), U.S. Pat. No. 5,757,126, U.S. Patent Application No. 2002/0125822 A1 (Graff et al.), and PCT Published Application No. WO 97/16053 (Robert Bosch GmbH).
- A first composite assembly for protection of a moisture or oxygen sensitive article includes a substrate, a first polymer layer overcoated on the substrate, and a second polymer layer overcoated on the first polymer layer. In this assembly, the first polymer layer is composed of a first polymer and the second polymer layer is composed of a second polymer different from the first polymer, and the second polymer comprises a plasma polymer.
- A second composite assembly for protection of a moisture or oxygen sensitive article includes a substrate, a polymer layer overcoated on the substrate, and a diamond-like carbon layer overcoated on the polymer layer.
- A third composite assembly for protection of a moisture or oxygen sensitive article includes a substrate, a polymer layer overcoated on the substrate, and a diamond-like glass layer overcoated on the polymer glass layer.
- Processes include any method of fabricating these assemblies.
- The words of orientation such as “atop”, “on”, “uppermost” and the like for the location of various layers in the barrier assemblies or devices refer to the relative position of one or more layers with respect to a horizontal support layer. We do not intend that the barrier assemblies or devices should have any particular orientation in space during or after their manufacture.
- The term “overcoated” to describe the position of a layer with respect to a substrate or other element of a barrier assembly, refers to the layer as being atop the substrate or other element, but not necessarily contiguous to either the substrate or the other element.
- The term “polymer” refers to homopolymers and copolymers, as well as homopolymers or copolymers that may be formed in a miscible blend, e.g., by coextrusion or by reaction, including, e.g., transesterification. The term “polymer” also includes plasma deposited polymers. The term “copolymer” includes both random and block copolymers. The term “curable polymer” includes both crosslinked and uncrosslinked polymers. The term “crosslinked” polymer refers to a polymer whose polymer chains are joined together by covalent chemical bonds, usually via crosslinking molecules or groups, to form a network polymer. A crosslinked polymer is generally characterized by insolubility, but may be swellable in the presence of an appropriate solvent.
- The term a “visible light-transmissive” support, layer, assembly or device means that the support, layer, assembly or device has an average transmission over the visible portion of the spectrum, Tvis of at least about 20%, measured along the normal axis.
- The term “diamond-like glass” (DLG) refers to substantially or completely amorphous glass including carbon and silicon, and optionally including one or more additional components selected from the group including hydrogen, nitrogen, oxygen, fluorine, sulfur, titanium, and copper. Other elements may be present in certain embodiments. The amorphous diamond-like glass films may contain clustering of atoms to give it a short-range order but are essentially void of medium and long range ordering that lead to micro or macro crystallinity which can adversely scatter radiation having wavelengths of from 180 nanometers (nm) to 800 nm.
- The term “diamond-like carbon” (DLC) refers to an amorphous film or coating comprising approximately 50 to 90 atomic percent carbon and approximately 10 to 50 atomic percent hydrogen, with a gram atom density of between approximately 0.20 and approximately 0.28 gram atoms per cubic centimeter, and composed of approximately 50% to approximately 90% tetrahedral bonds.
- The invention may be more completely understood in the following detailed description of various embodiments of the invention in connection with the accompanying drawings, in which:
-
FIG. 1 is a schematic view of a disclosed barrier assembly; -
FIG. 2 is a schematic view of a disclosed barrier assembly having multiple layers made from alternating DLG or DLC layers and polymer layers; -
FIG. 3 is a schematic view of a disclosed laminated barrier assembly having multiple layers made from polymers; -
FIG. 4 is a schematic view of an apparatus for carrying out a disclosed process for making barrier assemblies; and -
FIG. 5 is a schematic cross-sectional view of an exemplary OLED device that can incorporate the barrier assembly. - Embodiments consistent with the present invention include an enhanced PECVD process that leads to coatings having superior moisture vapor barrier performance. In one particular embodiment, excellent barrier performance is achieved from a SiOCH film formed on a web in intimate contact with a drum electrode utilizing radio frequency (RF) plasma conditions that lead to an oxygen depleted silicon oxide coating under significant energetic ion bombardment. The MVTRs of barrier coatings deposited using this process were less than 0.005 g/m2 day measured using ASTM F-1219 at 50° C. According to certain embodiments, barrier coatings at least 100 nm thick deposited under high self-bias and low pressures (approximately 5-10 mTorr) result in superior moisture vapor transmission rates. The coatings are deposited on a drum electrode powered using an RF source operating at least 1000 W of forward power. The vacuum chamber is configured such that these operating conditions result in a very high (>500 V) negative potential on the drum electrode. As a result of ion bombardment from having high substrate bias, the coating formed has very low free volume. The drum is typically water cooled. A silicon source such as tetra methyl silane (TMS) and oxygen is introduced in quantities such that the resulting coatings are oxygen depleted in certain embodiments. Even though the coatings are deficient in oxygen, the coatings have high optical transmission. Nitrogen may be introduced in addition to oxygen to obtain a SiOCNH coating. The SiOCNH coatings also have superior barrier properties.
- Therefore, the process conditions that result in better barrier coatings are as follows: (1) barrier coatings are made by an RF PECVD process on a moving drum electrode under high self-bias; (2) the CVD process is operated at a very low pressure of less than 50 mTorr, preferably less than 25 mTorr, most preferably less than 10 mTorr to avoid gas phase nucleation and particle formation, and to prevent collisional quenching of ion energy at higher pressures; and (3) the coatings are significantly “oxygen depleted,” meaning that for every Si atom there are less than 1.5 oxygen atoms present in the coating (O/Si atomic ratio<1.5).
- The barrier coatings may be used for various types of packaging applications. For example, electronics, medical, pharmaceutical and foodstuffs packaging all have varying requirements for protection from moisture and oxygen. For pharmaceuticals, the barrier coatings may be used, for example, to protect drugs from oxygen and moisture, helping to maintain their purity and increase their shelf life by avoiding the adverse effects of contaminants. For foodstuffs, the barrier coatings may be used, for example, to protect food products from oxygen and moisture, helping to preserve their flavor and increase their shelf life. Another application involves using the coatings to encapsulate phosphor particles including electroluminescent phosphor particles such as zinc sulfide, organic electroluminescent thin films, photovoltaic devices, and other such devices. Substrates having the barrier coatings may be used in the fabrication of flexible electronic devices such as OLEDs, organic transistors, liquid crystal displays (LCD), and other devices. The coatings can also be used to encapsulate the OLED devices directly, and the barrier film could be used as a cover for encapsulating glass or plastic substrate devices. Due to the superior barrier performance of the coatings produced using the described PECVD conditions, such devices could be produced at a lower cost with better performance.
-
FIG. 1 is a schematic view of a disclosed barrier assembly having acoating 100 to reduce or prevent substantial transfer of moisture and oxygen, or other contaminants, to anunderlying substrate 102. The assembly can represent any type of article requiring or benefiting from protection from moisture or oxygen, such as the examples provided above. For certain types of electronic or display devices, for example, oxygen and moisture can severely degrade their performance or lifetime, and thus thecoating 100 can provide significant advantages in device performance. -
FIG. 2 is a schematic view of a disclosedlaminated barrier assembly 110 having multiple layers made from alternating DLG or DLC layers 116, 120 andpolymer layers underlying substrate 112.FIG. 3 is a schematic view of a disclosedlaminated barrier assembly 130 having multiple layers made from alternating different types of polymer layers, for example alternatingpolymer layers polymer layers underlying substrate 132. In this example, layers 136 and 140 are composed of a first type of polymer, and layers 134 and 138 are composed of a second type of polymer different from the first type of polymer. Any highly crosslinked polymers may be used for the layers, examples of which are provided below.Assembly 130, in one embodiment, is thus an all polymer multilayer construction of a barrier assembly, although it can also include other types of layers. Each group of different polymers (e.g., 134 and 136), or combinations of polymers including DLG or DLC (e.g., 114 and 116), are referred to as a dyad, and the assembly can include any number of dyads. It can also include various types of optional layers between the dyads, examples of which are provided below. -
Assemblies - Substrates having moisture barrier coatings can include any type of substrate material for use in making a display or electronic device. The substrate can be rigid, for example by using glass or other materials. The substrate can also be curved or flexible, for example by using plastics or other materials. The substrate can be of any desired shape. Particularly preferred supports are flexible plastic materials including thermoplastic films such as polyesters (e.g., PET), polyacrylates (e.g., polymethyl methacrylate), polycarbonates, polypropylenes, high or low density polyethylenes, polyethylene naphthalates, polysulfones, polyether sulfones, polyurethanes, polyamides, polyvinyl butyral, polyvinyl chloride, polyvinylidene difluoride and polyethylene sulfide, and thermoset films such as cellulose derivatives, polyimide, polyimide benzoxazole, and poly benzoxazole.
- Other suitable materials for the substrate include chlorotrifluoroethylene-vinylidene fluoride copolymer (CTFE/VDF), ethylene-chlorotrifluoroethylene copolymer (ECTFE), ethylene-tetrafluoroethylene copolymer (ETFE), fluorinated ethylene-propylene copolymer (FEP), polychlorotrifluoroethylene (PCTFE), perfluoroalkyl-tetrafluoroethylene copolymer (PFA), polytetrafluoroethyloene (PTFE), polyvinylidene fluoride (PVDF), polyvinyl fluoride (PVF), tetrafluoroethylene-hexafluoropropylene copolymer (TFE/HFP), tetrafluoroethylene-hexafluoropropylene-vinylidene fluoride terpolymer (THV), polychlorotrifluoroethylene (PCTFE), hexafluoropropylene-vinylidene fluoride copolymer (HFP/VDF), tetrafluoroethylene-propylene copolymer (TFE/P), and tetrafluoroethylene-perfluoromethylether copolymer (TFE/PFMe).
- Alternative substrates include materials having a high glass transition temperature (Tg) barrier, preferably being heat-stabilized, using heat setting, annealing under tension, or other techniques that will discourage shrinkage up to at least the heat stabilization temperature when the support is not constrained. If the support has not been heat stabilized, then it preferably has a Tg greater than that of polymethyl methacrylate (PMMA, Tg=105° C.). More preferably the support has a Tg of at least about 110° C., yet more preferably at least about 120° C., and most preferably at least about 128° C. In addition to heat-stabilized polyethylene terephthalate (HSPET), other preferred supports include other heat-stabilized high Tg polyesters, PMMA, styrene/acrylonitrile (SAN, Tg=110° C.), styrene/maleic anhydride (SMA, Tg=115° C.), polyethylene naphthalate (PEN, Tg=about 120° C.), polyoxymethylene (POM, Tg=about 125° C.), polyvinylnaphthalene (PVN, Tg=about 135° C.), polyetheretherketone (PEEK, Tg=about 145° C.), polyaryletherketone (PAEK, Tg=145° C.), high Tg fluoropolymers (e.g., DYNEON™ HTE terpolymer of hexafluoropropylene, tetrafluoroethylene, and ethylene, Tg=about 149° C.), polycarbonate (PC, Tg=about 150° C.), poly alpha-methyl styrene (Tg=about 175° C.), polyarylate (PAR, Tg=190° C.), polysulfone (PSul, Tg=about 195° C.), polyphenylene oxide (PPO, Tg=about 200° C.), polyetherimide (PEI, Tg=about 218° C.), polyarylsulfone (PAS, Tg=220° C.), poly ether sulfone (PES, Tg=about 225° C.), polyamideimide (PAI, Tg=about 275° C.), polyimide (Tg=about 300° C.) and polyphthalamide (heat deflection temp of 120° C.). For applications where material costs are important, supports made of HSPET and PEN are especially preferred. For applications where barrier performance is paramount, supports made of more expensive materials may be employed. Preferably the substrate has a thickness of about 0.01 millimeters (mm) to about 1 mm, more preferably about 0.05 mm to about 0.25 mm.
- Diamond-like glass is an amorphous carbon system including a substantial quantity of silicon and oxygen that exhibits diamond-like properties. In these films, on a hydrogen-free basis, there is at least 30% carbon, a substantial amount of silicon (typically at least 25%) and no more than 45% oxygen. The unique combination of a fairly high amount of silicon with a significant amount of oxygen and a substantial amount of carbon makes these films highly transparent and flexible (unlike glass).
- Diamond-like glass thin films may have a variety of light transmissive properties. Depending upon the composition, the thin films may have increased transmissive properties at various frequencies. However, in specific implementations the thin film (when approximately one micron thick) is at least 70% transmissive to radiation at substantially all wavelengths from about 250 nm to about 800 nm and more preferably from about 400 nm to about 800 nm. The extinction coefficient of DLG film is as follows: 70% transmission for a one micron thick film corresponds to an extinction coefficient (k) of less than 0.02 in the visible wavelength range between 400 nm and 800 nm.
- Diamond thin films, having significantly different properties from the amorphous diamond-like glass film of the present invention due to the arrangement and intermolecular bonds of carbon atoms in the specific material, have previously been deposited on substrates. The type and amount of intermolecular bonds are determined by infrared (IR) and nuclear magnetic resonance (NMR) spectra. Carbon deposits contain substantially two types of carbon-carbon bonds: trigonal graphite bonds (sp2) and tetrahedral diamond bonds (sp3). Diamond is composed of virtually all tetrahedral bonds, while diamond-like films are composed of approximately 50% to 90% tetrahedral bonds, and graphite is composed of virtually all trigonal bonds.
- The crystallinity and the nature of the bonding of the carbon system determine the physical and chemical properties of the deposit. Diamond is crystalline whereas the diamond-like glass is a non-crystalline amorphous material, as determined by x-ray diffraction. Diamond is essentially pure carbon, whereas diamond-like glass contains a substantial amount of non-carbon components, including silicon.
- Diamond has the highest packing density, or gram atom density (GAD) of any material at ambient pressure. Its GAD is 0.28 gram atoms/cc. Amorphous diamond-like films have a GAD ranging from about 0.20 to 0.28 gram atoms/cc. In contrast, graphite has a GAD of 0.18 gram atoms/cc. The high packing density of diamond-like glass affords excellent resistance to diffusion of liquid or gaseous materials. Gram atom density is calculated from measurements of the weight and thickness of a material. The term “gram atom” refers to the atomic weight of a material expressed in grams.
- Amorphous diamond-like glass is diamond-like because, in addition to the foregoing physical properties that are similar to diamond, it has many of the desirable performance properties of diamond such as extreme hardness (typically 1000 to 2000 kg/mm2), high electrical resistivity (often 109 to 1013 ohm-cm), a low coefficient of friction (for example, 0.1), and optical transparency over a wide range of wavelengths (a typical extinction coefficient of about between 0.01 and 0.02 in the 400 nm to 800 nm range).
- Diamond films also have some properties which, in many applications, make them less beneficial than amorphous diamond-like glass films. Diamond films usually have grain structures, as determined by electron microscopy. The grain boundaries are a path for chemical attack and degradation of the substrates, and also cause scattering of actinic radiation. Amorphous diamond-like glass does not have a grain structure, as determined by electron microscopy, and is thus well suited to applications wherein actinic radiation will pass through the film. The polycrystalline structure of diamond films causes light scattering from the grain boundaries.
- In creating a diamond-like glass film, various additional components can be incorporated into the basic carbon or carbon and hydrogen composition. These additional components can be used to alter and enhance the properties that the diamond-like glass film imparts to the substrate. For example, it may be desirable to further enhance the barrier and surface properties.
- The additional components may include one or more of hydrogen (if not already incorporated), nitrogen, fluorine, sulfur, titanium, or copper. Other additional components may also be of benefit. The addition of hydrogen promotes the formation of tetrahedral bonds. The addition of fluorine is particularly useful in enhancing barrier and surface properties of the diamond-like glass film, including the ability to be dispersed in an incompatible matrix. The addition of nitrogen may be used to enhance resistance to oxidation and to increase electrical conductivity. The addition of sulfur can enhance adhesion. The addition of titanium tends to enhance adhesion as well as diffusion and barrier properties.
- These diamond-like materials may be considered as a form of plasma polymers, which can be deposited on the assembly using, for example, a vapor source. The term “plasma polymer” is applied to a class of materials synthesized from a plasma by using precursor monomers in the gas phase at low temperatures. Precursor molecules are broken down by energetic electrons present in the plasma to form free radical species. These free radical species react at the substrate surface and lead to polymeric thin film growth. Due to the non-specificity of the reaction processes in both the gas phase and the substrate, the resulting polymer films are highly cross-linked and amorphous in nature. This class of materials has been researched and summarized in publications such as the following: H. Yasuda, “Plasma Polymerization,” Academic Press Inc., New York (1985); R.d'Agostino (Ed), “Plasma Deposition, Treatment & Etching of Polymers,” Academic Press, New York (1990); and H. Biederman and Y. Osada, “Plasma Polymerization Processes,” Elsever, New York (1992).
- Typically, these polymers have an organic nature to them due to the presence of hydrocarbon and carbonaceous functional groups such as CH3, CH2, CH, Si—C, Si—CH3, Al—C, Si—O—CH3, etc. The presence of these functional groups may be ascertained by analytical techniques such as IR, nuclear magnetic resonance (NMR) and secondary ion mass (SIMS) spectroscopies. The carbon content in the film may be quantified by electron spectroscopy for chemical analysis (ESCA).
- Not all plasma deposition processes lead to plasma polymers. Inorganic thin films are frequently deposited by PECVD at elevated substrate temperatures to produce thin inorganic films such as amorphous silicon, silicon oxide, silicon nitride, aluminum nitride, etc. Lower temperature processes may be used with inorganic precursors such as silane (SiH4) and ammonia (NH3). In some cases, the organic component present in the precursors is removed in the plasma by feeding the precursor mixture with an excess flow of oxygen. Silicon rich films are produced frequently from tetramethyldisiloxane (TMDSO)-oxygen mixtures where the oxygen flow rate is ten times that of the TMDSO flow. Films produced in these cases have an oxygen to silicon ratio of about 2, which is near that of silicon dioxide.
- The plasma polymer layer of this invention is differentiated from other inorganic plasma deposited thin films by the oxygen to silicon ratio in the films and by the amount of carbon present in the films. When a surface analytic technique such as ESCA is used for the analysis, the elemental atomic composition of the film may be obtained on a hydrogen-free basis. Plasma polymer films of the present invention are substantially sub-stoichiometric in their inorganic component and substantially carbon-rich, depicting their organic nature. In films containing silicon for example, the oxygen to silicon ratio is preferably below 1.8 (silicon dioxide has a ratio of 2.0), and most preferably below 1.5 as in the case of DLG, and the carbon content is at least about 10%. Preferably, the carbon content is at least about 20% and most preferably at least about 25%. Furthermore, the organic siloxane structure of the films may be detected by IR spectra of the film with the presence of Si—CH3 groups at 1250 cm−1 and 800 cm−1, and by secondary ion mass spectroscopy (SIMS).
- One advantage of DLG coatings or films is their resistance to cracking in comparison to other films. DLG coatings are inherently resistant to cracking either under applied stress or inherent stresses arising from manufacture of the film. This property was determined by cutting 75 mm×10 mm strips of sample #2 prepared according to the process conditions in Table 2 of Example 1 below (175 nm thick DLG coating) and sample #1 prepared according to the conditions described in Table 3 of Example 1 below (60 nm thick sputtered SiOx film). The strips were attached to the jaws of a home-made vise. The extent of travel of the jaws was determined by a digital micrometer attached to the vise. The sample strips were stretched by opening the jaws by 1.5 mm thus producing a 2% elongation in the coated samples. The stretched samples were placed under a microscope and number of cracks in the coating were counted. The results are provided in Table 1. It can be seen that the number of cracks is substantially lower for the DLG film even though its thickness is almost three times that of the sputtered SiOx film, contrary to the generally expected result that a thicker film would result in a greater tendency to crack.
-
TABLE 1 Number of cracks/mm after Thickness 2% stretch DLG film 175 nm 52 Sputtered film 60 nm 84 - Diamond and DLC differ significantly due to the arrangement of carbon atoms in the specific material. Carbon coatings contain substantially two types of carbon-carbon bonds: trigonal graphite bonds (sp2) and tetrahedral diamond bonds (sp3). Diamond is composed of virtually all tetrahedral bonds, DLC is composed of approximately 50% to 90% tetrahedral bonds, and graphite is composed of virtually all trigonal bonds. The type and amount of bonds are determined from IR and nuclear magnetic resonance (NMR) spectra.
- The crystallinity and the nature of the bonding of the carbon determine the physical and chemical properties of the coating. Diamond is crystalline whereas DLC is a non-crystalline amorphous material, as determined by x-ray diffraction. DLC contains a substantial amount of hydrogen (from 10 to 50 atomic percent), unlike diamond which is essentially pure carbon. Atomic percentages are determined by combustion analysis.
- Diamond has the highest packing, or gram atom, density (GAD) of any material at ambient pressure. Its GAD is 0.28 gram atoms/cc. Diamond-like carbon has a GAD ranging from about 0.20 to 0.28 gram atoms/cc. In contrast, graphite has a GAD of 0.18 gram atoms/cc. The high packing density of DLC affords it excellent resistance to diffusion of liquid or gaseous materials.
- DLC coatings are diamond-like because, in addition to the foregoing physical properties that are similar to diamond, they have many of the desirable properties of diamond such as extreme hardness (1000 to 2000 kg/mm2), high electrical resistivity (109 to 1013 ohm-cm), a low coefficient of friction (0.1), and optical transparency over a wide range of wavelengths (extinction coefficient of less than 0.1 in the 400 to 800 nanometer range).
- However, diamond coatings have some properties which, in some applications, make them less beneficial as a coating than DLC. Diamond coatings are comprised of a grain structures, as determined by electron microscopy. The grain boundaries are a path for chemical attack and degradation of underlying sensitive materials, via transmission of water or oxygen. The amorphous DLC coatings do not have a grain structure, as determined by electron microscopy.
- Diamond and DLC also have different light absorption characteristics. For example, diamond has no intrinsic fundamental absorption in the blue light range because its optical band gap is 5.56 eV and it is transmissive well into the ultraviolet region. DLC, on the other hand, contains small amounts of unsaturated bonds due to carbon-carbon double bonding, which causes an optical absorption band in the blue region of the electromagnetic spectrum.
- Various additives to the DLC coating can be used. These additives may comprise one or more of nitrogen, oxygen, fluorine, or silicon. The addition of fluorine is particularly useful in enhancing barrier and surface properties, including dispersibility, of the DLC coating. Sources of fluorine include compounds such as carbon tetrafluoride (CF4), sulfur hexafluoride (SF6), C2F6, C3F8, and C4F10. The addition of silicon and oxygen to the DLC coating tend to improve the optical transparency and thermal stability of the coating. The addition of nitrogen may be used to enhance resistance to oxidation and to increase electrical conductivity. Sources of oxygen include oxygen gas (O2), water vapor, ethanol, and hydrogen peroxide. Sources of silicon preferably include silanes such as SiH4, Si2H6, and hexamethyldisiloxane. Sources of nitrogen include nitrogen gas (N2), ammonia (NH3), and hydrazine (N2H6).
- The additives may be incorporated into the diamond-like matrix or attached to the surface atomic layer. If the additives are incorporated into the diamond-like matrix they may cause perturbations in the density and/or structure, but the resulting material is essentially a densely packed network with diamond-like carbon characteristics (chemical inertness, hardness, barrier properties, etc.). If the additive concentration is large, greater than 50 atomic percent relative to the carbon concentration, the density will be affected and the beneficial properties of the diamond-like carbon network will be lost. If the additives are attached to the surface atomic layers they will alter only the surface structure and properties. The bulk properties of the diamond-like carbon network will be preserved.
- The polymer layers used in the multilayer stack of the barrier assemblies are preferably crosslinkable. The crosslinked polymeric layer lies atop the substrate or other layers, and it can be formed from a variety of materials. Preferably the polymeric layer is crosslinked in situ atop the underlying layer. If desired, the polymeric layer can be applied using conventional coating methods such as roll coating (e.g., gravure roll coating) or spray coating (e.g., electrostatic spray coating), then crosslinked using, for example, ultraviolet (UV) radiation. Most preferably the polymeric layer is formed by flash evaporation, vapor deposition and crosslinking of a monomer as described above. Volatilizable (meth)acrylate monomers are preferred for use in such a process, with volatilizable acrylate monomers being especially preferred. Preferred (meth)acrylates have a molecular weight in the range of about 150 to about 600, more preferably about 200 to about 400. Other preferred (meth)acrylates have a value of the ratio of the molecular weight to the number of acrylate functional groups per molecule in the range of about 150 to about 600 g/mole/(meth)acrylate group, more preferably about 200 to about 400 g/mole/(meth)acrylate group. Fluorinated (meth)acrylates can be used at higher molecular weight ranges or ratios, e.g., about 400 to about 3000 molecular weight or about 400 to about 3000 g/mole/(meth)acrylate group. Coating efficiency can be improved by cooling the support. Particularly preferred monomers include multifunctional (meth)acrylates, used alone or in combination with other multifunctional or mono functional (meth)acrylates, such as hexanediol diacrylate, ethoxyethyl acrylate, phenoxyethyl acrylate, cyanoethyl (mono)acrylate, isobornyl acrylate, isobornyl methacrylate, octadecyl acrylate, isodecyl acrylate, lauryl acrylate, beta-carboxyethyl acrylate, tetrahydrofurfuryl acrylate, dinitrile acrylate, pentafluorophenyl acrylate, nitrophenyl acrylate, 2-phenoxyethyl acrylate, 2-phenoxyethyl methacrylate, 2,2,2-trifluoromethyl (meth)acrylate, diethylene glycol diacrylate, triethylene glycol diacrylate, triethylene glycol dimethacrylate, tripropylene glycol diacrylate, tetraethylene glycol diacrylate, neopentyl glycol diacrylate, propoxylated neopentyl glycol diacrylate, polyethylene glycol diacrylate, tetraethylene glycol diacrylate, bisphenol A epoxy diacrylate, 1,6-hexanediol dimethacrylate, trimethylol propane triacrylate, ethoxylated trimethylol propane triacrylate, propylated trimethylol propane triacrylate, tris(2-hydroxyethyl)isocyanurate triacrylate, pentaerythritol triacrylate, phenylthioethyl acrylate, naphthloxyethyl acrylate, IRR-214 cyclic diacrylate from UCB Chemicals, epoxy acrylate RDX80095 from Rad-Cure Corporation, and mixtures thereof. A variety of other curable materials can be included in the crosslinked polymeric layer, e.g., vinyl ethers, vinyl naphthylene, acrylonitrile, and mixtures thereof.
- The physical thickness of the crosslinked polymeric layer will depend in part upon its refractive index and in part upon the desired optical characteristics of the film (e.g., on whether the film should contain a Fabry-Perot stack). For use in an infrared-rejecting Fabry-Perot stack, the crosslinked polymeric spacing layer typically will have a refractive index of about 1.3 to about 1.7, and preferably will have an optical thickness of about 75 nm to about 200 nm, more preferably about 100 nm to about 150 nm and a corresponding physical thickness of about 50 nm to about 130 nm, more preferably about 65 nm to about 100 nm.
- Alternative materials for the polymer layers include materials having a Tg greater than or equal to that of HSPET. A variety of alternative polymer materials can be employed. Volatilizable monomers that form suitably high Tg polymers are especially preferred. Preferably the alternative polymer layer has a Tg greater than that of PMMA, more preferably a Tg of at least about 110° C., yet more preferably at least about 150° C., and most preferably at least about 200° C. Especially preferred monomers that can be used to form this layer include urethane acrylates (e.g., CN-968, Tg=about 84° C. and CN-983, Tg=about 90° C., both commercially available from Sartomer Co.), isobornyl acrylate (e.g., SR-506, commercially available from Sartomer Co., Tg=about 88° C.), dipentaerythritol pentaacrylates (e.g., SR-399, commercially available from Sartomer Co., Tg=about 90° C.), epoxy acrylates blended with styrene (e.g., CN-120S80, commercially available from Sartomer Co., Tg=about 95° C.), di-trimethylolpropane tetraacrylates (e.g., SR-355, commercially available from Sartomer Co., Tg=about 98° C.), diethylene glycol diacrylates (e.g., SR-230, commercially available from Sartomer Co., Tg=about 100° C.), 1,3-butylene glycol diacrylate (e.g., SR-212, commercially available from Sartomer Co., Tg=about 101° C.), pentaacrylate esters (e.g., SR-9041, commercially available from Sartomer Co., Tg=about 102° C.), pentaerythritol tetraacrylates (e.g., SR-295, commercially available from Sartomer Co., Tg=about 103° C.), pentaerythritol triacrylates (e.g., SR-444, commercially available from Sartomer Co., Tg=about 103° C.), ethoxylated (3) trimethylolpropane triacrylates (e.g., SR-454, commercially available from Sartomer Co., Tg=about 103° C.), ethoxylated (3) trimethylolpropane triacrylates (e.g., SR-454HP, commercially available from Sartomer Co., Tg=about 103° C.), alkoxylated trifunctional acrylate esters (e.g., SR-9008, commercially available from Sartomer Co., Tg=about 103° C.), dipropylene glycol diacrylates (e.g., SR-508, commercially available from Sartomer Co., Tg=about 104° C.), neopentyl glycol diacrylates (e.g., SR-247, commercially available from Sartomer Co., Tg=about 107° C.), ethoxylated (4) bisphenol a dimethacrylates (e.g., CD-450, commercially available from Sartomer Co., Tg=about 108° C.), cyclohexane dimethanol diacrylate esters (e.g., CD-406, commercially available from Sartomer Co., Tg=about 110° C.), isobornyl methacrylate (e.g., SR-423, commercially available from Sartomer Co., Tg=about 110° C.), cyclic diacrylates (e.g., IRR-214, commercially available from UCB Chemicals, Tg=about 208° C.) and tris (2-hydroxy ethyl) isocyanurate triacrylate (e.g., SR-368, commercially available from Sartomer Co., Tg=about 272° C.), acrylates of the foregoing methacrylates and methacrylates of the foregoing acrylates.
- Various functional layers or coatings can be added to the barrier assemblies to alter or improve their physical or chemical properties, particularly at the surface of the barrier film. Such layers or coatings can include, for example, visible light-transmissive conductive layers or electrodes (e.g., of indium tin oxide); antistatic coatings or films; flame retardants; UV stabilizers; abrasion resistant or hardcoat materials; optical coatings; anti-fogging materials; magnetic or magneto-optic coatings or films; photographic emulsions; prismatic films; holographic films or images; adhesives such as pressure sensitive adhesives or hot melt adhesives; primers to promote adhesion to adjacent layers; and low adhesion backsize materials for use when the barrier assembly is to be used in adhesive roll form. These functional components can be incorporated into one or more of the outermost layers of the barrier assembly or can be applied as a separate film or coating.
- Optional layers can also include “getter” or “desiccant” layers functionally incorporated within or adjacent to the barrier coating; examples of such layers are described in copending U.S. patent application Ser. Nos. 10/948,013 and 10/948,011, which are incorporated herein by reference as if fully set forth. Getter layers include layers with materials that absorb or deactivate oxygen, and desiccant layers include layers with materials that absorb or deactivate water.
- Other optional layers include one or more inorganic barrier layers. The inorganic barrier layers, when multiple such layers are used, do not have to be the same. A variety of inorganic barrier materials can be employed. Preferred inorganic barrier materials include metal oxides, metal nitrides, metal carbides, metal oxynitrides, metal oxyborides, and combinations thereof, e.g., silicon oxides such as silica, aluminum oxides such as alumina, titanium oxides such as titania, indium oxides, tin oxides, indium tin oxide (“ITO”), tantalum oxide, zirconium oxide, niobium oxide, boron carbide, tungsten carbide, silicon carbide, aluminum nitride, silicon nitride, boron nitride, aluminum oxynitride, silicon oxynitride, boron oxynitride, zirconium oxyboride, titanium oxyboride, and combinations thereof. Indium tin oxide, silicon oxide, aluminum oxide and combinations thereof are especially preferred inorganic barrier materials. ITO is an example of a special class of ceramic materials that can become electrically conducting with the proper selection of the relative proportions of each elemental constituent. The inorganic barrier layers, when incorporated into the assembly, preferably are formed using techniques employed in the film metallizing art such as sputtering (e.g., cathode or planar magnetron sputtering), evaporation (e.g., resistive or electron beam evaporation), chemical vapor deposition, plating and the like. Most preferably the inorganic barrier layers are formed using sputtering, e.g., reactive sputtering. Enhanced barrier properties have been observed when the inorganic layer is formed by a high energy deposition technique such as sputtering compared to lower energy techniques such as conventional chemical vapor deposition processes. Without being bound by theory, it is believed that the enhanced properties are due to the condensing species arriving at the substrate with greater kinetic energy, leading to a lower void fraction as a result of compaction. The smoothness and continuity of each inorganic barrier layer and its adhesion to the underlying layer can be enhanced by pretreatments (e.g., plasma pretreatment) such as those described above.
- For some applications, it may be desirable to alter the appearance or performance of the barrier assembly, such as by laminating a dyed film layer to the barrier assembly, applying a pigmented coating to the surface of the barrier assembly, or including a dye or pigment in one or more of the materials used to make the barrier assembly. The dye or pigment can absorb in one or more selected regions of the spectrum, including portions of the infrared, ultraviolet or visible spectrum. The dye or pigment can be used to complement the properties of the barrier assembly, particularly where the barrier assembly transmits some frequencies while reflecting others.
- The barrier assembly can be treated with, for example, inks or other printed indicia such as those used to display product identification, orientation information, advertisements, warnings, decoration, or other information. Various techniques can be used to print on the barrier assembly, such as, for example, screen printing, inkjet printing, thermal transfer printing, letterpress printing, offset printing, flexographic printing, stipple printing, laser printing, and so forth, and various types of ink can be used, including one and two component inks, oxidatively drying and UV-drying inks, dissolved inks, dispersed inks, and 100% ink systems.
- The barrier assemblies can also have a protective polymer topcoat. If desired, the topcoat polymer layer can be applied using conventional coating methods such as roll coating (e.g., gravure roll coating) or spray coating (e.g., electrostatic spray coating), then crosslinked using, for example, UV radiation. A pretreatment (e.g., plasma pretreatment) may be used prior to formation of the topcoat polymer layer. The desired chemical composition and thickness of the topcoat polymer layer will depend in part on the nature and surface topography of the underlying layer(s), the hazards to which the barrier assembly might be exposed, and applicable device requirements. The topcoat polymer layer thickness preferably is sufficient to provide a smooth, defect-free surface that will protect the underlying layers from ordinary hazards.
- The polymer layers can be formed by applying a layer of a monomer or oligomer to the substrate and crosslinking the layer to form the polymer in situ, e.g., by flash evaporation and vapor deposition of a radiation-crosslinkable monomer, followed by crosslinking using, for example, an electron beam apparatus, UV light source, electrical discharge apparatus or other suitable device. Coating efficiency can be improved by cooling the support. The monomer or oligomer can also be applied to the substrate using conventional coating methods such as roll coating (e.g., gravure roll coating) or spray coating (e.g., electrostatic spray coating), then crosslinked as set out above. The polymer layers can also be formed by applying a layer containing an oligomer or polymer in solvent and drying the thus-applied layer to remove the solvent. Plasma polymerization may also be employed if it will provide a polymeric layer having a glassy state at an elevated temperature, with a glass transition temperature greater than or equal to that of HSPET. Most preferably, the polymer layers are formed by flash evaporation and vapor deposition followed by crosslinking in situ, e.g., as described in U.S. Pat. No. 4,696,719 (Bischoff), U.S. Pat. No. 4,722,515 (Ham), U.S. Pat. No. 4,842,893 (Yializis et al.), U.S. Pat. No. 4,954,371 (Yializis), U.S. Pat. No. 5,018,048 (Shaw et al.), U.S. Pat. No. 5,032,461 (Shaw et al.), U.S. Pat. No. 5,097,800 (Shaw et al.), U.S. Pat. No. 5,125,138 (Shaw et al.), U.S. Pat. No. 5,440,446 (Shaw et al.), U.S. Pat. No. 5,547,908 (Furuzawa et al.), U.S. Pat. No. 6,045,864 (Lyons et al.), U.S. Pat. No. 6,231,939 (Shaw et al.) and U.S. Pat. No. 6,214,422 (Yializis); in published PCT Application No. WO 00/26973 (Delta V Technologies, Inc.); in D. G. Shaw and M. G. Langlois, “A New Vapor Deposition Process for Coating Paper and Polymer Webs”, 6th International Vacuum Coating Conference (1992); in D. G. Shaw and M. G. Langlois, “A New High Speed Process for Vapor Depositing Acrylate Thin Films: An Update”, Society of Vacuum Coaters 36th Annual Technical Conference Proceedings (1993); in D. G. Shaw and M. G. Langlois, “Use of Vapor Deposited Acrylate Coatings to Improve the Barrier Properties of Metallized Film”, Society of Vacuum Coaters 37th Annual Technical Conference Proceedings (1994); in D. G. Shaw, M. Roehrig, M. G. Langlois and C. Sheehan, “Use of Evaporated Acrylate Coatings to Smooth the Surface of Polyester and Polypropylene Film Substrates”, RadTech (1996); in J. Affinito, P. Martin, M. Gross, C. Coronado and E. Greenwell, “Vacuum deposited polymer/metal multilayer films for optical application”, Thin
Solid Films 270, 43-48 (1995); and in J. D. Affinito, M. E. Gross, C. A. Coronado, G. L. Graff, E. N. Greenwell and P. M. Martin, “Polymer-Oxide Transparent Barrier Layers”, Society of Vacuum Coaters 39th Annual Technical Conference Proceedings (1996). -
FIG. 4 illustrates apreferred apparatus 180 that can be used for roll-to-roll manufacture of barrier assemblies on the invention, such as those shown inFIGS. 1-3 and described above. A more detailed diagram and description of a vacuum system used to make the barrier coatings is shown in U.S. Pat. No. 5,888,594, incorporated herein by reference. Powered rolls 181 a and 181 bmove supporting web 182 back and forth throughapparatus 180. Temperature-controlledrotating drums web 182 pastmetal sputtering applicator 185,plasma pretreater 186,monomer evaporator 187 andE-beam crosslinking device 188.Liquid material 189 is supplied toevaporator 187 fromreservoir 190. Successive layers or pairs of layers can be applied toweb 182 using multiple passes throughapparatus 180. Additional applicators, pretreaters, evaporators and crosslinking devices can be added toapparatus 180, for example along the periphery ofdrums power source 191 can provide the appropriate bias to drum 183 a.Apparatus 180 can be enclosed in a suitable chamber (as represented by the box enclosing it) and maintained under vacuum or supplied with a suitable inert atmosphere in order to discourage oxygen, water vapor, dust and other atmospheric contaminants from interfering with the various pretreatment, monomer coating, crosslinking and sputtering steps. Also,apparatus 180 can alternatively use only onedrum 183 a forcoating web 182, along the appropriate elements for applying layers to the web. - Display Device with Barrier
-
FIG. 5 is a schematic cross-sectional view of a disclosed OLED device. The barrier assemblies of the invention, such as those shown inFIGS. 1-3 and described above, can be used to inhibit the transmission of moisture vapor, oxygen or other gases in a variety of applications. The barrier assemblies are especially useful for encapsulating OLEDs, light valves such as LCDs, and other electronic devices, aside from the other examples provided above. A representative encapsulatedOLED device 200 is shown inFIG. 5 . The front or light-emitting side ofdevice 200 faces downward inFIG. 5 .Device 200 includes a visible light-transmissive barrier assembly 210 having an outer indium tin oxide layer (not shown inFIG. 5 , but oriented so that it would face upward) that serves as an anode. -
Light emitting structure 220 is formed on barrier assembly 210 in contact with the outer ITO layer.Structure 220 contains a plurality of layers (not individually shown inFIG. 5 ) that cooperate to emit light downward through barrier assembly 210 when suitably electrically energized.Device 200 also includesconductive cathode 230 andmetallic foil surround 250.Foil surround 250 is adhered to the back, sides and part of the front ofdevice 220 by adhesive 240. Anopening 260 formed in adhesive 240 permits aportion 270 offoil 250 to be deformed into contact withcathode 230. Another opening in foil 250 (not shown inFIG. 5 ) permits contact to be made with the anode formed by the outer ITO layer of barrier assembly 210.Metal foil 250 and barrier assembly 210 largely prevent water vapor and oxygen from reachinglight emitting structure 220. - The invention will now be described with reference to the following non-limiting examples.
- A UV-curable polymer solution was made containing 100 grams of epoxy acrylate, commercially available from UCB Chemicals, Smyrna, Ga. under the trade designation “Ebecryl 629”; 2 grams of 1-hydroxy-cyclohexyl-phenyl ketone, commercially available from Ciba Specialty Chemicals, Tarrytown, N.Y. under the trade designation “Irgacure184” dissolved in 1000 grams of methyl ethyl ketone. The resulting solution was coated at a web speed of 20 ft/min on a 6.5 inch wide, 100 micron polyethylene terephthalate (“PET”) liner commercially available from Teijin Corp., Japan under the trade designation “
HSPE 100” using a microgravure coater commercially available from Yasui Seiki, Japan under the trade designation “Model CAG150” fitted with a 90R knurl. The coating was dried in-line at 70° C. and cured under a nitrogen atmosphere with UV lamp commercially available from Fusion UV systems, Gaithersburg, Md. under the trade designation “F-600 Fusion D UV lamp” operating at 100% power, resulting in a dried coating thickness of approximately 1.2 microns. - The polymer coated web described above was loaded into the vacuum chamber of the coating system used to make DLG coating shown in U.S. Pat. No. 5,888,594 and pumped down to approximately 1 mTorr. The reactive gases were introduced into the chamber and RF power was applied to the drum. The web speed was adjusted to achieve the desired coating thickness. A second polymer layer was coated over the first DLG coating according to same conditions as the first polymer layer except a 110R knurl was used which resulted in the polymer layer thickness of approximately 0.7 microns. Table 2 describes the deposition conditions for DLG coating and the MVTR of the resulting barrier coatings that were made in this chamber.
- Barrier coatings were also made using reactive sputtering process for comparison purposes. PET web coated with the first polymer layer was coated with SiOx coating deposited under conditions shown in Table 3. A second polymer layer was coated over the first SiOx layer and a second SiOx layer was then coated over the second polymer layer. The deposition conditions and MVTR of coatings made by the reactive sputtering process are listed in Table 3.
-
TABLE 2 Deposition conditions used to make barrier coatings and their MVTRs Deposition Substrate TMS O2 Time Pressure Thickness Bias MVTR Sample # Sccm sccm seconds mTorr nm Volts g/m2 day 1 180 200 51 6 100 −805 0.017 2 180 200 90 6 175 −805 <0.005* *MVTR @ 50° C./100% RH = 0.008 g/m2 day -
TABLE 3 Comparative example: Barrier films made using reactive sputtering process Web Coating Target Argon O2 Speed Pressure Thickness Power Voltage MVTR Sample # Sccm sccm fpm mTorr nm Watts Volts g/m2day 1 51 27 1.4 1 60 2000 −600 0.028 2 51 31 1.7 3 100 4000 −620 0.095 - The effect of the diamond-like film deposition conditions was established by depositing a two-dyad stack of solution coated acrylate and a diamond-like film. In particular, referring to
FIG. 2 , the sample analyzed included aPET substrate 112, acrylate layers 114 and 118, and DLG film layers 116 and 120. The process for coating the acrylate layers is described in Example 1. - The primary variables explored in the study of the sample were as follows: (1) tetramethylsilane (TMS)/oxygen ratio and plasma power; (2) plasma power; and (3) deposition time (thickness) of the DLG film.
- Sixteen different conditions were studied as shown in Table 4 below, and the moisture barrier properties of these films was measured for each of these conditions at 50° C. The MVTR values are shown in the last column in Table 4 below. From these results, it may be seen that there were several conditions that yield MVTR values that are at or below the detection limit of the Mocon tester at 50° C. Additional significant points were as follows. For a fixed value of the TMS/O2 ratio and power, the MVTR values decrease with increasing thickness of the diamond-like film. For any fixed value of power, the MVTR values are lower at a TMS/O2 ratio of 1.0 when compared to 0.25. This means that the films with more organic content had improved barrier performance. For any fixed value of TMS/O2 ratio and thickness, the MVTR values were slightly higher for the 2000 watts compared to 1000 watts of plasma power.
-
TABLE 4 MVTR @ Pressure Power Time O2 TMS 50° C. RunOrder TMS/O2 (mTorr) (W) (sec) sccm sccm DC Bias V (g/(m2day)) 020-02 1 7 1000 30 200 200 −763 0.02 020-03 1 7 1000 60 200 200 −763 0.005 020-04 1 7 1000 90 200 200 −763 0.005 020-01 1 7 1000 120 200 200 −763 <0.005 020-06 0.25 7 1000 30 320 80 −748 0.043 020-07 0.25 7 1000 60 320 80 −748 0.025 020-08 0.25 7 1000 90 320 80 −748 0.016 020-05 0.25 7 1000 120 320 80 −748 0.005 020-10 1 7 2000 30 200 200 −1107 0.017 020-11 1 7 2000 60 200 200 −1107 0.005 020-12 1 7 2000 90 200 200 −1107 <0.005 020-09 1 7 2000 120 200 200 −1107 <0.005 020-14 0.25 7 2000 30 320 80 −1059 0.076 020-15 0.25 7 2000 60 320 80 −1059 0.062 020-16 0.25 7 2000 90 320 80 −1059 0.012 020-13 0.25 7 2000 120 320 80 −1059 <0.005
Claims (6)
1. A process for fabricating a composite assembly for protection of a moisture or oxygen sensitive article, comprising:
providing a substrate;
placing the substrate on an electrode in a chamber;
introducing a plasma into the chamber;
biasing the substrate using the electrode;
overcoating a polymer layer on the substrate using the plasma; and
overcoating a diamond-like glass layer on the polymer layer using the plasma,
wherein the diamond-like glass layer comprises an at least substantially amorphous glass including carbon and silicon and has an oxygen to silicon ratio less than 1.5.
2. The process of claim 1 , wherein during the overcoating steps the pressure in the chamber is less than 50 mTorr.
3. The process of claim 1 wherein, during the overcoating steps the bias of the substrate is greater than 500 V.
4. The process of claim 1 , wherein the diamond-like glass layer further comprises nitrogen.
5. A process for fabricating a composite assembly for protection of a moisture or oxygen sensitive article, comprising:
providing a substrate;
placing the substrate on an electrode in a chamber;
introducing a plasma into the chamber;
biasing the substrate using the electrode;
overcoating a polymer layer on the substrate using the plasma;
overcoating a diamond-like glass layer on the polymer layer using the plasma; and
overcoating an inorganic barrier layer on the diamond-like glass layer,
wherein the diamond-like glass layer comprises an at least substantially amorphous glass including carbon and silicon.
6. The process of claim 5 , wherein the diamond-like glass layer has an oxygen to silicon ratio less than 1.5.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/400,431 US20090169770A1 (en) | 2005-07-20 | 2009-03-09 | Moisture barrier coatings |
US13/024,521 US8034452B2 (en) | 2005-07-20 | 2011-02-10 | Moisture barrier coatings |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/185,078 US20070020451A1 (en) | 2005-07-20 | 2005-07-20 | Moisture barrier coatings |
US12/400,431 US20090169770A1 (en) | 2005-07-20 | 2009-03-09 | Moisture barrier coatings |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/185,078 Division US20070020451A1 (en) | 2005-07-20 | 2005-07-20 | Moisture barrier coatings |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US13/024,521 Continuation US8034452B2 (en) | 2005-07-20 | 2011-02-10 | Moisture barrier coatings |
Publications (1)
Publication Number | Publication Date |
---|---|
US20090169770A1 true US20090169770A1 (en) | 2009-07-02 |
Family
ID=37311881
Family Applications (4)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/185,078 Abandoned US20070020451A1 (en) | 2005-07-20 | 2005-07-20 | Moisture barrier coatings |
US12/388,919 Abandoned US20090186209A1 (en) | 2005-07-20 | 2009-02-19 | Moisture barrier coatings |
US12/400,431 Abandoned US20090169770A1 (en) | 2005-07-20 | 2009-03-09 | Moisture barrier coatings |
US13/024,521 Expired - Fee Related US8034452B2 (en) | 2005-07-20 | 2011-02-10 | Moisture barrier coatings |
Family Applications Before (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/185,078 Abandoned US20070020451A1 (en) | 2005-07-20 | 2005-07-20 | Moisture barrier coatings |
US12/388,919 Abandoned US20090186209A1 (en) | 2005-07-20 | 2009-02-19 | Moisture barrier coatings |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US13/024,521 Expired - Fee Related US8034452B2 (en) | 2005-07-20 | 2011-02-10 | Moisture barrier coatings |
Country Status (8)
Country | Link |
---|---|
US (4) | US20070020451A1 (en) |
EP (2) | EP2857443A1 (en) |
JP (1) | JP5313671B2 (en) |
KR (1) | KR101299750B1 (en) |
CN (1) | CN101228217A (en) |
BR (1) | BRPI0615503A2 (en) |
TW (1) | TWI517976B (en) |
WO (1) | WO2007015779A2 (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20080179760A1 (en) * | 2007-01-31 | 2008-07-31 | Infineon Technologies Ag | Method for producing a device and device |
US20100039707A1 (en) * | 2006-11-10 | 2010-02-18 | Sumitomo Electric Industries, Ltd. | Si-o containing hydrogenated carbon film, optical device including the same, and method for manufacturing the si-o containing hydrogenated carbon film and the optical device |
US20120135212A1 (en) * | 2010-11-26 | 2012-05-31 | Hon Hai Precision Industry Co., Ltd. | Coated article and method for making same |
US20130251919A1 (en) * | 2010-09-17 | 2013-09-26 | Mgc Filsheet Co., Ltd. | Front plate of tn liquid crystal panel |
US8871350B2 (en) | 2009-03-30 | 2014-10-28 | Material Design Factory Co., Ltd. | Gas barrier film, electronic device including the same, gas barrier bag, and method for producing gas barrier film |
US8963421B2 (en) | 2012-09-14 | 2015-02-24 | National Chiao Tung University | Electroluminescent device including moisture barrier layer |
US20150252125A1 (en) * | 2014-03-10 | 2015-09-10 | Cheil Industries Inc. | Curable resin compositions and barrier stacks including the same |
Families Citing this family (126)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1644723B1 (en) * | 2003-06-17 | 2019-11-06 | X-Ray Optical Systems, Inc. | Moveable transparent barrier for x-ray analysis of a pressurized sample |
KR100700013B1 (en) * | 2004-11-26 | 2007-03-26 | 삼성에스디아이 주식회사 | Organic Electroluminescence Display Device and Fabricating Method of the same |
US20080006819A1 (en) * | 2006-06-19 | 2008-01-10 | 3M Innovative Properties Company | Moisture barrier coatings for organic light emitting diode devices |
US20080009417A1 (en) * | 2006-07-05 | 2008-01-10 | General Electric Company | Coating composition, article, and associated method |
US8241713B2 (en) * | 2007-02-21 | 2012-08-14 | 3M Innovative Properties Company | Moisture barrier coatings for organic light emitting diode devices |
EP2137337A2 (en) * | 2007-02-23 | 2009-12-30 | Technische Universität Kaiserslautern | Plasma-deposited electrically insulating, diffusion-resistant and elastic layer system |
JP5208591B2 (en) * | 2007-06-28 | 2013-06-12 | 株式会社半導体エネルギー研究所 | Light emitting device and lighting device |
JP5532557B2 (en) * | 2007-07-09 | 2014-06-25 | 大日本印刷株式会社 | Gas barrier sheet, gas barrier sheet manufacturing method, sealing body, and organic EL display |
US8179034B2 (en) * | 2007-07-13 | 2012-05-15 | 3M Innovative Properties Company | Light extraction film for organic light emitting diode display and lighting devices |
US20090015142A1 (en) * | 2007-07-13 | 2009-01-15 | 3M Innovative Properties Company | Light extraction film for organic light emitting diode display devices |
US8067085B2 (en) * | 2007-09-14 | 2011-11-29 | Fujifilm Corporation | Gas barrier film, and display device comprising the same |
JP5187821B2 (en) * | 2007-12-04 | 2013-04-24 | 独立行政法人産業技術総合研究所 | Polycarbonate laminate |
JP2011508062A (en) * | 2007-12-28 | 2011-03-10 | スリーエム イノベイティブ プロパティズ カンパニー | Flexible encapsulated film system |
KR101550946B1 (en) * | 2007-12-28 | 2015-09-07 | 쓰리엠 이노베이티브 프로퍼티즈 컴파니 | Infrared reflecting films for solar control and other uses |
US8212337B2 (en) | 2008-01-10 | 2012-07-03 | International Business Machines Corporation | Advanced low k cap film formation process for nano electronic devices |
TWI438953B (en) * | 2008-01-30 | 2014-05-21 | Osram Opto Semiconductors Gmbh | Method for manufacturing electronic components and electronic components |
JP5467792B2 (en) * | 2008-04-24 | 2014-04-09 | 日東電工株式会社 | Flexible substrate |
JP5320167B2 (en) * | 2008-05-30 | 2013-10-23 | 富士フイルム株式会社 | Barrier laminate, gas barrier film, device and laminate production method |
JP5139894B2 (en) * | 2008-06-20 | 2013-02-06 | 富士フイルム株式会社 | Method for forming gas barrier film and gas barrier film |
JP5281964B2 (en) * | 2008-06-26 | 2013-09-04 | 富士フイルム株式会社 | Barrier laminate, gas barrier film, device and laminate production method |
JP5624033B2 (en) * | 2008-06-30 | 2014-11-12 | スリーエム イノベイティブプロパティズカンパニー | Method for producing inorganic or inorganic / organic hybrid barrier film |
TWI641292B (en) * | 2008-08-04 | 2018-11-11 | Agc北美平面玻璃公司 | Plasma source |
CN101370330B (en) * | 2008-09-26 | 2010-06-02 | 电子科技大学 | Organic opto-electronic device with organic protection layer and preparation method thereof |
JP5480279B2 (en) * | 2008-10-03 | 2014-04-23 | ウポノール・イノベーション・エービー | Methods and compositions for coated pipes |
US20100110551A1 (en) * | 2008-10-31 | 2010-05-06 | 3M Innovative Properties Company | Light extraction film with high index backfill layer and passivation layer |
KR20110087318A (en) * | 2008-11-17 | 2011-08-02 | 쓰리엠 이노베이티브 프로퍼티즈 컴파니 | Gradient composition barrier |
US7957621B2 (en) * | 2008-12-17 | 2011-06-07 | 3M Innovative Properties Company | Light extraction film with nanoparticle coatings |
US8946101B2 (en) * | 2009-02-10 | 2015-02-03 | Honeywell International Inc. | Enhanced barrier multifunctional coatings for nylon films |
DE102009023350A1 (en) * | 2009-05-29 | 2010-12-02 | Osram Opto Semiconductors Gmbh | Electronic component and method for producing an electronic component |
EP2267818B1 (en) | 2009-06-22 | 2017-03-22 | Novaled GmbH | Organic lighting device |
US20110008525A1 (en) * | 2009-07-10 | 2011-01-13 | General Electric Company | Condensation and curing of materials within a coating system |
DE102009034532A1 (en) * | 2009-07-23 | 2011-02-03 | Msg Lithoglas Ag | Process for producing a structured coating on a substrate, coated substrate and semifinished product with a coated substrate |
EP2473829A2 (en) * | 2009-08-31 | 2012-07-11 | Temptime Corporation | Freeze indicators with a controlled temperature response |
JP5485624B2 (en) * | 2009-09-14 | 2014-05-07 | 富士フイルム株式会社 | Barrier laminate and gas barrier film using the same |
KR20110034931A (en) * | 2009-09-29 | 2011-04-06 | 삼성전자주식회사 | Solar cell and method for manufacturing the same |
US9011985B2 (en) | 2009-10-30 | 2015-04-21 | Sumitomo Chemical Company, Limited | Method of manufacture of multilayer film |
EP2502100B1 (en) | 2009-11-18 | 2020-09-16 | 3M Innovative Properties Company | Multi-layer optical films |
CN102639322B (en) * | 2009-11-30 | 2015-11-25 | 3M创新有限公司 | Conformal barrier flaps, method and device |
US8460754B2 (en) * | 2009-12-21 | 2013-06-11 | 3M Innovative Properties Company | Needle coating and in-line curing of a coated workpiece |
KR101798487B1 (en) * | 2010-06-01 | 2017-11-17 | 삼성디스플레이 주식회사 | Display apparatus |
US9254506B2 (en) | 2010-07-02 | 2016-02-09 | 3M Innovative Properties Company | Moisture resistant coating for barrier films |
US10038111B2 (en) | 2010-07-02 | 2018-07-31 | 3M Innovative Properties Company | Barrier assembly with encapsulant and photovoltaic cell |
US9285584B2 (en) | 2010-10-06 | 2016-03-15 | 3M Innovative Properties Company | Anti-reflective articles with nanosilica-based coatings and barrier layer |
BR112013008304A2 (en) | 2010-10-06 | 2016-06-14 | 3M Innovative Properties Co | articles comprising a transparent substrate, and light energy absorbing device comprising the article |
FR2967915B1 (en) * | 2010-11-26 | 2014-05-16 | Commissariat Energie Atomique | EVAPORATION DEVICE |
TWI496909B (en) * | 2010-12-06 | 2015-08-21 | Hon Hai Prec Ind Co Ltd | Articles coated with anti-fingerprint coating and mathod for making the articles |
JP6110319B2 (en) | 2011-03-14 | 2017-04-05 | スリーエム イノベイティブ プロパティズ カンパニー | Nanostructured articles |
US8692446B2 (en) | 2011-03-17 | 2014-04-08 | 3M Innovative Properties Company | OLED light extraction films having nanoparticles and periodic structures |
KR101891987B1 (en) * | 2011-05-31 | 2018-08-28 | 엘지디스플레이 주식회사 | Organic Light Emitting Device and Method for manufacturing the same |
GB201112516D0 (en) * | 2011-07-21 | 2011-08-31 | P2I Ltd | Surface coatings |
US8659221B2 (en) | 2011-08-26 | 2014-02-25 | 3M Innovative Properties Company | OLED light extraction film with multi-periodic zones of nanostructures |
DE102011089565A1 (en) * | 2011-12-22 | 2013-06-27 | Tesa Se | Liner for the protection of adhesives |
WO2015157202A1 (en) | 2014-04-09 | 2015-10-15 | Corning Incorporated | Device modified substrate article and methods for making |
US10543662B2 (en) | 2012-02-08 | 2020-01-28 | Corning Incorporated | Device modified substrate article and methods for making |
CN104662689B (en) | 2012-02-28 | 2017-06-27 | 3M创新有限公司 | It is suitable to the composition comprising the modified high refractive index nanoparticles in surface of optically coupled layers |
KR101503401B1 (en) * | 2012-03-05 | 2015-03-17 | 삼성디스플레이 주식회사 | Method for preparing organic light emitting device |
WO2013148149A1 (en) | 2012-03-27 | 2013-10-03 | 3M Innovative Properties Company | Photovoltaic modules comprising light directing mediums and methods of making the same |
US8654503B2 (en) | 2012-06-29 | 2014-02-18 | Zoll Medical Corporation | Humidity resistant electronic components |
US9982160B2 (en) | 2012-08-08 | 2018-05-29 | 3M Innovative Properties Company | Urea (multi)-(meth)acrylate (multi)-silane compositions and articles including the same |
US20150221797A1 (en) | 2012-08-08 | 2015-08-06 | 3M Innovative Properties Company | Photovoltaic devices with encapsulating barrier film |
TWI610806B (en) | 2012-08-08 | 2018-01-11 | 3M新設資產公司 | Barrier film, method of making the barrier film, and articles including the barrier film |
JP2015529326A (en) | 2012-08-16 | 2015-10-05 | テンプタイム コーポレーション | Freezing indicator using light scattering and method for producing the same |
JP2015526867A (en) | 2012-08-22 | 2015-09-10 | スリーエム イノベイティブ プロパティズ カンパニー | Microcavity OLED light extraction |
WO2014031421A1 (en) | 2012-08-22 | 2014-02-27 | 3M Innovative Properties Company | Transparent oled light extraction |
JP2016502465A (en) * | 2012-11-29 | 2016-01-28 | エルジー・ケム・リミテッド | Coating method for reducing damage to the barrier layer |
JP6505605B2 (en) | 2012-11-30 | 2019-04-24 | スリーエム イノベイティブ プロパティズ カンパニー | Light emitting display with reflective polarizer |
EP2926334A4 (en) | 2012-11-30 | 2016-08-10 | 3M Innovative Properties Co | Emissive display with hybrid polarizer |
US10086584B2 (en) | 2012-12-13 | 2018-10-02 | Corning Incorporated | Glass articles and methods for controlled bonding of glass sheets with carriers |
US9340443B2 (en) | 2012-12-13 | 2016-05-17 | Corning Incorporated | Bulk annealing of glass sheets |
US10014177B2 (en) | 2012-12-13 | 2018-07-03 | Corning Incorporated | Methods for processing electronic devices |
TWI617437B (en) | 2012-12-13 | 2018-03-11 | 康寧公司 | Facilitated processing for controlling bonding between sheet and carrier |
US9711744B2 (en) | 2012-12-21 | 2017-07-18 | 3M Innovative Properties Company | Patterned structured transfer tape |
US20140175707A1 (en) | 2012-12-21 | 2014-06-26 | 3M Innovative Properties Company | Methods of using nanostructured transfer tape and articles made therefrom |
GB201305500D0 (en) * | 2013-03-26 | 2013-05-08 | Semblant Ltd | Coated electrical assembly |
JPWO2014162395A1 (en) * | 2013-04-01 | 2017-02-16 | パイオニア株式会社 | Light emitting device |
CN104134756A (en) * | 2013-04-30 | 2014-11-05 | 成均馆大学校产学协力团 | Multilayer encapsulation thin-film |
CN104157548A (en) * | 2013-05-14 | 2014-11-19 | 北儒精密股份有限公司 | Method for manufacturing flexible light-transmitting substrate |
TWI548082B (en) * | 2013-06-13 | 2016-09-01 | 財團法人工業技術研究院 | Substrate structure |
WO2015023536A1 (en) | 2013-08-12 | 2015-02-19 | 3M Innovative Properties Company | Emissive article with light extraction film |
CN104441840B (en) * | 2013-09-23 | 2016-05-11 | 宁夏银晨太阳能科技有限公司 | A kind of solar thermal collector safety glass transparent cover plate |
KR101642589B1 (en) * | 2013-09-30 | 2016-07-29 | 주식회사 엘지화학 | Substrate for organic electronic device and manufacturing method thereof |
US10510576B2 (en) | 2013-10-14 | 2019-12-17 | Corning Incorporated | Carrier-bonding methods and articles for semiconductor and interposer processing |
WO2015095443A1 (en) * | 2013-12-18 | 2015-06-25 | RADCO Infusion Technologies, LLC | Thermoplastics having improved barrier properties |
CN104752634A (en) * | 2013-12-31 | 2015-07-01 | 中国科学院微电子研究所 | Processing method of alternate structure thin film packaging layer interface |
EP3099483B1 (en) | 2014-01-27 | 2022-06-01 | Corning Incorporated | Articles and methods for controlled bonding of thin sheets with carriers |
TW201539736A (en) | 2014-03-19 | 2015-10-16 | 3M Innovative Properties Co | Nanostructures for color-by-white OLED devices |
CN103872266B (en) * | 2014-03-24 | 2016-03-16 | 中国科学院重庆绿色智能技术研究院 | Volume to volume Preparation equipment of organic optoelectronic device and preparation method thereof |
US20160056414A1 (en) * | 2014-08-21 | 2016-02-25 | Universal Display Corporation | Thin film permeation barrier system for substrates and devices and method of making the same |
TWI556003B (en) * | 2014-10-02 | 2016-11-01 | 群創光電股份有限公司 | Anti-reflection structure and display device |
AU2015331367B2 (en) * | 2014-10-14 | 2020-08-27 | Sekisui Chemical Co., Ltd. | Solar cell |
KR101708298B1 (en) * | 2014-11-14 | 2017-02-21 | 한화첨단소재 주식회사 | Integrated functional condictive pet film with low shrink oligomer free |
ES2900321T3 (en) | 2014-12-05 | 2022-03-16 | Agc Flat Glass Na Inc | Plasma source using a particulate reducing coating and method of using a plasma source using a particulate reducing coating for deposition of thin film coatings and surface modification |
EP3228160B1 (en) | 2014-12-05 | 2021-07-21 | AGC Glass Europe SA | Hollow cathode plasma source |
US10399086B2 (en) * | 2015-02-09 | 2019-09-03 | Viradys Medical Waste Solutions, LLC | System and method for disinfecting medical waste |
WO2016187186A1 (en) | 2015-05-19 | 2016-11-24 | Corning Incorporated | Articles and methods for bonding sheets with carriers |
JP6571389B2 (en) * | 2015-05-20 | 2019-09-04 | シャープ株式会社 | Nitride semiconductor light emitting device and manufacturing method thereof |
MX2017015919A (en) * | 2015-06-09 | 2018-08-21 | P2I Ltd | Coatings. |
EP3313799B1 (en) | 2015-06-26 | 2022-09-07 | Corning Incorporated | Methods and articles including a sheet and a carrier |
CN108137204B (en) * | 2015-09-30 | 2020-12-04 | 3M创新有限公司 | Multilayer barrier stack |
KR20180063161A (en) | 2015-09-30 | 2018-06-11 | 쓰리엠 이노베이티브 프로퍼티즈 캄파니 | Multilayer barrier stack |
WO2017066146A1 (en) | 2015-10-12 | 2017-04-20 | 3M Innovative Properties Company | Light redirecting film useful with solar modules |
SG11201803972XA (en) | 2015-11-11 | 2018-06-28 | 3M Innovative Properties Co | Multilayer construction including barrier layer and sealing layer |
US9721765B2 (en) | 2015-11-16 | 2017-08-01 | Agc Flat Glass North America, Inc. | Plasma device driven by multiple-phase alternating or pulsed electrical current |
US10242846B2 (en) | 2015-12-18 | 2019-03-26 | Agc Flat Glass North America, Inc. | Hollow cathode ion source |
US10573499B2 (en) | 2015-12-18 | 2020-02-25 | Agc Flat Glass North America, Inc. | Method of extracting and accelerating ions |
CN106025095A (en) * | 2016-06-07 | 2016-10-12 | 武汉华星光电技术有限公司 | Packaging structure of flexible OLED device and display device |
FR3055472B1 (en) * | 2016-08-29 | 2019-03-15 | Arkema France | PROTECTION OF ELECTRONIC DEVICES |
TW201825623A (en) | 2016-08-30 | 2018-07-16 | 美商康寧公司 | Siloxane plasma polymers for sheet bonding |
TWI821867B (en) | 2016-08-31 | 2023-11-11 | 美商康寧公司 | Articles of controllably bonded sheets and methods for making same |
US11751426B2 (en) | 2016-10-18 | 2023-09-05 | Universal Display Corporation | Hybrid thin film permeation barrier and method of making the same |
CN106450032B (en) * | 2016-11-08 | 2018-01-30 | 武汉华星光电技术有限公司 | OLED display and preparation method thereof |
CN106601931B (en) * | 2016-12-19 | 2018-08-14 | 武汉华星光电技术有限公司 | OLED encapsulation method and OLED encapsulating structures |
US10483493B2 (en) | 2017-08-01 | 2019-11-19 | Apple Inc. | Electronic device having display with thin-film encapsulation |
JP7260523B2 (en) | 2017-08-18 | 2023-04-18 | コーニング インコーポレイテッド | Temporary binding using polycationic polymers |
WO2019118660A1 (en) | 2017-12-15 | 2019-06-20 | Corning Incorporated | Method for treating a substrate and method for making articles comprising bonded sheets |
JP2021511685A (en) | 2018-01-30 | 2021-05-06 | スリーエム イノベイティブ プロパティズ カンパニー | An optical direction change device and a solar cell module equipped with the device. |
CN108198953B (en) * | 2018-02-13 | 2019-09-10 | 武汉华星光电半导体显示技术有限公司 | OLED encapsulation method and OLED encapsulating structure |
WO2019180543A1 (en) * | 2018-03-23 | 2019-09-26 | 3M Innovative Properties Company | Fluorinated membrane articles |
CN108511629A (en) * | 2018-05-31 | 2018-09-07 | 京东方科技集团股份有限公司 | Oled display substrate and preparation method thereof, display device |
WO2020035802A1 (en) * | 2018-08-14 | 2020-02-20 | 3M Innovative Properties Company | Flexible hardcoat disposed between organic base member and siliceous layer and cleanable articles |
WO2020044240A1 (en) | 2018-08-31 | 2020-03-05 | 3M Innovative Properties Company | Light redirecting film having stray-light mitigation properties useful with solar modules |
CN109903691A (en) * | 2019-03-22 | 2019-06-18 | 深圳立泰触控显示科技有限公司 | A kind of electronic display billboard of anti-dazzle |
US12016124B2 (en) | 2020-04-27 | 2024-06-18 | Covidien Lp | Coating for electrical components of surgical devices |
WO2022065498A1 (en) * | 2020-09-28 | 2022-03-31 | 三菱ケミカル株式会社 | Light guide plate for image display |
CN113969519A (en) * | 2021-10-13 | 2022-01-25 | 广州慧谷化学有限公司 | Barrier coating for food paper and paperboard, and food paper and paperboard |
CN113930725A (en) * | 2021-10-29 | 2022-01-14 | 厦门大锦工贸有限公司 | Multilayer gradient coating based on physical vapor deposition and preparation method thereof |
Citations (92)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4696719A (en) * | 1985-01-18 | 1987-09-29 | Spectrum Control, Inc. | Monomer atomizer for vaporization |
US4722515A (en) * | 1984-11-06 | 1988-02-02 | Spectrum Control, Inc. | Atomizing device for vaporization |
US4791012A (en) * | 1986-01-24 | 1988-12-13 | Ausimont S.P.A. | Films, layers, tapes, plates, and similar structures of metal or of plastic materials, coated with thin polyfluorocarbon films |
US4842893A (en) * | 1983-12-19 | 1989-06-27 | Spectrum Control, Inc. | High speed process for coating substrates |
US4954371A (en) * | 1986-06-23 | 1990-09-04 | Spectrum Control, Inc. | Flash evaporation of monomer fluids |
US5018048A (en) * | 1983-12-19 | 1991-05-21 | Spectrum Control, Inc. | Miniaturized monolithic multi-layer capacitor and apparatus and method for making |
US5032461A (en) * | 1983-12-19 | 1991-07-16 | Spectrum Control, Inc. | Method of making a multi-layered article |
US5097800A (en) * | 1983-12-19 | 1992-03-24 | Spectrum Control, Inc. | High speed apparatus for forming capacitors |
US5125138A (en) * | 1983-12-19 | 1992-06-30 | Spectrum Control, Inc. | Miniaturized monolithic multi-layer capacitor and apparatus and method for making same |
US5320875A (en) * | 1992-12-21 | 1994-06-14 | The Dow Chemical Company | Method of providing an abrasion resistant coating |
US5352493A (en) * | 1991-05-03 | 1994-10-04 | Veniamin Dorfman | Method for forming diamond-like nanocomposite or doped-diamond-like nanocomposite films |
US5440446A (en) * | 1993-10-04 | 1995-08-08 | Catalina Coatings, Inc. | Acrylate coating material |
US5494712A (en) * | 1993-08-27 | 1996-02-27 | The Dow Chemical Company | Method of forming a plasma polymerized film |
US5508368A (en) * | 1994-03-03 | 1996-04-16 | Diamonex, Incorporated | Ion beam process for deposition of highly abrasion-resistant coatings |
US5530581A (en) * | 1995-05-31 | 1996-06-25 | Eic Laboratories, Inc. | Protective overlayer material and electro-optical coating using same |
US5547908A (en) * | 1993-07-30 | 1996-08-20 | Kyocera Corporation | Dielectric ceramic composition and package made of the same composition for packaging semiconductor |
US5618619A (en) * | 1994-03-03 | 1997-04-08 | Monsanto Company | Highly abrasion-resistant, flexible coatings for soft substrates |
US5638251A (en) * | 1995-10-03 | 1997-06-10 | Advanced Refractory Technologies, Inc. | Capacitive thin films using diamond-like nanocomposite materials |
US5652067A (en) * | 1992-09-10 | 1997-07-29 | Toppan Printing Co., Ltd. | Organic electroluminescent device |
US5681666A (en) * | 1995-01-23 | 1997-10-28 | Duracell Inc. | Light transparent multilayer moisture barrier for electrochemical celltester and cell employing same |
US5682043A (en) * | 1994-06-28 | 1997-10-28 | Uniax Corporation | Electrochemical light-emitting devices |
US5686360A (en) * | 1995-11-30 | 1997-11-11 | Motorola | Passivation of organic devices |
US5693956A (en) * | 1996-07-29 | 1997-12-02 | Motorola | Inverted oleds on hard plastic substrate |
US5718976A (en) * | 1991-05-03 | 1998-02-17 | Advanced Refractory Technologies, Inc. | Erosion resistant diamond-like nanocomposite coatings for optical components |
US5736207A (en) * | 1994-10-27 | 1998-04-07 | Schott Glaswerke | Vessel of plastic having a barrier coating and a method of producing the vessel |
US5811177A (en) * | 1995-11-30 | 1998-09-22 | Motorola, Inc. | Passivation of electroluminescent organic devices |
US5877895A (en) * | 1995-03-20 | 1999-03-02 | Catalina Coatings, Inc. | Multicolor interference coating |
US5888594A (en) * | 1996-11-05 | 1999-03-30 | Minnesota Mining And Manufacturing Company | Process for depositing a carbon-rich coating on a moving substrate |
US5902641A (en) * | 1997-09-29 | 1999-05-11 | Battelle Memorial Institute | Flash evaporation of liquid monomer particle mixture |
US5920080A (en) * | 1997-06-23 | 1999-07-06 | Fed Corporation | Emissive display using organic light emitting diodes |
US6004660A (en) * | 1998-03-12 | 1999-12-21 | E.I. Du Pont De Nemours And Company | Oxygen barrier composite film structure |
US6045864A (en) * | 1997-12-01 | 2000-04-04 | 3M Innovative Properties Company | Vapor coating method |
US6083628A (en) * | 1994-11-04 | 2000-07-04 | Sigma Laboratories Of Arizona, Inc. | Hybrid polymer film |
US6146225A (en) * | 1998-07-30 | 2000-11-14 | Agilent Technologies, Inc. | Transparent, flexible permeability barrier for organic electroluminescent devices |
US6198217B1 (en) * | 1997-05-12 | 2001-03-06 | Matsushita Electric Industrial Co., Ltd. | Organic electroluminescent device having a protective covering comprising organic and inorganic layers |
US6200675B1 (en) * | 1996-04-22 | 2001-03-13 | N.V. Bekaert S.A. | Diamond-like nanocomposite compositions |
US6231939B1 (en) * | 1993-10-04 | 2001-05-15 | Presstek, Inc. | Acrylate composite barrier coating |
US6268695B1 (en) * | 1998-12-16 | 2001-07-31 | Battelle Memorial Institute | Environmental barrier material for organic light emitting device and method of making |
US20010052752A1 (en) * | 2000-04-25 | 2001-12-20 | Ghosh Amalkumar P. | Thin film encapsulation of organic light emitting diode devices |
US20020022156A1 (en) * | 1998-11-02 | 2002-02-21 | 3M Innovative Properties Company | Transparent conductive oxides for plastic flat panel displays |
US6358570B1 (en) * | 1999-03-31 | 2002-03-19 | Battelle Memorial Institute | Vacuum deposition and curing of oligomers and resins |
US6379757B1 (en) * | 1997-06-26 | 2002-04-30 | General Electric Company | Silicon dioxide deposition by plasma activated evaporation process |
US6413645B1 (en) * | 2000-04-20 | 2002-07-02 | Battelle Memorial Institute | Ultrabarrier substrates |
US20020093285A1 (en) * | 2000-09-25 | 2002-07-18 | Pioneer Corporation | Organic electroluminescent display panel |
US6429584B2 (en) * | 2000-03-30 | 2002-08-06 | Pioneer Corporation | Organic electroluminescence display panel and method of manufacturing the same |
US6432494B1 (en) * | 1997-06-26 | 2002-08-13 | General Electric Company | Protective coating by high rate arc plasma deposition |
US20020125822A1 (en) * | 1998-12-16 | 2002-09-12 | Graff Gordon L. | Environmental barrier material for organic light emitting device and method of making |
US6465953B1 (en) * | 2000-06-12 | 2002-10-15 | General Electric Company | Plastic substrates with improved barrier properties for devices sensitive to water and/or oxygen, such as organic electroluminescent devices |
US20020153523A1 (en) * | 2001-02-05 | 2002-10-24 | Bernius Mark T. | Organic light emitting diodes on plastic substrates |
US6492026B1 (en) * | 2000-04-20 | 2002-12-10 | Battelle Memorial Institute | Smoothing and barrier layers on high Tg substrates |
US20030089905A1 (en) * | 2001-11-09 | 2003-05-15 | Makoto Udagawa | Light emitting device |
US20030099858A1 (en) * | 2001-11-27 | 2003-05-29 | General Electric Company One Research Circle | Environmentally-stable organic electroluminescent fibers |
US20030164497A1 (en) * | 1999-04-28 | 2003-09-04 | Carcia Peter Francis | Flexible organic electronic device with improved resistance to oxygen and moisture degradation |
US6623861B2 (en) * | 2001-04-16 | 2003-09-23 | Battelle Memorial Institute | Multilayer plastic substrates |
US6624568B2 (en) * | 2001-03-28 | 2003-09-23 | Universal Display Corporation | Multilayer barrier region containing moisture- and oxygen-absorbing material for optoelectronic devices |
US6630243B2 (en) * | 1999-05-20 | 2003-10-07 | Bausch & Lomb Incorporated | Surface treatment of silicone hydrogel contact lenses comprising hydrophilic polymer chains attached to an intermediate carbon coating |
US6630980B2 (en) * | 2001-04-17 | 2003-10-07 | General Electric Company | Transparent flexible barrier for liquid crystal display devices and method of making the same |
US20040027061A1 (en) * | 2002-08-09 | 2004-02-12 | Semiconductor Energy Laboratory Co., Ltd. | Electroluminescence element and a light emitting device using the same |
US6696157B1 (en) * | 2000-03-05 | 2004-02-24 | 3M Innovative Properties Company | Diamond-like glass thin films |
US20040053431A1 (en) * | 2002-09-13 | 2004-03-18 | Industrial Technology Research Institute | Method of forming a flexible thin film transistor display device with a metal foil substrate |
US20040056269A1 (en) * | 2002-07-25 | 2004-03-25 | Kuang-Jung Chen | Passivation structure |
US6743524B2 (en) * | 2002-05-23 | 2004-06-01 | General Electric Company | Barrier layer for an article and method of making said barrier layer by expanding thermal plasma |
US20040119068A1 (en) * | 2001-03-29 | 2004-06-24 | Weaver Michael Stuart | Methods and structures for reducing lateral diffusion through cooperative barrier layers |
US6777249B2 (en) * | 2001-06-01 | 2004-08-17 | Semiconductor Energy Laboratory Co., Ltd. | Method of repairing a light-emitting device, and method of manufacturing a light-emitting device |
US20040195967A1 (en) * | 2003-04-02 | 2004-10-07 | 3M Innovative Properties Company | Flexible high-temperature ultrabarrier |
US20040197944A1 (en) * | 2003-04-04 | 2004-10-07 | Toppoly Optoelectronics Corp. | Method of forming encapsulation structure for organic light-emitting device |
US20040229051A1 (en) * | 2003-05-15 | 2004-11-18 | General Electric Company | Multilayer coating package on flexible substrates for electro-optical devices |
US20040241454A1 (en) * | 1993-10-04 | 2004-12-02 | Shaw David G. | Barrier sheet and method of making same |
US6849877B2 (en) * | 2001-06-20 | 2005-02-01 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and method of manufacturing the same |
US20050030264A1 (en) * | 2001-09-07 | 2005-02-10 | Hitoshi Tsuge | El display, el display driving circuit and image display |
US20050041193A1 (en) * | 2001-12-13 | 2005-02-24 | Herbert Lifka | Sealing structure for display devices |
US6897474B2 (en) * | 2002-04-12 | 2005-05-24 | Universal Display Corporation | Protected organic electronic devices and methods for making the same |
US6911667B2 (en) * | 2002-05-02 | 2005-06-28 | Osram Opto Semiconductors Gmbh | Encapsulation for organic electronic devices |
US6911067B2 (en) * | 2003-01-10 | 2005-06-28 | Blue29, Llc | Solution composition and method for electroless deposition of coatings free of alkali metals |
US20050146267A1 (en) * | 2002-04-04 | 2005-07-07 | Dielectric Systems, Inc. | Organic light emitting device having a protective barrier |
US20050179379A1 (en) * | 2004-02-17 | 2005-08-18 | Han-Ki Kim | Organic light-emitting device having thin-film encapsulation portion, method of manufacturing the device, and apparatus for forming a film |
US6933538B2 (en) * | 2000-09-11 | 2005-08-23 | Osram Opto Semiconductors Gmbh | Plasma encapsulation for electronic and microelectronic components such as organic light emitting diodes |
US20050202646A1 (en) * | 1999-10-25 | 2005-09-15 | Burrows Paul E. | Method for edge sealing barrier films |
US6957067B1 (en) * | 2002-09-24 | 2005-10-18 | Aruba Networks | System and method for monitoring and enforcing policy within a wireless network |
US20050239294A1 (en) * | 2002-04-15 | 2005-10-27 | Rosenblum Martin P | Apparatus for depositing a multilayer coating on discrete sheets |
US20050269943A1 (en) * | 2004-06-04 | 2005-12-08 | Michael Hack | Protected organic electronic devices and methods for making the same |
US20050287686A1 (en) * | 2004-06-25 | 2005-12-29 | Won Tae K | Method to improve water-barrier performance by changing film surface morphology |
US20060017055A1 (en) * | 2004-07-23 | 2006-01-26 | Eastman Kodak Company | Method for manufacturing a display device with low temperature diamond coatings |
US7015640B2 (en) * | 2002-09-11 | 2006-03-21 | General Electric Company | Diffusion barrier coatings having graded compositions and devices incorporating the same |
US20060063015A1 (en) * | 2004-09-23 | 2006-03-23 | 3M Innovative Properties Company | Protected polymeric film |
US20060061272A1 (en) * | 2004-09-23 | 2006-03-23 | 3M Innovative Properties Company | Organic electroluminescent device |
US20060078677A1 (en) * | 2004-06-25 | 2006-04-13 | Won Tae K | Method to improve transmittance of an encapsulating film |
US7030557B2 (en) * | 2003-01-29 | 2006-04-18 | Au Optronics Corp. | Display device with passivation structure |
US7038374B2 (en) * | 2002-04-05 | 2006-05-02 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device including plural carbon-based thin film layers |
US20060158101A1 (en) * | 2003-03-04 | 2006-07-20 | Dow Corning Corporation | Organic light-emitting diode |
US7086918B2 (en) * | 2002-12-11 | 2006-08-08 | Applied Materials, Inc. | Low temperature process for passivation applications |
US20060273304A1 (en) * | 2005-06-07 | 2006-12-07 | Eastman Kodak Company | OLED device having curved viewing surface |
Family Cites Families (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US588594A (en) * | 1897-08-24 | nickel | ||
US4698256A (en) * | 1984-04-02 | 1987-10-06 | American Cyanamid Company | Articles coated with adherent diamondlike carbon films |
US4715941A (en) | 1986-04-14 | 1987-12-29 | International Business Machines Corporation | Surface modification of organic materials to improve adhesion |
DE4220251C2 (en) * | 1991-06-20 | 1996-10-17 | Rodenstock Optik G | Photochromic plastic optical element |
WO1997016053A1 (en) | 1995-10-20 | 1997-05-01 | Robert Bosch Gmbh | Electroluminescent layer system |
JP3605908B2 (en) * | 1995-10-31 | 2004-12-22 | 凸版印刷株式会社 | Barrier laminate and method for producing the same |
US5610751A (en) * | 1995-11-14 | 1997-03-11 | Speedring Systems, Inc. | Optical scanning device having a spherical exit window |
DE19715054A1 (en) | 1997-04-11 | 1998-10-15 | Bosch Gmbh Robert | Electroluminescent device |
US8516132B2 (en) * | 1997-06-19 | 2013-08-20 | Mymail, Ltd. | Method of accessing a selected network |
US6198220B1 (en) | 1997-07-11 | 2001-03-06 | Emagin Corporation | Sealing structure for organic light emitting devices |
US6203898B1 (en) * | 1997-08-29 | 2001-03-20 | 3M Innovatave Properties Company | Article comprising a substrate having a silicone coating |
JP3817081B2 (en) | 1999-01-29 | 2006-08-30 | パイオニア株式会社 | Manufacturing method of organic EL element |
US6083313A (en) | 1999-07-27 | 2000-07-04 | Advanced Refractory Technologies, Inc. | Hardcoats for flat panel display substrates |
MXPA01010920A (en) * | 2000-02-28 | 2003-10-14 | Hydro Aluminium Deutschland | Surface alloyed cylindrical, partially cylindrical or hollow cylindrical component. |
CN100341095C (en) * | 2000-03-07 | 2007-10-03 | 日本胜利株式会社 | Winding apparatus and winding method of deflection coil, and deflection yoke thereby |
JP2001326071A (en) | 2000-05-18 | 2001-11-22 | Stanley Electric Co Ltd | Manufacturing method of passivation film for organic led element |
US6669996B2 (en) | 2000-07-06 | 2003-12-30 | University Of Louisville | Method of synthesizing metal doped diamond-like carbon films |
US6975967B2 (en) | 2001-07-31 | 2005-12-13 | Revco Technologies, Inc. | CO2/O2 incubator predictive failure for CO2 and O2 sensors |
US20020099858A1 (en) * | 2001-08-06 | 2002-07-25 | Muse Corporation | Network communications protocol |
US7106939B2 (en) * | 2001-09-19 | 2006-09-12 | 3M Innovative Properties Company | Optical and optoelectronic articles |
US6975067B2 (en) * | 2002-12-19 | 2005-12-13 | 3M Innovative Properties Company | Organic electroluminescent device and encapsulation method |
GB0409490D0 (en) | 2004-04-28 | 2004-06-02 | Bp Chem Int Ltd | Process |
DE102007062282A1 (en) * | 2007-12-21 | 2009-06-25 | Saltigo Gmbh | Process for the preparation of dialkyl thiodiglycolates |
-
2005
- 2005-07-20 US US11/185,078 patent/US20070020451A1/en not_active Abandoned
-
2006
- 2006-07-18 BR BRPI0615503-0A patent/BRPI0615503A2/en not_active Application Discontinuation
- 2006-07-18 CN CNA2006800265716A patent/CN101228217A/en active Pending
- 2006-07-18 EP EP20140185433 patent/EP2857443A1/en not_active Withdrawn
- 2006-07-18 WO PCT/US2006/027540 patent/WO2007015779A2/en active Application Filing
- 2006-07-18 EP EP20060787449 patent/EP1904560A2/en not_active Withdrawn
- 2006-07-18 KR KR1020087001425A patent/KR101299750B1/en not_active IP Right Cessation
- 2006-07-18 JP JP2008522849A patent/JP5313671B2/en not_active Expired - Fee Related
- 2006-07-19 TW TW095126433A patent/TWI517976B/en not_active IP Right Cessation
-
2009
- 2009-02-19 US US12/388,919 patent/US20090186209A1/en not_active Abandoned
- 2009-03-09 US US12/400,431 patent/US20090169770A1/en not_active Abandoned
-
2011
- 2011-02-10 US US13/024,521 patent/US8034452B2/en not_active Expired - Fee Related
Patent Citations (99)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4842893A (en) * | 1983-12-19 | 1989-06-27 | Spectrum Control, Inc. | High speed process for coating substrates |
US5018048A (en) * | 1983-12-19 | 1991-05-21 | Spectrum Control, Inc. | Miniaturized monolithic multi-layer capacitor and apparatus and method for making |
US5032461A (en) * | 1983-12-19 | 1991-07-16 | Spectrum Control, Inc. | Method of making a multi-layered article |
US5097800A (en) * | 1983-12-19 | 1992-03-24 | Spectrum Control, Inc. | High speed apparatus for forming capacitors |
US5125138A (en) * | 1983-12-19 | 1992-06-30 | Spectrum Control, Inc. | Miniaturized monolithic multi-layer capacitor and apparatus and method for making same |
US4722515A (en) * | 1984-11-06 | 1988-02-02 | Spectrum Control, Inc. | Atomizing device for vaporization |
US4696719A (en) * | 1985-01-18 | 1987-09-29 | Spectrum Control, Inc. | Monomer atomizer for vaporization |
US4791012A (en) * | 1986-01-24 | 1988-12-13 | Ausimont S.P.A. | Films, layers, tapes, plates, and similar structures of metal or of plastic materials, coated with thin polyfluorocarbon films |
US4954371A (en) * | 1986-06-23 | 1990-09-04 | Spectrum Control, Inc. | Flash evaporation of monomer fluids |
US5352493A (en) * | 1991-05-03 | 1994-10-04 | Veniamin Dorfman | Method for forming diamond-like nanocomposite or doped-diamond-like nanocomposite films |
US5718976A (en) * | 1991-05-03 | 1998-02-17 | Advanced Refractory Technologies, Inc. | Erosion resistant diamond-like nanocomposite coatings for optical components |
US5652067A (en) * | 1992-09-10 | 1997-07-29 | Toppan Printing Co., Ltd. | Organic electroluminescent device |
US5320875A (en) * | 1992-12-21 | 1994-06-14 | The Dow Chemical Company | Method of providing an abrasion resistant coating |
US5547908A (en) * | 1993-07-30 | 1996-08-20 | Kyocera Corporation | Dielectric ceramic composition and package made of the same composition for packaging semiconductor |
US5494712A (en) * | 1993-08-27 | 1996-02-27 | The Dow Chemical Company | Method of forming a plasma polymerized film |
US5440446A (en) * | 1993-10-04 | 1995-08-08 | Catalina Coatings, Inc. | Acrylate coating material |
US6231939B1 (en) * | 1993-10-04 | 2001-05-15 | Presstek, Inc. | Acrylate composite barrier coating |
US20040241454A1 (en) * | 1993-10-04 | 2004-12-02 | Shaw David G. | Barrier sheet and method of making same |
US5618619A (en) * | 1994-03-03 | 1997-04-08 | Monsanto Company | Highly abrasion-resistant, flexible coatings for soft substrates |
US5679413A (en) * | 1994-03-03 | 1997-10-21 | Monsanto Company | Highly abrasion-resistant, flexible coatings for soft substrates |
US5508368A (en) * | 1994-03-03 | 1996-04-16 | Diamonex, Incorporated | Ion beam process for deposition of highly abrasion-resistant coatings |
US5682043A (en) * | 1994-06-28 | 1997-10-28 | Uniax Corporation | Electrochemical light-emitting devices |
US5736207A (en) * | 1994-10-27 | 1998-04-07 | Schott Glaswerke | Vessel of plastic having a barrier coating and a method of producing the vessel |
US6214422B1 (en) * | 1994-11-04 | 2001-04-10 | Sigma Laboratories Of Arizona, Inc. | Method of forming a hybrid polymer film |
US6083628A (en) * | 1994-11-04 | 2000-07-04 | Sigma Laboratories Of Arizona, Inc. | Hybrid polymer film |
US5681666A (en) * | 1995-01-23 | 1997-10-28 | Duracell Inc. | Light transparent multilayer moisture barrier for electrochemical celltester and cell employing same |
US5877895A (en) * | 1995-03-20 | 1999-03-02 | Catalina Coatings, Inc. | Multicolor interference coating |
US6010751A (en) * | 1995-03-20 | 2000-01-04 | Delta V Technologies, Inc. | Method for forming a multicolor interference coating |
US5530581A (en) * | 1995-05-31 | 1996-06-25 | Eic Laboratories, Inc. | Protective overlayer material and electro-optical coating using same |
US5638251A (en) * | 1995-10-03 | 1997-06-10 | Advanced Refractory Technologies, Inc. | Capacitive thin films using diamond-like nanocomposite materials |
US5811177A (en) * | 1995-11-30 | 1998-09-22 | Motorola, Inc. | Passivation of electroluminescent organic devices |
US5757126A (en) * | 1995-11-30 | 1998-05-26 | Motorola, Inc. | Passivated organic device having alternating layers of polymer and dielectric |
US5686360A (en) * | 1995-11-30 | 1997-11-11 | Motorola | Passivation of organic devices |
US6200675B1 (en) * | 1996-04-22 | 2001-03-13 | N.V. Bekaert S.A. | Diamond-like nanocomposite compositions |
US5693956A (en) * | 1996-07-29 | 1997-12-02 | Motorola | Inverted oleds on hard plastic substrate |
US5888594A (en) * | 1996-11-05 | 1999-03-30 | Minnesota Mining And Manufacturing Company | Process for depositing a carbon-rich coating on a moving substrate |
US6198217B1 (en) * | 1997-05-12 | 2001-03-06 | Matsushita Electric Industrial Co., Ltd. | Organic electroluminescent device having a protective covering comprising organic and inorganic layers |
US5920080A (en) * | 1997-06-23 | 1999-07-06 | Fed Corporation | Emissive display using organic light emitting diodes |
US6379757B1 (en) * | 1997-06-26 | 2002-04-30 | General Electric Company | Silicon dioxide deposition by plasma activated evaporation process |
US6432494B1 (en) * | 1997-06-26 | 2002-08-13 | General Electric Company | Protective coating by high rate arc plasma deposition |
US5902641A (en) * | 1997-09-29 | 1999-05-11 | Battelle Memorial Institute | Flash evaporation of liquid monomer particle mixture |
US6045864A (en) * | 1997-12-01 | 2000-04-04 | 3M Innovative Properties Company | Vapor coating method |
US6004660A (en) * | 1998-03-12 | 1999-12-21 | E.I. Du Pont De Nemours And Company | Oxygen barrier composite film structure |
US6146225A (en) * | 1998-07-30 | 2000-11-14 | Agilent Technologies, Inc. | Transparent, flexible permeability barrier for organic electroluminescent devices |
US20020022156A1 (en) * | 1998-11-02 | 2002-02-21 | 3M Innovative Properties Company | Transparent conductive oxides for plastic flat panel displays |
US20020125822A1 (en) * | 1998-12-16 | 2002-09-12 | Graff Gordon L. | Environmental barrier material for organic light emitting device and method of making |
US6268695B1 (en) * | 1998-12-16 | 2001-07-31 | Battelle Memorial Institute | Environmental barrier material for organic light emitting device and method of making |
US6522067B1 (en) * | 1998-12-16 | 2003-02-18 | Battelle Memorial Institute | Environmental barrier material for organic light emitting device and method of making |
US6570325B2 (en) * | 1998-12-16 | 2003-05-27 | Battelle Memorial Institute | Environmental barrier material for organic light emitting device and method of making |
US6497598B2 (en) * | 1998-12-16 | 2002-12-24 | Battelle Memorial Institute | Environmental barrier material for organic light emitting device and method of making |
US6358570B1 (en) * | 1999-03-31 | 2002-03-19 | Battelle Memorial Institute | Vacuum deposition and curing of oligomers and resins |
US20030164497A1 (en) * | 1999-04-28 | 2003-09-04 | Carcia Peter Francis | Flexible organic electronic device with improved resistance to oxygen and moisture degradation |
US6630243B2 (en) * | 1999-05-20 | 2003-10-07 | Bausch & Lomb Incorporated | Surface treatment of silicone hydrogel contact lenses comprising hydrophilic polymer chains attached to an intermediate carbon coating |
US20050202646A1 (en) * | 1999-10-25 | 2005-09-15 | Burrows Paul E. | Method for edge sealing barrier films |
US6696157B1 (en) * | 2000-03-05 | 2004-02-24 | 3M Innovative Properties Company | Diamond-like glass thin films |
US6429584B2 (en) * | 2000-03-30 | 2002-08-06 | Pioneer Corporation | Organic electroluminescence display panel and method of manufacturing the same |
US6492026B1 (en) * | 2000-04-20 | 2002-12-10 | Battelle Memorial Institute | Smoothing and barrier layers on high Tg substrates |
US6413645B1 (en) * | 2000-04-20 | 2002-07-02 | Battelle Memorial Institute | Ultrabarrier substrates |
US20010052752A1 (en) * | 2000-04-25 | 2001-12-20 | Ghosh Amalkumar P. | Thin film encapsulation of organic light emitting diode devices |
US6465953B1 (en) * | 2000-06-12 | 2002-10-15 | General Electric Company | Plastic substrates with improved barrier properties for devices sensitive to water and/or oxygen, such as organic electroluminescent devices |
US6933538B2 (en) * | 2000-09-11 | 2005-08-23 | Osram Opto Semiconductors Gmbh | Plasma encapsulation for electronic and microelectronic components such as organic light emitting diodes |
US20020093285A1 (en) * | 2000-09-25 | 2002-07-18 | Pioneer Corporation | Organic electroluminescent display panel |
US20020153523A1 (en) * | 2001-02-05 | 2002-10-24 | Bernius Mark T. | Organic light emitting diodes on plastic substrates |
US6624568B2 (en) * | 2001-03-28 | 2003-09-23 | Universal Display Corporation | Multilayer barrier region containing moisture- and oxygen-absorbing material for optoelectronic devices |
US20040119068A1 (en) * | 2001-03-29 | 2004-06-24 | Weaver Michael Stuart | Methods and structures for reducing lateral diffusion through cooperative barrier layers |
US6623861B2 (en) * | 2001-04-16 | 2003-09-23 | Battelle Memorial Institute | Multilayer plastic substrates |
US6630980B2 (en) * | 2001-04-17 | 2003-10-07 | General Electric Company | Transparent flexible barrier for liquid crystal display devices and method of making the same |
US6777249B2 (en) * | 2001-06-01 | 2004-08-17 | Semiconductor Energy Laboratory Co., Ltd. | Method of repairing a light-emitting device, and method of manufacturing a light-emitting device |
US6849877B2 (en) * | 2001-06-20 | 2005-02-01 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and method of manufacturing the same |
US20050030264A1 (en) * | 2001-09-07 | 2005-02-10 | Hitoshi Tsuge | El display, el display driving circuit and image display |
US20030089905A1 (en) * | 2001-11-09 | 2003-05-15 | Makoto Udagawa | Light emitting device |
US20030099858A1 (en) * | 2001-11-27 | 2003-05-29 | General Electric Company One Research Circle | Environmentally-stable organic electroluminescent fibers |
US20050041193A1 (en) * | 2001-12-13 | 2005-02-24 | Herbert Lifka | Sealing structure for display devices |
US20050146267A1 (en) * | 2002-04-04 | 2005-07-07 | Dielectric Systems, Inc. | Organic light emitting device having a protective barrier |
US7038374B2 (en) * | 2002-04-05 | 2006-05-02 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device including plural carbon-based thin film layers |
US6897474B2 (en) * | 2002-04-12 | 2005-05-24 | Universal Display Corporation | Protected organic electronic devices and methods for making the same |
US20050239294A1 (en) * | 2002-04-15 | 2005-10-27 | Rosenblum Martin P | Apparatus for depositing a multilayer coating on discrete sheets |
US6911667B2 (en) * | 2002-05-02 | 2005-06-28 | Osram Opto Semiconductors Gmbh | Encapsulation for organic electronic devices |
US6743524B2 (en) * | 2002-05-23 | 2004-06-01 | General Electric Company | Barrier layer for an article and method of making said barrier layer by expanding thermal plasma |
US20040056269A1 (en) * | 2002-07-25 | 2004-03-25 | Kuang-Jung Chen | Passivation structure |
US20040027061A1 (en) * | 2002-08-09 | 2004-02-12 | Semiconductor Energy Laboratory Co., Ltd. | Electroluminescence element and a light emitting device using the same |
US7015640B2 (en) * | 2002-09-11 | 2006-03-21 | General Electric Company | Diffusion barrier coatings having graded compositions and devices incorporating the same |
US20040053431A1 (en) * | 2002-09-13 | 2004-03-18 | Industrial Technology Research Institute | Method of forming a flexible thin film transistor display device with a metal foil substrate |
US6957067B1 (en) * | 2002-09-24 | 2005-10-18 | Aruba Networks | System and method for monitoring and enforcing policy within a wireless network |
US7086918B2 (en) * | 2002-12-11 | 2006-08-08 | Applied Materials, Inc. | Low temperature process for passivation applications |
US6911067B2 (en) * | 2003-01-10 | 2005-06-28 | Blue29, Llc | Solution composition and method for electroless deposition of coatings free of alkali metals |
US7030557B2 (en) * | 2003-01-29 | 2006-04-18 | Au Optronics Corp. | Display device with passivation structure |
US20060158101A1 (en) * | 2003-03-04 | 2006-07-20 | Dow Corning Corporation | Organic light-emitting diode |
US20040195967A1 (en) * | 2003-04-02 | 2004-10-07 | 3M Innovative Properties Company | Flexible high-temperature ultrabarrier |
US20040197944A1 (en) * | 2003-04-04 | 2004-10-07 | Toppoly Optoelectronics Corp. | Method of forming encapsulation structure for organic light-emitting device |
US20040229051A1 (en) * | 2003-05-15 | 2004-11-18 | General Electric Company | Multilayer coating package on flexible substrates for electro-optical devices |
US20050179379A1 (en) * | 2004-02-17 | 2005-08-18 | Han-Ki Kim | Organic light-emitting device having thin-film encapsulation portion, method of manufacturing the device, and apparatus for forming a film |
US20050269943A1 (en) * | 2004-06-04 | 2005-12-08 | Michael Hack | Protected organic electronic devices and methods for making the same |
US20060078677A1 (en) * | 2004-06-25 | 2006-04-13 | Won Tae K | Method to improve transmittance of an encapsulating film |
US20050287686A1 (en) * | 2004-06-25 | 2005-12-29 | Won Tae K | Method to improve water-barrier performance by changing film surface morphology |
US20060017055A1 (en) * | 2004-07-23 | 2006-01-26 | Eastman Kodak Company | Method for manufacturing a display device with low temperature diamond coatings |
US20060061272A1 (en) * | 2004-09-23 | 2006-03-23 | 3M Innovative Properties Company | Organic electroluminescent device |
US20060063015A1 (en) * | 2004-09-23 | 2006-03-23 | 3M Innovative Properties Company | Protected polymeric film |
US20060273304A1 (en) * | 2005-06-07 | 2006-12-07 | Eastman Kodak Company | OLED device having curved viewing surface |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100039707A1 (en) * | 2006-11-10 | 2010-02-18 | Sumitomo Electric Industries, Ltd. | Si-o containing hydrogenated carbon film, optical device including the same, and method for manufacturing the si-o containing hydrogenated carbon film and the optical device |
US8047653B2 (en) * | 2006-11-10 | 2011-11-01 | Sumitomo Electric Industries, Ltd. | Si-O containing hydrogenated carbon film, optical device including the same, and method for manufacturing the Si-O containing hydrogenated carbon film and the optical device |
US20080179760A1 (en) * | 2007-01-31 | 2008-07-31 | Infineon Technologies Ag | Method for producing a device and device |
US7811860B2 (en) * | 2007-01-31 | 2010-10-12 | Infineon Technologies Ag | Method for producing a device and device |
US8871350B2 (en) | 2009-03-30 | 2014-10-28 | Material Design Factory Co., Ltd. | Gas barrier film, electronic device including the same, gas barrier bag, and method for producing gas barrier film |
US20130251919A1 (en) * | 2010-09-17 | 2013-09-26 | Mgc Filsheet Co., Ltd. | Front plate of tn liquid crystal panel |
US9817262B2 (en) * | 2010-09-17 | 2017-11-14 | Mitsubishi Gas Chemical Company, Inc. | Front plate of TN liquid crystal panel |
US20120135212A1 (en) * | 2010-11-26 | 2012-05-31 | Hon Hai Precision Industry Co., Ltd. | Coated article and method for making same |
US8963421B2 (en) | 2012-09-14 | 2015-02-24 | National Chiao Tung University | Electroluminescent device including moisture barrier layer |
US20150252125A1 (en) * | 2014-03-10 | 2015-09-10 | Cheil Industries Inc. | Curable resin compositions and barrier stacks including the same |
Also Published As
Publication number | Publication date |
---|---|
EP2857443A1 (en) | 2015-04-08 |
KR101299750B1 (en) | 2013-08-23 |
EP1904560A2 (en) | 2008-04-02 |
BRPI0615503A2 (en) | 2011-05-17 |
US20070020451A1 (en) | 2007-01-25 |
US20090186209A1 (en) | 2009-07-23 |
WO2007015779A3 (en) | 2007-10-25 |
KR20080036042A (en) | 2008-04-24 |
JP2009502554A (en) | 2009-01-29 |
TW200711844A (en) | 2007-04-01 |
WO2007015779A2 (en) | 2007-02-08 |
TWI517976B (en) | 2016-01-21 |
US8034452B2 (en) | 2011-10-11 |
CN101228217A (en) | 2008-07-23 |
JP5313671B2 (en) | 2013-10-09 |
US20110143129A1 (en) | 2011-06-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US8034452B2 (en) | Moisture barrier coatings | |
US8241713B2 (en) | Moisture barrier coatings for organic light emitting diode devices | |
EP2882591B1 (en) | Barrier film, method of making the barrier film, and articles including the barrier film | |
US20090252894A1 (en) | Moisture barrier coatings for organic light emitting diode devices | |
US20040195967A1 (en) | Flexible high-temperature ultrabarrier | |
US20090297771A1 (en) | Barrier laminate, gas barrier film, device, and method for producing barrier laminate | |
EP3337848B1 (en) | Composite article including a multilayer barrier assembly and methods of making the same | |
EP2128192B1 (en) | Barrier laminate, gas barrier film and device using the same | |
CN108137832B (en) | Multilayer barrier stack | |
EP3356251B1 (en) | Multilayer barrier stack | |
CN107921753B (en) | Composite article comprising a multilayer barrier component and method of making the same |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
STCB | Information on status: application discontinuation |
Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION |