Nothing Special   »   [go: up one dir, main page]

US20050229703A1 - Coupling apparatus for inertial sensors - Google Patents

Coupling apparatus for inertial sensors Download PDF

Info

Publication number
US20050229703A1
US20050229703A1 US11/106,354 US10635405A US2005229703A1 US 20050229703 A1 US20050229703 A1 US 20050229703A1 US 10635405 A US10635405 A US 10635405A US 2005229703 A1 US2005229703 A1 US 2005229703A1
Authority
US
United States
Prior art keywords
bar
flexure
frames
flexures
anchor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
US11/106,354
Other versions
US7347094B2 (en
Inventor
John Geen
William Clark
Jinbo Kuang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Analog Devices Inc
Original Assignee
Analog Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Analog Devices Inc filed Critical Analog Devices Inc
Priority to US11/106,354 priority Critical patent/US7347094B2/en
Assigned to ANALOG DEVICES, INC. reassignment ANALOG DEVICES, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: CLARK, WILLIAM A., GEEN, JOHN A., KUANG, JINBO
Publication of US20050229703A1 publication Critical patent/US20050229703A1/en
Application granted granted Critical
Publication of US7347094B2 publication Critical patent/US7347094B2/en
Active legal-status Critical Current
Adjusted expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C19/00Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
    • G01C19/56Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
    • G01C19/5719Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using planar vibrating masses driven in a translation vibration along an axis
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C19/00Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
    • G01C19/56Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
    • G01C19/5719Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using planar vibrating masses driven in a translation vibration along an axis
    • G01C19/5733Structural details or topology
    • G01C19/574Structural details or topology the devices having two sensing masses in anti-phase motion

Definitions

  • the invention generally relates to sensors and, more particularly, the invention relates to inertial sensors.
  • Inertial sensors such as MEMS gyroscopes, often are adversely affected by rotational vibration noise at the drive frequency (often referred to as “wobble”).
  • MEMS gyroscopes can produce false readings if they are not capable of distinguishing between rotational vibration and the actual movement they are intended to detect.
  • distortion of the geometry of a MEMS device having an oscillating mass can produce an imbalance in the forces transverse to a longitudinal drive finger. This imbalance can cause a net force that is indistinguishable from a Coriolis force. Consequently, a gyroscope can produce false outputs.
  • a gyroscope can produce false outputs.
  • Embodiments of the present invention provide apparatus for coupling inertial sensor element frames so as to allow anti-phase movements of the inertial sensor element frames along parallel axes but substantially prevents in-phase movements of the frames.
  • the apparatus includes a bar coupled between first and second sensor element frames and at least one supporting structure supporting the bar.
  • the at least one structure is coupled to a substrate underlying the frames.
  • the structures allow the bar to rotate at a pivot point when the frames move in anti-phase to one another along substantially parallel axes but substantially prevent in-phase movements of the frames.
  • the apparatus further includes a first pair of short flexures extending from one of the frames and interconnected by a first long flexure and a second pair of short flexures extending from the other of the frames and interconnected by a second long flexure.
  • the bar interconnects the first long flexure to the second long flexure substantially at the midpoints of the first and second long flexures.
  • the at least one supporting structure includes an anchor flexure supporting the bar.
  • the anchor flexure intersects with the bar substantially at the midpoints of the bar and the anchor flexure. Each end of the anchor flexure anchored to the substrate.
  • Each of the long flexures is typically coupled so as to flex as the bar rotates.
  • the apparatus further includes a first flexure extending from one of the frames and a second flexure extending from the other of the frames.
  • the bar interconnects the first and second flexures.
  • the at least one supporting structure includes at least one anchor flexure supporting the bar.
  • Each anchor flexure includes a structure anchored at one end to the at least one substrate and folded back 180 degrees to meet with the bar.
  • the at least one anchor flexure may include four anchor flexures positioned around the pivot point. Each of the anchor flexures is typically anchored to the substrate adjacent to the bar.
  • Each of the first and second flexures may include two substantially parallel members coupled at both ends, with one of the members coupled to the frame and the other member coupled to the bar such that the members flex as the bar rotates.
  • the apparatus includes coupling means for coupling first and second sensor element frames and supporting means for supporting the coupling means.
  • the supporting means are coupled to a substrate underlying the frames.
  • the supporting means allow the coupling means to rotate at a pivot point when the frames move in anti-phase to one another along substantially parallel axes but substantially preventing in-phase movements of the frames.
  • the coupling means include a first pair of short flexures extending from one of the frames and interconnected by a first long flexure; a second pair of short flexures extending from the other of the frames and interconnected by a second long flexure; and a bar that interconnects the first long flexure to the second long flexure substantially at the midpoints of the first and second long flexures.
  • the supporting means may include an anchor flexure supporting the bar, the anchor flexure intersecting with the bar substantially at the midpoints of the bar and the anchor flexure, each end of the anchor flexure anchored to the substrate.
  • Each of the long flexures may be coupled so as to flex as the bar rotates.
  • the coupling means include a first flexure extending from one of the frames; a second flexure extending from the other of the frames; and a bar that interconnects the first and second flexures.
  • the supporting means may include at least one anchor flexure supporting the bar, each anchor flexure including a structure anchored at one end to the at least one substrate and folded back 180 degrees to meet with the bar.
  • the at least one anchor flexure may include four anchor flexures positioned around the pivot point. Each of the anchor flexures may be anchored to the substrate adjacent to the bar.
  • Each of the first and second flexures may include two substantially parallel members coupled at both ends, one of the members coupled to the frame, the other member coupled to the bar, the members coupled so as to flex as the bar rotates.
  • rotation of the substrate about an axis normal to the plane causes the movements of the frames.
  • FIG. 1 schematically shows a linear array of gyroscopes configured in accordance with illustrative embodiments of the invention
  • FIG. 2 schematically shows a coupling apparatus for coupling two frames shown in FIG. 1 in accordance with illustrative embodiments of the invention
  • FIG. 3 schematically shows additional details of an alternative embodiment of a first pair of gyroscopes
  • FIG. 4 shows more detail of the specific coupling apparatus used by the gyroscope pair shown in FIG. 3 ;
  • FIG. 5 shows more detail of specific balancers in accordance with illustrative embodiments of the invention.
  • an inertial sensor has a plurality of individual sensor components that all share a common centroid. Details of illustrative embodiments are discussed below.
  • FIG. 1 schematically shows an array 10 of microelectromechanical systems (i.e., “MEMS”) configured in accordance with illustrative embodiments of the invention.
  • MEMS microelectromechanical systems
  • the array 10 of MEMS devices together combine to effectively perform the function of a single gyroscope.
  • the array 10 includes four MEMS gyroscopes 12 A-D that all are secured to a common underlying substrate (not shown).
  • the MEMS gyroscopes 12 A- 12 D could be secured to different substrates.
  • Each gyroscope 12 A- 12 D includes at least one oscillating mass (referred to herein as “resonator 14 A, 14 B, 14 C, and 14 D,” respectively, or “resonator 14 ” generally) that 1) oscillates at a constant frequency along the X-axis and 2) is coupled with a single accelerometer frame (referred to herein as “frame 16 A, 16 B, 16 C, or 16 D,” respectively, or “frame 16 ” generally).
  • the resonator 14 illustratively is compliant in the X-direction only, while the frame 16 is compliant in the Y-direction only.
  • any one of the gyroscopes 12 A- 12 D about the Z-axis causes its resonator 14 to produce a Coriolis force that imparted to the accelerometer frame 16 .
  • the frame 16 moves along the Y-axis.
  • Capacitively coupled fingers 18 detect this Y-movement, which is translated into a signal representing the magnitude of the angular acceleration.
  • the gyroscopes 12 A- 12 D are similar to those disclosed in U.S. Pat. Nos. 6,505,511 and 6,122,961, the disclosures of which are incorporated herein, in their entireties, by reference.
  • the gyroscopes 12 A- 12 D also may be similar to those disclosed in U.S. Pat. No. 6,877,374, the disclosure of which also is incorporated herein, in its entirety, by reference.
  • the different gyroscopes 12 A and 12 D have a common centroid with the gyroscopes producing anti-phase signals 12 B and 12 C.
  • the array 10 therefore is configured to position the gyroscopes 12 A- 12 D and phase the respective resonators 14 in a manner that accomplishes this end.
  • the specific placement, number of gyroscopes 12 A- 12 D, and the phase of their resonators 14 thus are coordinated to ensure that they share a common centroid.
  • FIG. 1 shows an exemplary arrangement that produces the desired result.
  • the array 10 includes a first pair of gyroscopes 12 A/B having the first and second gyroscopes 12 A and 12 B, and a second pair of gyroscopes 12 C/D having the third and fourth gyroscopes 12 C and 12 D.
  • the resonators 14 in each pair operate 180 degrees out of phase and their frames 16 are coupled together in the manner discussed below.
  • the first pair of gyroscopes 12 A/B is not coupled with the second pair 12 C/D.
  • embodiments of the invention should be substantially insensitive surface shear and also, as noted above, cause angular acceleration noise to cancel.
  • each pair of frames 16 is coupled to ensure that they can move in anti-phase (i.e., 180 degrees out of phase) only, although the two pairs of frames are not interconnected.
  • FIG. 2 schematically shows more details of a mechanical coupling apparatus 99 for securing two of the frames. Although embodiments of the coupling apparatus 99 apply to any of the frames 16 shown, the frames 16 are identified in FIG. 2 as the first and second frames 16 A and 16 B for simplicity.
  • the first frame 16 A has a first pair of short flexures 20 A that are coupled with a first long flexure 22 A.
  • the second frame 16 B has a second pair of short flexures 20 B that are coupled with a second long flexure 22 B.
  • a bar 24 secures the first long flexure 22 A to the second long flexure 22 B.
  • a pair of anchors 26 A and 26 B extend on two sides of the bar 24 and couple with it by means of an anchor flexure 28 .
  • This arrangement is substantially noncompliant when the two frames 16 A and 16 B are urged to move in phase. In contrast, this arrangement is substantially compliant when the two frames 16 A and 16 B are urged to move in anti-phase. In other words, when the first frame 16 A is urged upwardly along the Y-axis, the second frame 16 B is urged downwardly along the Y-axis. If both are urged upwardly along the Y-axis, however, this arrangement should be substantially non-compliant. In some embodiments, this arrangement permits the frames 16 A and 16 B to rotate to some extent as they move in the Y-direction.
  • FIG. 3 schematically shows additional details of an alternative embodiment of the first pair of frames 16 A and 16 B. As shown, this embodiment also has the resonator 14 , frame 16 , coupling apparatus, and other components similar to those discussed above.
  • FIG. 4 shows more detail of the specific coupling apparatus shown in FIG. 3 . Note that this coupling apparatus may be used with other gyroscope configurations, including those shown in FIG. 1 .
  • the anchor flexure 28 actually extends outwardly and then folds back 180 degrees to meet with the bar 24 .
  • the coupling apparatus also has etch compensators. See the text in FIG. 4 , which notes that the folded anchor flexure 28 allows rotation of the bar 24 about a pivot point, but no translation perpendicular to the axis of the bar 24 .
  • this embodiment uses a single short flexure 20 on each frame.
  • this flexure arrangement In addition to ensuring that the frames 16 A and 16 B move in anti-phase, this flexure arrangement also reduces the potentially adverse effects of material shrinkage and G cross G error. This G cross G error arises when there is in-phase movement of the frames, and this is suppressed or reduced by the couplings.
  • the coupling apparatus 99 effectively add mass and stiffness to the movements of the frames 16 . Since each frame is only coupled to an adjacent frame along one of its sides, the coupling apparatus 99 effectively unbalances the movements of each frame. Therefore, the array 10 preferably includes a number of balancers (referred to herein as “balancers 97 A, 97 B, 97 C, and 97 D,” respectively, or “balancer 97 ” generally) to help offset the effects of the coupling apparatus 99 . Specifically, a balancer 97 is preferably coupled to a side of each frame opposite the side with the coupling apparatus 99 .
  • balancer 97 A is coupled to frame 16 A along the side opposite the coupling 99 AB
  • balancer 97 B is coupled to frame 16 B along the side opposite the coupling 99 AB
  • balancer 97 C is coupled to frame 16 C along the side opposite the coupling 99 CD
  • balancer 97 D is coupled to frame 16 D along the side opposite the coupling 99 CD.
  • the configuration of each balancer 97 is typically the equivalent of half of a coupling apparatus 99 and therefore imparts substantially an equal but opposite mechanical effect on its respective frame 16 .
  • FIG. 5 shows more detail of specific balancers 97 (in this example, balancers 97 B and 97 C that sit between the two pairs of sensor elements) in accordance with illustrative embodiments of the invention.
  • the configuration of each balancer 97 is essentially the equivalent of half of a coupling apparatus as shown in FIG. 4 . It should be noted that, unlike the coupling apparatus 99 , there is no coupling between the two adjacent balancers 97 B and 97 C.
  • the accelerometers are run at about 17 volts.

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Gyroscopes (AREA)
  • Pressure Sensors (AREA)

Abstract

A coupling apparatus allows anti-phase movements of inertial sensor element frames along parallel axes but substantially prevents in-phase movements of the frames. The coupling apparatus includes a bar coupled between first and second sensor element frames and at least one supporting structure supporting the bar. The at least one structure is coupled to a substrate underlying the frames. The structures allow the bar to rotate at a pivot point when the frames move in anti-phase to one another along substantially parallel axes but substantially prevent in-phase movements of the frames.

Description

    CROSS-REFERENCE TO RELATED APPLICATIONS
  • This application claims priority from U.S. Provisional Patent Application No. 60/561,931 entitled Inertial Sensor Array and Coupling Apparatus for the Same, filed on Apr. 14, 2004 in the names of John A. Geen, William A. Clark, and Jinbo Kuang, which is hereby incorporated herein by reference in its entirety.
  • This application is also related to a certain U.S. patent application entitled INERTIAL SENSOR WITH A LINEAR ARRAY OF SENSOR ELEMENTS filed on even date herewith, which claims priority from the above-referenced provisional patent application and is hereby incorporated by reference in its entirety.
  • FIELD OF THE INVENTION
  • The invention generally relates to sensors and, more particularly, the invention relates to inertial sensors.
  • BACKGROUND OF THE INVENTION
  • Inertial sensors, such as MEMS gyroscopes, often are adversely affected by rotational vibration noise at the drive frequency (often referred to as “wobble”). In particular, MEMS gyroscopes can produce false readings if they are not capable of distinguishing between rotational vibration and the actual movement they are intended to detect.
  • Also, distortion of the geometry of a MEMS device having an oscillating mass, such as a gyroscope, can produce an imbalance in the forces transverse to a longitudinal drive finger. This imbalance can cause a net force that is indistinguishable from a Coriolis force. Consequently, a gyroscope can produce false outputs. There are at least two sources of these geometric distortions. One arises from surface shear of the substrate (e.g., from release/wafer curvature on dicing). Another arises from differential expansion of the package and applied accelerations (e.g., diagonally, G×G). Some causes of G×G error is discussed in Geen, J. A., “Progress in Integrated Gyroscopes,” IEEE PLANS 2004 Proceedings, pp. 1-6, which is hereby incorporated herein by reference in its entirety.
  • SUMMARY OF THE INVENTION
  • Embodiments of the present invention provide apparatus for coupling inertial sensor element frames so as to allow anti-phase movements of the inertial sensor element frames along parallel axes but substantially prevents in-phase movements of the frames.
  • In accordance with one aspect of the invention there is provided apparatus for coupling sensor elements of an inertial sensor. The apparatus includes a bar coupled between first and second sensor element frames and at least one supporting structure supporting the bar. The at least one structure is coupled to a substrate underlying the frames. The structures allow the bar to rotate at a pivot point when the frames move in anti-phase to one another along substantially parallel axes but substantially prevent in-phase movements of the frames.
  • In one exemplary embodiment, the apparatus further includes a first pair of short flexures extending from one of the frames and interconnected by a first long flexure and a second pair of short flexures extending from the other of the frames and interconnected by a second long flexure. The bar interconnects the first long flexure to the second long flexure substantially at the midpoints of the first and second long flexures. The at least one supporting structure includes an anchor flexure supporting the bar. The anchor flexure intersects with the bar substantially at the midpoints of the bar and the anchor flexure. Each end of the anchor flexure anchored to the substrate. Each of the long flexures is typically coupled so as to flex as the bar rotates.
  • In another exemplary embodiment of the invention, the apparatus further includes a first flexure extending from one of the frames and a second flexure extending from the other of the frames. The bar interconnects the first and second flexures. The at least one supporting structure includes at least one anchor flexure supporting the bar. Each anchor flexure includes a structure anchored at one end to the at least one substrate and folded back 180 degrees to meet with the bar. The at least one anchor flexure may include four anchor flexures positioned around the pivot point. Each of the anchor flexures is typically anchored to the substrate adjacent to the bar. Each of the first and second flexures may include two substantially parallel members coupled at both ends, with one of the members coupled to the frame and the other member coupled to the bar such that the members flex as the bar rotates.
  • In accordance with another aspect of the invention there is provided apparatus for coupling sensor elements of an inertial sensor. The apparatus includes coupling means for coupling first and second sensor element frames and supporting means for supporting the coupling means. The supporting means are coupled to a substrate underlying the frames. The supporting means allow the coupling means to rotate at a pivot point when the frames move in anti-phase to one another along substantially parallel axes but substantially preventing in-phase movements of the frames.
  • In a first exemplary embodiment, the coupling means include a first pair of short flexures extending from one of the frames and interconnected by a first long flexure; a second pair of short flexures extending from the other of the frames and interconnected by a second long flexure; and a bar that interconnects the first long flexure to the second long flexure substantially at the midpoints of the first and second long flexures. The supporting means may include an anchor flexure supporting the bar, the anchor flexure intersecting with the bar substantially at the midpoints of the bar and the anchor flexure, each end of the anchor flexure anchored to the substrate. Each of the long flexures may be coupled so as to flex as the bar rotates.
  • In another exemplary embodiment of the invention, the coupling means include a first flexure extending from one of the frames; a second flexure extending from the other of the frames; and a bar that interconnects the first and second flexures. The supporting means may include at least one anchor flexure supporting the bar, each anchor flexure including a structure anchored at one end to the at least one substrate and folded back 180 degrees to meet with the bar. The at least one anchor flexure may include four anchor flexures positioned around the pivot point. Each of the anchor flexures may be anchored to the substrate adjacent to the bar. Each of the first and second flexures may include two substantially parallel members coupled at both ends, one of the members coupled to the frame, the other member coupled to the bar, the members coupled so as to flex as the bar rotates.
  • In typical embodiments of the invention, rotation of the substrate about an axis normal to the plane causes the movements of the frames.
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • The foregoing and advantages of the invention will be appreciated more fully from the following further description thereof with reference to the accompanying drawings wherein:
  • FIG. 1 schematically shows a linear array of gyroscopes configured in accordance with illustrative embodiments of the invention;
  • FIG. 2 schematically shows a coupling apparatus for coupling two frames shown in FIG. 1 in accordance with illustrative embodiments of the invention;
  • FIG. 3 schematically shows additional details of an alternative embodiment of a first pair of gyroscopes;
  • FIG. 4 shows more detail of the specific coupling apparatus used by the gyroscope pair shown in FIG. 3; and
  • FIG. 5 shows more detail of specific balancers in accordance with illustrative embodiments of the invention.
  • The drawings are for illustrative purposes and may not be drawn to scale.
  • DETAILED DESCRIPTION OF A PREFERRED EMBODIMENT
  • In illustrative embodiments, an inertial sensor has a plurality of individual sensor components that all share a common centroid. Details of illustrative embodiments are discussed below.
  • FIG. 1 schematically shows an array 10 of microelectromechanical systems (i.e., “MEMS”) configured in accordance with illustrative embodiments of the invention. Specifically, the array 10 of MEMS devices together combine to effectively perform the function of a single gyroscope. To that end, the array 10 includes four MEMS gyroscopes 12A-D that all are secured to a common underlying substrate (not shown). Alternatively, the MEMS gyroscopes 12A-12D could be secured to different substrates.
  • Each gyroscope 12A-12D includes at least one oscillating mass (referred to herein as “ resonator 14A, 14B, 14C, and 14D,” respectively, or “resonator 14” generally) that 1) oscillates at a constant frequency along the X-axis and 2) is coupled with a single accelerometer frame (referred to herein as “ frame 16A, 16B, 16C, or 16D,” respectively, or “frame 16” generally). The resonator 14 illustratively is compliant in the X-direction only, while the frame 16 is compliant in the Y-direction only. Accordingly, rotation of any one of the gyroscopes 12A-12D about the Z-axis causes its resonator 14 to produce a Coriolis force that imparted to the accelerometer frame 16. Upon receipt of this Coriolis force, the frame 16 moves along the Y-axis. Capacitively coupled fingers 18 detect this Y-movement, which is translated into a signal representing the magnitude of the angular acceleration.
  • In illustrative embodiments, the gyroscopes 12A-12D are similar to those disclosed in U.S. Pat. Nos. 6,505,511 and 6,122,961, the disclosures of which are incorporated herein, in their entireties, by reference. The gyroscopes 12A-12D also may be similar to those disclosed in U.S. Pat. No. 6,877,374, the disclosure of which also is incorporated herein, in its entirety, by reference.
  • As noted above, in illustrative embodiments, the different gyroscopes 12A and 12D have a common centroid with the gyroscopes producing anti-phase signals 12B and 12C. The array 10 therefore is configured to position the gyroscopes 12A-12D and phase the respective resonators 14 in a manner that accomplishes this end. The specific placement, number of gyroscopes 12A-12D, and the phase of their resonators 14 thus are coordinated to ensure that they share a common centroid.
  • FIG. 1 shows an exemplary arrangement that produces the desired result. In particular, the array 10 includes a first pair of gyroscopes 12A/B having the first and second gyroscopes 12A and 12B, and a second pair of gyroscopes 12 C/D having the third and fourth gyroscopes 12C and 12D. As shown, the resonators 14 in each pair operate 180 degrees out of phase and their frames 16 are coupled together in the manner discussed below. The first pair of gyroscopes 12A/B, however, is not coupled with the second pair 12C/D.
  • When positioned in the manner shown in FIG. 1, the first gyroscope 12A and the fourth gyroscope 12D resonate in phase, while the second and third gyroscopes 12B and 12C resonate in phase. Accordingly, the following equation is true:
    V 1+V 4=V 2+V3,
      • where:
      • V1 is the vector distance of the first gyroscope 12A to a point of rotation,
      • V2 is the vector distance of the second gyroscope 12B to a point of rotation,
      • V3 is the vector distance of the third gyroscope 12C to a point of rotation, and
      • V4 is the vector distance of the fourth gyroscope 12D to a point of rotation.
  • Note that a sign of the vector distance should be taken into account when considering this equation. When this relationship holds, the gyroscope as a whole becomes substantially insensitive to angular accelerations about that point of rotation to the extent that the responses of the frames match each other. The couplings overcome the mismatches induced by manufacturing tolerances and thereby improve the rejection of angular acceleration.
  • This arrangement nevertheless should not adversely affect the array 10 from detecting the underlying angular velocity for which it is designed.
  • Accordingly, embodiments of the invention should be substantially insensitive surface shear and also, as noted above, cause angular acceleration noise to cancel.
  • As noted above, the individual frames 16 within each pair are coupled in a manner that facilitates operation. Specifically, frames 16A and 16B are coupled by coupling 99AB, while frames 16C and 16D are coupled by coupling 99CD (referred to herein as “coupling apparatus 99” generally). In illustrative embodiments, each pair of frames 16 is coupled to ensure that they can move in anti-phase (i.e., 180 degrees out of phase) only, although the two pairs of frames are not interconnected. FIG. 2 schematically shows more details of a mechanical coupling apparatus 99 for securing two of the frames. Although embodiments of the coupling apparatus 99 apply to any of the frames 16 shown, the frames 16 are identified in FIG. 2 as the first and second frames 16A and 16B for simplicity.
  • Specifically, the first frame 16A has a first pair of short flexures 20A that are coupled with a first long flexure 22A. In a corresponding manner, the second frame 16B has a second pair of short flexures 20B that are coupled with a second long flexure 22B. A bar 24 secures the first long flexure 22A to the second long flexure 22B. To provide some stability, a pair of anchors 26A and 26B extend on two sides of the bar 24 and couple with it by means of an anchor flexure 28.
  • This arrangement is substantially noncompliant when the two frames 16A and 16B are urged to move in phase. In contrast, this arrangement is substantially compliant when the two frames 16A and 16B are urged to move in anti-phase. In other words, when the first frame 16A is urged upwardly along the Y-axis, the second frame 16B is urged downwardly along the Y-axis. If both are urged upwardly along the Y-axis, however, this arrangement should be substantially non-compliant. In some embodiments, this arrangement permits the frames 16A and 16B to rotate to some extent as they move in the Y-direction.
  • FIG. 3 schematically shows additional details of an alternative embodiment of the first pair of frames 16A and 16B. As shown, this embodiment also has the resonator 14, frame 16, coupling apparatus, and other components similar to those discussed above. FIG. 4 shows more detail of the specific coupling apparatus shown in FIG. 3. Note that this coupling apparatus may be used with other gyroscope configurations, including those shown in FIG. 1.
  • As shown in FIG. 4, the anchor flexure 28 actually extends outwardly and then folds back 180 degrees to meet with the bar 24. In addition, the coupling apparatus also has etch compensators. See the text in FIG. 4, which notes that the folded anchor flexure 28 allows rotation of the bar 24 about a pivot point, but no translation perpendicular to the axis of the bar 24. Also, rather than have a pair of short flexures 20 on each frame, this embodiment uses a single short flexure 20 on each frame.
  • In addition to ensuring that the frames 16A and 16B move in anti-phase, this flexure arrangement also reduces the potentially adverse effects of material shrinkage and G cross G error. This G cross G error arises when there is in-phase movement of the frames, and this is suppressed or reduced by the couplings.
  • The coupling apparatus 99 effectively add mass and stiffness to the movements of the frames 16. Since each frame is only coupled to an adjacent frame along one of its sides, the coupling apparatus 99 effectively unbalances the movements of each frame. Therefore, the array 10 preferably includes a number of balancers (referred to herein as “balancers 97A, 97B, 97C, and 97D,” respectively, or “balancer 97” generally) to help offset the effects of the coupling apparatus 99. Specifically, a balancer 97 is preferably coupled to a side of each frame opposite the side with the coupling apparatus 99. Thus, balancer 97A is coupled to frame 16A along the side opposite the coupling 99AB, balancer 97B is coupled to frame 16B along the side opposite the coupling 99AB, balancer 97C is coupled to frame 16C along the side opposite the coupling 99CD, and balancer 97D is coupled to frame 16D along the side opposite the coupling 99CD. The configuration of each balancer 97 is typically the equivalent of half of a coupling apparatus 99 and therefore imparts substantially an equal but opposite mechanical effect on its respective frame 16.
  • FIG. 5 shows more detail of specific balancers 97 (in this example, balancers 97B and 97C that sit between the two pairs of sensor elements) in accordance with illustrative embodiments of the invention. As shown, the configuration of each balancer 97 is essentially the equivalent of half of a coupling apparatus as shown in FIG. 4. It should be noted that, unlike the coupling apparatus 99, there is no coupling between the two adjacent balancers 97B and 97C.
  • In illustrative embodiments, the accelerometers are run at about 17 volts.
  • The present invention may be embodied in other specific forms without departing from the true scope of the invention. The described embodiments are to be considered in all respects only as illustrative and not restrictive.

Claims (18)

1. Apparatus for coupling sensor elements of an inertial sensor, the apparatus comprising:
a bar coupled between first and second sensor element frames; and
at least one supporting structure supporting the bar, the at least one structure coupled to a substrate underlying the frames, the structures allowing the bar to rotate at a pivot point when the frames move in anti-phase to one another along separate substantially parallel axes but substantially preventing in-phase movements of the frames.
2. Apparatus according to claim 1, further comprising:
a first pair of short flexures extending from one of the frames and interconnected by a first long flexure; and
a second pair of short flexures extending from the other of the frames and interconnected by a second long flexure, wherein the bar interconnects the first long flexure to the second long flexure substantially at the midpoints of the first and second long flexures, and wherein the at least one supporting structure includes an anchor flexure supporting the bar, the anchor flexure intersecting with the bar substantially at the midpoints of the bar and the anchor flexure, each end of the anchor flexure anchored to the substrate.
3. Apparatus according to claim 2, wherein each of the long flexures is coupled so as to flex as the bar rotates.
4. Apparatus according to claim 1, further comprising:
a first flexure extending from one of the frames; and
a second flexure extending from the other of the frames, wherein the bar interconnects the first and second flexures, and wherein the at least one supporting structure includes at least one anchor flexure supporting the bar, each anchor flexure including a structure anchored at one end to the at least one substrate and folded back 180 degrees to meet with the bar.
5. Apparatus according to claim 4, wherein the at least one anchor flexure includes four anchor flexures positioned around the pivot point.
6. Apparatus according to claim 4, wherein each of the anchor flexures in anchored to the substrate adjacent to the bar.
7. Apparatus according to claim 4, wherein each of the first and second flexures includes two substantially parallel members coupled at both ends, one of the members coupled to the frame, the other member coupled to the bar, the members coupled so as to flex as the bar rotates.
8. Apparatus according to claim 1, wherein rotation of the substrate about an axis normal to the plane causes the movements of the frames.
9. Apparatus for coupling sensor elements of an inertial sensor, the apparatus comprising:
coupling means for coupling first and second sensor element frames; and
supporting means for supporting the coupling means, the supporting means coupled to a substrate underlying the frames, the supporting means allowing the coupling means to rotate at a pivot point when the frames move in anti-phase to one another along separate substantially parallel axes but substantially preventing in-phase movements of the frames.
10. Apparatus according to claim 9, wherein the coupling means comprises:
a first pair of short flexures extending from one of the frames and interconnected by a first long flexure;
a second pair of short flexures extending from the other of the frames and interconnected by a second long flexure; and
a bar that interconnects the first long flexure to the second long flexure substantially at the midpoints of the first and second long flexures.
11. Apparatus according to claim 10, wherein the supporting means comprises:
an anchor flexure supporting the bar, the anchor flexure intersecting with the bar substantially at the midpoints of the bar and the anchor flexure, each end of the anchor flexure anchored to the substrate.
12. Apparatus according to claim 10, wherein each of the long flexures is coupled so as to flex as the bar rotates.
13. Apparatus according to claim 9, wherein the coupling means comprises:
a first flexure extending from one of the frames;
a second flexure extending from the other of the frames; and
a bar that interconnects the first and second flexures.
14. Apparatus according to claim 13, wherein the supporting means comprises:
at least one anchor flexure supporting the bar, each anchor flexure including a structure anchored at one end to the at least one substrate and folded back 180 degrees to meet with the bar.
15. Apparatus according to claim 14, wherein the at least one anchor flexure includes four anchor flexures positioned around the pivot point.
16. Apparatus according to claim 14, wherein each of the anchor flexures is anchored to the substrate adjacent to the bar.
17. Apparatus according to claim 13, wherein each of the first and second flexures includes two substantially parallel members coupled at both ends, one of the members coupled to the frame, the other member coupled to the bar, the members coupled so as to flex as the bar rotates.
18. Apparatus according to claim 9, wherein rotation of the substrate about an axis normal to the plane causes the movements of the frames.
US11/106,354 2004-04-14 2005-04-14 Coupling apparatus for inertial sensors Active 2026-03-09 US7347094B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US11/106,354 US7347094B2 (en) 2004-04-14 2005-04-14 Coupling apparatus for inertial sensors

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US56193104P 2004-04-14 2004-04-14
US11/106,354 US7347094B2 (en) 2004-04-14 2005-04-14 Coupling apparatus for inertial sensors

Publications (2)

Publication Number Publication Date
US20050229703A1 true US20050229703A1 (en) 2005-10-20
US7347094B2 US7347094B2 (en) 2008-03-25

Family

ID=34966348

Family Applications (2)

Application Number Title Priority Date Filing Date
US11/106,354 Active 2026-03-09 US7347094B2 (en) 2004-04-14 2005-04-14 Coupling apparatus for inertial sensors
US11/106,039 Active 2025-09-10 US7287428B2 (en) 2004-04-14 2005-04-14 Inertial sensor with a linear array of sensor elements

Family Applications After (1)

Application Number Title Priority Date Filing Date
US11/106,039 Active 2025-09-10 US7287428B2 (en) 2004-04-14 2005-04-14 Inertial sensor with a linear array of sensor elements

Country Status (5)

Country Link
US (2) US7347094B2 (en)
EP (2) EP1735591B1 (en)
JP (2) JP4512636B2 (en)
CN (2) CN100559122C (en)
WO (2) WO2005103620A1 (en)

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100043551A1 (en) * 2008-08-19 2010-02-25 Analog Devices, Inc. Method and Apparatus for a Micromachined Multisensor
US20100126269A1 (en) * 2008-11-26 2010-05-27 Stmicroelectronics S.R.L. Microelectromechanical gyroscope with rotary driving motion and improved electrical properties
US20100126272A1 (en) * 2008-11-26 2010-05-27 Stmicroelectronics S.R.L. Uniaxial or biaxial microelectromechanical gyroscope with improved sensitivity to angular velocity detection
US20100132463A1 (en) * 2008-11-26 2010-06-03 Stmicroelectronics S.R.L Reading circuit for a multi-axis mems gyroscope having detection directions inclined with respect to the reference axes, and corresponding multi-axis mems gyroscope
US20100154541A1 (en) * 2008-12-23 2010-06-24 Stmicroelectronics S.R.L. Microelectromechanical gyroscope with enhanced rejection of acceleration noises
US20100281977A1 (en) * 2009-05-11 2010-11-11 Stmicroelectronics S.R.I. Microelectromechanical structure with enhanced rejection of acceleration noise
US20110154898A1 (en) * 2009-12-24 2011-06-30 Stmicroelectronics S.R.L. Integrated microelectromechanical gyroscope with improved driving structure
US9052194B2 (en) 2009-09-11 2015-06-09 Invensense, Inc. Extension-mode angular velocity sensor
US9097524B2 (en) 2009-09-11 2015-08-04 Invensense, Inc. MEMS device with improved spring system
US20160112044A1 (en) * 2014-10-20 2016-04-21 Ford Global Technologies, Llc Directional proximity switch assembly
US9464896B2 (en) 2012-06-22 2016-10-11 National Institute Of Advanced Industrial Science And Technology Device for measuring rotation angle acceleration
EP3106833A3 (en) * 2015-06-17 2017-05-03 NXP USA, Inc. Inertial sensor with couple spring for common mode rejection
US20170184400A1 (en) * 2015-12-29 2017-06-29 Stmicroelectronics S.R.L. Microelectromechanical gyroscope with rejection of disturbances and method of sensing an angular rate
US20180118557A1 (en) * 2016-05-26 2018-05-03 Honeywell International Inc. Systems and methods for bias suppression in a non-degenerate mems sensor
US10371520B2 (en) * 2014-12-18 2019-08-06 Rise Acreo Ab Quadrature compensation method for MEMS gyroscopes and a gyroscope sensor
US10598690B2 (en) 2011-09-12 2020-03-24 Stmicroelectronics S.R.L. Microelectromechanical device incorporating a gyroscope and an accelerometer

Families Citing this family (56)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7347094B2 (en) * 2004-04-14 2008-03-25 Analog Devices, Inc. Coupling apparatus for inertial sensors
US7478557B2 (en) * 2004-10-01 2009-01-20 Analog Devices, Inc. Common centroid micromachine driver
EP1645847B1 (en) * 2004-10-08 2014-07-02 STMicroelectronics Srl Temperature compensated micro-electromechanical device and method of temperature compensation in a micro-electromechanical device
US7421897B2 (en) 2005-04-14 2008-09-09 Analog Devices, Inc. Cross-quad and vertically coupled inertial sensors
FR2895501B1 (en) * 2005-12-23 2008-02-29 Commissariat Energie Atomique MICROSYSTEM, ESPECIALLY MICROGYROMETER, WITH AT LEAST TWO OSCILLATING MASSESM MECHANICALLY COUPLED
US7653214B2 (en) * 2006-01-17 2010-01-26 Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. Accelerometer utilizing image-based movement tracking
EP1996899B1 (en) * 2006-03-10 2014-09-17 Continental Teves AG & Co. oHG Rate-of-rotation sensor having a coupling bar
JPWO2008032415A1 (en) * 2006-09-15 2010-01-21 株式会社日立製作所 Angular velocity sensor
US8042396B2 (en) 2007-09-11 2011-10-25 Stmicroelectronics S.R.L. Microelectromechanical sensor with improved mechanical decoupling of sensing and driving modes
US8955984B2 (en) 2008-06-17 2015-02-17 The Invention Science Fund I, Llc Projection associated methods and systems
US8384005B2 (en) 2008-06-17 2013-02-26 The Invention Science Fund I, Llc Systems and methods for selectively projecting information in response to at least one specified motion associated with pressure applied to at least one projection surface
US20090309826A1 (en) 2008-06-17 2009-12-17 Searete Llc, A Limited Liability Corporation Of The State Of Delaware Systems and devices
US8267526B2 (en) 2008-06-17 2012-09-18 The Invention Science Fund I, Llc Methods associated with receiving and transmitting information related to projection
US8308304B2 (en) 2008-06-17 2012-11-13 The Invention Science Fund I, Llc Systems associated with receiving and transmitting information related to projection
US8944608B2 (en) 2008-06-17 2015-02-03 The Invention Science Fund I, Llc Systems and methods associated with projecting in response to conformation
US8430515B2 (en) 2008-06-17 2013-04-30 The Invention Science Fund I, Llc Systems and methods for projecting
US8608321B2 (en) 2008-06-17 2013-12-17 The Invention Science Fund I, Llc Systems and methods for projecting in response to conformation
US8936367B2 (en) 2008-06-17 2015-01-20 The Invention Science Fund I, Llc Systems and methods associated with projecting in response to conformation
US20090310038A1 (en) 2008-06-17 2009-12-17 Searete Llc, A Limited Liability Corporation Of The State Of Delaware Projection in response to position
US8723787B2 (en) 2008-06-17 2014-05-13 The Invention Science Fund I, Llc Methods and systems related to an image capture projection surface
US8733952B2 (en) 2008-06-17 2014-05-27 The Invention Science Fund I, Llc Methods and systems for coordinated use of two or more user responsive projectors
US8540381B2 (en) 2008-06-17 2013-09-24 The Invention Science Fund I, Llc Systems and methods for receiving information associated with projecting
US8641203B2 (en) 2008-06-17 2014-02-04 The Invention Science Fund I, Llc Methods and systems for receiving and transmitting signals between server and projector apparatuses
US8187902B2 (en) 2008-07-09 2012-05-29 The Charles Stark Draper Laboratory, Inc. High performance sensors and methods for forming the same
FI20095201A0 (en) * 2009-03-02 2009-03-02 Vti Technologies Oy Oscillating micromechanical angular velocity sensor
US8256290B2 (en) * 2009-03-17 2012-09-04 Minyao Mao Tri-axis angular rate sensor
DE102009046506B4 (en) 2009-11-06 2024-01-18 Robert Bosch Gmbh Rotation rate sensor
DE102010042438B4 (en) * 2010-01-27 2013-09-26 Robert Bosch Gmbh sensor arrangement
US9291638B2 (en) * 2012-01-20 2016-03-22 Mcube, Inc. Substrate curvature compensation methods and apparatus
RU2486469C1 (en) * 2012-01-31 2013-06-27 Открытое акционерное общество "Концерн "Центральный научно-исследовательский институт "Электроприбор" Method to suppress false signal in angular speed metre with micromechanical gyroscopes
CN102928622B (en) * 2012-10-17 2014-03-05 中北大学 Beam island tower shaped piezoresistive type three-axis micro-electro-mechanical system (MEMS) high-range acceleration sensor array
FI125696B (en) * 2013-09-11 2016-01-15 Murata Manufacturing Co Gyroscope construction and gyroscope with improved quadrature compensation
FI125695B (en) * 2013-09-11 2016-01-15 Murata Manufacturing Co Improved gyroscope structure and gyroscope
US9404747B2 (en) 2013-10-30 2016-08-02 Stmicroelectroncs S.R.L. Microelectromechanical gyroscope with compensation of quadrature error drift
JP6248576B2 (en) * 2013-11-25 2017-12-20 セイコーエプソン株式会社 Functional element, electronic device, and moving object
JP6189792B2 (en) * 2014-05-19 2017-08-30 日立オートモティブシステムズ株式会社 Angular velocity sensor
EP3350604B1 (en) 2015-09-14 2020-05-27 The Regents of The University of Michigan High-performance inertial measurements using a redundant array of inexpensive inertial sensors
US10514259B2 (en) 2016-08-31 2019-12-24 Analog Devices, Inc. Quad proof mass MEMS gyroscope with outer couplers and related methods
US10415968B2 (en) 2016-12-19 2019-09-17 Analog Devices, Inc. Synchronized mass gyroscope
US10627235B2 (en) 2016-12-19 2020-04-21 Analog Devices, Inc. Flexural couplers for microelectromechanical systems (MEMS) devices
US10697774B2 (en) 2016-12-19 2020-06-30 Analog Devices, Inc. Balanced runners synchronizing motion of masses in micromachined devices
US10330476B2 (en) 2017-07-12 2019-06-25 Nxp Usa, Inc. Angular rate sensor with in-phase motion suppression structure
JP7215607B2 (en) * 2017-09-29 2023-01-31 セイコーエプソン株式会社 Physical quantity sensors, inertial measurement devices, mobile positioning devices, portable electronic devices, electronic devices and mobile objects
JP7013774B2 (en) * 2017-09-29 2022-02-01 セイコーエプソン株式会社 Physical quantity sensor, inertial measurement unit, mobile positioning device, portable electronic device, electronic device and mobile body
JP7135291B2 (en) * 2017-10-24 2022-09-13 セイコーエプソン株式会社 Physical quantity sensors, inertial measurement devices, mobile positioning devices, electronic devices and mobile objects
JP7159548B2 (en) * 2017-11-28 2022-10-25 セイコーエプソン株式会社 physical quantity sensors, physical quantity sensor devices, composite sensor devices, inertial measurement devices, mobile positioning devices, portable electronic devices, electronic devices and mobile objects
US10948294B2 (en) 2018-04-05 2021-03-16 Analog Devices, Inc. MEMS gyroscopes with in-line springs and related systems and methods
TWI689708B (en) 2018-12-24 2020-04-01 財團法人工業技術研究院 Vibration sensor with monitoring function and vibration signal monitoring method thereof
US11846508B2 (en) 2020-05-25 2023-12-19 Murata Manufacturing Co., Ltd. Gyroscope with mass pairs
US11193771B1 (en) 2020-06-05 2021-12-07 Analog Devices, Inc. 3-axis gyroscope with rotational vibration rejection
US11692825B2 (en) 2020-06-08 2023-07-04 Analog Devices, Inc. Drive and sense stress relief apparatus
EP4162281A1 (en) 2020-06-08 2023-04-12 Analog Devices, Inc. Stress-relief mems gyroscope
US11519726B2 (en) 2020-06-19 2022-12-06 Analog Devices, Inc. Mechanism for selective coupling in microelectromechanical systems inertial sensors
JP7215606B2 (en) * 2020-07-22 2023-01-31 セイコーエプソン株式会社 physical quantity sensors and electronics
US11698257B2 (en) 2020-08-24 2023-07-11 Analog Devices, Inc. Isotropic attenuated motion gyroscope
US11525680B2 (en) 2021-02-17 2022-12-13 Nxp Usa, Inc. Angular rate sensor with centrally positioned coupling structures

Citations (85)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2309853A (en) * 1941-04-10 1943-02-02 Sperry Gyroscope Co Inc Rate and attitude indicating instrument
US4381672A (en) * 1981-03-04 1983-05-03 The Bendix Corporation Vibrating beam rotation sensor
US4510802A (en) * 1983-09-02 1985-04-16 Sundstrand Data Control, Inc. Angular rate sensor utilizing two vibrating accelerometers secured to a parallelogram linkage
US4524619A (en) * 1984-01-23 1985-06-25 Piezoelectric Technology Investors, Limited Vibratory angular rate sensor system
US4598585A (en) * 1984-03-19 1986-07-08 The Charles Stark Draper Laboratory, Inc. Planar inertial sensor
US4654663A (en) * 1981-11-16 1987-03-31 Piezoelectric Technology Investors, Ltd. Angular rate sensor system
US4744248A (en) * 1985-07-25 1988-05-17 Litton Systems, Inc. Vibrating accelerometer-multisensor
US4744249A (en) * 1985-07-25 1988-05-17 Litton Systems, Inc. Vibrating accelerometer-multisensor
US5016072A (en) * 1988-01-13 1991-05-14 The Charles Stark Draper Laboratory, Inc. Semiconductor chip gyroscopic transducer
US5016076A (en) * 1990-02-28 1991-05-14 At&T Bell Laboratories Lateral MOS controlled thyristor
US5025346A (en) * 1989-02-17 1991-06-18 Regents Of The University Of California Laterally driven resonant microstructures
US5056366A (en) * 1989-12-26 1991-10-15 Litton Systems, Inc. Piezoelectric vibratory rate sensor
US5111693A (en) * 1988-01-13 1992-05-12 The Charles Stark Draper Laboratory, Inc. Motion restraints for micromechanical devices
US5144184A (en) * 1990-01-26 1992-09-01 The Charles Stark Draper Laboratory, Inc. Micromechanical device with a trimmable resonant frequency structure and method of trimming same
US5195371A (en) * 1988-01-13 1993-03-23 The Charles Stark Draper Laboratory, Inc. Semiconductor chip transducer
US5203208A (en) * 1991-04-29 1993-04-20 The Charles Stark Draper Laboratory Symmetrical micromechanical gyroscope
US5216490A (en) * 1988-01-13 1993-06-01 Charles Stark Draper Laboratory, Inc. Bridge electrodes for microelectromechanical devices
US5241861A (en) * 1991-02-08 1993-09-07 Sundstrand Corporation Micromachined rate and acceleration sensor
US5259247A (en) * 1991-02-28 1993-11-09 Robert Bosch Gmbh Sensor
US5313835A (en) * 1991-12-19 1994-05-24 Motorola, Inc. Integrated monolithic gyroscopes/accelerometers with logic circuits
US5329815A (en) * 1991-12-19 1994-07-19 Motorola, Inc. Vibration monolithic gyroscope
US5343749A (en) * 1991-03-12 1994-09-06 New Sd, Inc. Single ended tuning fork inertial sensor and method
US5349855A (en) * 1992-04-07 1994-09-27 The Charles Stark Draper Laboratory, Inc. Comb drive micromechanical tuning fork gyro
US5359893A (en) * 1991-12-19 1994-11-01 Motorola, Inc. Multi-axes gyroscope
US5367217A (en) * 1992-11-18 1994-11-22 Alliedsignal Inc. Four bar resonating force transducer
US5377544A (en) * 1991-12-19 1995-01-03 Motorola, Inc. Rotational vibration gyroscope
US5392650A (en) * 1991-01-11 1995-02-28 Northrop Grumman Corporation Micromachined accelerometer gyroscope
US5408877A (en) * 1992-03-16 1995-04-25 The Charles Stark Draper Laboratory, Inc. Micromechanical gyroscopic transducer with improved drive and sense capabilities
US5481914A (en) * 1994-03-28 1996-01-09 The Charles Stark Draper Laboratory, Inc. Electronics for coriolis force and other sensors
US5492596A (en) * 1994-02-04 1996-02-20 The Charles Stark Draper Laboratory, Inc. Method of making a micromechanical silicon-on-glass tuning fork gyroscope
US5505084A (en) * 1991-09-11 1996-04-09 The Charles Stark Draper Laboratory, Inc. Micromechanical tuning fork angular rate sensor
US5530342A (en) * 1994-09-30 1996-06-25 Rockwell International Corporation Micromachined rate sensor comb drive device and method
US5535902A (en) * 1993-02-10 1996-07-16 The Charles Stark Draper Laboratory, Inc. Gimballed vibrating wheel gyroscope
US5537872A (en) * 1992-06-06 1996-07-23 Lucas Industries Public Limited Company Angular rate sensor
US5574222A (en) * 1994-09-02 1996-11-12 Robert Bosch Gmbh Acceleration sensor
US5600065A (en) * 1995-10-25 1997-02-04 Motorola, Inc. Angular velocity sensor
US5604312A (en) * 1994-11-25 1997-02-18 Robert Bosch Gmbh Rate-of-rotation sensor
US5635638A (en) * 1995-06-06 1997-06-03 Analog Devices, Inc. Coupling for multiple masses in a micromachined device
US5635640A (en) * 1995-06-06 1997-06-03 Analog Devices, Inc. Micromachined device with rotationally vibrated masses
US5635639A (en) * 1991-09-11 1997-06-03 The Charles Stark Draper Laboratory, Inc. Micromechanical tuning fork angular rate sensor
US5646348A (en) * 1994-08-29 1997-07-08 The Charles Stark Draper Laboratory, Inc. Micromechanical sensor with a guard band electrode and fabrication technique therefor
US5650568A (en) * 1993-02-10 1997-07-22 The Charles Stark Draper Laboratory, Inc. Gimballed vibrating wheel gyroscope having strain relief features
US5717140A (en) * 1995-05-30 1998-02-10 Alliedsignal, Inc. Angular rate sensor electronic balance
US5734105A (en) * 1992-10-13 1998-03-31 Nippondenso Co., Ltd. Dynamic quantity sensor
US5747961A (en) * 1995-10-11 1998-05-05 The Charles Stark Draper Laboratory, Inc. Beat frequency motor position detection scheme for tuning fork gyroscope and other sensors
US5763781A (en) * 1995-02-23 1998-06-09 Netzer; Yishay Coupled resonator vibratory rate sensor
US5767405A (en) * 1992-04-07 1998-06-16 The Charles Stark Draper Laboratory, Inc. Comb-drive micromechanical tuning fork gyroscope with piezoelectric readout
US5783973A (en) * 1997-02-24 1998-07-21 The Charles Stark Draper Laboratory, Inc. Temperature insensitive silicon oscillator and precision voltage reference formed therefrom
US5795988A (en) * 1996-07-01 1998-08-18 Alliedsignal Inc. Gyroscope noise reduction and drift compensation
US5886816A (en) * 1990-06-11 1999-03-23 Reveo, Inc. Method and system for recording spatially-multiplexed images of 3-D objects for use in stereoscopic viewing thereof
US5892153A (en) * 1996-11-21 1999-04-06 The Charles Stark Draper Laboratory, Inc. Guard bands which control out-of-plane sensitivities in tuning fork gyroscopes and other sensors
US5895851A (en) * 1994-11-17 1999-04-20 Nippondenso Co., Ltd. Semiconductor yaw rate sensor with a vibrating movable section with vertical and horizontal displacement detection
US5895850A (en) * 1994-04-23 1999-04-20 Robert Bosch Gmbh Micromechanical resonator of a vibration gyrometer
US5911156A (en) * 1997-02-24 1999-06-08 The Charles Stark Draper Laboratory, Inc. Split electrode to minimize charge transients, motor amplitude mismatch errors, and sensitivity to vertical translation in tuning fork gyros and other devices
US5918280A (en) * 1996-07-29 1999-06-29 Aisin Seiki Kabushiki Kaisha Angular rate sensing device
US5920012A (en) * 1998-06-16 1999-07-06 Boeing North American Micromechanical inertial sensor
US5945600A (en) * 1996-07-31 1999-08-31 Aisin Seiki Kabushiki Kaisha Angular rate sensor
US5952572A (en) * 1996-01-19 1999-09-14 Matsushita Electric Industrial Co., Ltd. Angular rate sensor and acceleration sensor
US5955668A (en) * 1997-01-28 1999-09-21 Irvine Sensors Corporation Multi-element micro gyro
US5987986A (en) * 1994-07-29 1999-11-23 Litton Systems, Inc. Navigation grade micromachined rotation sensor system
US5992233A (en) * 1996-05-31 1999-11-30 The Regents Of The University Of California Micromachined Z-axis vibratory rate gyroscope
US6009751A (en) * 1998-10-27 2000-01-04 Ljung; Bo Hans Gunnar Coriolis gyro sensor
US6032531A (en) * 1997-08-04 2000-03-07 Kearfott Guidance & Navigation Corporation Micromachined acceleration and coriolis sensor
US6044707A (en) * 1997-06-20 2000-04-04 Aisin Seiki Kabushiki Kaisha Angular rate sensor
US6064169A (en) * 1995-10-11 2000-05-16 The Charles Stark Draper Laboratory, Inc. Motor amplitude control circuit in conductor-on-insulator tuning fork gyroscope
US6070463A (en) * 1996-03-11 2000-06-06 Murata Manufacturing Co., Ltd. Angular velocity sensor
US6070464A (en) * 1997-09-05 2000-06-06 Motorola, Inc. Sensing structure comprising a movable mass and a self-test structure
US6089089A (en) * 1997-10-14 2000-07-18 Microsensors, Inc. Multi-element micro gyro
US6122961A (en) * 1997-09-02 2000-09-26 Analog Devices, Inc. Micromachined gyros
US6189381B1 (en) * 1999-04-26 2001-02-20 Sitek, Inc. Angular rate sensor made from a structural wafer of single crystal silicon
US6190571B1 (en) * 1996-12-20 2001-02-20 Aisin Seiki Kabushiki Kaisha Semiconductor micromachine and manufacturing method thereof
US6230563B1 (en) * 1998-06-09 2001-05-15 Integrated Micro Instruments, Inc. Dual-mass vibratory rate gyroscope with suppressed translational acceleration response and quadrature-error correction capability
US6250157B1 (en) * 1998-06-22 2001-06-26 Aisin Seiki Kabushiki Kaisha Angular rate sensor
US6250156B1 (en) * 1996-05-31 2001-06-26 The Regents Of The University Of California Dual-mass micromachined vibratory rate gyroscope
US6257059B1 (en) * 1999-09-24 2001-07-10 The Charles Stark Draper Laboratory, Inc. Microfabricated tuning fork gyroscope and associated three-axis inertial measurement system to sense out-of-plane rotation
US6282960B1 (en) * 1996-03-15 2001-09-04 Analog Devices, Inc. Micromachined device with enhanced dimensional control
US6289733B1 (en) * 1999-05-12 2001-09-18 Hughes Electronics Corporation Planar vibratory gyroscopes
US6311555B1 (en) * 1999-11-17 2001-11-06 American Gnc Corporation Angular rate producer with microelectromechanical system technology
US20030005767A1 (en) * 1991-02-08 2003-01-09 Hulsing Rand H. Triaxial angular rate and acceleration sensor
US6516666B1 (en) * 2000-09-19 2003-02-11 Motorola, Inc. Yaw rate motion sensor
US6561029B2 (en) * 1996-10-07 2003-05-13 Hahn-Schickard-Gesellschaft Fur Angewandte Forschung E.V. Rotational rate gyroscope with decoupled orthogonal primary and secondary oscillations
US20030131664A1 (en) * 2002-01-10 2003-07-17 Yoichi Mochida Angular velocity sensor
US20030131669A1 (en) * 2001-12-17 2003-07-17 Norikazu Osawa Coriolis mass flowmeter
US6767758B1 (en) * 2003-04-28 2004-07-27 Analog Devices, Inc. Micro-machined device structures having on and off-axis orientations
US6860151B2 (en) * 2003-02-07 2005-03-01 Honeywell International Inc. Methods and systems for controlling movement within MEMS structures

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4884446A (en) 1987-03-12 1989-12-05 Ljung Per B Solid state vibrating gyro
US6155115A (en) 1991-01-02 2000-12-05 Ljung; Per Vibratory angular rate sensor
DE4107658A1 (en) 1991-03-09 1992-09-17 Bosch Gmbh Robert ASSEMBLY METHOD FOR MICROMECHANICAL SENSORS
US5581035A (en) 1994-08-29 1996-12-03 The Charles Stark Draper Laboratory, Inc. Micromechanical sensor with a guard band electrode
US5696323A (en) 1996-06-25 1997-12-09 Alliedsignal, Inc. Two bar resonant beam Coriolis rate sensor
DE19648425C1 (en) * 1996-11-22 1998-01-02 Siemens Ag Micro-mechanical rotation rate sensor esp. for measuring angular speed
JP3262082B2 (en) * 1997-10-16 2002-03-04 株式会社豊田中央研究所 Vibrating angular velocity detector
US6164134A (en) 1999-01-29 2000-12-26 Hughes Electronics Corporation Balanced vibratory gyroscope and amplitude control for same
JP4126833B2 (en) 1999-03-12 2008-07-30 株式会社デンソー Angular velocity sensor device
FR2808264B1 (en) * 2000-04-28 2002-06-07 Commissariat Energie Atomique MICRO-MACHINED MECHANICAL STRUCTURE AND DEVICE INCORPORATING THE STRUCTURE
JP4568997B2 (en) * 2000-12-05 2010-10-27 株式会社豊田中央研究所 Jerk sensor
US6742389B2 (en) * 2001-01-24 2004-06-01 The Regents Of The University Of Michigan Filter-based method and system for measuring angular speed of an object
US6837107B2 (en) * 2003-04-28 2005-01-04 Analog Devices, Inc. Micro-machined multi-sensor providing 1-axis of acceleration sensing and 2-axes of angular rate sensing
US7036372B2 (en) * 2003-09-25 2006-05-02 Kionix, Inc. Z-axis angular rate sensor
JP4433747B2 (en) * 2003-09-29 2010-03-17 株式会社村田製作所 Angular velocity detector
US7347094B2 (en) * 2004-04-14 2008-03-25 Analog Devices, Inc. Coupling apparatus for inertial sensors
US9479575B2 (en) * 2012-03-27 2016-10-25 International Business Machines Corporation Managing capacity on demand in a server cloud

Patent Citations (100)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2309853A (en) * 1941-04-10 1943-02-02 Sperry Gyroscope Co Inc Rate and attitude indicating instrument
US4381672A (en) * 1981-03-04 1983-05-03 The Bendix Corporation Vibrating beam rotation sensor
US4654663A (en) * 1981-11-16 1987-03-31 Piezoelectric Technology Investors, Ltd. Angular rate sensor system
US4510802A (en) * 1983-09-02 1985-04-16 Sundstrand Data Control, Inc. Angular rate sensor utilizing two vibrating accelerometers secured to a parallelogram linkage
US4524619A (en) * 1984-01-23 1985-06-25 Piezoelectric Technology Investors, Limited Vibratory angular rate sensor system
US4598585A (en) * 1984-03-19 1986-07-08 The Charles Stark Draper Laboratory, Inc. Planar inertial sensor
US4744249A (en) * 1985-07-25 1988-05-17 Litton Systems, Inc. Vibrating accelerometer-multisensor
US4744248A (en) * 1985-07-25 1988-05-17 Litton Systems, Inc. Vibrating accelerometer-multisensor
US5111693A (en) * 1988-01-13 1992-05-12 The Charles Stark Draper Laboratory, Inc. Motion restraints for micromechanical devices
US5016072A (en) * 1988-01-13 1991-05-14 The Charles Stark Draper Laboratory, Inc. Semiconductor chip gyroscopic transducer
US5216490A (en) * 1988-01-13 1993-06-01 Charles Stark Draper Laboratory, Inc. Bridge electrodes for microelectromechanical devices
US5195371A (en) * 1988-01-13 1993-03-23 The Charles Stark Draper Laboratory, Inc. Semiconductor chip transducer
US5025346A (en) * 1989-02-17 1991-06-18 Regents Of The University Of California Laterally driven resonant microstructures
US5056366A (en) * 1989-12-26 1991-10-15 Litton Systems, Inc. Piezoelectric vibratory rate sensor
US5144184A (en) * 1990-01-26 1992-09-01 The Charles Stark Draper Laboratory, Inc. Micromechanical device with a trimmable resonant frequency structure and method of trimming same
US5016076A (en) * 1990-02-28 1991-05-14 At&T Bell Laboratories Lateral MOS controlled thyristor
US5886816A (en) * 1990-06-11 1999-03-23 Reveo, Inc. Method and system for recording spatially-multiplexed images of 3-D objects for use in stereoscopic viewing thereof
US5392650A (en) * 1991-01-11 1995-02-28 Northrop Grumman Corporation Micromachined accelerometer gyroscope
US5241861A (en) * 1991-02-08 1993-09-07 Sundstrand Corporation Micromachined rate and acceleration sensor
US20030005767A1 (en) * 1991-02-08 2003-01-09 Hulsing Rand H. Triaxial angular rate and acceleration sensor
US5341682A (en) * 1991-02-08 1994-08-30 Alliedsignal Inc. Micromachined rate and acceleration sensor
US5259247A (en) * 1991-02-28 1993-11-09 Robert Bosch Gmbh Sensor
US5343749A (en) * 1991-03-12 1994-09-06 New Sd, Inc. Single ended tuning fork inertial sensor and method
US5343749B1 (en) * 1991-03-12 2000-01-11 New Sd Inc Single ended tuning fork inertial sensor and method
US5203208A (en) * 1991-04-29 1993-04-20 The Charles Stark Draper Laboratory Symmetrical micromechanical gyroscope
US5635639A (en) * 1991-09-11 1997-06-03 The Charles Stark Draper Laboratory, Inc. Micromechanical tuning fork angular rate sensor
US5796001A (en) * 1991-09-11 1998-08-18 The Charles Stark Draper Laboratory, Inc. Monolithic micromechanical tuning fork angular rate sensor
US5505084A (en) * 1991-09-11 1996-04-09 The Charles Stark Draper Laboratory, Inc. Micromechanical tuning fork angular rate sensor
US5511419A (en) * 1991-12-19 1996-04-30 Motorola Rotational vibration gyroscope
US5359893A (en) * 1991-12-19 1994-11-01 Motorola, Inc. Multi-axes gyroscope
US5377544A (en) * 1991-12-19 1995-01-03 Motorola, Inc. Rotational vibration gyroscope
US5329815A (en) * 1991-12-19 1994-07-19 Motorola, Inc. Vibration monolithic gyroscope
US5313835A (en) * 1991-12-19 1994-05-24 Motorola, Inc. Integrated monolithic gyroscopes/accelerometers with logic circuits
US5408877A (en) * 1992-03-16 1995-04-25 The Charles Stark Draper Laboratory, Inc. Micromechanical gyroscopic transducer with improved drive and sense capabilities
US5515724A (en) * 1992-03-16 1996-05-14 The Charles Stark Draper Laboratory, Inc. Micromechanical gyroscopic transducer with improved drive and sense capabilities
US5496436A (en) * 1992-04-07 1996-03-05 The Charles Stark Draper Laboratory, Inc. Comb drive micromechanical tuning fork gyro fabrication method
US5349855A (en) * 1992-04-07 1994-09-27 The Charles Stark Draper Laboratory, Inc. Comb drive micromechanical tuning fork gyro
US5767405A (en) * 1992-04-07 1998-06-16 The Charles Stark Draper Laboratory, Inc. Comb-drive micromechanical tuning fork gyroscope with piezoelectric readout
US5537872A (en) * 1992-06-06 1996-07-23 Lucas Industries Public Limited Company Angular rate sensor
US6128953A (en) * 1992-10-13 2000-10-10 Nippondenso Co., Ltd Dynamical quantity sensor
US5734105A (en) * 1992-10-13 1998-03-31 Nippondenso Co., Ltd. Dynamic quantity sensor
US5367217A (en) * 1992-11-18 1994-11-22 Alliedsignal Inc. Four bar resonating force transducer
US5535902A (en) * 1993-02-10 1996-07-16 The Charles Stark Draper Laboratory, Inc. Gimballed vibrating wheel gyroscope
US5555765A (en) * 1993-02-10 1996-09-17 The Charles Stark Draper Laboratory, Inc. Gimballed vibrating wheel gyroscope
US5650568A (en) * 1993-02-10 1997-07-22 The Charles Stark Draper Laboratory, Inc. Gimballed vibrating wheel gyroscope having strain relief features
US5492596A (en) * 1994-02-04 1996-02-20 The Charles Stark Draper Laboratory, Inc. Method of making a micromechanical silicon-on-glass tuning fork gyroscope
US5672949A (en) * 1994-03-28 1997-09-30 The Charles Stark Draper Laboratory, Inc. Electronics for Coriolis force and other sensors
US5604309A (en) * 1994-03-28 1997-02-18 The Charles Stark Draper Laboratory, Inc. Electronics for Coriolis force and other sensors
US5481914A (en) * 1994-03-28 1996-01-09 The Charles Stark Draper Laboratory, Inc. Electronics for coriolis force and other sensors
US5600064A (en) * 1994-03-28 1997-02-04 The Charles Stark Draper Laboratory, Inc. Electronics for coriolis force and other sensors
US5608351A (en) * 1994-03-28 1997-03-04 The Charles Stark Draper Laboratory, Inc. Electronics for Coriolis force and other sensors
US5895850A (en) * 1994-04-23 1999-04-20 Robert Bosch Gmbh Micromechanical resonator of a vibration gyrometer
US5987986A (en) * 1994-07-29 1999-11-23 Litton Systems, Inc. Navigation grade micromachined rotation sensor system
US5646348A (en) * 1994-08-29 1997-07-08 The Charles Stark Draper Laboratory, Inc. Micromechanical sensor with a guard band electrode and fabrication technique therefor
US5574222A (en) * 1994-09-02 1996-11-12 Robert Bosch Gmbh Acceleration sensor
US5530342A (en) * 1994-09-30 1996-06-25 Rockwell International Corporation Micromachined rate sensor comb drive device and method
US5895851A (en) * 1994-11-17 1999-04-20 Nippondenso Co., Ltd. Semiconductor yaw rate sensor with a vibrating movable section with vertical and horizontal displacement detection
US5604312A (en) * 1994-11-25 1997-02-18 Robert Bosch Gmbh Rate-of-rotation sensor
US5763781A (en) * 1995-02-23 1998-06-09 Netzer; Yishay Coupled resonator vibratory rate sensor
US5717140A (en) * 1995-05-30 1998-02-10 Alliedsignal, Inc. Angular rate sensor electronic balance
US5869760A (en) * 1995-06-06 1999-02-09 Analog Devices, Inc. Micromachined device with rotationally vibrated masses
US5635638A (en) * 1995-06-06 1997-06-03 Analog Devices, Inc. Coupling for multiple masses in a micromachined device
US5635640A (en) * 1995-06-06 1997-06-03 Analog Devices, Inc. Micromachined device with rotationally vibrated masses
US5747961A (en) * 1995-10-11 1998-05-05 The Charles Stark Draper Laboratory, Inc. Beat frequency motor position detection scheme for tuning fork gyroscope and other sensors
US6064169A (en) * 1995-10-11 2000-05-16 The Charles Stark Draper Laboratory, Inc. Motor amplitude control circuit in conductor-on-insulator tuning fork gyroscope
US5600065A (en) * 1995-10-25 1997-02-04 Motorola, Inc. Angular velocity sensor
US5952572A (en) * 1996-01-19 1999-09-14 Matsushita Electric Industrial Co., Ltd. Angular rate sensor and acceleration sensor
US6070463A (en) * 1996-03-11 2000-06-06 Murata Manufacturing Co., Ltd. Angular velocity sensor
US6282960B1 (en) * 1996-03-15 2001-09-04 Analog Devices, Inc. Micromachined device with enhanced dimensional control
US5992233A (en) * 1996-05-31 1999-11-30 The Regents Of The University Of California Micromachined Z-axis vibratory rate gyroscope
US6067858A (en) * 1996-05-31 2000-05-30 The Regents Of The University Of California Micromachined vibratory rate gyroscope
US6250156B1 (en) * 1996-05-31 2001-06-26 The Regents Of The University Of California Dual-mass micromachined vibratory rate gyroscope
US5795988A (en) * 1996-07-01 1998-08-18 Alliedsignal Inc. Gyroscope noise reduction and drift compensation
US5918280A (en) * 1996-07-29 1999-06-29 Aisin Seiki Kabushiki Kaisha Angular rate sensing device
US5945600A (en) * 1996-07-31 1999-08-31 Aisin Seiki Kabushiki Kaisha Angular rate sensor
US6561029B2 (en) * 1996-10-07 2003-05-13 Hahn-Schickard-Gesellschaft Fur Angewandte Forschung E.V. Rotational rate gyroscope with decoupled orthogonal primary and secondary oscillations
US5892153A (en) * 1996-11-21 1999-04-06 The Charles Stark Draper Laboratory, Inc. Guard bands which control out-of-plane sensitivities in tuning fork gyroscopes and other sensors
US6190571B1 (en) * 1996-12-20 2001-02-20 Aisin Seiki Kabushiki Kaisha Semiconductor micromachine and manufacturing method thereof
US5955668A (en) * 1997-01-28 1999-09-21 Irvine Sensors Corporation Multi-element micro gyro
US5783973A (en) * 1997-02-24 1998-07-21 The Charles Stark Draper Laboratory, Inc. Temperature insensitive silicon oscillator and precision voltage reference formed therefrom
US5911156A (en) * 1997-02-24 1999-06-08 The Charles Stark Draper Laboratory, Inc. Split electrode to minimize charge transients, motor amplitude mismatch errors, and sensitivity to vertical translation in tuning fork gyros and other devices
US6044707A (en) * 1997-06-20 2000-04-04 Aisin Seiki Kabushiki Kaisha Angular rate sensor
US6032531A (en) * 1997-08-04 2000-03-07 Kearfott Guidance & Navigation Corporation Micromachined acceleration and coriolis sensor
US6122961A (en) * 1997-09-02 2000-09-26 Analog Devices, Inc. Micromachined gyros
US6505511B1 (en) * 1997-09-02 2003-01-14 Analog Devices, Inc. Micromachined gyros
US6070464A (en) * 1997-09-05 2000-06-06 Motorola, Inc. Sensing structure comprising a movable mass and a self-test structure
US6089089A (en) * 1997-10-14 2000-07-18 Microsensors, Inc. Multi-element micro gyro
US6230563B1 (en) * 1998-06-09 2001-05-15 Integrated Micro Instruments, Inc. Dual-mass vibratory rate gyroscope with suppressed translational acceleration response and quadrature-error correction capability
US5920012A (en) * 1998-06-16 1999-07-06 Boeing North American Micromechanical inertial sensor
US6250157B1 (en) * 1998-06-22 2001-06-26 Aisin Seiki Kabushiki Kaisha Angular rate sensor
US6009751A (en) * 1998-10-27 2000-01-04 Ljung; Bo Hans Gunnar Coriolis gyro sensor
US6189381B1 (en) * 1999-04-26 2001-02-20 Sitek, Inc. Angular rate sensor made from a structural wafer of single crystal silicon
US6289733B1 (en) * 1999-05-12 2001-09-18 Hughes Electronics Corporation Planar vibratory gyroscopes
US6257059B1 (en) * 1999-09-24 2001-07-10 The Charles Stark Draper Laboratory, Inc. Microfabricated tuning fork gyroscope and associated three-axis inertial measurement system to sense out-of-plane rotation
US6311555B1 (en) * 1999-11-17 2001-11-06 American Gnc Corporation Angular rate producer with microelectromechanical system technology
US6516666B1 (en) * 2000-09-19 2003-02-11 Motorola, Inc. Yaw rate motion sensor
US20030131669A1 (en) * 2001-12-17 2003-07-17 Norikazu Osawa Coriolis mass flowmeter
US20030131664A1 (en) * 2002-01-10 2003-07-17 Yoichi Mochida Angular velocity sensor
US6860151B2 (en) * 2003-02-07 2005-03-01 Honeywell International Inc. Methods and systems for controlling movement within MEMS structures
US6767758B1 (en) * 2003-04-28 2004-07-27 Analog Devices, Inc. Micro-machined device structures having on and off-axis orientations

Cited By (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7980133B2 (en) 2008-08-19 2011-07-19 Analog Devices, Inc. Method and apparatus for a micromachined multisensor
US20100043551A1 (en) * 2008-08-19 2010-02-25 Analog Devices, Inc. Method and Apparatus for a Micromachined Multisensor
US20100126269A1 (en) * 2008-11-26 2010-05-27 Stmicroelectronics S.R.L. Microelectromechanical gyroscope with rotary driving motion and improved electrical properties
US20100126272A1 (en) * 2008-11-26 2010-05-27 Stmicroelectronics S.R.L. Uniaxial or biaxial microelectromechanical gyroscope with improved sensitivity to angular velocity detection
US20100132463A1 (en) * 2008-11-26 2010-06-03 Stmicroelectronics S.R.L Reading circuit for a multi-axis mems gyroscope having detection directions inclined with respect to the reference axes, and corresponding multi-axis mems gyroscope
US8661897B2 (en) 2008-11-26 2014-03-04 Stmicroelectronics S.R.L. Uniaxial or biaxial microelectromechanical gyroscope with improved sensitivity to angular velocity detection
US8459109B2 (en) 2008-11-26 2013-06-11 Stmicroelectronics S.R.L. Reading circuit for a multi-axis MEMS gyroscope having detection directions inclined with respect to the reference axes
US8413506B2 (en) 2008-11-26 2013-04-09 Stmicroelectronics S.R.L. Microelectromechanical gyroscope with rotary driving motion and improved electrical properties
US8312769B2 (en) 2008-11-26 2012-11-20 Stmicroelectronics S.R.L. Uniaxial or biaxial microelectromechanical gyroscope with improved sensitivity to angular velocity detection
ITTO20080981A1 (en) * 2008-12-23 2010-06-24 St Microelectronics Srl MICROELETTROMECHANICAL GYROSCOPE WITH IMPROVED REJECTION OF ACCELERATION DISORDERS
US8347716B2 (en) 2008-12-23 2013-01-08 Stmicroelectronics S.R.L. Microelectromechanical gyroscope with enhanced rejection of acceleration noises
EP2202484A1 (en) * 2008-12-23 2010-06-30 STMicroelectronics Srl Microelectromechanical gyroscope with enhanced rejection of acceleration noise
US8549917B2 (en) 2008-12-23 2013-10-08 Stmicroelectronics S.R.L. Microelectromechanical gyroscope with enhanced rejection of acceleration noises
US20100154541A1 (en) * 2008-12-23 2010-06-24 Stmicroelectronics S.R.L. Microelectromechanical gyroscope with enhanced rejection of acceleration noises
US11079229B2 (en) 2009-05-11 2021-08-03 Stmicroelectronics S.R.L. Microelectromechanical structure with enhanced rejection of acceleration noise
US8342025B2 (en) 2009-05-11 2013-01-01 Stmicroelectronics S.R.L. Microelectromechanical structure with enhanced rejection of acceleration noise
US20100281977A1 (en) * 2009-05-11 2010-11-11 Stmicroelectronics S.R.I. Microelectromechanical structure with enhanced rejection of acceleration noise
US10209071B2 (en) 2009-05-11 2019-02-19 Stmicroelectronics S.R.L. Microelectromechanical structure with enhanced rejection of acceleration noise
US8833164B2 (en) 2009-05-11 2014-09-16 Stmicroelectronics S.R.L. Microelectromechanical structure with enhanced rejection of acceleration noise
US9739613B2 (en) 2009-05-11 2017-08-22 Stmicroelectronics S.R.L. Microelectromechanical structure with enhanced rejection of acceleration noise
US9097524B2 (en) 2009-09-11 2015-08-04 Invensense, Inc. MEMS device with improved spring system
US9891053B2 (en) 2009-09-11 2018-02-13 Invensense, Inc. MEMS device with improved spring system
US9683844B2 (en) 2009-09-11 2017-06-20 Invensense, Inc. Extension-mode angular velocity sensor
US10551193B2 (en) 2009-09-11 2020-02-04 Invensense, Inc. MEMS device with improved spring system
US9052194B2 (en) 2009-09-11 2015-06-09 Invensense, Inc. Extension-mode angular velocity sensor
US20110154898A1 (en) * 2009-12-24 2011-06-30 Stmicroelectronics S.R.L. Integrated microelectromechanical gyroscope with improved driving structure
US8459110B2 (en) 2009-12-24 2013-06-11 Stmicroelectronics S.R.L. Integrated microelectromechanical gyroscope with improved driving structure
US10598690B2 (en) 2011-09-12 2020-03-24 Stmicroelectronics S.R.L. Microelectromechanical device incorporating a gyroscope and an accelerometer
US9464896B2 (en) 2012-06-22 2016-10-11 National Institute Of Advanced Industrial Science And Technology Device for measuring rotation angle acceleration
US10038443B2 (en) * 2014-10-20 2018-07-31 Ford Global Technologies, Llc Directional proximity switch assembly
US20160112044A1 (en) * 2014-10-20 2016-04-21 Ford Global Technologies, Llc Directional proximity switch assembly
US10371520B2 (en) * 2014-12-18 2019-08-06 Rise Acreo Ab Quadrature compensation method for MEMS gyroscopes and a gyroscope sensor
EP3106833A3 (en) * 2015-06-17 2017-05-03 NXP USA, Inc. Inertial sensor with couple spring for common mode rejection
US10180324B2 (en) * 2015-12-29 2019-01-15 Stmicroelectronics S.R.L. Microelectromechanical gyroscope with rejection of disturbances and method of sensing an angular rate
EP3187825A1 (en) * 2015-12-29 2017-07-05 STMicroelectronics Srl Microelectromechanical gyroscope with rejection of disturbances and method of sensing an angular rate
US20200025567A1 (en) * 2015-12-29 2020-01-23 Stmicroelectronics S.R.L. Microelectromechanical gyroscope with rejection of disturbances and method of sensing an angular rate
ITUB20159197A1 (en) * 2015-12-29 2017-06-29 St Microelectronics Srl MICROELETTROMECHANICAL GYROSCOPE WITH DISORDER REJECTION AND METHOD OF DETECTING AN ANGULAR SPEED
US20170184400A1 (en) * 2015-12-29 2017-06-29 Stmicroelectronics S.R.L. Microelectromechanical gyroscope with rejection of disturbances and method of sensing an angular rate
US11085769B2 (en) * 2015-12-29 2021-08-10 Stmicroelectronics S.R.L. Microelectromechanical gyroscope with rejection of disturbances and method of sensing an angular rate
US20180118557A1 (en) * 2016-05-26 2018-05-03 Honeywell International Inc. Systems and methods for bias suppression in a non-degenerate mems sensor
US10696541B2 (en) * 2016-05-26 2020-06-30 Honeywell International Inc. Systems and methods for bias suppression in a non-degenerate MEMS sensor
US11390517B2 (en) * 2016-05-26 2022-07-19 Honeywell International Inc. Systems and methods for bias suppression in a non-degenerate MEMS sensor

Also Published As

Publication number Publication date
CN1954193A (en) 2007-04-25
WO2005103621A1 (en) 2005-11-03
JP2007532917A (en) 2007-11-15
CN1954192A (en) 2007-04-25
EP1735590B1 (en) 2013-11-27
JP4512636B2 (en) 2010-07-28
JP4516113B2 (en) 2010-08-04
EP1735591B1 (en) 2014-01-22
WO2005103620A1 (en) 2005-11-03
US7347094B2 (en) 2008-03-25
CN100559122C (en) 2009-11-11
JP2007532924A (en) 2007-11-15
EP1735590A1 (en) 2006-12-27
US7287428B2 (en) 2007-10-30
CN1954193B (en) 2010-09-01
EP1735591A1 (en) 2006-12-27
US20050229705A1 (en) 2005-10-20

Similar Documents

Publication Publication Date Title
US7347094B2 (en) Coupling apparatus for inertial sensors
US7421897B2 (en) Cross-quad and vertically coupled inertial sensors
US11841228B2 (en) Drive and sense balanced, fully-coupled 3-axis gyroscope
US8266961B2 (en) Inertial sensors with reduced sensitivity to quadrature errors and micromachining inaccuracies
US11815354B2 (en) Drive and sense balanced, semi-coupled 3-axis gyroscope
EP3428576B1 (en) Angular rate sensor with in-phase motion suppression structure
US7478557B2 (en) Common centroid micromachine driver
EP3751232A1 (en) In-plane non-degenerate coriolis vibratory gyroscope
CN111065888B (en) Driving and sensing balance, semi-coupling triaxial gyroscope
Shah et al. Research Article Modal Analysis of a Single-Structure Multiaxis MEMS Gyroscope

Legal Events

Date Code Title Description
AS Assignment

Owner name: ANALOG DEVICES, INC., MASSACHUSETTS

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:GEEN, JOHN A.;CLARK, WILLIAM A.;KUANG, JINBO;REEL/FRAME:016113/0246

Effective date: 20050517

STCF Information on status: patent grant

Free format text: PATENTED CASE

FPAY Fee payment

Year of fee payment: 4

FPAY Fee payment

Year of fee payment: 8

MAFP Maintenance fee payment

Free format text: PAYMENT OF MAINTENANCE FEE, 12TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1553); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

Year of fee payment: 12