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TWM606602U - High-power integrated circuit chip packaging device - Google Patents

High-power integrated circuit chip packaging device Download PDF

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Publication number
TWM606602U
TWM606602U TW109213563U TW109213563U TWM606602U TW M606602 U TWM606602 U TW M606602U TW 109213563 U TW109213563 U TW 109213563U TW 109213563 U TW109213563 U TW 109213563U TW M606602 U TWM606602 U TW M606602U
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TW
Taiwan
Prior art keywords
integrated circuit
circuit chip
power integrated
pins
packaging device
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Application number
TW109213563U
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Chinese (zh)
Inventor
張學豪
李軍
趙時峰
Original Assignee
大陸商昂寶電子(上海)有限公司
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Publication of TWM606602U publication Critical patent/TWM606602U/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48135Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
    • H01L2224/48145Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49171Fan-out arrangements

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  • Lead Frames For Integrated Circuits (AREA)

Abstract

本創作提供了一種大功率積體電路晶片封裝裝置。該大功率積體電路晶片封裝裝置包括大功率積體電路晶片、引線框架、和封裝體。引線框架包括載片台和至少十個引腳;載片台具有相對於至少十個引腳所在平面打凹下沉的平面,用於承載大功率積體電路晶片,並且載片台的下沉部的至少一部分暴露於封裝體的外部;至少十個引腳中的至少四個相鄰引腳被連接在一起並被加寬以形成加寬引腳,並且加寬引腳與載片台相連接,形成大功率積體電路晶片與外界環境的散熱通道。根據本創作實施例的積體電路晶片封裝裝置與同類結構相比,具有更好的散熱性能、同時製造成本較低,因此可以用於大功率積體電路晶片的設計封裝、規模化製造和應用。 This creation provides a high-power integrated circuit chip packaging device. The high-power integrated circuit chip packaging device includes a high-power integrated circuit chip, a lead frame, and a package body. The lead frame includes a slide table and at least ten pins; the slide table has a recessed and sunken flat surface relative to the plane where the at least ten pins are located, and is used to carry high-power integrated circuit chips and sink the slide table At least a part of the portion is exposed to the outside of the package body; at least four adjacent pins among the at least ten pins are connected together and widened to form a widened pin, and the widened pin is relative to the carrier Connect to form a heat dissipation channel between the high-power integrated circuit chip and the external environment. Compared with similar structures, the integrated circuit chip packaging device according to this creative embodiment has better heat dissipation performance and lower manufacturing cost, so it can be used for the design, packaging, large-scale manufacturing and application of high-power integrated circuit chips .

Description

大功率積體電路晶片封裝裝置 High-power integrated circuit chip packaging device

本創作涉及半導體領域,更具體地涉及一種大功率積體電路晶片封裝裝置。 This creation relates to the field of semiconductors, and more specifically to a high-power integrated circuit chip packaging device.

積體電路晶片的製造過程主要包括以下幾個階段:積體電路晶片的設計階段、積體電路晶片的製作階段、積體電路晶片的封裝階段、以及積體電路晶片的測試階段。當積體電路晶片製作完成後,積體電路晶片上通常有多個焊墊。在積體電路晶片的封裝階段,通常會把積體電路晶片上的這些焊墊與對應的引線框架互相電連接。積體電路晶片通常是通過焊線、或者以植球結合的方式連接到引線框架上,使得積體電路晶片的這些焊墊與引線框架的接點電連接,從而實現積體電路晶片的封裝結構內部的電氣連接。 The manufacturing process of the integrated circuit chip mainly includes the following stages: the design phase of the integrated circuit chip, the production phase of the integrated circuit chip, the packaging phase of the integrated circuit chip, and the testing phase of the integrated circuit chip. After the integrated circuit chip is manufactured, there are usually multiple bonding pads on the integrated circuit chip. In the packaging stage of the integrated circuit chip, the bonding pads on the integrated circuit chip and the corresponding lead frame are usually electrically connected to each other. The integrated circuit chip is usually connected to the lead frame by wire bonding or ball bonding, so that the bonding pads of the integrated circuit chip are electrically connected to the contacts of the lead frame, thereby realizing the packaging structure of the integrated circuit chip Internal electrical connections.

隨著功率類積體電路晶片越來越多地被使用,如何實現大功率積體電路晶片的高散熱性能的封裝成為半導體行業普遍關心的問題。 With the increasing use of power integrated circuit chips, how to achieve high-power integrated circuit chips with high heat dissipation performance has become a common concern in the semiconductor industry.

本創作提供了一種新穎的大功率積體電路晶片封裝裝置以及應用於該封裝裝置中的引線框架。 This creation provides a novel high-power integrated circuit chip packaging device and a lead frame used in the packaging device.

根據本創作的實施例,提供了一種積體電路晶片封裝裝置,包括大功率積體電路晶片、引線框架、以及封裝體。其中,引線框架包括載片台和至少十個引腳;載片台具有相對於至少十個引腳所在平面打凹下沉的平面,用於承載大功率積體電路晶片,並且載片台的下沉部的至少一部分暴露於所述封裝體的外部;並且至少十個引腳中的至少四個相鄰引腳被連接在一起並被加寬以形成加寬引腳,並且加寬引腳與載片台相連接,形成大功率積體電路晶片與外界環境的散熱通道。 According to an embodiment of the present creation, an integrated circuit chip packaging device is provided, which includes a high-power integrated circuit chip, a lead frame, and a package. Wherein, the lead frame includes a slide table and at least ten pins; the slide table has a concave and sunken plane relative to the plane where the at least ten pins are located, and is used to carry high-power integrated circuit chips, and At least a part of the sinking portion is exposed to the outside of the package body; and at least four adjacent pins among the at least ten pins are connected together and widened to form a widened pin, and the widened pin Connected with the slide table to form a heat dissipation channel between the high-power integrated circuit chip and the external environment.

在一個實施例中,至少十個引腳中的部分相鄰引腳、或者全部相鄰引腳之間的間距大於1.0mm。 In one embodiment, the spacing between some or all adjacent pins among the at least ten pins is greater than 1.0 mm.

在一個實施例中,載片台的下沉部暴露在封裝體的表面的面積占封裝體的同側表面積的30%以上。 In one embodiment, the area of the sunken portion of the slide table exposed on the surface of the package accounts for more than 30% of the surface area of the same side of the package.

在一個實施例中,大功率積體電路晶片封裝裝置為貼片式結構或雙列直插式結構。 In one embodiment, the high-power integrated circuit chip packaging device is a SMD structure or a dual in-line structure.

在一個實施例中,大功率積體電路晶片為開關電源晶片。 In one embodiment, the high-power integrated circuit chip is a switching power supply chip.

根據本創作的實施例,還提供了一種引線框架,包括載片台和至少十個引腳。其中,載片台具有相對於至少十個引腳所在平面打凹下沉的平面,用於承載大功率積體電路晶片;並且至少十個引腳中的至少四個相鄰引腳被連接在一起並被加寬以形成加寬引腳,並且加寬引腳與載片台相連接,形成大功率積體電路晶片與外界環境的散熱通道。 According to the embodiment of the present creation, a lead frame is also provided, which includes a stage and at least ten pins. Wherein, the slide table has a concave and sunken plane with respect to the plane where the at least ten pins are located, and is used to carry the high-power integrated circuit chip; and at least four adjacent pins among the at least ten pins are connected to Together, they are widened to form widened pins, and the widened pins are connected with the stage to form a heat dissipation channel between the high-power integrated circuit chip and the external environment.

根據本創作實施例的積體電路晶片封裝裝置與同類結構相比,具有更好的散熱性能、同時製造成本較低,因此可以用於大功率積體電路晶片的設計封裝、規模化製造和應用。 Compared with similar structures, the integrated circuit chip packaging device according to this creative embodiment has better heat dissipation performance and lower manufacturing cost, so it can be used for the design, packaging, large-scale manufacturing and application of high-power integrated circuit chips .

1(VDD),2(PRT),3(FB),4(GND),5(CS),6(DRAIN),7(DRAIN),8(DRAIN),9(DRAIN),10(HV):引腳 1(VDD), 2(PRT), 3(FB), 4(GND), 5(CS), 6(DRAIN), 7(DRAIN), 8(DRAIN), 9(DRAIN), 10(HV): Pin

2A:引線框架 2A: Lead frame

2A-1,4-3:載片台 2A-1, 4-3: Slide table

4-1:大功率積體電路晶片 4-1: High-power integrated circuit chip

4-2:控制類積體電路晶片 4-2: Control IC chip

a1:外露載片台X方向之邊長 a1: X-direction side length of exposed stage

b1:外露載片台Y方向之邊長 b1: Length of side in Y direction of exposed stage

L1:高壓(或高低壓)引腳之間寬間距 L1: Wide spacing between high voltage (or high and low voltage) pins

從下面結合圖式對本創作的具體實施方式的描述中可以更好地理解本創作,其中: This creation can be better understood from the following description of the specific implementation of this creation in combination with the diagrams, in which:

圖1A示出了根據本創作實施例的大功率積體電路晶片封裝裝置的俯視圖; Figure 1A shows a top view of a high-power integrated circuit chip packaging device according to an embodiment of the present invention;

圖1B示出了圖1A所示的大功率積體電路晶片封裝裝置沿A-A的截面圖; FIG. 1B shows a cross-sectional view of the high-power integrated circuit chip packaging device shown in FIG. 1A along A-A;

圖2A示出了根據本創作實施例的大功率積體電路晶片封裝裝置中的引線框架的俯視圖; 2A shows a top view of the lead frame in the high-power integrated circuit chip packaging device according to the present creative embodiment;

圖2B示出了圖2A所示的引線框架沿B-B的截面圖; Fig. 2B shows a cross-sectional view of the lead frame shown in Fig. 2A along B-B;

圖3A示出了根據本創作的另一實施例的大功率積體電路晶片封裝裝置的俯視圖; 3A shows a top view of a high-power integrated circuit chip packaging device according to another embodiment of the present invention;

圖3B示出了圖3A所示的大功率積體電路晶片封裝裝置沿C-C的截面圖; 3B shows a cross-sectional view of the high-power integrated circuit chip packaging device shown in FIG. 3A along C-C;

圖4示出了根據本創作實施例的大功率積體電路晶片封裝裝置的內部封裝結構的俯視圖; FIG. 4 shows a top view of the internal packaging structure of the high-power integrated circuit chip packaging device according to this creative embodiment;

圖5示出了根據本創作實施例的一種示例性開關電源晶片封裝裝置的引腳示意圖。 Fig. 5 shows a schematic diagram of pins of an exemplary switching power supply chip packaging device according to the present creative embodiment.

圖6示出了應用如圖5所示的示例性開關電源晶片封裝裝置的返馳功率變換器的示意性電路連接圖。 FIG. 6 shows a schematic circuit connection diagram of a flyback power converter applying the exemplary switching power supply chip packaging device shown in FIG. 5.

下面將詳細描述本創作的各個方面的特徵和示例性實施例。在下面的詳細描述中,提出了許多具體細節,以便提供對本創作的全面理解。但是,對於本領域技術人員來說很明顯的是,本創作可以在不需要這些具體細節中的一些細節的情況下實施。下面對實施例的描述僅僅是為了通過示出本創作的示例來提供對本創作的更好的理解。本創作絕不限於下面所提出的任何具體配置和演算法,而是在不脫離本創作的精神的前提下覆蓋了元素、部件和演算法的任何修改、替換和改進。在圖式和下面的描述中,沒有示出公知的結構和技術,以便避免對本創作造成不必要的模糊。 The features and exemplary embodiments of various aspects of the present creation will be described in detail below. In the following detailed description, many specific details are proposed in order to provide a comprehensive understanding of this creation. However, it is obvious to those skilled in the art that this creation can be implemented without some of these specific details. The following description of the embodiments is only to provide a better understanding of the present creation by showing an example of the present creation. This creation is by no means limited to any specific configuration and algorithm proposed below, but covers any modification, replacement and improvement of elements, components and algorithms without departing from the spirit of this creation. In the drawings and the following description, well-known structures and techniques are not shown in order to avoid unnecessary obscurity of the creation.

隨著功率類積體電路晶片越來越多地被使用,如何實現大功率積體電路晶片的高散熱性能的封裝成為半導體行業普遍關心的問題。鑒於該問題,本創作提供了一種新穎的大功率積體電路晶片封裝裝置。 With the increasing use of power integrated circuit chips, how to achieve high-power integrated circuit chips with high heat dissipation performance has become a common concern in the semiconductor industry. In view of this problem, this creation provides a novel high-power integrated circuit chip packaging device.

下面結合圖式,詳細描述根據本創作實施例的大功率積體電路晶片封裝裝置以及應用於該封裝裝置中的引線框架。 The following describes in detail the high-power integrated circuit chip packaging device according to this creative embodiment and the lead frame applied to the packaging device in conjunction with the drawings.

圖1A示出了根據本創作實施例的大功率積體電路晶片封裝裝置的俯視圖。圖1B示出了圖1A所示的大功率積體電路晶片封裝裝置沿A-A的截面圖。該大功率積體電路晶片封裝裝置可以應用如圖2A和2B所示的引線框架。該大功率積體電路晶片封裝裝置例如為貼片式結構,可以包括大功率積體電路晶片、引線框架和封裝體,其中引線框架包括引腳1、引腳2、...、引腳10共10個引腳、以及用於承載大功率積體電路晶片的載 片台。如圖1A所示,引腳6、引腳7、引腳8、引腳9連接在一起並被加寬以形成一個整體的加寬引腳。 Fig. 1A shows a top view of a high-power integrated circuit chip packaging device according to an embodiment of the present invention. Fig. 1B shows a cross-sectional view along A-A of the high-power integrated circuit chip packaging device shown in Fig. 1A. The high-power integrated circuit chip packaging device can be applied to the lead frame shown in FIGS. 2A and 2B. The high-power integrated circuit chip packaging device is, for example, a SMD structure, which may include a high-power integrated circuit chip, a lead frame, and a package body, wherein the lead frame includes pins 1, pins 2, ..., pins 10. A total of 10 pins, and a carrier for carrying high-power integrated circuit chips Film table. As shown in Fig. 1A, pin 6, pin 7, pin 8, and pin 9 are connected together and widened to form a whole widened pin.

結合圖1A和1B可以看出,載片台具有相對於引腳1至引腳10所在平面打凹下沉的平面。該打凹下沉的平面在封裝體以內,並且用於承載所述大功率積體電路晶片,而載片台的下沉部的至少一部分(例如,與載片台的打凹下沉的平面相對的面)可以被暴露在大功率積體電路晶片封裝裝置的封裝體的外部以形成大功率積體電路晶片與外界環境的散熱通道。此外,引腳6、引腳7、引腳8、引腳9連接在一起形成的加寬引腳可以與載片台相連接,進一步擴展大功率積體電路晶片與外界環境的散熱通道。該表面貼裝結構既能適用於印刷電路板組裝(Printed Circuit Board Assembly,PCBA)類工廠的傳統回流焊工藝,又能適用於被傳統用於外掛程式結構的波峰焊工藝,可在大中小各類組裝加工工廠應用組裝貼片,大大降低組裝成本。 As can be seen in conjunction with FIGS. 1A and 1B, the slide table has a flat surface that is concave and sunk relative to the plane where the pins 1 to 10 are located. The recessed and sinking plane is inside the package and is used to carry the high-power integrated circuit chip, and at least a part of the sinking portion of the carrier table (for example, the concave and sinking plane of the carrier The opposite surface) may be exposed to the outside of the package body of the high-power integrated circuit chip packaging device to form a heat dissipation channel between the high-power integrated circuit chip and the external environment. In addition, the widened pin formed by connecting pin 6, pin 7, pin 8, and pin 9 can be connected to the stage to further expand the heat dissipation channel between the high-power integrated circuit chip and the external environment. The surface mount structure can not only be applied to the traditional reflow soldering process of Printed Circuit Board Assembly (PCBA) factories, but also to the wave soldering process that is traditionally used for plug-in structure. Similar assembly processing factories use assembly patches to greatly reduce assembly costs.

注意,雖然圖1A和1B均未示出包括在積體電路晶片封裝裝置中的積體電路晶片本身和用於封裝積體電路晶片和引線框架的封裝體,但是本領域技術人員應該明白積體電路晶片封裝裝置必然包括至少一個積體電路晶片和封裝體。 Note that although FIGS. 1A and 1B do not show the integrated circuit chip itself included in the integrated circuit chip packaging device and the package for packaging the integrated circuit chip and the lead frame, those skilled in the art should understand that the integrated circuit chip The circuit chip packaging device necessarily includes at least one integrated circuit chip and a package body.

下面結合圖2A和圖2B更詳細地描述應用於根據本創作實施例的大功率積體電路晶片封裝裝置中的引線框架的結構。如圖2A所示,引線框架2A包括引腳1、引腳2、...、引腳10共10個引腳、以及載片台2A-1;載片台2A-1與引腳6、引腳7、引腳8、引腳9連接在一起;引腳6、引腳7、引腳8、引腳9本身也連接在一起並被加寬形成一個整體的加寬引腳。 The structure of the lead frame used in the high-power integrated circuit chip packaging device according to the present creative embodiment will be described in more detail below with reference to FIGS. 2A and 2B. As shown in Fig. 2A, the lead frame 2A includes pins 1, pins 2,..., and 10 pins, a total of 10 pins, and a stage 2A-1; a stage 2A-1 and pins 6, Pin 7, pin 8, and pin 9 are connected together; pin 6, pin 7, pin 8, and pin 9 are also connected together and widened to form a whole widened pin.

圖2B示出了圖2A所示的引線框架沿B-B的截面圖。結合圖2A和2B可以看出,載片台2A-1具有相對於引腳1至引腳10所在平面打凹下沉的平面,並且與引腳6、引腳7、引腳8、引腳9連接在一起,而沒有與其他引腳連接在一起。 Fig. 2B shows a cross-sectional view of the lead frame shown in Fig. 2A along B-B. It can be seen from Figures 2A and 2B that the stage 2A-1 has a concave and sinking plane with respect to the plane where the pins 1 to 10 are located, and is connected to pins 6, 7, 8, and 8. 9 is connected together, but not connected to other pins.

當引線框架2A被應用到大功率積體電路晶片封裝裝置中時,由於載片台2A-1與引腳6、引腳7、引腳8、引腳9連接在一起,所以承載在載片台2A-1上的大功率積體電路晶片與外界環境的散熱通道包括四個引腳。進一步地,由於引腳6、引腳7、引腳8、引腳9本身連接在一起並被加寬,所以進一步擴大了承載在載片台2A-1上的大功率積體電路晶片與外界環境的散熱通道。 When the lead frame 2A is applied to the high-power integrated circuit chip packaging device, the carrier 2A-1 is connected to the pins 6, 7, 8, and 9, so it is carried on the chip. The heat dissipation channel between the high-power integrated circuit chip on the platform 2A-1 and the external environment includes four pins. Furthermore, since the pins 6, 7, 8, and 9 themselves are connected together and are widened, the high-power integrated circuit chip carried on the stage 2A-1 is further enlarged. The cooling channel of the environment.

此外,在引線框架2A被應用到大功率積體電路晶片封裝裝置中時,可以通過把載片台2A-1的下沉部的至少一部分暴露在積體電路晶片封裝裝置的外部,來進一步擴大承載在載片台2A-1上的大功率積體電路晶片與外部環境的散熱通道。為了使載片台2A-1的下沉部暴露在積體電路晶片封裝裝置的外部,可以將積體電路晶片封裝裝置的厚度減小。 In addition, when the lead frame 2A is applied to a high-power integrated circuit chip packaging device, it can be further enlarged by exposing at least a part of the sinking portion of the stage 2A-1 to the outside of the integrated circuit chip packaging device. The heat dissipation channel between the high-power integrated circuit chip and the external environment carried on the stage 2A-1. In order to expose the sinking portion of the stage 2A-1 to the outside of the integrated circuit chip packaging device, the thickness of the integrated circuit chip packaging device may be reduced.

在一些實施例中,引線框架2A的部分相鄰引腳或者全部相鄰引腳之間的間距可以被調整為更大的間距。例如,可以將該間距(即圖1A所示之L1)設計為大於1.0mm(例如在1.0-3.6mm的範圍內),以預防某些應用條件尤其是潮濕環境下相鄰引腳(特別是高壓與低壓引腳)間的打火問題,從而保證應用引線框架2A的積體電路晶片封裝裝置的可靠性、和安全性。此外,在一些實施例中,可以將載片台2A-1的尺寸做得更大,例如,其面積占積體電路晶片封裝裝置的封裝體的總面積的10%-90%,從而承載更大尺寸的大功率積體電路晶片,同時可以有更大的暴露在積體電路晶片封裝裝置外部的散熱面積。例如,載片台2A-1的下沉部暴露在封裝體的表面的面積(即圖1A所示之a1*b1的乘積數)可以占封裝體的同側表面積的30%以上。 In some embodiments, the spacing between some or all adjacent pins of the lead frame 2A can be adjusted to a larger spacing. For example, the spacing (ie L1 shown in Figure 1A) can be designed to be greater than 1.0mm (for example, in the range of 1.0-3.6mm) to prevent certain application conditions, especially adjacent pins in humid environments (especially The ignition problem between the high-voltage and low-voltage pins, thereby ensuring the reliability and safety of the integrated circuit chip packaging device using the lead frame 2A. In addition, in some embodiments, the size of the stage 2A-1 can be made larger, for example, its area occupies 10%-90% of the total area of the package body of the integrated circuit chip packaging device, thereby carrying more Large-size and high-power integrated circuit chips can also have a larger heat dissipation area exposed to the outside of the integrated circuit chip packaging device. For example, the area of the sunken portion of the stage 2A-1 exposed on the surface of the package (ie the product of a1*b1 shown in FIG. 1A) can account for more than 30% of the surface area of the same side of the package.

圖3A示出了根據本創作另一實施例的積體電路晶片封裝裝置的俯視圖。圖3B示出了圖3A所示的積體電路晶片封裝裝置沿C-C的截面圖。圖3A和3B所示的積體電路晶片封裝裝置為雙列直插式結構,此結構可方便應用於單面PCBA設計的外掛程式組裝,對組裝工廠的設計和工藝要求及限制較小,生產和製造過程簡單。其他方面與結合圖1A和1B描述的積體電路晶片封裝裝置類似,這裡不再贅述。 Fig. 3A shows a top view of an integrated circuit chip packaging device according to another embodiment of the present invention. Fig. 3B shows a cross-sectional view along C-C of the integrated circuit chip packaging device shown in Fig. 3A. The integrated circuit chip packaging device shown in Figures 3A and 3B is a dual-in-line structure. This structure can be easily applied to the plug-in assembly of a single-sided PCBA design. The design and process requirements and restrictions on the assembly factory are small, and the production And the manufacturing process is simple. Other aspects are similar to the integrated circuit chip packaging device described in conjunction with FIGS. 1A and 1B, and will not be repeated here.

圖4示出了根據本創作實施例的大功率積體電路晶片封裝裝置的內部封裝結構的俯視圖。如圖4所示,載片台4-3被實現為具有更大的尺寸(可根據實際需求放大),以承載更大的大功率積體電路晶片4-1,該大功率積體電路晶片4-1上可以黏貼尺寸較小的控制類積體電路晶片4-2;載片台4-3與引腳6、引腳7、引腳8、引腳9連接在一起,使得大功率積體電路晶片4-1與外界環境的散熱通道包括四個引腳;引腳6、引腳7、引腳8、引腳9本身連接在一起,進一步擴大了大功率積體電路晶片4-1與外界環境的散熱通道。 Fig. 4 shows a top view of the internal packaging structure of the high-power integrated circuit chip packaging device according to this creative embodiment. As shown in Figure 4, the stage 4-3 is implemented to have a larger size (which can be enlarged according to actual needs) to carry a larger high-power integrated circuit chip 4-1. The high-power integrated circuit chip The smaller control IC chip 4-2 can be pasted on the 4-1; the stage 4-3 is connected with pins 6, 7, 8, and 9 to make the high-power product The heat dissipation channel between the bulk circuit chip 4-1 and the external environment includes four pins; pin 6, pin 7, pin 8, and pin 9 are connected together, which further expands the high-power integrated circuit chip 4-1 Heat dissipation channel with the external environment.

如上所述,根據本創作實施例的大功率積體電路晶片封裝裝置適用於功率較大的功率類積體電路晶片的封裝。例如,大功率積體電路晶片可以是開關電源晶片。圖5示出了根據本創作實施例的一種示例性開關電源晶片封裝裝置的引腳示意圖。 As described above, the high-power integrated circuit chip packaging device according to the present creative embodiment is suitable for packaging power-type integrated circuit chips with higher power. For example, the high-power integrated circuit chip may be a switching power supply chip. Fig. 5 shows a schematic diagram of pins of an exemplary switching power supply chip packaging device according to the present creative embodiment.

如圖5所示,該開關電源晶片封裝裝置具有10個引腳,其中引腳1、引腳2、引腳3、引腳4、引腳5和引腳10為六個獨立引腳,而引腳6、引腳7、引腳8和引腳9連接在一起形成一個整體的加寬引腳。 As shown in Figure 5, the switching power supply chip packaging device has 10 pins, of which pin 1, pin 2, pin 3, pin 4, pin 5, and pin 10 are six independent pins, and Pin 6, pin 7, pin 8, and pin 9 are connected together to form a whole widened pin.

圖6示出了應用如圖5所示的示例性開關電源晶片封裝裝置的返馳功率變換器的示意性電路連接圖。如圖5和圖6所示,引腳1被設置為VDD引腳,即一次供電引腳;引腳2被設置為PRT引腳,即過溫感測和保護引腳;引腳3被設置為FB引腳,即環路補償引腳;引腳4被設置為GND引腳,即晶片接地引腳;引腳5被設置為CS引腳,即功率電力MOS場效電晶體電流感測引腳;引腳10被設置為HV引腳,即高壓啟動引腳;並且引腳6、引腳7、引腳8和引腳9形成的整體的加寬引腳被設置為DRAIN引腳,即連接開關電源晶片中的功率電力MOS場效電晶體汲極的引腳。 FIG. 6 shows a schematic circuit connection diagram of a flyback power converter applying the exemplary switching power supply chip packaging device shown in FIG. 5. As shown in Figure 5 and Figure 6, Pin 1 is set as the VDD pin, which is the primary power supply pin; Pin 2 is set as the PRT pin, which is the over-temperature sensing and protection pin; Pin 3 is set It is the FB pin, which is the loop compensation pin; pin 4 is set as the GND pin, which is the chip ground pin; pin 5 is set as the CS pin, which is the power and power MOS field effect transistor current sensing lead Pin; Pin 10 is set as the HV pin, which is the high-voltage start pin; and the overall widened pin formed by pin 6, pin 7, pin 8 and pin 9 is set as DRAIN pin, namely Connect the pin of the power power MOS field effect transistor drain in the switching power supply chip.

以上以開關電源晶片為示例對根據本創作實施例的積體電路晶片封裝裝置的引腳設置進行了描述。但是應理解,根據本創作實施例的積體電路晶片封裝裝置可以用於各種大功率積體電路晶片的封裝。 The above description uses the switching power supply chip as an example to describe the pin setting of the integrated circuit chip packaging device according to this creative embodiment. However, it should be understood that the integrated circuit chip packaging device according to this creative embodiment can be used for packaging various high-power integrated circuit chips.

此外,雖然以上是以十個引腳的封裝結構為示例來描述根據本創作實施例的積體電路晶片封裝裝置的引腳設置,但是應理解,根據本創作實施例的積體電路晶片封裝裝置不限於僅包括十個引腳,而是可以包括更多的引腳。 In addition, although the ten-pin package structure is taken as an example to describe the pin arrangement of the integrated circuit chip packaging device according to this creative embodiment, it should be understood that the integrated circuit chip packaging device according to this creative embodiment It is not limited to only including ten pins, but more pins may be included.

此外,所描述的特徵、結構或特性可以以任何合適的方式結合在一個或更多實施例中。在以上的描述中,提供了許多具體細節從而給出對本創作的實施例的充分理解。然而,本領域技術人員將意識到,可以實踐本創作的技術方案而沒有所述特定細節中的一個或更多,或者可以採用其它的方法、組元、材料等。在其它情況下,不詳細示出或描述公知結構、材料或者操作以避免模糊本創作的主要技術創意。 Furthermore, the described features, structures or characteristics may be combined in one or more embodiments in any suitable manner. In the above description, many specific details are provided to give a sufficient understanding of the embodiments of the present creation. However, those skilled in the art will realize that the technical solution of this creation can be practiced without one or more of the specific details, or other methods, components, materials, etc. can be used. In other cases, well-known structures, materials, or operations are not shown or described in detail to avoid obscuring the main technical ideas of this creation.

本領域技術人員應能理解,上述實施例均是示例性而非限制性的。在不同實施例中出現的不同技術特徵可以進行組合,以取得有益效果。本領域技術人員在研究圖式、說明書及申請專利範圍的基礎上,應能理解並實現所揭示的實施例的其他變化的實施例。某些技術特徵出現在不同的從屬請求項中並不意味著不能將這些技術特徵進行組合以取得有益效果。 Those skilled in the art should understand that the above-mentioned embodiments are all exemplary rather than restrictive. Different technical features appearing in different embodiments can be combined to achieve beneficial effects. Those skilled in the art should be able to understand and implement other modified embodiments of the disclosed embodiments on the basis of studying the drawings, specifications, and the scope of patent applications. The presence of certain technical features in different subordinate claims does not mean that these technical features cannot be combined to achieve beneficial effects.

1(VDD),2(PRT),3(FB),4(GND),5(CS),6(DRAIN),7(DRAIN),8(DRAIN),9(DRAIN),10(HV):引腳 1(VDD), 2(PRT), 3(FB), 4(GND), 5(CS), 6(DRAIN), 7(DRAIN), 8(DRAIN), 9(DRAIN), 10(HV): Pin

a1:外露載片台X方向之邊長 a1: X-direction side length of exposed stage

b1:外露載片台Y方向之邊長 b1: Length of side in Y direction of exposed stage

L1:高壓(或高低壓)引腳之間寬間距 L1: Wide spacing between high voltage (or high and low voltage) pins

Claims (9)

一種大功率積體電路晶片封裝裝置,包括大功率積體電路晶片、引線框架、以及封裝體,其中: A high-power integrated circuit chip packaging device includes a high-power integrated circuit chip, a lead frame, and a package body, wherein: 所述引線框架包括載片台和至少十個引腳; The lead frame includes a stage and at least ten pins; 所述載片台具有相對於所述至少十個引腳所在平面打凹下沉的平面,用於承載所述大功率積體電路晶片,並且所述載片台的下沉部的至少一部分暴露於所述封裝體的外部;並且 The slide table has a recessed and sunk plane with respect to the plane where the at least ten pins are located, and is used to carry the high-power integrated circuit chip, and at least a part of the sink portion of the slide table is exposed On the outside of the package; and 所述至少十個引腳中的至少四個相鄰引腳被連接在一起並被加寬以形成加寬引腳,並且所述加寬引腳與所述載片台相連接,形成所述大功率積體電路晶片與外界環境的散熱通道。 At least four adjacent pins among the at least ten pins are connected together and widened to form a widened pin, and the widened pin is connected to the stage to form the The heat dissipation channel between the high-power integrated circuit chip and the external environment. 如請求項1所述的大功率積體電路晶片封裝裝置,其中,所述至少十個引腳中的部分相鄰引腳、或者全部相鄰引腳之間的間距大於1.0mm。 The high-power integrated circuit chip packaging device according to claim 1, wherein the distance between some or all adjacent pins among the at least ten pins is greater than 1.0 mm. 如請求項1所述的大功率積體電路晶片封裝裝置,其中,所述載片台的下沉部暴露在所述封裝體的表面的面積占所述封裝體的同側表面積的30%以上。 The high-power integrated circuit chip packaging device according to claim 1, wherein the area of the sunken portion of the stage that is exposed on the surface of the package occupies more than 30% of the surface area on the same side of the package . 如請求項1所述的大功率積體電路晶片封裝裝置,其中,所述大功率積體電路晶片封裝裝置被配置為貼片式結構。 The high-power integrated circuit chip packaging device according to claim 1, wherein the high-power integrated circuit chip packaging device is configured as a chip structure. 如請求項1所述的大功率積體電路晶片封裝裝置,其中,所述大功率積體電路晶片封裝裝置被配置為雙列直插式結構。 The high-power integrated circuit chip packaging device according to claim 1, wherein the high-power integrated circuit chip packaging device is configured as a dual in-line structure. 如請求項1所述的大功率積體電路晶片封裝裝置,其中,所述大功率積體電路晶片為開關電源晶片。 The high-power integrated circuit chip packaging device according to claim 1, wherein the high-power integrated circuit chip is a switching power supply chip. 一種引線框架,包括載片台和至少十個引腳,其中: A lead frame includes a stage and at least ten pins, wherein: 所述載片台具有相對於所述至少十個引腳所在平面打凹下沉的平面,用於承載大功率積體電路晶片;並且 The slide table has a flat surface that is recessed and sunk relative to the flat surface where the at least ten pins are located, and is used to carry high-power integrated circuit chips; and 所述至少十個引腳中的至少四個相鄰引腳被連接在一起並被加寬以形成加寬引腳,並且所述加寬引腳與所述載片台相連接,形成所述大功率積體電路晶片與外界環境的散熱通道。 At least four adjacent pins among the at least ten pins are connected together and widened to form a widened pin, and the widened pin is connected to the stage to form the The heat dissipation channel between the high-power integrated circuit chip and the external environment. 如請求項6所述的引線框架,其中,所述至少十個引腳中的部分相鄰引腳、或者全部相鄰引腳之間的間距大於1.0mm。 The lead frame according to claim 6, wherein the spacing between some or all of the adjacent pins among the at least ten pins is greater than 1.0 mm. 如請求項6所述的引線框架,其中,所述大功率積體電路晶片為開關電源晶片。 The lead frame according to claim 6, wherein the high-power integrated circuit chip is a switching power supply chip.
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116127903A (en) * 2023-02-14 2023-05-16 电子科技大学 High-power PA chip layout and wind tunnel type self-heat-dissipation packaging design method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116127903A (en) * 2023-02-14 2023-05-16 电子科技大学 High-power PA chip layout and wind tunnel type self-heat-dissipation packaging design method
CN116127903B (en) * 2023-02-14 2023-11-14 电子科技大学 High-power PA chip layout and wind tunnel type self-heat-dissipation packaging design method

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